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James R. Moyne
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2020 – today
- 2024
- [j15]Mark O. Neisser
, Ndubuisi G. Orji
, Harry J. Levinson
, Umberto Celano
, James R. Moyne
, Supika Mashiro
, Dan Wilcox
, Slava Libman
:
How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning. Computer 57(1): 51-58 (2024) - [j14]Efe C. Balta
, Michael Pease
, James R. Moyne
, Kira Barton
, Dawn M. Tilbury
:
Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems. IEEE Trans Autom. Sci. Eng. 21(2): 1695-1712 (2024) - 2023
- [j13]Maxwell Toothman
, Birgit Braun, Scott J. Bury
, James R. Moyne, Dawn M. Tilbury, Yixin Ye, Kira Barton:
A digital twin framework for prognostics and health management. Comput. Ind. 150: 103948 (2023) - [j12]Ilya Kovalenko
, Kira Barton
, James R. Moyne
, Dawn M. Tilbury
:
Opportunities and Challenges to Integrate Artificial Intelligence Into Manufacturing Systems: Thoughts From a Panel Discussion [Opinion]. IEEE Robotics Autom. Mag. 30(2): 109-112 (2023) - [j11]Maxwell Toothman
, Birgit Braun, Scott J. Bury
, James R. Moyne, Dawn M. Tilbury, Yixin Ye, Kira Barton
:
Overcoming Challenges Associated with Developing Industrial Prognostics and Health Management Solutions. Sensors 23(8): 4009 (2023) - [c25]Maxwell Toothman, Birgit Braun, Scott J. Bury, James R. Moyne, Dawn M. Tilbury, Kira Barton:
An Adaptive, State-Based Framework for Fault Prediction in Rotating Equipment. CASE 2023: 1-6 - [i2]Ilya Kovalenko, Kira Barton, James R. Moyne, Dawn M. Tilbury:
Opportunities and Challenges to Integrate Artificial Intelligence into Manufacturing Systems: Thoughts from a Panel Discussion. CoRR abs/2303.11139 (2023) - 2022
- [j10]Ilya Kovalenko
, James R. Moyne
, Mingjie Bi
, Efe C. Balta, Wenyuan Ma, Yassine Qamsane
, Xiao Zhu
, Z. Morley Mao
, Dawn M. Tilbury
, Kira Barton
:
Toward an Automated Learning Control Architecture for Cyber-Physical Manufacturing Systems. IEEE Access 10: 38755-38773 (2022) - 2021
- [j9]Yassine Qamsane
, James R. Moyne
, Maxwell Toothman
, Ilya Kovalenko
, Efe C. Balta
, John Faris, Dawn M. Tilbury
, Kira Barton
:
A Methodology to Develop and Implement Digital Twin Solutions for Manufacturing Systems. IEEE Access 9: 44247-44265 (2021) - [j8]Maxwell Toothman
, Birgit Braun, Scott J. Bury
, Michael Dessauer, Kaytlin Henderson, Ray Wright, Dawn M. Tilbury
, James R. Moyne
, Kira Barton
:
Trend-Based Repair Quality Assessment for Industrial Rotating Equipment. IEEE Control. Syst. Lett. 5(5): 1675-1680 (2021) - [c24]Maxwell Toothman, Birgit Braun, Scott J. Bury
, Michael Dessauer, Kaytlin Henderson, Ray Wright, Dawn M. Tilbury, James R. Moyne, Kira Barton:
Trend-based repair quality assessment for industrial rotating equipment. ACC 2021: 502-507 - [i1]Hao Wang, Yassine Qamsane, James R. Moyne, Kira Barton:
Merging Subject Matter Expertise and Deep Convolutional Neural Network for State-Based Online Machine-Part Interaction Classification. CoRR abs/2112.04572 (2021) - 2020
- [j7]James R. Moyne
, Yassine Qamsane
, Efe C. Balta
, Ilya Kovalenko
, John Faris, Kira Barton, Dawn M. Tilbury:
A Requirements Driven Digital Twin Framework: Specification and Opportunities. IEEE Access 8: 107781-107801 (2020)
2010 – 2019
- 2019
- [c23]Yassine Qamsane
, Efe C. Balta, James R. Moyne, Dawn M. Tilbury, Kira Barton:
Dynamic Rerouting of Cyber-Physical Production Systems in Response to Disruptions Based on SDC Framework. ACC 2019: 3650-3657 - [c22]Yassine Qamsane
, Chien-Ying Chen, Efe C. Balta, Bin-Chou Kao, Sibin Mohan
, James R. Moyne, Dawn M. Tilbury, Kira Barton:
A Unified Digital Twin Framework for Real-time Monitoring and Evaluation of Smart Manufacturing Systems. CASE 2019: 1394-1401 - [c21]Mu Zhang
, Chien-Ying Chen, Bin-Chou Kao, Yassine Qamsane
, Yuru Shao, Yikai Lin, Elaine Shi, Sibin Mohan, Kira Barton, James R. Moyne, Z. Morley Mao:
Towards Automated Safety Vetting of PLC Code in Real-World Plants. IEEE Symposium on Security and Privacy 2019: 522-538 - 2018
- [c20]Zheng Wang, Farshad Harirchi, Dhananjay M. Anand, Chee Yee Tang, James R. Moyne, Dawn M. Tilbury:
Conflict-driven Hybrid Observer-based Anomaly Detection. ACC 2018: 5793-5800 - 2017
- [j6]Felipe Lopez
, Miguel Saez, Yuru Shao, Efe C. Balta
, James R. Moyne, Zhuoqing Morley Mao, Kira Barton, Dawn M. Tilbury:
Categorization of Anomalies in Smart Manufacturing Systems to Support the Selection of Detection Mechanisms. IEEE Robotics Autom. Lett. 2(4): 1885-1892 (2017) - 2015
- [j5]Dhananjay M. Anand, Rupert Tull de Salis, Yijie Cheng
, James R. Moyne, Dawn M. Tilbury:
A Hierarchical Incentive Arbitration Scheme for Coordinated PEV Charging Stations. IEEE Trans. Smart Grid 6(4): 1775-1784 (2015) - [r1]James R. Moyne:
Run-to-Run Control in Semiconductor Manufacturing. Encyclopedia of Systems and Control 2015 - 2014
- [c19]James R. Moyne, Martin Schellenberger, Lothar Pfitzner:
The Factory Integration Roadmap in Semiconductor manufacturing. ESSDERC 2014: 154-156 - 2012
- [c18]Julien Amelot, Jeffrey G. Fletcher, Ya-Shian Li-Baboud, Dhananjay M. Anand, Clement Vasseur, James R. Moyne:
An IEEE 1588 performance testing dashboard for power industry requirements. PerMIS 2012: 216-222 - 2010
- [c17]Dhananjay M. Anand, Jeffrey G. Fletcher, Ya-Shian Li-Baboud, James R. Moyne:
A practical implementation of distributed system control over an asynchronous Ethernet network using time stamped data. CASE 2010: 515-520
2000 – 2009
- 2009
- [c16]Dhananjay M. Anand, James R. Moyne, Dawn M. Tilbury:
Performance evaluation of wireless networks for factory automation applications. CASE 2009: 340-346 - [p2]James R. Moyne, Dawn M. Tilbury:
Networked Control Systems for Manufacturing: Parameterization, Differentiation, Evaluation and Application. Networked Embedded Systems 2009: 23 - 2008
- [c15]Lindsay V. Allen, Jing Zhang, James R. Moyne, Dawn M. Tilbury:
Factory-level control consolidation using Event-Condition-Action: Case study on the reconfigurable factory testbed. ACC 2008: 1715-1721 - [c14]Jing Zhang, James R. Moyne, Dawn M. Tilbury:
Verification of ECA rule based management and control systems. CASE 2008: 1-7 - [c13]Kyle Schroeder, James R. Moyne, Dawn M. Tilbury:
A Factory Health Monitor: System identification, process monitoring, and control. CASE 2008: 16-22 - 2007
- [j4]James R. Moyne, Dawn M. Tilbury:
The Emergence of Industrial Control Networks for Manufacturing Control, Diagnostics, and Safety Data. Proc. IEEE 95(1): 29-47 (2007) - 2006
- [j3]Feng-Li Lian
, John K. Yook, Dawn M. Tilbury, James R. Moyne:
Network architecture and communication modules for guaranteeing acceptable control and communication performance for networked multi-agent systems. IEEE Trans. Ind. Informatics 2(1): 12-24 (2006) - [c12]Jonathan Parrott, James R. Moyne, Dawn M. Tilbury:
Experimental determination of network quality of service in Ethernet: UDP, OPC, and VPN. ACC 2006: 1-6 - [c11]Marco Antolovic, Kristen Acton, Naveen Kalappa, Siddharth Mantri, Jonathan Parrott, Jonathan E. Luntz, James R. Moyne, Dawn M. Tilbury:
PLC Communication using PROFINET: Experimental Results and Analysis. ETFA 2006 - [c10]Bradley Triden, Siddharth Mantri, Kyle Schroeder, Aditya Thomas, James R. Moyne, Dawn M. Tilbury:
Dedicated vs. Shared Networks for Safety and Controls: An analysis of the trade-offs involved. ETFA 2006: 341-347 - [c9]Naveen Kalappa, Kristen Acton, Marco Antolovic, Siddharth Mantri, Jonathan Parrott, Jonathan E. Luntz, James R. Moyne, Dawn M. Tilbury:
Experimental Determination of Real Time Peer to Peer Communication Characteristics of EtherNet/IP. ETFA 2006: 1061-1064 - 2005
- [c8]Jonathan E. Luntz, James R. Moyne, Dawn M. Tilbury:
On-line control reconfiguration at the machine and cell levels: case studies from the reconfigurable factory testbed. ETFA 2005 - [p1]Feng-Li Lian, James R. Moyne, Dawn M. Tilbury:
Network Protocols for Networked Control Systems. Handbook of Networked and Embedded Control Systems 2005: 651-676 - 2003
- [c7]Feng-Li Lian, John K. Yook, Paul G. Otanez, Dawn M. Tilbury, James R. Moyne:
Design of sampling and transmission rates for achieving control and communication performance in networked agent systems. ACC 2003: 3329-3334 - 2002
- [c6]Feng-Li Lian, James R. Moyne, Dawn M. Tilbury:
Optimal controller design and evaluation for a class of networked control systems with distributed constant delays. ACC 2002: 3009-3014 - [c5]Paul G. Otanez, James R. Moyne, Dawn M. Tilbury:
Using deadbands to reduce communication in networked control systems. ACC 2002: 3015-3020 - 2001
- [c4]Feng-Li Lian, James R. Moyne, Dawn M. Tilbury:
Analysis and modeling of networked control systems: MIMO case with multiple time delays. ACC 2001: 4306-4312 - 2000
- [c3]Feng-Li Lian, James R. Moyne, Dawn M. Tilbury:
Control performance study of a networked machining cell. ACC 2000: 2337-2341
1990 – 1999
- 1999
- [j2]Nauman A. Chaudhry, James R. Moyne, Elke A. Rundensteiner:
An Extended Database Design Methodology for Uncertain Data Management. Inf. Sci. 121(1-2): 83-112 (1999) - 1998
- [c2]Nauman A. Chaudhry, James R. Moyne, Elke A. Rundensteiner:
A Formal Model for Rule Inheritance and Overriding in Active Object-Oriented Databases. IADT 1998: 128-135 - 1994
- [c1]Nauman A. Chaudhry, James R. Moyne, Elke A. Rundensteiner:
A Design Methodology for Databases with Uncertain Data. SSDBM 1994: 32-41 - 1991
- [j1]James R. Moyne, Toby J. Teorey, Leo C. McAfee Jr.:
Time sequence ordering extensions to the Entity-Relationship model and their application to the automated manufacturing process. Data Knowl. Eng. 6: 421-443 (1991)
Coauthor Index
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