"Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the ..."

Christoph Wilhelmer et al. (2021)

> Home

Details and statistics

DOI: 10.1109/ESSDERC53440.2021.9631833

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/WilhelmerJWECG21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/WilhelmerJWECG21
Christoph Wilhelmer, Markus Jech, Dominic Waldhoer, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Tibor Grasser:
Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network. ESSDERC 2021: 243-246

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.