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IEEE Design & Test, Volume 32
Volume 32, Number 1, February 2015
- André Ivanov:
Speeding Up Analog Integration and Test for Mixed-Signal SoCs. 4-5 - Rubin A. Parekhji, Kenneth Butler, Gordon W. Roberts:
Guest Editors' Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs. 6-8 - Antonio Anastasio Bruto da Costa, Pallab Dasgupta:
Formal Interpretation of Assertion-Based Features on AMS Designs. 9-17 - Manuel J. Barragan Asian, Gildas Léger
:
A Procedure for Alternate Test Feature Design and Selection. 18-25 - Siva Kumar Sudani, Li Xu, Degang Chen:
A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods. 26-35 - Ender Yilmaz, Sule Ozev:
Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation. 36-43 - ByongChan Lim
, Ji-Eun Jang, James Mao, Jaeha Kim, Mark Horowitz:
Digital Analog Design: Enabling Mixed-Signal System Validation. 44-52 - Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
:
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. 53-60 - Vishwanath Natarajan, Aritra Banerjee
, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization. 61-69 - Theo Theocharides:
Test Technology TC Newsletter. 75-76 - Peng Li:
The Art of Certifying Analog/Mixed-Signal Circuits. 79-80
Volume 32, Number 2, April 2015
- André Ivanov:
A Look at Trojan Attack, Pruning, and Dependability. 4-5 - Swaroop Ghosh, Abhishek Basak, Swarup Bhunia
:
How Secure Are Printed Circuit Boards Against Trojan Attacks? 7-16 - Marco Ottavi
, Salvatore Pontarelli
, Dimitris Gizopoulos, Cristiana Bolchini
, Maria K. Michael, Lorena Anghel
, Mehdi Baradaran Tahoori, Antonis M. Paschalis
, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis
, Said Hamdioui:
Dependable Multicore Architectures at Nanoscale: The View From Europe. 17-28 - Jacob Murray, Nghia Tang, Partha Pratim Pande, Deukhyoun Heo, Behrooz A. Shirazi:
DVFS Pruning for Wireless NoC Architectures. 29-38 - James Buczkowski, Walden C. Rhines:
The Future of Automotive Design and the Road to Get There. 40-47 - Theo Theocharides:
Test Technology TC Newsletter. 49-50 - Scott Davidson:
Getting Credit. 56
Volume 32, Number 3, June 2015
- André Ivanov:
A Look at Asynchronous Design and Photonic Network-on-a-Chip (PNoC). 4 - Steven M. Nowick, Montek Singh:
Asynchronous Design - Part 1: Overview and Recent Advances. 5-18 - Steven M. Nowick, Montek Singh:
Asynchronous Design - Part 2: Systems and Methodologies. 19-28 - Sai Vineel Reddy Chittamuru
, Sudeep Pasricha:
Crosstalk Mitigation for High-Radix and Low-Diameter Photonic NoC Architectures. 29-39 - Theo Theocharides:
Test Technology TC Newsletter. 49-50 - Scott Davidson:
Time Out of Mind. 56
Volume 32, Number 4, August 2015
- André Ivanov:
Advances in 3-D Integrated Circuits, Systems, and CAD Tools. 4-5 - Dae Hyun Kim, Sung Kyu Lim
:
Guest Editors' Introduction: Advances in 3-D Integrated Circuits, Systems, and CAD Tools. 6-7 - Dae Hyun Kim, Sung Kyu Lim
:
Physical Design and CAD Tools for 3-D Integrated Circuits: Challenges and Opportunities. 8-22 - Guruprasad Katti, S. W. Ho, Li Hong Yu, Songbai Zhang, Rahul Dutta, Roshan Weerasekera
, Ka-Fai Chang, Jong-Kai Lin, Srinivasa Rao Vempati, Surya Bhattacharya:
Fabrication and Assembly of Cu-RDL-Based 2.5-D Low-Cost Through Silicon Interposer (LC-TSI). 23-31 - Yong Han, Boon Long Lau, Boo Yang Jung, Xiaowu Zhang
:
Heat Dissipation Capability of a Package-on-Package Embedded Wafer-Level Package. 32-39 - Christos Papameletis, Brion L. Keller, Vivek Chickermane, Said Hamdioui, Erik Jan Marinissen
:
A DfT Architecture and Tool Flow for 3-D SICs With Test Data Compression, Embedded Cores, and Multiple Towers. 40-48 - Dongjun Xu, Sai Manoj P. D.
, Kanwen Wang, Hao Yu, Ningmei Yu, Mingbin Yu:
A 2.5-D Memory-Logic Integration With Data-Pattern-Aware Memory Controller. 49-58 - Che-Wei Chou, Jin-Fu Li, Yun-Chao Yu, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou:
Hierarchical Test Integration Methodology for 3-D ICs. 59-70 - Ishan G. Thakkar, Sudeep Pasricha:
3-D WiRED: A Novel WIDE I/O DRAM With Energy-Efficient 3-D Bank Organization. 71-80 - Theo Theocharides:
Test Technology TC Newsletter. 85-86 - Scott Davidson:
A 3-D Forward into the Past. 88
Volume 32, Number 5, October 2015
- André Ivanov:
Cyber-Physplical Systems for Medical Apications. 4-5 - Paul Bogdan
, Rahul Mangharam:
Guest Editors' Introduction: Cyber-Physical Systems for Medical Applications. 6-8 - James Weimer, Radoslav Ivanov, Alexander Roederer, Sanjian Chen, Insup Lee:
Parameter-Invariant Design of Medical Alarms. 9-16 - Margarida M. Silva, Alexander Medvedev, Torbjörn Wigren
, Teresa Mendonça
:
Modeling the Effect of Intravenous Anesthetics: A Path Toward Individualization. 17-26 - Zhenqi Huang, Chuchu Fan
, Alexandru Mereacre, Sayan Mitra
, Marta Z. Kwiatkowska
:
Simulation-Based Verification of Cardiac Pacemakers With Guaranteed Coverage. 27-34 - Marilyn Wolf, Mihaela van der Schaar
, Honggab Kim, Jie Xu
:
Caring Analytics for Adults With Special Needs. 35-44 - Alan Wassyng, Neeraj Kumar Singh, Mischa Geven, Nicholas Proscia, Hao Wang
, Mark Lawford, Tom Maibaum:
Can Product-Specific Assurance Case Templates Be Used as Medical Device Standards? 45-55 - Arnab Ray, Rance Cleaveland:
Security Assurance Cases for Medical Cyber-Physical Systems. 56-65 - Anitha Murugesan
, Sanjai Rayadurgam, Michael W. Whalen, Mats Per Erik Heimdahl:
Design Considerations for Modeling Modes in Cyber-Physical Systems. 66-73 - Brian R. Larson, Yi Zhang
, Stephen C. Barrett, John Hatcliff, Paul L. Jones:
Enabling Safe Interoperation by Medical Device Virtual Integration. 74-88 - Suren Kumar
, Pankaj Singhal, Venkat N. Krovi
:
Computer-Vision-Based Decision Support in Surgical Robotics. 89-97 - Marco Beccani, Hakan Tunc, Addisu Taddese, Ekawahyu Susilo, Péter Völgyesi, Ákos Lédeczi, Pietro Valdastri
:
Systematic Design of Medical Capsule Robots. 98-108 - Theo Theocharides:
Test Technology TC Newsletter. 115-116 - Insup Lee:
Medical Cyber-Physical Systems: The Early Years. 119-120
Volume 32, Number 6, December 2015
- André Ivanov:
Microfluidics: Design and Test Solutions for Enabling Biochemistry on a Chip. 4-5 - Tsung-Yi Ho
, Bhargab B. Bhattacharya:
Guest Editors' Introduction: Microfluidics: Design and Test Solutions for Enabling Biochemistry on a Chip. 6-7 - Paul Pop
, Ismail Emre Araci, Krishnendu Chakrabarty
:
Continuous-Flow Biochips: Technology, Physical-Design Methods, and Testing. 8-19 - Yehya H. Ghallab, Hamdy Abd Elhamid
, Yehea Ismail:
Lab on a Chip Based on CMOS Technology: System Architectures, Microfluidic Packaging, and Challenges. 20-31 - Xiwei Huang
, Hao Yu, Xu Liu, Yu Jiang, Mei Yan:
A Single-Frame Superresolution Algorithm for Lab-on-a-Chip Lensless Microfluidic Imaging. 32-40 - Robert Wille
, Oliver Keszöcze
, Rolf Drechsler
, Tobias Boehnisch, Alexander Kroker:
Scalable One-Pass Synthesis for Digital Microfluidic Biochips. 41-50 - Jeffrey McDaniel, Brian Crites, Philip Brisk
, William H. Grover
:
Flow-Layer Physical Design for Microchips Based on Monolithic Membrane Valves. 51-59 - Hailong Yao
, Qin Wang, Yizhong Ru, Yici Cai, Tsung-Yi Ho
:
Integrated Flow-Control Codesign Methodology for Flow-Based Microfluidic Biochips. 60-68 - Tsun-Ming Tseng
, Bing Li, Ulf Schlichtmann
, Tsung-Yi Ho
:
Storage and Caching: Synthesis of Flow-Based Microfluidic Biochips. 69-75 - Martin Barnasconi, Manfred Dietrich, Karsten Einwich, Thilo Vörtler, Jean-Paul Chaput, Marie-Minerve Louërat, François Pêcheux, Zhi Wang, Philippe Cuenot, Ingmar Neumann, Thang Nguyen, Ronan Lucas, Emmanuel Vaumorin:
UVM-SystemC-AMS Framework for System-Level Verification and Validation of Automotive Use Cases. 76-86 - Makoto Nagata
, Satoshi Takaya, Hiroaki Ikeda:
In-Place Signal and Power Noise Waveform Capturing Within 3-D Chip Stacking. 87-98 - Theo Theocharides:
Test Technology TC Newsletter. 110-111 - Scott Davidson:
Chips That Do Things. 112
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