Atmel 2513 8 Bit AVR Microntroller ATmega162 Datasheet
Atmel 2513 8 Bit AVR Microntroller ATmega162 Datasheet
Atmel 2513 8 Bit AVR Microntroller ATmega162 Datasheet
8-bit Microcontroller
Advanced RISC Architecture
131 Powerful Instructions Most Single-clock Cycle Execution
32 x 8 General Purpose Working Registers
Fully Static Operation
Up to 16 MIPS Throughput at 16 MHz
On-chip 2-cycle Multiplier
High Endurance Non-volatile Memory segments
16K Bytes of In-System Self-programmable Flash program memory
512 Bytes EEPROM
1K Bytes Internal SRAM
Write/Erase cycles: 10,000 Flash/100,000 EEPROM
Data retention: 20 years at 85C/100 years at 25C
(1)
Optional Boot Code Section with Independent Lock Bits
In-System Programming by On-chip Boot Program
True Read-While-Write Operation
Up to 64K Bytes Optional External Memory Space
Programming Lock for Software Security
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the JTAG Standard
Extensive On-chip Debug Support
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
Peripheral Features
Two 8-bit Timer/Counters with Separate Prescalers and Compare Modes
Two 16-bit Timer/Counters with Separate Prescalers, Compare Modes, and
Capture Modes
Real Time Counter with Separate Oscillator
Six PWM Channels
Dual Programmable Serial USARTs
Master/Slave SPI Serial Interface
Programmable Watchdog Timer with Separate On-chip Oscillator
On-chip Analog Comparator
Special Microcontroller Features
Power-on Reset and Programmable Brown-out Detection
Internal Calibrated RC Oscillator
External and Internal Interrupt Sources
Five Sleep Modes: Idle, Power-save, Power-down, Standby, and Extended Standby
I/O and Packages
35 Programmable I/O Lines
40-pin PDIP, 44-lead TQFP, and 44-pad MLF
Operating Voltages
1.8 - 5.5V for ATmega162V
2.7 - 5.5V for ATmega162
Speed Grades
0 - 8 MHz for ATmega162V (see Figure 113 on page 266)
0 - 16 MHz for ATmega162 (see Figure 114 on page 266)
8-bit
Microcontroller
with 16K Bytes
In-System
Programmable
Flash
ATmega162
ATmega162V
2513LAVR03/2013
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ATmega162/V
Pin
Configurations
Figure 1. Pinout ATmega162
Disclaimer Typical values contained in this datasheet are based on simulations and characterization of
other AVR microcontrollers manufactured on the same process technology. Min and Max values
will be available after the device is characterized.
(OC0/T0) PB0
(OC2/T1) PB1
(RXD1/AIN0) PB2
(TXD1/AIN1) PB3
(SS/OC3B) PB4
(MOSI) PB5
(MISO) PB6
(SCK) PB7
RESET
(RXD0) PD0
(TXD0) PD1
(INT0/XCK1) PD2
(INT1/ICP3) PD3
(TOSC1/XCK0/OC3A) PD4
(OC1A/TOSC2) PD5
(WR) PD6
(RD) PD7
XTAL2
XTAL1
GND
VCC
PA0 (AD0/PCINT0)
PA1 (AD1/PCINT1)
PA2 (AD2/PCINT2)
PA3 (AD3/PCINT3)
PA4 (AD4/PCINT4)
PA5 (AD5/PCINT5)
PA6 (AD6/PCINT6)
PA7 (AD7/PCINT7)
PE0 (ICP1/INT2)
PE1 (ALE)
PE2 (OC1B)
PC7 (A15/TDI/PCINT15)
PC6 (A14/TDO/PCINT14)
PC5 (A13/TMS/PCINT13)
PC4 (A12/TCK/PCINT12)
PC3 (A11/PCINT11)
PC2 (A10/PCINT10)
PC1 (A9/PCINT9)
PC0 (A8/PCINT8)
PA4 (AD4/PCINT4)
PA5 (AD5/PCINT5)
PA6 (AD6/PCINT6)
PA7 (AD7/PCINT7)
PE0 (ICP1/INT2)
GND
PE1 (ALE)
PE2 (OC1B)
PC7 (A15/TDI/PCINT15)
PC6 (A14/TDO/PCINT14)
PC5 (A13/TMS/PCINT13)
(MOSI) PB5
(MISO) PB6
(SCK) PB7
RESET
(RXD0) PD0
VCC
(TXD0) PD1
(INT0/XCK1) PD2
(INT1/ICP3) PD3
(TOSC1/XCK0/OC3A) PD4
(OC1A/TOSC2) PD5
(
W
R
)
P
D
6
(
R
D
)
P
D
7
X
T
A
L
2
X
T
A
L
1
G
N
D
V
C
C
(
A
8
/
P
C
I
N
T
8
)
P
C
0
(
A
9
/
P
C
I
N
T
9
)
P
C
1
(
A
1
0
/
P
C
I
N
T
1
0
)
P
C
2
(
A
1
1
/
P
C
I
N
T
1
1
)
P
C
3
(
T
C
K
/
A
1
2
/
P
C
I
N
T
1
2
)
P
C
4
P
B
4
(
S
S
/
O
C
3
B
)
P
B
3
(
T
X
D
1
/
A
I
N
1
)
P
B
2
(
R
X
D
1
/
A
I
N
0
)
P
B
1
(
O
C
2
/
T
1
)
P
B
0
(
O
C
0
/
T
0
)
G
N
D
V
C
C
P
A
0
(
A
D
0
/
P
C
I
N
T
0
)
P
A
1
(
A
D
1
/
P
C
I
N
T
1
)
P
A
2
(
A
D
2
/
P
C
I
N
T
2
)
P
A
3
(
A
D
3
/
P
C
I
N
T
3
)
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
PDIP
1
2
3
4
5
6
7
8
9
10
11
12 14 16 18 20 22
13 15 17 19 21
33
32
31
30
29
28
27
26
25
24
23
44 42 40 38 36 34
43 41 39 37 35
TQFP/MLF
NOTE:
MLF bottom pad should
be soldered to ground.
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ATmega162/V
Overview The ATmega162 is a low-power CMOS 8-bit microcontroller based on the AVR enhanced RISC
architecture. By executing powerful instructions in a single clock cycle, the ATmega162
achieves throughputs approaching 1 MIPS per MHz allowing the system designer to optimize
power consumption versus processing speed.
Block Diagram Figure 2. Block Diagram
INTERNAL
OSCILLATOR
OSCILLATOR
WATCHDOG
TIMER
MCU CTRL.
& TIMING
OSCILLATOR
TIMERS/
COUNTERS
INTERRUPT
UNIT
STACK
POINTER
EEPROM
SRAM
STATUS
REGISTER
USART0
PROGRAM
COUNTER
PROGRAM
FLASH
INSTRUCTION
REGISTER
INSTRUCTION
DECODER
PROGRAMMING
LOGIC
SPI
COMP.
INTERFACE
PORTA DRIVERS/BUFFERS
PORTA DIGITAL INTERFACE
GENERAL
PURPOSE
REGISTERS
X
Y
Z
ALU
+
-
PORTC DRIVERS/BUFFERS
PORTC DIGITAL INTERFACE
PORTB DIGITAL INTERFACE
PORTB DRIVERS/BUFFERS
PORTD DIGITAL INTERFACE
PORTD DRIVERS/BUFFERS
XTAL1
XTAL2
RESET
CONTROL
LINES
VCC
GND
PA0 - PA7 PC0 - PC7
PD0 - PD7 PB0 - PB7
AVR CPU
INTERNAL
CALIBRATED
OSCILLATOR
PORTE
DRIVERS/
BUFFERS
PORTE
DIGITAL
INTERFACE
PE0 - PE2
USART1
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The AVR core combines a rich instruction set with 32 general purpose working registers. All the
32 registers are directly connected to the Arithmetic Logic Unit (ALU), allowing two independent
registers to be accessed in one single instruction executed in one clock cycle. The resulting
architecture is more code efficient while achieving throughputs up to ten times faster than con-
ventional CISC microcontrollers.
The ATmega162 provides the following features: 16K bytes of In-System Programmable Flash
with Read-While-Write capabilities, 512 bytes EEPROM, 1K bytes SRAM, an external memory
interface, 35 general purpose I/O lines, 32 general purpose working registers, a J TAG interface
for Boundary-scan, On-chip Debugging support and programming, four flexible Timer/Counters
with compare modes, internal and external interrupts, two serial programmable USARTs, a pro-
grammable Watchdog Timer with Internal Oscillator, an SPI serial port, and five software
selectable power saving modes. The Idle mode stops the CPU while allowing the SRAM,
Timer/Counters, SPI port, and interrupt system to continue functioning. The Power-down mode
saves the register contents but freezes the Oscillator, disabling all other chip functions until the
next interrupt or Hardware Reset. In Power-save mode, the Asynchronous Timer continues to
run, allowing the user to maintain a timer base while the rest of the device is sleeping. In
Standby mode, the crystal/resonator Oscillator is running while the rest of the device is sleeping.
This allows very fast start-up combined with low-power consumption. In Extended Standby
mode, both the main Oscillator and the Asynchronous Timer continue to run.
The device is manufactured using Atmels high density non-volatile memory technology. The
On-chip ISP Flash allows the program memory to be reprogrammed In-System through an SPI
serial interface, by a conventional non-volatile memory programmer, or by an On-chip Boot Pro-
gram running on the AVR core. The Boot Program can use any interface to download the
Application Program in the Application Flash memory. Software in the Boot Flash section will
continue to run while the Application Flash section is updated, providing true Read-While-Write
operation. By combining an 8-bit RISC CPU with In-System Self-Programmable Flash on a
monolithic chip, the Atmel ATmega162 is a powerful microcontroller that provides a highly flexi-
ble and cost effective solution to many embedded control applications.
The ATmega162 AVR is supported with a full suite of program and system development tools
including: C compilers, macro assemblers, program debugger/simulators, In-Circuit Emulators,
and evaluation kits.
ATmega161 and
ATmega162
Compatibility
The ATmega162 is a highly complex microcontroller where the number of I/O locations super-
sedes the 64 I/O locations reserved in the AVR instruction set. To ensure back-ward
compatibility with the ATmega161, all I/O locations present in ATmega161 have the same loca-
tions in ATmega162. Some additional I/O locations are added in an Extended I/O space starting
from 0x60 to 0xFF, (i.e., in the ATmega162 internal RAM space). These locations can be
reached by using LD/LDS/LDD and ST/STS/STD instructions only, not by using IN and OUT
instructions. The relocation of the internal RAM space may still be a problem for ATmega161
users. Also, the increased number of Interrupt Vectors might be a problem if the code uses
absolute addresses. To solve these problems, an ATmega161 compatibility mode can be
selected by programming the fuse M161C. In this mode, none of the functions in the Extended
I/O space are in use, so the internal RAM is located as in ATmega161. Also, the Extended Inter-
rupt Vec-tors are removed. The ATmega162 is 100% pin compatible with ATmega161, and can
replace the ATmega161 on current Printed Circuit Boards. However, the location of Fuse bits
and the electrical characteristics differs between the two devices.
ATmega161
Compatibility Mode
Programming the M161C will change the following functionality:
The extended I/O map will be configured as internal RAM once the M161C Fuse is
programmed.
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The timed sequence for changing the Watchdog Time-out period is disabled. See Timed
Sequences for Changing the Configuration of the Watchdog Timer on page 56 for details.
The double buffering of the USART Receive Registers is disabled. See AVR USART vs.
AVR UART Compatibility on page 168 for details.
Pin change interrupts are not supported (Control Registers are located in Extended I/O).
One 16 bits Timer/Counter (Timer/Counter1) only. Timer/Counter3 is not accessible.
Note that the shared UBRRHI Register in ATmega161 is split into two separate registers in
ATmega162, UBRR0H and UBRR1H. The location of these registers will not be affected by the
ATmega161 compatibility fuse.
Pin Descriptions
VCC Digital supply voltage
GND Ground
Port A (PA7..PA0) Port A is an 8-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). The
Port A output buffers have symmetrical drive characteristics with both high sink and source
capability. When pins PA0 to PA7 are used as inputs and are externally pulled low, they will
source current if the internal pull-up resistors are activated. The Port A pins are tri-stated when a
reset condition becomes active, even if the clock is not running.
Port A also serves the functions of various special features of the ATmega162 as listed on page
72.
Port B (PB7..PB0) Port B is an 8-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). The
Port B output buffers have symmetrical drive characteristics with both high sink and source
capability. As inputs, Port B pins that are externally pulled low will source current if the pull-up
resistors are activated. The Port B pins are tri-stated when a reset condition becomes active,
even if the clock is not running.
Port B also serves the functions of various special features of the ATmega162 as listed on page
72.
Port C (PC7..PC0) Port C is an 8-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). The
Port C output buffers have symmetrical drive characteristics with both high sink and source
capability. As inputs, Port C pins that are externally pulled low will source current if the pull-up
resistors are activated. The Port C pins are tri-stated when a reset condition becomes active,
even if the clock is not running. If the J TAG interface is enabled, the pull-up resistors on pins
PC7(TDI), PC5(TMS) and PC4(TCK) will be activated even if a Reset occurs.
Port C also serves the functions of the J TAG interface and other special features of the
ATmega162 as listed on page 75.
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ATmega162/V
Port D (PD7..PD0) Port D is an 8-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). The
Port D output buffers have symmetrical drive characteristics with both high sink and source
capability. As inputs, Port D pins that are externally pulled low will source current if the pull-up
resistors are activated. The Port D pins are tri-stated when a reset condition becomes active,
even if the clock is not running.
Port D also serves the functions of various special features of the ATmega162 as listed on page
78.
Port E(PE2..PE0) Port E is an 3-bit bi-directional I/O port with internal pull-up resistors (selected for each bit). The
Port E output buffers have symmetrical drive characteristics with both high sink and source
capability. As inputs, Port E pins that are externally pulled low will source current if the pull-up
resistors are activated. The Port E pins are tri-stated when a reset condition becomes active,
even if the clock is not running.
Port E also serves the functions of various special features of the ATmega162 as listed on page
81.
RESET Reset input. A low level on this pin for longer than the minimum pulse length will generate a
Reset, even if the clock is not running. The minimum pulse length is given in Table 18 on page
48. Shorter pulses are not guaranteed to generate a reset.
XTAL1 Input to the Inverting Oscillator amplifier and input to the internal clock operating circuit.
XTAL2 Output from the Inverting Oscillator amplifier.
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ATmega162/V
Resources A comprehensive set of development tools, application notes and datasheets are available for
download on http://www.atmel.com/avr.
Note: 1.
Data Retention Reliability Qualification results show that the projected data retention failure rate is much less
than 1 PPM over 20 years at 85C or 100 years at 25C.
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ATmega162/V
About Code
Examples
This documentation contains simple code examples that briefly show how to use various parts of
the device. These code examples assume that the part specific header file is included before
compilation. Be aware that not all C compiler vendors include bit definitions in the header files
and interrupt handling in C is compiler dependent. Please confirm with the C compiler documen-
tation for more details.
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ATmega162/V
AVR CPU Core
Introduction This section discusses the AVR core architecture in general. The main function of the CPU core
is to ensure correct program execution. The CPU must therefore be able to access memories,
perform calculations, control peripherals, and handle interrupts.
Architectural
Overview
Figure 3. Block Diagram of the AVR Architecture
In order to maximize performance and parallelism, the AVR uses a Harvard architecture with
separate memories and buses for program and data. Instructions in the program memory are
executed with a single level pipelining. While one instruction is being executed, the next instruc-
tion is pre-fetched from the program memory. This concept enables instructions to be executed
in every clock cycle. The program memory is In-System Reprogrammable Flash memory.
The fast-access Register File contains 32 x 8-bit general purpose working registers with a single
clock cycle access time. This allows single-cycle Arithmetic Logic Unit (ALU) operation. In a typ-
ical ALU operation, two operands are output from the Register File, the operation is executed,
and the result is stored back in the Register File in one clock cycle.
Six of the 32 registers can be used as three 16-bit indirect address register pointers for Data
Space addressing enabling efficient address calculations. One of the these address pointers
Flash
Program
Memory
Instruction
Register
Instruction
Decoder
Program
Counter
Control Lines
32 x 8
General
Purpose
Registrers
ALU
Status
and Control
I/O Lines
EEPROM
Data Bus 8-bit
Data
SRAM
D
i
r
e
c
t
A
d
d
r
e
s
s
i
n
g
I
n
d
i
r
e
c
t
A
d
d
r
e
s
s
i
n
g
Interrupt
Unit
SPI
Unit
Watchdog
Timer
Analog
Comparator
I/O Module 2
I/O Module1
I/O Module n
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ATmega162/V
can also be used as an address pointer for look up tables in Flash Program memory. These
added function registers are the 16-bit X-, Y-, and Z-register, described later in this section.
The ALU supports arithmetic and logic operations between registers or between a constant and
a register. Single register operations can also be executed in the ALU. After an arithmetic opera-
tion, the Status Register is updated to reflect information about the result of the operation.
Program flow is provided by conditional and unconditional jump and call instructions, able to
directly address the whole address space. Most AVR instructions have a single 16-bit word for-
mat. Every program memory address contains a 16- or 32-bit instruction.
Program Flash memory space is divided in two sections, the Boot Program section and the
Application Program section. Both sections have dedicated Lock bits for write and read/write
protection. The SPM instruction that writes into the Application Flash memory section must
reside in the Boot Program section.
During interrupts and subroutine calls, the return address Program Counter (PC) is stored on the
Stack. The Stack is effectively allocated in the general data SRAM, and consequently the Stack
size is only limited by the total SRAM size and the usage of the SRAM. All user programs must
initialize the SP in the reset routine (before subroutines or interrupts are executed). The Stack
Pointer SP is read/write accessible in the I/O space. The data SRAM can easily be accessed
through the five different addressing modes supported in the AVR architecture.
The memory spaces in the AVR architecture are all linear and regular memory maps.
A flexible interrupt module has its control registers in the I/O space with an additional Global
Interrupt Enable bit in the Status Register. All interrupts have a separate Interrupt Vector in the
Interrupt Vector table. The interrupts have priority in accordance with their Interrupt Vector posi-
tion. The lower the Interrupt Vector address, the higher the priority.
The I/O memory space contains 64 addresses for CPU peripheral functions as Control Regis-
ters, SPI, and other I/O functions. The I/O memory can be accessed directly, or as the Data
Space locations following those of the Register File, 0x20 - 0x5F.
ALU Arithmetic
Logic Unit
The high-performance AVR ALU operates in direct connection with all the 32 general purpose
working registers. Within a single clock cycle, arithmetic operations between general purpose
registers or between a register and an immediate are executed. The ALU operations are divided
into three main categories arithmetic, logical, and bit-functions. Some implementations of the
architecture also provide a powerful multiplier supporting both signed/unsigned multiplication
and fractional format. See the Instruction Set section for a detailed description.
Status Register The Status Register contains information about the result of the most recently executed arithme-
tic instruction. This information can be used for altering program flow in order to perform
conditional operations. Note that the Status Register is updated after all ALU operations, as
specified in the Instruction Set Reference. This will in many cases remove the need for using the
dedicated compare instructions, resulting in faster and more compact code.
The Status Register is not automatically stored when entering an interrupt routine and restored
when returning from an interrupt. This must be handled by software.
The AVR Status Register SREG is defined as:
Bit 7 6 5 4 3 2 1 0
I T H S V N Z C SREG
Read/Write R/W R/W R/W R/W R/W R/W R/W R/W
Initial Value 0 0 0 0 0 0 0 0
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Bit 7 I: Global Interrupt Enable
The Global Interrupt Enable bit must be set for the interrupts to be enabled. The individual inter-
rupt enable control is then performed in separate control registers. If the Global Interrupt Enable
Register is cleared, none of the interrupts are enabled independent of the individual interrupt
enable settings. The I-bit is cleared by hardware after an interrupt has occurred, and is set by
the RETI instruction to enable subsequent interrupts. The I-bit can also be set and cleared by
the application with the SEI and CLI instructions, as described in the instruction set reference.
Bit 6 T: Bit Copy Storage
The Bit Copy instructions BLD (Bit LoaD) and BST (Bit STore) use the T bit as source or destina-
tion for the operated bit. A bit from a register in the Register File can be copied into T by the BST
instruction, and a bit in T can be copied into a bit in a register in the Register File by the BLD
instruction.
Bit 5 H: Half Carry Flag
The Half Carry Flag H indicates a half carry in some arithmetic operations. Half Carry is useful in
BCD arithmetic. See the Instruction Set Description for detailed information.
Bit 4 S: Sign Bit, S = N V
The S-bit is always an exclusive or between the Negative Flag N and the Twos Complement
Overflow Flag V. See the Instruction Set Description for detailed information.
Bit 3 V: Twos Complement Overflow Flag
The Twos Complement Overflow Flag V supports twos complement arithmetics. See the
Instruction Set Description for detailed information.
Bit 2 N: Negative Flag
The Negative Flag N indicates a negative result in an arithmetic or logic operation. See the
Instruction Set Description for detailed information.
Bit 1 Z: Zero Flag
The Zero Flag Z indicates a zero result in an arithmetic or logic operation. See the Instruction
Set Description for detailed information.
Bit 0 C: Carry Flag
The Carry Flag C indicates a carry in an arithmetic or logic operation. See the Instruction Set
Description for detailed information.
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General Purpose
Register File
The Register File is optimized for the AVR Enhanced RISC instruction set. In order to achieve
the required performance and flexibility, the following input/output schemes are supported by the
Register File:
One 8-bit output operand and one 8-bit result input
Two 8-bit output operands and one 8-bit result input
Two 8-bit output operands and one 16-bit result input
One 16-bit output operand and one 16-bit result input
Figure 4 shows the structure of the 32 general purpose working registers in the CPU.
Figure 4. AVR CPU General Purpose Working Registers
Most of the instructions operating on the Register File have direct access to all registers, and
most of them are single cycle instructions.
As shown in Figure 4, each register is also assigned a data memory address, mapping them
directly into the first 32 locations of the user Data Space. Although not being physically imple-
mented as SRAM locations, this memory organization provides great flexibility in access of the
registers, as the X-, Y-, and Z-pointer registers can be set to index any register in the file.
7 0 Addr.
R0 0x00
R1 0x01
R2 0x02
R13 0x0D
General R14 0x0E
Purpose R15 0x0F
Working R16 0x10
Registers R17 0x11
Overview The AVR IEEE std. 1149.1 compliant J TAG interface can be used for
Testing PCBs by using the J TAG Boundary-scan capability.
Programming the non-volatile memories, Fuses and Lock bits.
On-chip debugging.
A brief description is given in the following sections. Detailed descriptions for Programming via
the J TAG interface, and using the Boundary-scan Chain can be found in the sections Program-
ming via the J TAG Interface on page 250 and IEEE 1149.1 (J TAG) Boundary-scan on page
204, respectively. The On-chip Debug support is considered being private J TAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 83 shows a block diagram of the J TAG interface and the On-chip Debug system. The
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the J TAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI input and TDO output. The Instruction Register holds J TAG
instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The J TAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for serial programming via the J TAG interface. The Internal
Scan Chain and Break Point Scan Chain are used for On-chip debugging only.
Test Access Port
TAP
The J TAG interface is accessed through four of the AVRs pins. In J TAG terminology, these pins
constitute the Test Access Port TAP. These pins are:
TMS: Test mode select. This pin is used for navigating through the TAP-controller state
machine.
TCK: Test Clock. J TAG operation is synchronous to TCK.
TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data
Register (Scan Chains).
TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
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The IEEE std. 1149.1 also specifies an optional TAP signal; TRST Test ReSeT which is not
provided.
When the J TAGEN fuse is unprogrammed, these four TAP pins are normal port pins and the
TAP controller is in reset. When programmed and the J TD bit in MCUCSR is cleared, the TAP
input signals are internally pulled high and the J TAG is enabled for Boundary-scan and program-
ming. In this case, the TAP output pin (TDO) is left floating in states where the J TAG TAP
controller is not shifting data, and must therefore be connected to a pull-up resistor or other
hardware having pull-ups (for instance the TDI-input of the next device in the scan chain). The
device is shipped with this fuse programmed.
For the On-chip Debug system, in addition to the J TAG interface pins, the RESET pin is moni-
tored by the debugger to be able to detect External Reset sources. The debugger can also pull
the RESET pin low to reset the whole system, assuming only open collectors on the reset line
are used in the application.
Figure 83. Block Diagram
TAP
CONTROLLER
TDI
TDO
TCK
TMS
FLASH
MEMORY
AVR CPU
DIGITAL
PERIPHERAL
UNITS
JTAG / AVR CORE
COMMUNICATION
INTERFACE
BREAKPOINT
UNIT
FLOW CONTROL
UNIT
OCD STATUS
AND CONTROL
INTERNAL
SCAN
CHAIN
M
U
X
INSTRUCTION
REGISTER
ID
REGISTER
BYPASS
REGISTER
JTAG PROGRAMMING
INTERFACE
PC
Instruction
Address
Data
BREAKPOINT
SCAN CHAIN
ADDRESS
DECODER
ANALOG
PERIPHERIAL
UNITS
I/O PORT 0
I/O PORT n
BOUNDARY SCAN CHAIN
Analog inputs
Control & Clock lines
DEVICE BOUNDARY
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Figure 84. TAP Controller State Diagram
Test-Logic-Reset
Run-Test/Idle
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Select-IR Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Exit2-IR
Update-IR
Select-DR Scan
Capture-DR
0
1
0
1 1 1
0 0
0 0
1 1
1 0
1
1
0
1
0
0
1 0
1
1
0
1
0
0
0 0
1 1
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TAP Controller The TAP controller is a 16-state finite state machine that controls the operation of the Boundary-
scan circuitry, J TAG programming circuitry, or On-chip Debug system. The state transitions
depicted in Figure 84 depend on the signal present on TMS (shown adjacent to each state tran-
sition) at the time of the rising edge at TCK. The initial state after a Power-on Reset is Test-
Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the J TAG interface is:
At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register Shift-IR state. While in this state, shift the four bits of the J TAG
instructions into the J TAG Instruction Register from the TDI input at the rising edge of TCK.
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high.
While the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out
on the TDO pin. The J TAG Instruction selects a particular Data Register as path between
TDI and TDO and controls the circuitry surrounding the selected Data Register.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction is
latched onto the parallel output from the Shift Register path in the Update-IR state. The Exit-
IR, Pause-IR, and Exit2-IR states are only used for navigating the state machine.
At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift
Data Register Shift-DR state. While in this state, upload the selected data register
(selected by the present J TAG instruction in the J TAG Instruction Register) from the TDI
input at the rising edge of TCK. In order to remain in the Shift-DR state, the TMS input must
be held low during input of all bits except the MSB. The MSB of the data is shifted in when
this state is left by setting TMS high. While the Data Register is shifted in from the TDI pin,
the parallel inputs to the Data Register captured in the Capture-DR state is shifted out on the
TDO pin.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected data
register has a latched parallel-output, the latching takes place in the Update-DR state. The
Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating the state machine.
As shown in the state diagram, the Run-Test/Idle state need not be entered between selecting
J TAG instruction and using Data Registers, and some J TAG instructions may select certain
functions to be performed in the Run-Test/Idle, making it unsuitable as an Idle state.
Note: Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can always be
entered by holding TMS high for five TCK clock periods.
For detailed information on the J TAG specification, refer to the literature listed in Bibliography
on page 203.
Using the
Boundary-scan
Chain
A complete description of the Boundary-scan capabilities are given in the section IEEE 1149.1
(J TAG) Boundary-scan on page 204.
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Using the On-chip
Debug system
As shown in Figure 83, the hardware support for On-chip Debugging consists mainly of
A scan chain on the interface between the internal AVR CPU and the internal peripheral
units
Break Point unit
Communication interface between the CPU and J TAG system
All read or modify/write operations needed for implementing the Debugger are done by applying
AVR instructions via the internal AVR CPU Scan Chain. The CPU sends the result to an I/O
memory mapped location which is part of the communication interface between the CPU and the
J TAG system.
The Break Point unit implements Break on Change of program flow, Single Step Break, two Pro-
gram memory Break Points, and two Combined Break Points. Together, the four Break Points
can be configured as either:
4 single Program Memory Break Points
3 Single Program Memory Break Point +1 single Data Memory Break Point
2 single Program Memory Break Points +2 single Data Memory Break Points
2 single Program Memory Break Points +1 Program Memory Break Point with mask (range
Break Point)
2 single Program Memory Break Points +1 Data Memory Break Point with mask (range
Break Point)
A debugger, like the AVR Studio
, may however use one or more of these resources for its inter-
nal purpose, leaving less flexibility to the end-user.
A list of the On-chip Debug specific J TAG instructions is given in On-chip debug specific J TAG
instructions on page 202.
The J TAGEN Fuse must be programmed to enable the J TAG Test Access Port. In addition, the
OCDEN Fuse must be programmed and no Lock bits must be set for the On-chip debug system
to work. As a security feature, the On-chip debug system is disabled when either of the LB1 or
LB2 Lock bits are set. Otherwise, the On-chip debug system would have provided a backdoor
into a secured device.
The AVR Studio enables the user to fully control execution of programs on an AVR device with
On-chip Debug capability, AVR In-Circuit Emulator, or the built-in AVR Instruction Set Simulator.
AVR Studio supports source level execution of Assembly programs assembled with Atmel Cor-
porations AVR Assembler and C programs compiled with third party vendors compilers.
AVR Studio runs under Microsoft
Windows
95/98/2000, Windows NT
, and Windows XP
.
For a full description of the AVR Studio, please refer to the AVR Studio User Guide. Only high-
lights are presented in this document.
All necessary execution commands are available in AVR Studio, both on source level and on
disassembly level. The user can execute the program, single step through the code either by
tracing into or stepping over functions, step out of functions, place the cursor on a statement and
execute until the statement is reached, stop the execution, and reset the execution target. In
addition, the user can have an unlimited number of code Break Points (using the BREAK
instruction) and up to two data memory Break Points, alternatively combined as a mask (range)
Break Point.
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On-chip debug
specific JTAG
instructions
The On-chip debug support is considered being private J TAG instructions, and distributed within
ATMEL and to selected 3rd party vendors only. Instruction opcodes are listed for reference.
PRIVATE0; 0x8 Private J TAG instruction for accessing On-chip debug system.
PRIVATE1; 0x9 Private J TAG instruction for accessing On-chip debug system.
PRIVATE2; 0xA Private J TAG instruction for accessing On-chip debug system.
PRIVATE3; 0xB Private J TAG instruction for accessing On-chip debug system.
On-chip Debug
Related Register in
I/O Memory
On-chip Debug
Register OCDR
The OCDR Register provides a communication channel from the running program in the micro-
controller to the debugger. The CPU can transfer a byte to the debugger by writing to this
location. At the same time, an internal flag; I/O Debug Register Dirty IDRD is set to indicate
to the debugger that the register has been written. When the CPU reads the OCDR Register the
7 LSB will be from the OCDR Register, while the MSB is the IDRD bit. The debugger clears the
IDRD bit when it has read the information.
In some AVR devices, this register is shared with a standard I/O location. In this case, the OCDR
Register can only be accessed if the OCDEN Fuse is programmed, and the debugger enables
access to the OCDR Register. In all other cases, the standard I/O location is accessed.
Refer to the debugger documentation for further information on how to use this register.
Using the JTAG
Programming
Capabilities
Programming of AVR parts via J TAG is performed via the 4-pin J TAG port, TCK, TMS, TDI and
TDO. These are the only pins that need to be controlled/observed to perform J TAG program-
ming (in addition to power pins). It is not required to apply 12V externally. The J TAGEN Fuse
must be programmed and the J TD bit in the MCUSR Register must be cleared to enable the
J TAG Test Access Port.
The J TAG programming capability supports:
Flash programming and verifying.
EEPROM programming and verifying.
Fuse programming and verifying.
Lock bit programming and verifying.
The Lock bit security is exactly as in parallel programming mode. If the Lock bits LB1 or LB2 are
programmed, the OCDEN Fuse cannot be programmed unless first doing a chip erase. This is a
security feature that ensures no backdoor exists for reading out the content of a secured device.
The details on programming through the J TAG interface and programming specific J TAG
instructions are given in the section Programming via the J TAG Interface on page 250.
Bit 7 6 5 4 3 2 1 0
MSB/IDRD LSB OCDR
Read/Write R/W R/W R/W R/W R/W R/W R/W R/W
Initial Value 0 0 0 0 0 0 0 0
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Bibliography For more information about general Boundary-scan, the following literature can be consulted:
IEEE: IEEE Std. 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan
Architecture, IEEE, 1993
Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-Wesley,
1992
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IEEE 1149.1
(JTAG)
Boundary-scan
Features JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the JTAG Standard
Full Scan of all Port Functions as well as Analog Circuitry Having Off-chip Connections
Supports the Optional IDCODE Instruction
Additional Public AVR_RESET Instruction to Reset the AVR
System Overview The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-
tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connections. At system level, all ICs having J TAG capabilities are connected serially by
the TDI/TDO signals to form a long Shift Register. An external controller sets up the devices to
drive values at their output pins, and observe the input values received from other devices. The
controller compares the received data with the expected result. In this way, Boundary-scan pro-
vides a mechanism for testing interconnections and integrity of components on Printed Circuits
Boards by using the four TAP signals only.
The four IEEE 1149.1 defined mandatory J TAG instructions IDCODE, BYPASS, SAMPLE/PRE-
LOAD, and EXTEST, as well as the AVR specific public J TAG instruction AVR_RESET can be
used for testing the Printed Circuit Board. Initial scanning of the Data Register path will show the
ID-code of the device, since IDCODE is the default J TAG instruction. It may be desirable to have
the AVR device in Reset during Test mode. If not Reset, inputs to the device may be determined
by the scan operations, and the internal software may be in an undetermined state when exiting
the test mode. Entering Reset, the outputs of any Port Pin will instantly enter the high impedance
state, making the HIGHZ instruction redundant. If needed, the BYPASS instruction can be
issued to make the shortest possible scan chain through the device. The device can be set in
the Reset state either by pulling the external RESET pin low, or issuing the AVR_RESET
instruction with appropriate setting of the Reset Data Register.
The EXTEST instruction is used for sampling external pins and loading output pins with data.
The data from the output latch will be driven out on the pins as soon as the EXTEST instruction
is loaded into the J TAG IR-Register. Therefore, the SAMPLE/PRELOAD should also be used for
setting initial values to the scan ring, to avoid damaging the board when issuing the EXTEST
instruction for the first time. SAMPLE/PRELOAD can also be used for taking a snapshot of the
external pins during normal operation of the part.
The J TAGEN Fuse must be programmed and the J TD bit in the I/O Register MCUCSR must be
cleared to enable the J TAG Test Access Port.
When using the J TAG interface for Boundary-scan, using a J TAG TCK clock frequency higher
than the internal chip frequency is possible. The chip clock is not required to run.
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Data Registers The data registers relevant for Boundary-scan operations are:
Bypass Register
Device Identification Register
Reset Register
Boundary-scan Chain
Bypass Register The Bypass Register consists of a single Shift Register stage. When the Bypass Register is
selected as path between TDI and TDO, the register is reset to 0 when leaving the Capture-DR
controller state. The Bypass Register can be used to shorten the scan chain on a system when
the other devices are to be tested.
Device Identification
Register
Figure 85 shows the structure of the Device Identification Register.
Figure 85. The Format of the Device Identification Register
Version Version is a 4-bit number identifying the revision of the component. The J TAG version number
follows the revision of the device. Revision A is 0x0, revision B is 0x1 and so on.
Part Number The part number is a 16-bit code identifying the component. The J TAG Part Number for
ATmega162 is listed in Table 83.
Manufacturer ID The Manufacturer ID is a 11-bit code identifying the manufacturer. The J TAG manufacturer ID
for ATMEL is listed in Table 84.
Reset Register The Reset Register is a test data register used to reset the part. Since the AVR tri-states Port
Pins when reset, the Reset Register can also replace the function of the unimplemented optional
J TAG instruction HIGHZ.
A high value in the Reset Register corresponds to pulling the external Reset low. The part is
reset as long as there is a high value present in the Reset Register. Depending on the Fuse set-
tings for the clock options, the part will remain reset for a Reset Time-out Period (refer to Clock
Sources on page 36) after releasing the Reset Register. The output from this data register is not
latched, so the reset will take place immediately, as shown in Figure 86.
MSB LSB
Bit 31 28 27 12 11 1 0
Device ID Version Part Number Manufacturer ID 1
4 bits 16 bits 11 bits 1 bit
Table 83. AVR J TAG Part Number
Part number JTAG Part Number (Hex)
ATmega162 0x9404
Table 84. Manufacturer ID
Manufacturer JTAG Man. ID (Hex)
ATMEL 0x01F
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Figure 86. Reset Register
Boundary-scan Chain The Boundary-scan Chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connections.
See Boundary-scan Chain on page 208 for a complete description.
Boundary-scan
Specific JTAG
Instructions
The Instruction Register is 4-bit wide, supporting up to 16 instructions. Listed below are the
J TAG instructions useful for Boundary-scan operation. Note that the optional HIGHZ instruction
is not implemented, but all outputs with tri-state capability can be set in high-impedant state by
using the AVR_RESET instruction, since the initial state for all port pins is tri-state.
As a definition in this datasheet, the LSB is shifted in and out first for all Shift Registers.
The OPCODE for each instruction is shown behind the instruction name in hex format. The text
describes which Data Register is selected as path between TDI and TDO for each instruction.
EXTEST; 0x0 Mandatory J TAG instruction for selecting the Boundary-scan Chain as Data Register for testing
circuitry external to the AVR package. For port-pins, Pull-up Disable, Output Control, Output
Data, and Input Data are all accessible in the scan chain. For analog circuits having Off-chip
connections, the interface between the analog and the digital logic is in the scan chain. The con-
tents of the latched outputs of the Boundary-scan chain is driven out as soon as the J TAG IR-
Register is loaded with the EXTEST instruction.
The active states are:
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
Shift-DR: The Internal Scan Chain is shifted by the TCK input.
Update-DR: Data from the scan chain is applied to output pins.
D Q
From
TDI
ClockDR AVR_RESET
To
TDO
From Other Internal and
External Reset Sources
Internal Reset
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IDCODE; 0x1 Optional J TAG instruction selecting the 32-bit ID-register as data register. The ID-Register con-
sists of a version number, a device number and the manufacturer code chosen by J EDEC. This
is the default instruction after Power-up.
The active states are:
Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.
Shift-DR: The IDCODE scan chain is shifted by the TCK input.
SAMPLE_PRELOAD;
0x2
Mandatory J TAG instruction for preloading the output latches and taking a snapshot of the
input/output pins without affecting the system operation. However, the output latches are not
connected to the pins. The Boundary-scan Chain is selected as Data Register.
The active states are:
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
Update-DR: Data from the Boundary-scan chain is applied to the output latches. However,
the output latches are not connected to the pins.
AVR_RESET; 0xC The AVR specific public J TAG instruction for forcing the AVR device into the Reset mode or
releasing the J TAG Reset source. The TAP controller is not reset by this instruction. The one bit
Reset Register is selected as data register. Note that the reset will be active as long as there is
a logic 'one' in the Reset Chain. The output from this chain is not latched.
The active states are:
Shift-DR: The Reset Register is shifted by the TCK input.
BYPASS; 0xF Mandatory J TAG instruction selecting the Bypass Register for data register.
The active states are:
Capture-DR: Loads a logic 0 into the Bypass Register.
Shift-DR: The Bypass Register cell between TDI and TDO is shifted.
Boundary-scan
Related Register in I/O
Memory
MCU Control and
Status Register
MCUCSR
The MCU Control and Status Register contains control bits for general MCU functions, and pro-
vides information on which reset source caused an MCU Reset.
Bit 7 JTD: JTAG Interface Disable
When this bit is zero, the J TAG interface is enabled if the J TAGEN Fuse is programmed. If this
bit is one, the J TAG interface is disabled. In order to avoid unintentional disabling or enabling of
the J TAG interface, a timed sequence must be followed when changing this bit: The application
software must write this bit to the desired value twice within four cycles to change its value.
If the J TAG interface is left unconnected to other J TAG circuitry, the J TD bit should be set to
one. The reason for this is to avoid static current at the TDO pin in the J TAG interface.
Bit 7 6 5 4 3 2 1 0
JTD SM2 JTRF WDRF BORF EXTRF PORF MCUCSR
Read/Write R/W R/W R R/W R/W R/W R/W R/W
Initial Value 0 0 0 See Bit Description
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Bit 4 JTRF: JTAG Reset Flag
This bit is set if a reset is being caused by a logic one in the J TAG Reset Register selected by
the J TAG instruction AVR_RESET. This bit is reset by a Power-on Reset, or by writing a logic
zero to the flag.
Boundary-scan
Chain
The Boundary-scan Chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connection.
Scanning the Digital
Port Pins
Figure 87 shows the Boundary-scan Cell for a bi-directional port pin with pull-up function. The
cell consists of a standard Boundary-scan cell for the Pull-up Enable PUExn function, and a
bi-directional pin cell that combines the three signals Output Control OCxn, Output Data
ODxn, and Input Data IDxn, into only a two-stage Shift Register. The port and pin indexes are
not used in the following description
The Boundary-scan logic is not included in the figures in the datasheet. Figure 88 shows a sim-
ple digital Port Pin as described in the section I/O-Ports on page 63. The Boundary-scan
details from Figure 87 replaces the dashed box in Figure 88.
When no alternate port function is present, the Input Data ID corresponds to the PINxn Reg-
ister value (but ID has no synchronizer), Output Data corresponds to the PORT Register, Output
Control corresponds to the Data Direction DD Register, and the Pull-up Enable PUExn cor-
responds to logic expression PUD DDxn PORTxn.
Digital alternate port functions are connected outside the dotted box in Figure 88 to make the
scan chain read the actual pin value. For Analog function, there is a direct connection from the
external pin to the analog circuit, and a scan chain is inserted on the interface between the digi-
tal logic and the analog circuitry.
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Figure 87. Boundary-scan Cell for Bi-directional Port Pin with Pull-up Function.
D Q D Q
G
0
1
0
1
D Q D Q
G
0
1
0
1
0
1
0
1
D Q D Q
G
0
1
Port Pin (PXn)
Vcc EXTEST To Next Cell ShiftDR
Output Control (OC)
Pullup Enable (PUE)
Output Data (OD)
Input Data (ID)
From Last Cell UpdateDR ClockDR
FF2 LD2
FF1 LD1
LD0 FF0
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Figure 88. General Port Pin Schematic Diagram
Scanning the RESET
pin
The RESET pin accepts 5V active low logic for standard reset operation, and 12V active high
logic for high voltage parallel programming. An observe-only cell as shown in Figure 89 is
inserted both for the 5V reset signal; RSTT, and the 12V reset signal; RSTHV.
Figure 89. Observe-only Cell
CLK
RPx
RRx
WRx
RDx
WDx
PUD
SYNCHRONIZER
WDx: WRITE DDRx
WRx: WRITE PORTx
RRx: READ PORTx REGISTER
RPx: READ PORTx PIN
PUD: PULLUP DISABLE
CLK : I/O CLOCK
RDx: READ DDRx
D
L
Q
Q
RESET
RESET
Q
Q D
Q
Q D
CLR
PORTxn
Q
Q D
CLR
DDxn
PINxn
D
A
T
A
B
U
S
SLEEP
SLEEP: SLEEP CONTROL
Pxn
I/O
I/O
See Boundary-Scan Description
for Details!
PUExn
OCxn
ODxn
IDxn
PUExn: PULLUP ENABLE for pin Pxn
OCxn: OUTPUT CONTROL for pin Pxn
ODxn: OUTPUT DATA to pin Pxn
IDxn: INPUT DATA from pin Pxn
0
1
D Q
From
Previous
Cell
ClockDR
ShiftDR
To
Next
Cell
From System Pin To System Logic
FF1
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Scanning the Clock
Pins
The AVR devices have many clock options selectable by fuses. These are: Internal RC Oscilla-
tor, External Clock, (High Frequency) Crystal Oscillator, Low Frequency Crystal Oscillator, and
Ceramic Resonator.
Figure 90 shows how each Oscillator with external connection is supported in the scan chain.
The Enable signal is supported with a general Boundary-scan cell, while the Oscillator/clock out-
put is attached to an observe-only cell. In addition to the main clock, the Timer Oscillator is
scanned in the same way. The output from the internal RC Oscillator is not scanned, as this
Oscillator does not have external connections.
Figure 90. Boundary-scan Cells for Oscillators and Clock Options
Table 85 summaries the scan registers for the external clock pin XTAL1, oscillators with
XTAL1/XTAL2 connections as well as 32 kHz Timer Oscillator.
Notes: 1. Do not enable more than one clock source as main clock at a time.
2. Scanning an Oscillator output gives unpredictable results as there is a frequency drift between
the Internal Oscillator and the J TAG TCK clock. If possible, scanning an external clock is
preferred.
3. The clock configuration is programmed by fuses. As a fuse is not changed run-time, the clock
configuration is considered fixed for a given application. The user is advised to scan the same
clock option as to be used in the final system. The enable signals are supported in the scan
chain because the system logic can disable clock options in sleep modes, thereby disconnect-
ing the Oscillator pins from the scan path if not provided. The INTCAP selection is not
supported in the scan-chain, so the boundary scan chain can not make a XTAL Oscillator
requiring internal capacitors to run unless the fuses are correctly programmed.
Table 85. Scan Signals for the Oscillator
(1)(2)(3)
Enable Signal Scanned Clock Line Clock Option
Scanned Clock
Line when Not
Used
EXTCLKEN EXTCLK (XTAL1) External Clock 0
OSCON OSCCK External Crystal
External Ceramic Resonator
0
OSC32EN OSC32CK Low Freq. External Crystal 0
TOSKON TOSCK 32 kHz Timer Oscillator 0
0
1
D Q
From
Previous
Cell
ClockDR
ShiftDR
To
Next
Cell
To System Logic
FF1 0
1
D Q D Q
G
0
1
From
Previous
Cell
ClockDR UpdateDR
ShiftDR
To
Next
Cell EXTEST
From Digital Logic
XTAL1/TOSC1 XTAL2/TOSC2
Oscillator
ENABLE OUTPUT
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Scanning the Analog
Comparator
The relevant Comparator signals regarding Boundary-scan are shown in Figure 91. The Bound-
ary-scan cell from Figure 92 is attached to each of these signals. The signals are described in
Table 86.
The Comparator need not be used for pure connectivity testing, since all analog inputs are
shared with a digital port pin as well.
Figure 91. Analog Comparator
Figure 92. General Boundary-scan Cell used for Signals for Comparator
ACBG
BANDGAP
REFERENCE
AC_IDLE
ACO
0
1
D Q D Q
G
0
1
From
Previous
Cell
ClockDR UpdateDR
ShiftDR
To
Next
Cell EXTEST
To Snalog Circuitry/
To Digital Logic
From Digital Logic/
From Analog Ciruitry
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ATmega162
Boundary-scan
Order
Table 87 shows the Scan order between TDI and TDO when the Boundary-scan chain is
selected as data path. Bit 0 is the LSB; the first bit scanned in, and the first bit scanned out. The
scan order follows the pinout order as far as possible. Therefore, the bits of Port A and Port E is
scanned in the opposite bit order of the other ports. Exceptions from the rules are the Scan
chains for the analog circuits, which constitute the most significant bits of the scan chain regard-
less of which physical pin they are connected to. In Figure 87, PXn. Data corresponds to FF0,
PXn. Control corresponds to FF1, and PXn. Pullup_enable corresponds to FF2. Bit 4, 5, 6, and
7of Port C is not in the scan chain, since these pins constitute the TAP pins when the J TAG is
enabled.
Table 86. Boundary-scan Signals for the Analog Comparator
Signal
Name
Direction as
seen from the
Comparator Description
Recommended
Input when Not
in Use
Output Values when
Recommended
Inputs are Used
AC_IDLE input Turns off Analog
comparator
when true
1 Depends upon C
code being executed
ACO output Analog
Comparator
Output
Will become
input to C code
being executed
0
ACBG input Bandgap
Reference
enable
0 Depends upon C
code being executed
Table 87. ATmega162 Boundary-scan Order
Bit Number Signal Name Module
105 AC_IDLE Comparator
104 ACO
103 ACBG
102 PB0.Data Port B
101 PB0.Control
100 PB0.Pullup_Enable
99 PB1.Data
98 PB1.Control
97 PB1.Pullup_Enable
96 PB2.Data
95 PB2.Control
94 PB2.Pullup_Enable
93 PB3.Data
92 PB3.Control
91 PB3.Pullup_Enable
90 PB4.Data
89 PB4.Control
88 PB4.Pullup_Enable
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87 PB5.Data Port B
86 PB5.Control
85 PB5.Pullup_Enable
84 PB6.Data
83 PB6.Control
82 PB6.Pullup_Enable
81 PB7.Data
80 PB7.Control
79 PB7.Pullup_Enable
78 RSTT Reset Logic
(Observe-only)
77 RSTHV
76 TOSC 32 kHz Timer Oscillator
75 TOSCON
74 PD0.Data Port D
73 PD0.Control
72 PD0.Pullup_Enable
71 PD1.Data
70 PD1.Control
69 PD1.Pullup_Enable
68 PD2.Data
67 PD2.Control
66 PD2.Pullup_Enable
65 PD3.Data
64 PD3.Control
63 PD3.Pullup_Enable
62 PD4.Data
61 PD4.Control
60 PD4.Pullup_Enable
59 PD5.Data Port D
58 PD5.Control
57 PD5.Pullup_Enable
56 PD6.Data
55 PD6.Control
54 PD6.Pullup_Enable
53 PD7.Data
52 PD7.Control
Table 87. ATmega162 Boundary-scan Order (Continued)
Bit Number Signal Name Module
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51 PD7.Pullup_Enable Port D
50 EXTCLKEN Enable signals for main
Clock/Oscillators
49 OSCON
48 OSC32EN
47 EXTCLK (XTAL1) Clock input and Oscillators
for the main clock (Observe-
only)
46 OSCCK
45 OSC32CK
44 PC0.Data Port C
43 PC0.Control
42 PC0.Pullup_Enable
41 PC1.Data
40 PC1.Control
39 PC1.Pullup_Enable
38 PC2.Data
37 PC2.Control
36 PC2.Pullup_Enable
35 PC3.Data
34 PC3.Control
33 PC3.Pullup_Enable
32 PE2.Data Port E
31 PE2.Control
30 PE2.Pullup_Enable
29 PE1.Data
28 PE1.Control
27 PE1.Pullup_Enable
26 PE0.Data
25 PE0.Control
24 PE0.Pullup_Enable
23 PA7.Data Port A
22 PA7.Control
21 PA7.Pullup_Enable
20 PA6.Data
19 PA6.Control
18 PA6.Pullup_Enable
17 PA5.Data
16 PA5.Control
Table 87. ATmega162 Boundary-scan Order (Continued)
Bit Number Signal Name Module
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Note: 1. PRIVATE_SIGNAL1 should always be scanned in as zero.
Boundary-scan
Description
Language Files
Boundary-scan Description Language (BSDL) files describe Boundary-scan capable devices in
a standard format used by automated test-generation software. The order and function of bits in
the Boundary-scan Data Register are included in this description. A BSDL file for ATmega162 is
available.
15 PA5.Pullup_Enable Port A
14 PA4.Data
13 PA4.Control
12 PA4.Pullup_Enable
11 PA3.Data
10 PA3.Control
9 PA3.Pullup_Enable
8 PA2.Data
7 PA2.Control
6 PA2.Pullup_Enable
5 PA1.Data
4 PA1.Control
3 PA1.Pullup_Enable
2 PA0.Data
1 PA0.Control
0 PA0.Pullup_Enable
Table 87. ATmega162 Boundary-scan Order (Continued)
Bit Number Signal Name Module
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Boot Loader
Support Read-
While-Write
Self-
programming
The Boot Loader Support provides a real Read-While-Write Self-programming mechanism for
downloading and uploading program code by the MCU itself. This feature allows flexible applica-
tion software updates controlled by the MCU using a Flash-resident Boot Loader program. The
Boot Loader program can use any available data interface and associated protocol to read code
and write (program) that code into the Flash memory, or read the code from the program mem-
ory. The program code within the Boot Loader section has the capability to write into the entire
Flash, including the Boot Loader memory. The Boot Loader can thus even modify itself, and it
can also erase itself from the code if the feature is not needed anymore. The size of the Boot
Loader memory is configurable with Fuses and the Boot Loader has two separate sets of Boot
Lock bits which can be set independently. This gives the user a unique flexibility to select differ-
ent levels of protection.
Features Read-While-Write Self-programming
Flexible Boot Memory Size
High Security (Separate Boot Lock Bits for a Flexible Protection)
Separate Fuse to Select Reset Vector
Optimized Page
(1)
Size
Code Efficient Algorithm
Efficient Read-Modify-Write Support
Note: 1. A page is a section in the Flash consisting of several bytes (see Table 105 on page 236) used
during programming. The page organization does not affect normal operation.
Application and
Boot Loader Flash
Sections
The Flash memory is organized in two main sections, the Application section and the Boot
Loader section (see Figure 94). The size of the different sections is configured by the BOOTSZ
Fuses as shown in Table 93 on page 228 and Figure 94. These two sections can have different
level of protection since they have different sets of Lock bits.
Application Section The Application section is the section of the Flash that is used for storing the application code.
The protection level for the application section can be selected by the Application Boot Lock bits
(Boot Lock bits 0), see Table 89 on page 220. The Application section can never store any Boot
Loader code since the SPM instruction is disabled when executed from the Application section.
BLS Boot Loader
Section
While the Application section is used for storing the application code, the The Boot Loader soft-
ware must be located in the BLS since the SPM instruction can initiate a programming when
executing from the BLS only. The SPM instruction can access the entire Flash, including the
BLS itself. The protection level for the Boot Loader section can be selected by the Boot Loader
Lock bits (Boot Lock bits 1), see Table 90 on page 220.
Read-While-Write
and No Read-
While-Write Flash
Sections
Whether the CPU supports Read-While-Write or if the CPU is halted during a Boot Loader soft-
ware update is dependent on which address that is being programmed. In addition to the two
sections that are configurable by the BOOTSZ Fuses as described above, the Flash is also
divided into two fixed sections, the Read-While-Write (RWW) section and the No Read-While-
Write (NRWW) section. The limit between the RWW- and NRWW sections is given in Table 94
on page 229 and Figure 94 on page 219. The main difference between the two sections is:
When erasing or writing a page located inside the RWW section, the NRWW section can be
read during the operation.
When erasing or writing a page located inside the NRWW section, the CPU is halted during
the entire operation.
Note that the user software can never read any code that is located inside the RWW section dur-
ing a Boot Loader software operation. The syntax Read-While-Write section refers to which
section that is being programmed (erased or written), not which section that actually is being
read during a Boot Loader software update.
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RWW Read-While-
Write Section
If a Boot Loader software update is programming a page inside the RWW section, it is possible
to read code from the Flash, but only code that is located in the NRWW section. During an ongo-
ing programming, the software must ensure that the RWW section never is being read. If the
user software is trying to read code that is located inside the RWW section (i.e., by a
call/jmp/lpm or an interrupt) during programming, the software might end up in an unknown
state. To avoid this, the interrupts should either be disabled or moved to the Boot Loader sec-
tion. The Boot Loader section is always located in the NRWW section. The RWW Section Busy
bit (RWWSB) in the Store Program Memory Control Register (SPMCR) will be read as logical
one as long as the RWW section is blocked for reading. After a programming is completed, the
RWWSB must be cleared by software before reading code located in the RWW section. See
Store Program Memory Control Register SPMCR on page 221. for details on how to clear
RWWSB.
NRWW No Read-
While-Write Section
The code located in the NRWW section can be read when the Boot Loader software is updating
a page in the RWW section. When the Boot Loader code updates the NRWW section, the CPU
is halted during the entire Page Erase or Page Write operation.
Figure 93. Read-While-Write vs. No Read-While-Write
Table 88. Read-While-Write Features
Which Section does the Z-
pointer Address During the
Programming?
Which Section Can be
Read During
Programming?
Is the CPU
Halted?
Read-While-
Write
Supported?
RWW section NRWW section No Yes
NRWW section None Yes No
Read-While-Write
(RWW) Section
No Read-While-Write
(NRWW) Section
Z-pointer
Addresses RWW
Section
Z-pointer
Addresses NRWW
Section
CPU is Halted
During the Operation
Code Located in
NRWW Section
Can be Read During
the Operation
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Figure 94. Memory Sections
(1)
Note: 1. The parameters are given in Table 93 on page 228.
Boot Loader Lock
Bits
If no Boot Loader capability is needed, the entire Flash is available for application code. The
Boot Loader has two separate sets of Boot Lock bits which can be set independently. This gives
the user a unique flexibility to select different levels of protection.
The user can select:
To protect the entire Flash from a software update by the MCU
To protect only the Boot Loader Flash section from a software update by the MCU
To protect only the Application Flash section from a software update by the MCU
Allow software update in the entire Flash
See Table 89 and Table 90 for further details. The Boot Lock bits can be set in software and in
Serial or Parallel Programming mode, but they can be cleared by a chip erase command only.
The general Write Lock (Lock bit mode 2) does not control the programming of the Flash mem-
0x0000
Flashend
Program Memory
BOOTSZ = '11'
Application Flash Section
Boot Loader Flash Section
Flashend
Program Memory
BOOTSZ = '10'
0x0000
Program Memory
BOOTSZ = '01'
Program Memory
BOOTSZ = '00'
Application Flash Section
Boot Loader Flash Section
0x0000
Flashend
Application Flash Section
Flashend
End RWW
Start NRWW
Application flash Section
Boot Loader Flash Section
Boot Loader Flash Section
End RWW
Start NRWW
End RWW
Start NRWW
0x0000
End RWW, End Application
Start NRWW, Start Boot Loader
Application Flash Section Application Flash Section
Application Flash Section
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End Application
Start Boot Loader
End Application
Start Boot Loader
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ory by SPM instruction. Similarly, the general Read/Write Lock (Lock bit mode 1) does not
control reading nor writing by LPM/SPM, if it is attempted.
Note: 1. 1 means unprogrammed, 0 means programmed
Note: 1. 1 means unprogrammed, 0 means programmed
Table 89. Boot Lock Bit0 Protection Modes (Application Section)
(1)
BLB0 Mode BLB02 BLB01 Protection
1 1 1
No restrictions for SPM or LPM accessing the Application
section.
2 1 0 SPM is not allowed to write to the Application section.
3 0 0
SPM is not allowed to write to the Application section, and
LPM executing from the Boot Loader section is not
allowed to read from the Application section. If Interrupt
Vectors are placed in the Boot Loader section, interrupts
are disabled while executing from the Application section.
4 0 1
LPM executing from the Boot Loader section is not
allowed to read from the Application section. If Interrupt
Vectors are placed in the Boot Loader section, interrupts
are disabled while executing from the Application section.
Table 90. Boot Lock Bit1 Protection Modes (Boot Loader Section)
(1)
BLB1 Mode BLB12 BLB11 Protection
1 1 1
No restrictions for SPM or LPM accessing the Boot Loader
section.
2 1 0 SPM is not allowed to write to the Boot Loader section.
3 0 0
SPM is not allowed to write to the Boot Loader section,
and LPM executing from the Application section is not
allowed to read from the Boot Loader section. If Interrupt
Vectors are placed in the Application section, interrupts
are disabled while executing from the Boot Loader
section.
4 0 1
LPM executing from the Application section is not allowed
to read from the Boot Loader section. If Interrupt Vectors
are placed in the Application section, interrupts are
disabled while executing from the Boot Loader section.
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Entering the Boot
Loader Program
Entering the Boot Loader takes place by a jump or call from the application program. This may
be initiated by a trigger such as a command received via USART, or SPI interface. Alternatively,
the Boot Reset Fuse can be programmed so that the Reset Vector is pointing to the Boot Flash
start address after a reset. In this case, the Boot Loader is started after a reset. After the applica-
tion code is loaded, the program can start executing the application code. Note that the fuses
cannot be changed by the MCU itself. This means that once the Boot Reset Fuse is pro-
grammed, the Reset Vector will always point to the Boot Loader Reset and the fuse can only be
changed through the Serial or Parallel Programming interface.
Note: 1. 1 means unprogrammed, 0 means programmed
Store Program
Memory Control
Register SPMCR
The Store Program Memory Control Register contains the control bits needed to control the Boot
Loader operations.
Bit 7 SPMIE: SPM Interrupt Enable
When the SPMIE bit is written to one, and the I-bit in the Status Register is set (one), the SPM
ready interrupt will be enabled. The SPM ready Interrupt will be executed as long as the SPMEN
bit in the SPMCR Register is cleared.
Bit 6 RWWSB: Read-While-Write Section Busy
When a Self-programming (Page Erase or Page Write) operation to the RWW section is initi-
ated, the RWWSB will be set (one) by hardware. When the RWWSB bit is set, the RWW section
cannot be accessed. The RWWSB bit will be cleared if the RWWSRE bit is written to one after a
Self-programming operation is completed. Alternatively the RWWSB bit will automatically be
cleared if a page load operation is initiated.
Bit 5 Res: Reserved Bit
This bit is a reserved bit in the ATmega162 and always read as zero.
Bit 4 RWWSRE: Read-While-Write Section Read Enable
When programming (Page Erase or Page Write) to the RWW section, the RWW section is
blocked for reading (the RWWSB will be set by hardware). To re-enable the RWW section, the
user software must wait until the programming is completed (SPMEN will be cleared). Then, if
the RWWSRE bit is written to one at the same time as SPMEN, the next SPM instruction within
four clock cycles re-enables the RWW section. The RWW section cannot be re-enabled while
the Flash is busy with a Page Erase or a Page Write (SPMEN is set). If the RWWSRE bit is writ-
ten while the Flash is being loaded, the Flash load operation will abort and the data loaded will
be lost.
Table 91. Boot Reset Fuse
(1)
BOOTRST Reset Address
1 Reset Vector =Application Reset (address 0x0000).
0 Reset Vector =Boot Loader Reset (see Table 93 on page 228).
Bit 7 6 5 4 3 2 1 0
SPMIE RWWSB RWWSRE BLBSET PGWRT PGERS SPMEN SPMCR
Read/Write R/W R R R/W R/W R/W R/W R/W
Initial Value 0 0 0 0 0 0 0 0
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Bit 3 BLBSET: Boot Lock Bit Set
If this bit is written to one at the same time as SPMEN, the next SPM instruction within four clock
cycles sets Boot Lock bits, according to the data in R0. The data in R1 and the address in the Z-
pointer are ignored. The BLBSET bit will automatically be cleared upon completion of the Lock
bit set, or if no SPM instruction is executed within four clock cycles.
An LPM instruction within three cycles after BLBSET and SPMEN are set in the SPMCR Regis-
ter, will read either the Lock bits or the Fuse bits (depending on Z0 in the Z-pointer) into the
destination register. See Reading the Fuse and Lock Bits from Software on page 225 for
details.
Bit 2 PGWRT: Page Write
If this bit is written to one at the same time as SPMEN, the next SPM instruction within four clock
cycles executes Page Write, with the data stored in the temporary buffer. The page address is
taken from the high part of the Z-pointer. The data in R1 and R0 are ignored. The PGWRT bit
will autoclear upon completion of a Page Write, or if no SPM instruction is executed within four
clock cycles. The CPU is halted during the entire Page Write operation if the NRWW section is
addressed.
Bit 1 PGERS: Page Erase
If this bit is written to one at the same time as SPMEN, the next SPM instruction within four clock
cycles executes Page Erase. The page address is taken from the high part of the Z-pointer. The
data in R1 and R0 are ignored. The PGERS bit will auto-clear upon completion of a Page Erase,
or if no SPM instruction is executed within four clock cycles. The CPU is halted during the entire
Page Write operation if the NRWW section is addressed.
Bit 0 SPMEN: Store Program Memory Enable
This bit enables the SPM instruction for the next four clock cycles. If written to one together with
either RWWSRE, BLBSET, PGWRT or PGERS, the following SPM instruction will have a spe-
cial meaning, see description above. If only SPMEN is written, the following SPM instruction will
store the value in R1:R0 in the temporary page buffer addressed by the Z-pointer. The LSB of
the Z-pointer is ignored. The SPMEN bit will auto-clear upon completion of an SPM instruction,
or if no SPM instruction is executed within four clock cycles. During Page Erase and Page Write,
the SPMEN bit remains high until the operation is completed.
Writing any other combination than 10001, 01001, 00101, 00011 or 00001 in the lower
five bits will have no effect.
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Addressing the
Flash During Self-
programming
The Z-pointer is used to address the SPM commands.
Since the Flash is organized in pages (see Table 105 on page 236), the Program Counter can
be treated as having two different sections. One section, consisting of the least significant bits, is
addressing the words within a page, while the most significant bits are addressing the pages.
This is shown in Figure 95. Note that the Page Erase and Page Write operations are addressed
independently. Therefore it is of major importance that the Boot Loader software addresses the
same page in both the Page Erase and Page Write operation. Once a programming operation is
initiated, the address is latched and the Z-pointer can be used for other operations.
The only SPM operation that does not use the Z-pointer is Setting the Boot Loader Lock bits.
The content of the Z-pointer is ignored and will have no effect on the operation. The LPM
instruction does also use the Z-pointer to store the address. Since this instruction addresses the
Flash byte-by-byte, also the LSB (bit Z0) of the Z-pointer is used.
Figure 95. Addressing the Flash during SPM
(1)
Notes: 1. The different variables used in Figure 95 are listed in Table 95 on page 230.
2. PCPAGE and PCWORD are listed in Table 105 on page 236.
Bit 15 14 13 12 11 10 9 8
ZH (R31) Z15 Z14 Z13 Z12 Z11 Z10 Z9 Z8
ZL (R30) Z7 Z6 Z5 Z4 Z3 Z2 Z1 Z0
7 6 5 4 3 2 1 0
PROGRAM MEMORY
0 1 15
Z - REGISTER
BIT
0
ZPAGEMSB
WORD ADDRESS
WITHIN A PAGE
PAGE ADDRESS
WITHIN THE FLASH
ZPCMSB
INSTRUCTION WORD
PAGE
PCWORD[PAGEMSB:0]:
00
01
02
PAGEEND
PAGE
PCWORD PCPAGE
PCMSB PAGEMSB
PROGRAM
COUNTER
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Self-programming
the Flash
The program memory is updated in a page by page fashion. Before programming a page with
the data stored in the temporary page buffer, the page must be erased. The temporary page buf-
fer is filled one word at a time using SPM and the buffer can be filled either before the Page
Erase command or between a Page Erase and a Page Write operation:
Alternative 1, fill the buffer before a Page Erase
Fill temporary page buffer
Perform a Page Erase
Perform a Page Write
Alternative 2, fill the buffer after Page Erase
Perform a Page Erase
Fill temporary page buffer
Perform a Page Write
If only a part of the page needs to be changed, the rest of the page must be stored (for example
in the temporary page buffer) before the erase, and then be rewritten. When using alternative 1,
the Boot Loader provides an effective Read-Modify-Write feature which allows the user software
to first read the page, do the necessary changes, and then write back the modified data. If alter-
native 2 is used, it is not possible to read the old data while loading since the page is already
erased. The temporary page buffer can be accessed in a random sequence. It is essential that
the page address used in both the Page Erase and Page Write operation is addressing the
same page. See Simple Assembly Code Example for a Boot Loader on page 227 for an
assembly code example.
Performing Page
Erase by SPM
To execute Page Erase, set up the address in the Z-pointer, write X0000011 to SPMCR and
execute SPM within four clock cycles after writing SPMCR. The data in R1 and R0 is ignored.
The page address must be written to PCPAGE in the Z-register. Other bits in the Z-pointer will
be ignored during this operation.
Page Erase to the RWW section: The NRWW section can be read during the Page Erase.
Page Erase to the NRWW section: The CPU is halted during the operation.
Filling the Temporary
Buffer (Page Loading)
To write an instruction word, set up the address in the Z-pointer and data in R1:R0, write
00000001 to SPMCR and execute SPM within four clock cycles after writing SPMCR. The con-
tent of PCWORD in the Z-register is used to address the data in the temporary buffer. The
temporary buffer will auto-erase after a Page Write operation or by writing the RWWSRE bit in
SPMCR. It is also erased after a System Reset. Note that it is not possible to write more than
one time to each address without erasing the temporary buffer.
Note: If the EEPROM is written in the middle of an SPM Page Load operation, all data loaded will be
lost.
Performing a Page
Write
To execute Page Write, set up the address in the Z-pointer, write X0000101 to SPMCR and
execute SPM within four clock cycles after writing SPMCR. The data in R1 and R0 is ignored.
The page address must be written to PCPAGE. Other bits in the Z-pointer must be written zero
during this operation.
Page Write to the RWW section: The NRWW section can be read during the Page Write.
Page Write to the NRWW section: The CPU is halted during the operation.
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Using the SPM
Interrupt
If the SPM interrupt is enabled, the SPM interrupt will generate a constant interrupt when the
SPMEN bit in SPMCR is cleared. This means that the interrupt can be used instead of polling
the SPMCR Register in software. When using the SPM interrupt, the Interrupt Vectors should be
moved to the BLS section to avoid that an interrupt is accessing the RWW section when it is
blocked for reading. How to move the interrupts is described in Interrupts on page 57.
Consideration while
Updating BLS
Special care must be taken if the user allows the Boot Loader section to be updated by leaving
Boot Lock bit11 unprogrammed. An accidental write to the Boot Loader itself can corrupt the
entire Boot Loader, and further software updates might be impossible. If it is not necessary to
change the Boot Loader software itself, it is recommended to program the Boot Lock bit11 to
protect the Boot Loader software from any internal software changes.
Prevent Reading the
RWW Section During
Self-programming
During Self-programming (either Page Erase or Page Write), the RWW section is always
blocked for reading. The user software itself must prevent that this section is addressed during
the self programming operation. The RWWSB in the SPMCR will be set as long as the RWW
section is busy. During Self-programming the Interrupt Vector table should be moved to the BLS
as described in Interrupts on page 57, or the interrupts must be disabled. Before addressing
the RWW section after the programming is completed, the user software must clear the
RWWSB by writing the RWWSRE. See Simple Assembly Code Example for a Boot Loader on
page 227 for an example.
Setting the Boot
Loader Lock Bits by
SPM
To set the Boot Loader Lock bits, write the desired data to R0, write X0001001 to SPMCR and
execute SPM within four clock cycles after writing SPMCR. The only accessible Lock bits are the
Boot Lock bits that may prevent the Application and Boot Loader section from any software
update by the MCU.
See Table 89 and Table 90 for how the different settings of the Boot Loader bits affect the Flash
access.
If bits 5..2 in R0 are cleared (zero), the corresponding Boot Lock bit will be programmed if an
SPM instruction is executed within four cycles after BLBSET and SPMEN are set in SPMCR.
The Z-pointer is dont care during this operation, but for future compatibility it is recommended to
load the Z-pointer with 0x0001 (same as used for reading the Lock bits). For future compatibility
it is also recommended to set bits 7, 6, 1, and 0 in R0 to 1 when writing the Lock bits. When
programming the Lock bits the entire Flash can be read during the operation.
EEPROM Write
Prevents Writing to
SPMCR
Note that an EEPROM write operation will block all software programming to Flash. Reading the
Fuses and Lock bits from software will also be prevented during the EEPROM write operation. It
is recommended that the user checks the status bit (EEWE) in the EECR Register and verifies
that the bit is cleared before writing to the SPMCR Register.
Reading the Fuse and
Lock Bits from
Software
It is possible to read both the Fuse and Lock bits from software. To read the Lock bits, load the
Z-pointer with 0x0001 and set the BLBSET and SPMEN bits in SPMCR. When an LPM instruc-
tion is executed within three CPU cycles after the BLBSET and SPMEN bits are set in SPMCR,
the value of the Lock bits will be loaded in the destination register. The BLBSET and SPMEN
bits will auto-clear upon completion of reading the Lock bits or if no LPM instruction is executed
within three CPU cycles or no SPM instruction is executed within four CPU cycles. When BLB-
SET and SPMEN are cleared, LPM will work as described in the Instruction set Manual.
Bit 7 6 5 4 3 2 1 0
R0 1 1 BLB12 BLB11 BLB02 BLB01 1 1
Bit 7 6 5 4 3 2 1 0
Rd BLB12 BLB11 BLB02 BLB01 LB2 LB1
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The algorithm for reading the Fuse Low byte is similar to the one described above for reading
the Lock bits. To read the Fuse Low byte, load the Z-pointer with 0x0000 and set the BLBSET
and SPMEN bits in SPMCR. When an LPM instruction is executed within three cycles after the
BLBSET and SPMEN bits are set in the SPMCR, the value of the Fuse Low byte (FLB) will be
loaded in the destination register as shown below. Refer to Table 100 on page 233 for a detailed
description and mapping of the Fuse Low byte.
Similarly, when reading the Fuse High byte, load 0x0003 in the Z-pointer. When an LPM instruc-
tion is executed within three cycles after the BLBSET and SPMEN bits are set in the SPMCR,
the value of the Fuse High byte (FHB) will be loaded in the destination register as shown below.
Refer to Table 98 on page 232 for detailed description and mapping of the Fuse High byte.
When reading the Extended Fuse byte, load 0x0002 in the Z-pointer. When an LPM instruction
is executed within three cycles after the BLBSET and SPMEN bits are set in the SPMCR, the
value of the Extended Fuse byte (EFB) will be loaded in the destination register as shown below.
Refer to Table 98 on page 232 for detailed description and mapping of the Extended Fuse byte.
Fuse and Lock bits that are programmed, will be read as zero. Fuse and Lock bits that are
unprogrammed, will be read as one.
Preventing Flash
Corruption
During periods of low V
CC
, the Flash program can be corrupted because the supply voltage is
too low for the CPU and the Flash to operate properly. These issues are the same as for board
level systems using the Flash, and the same design solutions should be applied.
A Flash program corruption can be caused by two situations when the voltage is too low. First, a
regular write sequence to the Flash requires a minimum voltage to operate correctly. Secondly,
the CPU itself can execute instructions incorrectly, if the supply voltage for executing instructions
is too low.
Flash corruption can easily be avoided by following these design recommendations (one is
sufficient):
1. If there is no need for a Boot Loader update in the system, program the Boot Loader
Lock bits to prevent any Boot Loader software updates.
2. Keep the AVR RESET active (low) during periods of insufficient power supply voltage.
This can be done by enabling the internal Brown-out Detector (BOD) if the operating volt-
age matches the detection level. If not, an external low V
CC
Reset Protection circuit can
be used. If a Reset occurs while a write operation is in progress, the write operation will
be completed provided that the power supply voltage is sufficient.
3. Keep the AVR core in Power-down sleep mode during periods of low V
CC
. This will pre-
vent the CPU from attempting to decode and execute instructions, effectively protecting
the SPMCR Register and thus the Flash from unintentional writes.
Bit 7 6 5 4 3 2 1 0
Rd FLB7 FLB6 FLB5 FLB4 FLB3 FLB2 FLB1 FLB0
Bit 7 6 5 4 3 2 1 0
Rd FHB7 FHB6 FHB5 FHB4 FHB3 FHB2 FHB1 FHB0
Bit 7 6 5 4 3 2 1 0
Rd EFB4 EFB3 EFB2 EFB1
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Programming Time for
Flash When Using
SPM
The calibrated RC Oscillator is used to time Flash accesses. Table 92 shows the typical pro-
gramming time for Flash accesses from the CPU.
Simple Assembly
Code Example for a
Boot Loader
;-the routine writes one page of data from RAM to Flash
; the first data location in RAM is pointed to by the Y pointer
; the first data location in Flash is pointed to by the Z-pointer
;-error handling is not included
;-the routine must be placed inside the boot space
; (at least the Do_spm sub routine). Only code inside NRWW section can
; be read during self-programming (page erase and page write).
;-registers used: r0, r1, temp1 (r16), temp2 (r17), looplo (r24),
; loophi (r25), spmcrval (r20)
; storing and restoring of registers is not included in the routine
; register usage can be optimized at the expense of code size
;-It is assumed that either the interrupt table is moved to the Boot
; loader section or that the interrupts are disabled.
.equ PAGESIZEB = PAGESIZE*2 ;PAGESIZEB is page size in BYTES, not
; words
.org SMALLBOOTSTART
Write_page:
; page erase
ldi spmcrval, (1<<PGERS) | (1<<SPMEN)
call Do_spm
; re-enable the RWW section
ldi spmcrval, (1<<RWWSRE) | (1<<SPMEN)
call Do_spm
; transfer data from RAM to Flash page buffer
ldi looplo, low(PAGESIZEB) ;init loop variable
ldi loophi, high(PAGESIZEB) ;not required for PAGESIZEB<=256
Wrloop:
ld r0, Y+
ld r1, Y+
ldi spmcrval, (1<<SPMEN)
call Do_spm
adiw ZH:ZL, 2
sbiw loophi:looplo, 2 ;use subi for PAGESIZEB<=256
brne Wrloop
; execute page write
subi ZL, low(PAGESIZEB) ;restore pointer
sbci ZH, high(PAGESIZEB) ;not required for PAGESIZEB<=256
ldi spmcrval, (1<<PGWRT) | (1<<SPMEN)
call Do_spm
; re-enable the RWW section
ldi spmcrval, (1<<RWWSRE) | (1<<SPMEN)
call Do_spm
; read back and check, optional
ldi looplo, low(PAGESIZEB) ;init loop variable
ldi loophi, high(PAGESIZEB) ;not required for PAGESIZEB<=256
subi YL, low(PAGESIZEB) ;restore pointer
sbci YH, high(PAGESIZEB)
Rdloop:
lpm r0, Z+
Table 92. SPM Programming Time
Symbol Min Programming Time Max Programming Time
Flash Write (Page Erase, Page Write,
and Write Lock bits by SPM)
3.7ms 4.5ms
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ld r1, Y+
cpse r0, r1
jmp Error
sbiw loophi:looplo, 1 ;use subi for PAGESIZEB<=256
brne Rdloop
; return to RWW section
; verify that RWW section is safe to read
Return:
in temp1, SPMCR
sbrs temp1, RWWSB ; If RWWSB is set, the RWW section is not
; ready yet
ret
; re-enable the RWW section
ldi spmcrval, (1<<RWWSRE) | (1<<SPMEN)
call Do_spm
rjmp Return
Do_spm:
; check for previous SPM complete
Wait_spm:
in temp1, SPMCR
sbrc temp1, SPMEN
rjmp Wait_spm
; input: spmcrval determines SPM action
; disable interrupts if enabled, store status
in temp2, SREG
cli
; check that no EEPROM write access is present
Wait_ee:
sbic EECR, EEWE
rjmp Wait_ee
; SPM timed sequence
out SPMCR, spmcrval
spm
; restore SREG (to enable interrupts if originally enabled)
out SREG, temp2
ret
ATmega162 Boot
Loader Parameters
In Table 93 through Table 95, the parameters used in the description of the self programming
are given.
Table 93. Boot Size Configuration
(1)
BOOTSZ1 BOOTSZ0
Boot
Size Pages
Application
Flash
Section
Boot
Loader
Flash
Section
End
Application
Section
Boot Reset
Address
(Start Boot
Loader
Section)
1 1
128
words
2
0x0000 -
0x1F7F
0x1F80 -
0x1FFF
0x1F7F 0x1F80
1 0
256
words
4
0x0000 -
0x1EFF
0x1F00 -
0x1FFF
0x1EFF 0x1F00
0 1
512
words
8
0x0000 -
0x1DFF
0x1E00 -
0x1FFF
0x1DFF 0x1E00
0 0
1024
words
16
0x0000 -
0x1BFF
0x1C00 -
0x1FFF
0x1BFF 0x1C00
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Note: 1. The different BOOTSZ Fuse configurations are shown in Figure 94
Note: 1. For details about these two section, see NRWW No Read-While-Write Section on page
218 and RWW Read-While-Write Section on page 218
Table 94. Read-While-Write Limit
Section Pages Address
Read-While-Write section (RWW) 112 0x0000 - 0x1BFF
No Read-While-Write section (NRWW) 16 0x1C00 - 0x1FFF
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Note: 1. Z15:Z14: always ignored
Z0: should be zero for all SPM commands, byte select for the LPM instruction.
See Addressing the Flash During Self-programming on page 223 for details about the use of
Z-pointer during Self-programming.
Tabl e 95. Explanation of Different Variables Used in Figure 95 and the Mapping to the Z-
pointer
(1)
Variable
Corresponding
Z-value Description
PCMSB
12 Most significant bit in the Program Counter.
(The Program Counter is 13 bits PC[12:0])
PAGEMSB
5 Most significant bit which is used to address
the words within one page (64 words in a page
requires 6 bits PC [5:0]).
ZPCMSB
Z13 Bit in Z-register that is mapped to PCMSB.
Because Z0 is not used, the ZPCMSB equals
PCMSB +1.
ZPAGEMSB
Z6 Bit in Z-register that is mapped to PCMSB.
Because Z0 is not used, the ZPAGEMSB
equals PAGEMSB +1.
PCPAGE
PC[12:6] Z13:Z7 Program Counter page address: Page select,
for Page Erase and Page Write
PCWORD
PC[5:0] Z6:Z1 Program Counter word address: Word select,
for filling temporary buffer (must be zero during
Page Write operation)
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Memory
Programming
Program And Data
Memory Lock Bits
The ATmega162 provides six Lock bits which can be left unprogrammed (1) or can be pro-
grammed (0) to obtain the additional features listed in Table 97. The Lock bits can only be
erased to 1 with the Chip Erase command.
Note: 1. 1 means unprogrammed, 0 means programmed
Table 96. Lock Bit Byte
(1)
Lock Bit Byte Bit no Description Default Value
7 1 (unprogrammed)
6 1 (unprogrammed)
BLB12 5 Boot Lock bit 1 (unprogrammed)
BLB11 4 Boot Lock bit 1 (unprogrammed)
BLB02 3 Boot Lock bit 1 (unprogrammed)
BLB01 2 Boot Lock bit 1 (unprogrammed)
LB2 1 Lock bit 1 (unprogrammed)
LB1 0 Lock bit 1 (unprogrammed)
Table 97. Lock Bit Protection Modes
(1)(2)
Memory Lock Bits Protection Type
LB Mode LB2 LB1
1 1 1 No memory lock features enabled.
2 1 0
Further programming of the Flash and EEPROM is
disabled in Parallel and SPI/J TAG Serial Programming
mode. The Fuse bits are locked in both Serial and Parallel
Programming mode
(1)
.
3 0 0
Further programming and verification of the Flash and
EEPROM is disabled in Parallel and SPI/J TAG Serial
Programming mode. Also the Boot Lock bits and the Fuse
bits are locked in both Serial and Parallel Programming
mode
(1)
.
BLB0 Mode BLB02 BLB01
1 1 1
No restrictions for SPM or LPM accessing the Application
section.
2 1 0 SPM is not allowed to write to the Application section.
3 0 0
SPM is not allowed to write to the Application section, and
LPM executing from the Boot Loader section is not
allowed to read from the Application section. If Interrupt
Vectors are placed in the Boot Loader section, interrupts
are disabled while executing from the Application section.
4 0 1
LPM executing from the Boot Loader section is not
allowed to read from the Application section. If Interrupt
Vectors are placed in the Boot Loader section, interrupts
are disabled while executing from the Application section.
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Notes: 1. Program the Fuse bits and Boot Lock bits before programming the LB1 and LB2.
2. 1 means unprogrammed, 0 means programmed
Fuse Bits The ATmega162 has three Fuse bytes. Table 99 and Table 100 describe briefly the functionality
of all the fuses and how they are mapped into the Fuse bytes. Note that the fuses are read as
logical zero, 0, if they are programmed.
Notes: 1. See ATmega161 Compatibility Mode on page 4 for details.
2. See Table 19 on page 50 for BODLEVEL Fuse decoding.
BLB1 Mode BLB12 BLB11
1 1 1
No restrictions for SPM or LPM accessing the Boot Loader
section.
2 1 0 SPM is not allowed to write to the Boot Loader section.
3 0 0
SPM is not allowed to write to the Boot Loader section,
and LPM executing from the Application section is not
allowed to read from the Boot Loader section. If Interrupt
Vectors are placed in the Application section, interrupts
are disabled while executing from the Boot Loader
section.
4 0 1
LPM executing from the Application section is not allowed
to read from the Boot Loader section. If Interrupt Vectors
are placed in the Application section, interrupts are
disabled while executing from the Boot Loader section.
Table 97. Lock Bit Protection Modes
(1)(2)
(Continued)
Memory Lock Bits Protection Type
Table 98. Extended Fuse Byte
(1)(2)
Fuse Low Byte Bit no Description Default Value
7 1
6 1
5 1
M161C 4
ATmega161 compatibility
mode
1 (unprogrammed)
BODLEVEL2
(2)
3
Brown-out Detector
trigger level
1 (unprogrammed)
BODLEVEL1
(2)
2
Brown-out Detector
trigger level
1 (unprogrammed)
BODLEVEL0
(2)
1
Brown-out Detector
trigger level
1 (unprogrammed)
0 1
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Notes: 1. The SPIEN Fuse is not accessible in SPI Serial Programming mode.
2. The default value of BOOTSZ1:0 results in maximum Boot Size. See Table 93 on page 228 for
details.
3. Never ship a product with the OCDEN Fuse programmed regardless of the setting of Lock bits
and the J TAGEN Fuse. A programmed OCDEN Fuse enables some parts of the clock system
to be running in all sleep modes. This may increase the power consumption.
4. If the J TAG interface is left unconnected, the J TAGEN fuse should if possible be disabled. This
to avoid static current at the TDO pin in the J TAG interface.
Notes: 1. The default value of SUT1:0 results in maximum start-up time for the default clock source. See
Table 12 on page 39 for details.
2. The default setting of CKSEL3:0 results in Internal RC Oscillator @ 8 MHz. See Table 5 on
page 36 for details.
3. The CKOUT Fuse allow the system clock to be output on PortB 0. See Clock output buffer on
page 40 for details.
4. See System Clock Prescaler on page 41 for details.
The status of the Fuse bits is not affected by Chip Erase. Note that the Fuse bits are locked if
Lock bit1 (LB1) is programmed. Program the Fuse bits before programming the Lock bits.
Table 99. Fuse High Byte
Fuse Low Byte Bit no Description Default Value
OCDEN
(3)
7 Enable OCD
1 (unprogrammed, OCD
disabled)
J TAGEN
(4)
6 Enable J TAG
0 (programmed, J TAG
enabled)
SPIEN
(1)
5
Enable Serial Program and Data
Downloading
0 (programmed, SPI prog.
enabled)
WDTON 4 Watchdog Timer always on 1 (unprogrammed)
EESAVE 3
EEPROM memory is preserved
through the Chip Erase
1 (unprogrammed,
EEPROM not preserved)
BOOTSZ1 2
Select Boot Size (see Table 93 for
details)
0 (programmed)
(2)
BOOTSZ0 1
Select Boot Size (see Table 93 for
details)
0 (programmed)
(2)
BOOTRST 0 Select Reset Vector 1 (unprogrammed)
Table 100. Fuse Low Byte
Fuse Low Byte Bit no Description Default value
CKDIV8
(4)
7 Divide clock by 8 0 (programmed)
CKOUT
(3)
6 Clock Output 1 (unprogrammed)
SUT1 5 Select start-up time 1 (unprogrammed)
(1)
SUT0 4 Select start-up time 0 (programmed)
(1)
CKSEL3 3 Select Clock source 0 (programmed)
(2)
CKSEL2 2 Select Clock source 0 (programmed)
(2)
CKSEL1 1 Select Clock source 1 (unprogrammed)
(2)
CKSEL0 0 Select Clock source 0 (programmed)
(2)
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Latching of Fuses The Fuse values are latched when the device enters Programming mode and changes of the
Fuse values will have no effect until the part leaves Programming mode. This does not apply to
the EESAVE Fuse which will take effect once it is programmed. The Fuses are also latched on
Power-up in Normal mode.
Signature Bytes All Atmel microcontrollers have a 3-byte signature code which identifies the device. This code
can be read in both Serial and Parallel mode, also when the device is locked. The three bytes
reside in a separate address space.
For the ATmega162 the signature bytes are:
1. 0x000: 0x1E (indicates manufactured by Atmel).
2. 0x001: 0x94 (indicates 16KB Flash memory).
3. 0x002: 0x04 (indicates ATmega162 device when 0x001 is 0x94).
Calibration Byte The ATmega162 has a one-byte calibration value for the internal RC Oscillator. This byte
resides in the high byte of address 0x000 in the signature address space. During Reset, this
byte is automatically written into the OSCCAL Register to ensure correct frequency of the cali-
brated RC Oscillator.
Parallel
Programming
Parameters, Pin
Mapping, and
Commands
This section describes how to parallel program and verify Flash Program memory, EEPROM
Data memory, Memory Lock bits, and Fuse bits in the ATmega162. Pulses are assumed to be at
least 250 ns unless otherwise noted.
Signal Names In this section, some pins of the ATmega162 are referenced by signal names describing their
functionality during parallel programming, see Figure 96 and Table 101. Pins not described in
the following table are referenced by pin names.
The XA1/XA0 pins determine the action executed when the XTAL1 pin is given a positive pulse.
The bit coding is shown in Table 103.
When pulsing WR or OE, the command loaded determines the action executed. The different
Commands are shown in Table 104.
Figure 96. Parallel Programming
VCC
+5V
GND
XTAL1
PD1
PD2
PD3
PD4
PD5
PD6
PB7 - PB0 DATA
RESET
PD7
+12 V
BS1
XA0
XA1
OE
RDY/BSY
PAGEL
PA0
WR
BS2
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Table 101. Pin Name Mapping
Signal Name in
Programming Mode Pin Name I/O Function
RDY/BSY PD1 O
0: Device is busy programming, 1: Device is ready
for new command
OE PD2 I Output Enable (Active low)
WR PD3 I Write Pulse (Active low)
BS1 PD4 I
Byte Select 1 (0 selects low byte, 1 selects high
byte)
XA0 PD5 I XTAL Action Bit 0
XA1 PD6 I XTAL Action Bit 1
PAGEL PD7 I Program Memory and EEPROM data Page Load
BS2 PA0 I
Byte Select 2 (0 selects low byte, 1 selects 2nd
high byte)
DATA PB7 - 0 I/O Bi-directional Data bus (Output when OE is low)
Table 102. Pin Values used to Enter Programming Mode
Pin Symbol Value
PAGEL Prog_enable[3] 0
XA1 Prog_enable[2] 0
XA0 Prog_enable[1] 0
BS1 Prog_enable[0] 0
Table 103. XA1 and XA0 Coding
XA1 XA0 Action when XTAL1 is Pulsed
0 0 Load Flash or EEPROM address (High or low address byte determined by BS1)
0 1 Load Data (High or Low data byte for Flash determined by BS1).
1 0 Load Command
1 1 No Action, Idle
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Parallel
Programming
Enter Programming
Mode
The following algorithm puts the device in Parallel Programming mode:
1. Apply 4.5 - 5.5V between V
CC
and GND, and wait at least 100 s.
2. Set RESET to 0 and toggle XTAL1 at least six times.
3. Set the Prog_enable pins listed in Table 102 on page 235 to 0000 and wait at least 100
ns.
4. Apply 11.5 - 12.5V to RESET. Any activity on Prog_enable pins within 100 ns after +12V
has been applied to RESET, will cause the device to fail entering Programming mode.
Considerations for
Efficient Programming
The loaded command and address are retained in the device during programming. For efficient
programming, the following should be considered.
The command needs only be loaded once when writing or reading multiple memory
locations.
Skip writing the data value 0xFF, that is the contents of the entire EEPROM (unless the
EESAVE Fuse is programmed) and Flash after a Chip Erase.
Address high byte needs only be loaded before programming or reading a new 256-word
window in Flash or 256 byte EEPROM. This consideration also applies to Signature bytes
reading.
Table 104. Command Byte Bit Coding
Command Byte Command Executed
1000 0000 Chip Erase
0100 0000 Write Fuse Bits
0010 0000 Write Lock Bits
0001 0000 Write Flash
0001 0001 Write EEPROM
0000 1000 Read Signature Bytes and Calibration byte
0000 0100 Read Fuse and Lock Bits
0000 0010 Read Flash
0000 0011 Read EEPROM
Table 105. No. of Words in a Page and no. of Pages in the Flash
Flash Size Page Size PCWORD No. of Pages PCPAGE PCMSB
8K words (16K bytes) 64 words PC[5:0] 128 PC[12:6] 12
Table 106. No. of Words in a Page and no. of Pages in the EEPROM
EEPROM Size Page Size PCWORD No. of pages PCPAGE EEAMSB
512 bytes 4 bytes EEA[1:0] 128 EEA[8:2] 8
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Chip Erase The Chip Erase will erase the Flash and EEPROM
(1)
memories plus Lock bits. The Lock bits are
not reset until the program memory has been completely erased. The Fuse bits are not
changed. A Chip Erase must be performed before the Flash or EEPROM are reprogrammed.
Note: 1. The EEPRPOM memory is preserved during chip erase if the EESAVE Fuse is programmed.
Load Command Chip Erase
1. Set XA1, XA0 to 10. This enables command loading.
2. Set BS1 to 0.
3. Set DATA to 1000 0000. This is the command for Chip Erase.
4. Give XTAL1 a positive pulse. This loads the command.
5. Give WR a negative pulse. This starts the Chip Erase. RDY/BSY goes low.
6. Wait until RDY/BSY goes high before loading a new command.
Programming the
Flash
The Flash is organized in pages, see Table 105 on page 236. When programming the Flash, the
program data is latched into a page buffer. This allows one page of program data to be pro-
grammed simultaneously. The following procedure describes how to program the entire Flash
memory:
A. Load Command Write Flash
1. Set XA1, XA0 to 10. This enables command loading.
2. Set BS1 to 0.
3. Set DATA to 0001 0000. This is the command for Write Flash.
4. Give XTAL1 a positive pulse. This loads the command.
B. Load Address Low byte
1. Set XA1, XA0 to 00. This enables address loading.
2. Set BS1 to 0. This selects low address.
3. Set DATA =Address low byte (0x00 - 0xFF).
4. Give XTAL1 a positive pulse. This loads the address low byte.
C. Load Data Low Byte
1. Set XA1, XA0 to 01. This enables data loading.
2. Set DATA =Data low byte (0x00 - 0xFF).
3. Give XTAL1 a positive pulse. This loads the data byte.
D. Load Data High Byte
1. Set BS1 to 1. This selects high data byte.
2. Set XA1, XA0 to 01. This enables data loading.
3. Set DATA =Data high byte (0x00 - 0xFF).
4. Give XTAL1 a positive pulse. This loads the data byte.
E. Latch Data
1. Set BS1 to 1. This selects high data byte.
2. Give PAGEL a positive pulse. This latches the data bytes (See Figure 98 for signal
waveforms).
F. Repeat B through E until the entire buffer is filled or until all data within the page is loaded.
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While the lower bits in the address are mapped to words within the page, the higher bits address
the pages within the FLASH. This is illustrated in Figure 97 on page 238. Note that if less than
eight bits are required to address words in the page (pagesize <256), the most significant bit(s)
in the address low byte are used to address the page when performing a Page Write.
G. Load Address High byte
1. Set XA1, XA0 to 00. This enables address loading.
2. Set BS1 to 1. This selects high address.
3. Set DATA =Address high byte (0x00 - 0xFF).
4. Give XTAL1 a positive pulse. This loads the address high byte.
H. Program Page
1. Give WR a negative pulse. This starts programming of the entire page of data. RDY/BSY
goes low.
2. Wait until RDY/BSY goes high. (See Figure 98 for signal waveforms)
I. Repeat B through H until the entire Flash is programmed or until all data has been
programmed.
J . End Page Programming
1. 1. Set XA1, XA0 to 10. This enables command loading.
2. Set DATA to 0000 0000. This is the command for No Operation.
3. Give XTAL1 a positive pulse. This loads the command, and the internal write signals are
reset.
Figure 97. Addressing the Flash which is Organized in Pages
(1)
Note: 1. PCPAGE and PCWORD are listed in Table 105 on page 236.
PROGRAM MEMORY
WORD ADDRESS
WITHIN A PAGE
PAGE ADDRESS
WITHIN THE FLASH
INSTRUCTION WORD
PAGE
PCWORD[PAGEMSB:0]:
00
01
02
PAGEEND
PAGE
PCWORD PCPAGE
PCMSB PAGEMSB
PROGRAM
COUNTER
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Figure 98. Programming the Flash Waveforms
Note: XX is dont care. The letters refer to the programming description above.
Programming the
EEPROM
The EEPROM is organized in pages, see Table 106 on page 236. When programming the
EEPROM, the program data is latched into a page buffer. This allows one page of data to be
programmed simultaneously. The programming algorithm for the EEPROM data memory is as
follows (refer to Programming the Flash on page 237 for details on Command, Address and
Data loading):
1. A: Load Command 0001 0001.
2. G: Load Address High Byte (0x00 - 0xFF).
3. B: Load Address Low Byte (0x00 - 0xFF).
4. C: Load Data (0x00 - 0xFF).
5. E: Latch data (give PAGEL a positive pulse).
K: Repeat 3 through 5 until the entire buffer is filled.
L: Program EEPROM page
1. Set BS to 0.
2. Give WR a negative pulse. This starts programming of the EEPROM page. RDY/BSY
goes low.
3. Wait until to RDY/BSY goes high before programming the next page
(See Figure 99 for signal waveforms).
RDY/BSY
WR
OE
RESET +12V
PAGEL
BS2
0x10 ADDR. LOW ADDR. HIGH
DATA
DATA LOW DATA HIGH ADDR. LOW DATA LOW DATA HIGH
XA1
XA0
BS1
XTAL1
XX XX XX
A B C D E B C D E G H
F
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Figure 99. Programming the EEPROM Waveforms
Reading the Flash The algorithm for reading the Flash memory is as follows (refer to Programming the Flash on
page 237 for details on Command and Address loading):
1. A: Load Command 0000 0010.
2. G: Load Address High Byte (0x00 - 0xFF).
3. B: Load Address Low Byte (0x00 - 0xFF).
4. Set OE to 0, and BS1 to 0. The Flash word low byte can now be read at DATA.
5. Set BS to 1. The Flash word high byte can now be read at DATA.
6. Set OE to 1.
Reading the EEPROM The algorithm for reading the EEPROM memory is as follows (refer to Programming the Flash
on page 237 for details on Command and Address loading):
1. A: Load Command 0000 0011.
2. G: Load Address High Byte (0x00 - 0xFF).
3. B: Load Address Low Byte (0x00 - 0xFF).
4. Set OE to 0, and BS1 to 0. The EEPROM Data byte can now be read at DATA.
5. Set OE to 1.
Programming the
Fuse Low Bits
The algorithm for programming the Fuse Low bits is as follows (refer to Programming the Flash
on page 237 for details on Command and Data loading):
1. A: Load Command 0100 0000.
2. C: Load Data Low Byte. Bit n =0 programs and bit n =1 erases the Fuse bit.
3. Set BS1 to 0 and BS2 to 0. This selects low data byte.
4. Give WR a negative pulse and wait for RDY/BSY to go high.
RDY/BSY
WR
OE
RESET +12V
PAGEL
BS2
0x11 ADDR. HIGH
DATA
ADDR. LOW DATA ADDR. LOW DATA XX
XA1
XA0
BS1
XTAL1
XX
A G B C E B C E L
K
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Programming the
Fuse High Bits
The algorithm for programming the Fuse high bits is as follows (refer to Programming the Flash
on page 237 for details on Command and Data loading):
1. A: Load Command 0100 0000.
2. C: Load Data Low Byte. Bit n =0 programs and bit n =1 erases the Fuse bit.
3. Set BS1 to 1 and BS2 to 0. This selects high data byte.
4. Give WR a negative pulse and wait for RDY/BSY to go high.
5. Set BS1 to 0. This selects low data byte.
Programming the
Extended Fuse Bits
The algorithm for programming the Extended Fuse bits is as follows (refer to Programming the
Flash on page 237 for details on Command and Data loading):
1. 1. A: Load Command 0100 0000.
2. 2. C: Load Data Low Byte. Bit n =0 programs and bit n =1 erases the Fuse bit.
3. 3. Set BS1 to 0 and BS2 to 1. This selects extended data byte.
4. 4. Give WR a negative pulse and wait for RDY/BSY to go high.
5. 5. Set BS2 to 0. This selects low data byte.
Figure 100. Programming the FUSES Waveforms
RDY/BSY
WR
OE
RESET +12V
PAGEL
0x40
DATA
DATA XX
XA1
XA0
BS1
XTAL1
A C
0x40 DATA XX
A C
Write Fuse Low byte Write Fuse high byte
0x40 DATA XX
A C
Write Extended Fuse byte
BS2
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Programming the
Lock Bits
The algorithm for programming the Lock bits is as follows (refer to Programming the Flash on
page 237 for details on Command and Data loading):
1. A: Load Command 0010 0000.
2. C: Load Data Low Byte. Bit n =0 programs the Lock bit. If LB mode 3 is programmed
(LB1 and LB2 is programmed), it is not possible to program the Boot Lock Bits by any
external Programming mode.
3. Give WR a negative pulse and wait for RDY/BSY to go high.
The Lock bits can only be cleared by executing Chip Erase.
Reading the Fuse and
Lock Bits
The algorithm for reading the Fuse and Lock bits is as follows (refer to Programming the Flash
on page 237 for details on Command loading):
1. A: Load Command 0000 0100.
2. Set OE to 0, BS2 to 0 and BS1 to 0. The status of the Fuse Low bits can now be
read at DATA (0 means programmed).
3. Set OE to 0, BS2 to 1 and BS1 to 1. The status of the Fuse High bits can now be
read at DATA (0 means programmed).
4. Set OE to 0, BS2 to 1 and BS1 to 0. The status of the Extended Fuse bits can now
be read at DATA (0 means programmed).
5. Set OE to 0, BS2 to 0 and BS1 to 1. The status of the Lock bits can now be read at
DATA (0 means programmed).
6. Set OE to 1.
Figure 101. Mapping Between BS1, BS2 and the Fuse and Lock Bits During Read
Reading the Signature
Bytes
The algorithm for reading the signature bytes is as follows (refer to Programming the Flash on
page 237 for details on Command and Address loading):
1. A: Load Command 0000 1000.
2. B: Load Address Low Byte (0x00 - 0x02).
3. Set OE to 0, and BS to 0. The selected Signature byte can now be read at DATA.
4. Set OE to 1.
Lock Bits 0
1
BS2
Fuse High Byte
0
1
BS1
DATA
Fuse Low Byte 0
1
BS2
Extended Fuse Byte
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Reading the
Calibration Byte
The algorithm for reading the calibration byte is as follows (refer to Programming the Flash on
page 237 for details on Command and Address loading):
1. A: Load Command 0000 1000.
2. B: Load Address Low Byte, 0x00.
3. Set OE to 0, and BS1 to 1. The Calibration byte can now be read at DATA.
4. Set OE to 1.
Parallel Programming
Characteristics
Figure 102. Parallel Programming Timing, Including some General Timing Requirements
Figure 103. Parallel Programming Timing, Loading Sequence with Timing Requirements
(1)
Note: 1. The timing requirements shown in Figure 102 (i.e., t
DVXH
, t
XHXL
, and t
XLDX
) also apply to load-
ing operation.
Data & Contol
(DATA, XA0/1, BS1, BS2)
XTAL1
t
XHXL
t
WLWH
t
DVXH
t
XLDX
t
PLWL
t
WLRH
WR
RDY/BSY
PAGEL t
PHPL
t
PLBX
t
BVPH
t
XLWL
t
WLBX
t
BVWL
WLRL
XTAL1
PAGEL
t
PLXH
XLXH
t
t
XLPH
ADDR0 (low byte) DATA (low byte) DATA (high byte) ADDR1 (low byte) DATA
BS1
XA0
XA1
LOAD ADDRESS
(LOW BYTE)
LOAD DATA
(LOW BYTE)
LOAD DATA
(HIGH BYTE)
LOAD DATA LOAD ADDRESS
(LOW BYTE)
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Fi gure 104. Parallel Programming Timing, Reading Sequence (within the Same Page) with
Timing Requirements
(1)
Note: 1. The timing requirements shown in Figure 102 (i.e., t
DVXH
, t
XHXL
, and t
XLDX
) also apply to read-
ing operation.
Table 107. Parallel Programming Characteristics, V
CC
=5 V 10%
Symbol Parameter Min Typ Max Units
V
PP
Programming Enable Voltage 11.5 12.5 V
I
PP
Programming Enable Current 250 A
t
DVXH
Data and Control Valid before XTAL1 High 67 ns
t
XLXH
XTAL1 Low to XTAL1 High 200 ns
t
XHXL
XTAL1 Pulse Width High 150 ns
t
XLDX
Data and Control Hold after XTAL1 Low 67 ns
t
XLWL
XTAL1 Low to WR Low 0 ns
t
XLPH
XTAL1 Low to PAGEL high 0 ns
t
PLXH
PAGEL low to XTAL1 high 150 ns
t
BVPH
BS1 Valid before PAGEL High 67 ns
t
PHPL
PAGEL Pulse Width High 150 ns
t
PLBX
BS1 Hold after PAGEL Low 67 ns
t
WLBX
BS2/1 Hold after WR Low 67 ns
t
PLWL
PAGEL Low to WR Low 67 ns
t
BVWL
BS1 Valid to WR Low 67 ns
t
WLWH
WR Pulse Width Low 150 ns
t
WLRL
WR Low to RDY/BSY Low 0 1 s
t
WLRH
WR Low to RDY/BSY High
(1)
3.7 4.5 ms
t
WLRH_CE
WR Low to RDY/BSY High for Chip Erase
(2)
7.5 9 ms
t
XLOL
XTAL1 Low to OE Low 0 ns
XTAL1
OE
ADDR0 (low byte) DATA (low byte) DATA (high byte) ADDR1 (low byte) DATA
BS1
XA0
XA1
LOAD ADDRESS
(LOW BYTE)
READ DATA
(LOW BYTE)
READ DATA
(HIGH BYTE)
LOAD ADDRESS
(LOW BYTE)
t
BVDV
t
OLDV
t
XLOL
t
OHDZ
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Notes: 1. t
WLRH
is valid for the Write Flash, Write EEPROM, Write Fuse Bits and Write Lock Bits
commands.
2. t
WLRH_CE
is valid for the Chip Erase command.
Serial
Downloading
SPI Serial
Programming Pin
Mapping
Both the Flash and EEPROM memory arrays can be programmed using the serial SPI bus while
RESET is pulled to GND. The serial interface consists of pins SCK, MOSI (input) and MISO (out-
put). After RESET is set low, the Programming Enable instruction needs to be executed first
before program/erase operations can be executed. NOTE, in Table 108 on page 245, the pin
mapping for SPI programming is listed. Not all parts use the SPI pins dedicated for the internal
SPI interface.
Figure 105. SPI Serial Programming and Verify
(1)
Note: 1. If the device is clocked by the Internal Oscillator, it is no need to connect a clock source to the
XTAL1 pin.
When programming the EEPROM, an auto-erase cycle is built into the self-timed programming
operation (in the Serial mode ONLY) and there is no need to first execute the Chip Erase
instruction. The Chip Erase operation turns the content of every memory location in both the
Program and EEPROM arrays into 0xFF.
t
BVDV
BS1 Valid to DATA valid 0 250 ns
t
OLDV
OE Low to DATA Valid 250 ns
t
OHDZ
OE High to DATA Tri-stated 250 ns
Table 107. Parallel Programming Characteristics, V
CC
=5 V 10% (Continued)
Symbol Parameter Min Typ Max Units
Table 108. Pin Mapping SPI Serial Programming
Symbol Pins I/O Description
MOSI PB5 I Serial Data in
MISO PB6 O Serial Data out
SCK PB7 I Serial Clock
VCC
GND
XTAL1
SCK
MISO
MOSI
RESET
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Depending on CKSEL Fuses, a valid clock must be present. The minimum low and high periods
for the serial clock (SCK) input are defined as follows:
Low:>2 CPU clock cycles for f
ck
<12 MHz, 3 CPU clock cycles for f
ck
>=12 MHz
High:>2 CPU clock cycles for f
ck
<12 MHz, 3 CPU clock cycles for f
ck
>=12 MHz
SPI Serial
Programming
Algorithm
When writing serial data to the ATmega162, data is clocked on the rising edge of SCK.
When reading data from the ATmega162, data is clocked on the falling edge of SCK. See Figure
106.
To program and verify the ATmega162 in the SPI Serial Programming mode, the following
sequence is recommended (See four byte instruction formats in Table 110):
1. Power-up sequence:
Apply power between V
CC
and GND while RESET and SCK are set to 0. In some sys-
tems, the programmer can not guarantee that SCK is held low during Power-up. In this
case, RESET must be given a positive pulse of at least two CPU clock cycles duration
after SCK has been set to 0.
2. Wait for at least 20 ms and enable SPI Serial Programming by sending the Programming
Enable serial instruction to pin MOSI.
3. The SPI Serial Programming instructions will not work if the communication is out of syn-
chronization. When in sync. the second byte (0x53), will echo back when issuing the third
byte of the Programming Enable instruction. Whether the echo is correct or not, all four
bytes of the instruction must be transmitted. If the 0x53 did not echo back, give RESET a
positive pulse and issue a new Programming Enable command.
4. The Flash is programmed one page at a time. The page size is found in Table 105 on
page 236. The memory page is loaded one byte at a time by supplying the 6 LSB of the
address and data together with the Load Program Memory Page instruction. To ensure
correct loading of the page, the data low byte must be loaded before data high byte is
applied for a given address. The Program Memory Page is stored by loading the Write
Program Memory Page instruction with the 8 MSB of the address. If polling is not used,
the user must wait at least t
WD_FLASH
before issuing the next page. (See Table 109.)
Accessing the SPI serial programming interface before the Flash write operation com-
pletes can result in incorrect programming.
5. The EEPROM array can either be programmed one page at a time or it can be pro-
grammed byte by byte.
For Page Programming, the following algorithm is used:
The EEPROM memory page is loaded one byte at a time by supplying the 2 LSB of the
address and data together with the Load EEPROM Memory Page instruction. The EEPROM
Memory Page is stored by loading the Write EEPROM Memory Page instruction with the 8
MSB of the address. If polling is not used, the user must wait at least t
WD_EEPROM
before issu-
ing the next page. (See Table 99.) Accessing the SPI Serial Programming interface before
the EEPROM write operation completes can result in incorrect programming.
Alternatively, the EEPROM can be programmed bytewise:
The EEPROM array is programmed one byte at a time by supplying the address and data
together with the Write EEPROM instruction. An EEPROM memory location is first automat-
ically erased before new data is written. If polling is not used, the user must wait at least
t
WD_EEPROM
before issuing the next byte. (See Table 109.) In a chip erased device, no 0xFFs
in the data file(s) need to be programmed.
6. Any memory location can be verified by using the Read instruction which returns the con-
tent at the selected address at serial output MISO.
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7. At the end of the programming session, RESET can be set high to commence normal
operation.
8. Power-off sequence (if needed):
Set RESET to 1.
Turn V
CC
power off.
Figure 106. SPI Serial Programming Waveforms
Table 109. Minimum Wait Delay before Writing the Next Flash or EEPROM Location
Symbol Minimum Wait Delay
t
WD_FLASH
4.5 ms
t
WD_EEPROM
9.0 ms
t
WD_ERASE
9.0 ms
t
WD_FUSE
4.5 ms
MSB
MSB
LSB
LSB
SERIAL CLOCK INPUT
(SCK)
SERIAL DATA INPUT
(MOSI)
(MISO)
SAMPLE
SERIAL DATA OUTPUT
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Table 110. SPI Serial Programming Instruction Set
(1)
Instruction Instruction Format Operation
Byte 1 Byte 2 Byte 3 Byte4
Programming Enable
1010 1100 0101 0011 xxxx xxxx xxxx xxxx Enable SPI Serial Programming
after RESET goes low.
Chip Erase 1010 1100 100x xxxx xxxx xxxx xxxx xxxx Chip Erase EEPROM and Flash.
Read Program Memory
0010 H000 00aa aaaa bbbb bbbb oooo oooo Read H (high or low) data o from
Program memory at word address
a:b.
Load Program Memory
Page
0100 H000 00xx xxxx xxbb bbbb iiii iiii Write H (high or low) data i to
Program Memory page at word
address b. Data low byte must be
loaded before Data high byte is
applied within the same address.
Write Program Memory
Page
0100 1100 00aa aaaa bbxx xxxx xxxx xxxx Write Program Memory Page at
address a:b.
Read EEPROM Memory
1010 0000 00xx xxaa bbbb bbbb oooo oooo Read data o from EEPROM
memory at address a:b.
Write EEPROM Memory
(byte access)
1100 0000 00xx xxaa bbbb bbbb iiii iiii Write data i to EEPROM memory at
address a:b.
Load EEPROM Memory
Page (page access)
1100 0001 0000 0000 0000 00bb iiii iiii Load data i to EEPROM memory
page buffer. After data is loaded,
program EEPROM page.
Write EEPROM Memory
Page (page access)
1100 0010 00xx xxaa bbbb bb00 xxxx xxxx Write EEPROM page at address
a:b.
Read Lock Bits
0101 1000 0000 0000 xxxx xxxx xxoo oooo Read Lock bits. 0 =programmed,
1 =unprogrammed. See Table
96 on page 231 for details.
Write Lock Bits
1010 1100 111x xxxx xxxx xxxx 11ii iiii Write Lock bits. Set bits =0 to
program Lock bits. See Table 96
on page 231 for details.
Read Signature Byte
0011 0000 00xx xxxx xxxx xxbb oooo oooo Read Signature Byte o at address
b.
Write Fuse Bits
1010 1100 1010 0000 xxxx xxxx iiii iiii Set bits =0 to program, 1 to
unprogram. See Table 100 on
page 233 for details.
Write Fuse High Bits
1010 1100 1010 1000 xxxx xxxx iiii iiii Set bits =0 to program, 1 to
unprogram. See Table 99 on
page 233 for details.
Write Extended Fuse Bits
1010 1100 1010 0100 xxxx xxxx xxxx xxii Set bits =0 to program, 1 to
unprogram. See Table 98 on
page 232 for details.
Read Fuse Bits
0101 0000 0000 0000 xxxx xxxx oooo oooo Read Fuse bits. 0 =programmed,
1 =unprogrammed. See Table
100 on page 233 for details.
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Note: 1. a =address high bits, b =address low bits, H =0 Low byte, 1 High Byte, o =data out, i =data in, x =dont care
SPI Serial
Programming
Characteristics
For characteristics of the SPI module, see SPI Timing Characteristics on page 268.
Read Fuse High Bits
0101 1000 0000 1000 xxxx xxxx oooo oooo Read Fuse high bits. 0 =pro-
grammed, 1 =unprogrammed.
See Table 99 on page 233 for
details.
Read Extended Fuse Bits
0101 0000 0000 1000 xxxx xxxx oooo oooo Read Extended Fuse bits. 0 =
pro-grammed, 1 =
unprogrammed. See Table 98 on
page 232 for details.
Read Calibration Byte 0011 1000 00xx xxxx 0000 0000 oooo oooo Read Calibration Byte
Poll RDY/BSY
1111 0000 0000 0000 xxxx xxxx xxxx xxxo If o =1, a programming operation
is still busy. Wait until this bit
returns to 0 before applying
another command.
Table 110. SPI Serial Programming Instruction Set
(1)
(Continued)
Instruction Instruction Format Operation
Byte 1 Byte 2 Byte 3 Byte4
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Programming via
the JTAG Interface
Programming through the J TAG interface requires control of the four J TAG specific pins: TCK,
TMS, TDI, and TDO. Control of the Reset and clock pins is not required.
To be able to use the J TAG interface, the J TAGEN Fuse must be programmed. The device is
default shipped with the Fuse programmed. In addition, the J TD bit in MCUCSR must be
cleared. Alternatively, if the J TD bit is set, the External Reset can be forced low. Then, the J TD
bit will be cleared after two chip clocks, and the J TAG pins are available for programming. This
provides a means of using the J TAG pins as normal port pins in running mode while still allowing
In-System Programming via the J TAG interface. Note that this technique can not be used when
using the J TAG pins for Boundary-scan or On-chip Debug. In these cases the J TAG pins must
be dedicated for this purpose.
As a definition in this datasheet, the LSB is shifted in and out first of all Shift Registers.
Programming Specific
JTAG Instructions
The Instruction Register is 4-bit wide, supporting up to 16 instructions. The J TAG instructions
useful for Programming are listed below.
The OPCODE for each instruction is shown behind the instruction name in hex format. The text
describes which Data Register is selected as path between TDI and TDO for each instruction.
The Run-Test/Idle state of the TAP controller is used to generate internal clocks. It can also be
used as an idle state between J TAG sequences. The state machine sequence for changing the
instruction word is shown in Figure 107.
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Figure 107. State machine sequence for changing the instruction word
Test-Logic-Reset
Run-Test/Idle
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Select-IR Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Exit2-IR
Update-IR
Select-DR Scan
Capture-DR
0
1
0
1 1 1
0 0
0 0
1 1
1 0
1
1
0
1
0
0
1 0
1
1
0
1
0
0
0 0
1 1
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AVR_RESET (0xC) The AVR specific public J TAG instruction for setting the AVR device in the Reset mode or taking
the device out from the Reset mode. The TAP controller is not reset by this instruction. The one
bit Reset Register is selected as data register. Note that the reset will be active as long as there
is a logic one in the Reset Chain. The output from this chain is not latched.
The active states are:
Shift-DR: The Reset Register is shifted by the TCK input.
PROG_ENABLE (0x4) The AVR specific public J TAG instruction for enabling programming via the J TAG port. The 16-
bit Programming Enable Register is selected as data register. The active states are the
following:
Shift-DR: The programming enable signature is shifted into the Data Register.
Update-DR: The programming enable signature is compared to the correct value, and
Programming mode is entered if the signature is valid.
PROG_COMMANDS
(0x5)
The AVR specific public J TAG instruction for entering programming commands via the J TAG
port. The 15-bit Programming Command Register is selected as data register. The active states
are the following:
Capture-DR: The result of the previous command is loaded into the Data Register.
Shift-DR: The Data Register is shifted by the TCK input, shifting out the result of the
previous command and shifting in the new command.
Update-DR: The programming command is applied to the Flash inputs.
Run-Test/Idle: One clock cycle is generated, executing the applied command (not always
required, see Table 111 below).
PROG_PAGELOAD
(0x6)
The AVR specific public J TAG instruction to directly load the Flash data page via the J TAG port.
The 1024 bit Virtual Flash Page Load Register is selected as register. This is a virtual scan chain
with length equal to the number of bits in one Flash page. Internally the Shift Register is 8-bit.
Unlike most J TAG instructions, the Update-DR state is not used to transfer data from the Shift
Register. The data are automatically transferred to the Flash page buffer byte-by-byte in the
Shift-DR state by an internal state machine. This is the only active state:
Shift-DR: Flash page data are shifted in from TDI by the TCK input, and automatically
loaded into the Flash page one byte at a time.
Note: The J TAG instruction PROG_PAGELOAD can only be used if the AVR device is the first device in
J TAG scan chain. If the AVR cannot be the first device in the scan chain, the byte-wise program-
ming algorithm must be used.
PROG_PAGEREAD
(0x7)
The AVR specific public J TAG instruction to read one full Flash data page via the J TAG port.
The 1032 bit Virtual Flash Page Read Register is selected as data register. This is a virtual scan
chain with length equal to the number of bits in one Flash page plus eight. Internally the Shift
Register is 8-bit. Unlike most J TAG instructions, the Capture-DR state is not used to transfer
data to the Shift Register. The data are automatically transferred from the Flash page buffer
byte-by-byte in the Shift-DR state by an internal state machine. This is the only active state:
Shift-DR: Flash data are automatically read one byte at a time and shifted out on TDO by the
TCK input. The TDI input is ignored.
Note: The J TAG instruction PROG_PAGEREAD can only be used if the AVR device is the first device in
J TAG scan chain. If the AVR cannot be the first device in the scan chain, the byte-wise program-
ming algorithm must be used.
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Data Registers The Data Registers are selected by the J TAG Instruction Registers described in section Pro-
gramming Specific J TAG Instructions on page 250. The Data Registers relevant for
programming operations are:
Reset Register
Programming Enable Register.
Programming Command Register.
Virtual Flash Page Load Register.
Virtual Flash Page Read Register.
Reset Register The Reset Register is a test data register used to reset the part during programming. It is
required to reset the part before entering Programming mode.
A high value in the Reset Register corresponds to pulling the external reset low. The part is reset
as long as there is a high value present in the Reset Register. Depending on the fuse settings for
the clock options, the part will remain reset for a Reset Time-out period (refer to Clock Sources
on page 36) after releasing the Reset Register. The output from this data register is not latched,
so the reset will take place immediately, as shown in Figure 86 on page 206.
Programming Enable
Register
The Programming Enable Register is a 16-bit register. The contents of this register is compared
to the programming enable signature, binary code 1010_0011_0111_0000. When the contents
of the register is equal to the programming enable signature, programming via the J TAG port is
enabled. The register is reset to 0 on Power-on Reset, and should always be reset when leaving
Programming mode.
Figure 108. Programming Enable Register
TDI
TDO
D
A
T
A
=
D Q
ClockDR & PROG_ENABLE
Programming Enable
0xA370
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Programming
Command Register
The Programming Command Register is a 15-bit register. This register is used to serially shift in
programming commands, and to serially shift out the result of the previous command, if any. The
J TAG Programming Instruction Set is shown in Table 111. The state sequence when shifting in
the programming commands is illustrated in Figure 110.
Figure 109. Programming Command Register
TDI
TDO
S
T
R
O
B
E
S
A
D
D
R
E
S
S
/
D
A
T
A
Flash
EEPROM
Fuses
Lock Bits
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Table 111. J TAG Programming Instruction Set
Instruction TDI sequence TDO sequence Notes
1a. Chip eRase 0100011_10000000
0110001_10000000
0110011_10000000
0110011_10000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
1b. Poll for Chip Erase complete 0110011_10000000 xxxxxox_xxxxxxxx (2)
2a. Enter Flash Write 0100011_00010000 xxxxxxx_xxxxxxxx
2b. Load Address High Byte 0000111_aaaaaaaa xxxxxxx_xxxxxxxx (9)
2c. Load Address Low Byte 0000011_bbbbbbbb xxxxxxx_xxxxxxxx
2d. Load Data Low Byte 0010011_iiiiiiii xxxxxxx_xxxxxxxx
2e. Load Data High Byte 0010111_iiiiiiii xxxxxxx_xxxxxxxx
2f. Latch Data 0110111_00000000
1110111_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
2g. Write Flash Page 0110111_00000000
0110101_00000000
0110111_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
2h. Poll for Page Write complete 0110111_00000000 xxxxxox_xxxxxxxx (2)
3a. Enter Flash Read 0100011_00000010 xxxxxxx_xxxxxxxx
3b. Load Address High Byte 0000111_aaaaaaaa xxxxxxx_xxxxxxxx (9)
3c. Load Address Low Byte 0000011_bbbbbbbb xxxxxxx_xxxxxxxx
3d. Read Data Low and High Byte 0110010_00000000
0110110_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
xxxxxxx_oooooooo
low byte
high byte
4a. Enter EEPROM Write 0100011_00010001 xxxxxxx_xxxxxxxx
4b. Load Address High Byte 0000111_aaaaaaaa xxxxxxx_xxxxxxxx (9)
4c. Load Address Low Byte 0000011_bbbbbbbb xxxxxxx_xxxxxxxx
4d. Load Data Byte 0010011_iiiiiiii xxxxxxx_xxxxxxxx
4e. Latch Data 0110111_00000000
1110111_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
4f. Write EEPROM Page 0110011_00000000
0110001_00000000
0110011_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
4g. Poll for Page Write complete 0110011_00000000 xxxxxox_xxxxxxxx (2)
5a. Enter EEPROM Read 0100011_00000011 xxxxxxx_xxxxxxxx
5b. Load Address High Byte 0000111_aaaaaaaa xxxxxxx_xxxxxxxx (9)
5c. Load Address Low Byte 0000011_bbbbbbbb xxxxxxx_xxxxxxxx
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5d. Read Data Byte 0110011_bbbbbbbb
0110010_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
6a. Enter Fuse Write 0100011_01000000 xxxxxxx_xxxxxxxx
6b. Load Data Low Byte
(6)
0010011_iiiiiiii xxxxxxx_xxxxxxxx (3)
6c. Write Fuse Extended Byte 0111011_00000000
0111001_00000000
0111011_00000000
0111011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
6d. Poll for Fuse Write complete 0110111_00000000 xxxxxox_xxxxxxxx (2)
6e. Load Data Low Byte
(7)
0010011_iiiiiiii xxxxxxx_xxxxxxxx (3)
6f. Write Fuse High byte 0110111_00000000
0110101_00000000
0110111_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
6g. Poll for Fuse Write complete 0110111_00000000 xxxxxox_xxxxxxxx (2)
6h. Load Data Low Byte
(8)
0010011_iiiiiiii xxxxxxx_xxxxxxxx (3)
6i. Write Fuse Low Byte 0110011_00000000
0110001_00000000
0110011_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
6j. Poll for Fuse Write complete 0110011_00000000 xxxxxox_xxxxxxxx (2)
7a. Enter Lock Bit Write 0100011_00100000 xxxxxxx_xxxxxxxx
7b. Load Data Byte
(9)
0010011_11iiiiii xxxxxxx_xxxxxxxx (4)
7c. Write Lock Bits 0110011_00000000
0110001_00000000
0110011_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
(1)
7d. Poll for Lock Bit Write complete 0110011_00000000 xxxxxox_xxxxxxxx (2)
8a. Enter Fuse/Lock Bit Read 0100011_00000100 xxxxxxx_xxxxxxxx
8b. Read Fuse Extended Byte
(6)
0111010_00000000
0111111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
8c. Read Fuse High Byte
(7)
0111110_00000000
0111111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
8d. Read Fuse Low Byte
(8)
0110010_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
8e. Read Lock Bits
(9)
0110110_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxoooooo
(5)
Table 111. J TAG Programming Instruction Set (Continued)
Instruction TDI sequence TDO sequence Notes
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Notes: 1. This command sequence is not required if the seven MSB are correctly set by the previous command sequence (which is
normally the case).
2. Repeat until o =1.
3. Set bits to 0 to program the corresponding Fuse, 1 to unprogram the Fuse.
4. Set bits to 0 to program the corresponding lock bit, 1 to leave the Lock bit unchanged.
5. 0 =programmed, 1 =unprogrammed.
6. The bit mapping for Fuses Extended byte is listed in Table 98 on page 232.
7. The bit mapping for Fuses High byte is listed in Table 99 on page 233.
8. The bit mapping for Fuses Low byte is listed in Table 100 on page 233.
9. The bit mapping for Lock Bits byte is listed in Table 96 on page 231.
10. Address bits exceeding PCMSB and EEAMSB (Table 105 and Table 106) are dont care
Note: a =address high bits
b =address low bits
H =0 Low byte, 1 High Byte
o =data out
i =data in
x =dont care
8f. Read Fuses and Lock Bits 0111010_00000000
0111110_00000000
0110010_00000000
0110110_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
xxxxxxx_oooooooo
xxxxxxx_oooooooo
xxxxxxx_oooooooo
(5)
Fuse ext. byte
Fuse high byte
Fuse low byte
Lock bits
9a. Enter Signature Byte Read 0100011_00001000 xxxxxxx_xxxxxxxx
9b. Load Address Byte 0000011_bbbbbbbb xxxxxxx_xxxxxxxx
9c. Read Signature Byte 0110010_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
10a. Enter Calibration Byte Read 0100011_00001000 xxxxxxx_xxxxxxxx
10b. Load Address Byte 0000011_bbbbbbbb xxxxxxx_xxxxxxxx
10c. Read Calibration Byte 0110110_00000000
0110111_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_oooooooo
11a. Load No Operation Command 0100011_00000000
0110011_00000000
xxxxxxx_xxxxxxxx
xxxxxxx_xxxxxxxx
Table 111. J TAG Programming Instruction Set (Continued)
Instruction TDI sequence TDO sequence Notes
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Figure 110. State Machine Sequence for Changing/Reading the Data Word
Virtual Flash Page
Load Register
The Virtual Flash Page Load Register is a virtual scan chain with length equal to the number of
bits in one Flash page. Internally the Shift Register is 8-bit, and the data are automatically trans-
ferred to the Flash page buffer byte-by-byte. Shift in all instruction words in the page, starting
with the LSB of the first instruction in the page and ending with the MSB of the last instruction in
the page. This provides an efficient way to load the entire Flash page buffer before executing
Page Write.
Test-Logic-Reset
Run-Test/Idle
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Select-IR Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Exit2-IR
Update-IR
Select-DR Scan
Capture-DR
0
1
0
1 1 1
0 0
0 0
1 1
1 0
1
1
0
1
0
0
1 0
1
1
0
1
0
0
0 0
1 1
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Figure 111. Virtual Flash Page Load Register
Virtual Flash Page
Read Register
The Virtual Flash Page Read Register is a virtual scan chain with length equal to the number of
bits in one Flash page plus eight. Internally the Shift Register is 8-bit, and the data are automati-
cally transferred from the Flash data page byte-by-byte. The first eight cycles are used to
transfer the first byte to the internal Shift Register, and the bits that are shifted out during these
right cycles should be ignored. Following this initialization, data are shifted out starting with the
LSB of the first instruction in the page and ending with the MSB of the last instruction in the
page. This provides an efficient way to read one full Flash page to verify programming.
TDI
TDO
D
A
T
A
Flash
EEPROM
Fuses
Lock Bits
STROBES
ADDRESS
State
Machine
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Figure 112. Virtual Flash Page Read Register
Programming
Algorithm
All references below of type 1a, 1b, and so on, refer to Table 111.
Entering
Programming Mode
1. Enter J TAG instruction AVR_RESET and shift one in the Reset Register.
2. Enter instruction PROG_ENABLE and shift 1010_0011_0111_0000 in the Programming
Enable Register.
Leaving Programming
Mode
1. Enter J TAG instruction PROG_COMMANDS.
2. Disable all programming instructions by using no operation instruction 11a.
3. Enter instruction PROG_ENABLE and shift 0000_0000_0000_0000 in the Programming
Enable Register.
4. Enter J TAG instruction AVR_RESET and shift 0 in the Reset Register.
Performing Chip Erase 1. Enter J TAG instruction PROG_COMMANDS.
2. Start Chip Erase using programming instruction 1a.
3. Poll for Chip Erase complete using programming instruction 1b, or wait for t
WLRH_CE
(refer
to Table 107 on page 244).
Programming the
Flash
Before programming the Flash a Chip Erase must be performed. See Performing Chip Erase
on page 260.
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Flash write using programming instruction 2a.
3. Load address high byte using programming instruction 2b.
4. Load address low byte using programming instruction 2c.
5. Load data using programming instructions 2d, 2e and 2f.
6. Repeat steps 4 and 5 for all instruction words in the page.
TDI
TDO
D
A
T
A
Flash
EEPROM
Fuses
Lock Bits
STROBES
ADDRESS
State
Machine
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7. Write the page using programming instruction 2g.
8. Poll for Flash write complete using programming instruction 2h, or wait for t
WLRH_FLASH
(refer to Table 107 on page 244).
9. Repeat steps 3 to 7 until all data have been programmed.
A more efficient data transfer can be achieved using the PROG_PAGELOAD instruction:
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Flash write using programming instruction 2a.
3. Load the page address using programming instructions 2b and 2c. PCWORD (refer to
Table 105 on page 236) is used to address within one page and must be written as 0.
4. Enter J TAG instruction PROG_PAGELOAD.
5. Load the entire page by shifting in all instruction words in the page, starting with the LSB
of the first instruction in the page and ending with the MSB of the last instruction in the
page.
6. Enter J TAG instruction PROG_COMMANDS.
7. Write the page using programming instruction 2g.
8. Poll for Flash write complete using programming instruction 2h, or wait for t
WLRH_FLASH
(refer to Table 107 on page 244).
9. Repeat steps 3 to 8 until all data have been programmed.
Reading the Flash 1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Flash read using programming instruction 3a.
3. Load address using programming instructions 3b and 3c.
4. Read data using programming instruction 3d.
5. Repeat steps 3 and 4 until all data have been read.
A more efficient data transfer can be achieved using the PROG_PAGEREAD instruction:
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Flash read using programming instruction 3a.
3. Load the page address using programming instructions 3b and 3c. PCWORD (refer to
Table 105 on page 236) is used to address within one page and must be written as 0.
4. Enter J TAG instruction PROG_PAGEREAD.
5. Read the entire page by shifting out all instruction words in the page, starting with the
LSB of the first instruction in the page and ending with the MSB of the last instruction in
the page. Remember that the first 8 bits shifted out should be ignored.
6. Enter J TAG instruction PROG_COMMANDS.
7. Repeat steps 3 to 6 until all data have been read.
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Programming the
EEPROM
Before programming the EEPROM a Chip Erase must be performed. See Performing Chip
Erase on page 260.
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable EEPROM write using programming instruction 4a.
3. Load address high byte using programming instruction 4b.
4. Load address low byte using programming instruction 4c.
5. Load data using programming instructions 4d and 4e.
6. Repeat steps 4 and 5 for all data bytes in the page.
7. Write the data using programming instruction 4f.
8. Poll for EEPROM write complete using programming instruction 4g, or wait for t
WLRH
(refer to Table 107 on page 244).
9. Repeat steps 3 to 8 until all data have been programmed.
Note: The PROG_PAGELOAD instruction can not be used when programming the EEPROM
Reading the EEPROM 1. Enter J TAG instruction PROG_COMMANDS.
2. Enable EEPROM read using programming instruction 5a.
3. Load address using programming instructions 5b and 5c.
4. Read data using programming instruction 5d.
5. Repeat steps 3 and 4 until all data have been read.
Note: The PROG_PAGEREAD instruction can not be used when reading the EEPROM
Programming the
Fuses
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Fuse write using programming instruction 6a.
3. Load data low byte using programming instructions 6b. A bit value of 0 will program the
corresponding Fuse, a 1 will unprogram the Fuse.
4. Write Fuse extended byte using programming instruction 6c.
5. Poll for Fuse write complete using programming instruction 6d, or wait for t
WLRH
(refer to
Table 107 on page 244).
6. Load data low byte using programming instructions 6e. A bit value of 0 will program the
corresponding Fuse, a 1 will unprogram the Fuse.
7. Write Fuse High byte using programming instruction 6f.
8. Poll for Fuse write complete using programming instruction 6g, or wait for t
WLRH
(refer to
Table 107 on page 244).
9. Load data low byte using programming instructions 6h. A 0 will program the Fuse, a 1
will unprogram the Fuse.
10. Write Fuse Low byte using programming instruction 6i.
11. Poll for Fuse write complete using programming instruction 6j, or wait for t
WLRH
(refer to
Table 107 on page 244).
Programming the
Lock Bits
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Lock bit write using programming instruction 7a.
3. Load data using programming instructions 7b. A bit value of 0 will program the corre-
sponding Lock bit, a 1 will leave the Lock bit unchanged.
4. Write Lock bits using programming instruction 7c.
5. Poll for Lock bit write complete using programming instruction 7d, or wait for t
WLRH
(refer
to Table 107 on page 244).
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Reading the Fuses
and Lock Bits
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Fuse/Lock bit read using programming instruction 8a.
3. To read all Fuses and Lock bits, use programming instruction 8f.
To only read Fuse Extended byte, use programming instruction 8b.
To only read Fuse High byte, use programming instruction 8c.
To only read Fuse Low byte, use programming instruction 8d.
To only read Lock bits, use programming instruction 8e.
Reading the Signature
Bytes
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Signature byte read using programming instruction 9a.
3. Load address 0x00 using programming instruction 9b.
4. Read first signature byte using programming instruction 9c.
5. Repeat steps 3 and 4 with address 0x01 and address 0x02 to read the second and third
signature bytes, respectively.
Reading the
Calibration Byte
1. Enter J TAG instruction PROG_COMMANDS.
2. Enable Calibration byte read using programming instruction 10a.
3. Load address 0x00 using programming instruction 10b.
4. Read the calibration byte using programming instruction 10c.
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Electrical Characteristics
DC Characteristics
Absolute Maximum Ratings*
Operating Temperature.................................. -55C to +125C
*NOTICE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Storage Temperature..................................... -65C to +150C
Voltage on any Pin except RESET
with respect to Ground ................................-0.5V to V
CC
+0.5V
Voltage on RESET with respect to Ground......-0.5V to +13.0V
Maximum Operating Voltage............................................ 6.0V
DC Current per I/O Pin............................................... 40.0 mA
DC Current V
CC
and GND Pins...................... 200.0 mA PDIP,
400 mA TQFP/MLF
T
A
=-40C to 85C, V
CC
=1.8V to 5.5V (unless otherwise noted)
Symbol Parameter Condition Min. Typ. Max. Units
V
IL
Input Low Voltage, Except XTAL1
and RESETpin
V
CC
=1.8 - 2.4V
V
CC
=2.4 - 5.5V
-0.5
-0.5
0.2 V
CC
(1)
0.3 V
CC
(1)
V
V
IH
Input High Voltage, Except XTAL1
and RESET pin
V
CC
=1.8 - 2.4V
V
CC
=2.4 - 5.5V
0.7 V
CC
(2)
0.6 V
CC
(2)
V
CC
+0.5
V
CC
+0.5
V
V
IL1
Input Low Voltage, XTAL1 pin V
CC
=1.8 - 5.5V -0.5 0.1 V
CC
(1)
V
V
IH1
Input High Voltage, XTAL1 pin
V
CC
=1.8 - 2.4V
V
CC
=2.4 - 5.5V
0.8 V
CC
(2)
0.7 V
CC
(2)
V
CC
+0.5
V
CC
+0.5
V
V
IL2
Input Low Voltage, RESET pin V
CC
=1.8 - 5.5V -0.5 0.2 V
CC
V
V
IH2
Input High Voltage, RESET pin V
CC
=1.8 - 5.5V 0.9 V
CC
(2)
V
CC
+0.5 V
V
OL
Output Low Voltage
(3)
, Ports A, B, C,
D, and E
I
OL
=20 mA, V
CC
=5V
I
OL
=10 mA, V
CC
=3V
0.7
0.5
V
V
V
OH
Output High Voltage
(4)
, Ports A, B,
C, D, and E
I
OL
=-20 mA, V
CC
=5V
I
OL
=-10 mA, V
CC
=3V
4.2
2.3
V
V
I
IL
Input Leakage Current I/O Pin
Vcc =5.5V, pin low
(absolute value)
1 A
I
IH
Input Leakage Current I/O Pin
Vcc =5.5V, pin high
(absolute value)
1 A
R
RST
Reset Pull-up Resistor 30 60 kO
R
pu
I/O Pin Pull-up Resistor 20 50 kO
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Notes: 1. Max means the highest value where the pin is guaranteed to be read as low
2. Min means the lowest value where the pin is guaranteed to be read as high
3. Although each I/O port can sink more than the test conditions (20 mA at Vcc =5V, 10 mA at Vcc =3V) under steady state
conditions (non-transient), the following must be observed:
PDIP Package:
1] The sum of all IOL, for all ports, should not exceed 200 mA.
2] The sum of all IOL, for port B0 - B7, D0 - D7, and XTAL2, should not exceed 100 mA.
3] The sum of all IOL, for ports A0 - A7, E0 - E2, C0 - C7, should not exceed 100 mA.
TQFP and QFN/MLF Package:
1] The sum of all IOL, for all ports, should not exceed 400 mA.
2] The sum of all IOL, for ports B0 - B7, D0 - D7, and XTAL2, should not exceed 200 mA.
3] The sum of all IOL, for ports C0 - C7 and E1 - E2, should not exceed 200 mA.
4] The sum of all IOL, for ports A0 - A7 and E0, should not exceed 200 mA.
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test condition.
4. Although each I/O port can source more than the test conditions (20 mA at Vcc =5V, 10 mA at Vcc =3V) under steady state
conditions (non-transient), the following must be observed:
PDIP Package:
1] The sum of all IOH, for all ports, should not exceed 200 mA.
2] The sum of all IOH, for port B0 - B7, D0 - D7, and XTAL2, should not exceed 100 mA.
3] The sum of all IOH, for ports A0 - A7, E0 - E2, C0 - C7, should not exceed 100 mA.
TQFP and MLF Package:
1] The sum of all IOH, for all ports, should not exceed 400 mA.
2] The sum of all IOH, for ports B0 - B7, D0 - D7, and XTAL2, should not exceed 200 mA.
3] The sum of all IOH, for ports C0 - C7 and E1 - E2, should not exceed 200 mA.
4] The sum of all IOH, for ports A0 - A7 and E0, should not exceed 200 mA.
I
CC
Power Supply Current
Active 1 MHz, V
CC
=2V
(ATmega162V)
0.8 mA
Active 4 MHz, V
CC
=3V
(ATmega162/V)
5 mA
Active 8 MHz, V
CC
=5V
(ATmega162)
16 mA
Idle 1 MHz, V
CC
=2V
(ATmega162V)
0.3 mA
Idle 4 MHz, V
CC
=3V
(ATmega162/V)
2 mA
Idle 8 MHz, V
CC
=5V
(ATmega162)
8 mA
Power-down mode
WDT Enabled,
V
CC
=3.0V
<10 14 A
WDT Disabled,
V
CC
=3.0V
<1.5 2 A
V
ACIO
Analog Comparator Input Offset
Voltage
V
CC
=5V
V
in
=V
CC
/2
<10 40 mV
I
ACLK
Analog Comparator Input Leakage
Current
V
CC
=5V
V
in
=V
CC
/2
-50 50 nA
t
ACPD
Analog Comparator Propagation
Delay
V
CC
=2.7V
V
CC
=4.0V
750
500
ns
T
A
=-40C to 85C, V
CC
=1.8V to 5.5V (unless otherwise noted) (Continued)
Symbol Parameter Condition Min. Typ. Max. Units
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If IOH exceeds the test condition, VOH may exceed the related specification. Pins are not guaranteed to source current
greater than the listed test condition.
Figure 113. Absolute Maximum Frequency as a function of VCC, ATmega162V
Figure 114. Absolute Maximum Frequency as a function of VCC, ATmega162
Frequency
8 MHz
16 MHz
1 MHz
VCC
1.8V 2.4V 5.5V 2.7V 4.5V
Safe Operating
Area
Frequency
8 MHz
16 MHz
1 MHz
VCC
1.8V 2.4V 5.5V 2.7V 4.5V
Safe Operating
Area
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External Clock
Drive Waveforms
Figure 115. External Clock Drive Waveforms
External Clock
Drive
V
IL1
V
IH1
Table 112. External Clock Drive
Symbol Parameter
V
CC
= 1.8 - 5.5V V
CC
=2.7 - 5.5V V
CC
= 4.5 - 5.5V
Units Min. Max. Min. Max. Min. Max.
1/t
CLCL
Oscillator
Frequency
0 1 0 8 0 16 MHz
t
CLCL
Clock Period 1000 125 62.5 ns
t
CHCX
High Time 400 50 25 ns
t
CLCX
Low Time 400 50 25 ns
t
CLCH
Rise Time 2.0 1.6 0.5 s
t
CHCL
Fall Time 2.0 1.6 0.5 s
At
CLCL
Change in
period from one
clock cycle to
the next
2 2 2 %
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SPI Timing
Characteristics
See Figure 116 and Figure 117 for details.
Note: 1. In SPI Programming mode, the minimum SCK high/low period is:
2 t
CLCL
for f
CK
<12 MHz
3 t
CLCL
for f
CK
>12 MHz.
Figure 116. SPI Interface Timing Requirements (Master Mode)
Table 113. SPI Timing Parameters
Description Mode Min Typ Max
1 SCK period Master See Table 68
ns
2 SCK high/low Master 50% duty cycle
3 Rise/Fall time Master 3.6
4 Setup Master 10
5 Hold Master 10
6 Out to SCK Master 0.5 t
sck
7 SCK to out Master 10
8 SCK to out high Master 10
9 SS low to out Slave 15
10 SCK period Slave 4 t
ck
11 SCK high/low
(1)
Slave 2 t
ck
12 Rise/Fall time Slave 1.6 s
13 Setup Slave 10
ns
14 Hold Slave t
ck
15 SCK to out Slave 15
16 SCK to SS high Slave 20
17 SS high to tri-state Slave 10
18 SS low to SCK Slave 2 t
ck
MOSI
(Data Output)
SCK
(CPOL = 1)
MISO
(Data Input)
SCK
(CPOL = 0)
SS
MSB LSB
LSB MSB
...
...
6 1
2 2
3 4 5
8 7
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Figure 117. SPI Interface Timing Requirements (Slave Mode)
MISO
(Data Output)
SCK
(CPOL = 1)
MOSI
(Data Input)
SCK
(CPOL = 0)
SS
MSB LSB
LSB MSB
...
...
10
11 11
12 13 14
17 15
9
X
16
18
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External Data Memory Timing
Notes: 1. This assumes 50% clock duty cycle. The half period is actually the high time of the external clock, XTAL1.
2. This assumes 50% clock duty cycle. The half period is actually the low time of the external clock, XTAL1.
Table 114. External Data Memory Characteristics, 4.5 - 5.5 Volts, no Wait-state
Symbol Parameter
8 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 16 MHz
1 t
LHLL
ALE Pulse Width 115 1.0t
CLCL
-10 ns
2 t
AVLL
Address Valid A to ALE Low 57.5 0.5t
CLCL
-5
(1)
ns
3a t
LLAX_ST
Address Hold After ALE Low,
write access
5 5
ns
3b t
LLAX_LD
Address Hold after ALE Low,
read access
5 5
ns
4 t
AVLLC
Address Valid C to ALE Low 57.5 0.5t
CLCL
-5
(1)
ns
5 t
AVRL
Address Valid to RD Low 115 1.0t
CLCL
-10 ns
6 t
AVWL
Address Valid to WR Low 115 1.0t
CLCL
-10 ns
7 t
LLWL
ALE Low to WR Low 47.5 67.5 0.5t
CLCL
-15
(2)
0.5t
CLCL
+5
(2)
ns
8 t
LLRL
ALE Low to RD Low 47.5 67.5 0.5t
CLCL
-15
(2)
0.5t
CLCL
+5
(2)
ns
9 t
DVRH
Data Setup to RD High 40 40 ns
10 t
RLDV
Read Low to Data Valid 75 1.0t
CLCL
-50 ns
11 t
RHDX
Data Hold After RD High 0 0 ns
12 t
RLRH
RD Pulse Width 115 1.0t
CLCL
-10 ns
13 t
DVWL
Data Setup to WR Low 42.5 0.5t
CLCL
-20
(1)
ns
14 t
WHDX
Data Hold After WR High 115 1.0t
CLCL
-10 ns
15 t
DVWH
Data Valid to WR High 125 1.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 115 1.0t
CLCL
-10 ns
Table 115. External Data Memory Characteristics, 4.5 - 5.5 Volts, 1 Cycle Wait-state
Symbol Parameter
8 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 16 MHz
10 t
RLDV
Read Low to Data Valid 200 2.0t
CLCL
-50 ns
12 t
RLRH
RD Pulse Width 240 2.0t
CLCL
-10 ns
15 t
DVWH
Data Valid to WR High 240 2.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 240 2.0t
CLCL
-10 ns
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Table 116. External Data Memory Characteristics, 4.5 - 5.5 Volts, SRWn1 =1, SRWn0 =0
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 16 MHz
10 t
RLDV
Read Low to Data Valid 325 3.0t
CLCL
-50 ns
12 t
RLRH
RD Pulse Width 365 3.0t
CLCL
-10 ns
15 t
DVWH
Data Valid to WR High 375 3.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 365 3.0t
CLCL
-10 ns
Table 117. External Data Memory Characteristics, 4.5 - 5.5 Volts, SRWn1 =1, SRWn0 =1
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 16 MHz
10 t
RLDV
Read Low to Data Valid 325 3.0t
CLCL
-50 ns
12 t
RLRH
RD Pulse Width 365 3.0t
CLCL
-10 ns
14 t
WHDX
Data Hold After WR High 240 2.0t
CLCL
-10 ns
15 t
DVWH
Data Valid to WR High 375 3.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 365 3.0t
CLCL
-10 ns
Table 118. External Data Memory Characteristics, 2.7 - 5.5 Volts, no Wait-state
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 8 MHz
1 t
LHLL
ALE Pulse Width 235 t
CLCL
-15 ns
2 t
AVLL
Address Valid A to ALE Low 115 0.5t
CLCL
-10
(1)
ns
3a t
LLAX_ST
Address Hold After ALE Low,
write access
5 5
ns
3b t
LLAX_LD
Address Hold after ALE Low,
read access
5 5
ns
4 t
AVLLC
Address Valid C to ALE Low 115 0.5t
CLCL
-10
(1)
ns
5 t
AVRL
Address Valid to RD Low 235 1.0t
CLCL
-15 ns
6 t
AVWL
Address Valid to WR Low 235 1.0t
CLCL
-15 ns
7 t
LLWL
ALE Low to WR Low 115 130 0.5t
CLCL
-10
(2)
0.5t
CLCL
+5
(2)
ns
8 t
LLRL
ALE Low to RD Low 115 130 0.5t
CLCL
-10
(2)
0.5t
CLCL
+5
(2)
ns
9 t
DVRH
Data Setup to RD High 45 45 ns
10 t
RLDV
Read Low to Data Valid 190 1.0t
CLCL
-60 ns
11 t
RHDX
Data Hold After RD High 0 0 ns
272
2513LAVR03/2013
ATmega162/V
Notes: 1. This assumes 50% clock duty cycle. The half period is actually the high time of the external clock, XTAL1.
2. This assumes 50% clock duty cycle. The half period is actually the low time of the external clock, XTAL1.
12 t
RLRH
RD Pulse Width 235 1.0t
CLCL
-15 ns
13 t
DVWL
Data Setup to WR Low 105 0.5t
CLCL
-20
(1)
ns
14 t
WHDX
Data Hold After WR High 235 1.0t
CLCL
-15 ns
15 t
DVWH
Data Valid to WR High 250 1.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 235 1.0t
CLCL
-15 ns
Table 118. External Data Memory Characteristics, 2.7 - 5.5 Volts, no Wait-state (Continued)
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
Table 119. External Data Memory Characteristics, 2.7 - 5.5 Volts, SRWn1 =0, SRWn0 =1
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 8 MHz
10 t
RLDV
Read Low to Data Valid 440 2.0t
CLCL
-60 ns
12 t
RLRH
RD Pulse Width 485 2.0t
CLCL
-15 ns
15 t
DVWH
Data Valid to WR High 500 2.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 485 2.0t
CLCL
-15 ns
Table 120. External Data Memory Characteristics, 2.7 - 5.5 Volts, SRWn1 =1, SRWn0 =0
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 8 MHz
10 t
RLDV
Read Low to Data Valid 690 3.0t
CLCL
-60 ns
12 t
RLRH
RD Pulse Width 735 3.0t
CLCL
-15 ns
15 t
DVWH
Data Valid to WR High 750 3.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 735 3.0t
CLCL
-15 ns
Table 121. External Data Memory Characteristics, 2.7 - 5.5 Volts, SRWn1 =1, SRWn0 =1
Symbol Parameter
4 MHz Oscillator Variable Oscillator
Unit Min Max Min Max
0 1/t
CLCL
Oscillator Frequency 0.0 8 MHz
10 t
RLDV
Read Low to Data Valid 690 3.0t
CLCL
-60 ns
12 t
RLRH
RD Pulse Width 735 3.0t
CLCL
-15 ns
14 t
WHDX
Data Hold After WR High 485 2.0t
CLCL
-15 ns
15 t
DVWH
Data Valid to WR High 750 3.0t
CLCL
ns
16 t
WLWH
WR Pulse Width 735 3.0t
CLCL
-15 ns
273
2513LAVR03/2013
ATmega162/V
Figure 118. External Memory Timing (SRWn1 =0, SRWn0 =0
Figure 119. External Memory Timing (SRWn1 =0, SRWn0 =1)
ALE
T1 T2 T3
W
r
i
t
e
R
e
a
d
WR
T4
A15:8 Address Prev. addr.
DA7:0 Address Data Prev. data XX
RD
DA7:0 (XMBK = 0) Data Address
System Clock (CLK
CPU
)
1
4
2
7
6
3a
3b
5
8 12
16
13
10
11
14
15
9
ALE
T1 T2 T3
W
r
i
t
e
R
e
a
d
WR
T5
A15:8 Address Prev. addr.
DA7:0 Address Data Prev. data XX
RD
DA7:0 (XMBK = 0) Data Address
System Clock (CLK
CPU
)
1
4
2
7
6
3a
3b
5
8 12
16
13
10
11
14
15
9
T4
274
2513LAVR03/2013
ATmega162/V
Figure 120. External Memory Timing (SRWn1 =1, SRWn0 =0)
Figure 121. External Memory Timing (SRWn1 =1, SRWn0 =1)
(1)
Note: 1. The ALE pulse in the last period (T4 - T7) is only present if the next instruction accesses the
RAM (internal or external).
ALE
T1 T2 T3
W
r
i
t
e
R
e
a
d
WR
T6
A15:8 Address Prev. addr.
DA7:0 Address Data Prev. data XX
RD
DA7:0 (XMBK = 0) Data Address
System Clock (CLK
CPU
)
1
4
2
7
6
3a
3b
5
8 12
16
13
10
11
14
15
9
T4 T5
ALE
T1 T2 T3
W
r
it
e
R
e
a
d
WR
T7
A15:8 Address Prev. addr.
DA7:0 Address Data Prev. data XX
RD
DA7:0 (XMBK = 0) Data Address
System Clock (CLK
CPU
)
1
4
2
7
6
3a
3b
5
8 12
16
13
10
11
14
15
9
T4 T5 T6
275
2513LAVR03/2013
ATmega162/V
ATmega162
Typical
Characteristics
The following charts show typical behavior. These figures are not tested during manufacturing.
All current consumption measurements are performed with all I/O pins configured as inputs and
with internal pull-ups enabled. A sine wave generator with rail-to-rail output is used as clock
source. The CKSEL Fuses are programmed to select external clock.
The power consumption in Power-down mode is independent of clock selection.
The current consumption is a function of several factors such as: Operating voltage, operating
frequency, loading of I/O pins, switching rate of I/O pins, code executed and ambient tempera-
ture. The dominating factors are operating voltage and frequency.
The current drawn from capacitive loaded pins may be estimated (for one pin) as C
L
*V
CC
*f where
C
L
=load capacitance, V
CC
=operating voltage and f =average switching frequency of I/O pin.
The parts are characterized at frequencies higher than test limits. Parts are not guaranteed to
function properly at frequencies higher than the ordering code indicates.
The difference between current consumption in Power-down mode with Watchdog Timer
enabled and Power-down mode with Watchdog Timer disabled represents the differential cur-
rent drawn by the Watchdog Timer.
Active Supply Current Figure 122. Active Supply Current vs. Frequency (0.1 - 1.0 MHz)
ACTIVE SUPPLY CURRENT vs. FREQUENCY
0.1 - 1.0 MHz
0
0.5
1
1.5
2
2.5
3
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency (MHz)
I
C
C
(
m
A
)
5.5V
4.5V
4.0V
3.3V
2.7V
1.8V
5.0V
276
2513LAVR03/2013
ATmega162/V
Figure 123. Active Supply Current vs. Frequency (1 - 20 MHz)
Figure 124. Active Supply Current vs. V
CC
(Internal RC Oscillator, 8 MHz)
ACTIVE SUPPLY CURRENT vs. FREQUENCY
1- 20 MHz
0
5
10
15
20
25
30
35
40
45
0 2 4 6 8 10 12 14 16 18 20
Frequency (MHz)
I
C
C
(
m
A
)
5.5V
4.5V
4.0V
3.3V
2.7V
1.8V
5.0V
ACTIVE SUPPLY CURRENT vs. V
CC
INTERNAL RC OSCILLATOR, 8 MHz
0
2
4
6
8
10
12
14
16
18
20
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
m
A
)
85C
25C
-40C
277
2513LAVR03/2013
ATmega162/V
Figure 125. Active Supply Current vs. V
CC
(32 kHz External Oscillator)
Idle Supply Current Figure 126. Idle Supply Current vs. Frequency (0.1 - 1.0 MHz)
ACTIVE SUPPLY CURRENT vs. V
CC
32kHz EXTERNAL OSCILLATOR
0
50
100
150
200
250
300
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
25C
85C
IDLE SUPPLY CURRENT vs. FREQUENCY
0.1 - 1.0 MHz
0
0.2
0.4
0.6
0.8
1
1.2
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency (MHz)
I
C
C
(
m
A
)
5.5V
4.5V
4.0V
3.3V
2.7V
1.8V
5.0V
278
2513LAVR03/2013
ATmega162/V
Figure 127. Idle Supply Current vs. Frequency (1 - 20 MHz)
Figure 128. Idle Supply Current vs. V
CC
(Internal RC Oscillator, 8 MHz)
IDLE SUPPLY CURRENT vs. FREQUENCY
1 - 20 MHz
0
5
10
15
20
25
0 2 4 6 8 10 12 14 16 18 20
Frequency (MHz)
I
C
C
(
m
A
)
5.5V
4.5V
4.0V
3.3V
2.7V
1.8V
5.0V
IDLE SUPPLY CURRENT vs. V
CC
INTERNAL RC OSCILLATOR, 8 MHz
0
1
2
3
4
5
6
7
8
9
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
m
A
)
85C
25C
-40C
279
2513LAVR03/2013
ATmega162/V
Figure 129. Idle Supply Current vs. V
CC
(32 kHz External Oscillator)
Power-down Supply
Current
Figure 130. Power-down Supply Current vs. V
CC
(Watchdog Timer Disabled)
IDLE SUPPLY CURRENT vs. V
CC
32kHz EXTERNAL OSCILLATOR
0
10
20
30
40
50
60
70
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
POWER-DOWN SUPPLY CURRENT vs. V
CC
WATCHDOG TIMER DISABLED
0
0.5
1
1.5
2
2.5
3
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
-40C
280
2513LAVR03/2013
ATmega162/V
Figure 131. Power-down Supply Current vs. V
CC
(Watchdog Timer Enabled)
Power-save Supply
Current
Figure 132. Power-save Supply Current vs. V
CC
(Watchdog Timer Disabled)
POWER-DOWN SUPPLY CURRENT vs. V
CC
WATCHDOG TIMER ENABLED
0
5
10
15
20
25
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
-40C
POWER-SAVE SUPPLY CURRENT vs. V
CC
WATCHDOG TIMER DISABLED
0
5
10
15
20
25
30
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
281
2513LAVR03/2013
ATmega162/V
Standby Supply
Current
Figure 133. Standby Supply Current vs. V
CC
(455 kHz Resonator, Watchdog Timer Disabled)
Figure 134. Standby Supply Current vs. V
CC
(1 MHz Resonator, Watchdog Timer Disabled)
STANDBY SUPPLY CURRENT vs. V
CC
455 kHz RESONATOR, WATCHDOG TIMER DISABLED
0
10
20
30
40
50
60
70
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
STANDBY SUPPLY CURRENT vs. V
CC
1 MHz RESONATOR, WATCHDOG TIMER DISABLED
0
10
20
30
40
50
60
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
282
2513LAVR03/2013
ATmega162/V
Figure 135. Standby Supply Current vs. V
CC
(2 MHz Resonator, Watchdog Timer Disabled)
Figure 136. Standby Supply Current vs. V
CC
(2 MHz Xtal, Watchdog Timer Disabled)
STANDBY SUPPLY CURRENT vs. V
CC
2 MHz XTAL, WATCHDOG TIMER DISABLED
0
10
20
30
40
50
60
70
80
90
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
STANDBY SUPPLY CURRENT vs. V
CC
2 MHz XTAL, WATCHDOG TIMER DISABLED
0
10
20
30
40
50
60
70
80
90
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
283
2513LAVR03/2013
ATmega162/V
Figure 137. Standby Supply Current vs. V
CC
(4 MHz Resonator, Watchdog Timer Disabled)
Figure 138. Standby Supply Current vs. V
CC
(4 MHz Xtal, Watchdog Timer Disabled)
STANDBY SUPPLY CURRENT vs. V
CC
4 MHz RESONATOR, WATCHDOG TIMER DISABLED
0
20
40
60
80
100
120
140
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
STANDBY SUPPLY CURRENT vs. V
CC
4 MHz XTAL, WATCHDOG TIMER DISABLED
0
20
40
60
80
100
120
140
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
284
2513LAVR03/2013
ATmega162/V
Figure 139. Standby Supply Current vs. V
CC
(6 MHz Resonator, Watchdog Timer Disabled)
Figure 140. Standby Supply Current vs. V
CC
(6 MHz Xtal, Watchdog Timer Disabled)
STANDBY SUPPLY CURRENT vs. V
CC
6 MHz RESONATOR, WATCHDOG TIMER DISABLED
0
20
40
60
80
100
120
140
160
180
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
STANDBY SUPPLY CURRENT vs. V
CC
6 MHz XTAL, WATCHDOG TIMER DISABLED
0
20
40
60
80
100
120
140
160
180
200
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
285
2513LAVR03/2013
ATmega162/V
Pin Pull-up Figure 141. I/O Pin Pull-up Resistor Current vs. Input Voltage (V
CC
=5V)
Figure 142. I/O Pin Pull-up Resistor Current vs. Input Voltage (V
CC
=2.7V)
I/O PIN PULL-UP RESISTOR CURRENT vs. INPUT VOLTAGE
Vcc = 5V
0
20
40
60
80
100
120
140
160
0 1 2 3 4 5
V
IO
(V)
I
I
O
(
u
A
)
85C
25C
-40C
6
I/O PIN PULL-UP RESISTOR CURRENT vs. INPUT VOLTAGE
Vcc = 2.7V
0
10
20
30
40
50
60
70
80
0 0.5 1 1.5 2 2.5 3
V
IO
(V)
I
I
O
(
u
A
)
85C 25C
-40C
286
2513LAVR03/2013
ATmega162/V
Figure 143. I/O Pin Pull-up Resistor Current vs. Input Voltage (V
CC
=1.8V)
Figure 144. Reset Pull-up Resistor Current vs. Reset Pin Voltage (V
CC
=5V)
I/O PIN PULL-UP RESISTOR CURRENT vs. INPUT VOLTAGE
Vcc = 1.8V
0
10
20
30
40
50
60
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
V
OP
(V)
I
O
P
(
u
A
)
85C
25C
-40C
RESET PULL-UP RESISTOR CURRENT vs. RESET PIN VOLTAGE
Vcc = 5V
0
20
40
60
80
100
120
0 1 2 3 4 5
V
RESET
(V)
I
R
E
S
E
T
(
u
A
)
-40C
25C
85C
6
287
2513LAVR03/2013
ATmega162/V
Figure 145. Reset Pull-up Resistor Current vs. Reset Pin Voltage (V
CC
=2.7V)
Figure 146. Reset Pull-up Resistor Current vs. Reset Pin Voltage (V
CC
=1.8V)
RESET PULL-UP RESISTOR CURRENT vs. RESET PIN VOLTAGE
Vcc = 2.7V
0
10
20
30
40
50
60
0 0.5 1 1.5 2 2.5 3
V
RESET
(V)
I
R
E
S
E
T
(
u
A
)
-40C
25C
85C
RESET PULL-UP RESISTOR CURRENT vs. RESET PIN VOLTAGE
Vcc = 1.8V
0
5
10
15
20
25
30
35
40
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
V
RESET
(V)
I
R
E
S
E
T
(
u
A
)
-40C
25C
85C
288
2513LAVR03/2013
ATmega162/V
Pin Driver Strength Figure 147. I/O Pin Source Current vs. Output Voltage (V
CC
=5V)
Figure 148. I/O Pin Source Current vs. Output Voltage (V
CC
=2.7V)
I/O PIN SOURCE CURRENT vs. OUTPUT VOLTAGE
Vcc = 5V
0
10
20
30
40
50
60
70
80
90
0 1 2 3 4 5
V
OH
(V)
I
O
H
(
m
A
)
85C
25C
-40C
6
I/O PIN SOURCE CURRENT vs. OUTPUT VOLTAGE
Vcc = 2.7V
0
5
10
15
20
25
30
0 0.5 1 1.5 2 2.5 3
V
OH
(V)
I
O
H
(
m
A
)
85C
25C
-40C
289
2513LAVR03/2013
ATmega162/V
Figure 149. I/O Pin Source Current vs. Output Voltage (V
CC
=1.8V)
Figure 150. I/O Pin Sink Current vs. Output Voltage (V
CC
=5V)
I/O PIN SOURCE CURRENT vs. OUTPUT VOLTAGE
Vcc = 1.8V
0
1
2
3
4
5
6
7
8
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
V
OH
(V)
I
O
H
(
m
A
)
85C
25C
-40C
I/O PIN SINK CURRENT vs. OUTPUT VOLTAGE
Vcc = 5V
0
10
20
30
40
50
60
70
80
90
0 0.5 1 1.5 2 2.5
V
OL
(V)
I
O
L
(
m
A
)
85C
25C
-40C
290
2513LAVR03/2013
ATmega162/V
Figure 151. I/O Pin Sink Current vs. Output Voltage (V
CC
=2.7V)
Figure 152. I/O Pin Sink Current vs. Output Voltage (V
CC
=1.8V)
I/O PIN SINK CURRENT vs. OUTPUT VOLTAGE
Vcc = 2.7V
0
5
10
15
20
25
30
35
0 0.5 1 1.5 2 2.5
V
OL
(V)
I
O
L
(
m
A
)
85C
25C
-40C
I/O PIN SINK CURRENT vs. OUTPUT VOLTAGE
Vcc = 1.8V
0
2
4
6
8
10
12
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
V
OL
(V)
I
O
L
(
m
A
)
85C
25C
-40C
291
2513LAVR03/2013
ATmega162/V
Pin Thresholds and
Hysteresis
Figure 153. I/O Pin Input Threshold Voltage vs. V
CC
(V
IH
, I/O Pin Read as 1)
Figure 154. I/O Pin Input Threshold Voltage vs. V
CC
(V
IL
, I/O Pin Read as 0)
I/O PIN INPUT THRESHOLD VOLTAGE vs. V
CC
VIH, I/O PIN READ AS '1'
0
0.5
1
1.5
2
2.5
3
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
T
h
r
e
s
h
o
l
d
(
V
)
85C
25C
-40C
I/O PIN INPUT THRESHOLD VOLTAGE vs. V
CC
VIL, I/O PIN READ AS '0'
0
0.5
1
1.5
2
2.5
3
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
T
h
r
e
s
h
o
l
d
(
V
)
85C
25C
-40C
292
2513LAVR03/2013
ATmega162/V
Figure 155. I/O Pin Input Hysteresis vs. V
CC
Figure 156. Reset Input Threshold Voltage vs. V
CC
(V
IH
, Reset Pin Read as 1)
I/O PIN INPUT HYSTERESIS vs. V
CC
0
0.1
0.2
0.3
0.4
0.5
0.6
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
T
h
r
e
s
h
o
l
d
(
V
)
85C
25C
-40C
RESET INPUT THRESHOLD VOLTAGE vs. V
CC
VIH, RESET PIN READ AS '1'
0
0.5
1
1.5
2
2.5
3
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
T
h
r
e
s
h
o
l
d
(
V
)
85C
25C
-40C
293
2513LAVR03/2013
ATmega162/V
Figure 157. Reset Input Threshold Voltage vs. V
CC
(V
IL
, Reset Pin Read as 0)
Figure 158. Reset Input Pin Hysteresis vs. V
CC
RESET INPUT THRESHOLD VOLTAGE vs. V
CC
VIL, RESET PIN READ AS '0'
0
0.5
1
1.5
2
2.5
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
T
h
r
e
s
h
o
l
d
(
V
)
85C
25C
-40C
RESET INPUT PIN HYSTERESIS vs. VCC
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
T
h
r
e
s
h
o
l
d
(
V
)
85C
25C
-40C
294
2513LAVR03/2013
ATmega162/V
BOD Thresholds and
Analog Comparator
Offset
Figure 159. BOD Thresholds vs. Temperature (BOD Level is 4.3V)
Figure 160. BOD Thresholds vs. Temperature (BOD Level is 2.7V)
BOD THRESHOLDS vs. TEMPERATURE
BODLEVEL IS 4.3V
4
4.1
4.2
4.3
4.4
4.5
4.6
-50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature (C)
T
h
r
e
s
h
o
l
d
(
V
)
Rising V
CC
Falling V
CC
BOD THRESHOLDS vs. TEMPERATURE
BODLEVEL IS 2.7V
2.4
2.5
2.6
2.7
2.8
2.9
3
-50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature (C)
T
h
r
e
s
h
o
l
d
(
V
)
Rising V
CC
Falling V
CC
295
2513LAVR03/2013
ATmega162/V
Figure 161. BOD Thresholds vs. Temperature (BOD Level is 2.3V)
Figure 162. BOD Thresholds vs. Temperature (BOD Level is 1.8V)
BOD THRESHOLDS vs. TEMPERATURE
BODLEVEL IS 2.3V
2
2.1
2.2
2.3
2.4
2.5
2.6
-50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature (C)
T
h
r
e
s
h
o
l
d
(
V
)
Rising V
CC
Falling V
CC
BOD THRESHOLDS vs. TEMPERATURE
BODLEVEL IS 1.8V
1.5
1.6
1.7
1.8
1.9
2
2.1
-50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100
Temperature (C)
T
h
r
e
s
h
o
l
d
(
V
)
Rising V
CC
Falling V
CC
296
2513LAVR03/2013
ATmega162/V
Figure 163. Bandgap Voltage vs. V
CC
Figure 164. Analog Comparator Offset Voltage vs. Common Mode Voltage (V
CC
=5V)
BANDGAP VOLTAGE vs. V
CC
1.08
1.09
1.1
1.11
1.12
1.13
1.14
1.5 2 2.5 3 3.5 4 4.5 5 5.5
Vcc (V)
B
a
n
d
g
a
p
V
o
l
t
a
g
e
(
V
)
85C
25C
-40C
ANALOG COMPARATOR OFFSET VOLTAGE vs. COMMON MODE VOLTAGE
V
CC
= 5V
0
0.001
0.002
0.003
0.004
0.005
0.006
0.007
0.008
0.009
0.01
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
Common Mode Voltage (V)
C
o
m
p
a
r
a
t
o
r
O
f
f
s
e
t
V
o
l
t
a
g
e
(
V
)
85C
25C
-40C
297
2513LAVR03/2013
ATmega162/V
Figure 165. Analog Comparator Offset Voltage vs. Common Mode Voltage (V
CC
=2.7V)
Internal Oscillator
Speed
Figure 166. Watchdog Oscillator Frequency vs. V
CC
ANALOG COMPARATOR OFFSET VOLTAGE vs. COMMON MODE VOLTAGE
V
CC
= 2.7V
-0.001
0
0.001
0.002
0.003
0.004
0.005
0.006
0 0.5 1 1.5 2 2.5 3
Common Mode Voltage (V)
C
o
m
p
a
r
a
t
o
r
O
f
f
s
e
t
V
o
l
t
a
g
e
(
V
)
85C
25C
-40C
WATCHDOG OSCILLATOR FREQUENCY vs. V
CC
1000
1050
1100
1150
1200
1250
1300
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
F
R
C
(
k
H
z
)
85C
25C
-40C
298
2513LAVR03/2013
ATmega162/V
Figure 167. Calibrated 8 MHz RC Oscillator Frequency vs. Temperature
Figure 168. Calibrated 8 MHz RC Oscillator Frequency vs.V
CC
CALIBRATED 8MHz RC OSCILLATOR FREQUENCY vs. TEMPERATURE
7.5
7.6
7.7
7.8
7.9
8
8.1
8.2
8.3
8.4
-60 -40 -20 0 20 40 60 80 100
T
a
(C)
F
R
C
(
M
H
z
)
4.0V
1.8V
5.5V
2.7V
CALIBRATED 8MHz RC OSCILLATOR FREQUENCY vs. V
CC
6
6.5
7
7.5
8
8.5
9
9.5
10
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
F
R
C
(
M
H
z
)
85C
25C
-40C
299
2513LAVR03/2013
ATmega162/V
Figure 169. Calibrated 8 MHz RC Oscillator Frequency vs. Osccal Value
Current Consumption
of Peripheral Units
Figure 170. Brownout Detector Current vs. V
CC
CALIBRATED 8MHz RC OSCILLATOR FREQUENCY vs. OSCCAL VALUE
4
6
8
10
12
14
16
0 16 32 48 64 80 96 112
OSCCAL VALUE
F
R
C
(
M
H
z
)
BROWNOUT DETECTOR CURRENT vs. V
CC
-5
0
5
10
15
20
25
30
35
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
25C
-40C
85C
300
2513LAVR03/2013
ATmega162/V
Figure 171. 32 kHz TOSC Current vs. V
CC
(Watchdog Timer Disabled)
Figure 172. Watchdog TImer Current vs. V
CC
32kHz TOSC CURRENT vs. V
CC
WATCHDOG TIMER DISABLED
0
5
10
15
20
25
30
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
WATCHDOG TIMER CURRENT vs. V
CC
0
2
4
6
8
10
12
14
16
18
20
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
-40C
301
2513LAVR03/2013
ATmega162/V
Figure 173. Analog Comparator Current vs. V
CC
Figure 174. Programming Current vs. V
CC
ANALOG COMPARATOR CURRENT vs. V
CC
0
10
20
30
40
50
60
70
80
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
u
A
)
85C
25C
-40C
PROGRAMMING CURRENT vs. Vcc
0
5
10
15
20
25
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
I
C
C
(
m
A
)
85C
25C
-40C
302
2513LAVR03/2013
ATmega162/V
Current Consumption
in Reset and Reset
Pulsewidth
Fi gure 175. Reset Supply Current vs. Frequency (0.1 - 1.0 MHz, Excluding Current Through
The Reset Pull-up)
Figure 176. Reset Supply Current vs. Frequency (1 - 20 MHz, Excluding Current Through The
Reset Pull-up)
RESET SUPPLY CURRENT vs. FREQUENCY
0.1 - 1.0 MHz, EXCLUDING CURRENT THROUGH THE RESET PULLUP
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Frequency (MHz)
I
C
C
(
m
A
)
5.5V
4.5V
4.0V
3.3V
2.7V
1.8V
5.0V
RESET SUPPLY CURRENT vs. FREQUENCY
1 - 20 MHz, EXCLUDING CURRENT THROUGH THE RESET PULLUP
0
5
10
15
20
25
30
35
0 2 4 6 8 10 12 14 16 18 20
Frequency (MHz)
I
C
C
(
m
A
)
5.5V
4.5V
4.0V
3.3V
2.7V
1.8V
5.0V
303
2513LAVR03/2013
ATmega162/V
Figure 177. Reset Pulse Width vs. V
CC
RESET PULSE WIDTH vs. V
CC
0
500
1000
1500
2000
2500
1.5 2 2.5 3 3.5 4 4.5 5 5.5
V
CC
(V)
P
u
l
s
e
w
i
d
t
h
(
n
s
)
85C
25C
-40C
304
2513LAVR03/2013
ATmega162/V
Register Summary
Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
(0xFF) Reserved
.. Reserved
(0x9E) Reserved
(0x9D) Reserved
(0x9C) Reserved
(0x9B) Reserved
(0x9A) Reserved
(0x99) Reserved
(0x98) Reserved
(0x97) Reserved
(0x96) Reserved
(0x95) Reserved
(0x94) Reserved
(0x93) Reserved
(0x92) Reserved
(0x91) Reserved
(0x90) Reserved
(0x8F) Reserved
(0x8E) Reserved
(0x8D) Reserved
(0x8C) Reserved
(0x8B) TCCR3A COM3A1 COM3A0 COM3B1 COM3B0 FOC3A FOC3B WGM31 WGM30 131
(0x8A) TCCR3B ICNC3 ICES3 WGM33 WGM32 CS32 CS31 CS30 128
(0x89) TCNT3H Timer/Counter3 Counter Register High Byte 133
(0x88) TCNT3L Timer/Counter3 Counter Register Low Byte 133
(0x87) OCR3AH Timer/Counter3 Output Compare Register A High Byte 133
(0x86) OCR3AL Timer/Counter3 Output Compare Register A Low Byte 133
(0x85) OCR3BH Timer/Counter3 Output Compare Register B High Byte 133
(0x84) OCR3BL Timer/Counter3 Output Compare Register B Low Byte 133
(0x83) Reserved
(0x82) Reserved
(0x81) ICR3H Timer/Counter3 Input Capture Register High Byte 134
(0x80) ICR3L Timer/Counter3 Input Capture Register Low Byte 134
(0x7F) Reserved
(0x7E) Reserved
(0x7D) ETIMSK TICIE3 OCIE3A OCIE3B TOIE3 135
(0x7C) ETIFR ICF3 OCF3A OCF3B TOV3 135
(0x7B) Reserved
(0x7A) Reserved
(0x79) Reserved
(0x78) Reserved
(0x77) Reserved
(0x76) Reserved
(0x75) Reserved
(0x74) Reserved
(0x73) Reserved
(0x72) Reserved
(0x71) Reserved
(0x70) Reserved
(0x6F) Reserved
(0x6E) Reserved
(0x6D) Reserved
(0x6C) PCMSK1 PCINT15 PCINT14 PCINT13 PCINT12 PCINT11 PCINT10 PCINT9 PCINT8 88
(0x6B) PCMSK0 PCINT7 PCINT6 PCINT5 PCINT4 PCINT3 PCINT2 PCINT1 PCINT0 88
(0x6A) Reserved
(0x69) Reserved
(0x68) Reserved
(0x67) Reserved
(0x66) Reserved
(0x65) Reserved
(0x64) Reserved
(0x63) Reserved
(0x62) Reserved
(0x61) CLKPR CLKPCE CLKPS3 CLKPS2 CLKPS1 CLKPS0 41
305
2513LAVR03/2013
ATmega162/V
(0x60) Reserved
0x3F (0x5F) SREG I T H S V N Z C 10
0x3E (0x5E) SPH SP15 SP14 SP13 SP12 SP11 SP10 SP9 SP8 13
0x3D (0x5D) SPL SP7 SP6 SP5 SP4 SP3 SP2 SP1 SP0 13
0x3C
(2)
(0x5C)
(2)
UBRR1H URSEL1 UBRR1[11:8] 190
UCSR1C URSEL1 UMSEL1 UPM11 UPM10 USBS1 UCSZ11 UCSZ10 UCPOL1 189
0x3B (0x5B) GICR INT1 INT0 INT2 PCIE1 PCIE0 IVSEL IVCE 61, 86
0x3A (0x5A) GIFR INTF1 INTF0 INTF2 PCIF1 PCIF0 87
0x39 (0x59) TIMSK TOIE1 OCIE1A OCIE1B OCIE2 TICIE1 TOIE2 TOIE0 OCIE0 102, 134, 154
0x38 (0x58) TIFR TOV1 OCF1A OCF1B OCF2 ICF1 TOV2 TOV0 OCF0 103, 135, 155
0x37 (0x57) SPMCR SPMIE RWWSB RWWSRE BLBSET PGWRT PGERS SPMEN 221
0x36 (0x56) EMCUCR SM0 SRL2 SRL1 SRL0 SRW01 SRW00 SRW11 ISC2 30,44,85
0x35 (0x55) MCUCR SRE SRW10 SE SM1 ISC11 ISC10 ISC01 ISC00 30,43,84
0x34 (0x54) MCUCSR J TD SM2 J TRF WDRF BORF EXTRF PORF 43,51,207
0x33 (0x53) TCCR0 FOC0 WGM00 COM01 COM00 WGM01 CS02 CS01 CS00 100
0x32 (0x52) TCNT0 Timer/Counter0 (8 Bits) 102
0x31 (0x51) OCR0 Timer/Counter0 Output Compare Register 102
0x30 (0x50) SFIOR TSM XMBK XMM2 XMM1 XMM0 PUD PSR2 PSR310 32,70,105,156
0x2F (0x4F) TCCR1A COM1A1 COM1A0 COM1B1 COM1B0 FOC1A FOC1B WGM11 WGM10 128
0x2E (0x4E) TCCR1B ICNC1 ICES1 WGM13 WGM12 CS12 CS11 CS10 131
0x2D (0x4D) TCNT1H Timer/Counter1 Counter Register High Byte 133
0x2C (0x4C) TCNT1L Timer/Counter1 Counter Register Low Byte 133
0x2B (0x4B) OCR1AH Timer/Counter1 Output Compare Register A High Byte 133
0x2A (0x4A) OCR1AL Timer/Counter1 Output Compare Register A Low Byte 133
0x29 (0x49) OCR1BH Timer/Counter1 Output Compare Register B High Byte 133
0x28 (0x48) OCR1BL Timer/Counter1 Output Compare Register B Low Byte 133
0x27 (0x47) TCCR2 FOC2 WGM20 COM21 COM20 WGM21 CS22 CS21 CS20 149
0x26 (0x46) ASSR AS2 TCN2UB OCR2UB TCR2UB 152
0x25 (0x45) ICR1H Timer/Counter1 Input Capture Register High Byte 134
0x24 (0x44) ICR1L Timer/Counter1 Input Capture Register Low Byte 134
0x23 (0x43) TCNT2 Timer/Counter2 (8 Bits) 151
0x22 (0x42) OCR2 Timer/Counter2 Output Compare Register 151
0x21 (0x41) WDTCR WDCE WDE WDP2 WDP1 WDP0 53
0x20
(2)
(0x40)
(2)
UBRR0H URSEL0 UBRR0[11:8] 190
UCSR0C URSEL0 UMSEL0 UPM01 UPM00 USBS0 UCSZ01 UCSZ00 UCPOL0 189
0x1F (0x3F) EEARH EEAR8 20
0x1E (0x3E) EEARL EEPROM Address Register Low Byte 20
0x1D (0x3D) EEDR EEPROM Data Register 21
0x1C (0x3C) EECR EERIE EEMWE EEWE EERE 21
0x1B (0x3B) PORTA PORTA7 PORTA6 PORTA5 PORTA4 PORTA3 PORTA2 PORTA1 PORTA0 82
0x1A (0x3A) DDRA DDA7 DDA6 DDA5 DDA4 DDA3 DDA2 DDA1 DDA0 82
0x19 (0x39) PINA PINA7 PINA6 PINA5 PINA4 PINA3 PINA2 PINA1 PINA0 82
0x18 (0x38) PORTB PORTB7 PORTB6 PORTB5 PORTB4 PORTB3 PORTB2 PORTB1 PORTB0 82
0x17 (0x37) DDRB DDB7 DDB6 DDB5 DDB4 DDB3 DDB2 DDB1 DDB0 82
0x16 (0x36) PINB PINB7 PINB6 PINB5 PINB4 PINB3 PINB2 PINB1 PINB0 82
0x15 (0x35) PORTC PORTC7 PORTC6 PORTC5 PORTC4 PORTC3 PORTC2 PORTC1 PORTC0 82
0x14 (0x34) DDRC DDC7 DDC6 DDC5 DDC4 DDC3 DDC2 DDC1 DDC0 82
0x13 (0x33) PINC PINC7 PINC6 PINC5 PINC4 PINC3 PINC2 PINC1 PINC0 83
0x12 (0x32) PORTD PORTD7 PORTD6 PORTD5 PORTD4 PORTD3 PORTD2 PORTD1 PORTD0 83
0x11 (0x31) DDRD DDD7 DDD6 DDD5 DDD4 DDD3 DDD2 DDD1 DDD0 83
0x10 (0x30) PIND PIND7 PIND6 PIND5 PIND4 PIND3 PIND2 PIND1 PIND0 83
0x0F (0x2F) SPDR SPI Data Register 164
0x0E (0x2E) SPSR SPIF WCOL SPI2X 164
0x0D (0x2D) SPCR SPIE SPE DORD MSTR CPOL CPHA SPR1 SPR0 162
0x0C (0x2C) UDR0 USART0 I/O Data Register 186
0x0B (0x2B) UCSR0A RXC0 TXC0 UDRE0 FE0 DOR0 UPE0 U2X0 MPCM0 186
0x0A (0x2A) UCSR0B RXCIE0 TXCIE0 UDRIE0 RXEN0 TXEN0 UCSZ02 RXB80 TXB80 187
0x09 (0x29) UBRR0L USART0 Baud Rate Register Low Byte 190
0x08 (0x28) ACSR ACD ACBG ACO ACI ACIE ACIC ACIS1 ACIS0 195
0x07 (0x27) PORTE PORTE2 PORTE1 PORTE0 83
0x06 (0x26) DDRE DDE2 DDE1 DDE0 83
0x05 (0x25) PINE PINE2 PINE1 PINE0 83
0x04
(1)
(0x24)
(1)
OSCCAL CAL6 CAL5 CAL4 CAL3 CAL2 CAL1 CAL0 39
OCDR On-chip Debug Register 202
0x03 (0x23) UDR1 USART1 I/O Data Register 186
0x02 (0x22) UCSR1A RXC1 TXC1 UDRE1 FE1 DOR1 UPE1 U2X1 MPCM1 186
Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
306
2513LAVR03/2013
ATmega162/V
Notes: 1. When the OCDEN Fuse is unprogrammed, the OSCCAL Register is always accessed on this address. Refer to the debug-
ger specific documentation for details on how to use the OCDR Register.
2. Refer to the USART description for details on how to access UBRRH and UCSRC.
3. For compatibility with future devices, reserved bits should be written to zero if accessed. Reserved I/O memory addresses
should never be written.
4. Some of the Status Flags are cleared by writing a logical one to them. Note that the CBI and SBI instructions will operate on
all bits in the I/O Register, writing a one back into any flag read as set, thus clearing the flag. The CBI and SBI instructions
work with registers 0x00 to 0x1F only.
0x01 (0x21) UCSR1B RXCIE1 TXCIE1 UDRIE1 RXEN1 TXEN1 UCSZ12 RXB81 TXB81 187
0x00 (0x20) UBRR1L USART1 Baud Rate Register Low Byte 190
Address Name Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Page
307
2513LAVR03/2013
ATmega162/V
Instruction Set Summary
Mnemonics
Operands Description Operation
Flags #Clocks
ARITHMETIC AND LOGIC INSTRUCTIONS
ADD Rd, Rr Add two Registers Rd Rd +Rr Z,C,N,V,H 1
ADC Rd, Rr Add with Carry two Registers Rd Rd +Rr +C Z,C,N,V,H 1
ADIW Rdl,K Add Immediate to Word Rdh:Rdl Rdh:Rdl +K Z,C,N,V,S 2
SUB Rd, Rr Subtract two Registers Rd Rd - Rr Z,C,N,V,H 1
SUBI Rd, K Subtract Constant from Register Rd Rd - K Z,C,N,V,H 1
SBC Rd, Rr Subtract with Carry two Registers Rd Rd - Rr - C Z,C,N,V,H 1
SBCI Rd, K Subtract with Carry Constant from Reg. Rd Rd - K - C Z,C,N,V,H 1
SBIW Rdl,K Subtract Immediate from Word Rdh:Rdl Rdh:Rdl - K Z,C,N,V,S 2
AND Rd, Rr Logical AND Registers Rd Rd - Rr Z,N,V 1
ANDI Rd, K Logical AND Register and Constant Rd Rd - K Z,N,V 1
OR Rd, Rr Logical OR Registers Rd Rd v Rr Z,N,V 1
ORI Rd, K Logical OR Register and Constant Rd Rd v K Z,N,V 1
EOR Rd, Rr Exclusive OR Registers Rd Rd Rr Z,N,V 1
COM Rd Ones Complement Rd 0xFF Rd Z,C,N,V 1
NEG Rd Twos Complement Rd 0x00 Rd Z,C,N,V,H 1
SBR Rd,K Set Bit(s) in Register Rd Rd v K Z,N,V 1
CBR Rd,K Clear Bit(s) in Register Rd Rd - (0xFF - K) Z,N,V 1
INC Rd Increment Rd Rd +1 Z,N,V 1
DEC Rd Decrement Rd Rd 1 Z,N,V 1
TST Rd Test for Zero or Minus Rd Rd - Rd Z,N,V 1
CLR Rd Clear Register Rd Rd Rd Z,N,V 1
SER Rd Set Register Rd 0xFF None 1
MUL Rd, Rr Multiply Unsigned R1:R0 Rd x Rr Z,C 2
MULS Rd, Rr Multiply Signed R1:R0 Rd x Rr Z,C 2
MULSU Rd, Rr Multiply Signed with Unsigned R1:R0 Rd x Rr Z,C 2
FMUL Rd, Rr Fractional Multiply Unsigned R1:R0 (Rd x Rr) <<1 Z,C 2
FMULS Rd, Rr Fractional Multiply Signed R1:R0 (Rd x Rr) <<1 Z,C 2
FMULSU Rd, Rr Fractional Multiply Signed with Unsigned R1:R0 (Rd x Rr) <<1 Z,C 2
BRANCH INSTRUCTIONS
RJ MP k Relative J ump PC PC +k +1 None 2
IJ MP Indirect J ump to (Z) PC Z None 2
J MP k Direct J ump PC k None 3
RCALL k Relative Subroutine Call PC PC +k +1 None 3
ICALL Indirect Call to (Z) PC Z None 3
CALL k Direct Subroutine Call PC k None 4
RET Subroutine Return PC STACK None 4
RETI Interrupt Return PC STACK I 4
CPSE Rd,Rr Compare, Skip if Equal if (Rd =Rr) PC PC +2 or 3 None 1/2/3
CP Rd,Rr Compare Rd Rr Z, N,V,C,H 1
CPC Rd,Rr Compare with Carry Rd Rr C Z, N,V,C,H 1
CPI Rd,K Compare Register with Immediate Rd K Z, N,V,C,H 1
SBRC Rr, b Skip if Bit in Register Cleared if (Rr(b)=0) PC PC +2 or 3 None 1/2/3
SBRS Rr, b Skip if Bit in Register is Set if (Rr(b)=1) PC PC +2 or 3 None 1/2/3
SBIC P, b Skip if Bit in I/O Register Cleared if (P(b)=0) PC PC +2 or 3 None 1/2/3
SBIS P, b Skip if Bit in I/O Register is Set if (P(b)=1) PC PC +2 or 3 None 1/2/3
BRBS s, k Branch if Status Flag Set if (SREG(s) =1) then PCPC+k +1 None 1/2
BRBC s, k Branch if Status Flag Cleared if (SREG(s) =0) then PCPC+k +1 None 1/2
BREQ k Branch if Equal if (Z =1) then PC PC +k +1 None 1/2
BRNE k Branch if Not Equal if (Z =0) then PC PC +k +1 None 1/2
BRCS k Branch if Carry Set if (C =1) then PC PC +k +1 None 1/2
BRCC k Branch if Carry Cleared if (C =0) then PC PC +k +1 None 1/2
BRSH k Branch if Same or Higher if (C =0) then PC PC +k +1 None 1/2
BRLO k Branch if Lower if (C =1) then PC PC +k +1 None 1/2
BRMI k Branch if Minus if (N =1) then PC PC +k +1 None 1/2
BRPL k Branch if Plus if (N =0) then PC PC +k +1 None 1/2
BRGE k Branch if Greater or Equal, Signed if (N V=0) then PC PC +k +1 None 1/2
BRLT k Branch if Less Than Zero, Signed if (N V=1) then PC PC +k +1 None 1/2
BRHS k Branch if Half Carry Flag Set if (H =1) then PC PC +k +1 None 1/2
BRHC k Branch if Half Carry Flag Cleared if (H =0) then PC PC +k +1 None 1/2
BRTS k Branch if T Flag Set if (T =1) then PC PC +k +1 None 1/2
BRTC k Branch if T Flag Cleared if (T =0) then PC PC +k +1 None 1/2
BRVS k Branch if Overflow Flag is Set if (V =1) then PC PC +k +1 None 1/2
BRVC k Branch if Overflow Flag is Cleared if (V =0) then PC PC +k +1 None 1/2
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BRIE k Branch if Interrupt Enabled if ( I =1) then PC PC +k +1 None 1/2
BRID k Branch if Interrupt Disabled if ( I =0) then PC PC +k +1 None 1/2
DATA TRANSFER INSTRUCTIONS
MOV Rd, Rr Move Between Registers Rd Rr None 1
MOVW Rd, Rr Copy Register Word Rd+1:Rd Rr+1:Rr None 1
LDI Rd, K Load Immediate Rd K None 1
LD Rd, X Load Indirect Rd (X) None 2
LD Rd, X+ Load Indirect and Post-Inc. Rd (X), X X +1 None 2
LD Rd, - X Load Indirect and Pre-Dec. X X - 1, Rd (X) None 2
LD Rd, Y Load Indirect Rd (Y) None 2
LD Rd, Y+ Load Indirect and Post-Inc. Rd (Y), Y Y +1 None 2
LD Rd, - Y Load Indirect and Pre-Dec. Y Y - 1, Rd (Y) None 2
LDD Rd,Y+q Load Indirect with Displacement Rd (Y +q) None 2
LD Rd, Z Load Indirect Rd (Z) None 2
LD Rd, Z+ Load Indirect and Post-Inc. Rd (Z), Z Z+1 None 2
LD Rd, -Z Load Indirect and Pre-Dec. Z Z - 1, Rd (Z) None 2
LDD Rd, Z+q Load Indirect with Displacement Rd (Z +q) None 2
LDS Rd, k Load Direct from SRAM Rd (k) None 2
ST X, Rr Store Indirect (X) Rr None 2
ST X+, Rr Store Indirect and Post-Inc. (X) Rr, X X +1 None 2
ST - X, Rr Store Indirect and Pre-Dec. X X - 1, (X) Rr None 2
ST Y, Rr Store Indirect (Y) Rr None 2
ST Y+, Rr Store Indirect and Post-Inc. (Y) Rr, Y Y +1 None 2
ST - Y, Rr Store Indirect and Pre-Dec. Y Y - 1, (Y) Rr None 2
STD Y+q,Rr Store Indirect with Displacement (Y +q) Rr None 2
ST Z, Rr Store Indirect (Z) Rr None 2
ST Z+, Rr Store Indirect and Post-Inc. (Z) Rr, Z Z +1 None 2
ST -Z, Rr Store Indirect and Pre-Dec. Z Z - 1, (Z) Rr None 2
STD Z+q,Rr Store Indirect with Displacement (Z +q) Rr None 2
STS k, Rr Store Direct to SRAM (k) Rr None 2
LPM Load Program Memory R0 (Z) None 3
LPM Rd, Z Load Program Memory Rd (Z) None 3
LPM Rd, Z+ Load Program Memory and Post-Inc Rd (Z), Z Z+1 None 3
SPM Store Program Memory (Z) R1:R0 None -
IN Rd, P In Port Rd P None 1
OUT P, Rr Out Port P Rr None 1
PUSH Rr Push Register on Stack STACK Rr None 2
POP Rd Pop Register from Stack Rd STACK None 2
BIT AND BIT-TEST INSTRUCTIONS
SBI P,b Set Bit in I/O Register I/O(P,b) 1 None 2
CBI P,b Clear Bit in I/O Register I/O(P,b) 0 None 2
LSL Rd Logical Shift Left Rd(n+1) Rd(n), Rd(0) 0 Z,C,N,V 1
LSR Rd Logical Shift Right Rd(n) Rd(n+1), Rd(7) 0 Z,C,N,V 1
ROL Rd Rotate Left Through Carry Rd(0)C,Rd(n+1) Rd(n),CRd(7) Z,C,N,V 1
ROR Rd Rotate Right Through Carry Rd(7)C,Rd(n) Rd(n+1),CRd(0) Z,C,N,V 1
ASR Rd Arithmetic Shift Right Rd(n) Rd(n+1), n=0..6 Z,C,N,V 1
SWAP Rd Swap Nibbles Rd(3..0)Rd(7..4),Rd(7..4)Rd(3..0) None 1
BSET s Flag Set SREG(s) 1 SREG(s) 1
BCLR s Flag Clear SREG(s) 0 SREG(s) 1
BST Rr, b Bit Store from Register to T T Rr(b) T 1
BLD Rd, b Bit load from T to Register Rd(b) T None 1
SEC Set Carry C 1 C 1
CLC Clear Carry C 0 C 1
SEN Set Negative Flag N 1 N 1
CLN Clear Negative Flag N 0 N 1
SEZ Set Zero Flag Z 1 Z 1
CLZ Clear Zero Flag Z 0 Z 1
SEI Global Interrupt Enable I 1 I 1
CLI Global Interrupt Disable I 0 I 1
SES Set Signed Test Flag S 1 S 1
CLS Clear Signed Test Flag S 0 S 1
SEV Set Twos Complement Overflow. V 1 V 1
CLV Clear Twos Complement Overflow V 0 V 1
SET Set T in SREG T 1 T 1
CLT Clear T in SREG T 0 T 1
SEH Set Half Carry Flag in SREG H 1 H 1
Mnemonics
Operands Description Operation
Flags #Clocks
309
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CLH Clear Half Carry Flag in SREG H 0 H 1
MCU CONTROL INSTRUCTIONS
NOP No Operation None 1
SLEEP Sleep (see specific descr. for Sleep function) None 1
WDR Watchdog Reset (see specific descr. for WDR/Timer) None 1
BREAK Break For On-chip Debug Only None N/A
Mnemonics
Operands Description Operation
Flags #Clocks
310
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Ordering Information
Notes: 1. This device can also be supplied in wafer form. Please contact your local Atmel sales office for detailed ordering information
and minimum quantities.
2. Pb-free packaging, complies to the European Directive for Restriction of Hazardous Substances (RoHS directive).Also
Halide free and fully Green.
3. See Figure 113 on page 266.
4. See Figure 114 on page 266.
Speed (MHz) Power Supply Ordering Code
(2)
Package
(1)
Operation Range
8
(3)
1.8 - 5.5V
ATmega162V-8AU
ATmega162V-8PU
ATmega162V-8MU
44A
40P6
44M1
Industrial
(-40C to 85C)
16
(4)
2.7 - 5.5V
ATmega162-16AU
ATmega162-16PU
ATmega162-16MU
44A
40P6
44M1
Industrial
(-40C to 85C)
Package Type
44A 44-lead, Thin (1.0 mm) Plastic Gull Wing Quad Flat Package (TQFP)
40P6 40-pin, 0.600 Wide, Plastic Dual Inline Package (PDIP)
44M1 44-pad, 7 x 7 x 1.0 mm body, lead pitch 0.50 mm, Micro Lead Frame Package (QFN/MLF)
311
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Packaging Information
44A
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
44A, 44-lead, 10 x 10mm body size, 1.0mm body thickness,
0.8 mm lead pitch, thin profile plastic quad flat package (TQFP)
C 44A
2010-10-20
PIN 1 IDENTIFIER
0~7
PIN 1
L
C
A1 A2 A
D1
D
e
E1 E
B
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes:
1. This package conforms to JEDEC reference MS-026, Variation ACB.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable
protrusion is 0.25mm per side. Dimensions D1 and E1 are maximum
plastic body size dimensions including mold mismatch.
3. Lead coplanarity is 0.10mm maximum.
A 1.20
A1 0.05 0.15
A2 0.95 1.00 1.05
D 11.75 12.00 12.25
D1 9.90 10.00 10.10 Note 2
E 11.75 12.00 12.25
E1 9.90 10.00 10.10 Note 2
B 0.30 0.45
C 0.09 0.20
L 0.45 0.75
e 0.80 TYP
312
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ATmega162/V
40P6
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
40P6, 40-lead (0.600"/15.24mm Wide) Plastic Dual
Inline Package (PDIP)
B 40P6
09/28/01
PIN
1
E1
A1
B
REF
E
B1
C
L
SEATING PLANE
A
0 ~ 15
D
e
eB
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A 4.826
A1 0.381
D 52.070 52.578 Note 2
E 15.240 15.875
E1 13.462 13.970 Note 2
B 0.356 0.559
B1 1.041 1.651
L 3.048 3.556
C 0.203 0.381
eB 15.494 17.526
e 2.540 TYP
Notes:
1. This package conforms to JEDEC reference MS-011, Variation AC.
2. Dimensions D and E1 do not include mold Flash or Protrusion.
Mold Flash or Protrusion shall not exceed 0.25mm (0.010").
313
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44M1
TITLE DRAWING NO. GPC REV.
Package Drawing Contact:
packagedrawings@atmel.com
44M1 ZWS H
44M1, 44-pad, 7 x 7 x 1.0mm body, lead
pitch 0.50mm, 5.20mm exposed pad, thermally
enhanced plastic very thin quad flat no
lead package (VQFN)
9/26/08
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A 0.80 0.90 1.00
A1 0.02 0.05
A3 0.20 REF
b 0.18 0.23 0.30
D
D2 5.00 5.20 5.40
6.90 7.00 7.10
6.90 7.00 7.10
E
E2 5.00 5.20 5.40
e 0.50 BSC
L 0.59 0.64 0.69
K 0.20 0.26 0.41
Note: JEDEC Standard MO-220, Fig. 1 (SAW Singulation) VKKD-3.
TOP VIEW
SIDE VIEW
BOTTOM VIEW
D
E
Marked Pin# 1 ID
E2
D2
b e
Pin #1 Corner
L
A1
A3
A
SEATING PLANE
Pin #1
Triangle
Pin #1
Chamfer
(C 0.30)
Option A
Option B
Pin #1
Notch
(0.20 R)
Option C
K
K
1
2
3
314
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ATmega162/V
Errata The revision letter in this section refers to the revision of the ATmega162 device.
ATmega162, all
rev.
There are no errata for this revision of ATmega162. However, a proposal for solving problems
regarding the J TAG instruction IDCODE is presented below.
IDCODE masks data from TDI input
Reading EEPROM by using ST or STS to set EERE bit triggers unexpected interrupt request
Interrupts may be lost when writing the timer register in asynchronous timer
1. IDCODE masks data from TDI input
The public but optional J TAG instruction IDCODE is not implemented correctly according to
IEEE1149.1; a logic one is scanned into the shift register instead of the TDI input while shift-
ing the Device ID Register. Hence, captured data from the preceding devices in the
boundary scan chain are lost and replaced by all-ones, and data to succeeding devices are
replaced by all-ones during Update-DR.
If ATmega162 is the only device in the scan chain, the problem is not visible.
Problem Fix / Workaround
Select the Device ID Register of the ATmega162 (Either by issuing the IDCODE instruction
or by entering the Test-Logic-Reset state of the TAP controller) to read out the contents of
its Device ID Register and possibly data from succeeding devices of the scan chain. Note
that data to succeeding devices cannot be entered during this scan, but data to preceding
devices can. Issue the BYPASS instruction to the ATmega162 to select its Bypass Register
while reading the Device ID Registers of preceding devices of the boundary scan chain.
Never read data from succeeding devices in the boundary scan chain or upload data to the
succeeding devices while the Device ID Register is selected for the ATmega162. Note that
the IDCODE instruction is the default instruction selected by the Test-Logic-Reset state of
the TAP-controller.
Alternative Problem Fix / Workaround
If the Device IDs of all devices in the boundary scan chain must be captured simultaneously
(for instance if blind interrogation is used), the boundary scan chain can be connected in
such way that the ATmega162 is the first device in the chain. Update-DR will still not work
for the succeeding devices in the boundary scan chain as long as IDCODE is present in the
J TAG Instruction Register, but the Device ID registered cannot be uploaded in any case.
2. Reading EEPROM by using ST or STS to set EERE bit triggers unexpected interrupt
request.
Reading EEPROM by using the ST or STS command to set the EERE bit in the EECR reg-
ister triggers an unexpected EEPROM interrupt request.
Problem Fix / Workaround
Always use OUT or SBI to set EERE in EECR.
3. Interrupts may be lost when writing the timer register in asynchronous timer
The interrupt will be lost if a timer register that is synchronous timer clock is written when the
asynchronous Timer/Counter register (TCNTx) is 0x00.
Problem Fix / Workaround
Always check that the asynchronous Timer/Counter register neither have the value 0xFF nor
0x00 before writing to the asynchronous Timer Control Register (TCCRx), asynchronous
Timer Counter Register (TCNTx), or asynchronous Output Compare Register (OCRx).
315
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Datasheet
Revision
History
Please note that the referring page numbers in this section are referred to this document. The
referring revision in this section are referring to the document revision.
Changes from Rev.
2513K-08/07 to
Rev. 2513L-03/13
1. Updated Ordering Information on page 310:
Removed -AI, -PI and -MI ordering codes. Only Pb-free package options are available.
Changes from Rev.
2513J-08/07 to
Rev. 2513K-07/09
1. Updated Errata on page 314.
2. Updated the last page with Atmels new addresses.
Changes from Rev.
2513I-04/07 to Rev.
2513J-08/07
1. Updated Features on page 1.
2. Added Data Retention on page 7.
3. Updated Errata on page 314.
4. Updated Version on page 205.
5. Updated C Code Example(1) on page 172.
6. Updated Figure 18 on page 35.
7. Updated Clock Distribution on page 35.
8. Updated SPI Serial Programming Algorithm on page 246.
9. Updated Slave Mode on page 162.
Changes from Rev.
2513H-04/06 to
Rev. 2513I-04/07
1. Updated Using all 64KB Locations of External Memory on page 34.
2. Updated Bit 6 ACBG: Analog Comparator Bandgap Select on page 195.
3. Updated V
OH
conditions in DC Characteristics on page 264.
Changes from Rev.
2513G-03/05 to
Rev. 2513H-04/06
1. Added Resources on page 7.
2. Updated Calibrated Internal RC Oscillator on page 38.
3. Updated note for Table 19 on page 50.
4. Updated Serial Peripheral Interface SPI on page 157.
Changes from Rev.
2513F-09/03 to
Rev. 2513G-03/05
1. MLF-package alternative changed to Quad Flat No-Lead/Micro Lead Frame Package
QFN/MLF .
2. Updated Electrical Characteristics on page 264
3. Updated Ordering Information on page 310
316
2513LAVR03/2013
ATmega162/V
Changes from Rev.
2513D-04/03 to
Rev. 2513E-09/03
1. Removed Preliminary from the datasheet.
2. Added note on Figure 1 on page 2.
3. Renamed and updated On-chip Debug System to JTAG Interface and On-chip
Debug System on page 46.
4. Updated Table 18 on page 48 and Table 19 on page 50.
5. Updated Test Access Port TAP on page 197 regarding JTAGEN.
6. Updated description for the JTD bit on page 207.
7. Added note on JTAGEN in Table 99 on page 233.
8. Updated Absolute Maximum Ratings* and DC Characteristics in Electrical Character-
istics on page 264.
9. Added a proposal for solving problems regarding the JTAG instruction IDCODE in
Errata on page 314.
Changes from Rev.
2513C-09/02 to
Rev. 2513D-04/03
1. Updated the Ordering Information on page 310 and Packaging Information on
page 311.
2. Updated Features on page 1.
3. Added characterization plots under ATmega162 Typical Characteristics on page
275.
4. Added Chip Erase as a first step under Programming the Flash on page 260 and
Programming the EEPROM on page 262.
5. Changed CAL7, the highest bit in the OSCCAL Register, to a reserved bit on page 39
and in Register Summary on page 304.
6. Changed CPCE to CLKPCE on page 41.
7. Corrected code examples on page 55.
8. Corrected OCn waveforms in Figure 52 on page 120.
9. Various minor Timer1 corrections.
10. Added note under Filling the Temporary Buffer (Page Loading) on page 224 about
writing to the EEPROM during an SPM Page Load.
11. Added section EEPROM Write During Power-down Sleep Mode on page 24.
12. Added information about PWM symmetry for Timer0 on page 98 and Timer2 on page
147.
13. Updated Table 18 on page 48, Table 20 on page 50, Table 36 on page 77, Table 83 on
page 205, Table 109 on page 247, Table 112 on page 267, and Table 113 on page 268.
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2513LAVR03/2013
ATmega162/V
14. Added Figures for Absolute Maximum Frequency as a function of VCC, ATmega162
on page 266.
15. Updated Figure 29 on page 64, Figure 32 on page 68, and Figure 88 on page 210.
16. Removed Table 114, External RC Oscillator, Typical Frequencies
(1)
, on page 265.
17. Updated Electrical Characteristics on page 264.
Changes from Rev.
2513B-09/02 to
Rev. 2513C-09/02
1. Changed the Endurance on the Flash to 10,000 Write/Erase Cycles.
Changes from Rev.
2513A-05/02 to
Rev. 2513B-09/02
1. Added information for ATmega162U.
Information about ATmega162U included in Features on page 1, Table 19, BODLEVEL
Fuse Coding, on page 50, and Ordering Information on page 310.
318
2513LAVR03/2013
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1
2513LAVR03/2013
ATmega162/V
Table of Contents
Features 1
Pin Configurations 2
Disclaimer 2
Overview 3
Block Diagram 3
ATmega161 and ATmega162 Compatibility 4
Pin Descriptions 5
Resources 7
Data Retention 7
About Code Examples 8
AVR CPU Core 9
Introduction 9
Architectural Overview 9
ALU Arithmetic Logic Unit 10
Status Register 10
General Purpose Register File 12
Stack Pointer 13
Instruction Execution Timing 14
Reset and Interrupt Handling 14
AVR ATmega162 Memories 17
In-System Reprogrammable Flash Program Memory 17
SRAM Data Memory 18
EEPROM Data Memory 19
I/O Memory 25
External Memory Interface 26
XMEM Register Description 30
System Clock and Clock Options 35
Clock Systems and their Distribution 35
Clock Sources 36
Default Clock Source 36
Crystal Oscillator 36
Low-frequency Crystal Oscillator 38
Calibrated Internal RC Oscillator 38
External Clock 40
Clock output buffer 40
Timer/Counter Oscillator 41
2
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ATmega162/V
System Clock Prescaler 41
Power Management and Sleep Modes 43
Idle Mode 44
Power-down Mode 44
Power-save Mode 45
Standby Mode 45
Extended Standby Mode 45
Minimizing Power Consumption 46
System Control and Reset 47
Internal Voltage Reference 52
Watchdog Timer 52
Timed Sequences for Changing the Configuration of the Watchdog Timer 56
Interrupts 57
Interrupt Vectors in ATmega162 57
I/O-Ports 63
Introduction 63
Ports as General Digital I/O 63
Alternate Port Functions 68
Register Description for I/O-Ports 82
External Interrupts 84
8-bit Timer/Counter0 with PWM 89
Overview 89
Timer/Counter Clock Sources 90
Counter Unit 91
Output Compare Unit 91
Compare Match Output Unit 93
Modes of Operation 94
Timer/Counter Timing Diagrams 98
8-bit Timer/Counter Register Description 100
Timer/Counter0, Timer/Counter1, and Timer/Counter3 Prescalers 104
16-bit Timer/Counter (Timer/Counter1 and Timer/Counter3) 106
Restriction in ATmega161 Compatibility Mode 106
Overview 106
Accessing 16-bit Registers 109
Timer/Counter Clock Sources 112
Counter Unit 112
Input Capture Unit 113
Output Compare Units 114
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ATmega162/V
Compare Match Output Unit 117
Modes of Operation 118
Timer/Counter Timing Diagrams 126
16-bit Timer/Counter Register Description 128
8-bit Timer/Counter2 with PWM and Asynchronous operation 138
Overview 138
Timer/Counter Clock Sources 139
Counter Unit 140
Output Compare Unit 140
Compare Match Output Unit 142
Modes of Operation 143
Timer/Counter Timing Diagrams 147
8-bit Timer/Counter Register Description 149
Asynchronous operation of the Timer/Counter 152
Timer/Counter Prescaler 156
Serial Peripheral Interface SPI 157
SS Pin Functionality 162
Data Modes 165
USART 166
Dual USART 166
Clock Generation 168
Frame Formats 171
USART Initialization 172
Data Transmission The USART Transmitter 173
Data Reception The USART Receiver 175
Asynchronous Data Reception 179
Multi-processor Communication Mode 182
Accessing UBRRH/
UCSRC Registers 184
USART Register Description 186
Examples of Baud Rate Setting 191
Analog Comparator 195
JTAG Interface and On-chip Debug System 197
Features 197
Overview 197
Test Access Port TAP 197
TAP Controller 200
Using the Boundary-scan Chain 200
Using the On-chip Debug system 201
On-chip debug specific J TAG instructions 202
On-chip Debug Related Register in I/O Memory 202
4
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ATmega162/V
Using the J TAG Programming Capabilities 202
Bibliography 203
IEEE 1149.1 (JTAG) Boundary-scan 204
Features 204
System Overview 204
Data Registers 205
Boundary-scan Specific J TAG Instructions 206
Boundary-scan Chain 208
ATmega162 Boundary-scan Order 213
Boundary-scan Description Language Files 216
Boot Loader Support Read-While-Write Self-programming 217
Features 217
Application and Boot Loader Flash Sections 217
Read-While-Write and No Read-While-Write Flash Sections 217
Boot Loader Lock Bits 219
Entering the Boot Loader Program 221
Addressing the Flash During Self-programming 223
Self-programming the Flash 224
Memory Programming 231
Program And Data Memory Lock Bits 231
Fuse Bits 232
Signature Bytes 234
Calibration Byte 234
Parallel Programming Parameters, Pin Mapping, and Commands 234
Parallel Programming 236
Serial Downloading 245
SPI Serial Programming Pin Mapping 245
Programming via the J TAG Interface 250
Electrical Characteristics 264
Absolute Maximum Ratings* 264
DC Characteristics 264
External Clock Drive Waveforms 267
External Clock Drive 267
SPI Timing Characteristics 268
External Data Memory Timing 270
ATmega162 Typical Characteristics 275
Register Summary 304
Instruction Set Summary 307
5
2513LAVR03/2013
ATmega162/V
Ordering Information 310
Packaging Information 311
44A 311
40P6 312
44M1 313
Errata 314
ATmega162, all rev. 314
Datasheet Revision History 315
Changes from Rev. 2513K-08/07 to Rev. 2513L-03/13 315
Changes from Rev. 2513J -08/07 to Rev. 2513K-07/09 315
Changes from Rev. 2513I-04/07 to Rev. 2513J -08/07 315
Changes from Rev. 2513H-04/06 to Rev. 2513I-04/07 315
Changes from Rev. 2513G-03/05 to Rev. 2513H-04/06 315
Changes from Rev. 2513F-09/03 to Rev. 2513G-03/05 315
Changes from Rev. 2513D-04/03 to Rev. 2513E-09/03 316
Changes from Rev. 2513C-09/02 to Rev. 2513D-04/03 316
Changes from Rev. 2513B-09/02 to Rev. 2513C-09/02 317
Changes from Rev. 2513A-05/02 to Rev. 2513B-09/02 317
Atmel Corporation
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Tel: (+81) (3) 6417-0300
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2013 Atmel Corporation. All rights reserved. / Rev.: 2513LAVR03/2013
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any intellectual property right is granted by this
document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN THE ATMEL TERMS AND CONDITIONS OF SALES LOCATED ON THE ATMEL WEBSITE, ATMEL ASSUMES
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