"Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep ..."

Filippo Boni et al. (2024)

> Home

Details and statistics

DOI: 10.1109/CODIT62066.2024.10708503

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/codit/BoniMYGLS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/codit/BoniMYGLS24
Filippo Boni, Riccardo De Monte, Yao Yang, Natalie Gentner, Joon Khim Low, Gian Antonio Susto:
Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation. CoDIT 2024: 1414-1419

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.