"Secure Scan and Test Using Obfuscation Throughout Supply Chain."

Xiaoxiao Wang et al. (2018)

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DOI: 10.1109/TCAD.2017.2772817

access: closed

type: Journal Article

metadata version: 2022-09-26

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Xiaoxiao Wang, Dongrong Zhang, Miao Tony He, Donglin Su, Mark M. Tehranipoor:
Secure Scan and Test Using Obfuscation Throughout Supply Chain. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(9): 1867-1880 (2018)

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