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ORCIDJournal of Electronic Testing, Volume 37
Volume 37, Number 1, February 2021
- Vishwani D. Agrawal:
Editorial. 1-2 - 2020 JETTA Reviewers. 3-4
- Test Technology Newsletter. 5-6
- Umer Farooq
, Habib Mehrez:
Pre-Silicon Verification Using Multi-FPGA Platforms: A Review. 7-24 - Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal:
Estimating Operational Age of an Integrated Circuit. 25-40 - Sabyasachi Deyati, Barry J. Muldrey, Adit D. Singh, Abhijit Chatterjee:
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems. 41-63 - Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas:
Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier. 65-82 - Karthik Pandaram, S. Rathnapriya, V. Manikandan:
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm. 83-96 - Xijun Huang, Chuan-pei Xu, Long Zhang:
On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure. 97-107 - Sourav Ghosh, Surajit Kumar Roy, Chandan Giri:
Testing and Diagnosis of Digital Microfluidic Biochips using Multiple Droplets. 109-126 - Mengru Wang, Jinbo Wang, Jianmin Wang, Shan Zhou:
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model. 127-140 - Yindong Xiao, XueQian Huang, Ke Liu:
Model Transferability from ImageNet to Lithography Hotspot Detection. 141-149 - Partha Mitra, Jaydeb Bhaumik, Angsuman Sarkar:
Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip. 151-155
Volume 37, Number 2, April 2021
- Vishwani D. Agrawal:
Editorial. 157-158 - Test Technology Newsletter. 159-160
- Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. 161-189 - Vasileios Gerakis, Yiorgos Tsiatouhas, Alkis A. Hatzopoulos:
A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs. 191-203 - Wang-Dauh Tseng:
A Cascaded Multicasting Architecture for Test Data Compression. 205-214 - Lu Sun, Yang Li, Han Du, Peipei Liang, Fushun Nian:
Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model. 215-223 - Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. 225-242 - Muhammad Sheikh Sadi, Sumaiya Sumaiya, Mouly Dewan, Md. Atikur Rahman:
Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity. 243-254 - JianAn Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen:
Radiation Tolerant SRAM Cell Design in 65nm Technology. 255-262 - Cleiton Magano Marques, Cristina Meinhardt, Paulo Francisco Butzen:
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions. 263-270 - Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. 271-278 - Lijun Liu, Tao Wang, Xiaohan Wang:
Method of Implanting Hardware Trojan Based on EHW in Part of Circuit. 279-284
Volume 37, Number 3, June 2021
- Vishwani D. Agrawal:
Editorial. 285-286 - Test Technology Newsletter. 287-288
- Ievgen Kabin, Zoya Dyka, Dan Klann, Marcin Aftowicz, Peter Langendoerfer:
Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice. 289-303 - Yonghong Bai, Zhiyuan Yan:
A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes. 305-316 - Anindan Mondal, Rajesh Kumar Biswal, Mahabub Hasan Mahalat, Suchismita Roy, Bibhash Sen:
Hardware Trojan Free Netlist Identification: A Clustering Approach. 317-328 - Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen:
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. 329-343 - Mahamat Issa Boukhari, Djiddo Ali Oumar, Stéphane Capraro, D. Piétroy, J. P. Chatelon, Jean Jacques Rousseau:
Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors. 345-355 - S. Herasimov, M. Borysenko, E. Roshchupkin, Volodymyr I. Hrabchak, Yuriy A. Nastishin:
Spectrum Analyzer Based on a Dynamic Filter. 357-368 - Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas:
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. 369-382 - Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. 383-394 - Masoumeh Taali, Zahra Shirmohammadi:
A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula. 395-408 - Felix Loh, Kewal K. Saluja, Parameswaran Ramanathan:
Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method. 409-422
Volume 37, Number 4, August 2021
- Vishwani D. Agrawal:
Editorial. 423-424 - Test Technology Newsletter. 425-426
- Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke:
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. 427-437 - Milos Milovancevic, Aleksandar Dimov, Kamen Boyanov Spasov, Ljubomir Vracar, Miroslav Planic:
Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System. 439-452 - Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, Chien-Mo James Li, Tsung-Te Liu, I-Wei Chiu:
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits. 453-471 - Mahshid Tebyanian, Azadeh Mokhtarpour, Alireza Shafieinejad:
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier. 473-487 - Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. 489-502 - Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun:
Fault-Aware Dependability Enhancement Techniques for Phase Change Memory. 503-513 - Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb:
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability. 515-532 - Marco Grossi, Martin Omaña:
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers. 533-544 - Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu:
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems. 545-559 - Mishal Fatima Minhas, Osman Hasan, Sa'ed Abed:
HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits. 561-567
Volume 37, Number 5, December 2021
- Vishwani D. Agrawal:
Editorial. 569-570 - 2020 JETTA-TTTC Best Paper Award. 571-572
- TTTC Newsletter. 573-575
- Muralidharan Jayabalan, E. Srinivas, Francis H. Shajin, Paulthurai Rajesh:
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization. 577-592 - Jaynarayan T. Tudu, Satyadev Ahlawat, Sonali Shukla, Virendra Singh:
A Framework for Configurable Joint-Scan Design-for-Test Architecture. 593-611 - Zsombor Petho, Intiyaz Khan, Árpád Török:
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations. 613-621 - E. Jagadeeswara Rao, P. Samundiswary:
Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application. 623-631 - Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka:
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement. 633-652 - Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. 653-673 - Takefumi Yoshikawa, Masahiro Ishimaru, Tatsuya Iwata, Fuma Mori, Kazutoshi Kobayashi:
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment. 675-684 - Nikolaos Georgoulopoulos, Alkiviades A. Hatzopoulos:
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog. 685-700 - Xiaoyan Yang, Chenglin Yang, Houjun Wang:
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm. 701-713 - Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich:
Stress-Aware Periodic Test of Interconnects. 715-728
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