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ORCIDMojtaba Ebrahimi
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2020 – today
- 2023
[j18]Mojtaba Ebrahimi
, Mehdi Mahmoodjanloo, Behnam Einabadi, Armand Baboli, Eva Rother:
A mixed-model assembly line sequencing problem with parallel stations and walking workers: a case study in the automotive industry. Int. J. Prod. Res. 61(3): 993-1012 (2023)- [c38]Filippo Ciabattini, Akshay M. Arabhavi, Sara Hamzeloui, Mojtaba Ebrahimi, Olivier Ostinelli, Colombo R. Bolognesi:
Thermal Characterization of InP/GaAsSb DHBTs: Effect of Emitter and Collector Layers. BCICTS 2023: 24-27 - [c37]Sara Hamzeloui, Akshay M. Arabhavi, Filippo Ciabattini, Mojtaba Ebrahimi, Markus Müller, Olivier Ostinelli, Michael Schröter, Colombo R. Bolognesi:
Multi-Finger 250-nm InP/GaAsSb DHBTs with Record 37.3 % Class-A PAE at 94 GHz. BCICTS 2023: 145-148 - [c36]Anthony Chehami, Armand Baboli, Eva Rother, Behnam Einabadi, Mojtaba Ebrahimi:
A Comprehensive Method for Measuring Flexibility at the Individual and Global Levels: A Case Study in the Automotive Industry. CoDIT 2023: 1978-1983 - 2022
- [c35]Sara Hamzeloui, Filippo Ciabattini, Akshay M. Arabhavi, W. Quan, Diego Marti, Mojtaba Ebrahimi, Olivier Ostinelli, Colombo R. Bolognesi:
Highly-Linear InP/GaAsSb DHBTs with 18.2 dBm OIP3 at 45 GHz: Comparison of Common-Base and Common-Emitter Structures. BCICTS 2022: 108-111 - [c34]Anthony Chehami, Armand Baboli, Behnam Einabadi, Mojtaba Ebrahimi, Eva Rother:
Determination and Prioritization of Flexibility Types in the Context of Industry 4.0: A Use Case in Automotive Industry. IEEM 2022: 1529-1535 - 2020
- [j17]Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Selective Flip-Flop Optimization for Reliable Digital Circuit Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(7): 1484-1497 (2020)
2010 – 2019
- 2018
- [j16]Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 499-511 (2018) - 2017
- [j15]Nezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori:
Bias Temperature Instability Mitigation via Adaptive Cache Size Management. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1012-1022 (2017) - [j14]Saman Kiamehr, Mojtaba Ebrahimi, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Temperature-Aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing. IEEE Trans. Very Large Scale Integr. Syst. 25(7): 2017-2026 (2017) - [c33]Nour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Opportunistic write for fast and reliable STT-MRAM. DATE 2017: 554-559 - [c32]Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori:
Aging-aware coding scheme for memory arrays. ETS 2017: 1-6 - 2016
- [b1]Mojtaba Ebrahimi:
Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies. Karlsruhe Institute of Technology, 2016 - [j13]Mojtaba Ebrahimi, Hossein Asadi, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Layout-Based Modeling and Mitigation of Multiple Event Transients. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(3): 367-379 (2016) - [j12]Guillaume Prenat, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Nathalie Lamard, Olivier Boulle, Kevin Garello, Juergen Langer, Berthold Ocker, Marie Claire Cyrille, Pietro Gambardella, Mehdi Baradaran Tahoori, Gilles Gaudin:
Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing. IEEE Trans. Multi Scale Comput. Syst. 2(1): 49-60 (2016) - [j11]Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Reliability-Aware Resource Allocation and Binding in High-Level Synthesis. ACM Trans. Design Autom. Electr. Syst. 21(2): 30:1-30:27 (2016) - [j10]Mojtaba Ebrahimi, Parthasarathy Murali B. Rao, Razi Seyyedi, Mehdi Baradaran Tahoori:
Low-Cost Multiple Bit Upset Correction in SRAM-Based FPGA Configuration Frames. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 932-943 (2016) - [j9]Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Self-Timed Read and Write Operations in STT-MRAM. IEEE Trans. Very Large Scale Integr. Syst. 24(5): 1783-1793 (2016) - [c31]Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Fault injection acceleration by simultaneous injection of non-interacting faults. DAC 2016: 25:1-25:6 - [c30]Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Invited - Cross-layer approaches for soft error modeling and mitigation. DAC 2016: 32:1-32:6 - [c29]Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Variation-aware near threshold circuit synthesis. DATE 2016: 1237-1242 - [c28]Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
System-level reliability evaluation through cache-aware software-based fault injection. DDECS 2016: 9-14 - [c27]Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Temperature-aware Dynamic Voltage Scaling for Near-Threshold Computing. ACM Great Lakes Symposium on VLSI 2016: 361-364 - [c26]Mojtaba Ebrahimi, Maryam Rashvand, Firas Kaddachi, Mehdi Baradaran Tahoori, Giorgio Di Natale:
Revisiting software-based soft error mitigation techniques via accurate error generation and propagation models. IOLTS 2016: 66-71 - [c25]Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Online soft-error vulnerability estimation for memory arrays. VTS 2016: 1-6 - 2015
- [j8]Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths. J. Electron. Test. 31(2): 193-206 (2015) - [j7]Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori:
Extending standard cell library for aging mitigation. IET Comput. Digit. Tech. 9(4): 206-212 (2015) - [j6]Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis:
Application-aware cross-layer reliability analysis and optimization. it Inf. Technol. 57(3): 159-169 (2015) - [j5]Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(3): 367-380 (2015) - [j4]Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi:
Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(10): 1586-1599 (2015) - [c24]Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori:
Aging mitigation in memory arrays using self-controlled bit-flipping technique. ASP-DAC 2015: 231-236 - [c23]Mojtaba Ebrahimi, Razi Seyyedi, Liang Chen, Mehdi Baradaran Tahoori:
Event-driven transient error propagation: A scalable and accurate soft error rate estimation approach. ASP-DAC 2015: 743-748 - [c22]Mojtaba Ebrahimi, Nour Sayed, Maryam Rashvand, Mehdi Baradaran Tahoori:
Fault injection acceleration by architectural importance sampling. CODES+ISSS 2015: 212-219 - [c21]Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt:
Protecting caches against multi-bit errors using embedded erasure coding. ETS 2015: 1-6 - [c20]Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Reliability-aware operation chaining in high level synthesis. ETS 2015: 1-6 - [c19]Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Aging guardband reduction through selective flip-flop optimization. ETS 2015: 1-6 - [c18]Ali Ahari, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Energy efficient partitioning of dynamic reconfigurable MRAM-FPGAs. FPL 2015: 1-6 - [c17]Ali Ahari, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori:
Improving reliability, performance, and energy efficiency of STT-MRAM with dynamic write latency. ICCD 2015: 109-116 - [c16]Fabian Oboril, Mojtaba Ebrahimi, Saman Kiamehr, Mehdi Baradaran Tahoori:
Cross-layer resilient system design flow. ISCAS 2015: 2457-2460 - [c15]Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Stepped parity: A low-cost multiple bit upset detection technique. ITC 2015: 1-8 - 2014
- [j3]Mojtaba Ebrahimi, Abbas Mohammadi, Alireza Ejlali, Seyed Ghassem Miremadi:
A fast, flexible, and easy-to-develop FPGA-based fault injection technique. Microelectron. Reliab. 54(5): 1000-1008 (2014) - [c14]Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori:
Architectural aspects in design and analysis of SOT-based memories. ASP-DAC 2014: 700-707 - [c13]Parthasarathy M. B. Rao, Mojtaba Ebrahimi, Razi Seyyedi, Mehdi Baradaran Tahoori:
Protecting SRAM-based FPGAs Against Multiple Bit Upsets Using Erasure Codes. DAC 2014: 212:1-212:6 - [c12]Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori:
Asynchronous Asymmetrical Write Termination (AAWT) for a low power STT-MRAM. DATE 2014: 1-6 - [c11]Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu:
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales. DATE 2014: 1-6 - [c10]Saman Kiamehr, Farshad Firouzi, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Aging-aware standard cell library design. DATE 2014: 1-4 - [c9]Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Quantitative evaluation of register vulnerabilities in RTL control paths. ETS 2014: 1-2 - [c8]Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Avoiding unnecessary write operations in STT-MRAM for low power implementation. ISQED 2014: 548-553 - [c7]Rajendra Bishnoi, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori:
Read disturb fault detection in STT-MRAM. ITC 2014: 1-7 - [i1]Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Michael Glaß, Faramarz Khosravi, Mehdi Baradaran Tahoori:
Towards Cross-layer Reliability Analysis of Transient and Permanent Faults. CoRR abs/1405.2914 (2014) - 2013
- [j2]Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis. J. Electron. Test. 29(2): 143-158 (2013) - [j1]Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Hossein Asadi, Mahdi Fazeli:
Low-Cost Scan-Chain-Based Technique to Recover Multiple Errors in TMR Systems. IEEE Trans. Very Large Scale Integr. Syst. 21(8): 1454-1468 (2013) - [c6]Mojtaba Ebrahimi, Liang Chen, Hossein Asadi, Mehdi Baradaran Tahoori:
CLASS: Combined logic and architectural soft error sensitivity analysis. ASP-DAC 2013: 601-607 - [c5]Mojtaba Ebrahimi, Hossein Asadi, Mehdi Baradaran Tahoori:
A layout-based approach for multiple event transient analysis. DAC 2013: 100:1-100:6 - [c4]Mojtaba Ebrahimi, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori:
Aging-aware logic synthesis. ICCAD 2013: 61-68 - [c3]Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori:
Chip-level modeling and analysis of electrical masking of soft errors. VTS 2013: 1-6 - 2012
- [c2]Abbas Mohammadi, Mojtaba Ebrahimi, Alireza Ejlali, Seyed Ghassem Miremadi:
SCFIT: A FPGA-based fault injection technique for SEU fault model. DATE 2012: 586-589 - 2011
- [c1]Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Hossein Asadi:
ScTMR: A scan chain-based error recovery technique for TMR systems in safety-critical applications. DATE 2011: 298-292
Coauthor Index
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