BQ 24260
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BQ 24260
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bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
bq2426x 3A, 30V, Host-Controlled Single-Input, Single Cell Switchmode Li-Ion Battery
Charger with Power Path Management and USB-OTG Support
1 Features
2 Applications
3 Description
The bq24260/bq24261/bq24262 are highly integrated
single cell Li-Ion battery charger and system power
path management devices that supports operation
from either a USB port or wall adapter supply. The
power path feature allows the bq2426x to power the
system from a high efficiency DC to DC converter
while simultaneously and independently charging the
battery. The power path also permits the battery to
supplement the system current requirements when
the adapter cannot. Many features are programmable
using the I2C interface. To support USB OTG
applications, the bq2426x is configurable to boost the
battery voltage to 5V and supply up to 1A at the
input. The battery is charged with three phases:
precharge, constant current and constant voltage.
Thermal regulation prevents the die temperature from
exceeding 125C. Additionally, a JEITA compatible
battery pack thermistor monitoring input (TS) is
included to prevent the battery from charging outside
of its safe temperature range.
Device Information
ORDER NUMBER
PACKAGE
BODY SIZE
bq24260/1/2YFF
DSBGA (36)
2,4mm 2,4mm
bq24260/1/2RGE
QFN (24)
4mm 4mm
4 Application Schematic
Charge Time Optimizer Effect
Charge Cycle 4000mAh Battery 2A Charge Rate
SW
4.4
D+
D-
System
Load
GND
PGND
4.2
BOOT
2.5
4
PMID
3.8
SYS
Voltage (V)
D+
DBAT
CD
HOST
1.5
3.2
3
bq24260
INT
PACK+
TS
2.8
0.5
TEMP
2.6
VDRV
V I/O
3.4
SDA
SCL
More Energy
Delivered to
the Battery
in the Same
Time
3.6
IN
VBUS
PACK-
2.4
0
2000
VBAT_CTO
4000
6000
Time (sec)
VBAT_Traditional
8000
IBAT_CTO
0
10000 11000
IBAT_Traditional
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Application Schematic ..........................................
Revision History.....................................................
Terminal Configuration and Functions................
Specifications.........................................................
7.1
7.2
7.3
7.4
7.5
7.6
7.7
1
1
1
1
2
3
5
Overview .................................................................
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes........................................
12
13
15
15
8.5 Programming........................................................... 26
8.6 Register Descriptions .............................................. 29
11 Layout................................................................... 40
11.1 Layout Guidelines ................................................. 40
11.2 Layout Example .................................................... 40
42
42
42
42
42
5 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (January 2014) to Revision B
Page
Changed VBATREG accuracy for 0-125C, added 0-85C, and added mV specific numbers to Elec Charateristics table. ....... 7
Changed location of Ordering Information to Mechanical, Packaging, and Orderable Information .................................... 43
Page
Added separate lines for IINLIM current for YFF and RGE packages. ..................................................................................... 8
Changed VDO_DRV spec MAX voltage from "500 mV" to "450 mV" ......................................................................................... 8
Changed the wording of the Safety Timer description for clarification. ............................................................................... 21
Changed text in the F/S Mode Protocol section from "...to either transmit data to the slave (R/W bit 1) or receive
data from the slave (R/W bit 0" to "...to either transmit data to the slave (R/W bit 0) or receive data from the slave
(R/W bit 1" for clarification. ................................................................................................................................................... 27
bq24260
bq24261, bq24262
www.ti.com
OVP
CE BIT DEFAULT
D+/D
DETECTION
NTC
MONITORING
OTG
BOOST
I2C
ADDRESS
bq24260
10.5
0
(Charge Enabled)
YES
YES
JEITA
YES
6B
bq24261
14
1
(Charge Disabled)
NO
YES
JEITA
YES
6B
bq24262
6.5
0
(Charge Enabled)
NO
NO
JEITA
YES
6B
PGND
PGND
PGND
PGND
PGND
PGND
SW
PMID
SW
SW
SW
SW
SW
CD
BOOT
IN
IN
IN
IN
CD
BOOT
D+
TS
DRV
SDA
SCL
N.C.
PSEL
TS
DRV
SYS
SYS
SYS
SYS
STAT
INT
SYS
SYS
SYS
SYS
BAT
BAT
BAT
BAT
AGND
BGATE
BAT
BAT
BAT
BAT
PGND
PGND
PGND
PGND
PGND
PGND
PMID
SW
SW
SW
SW
IN
IN
IN
IN
SDA
SCL
STAT
INT
AGND
BGATE
AGND
IN
IN
PGND
AGND
PGND
PGND
SW
PGND
SW
SW
19
DRV
19
20
20
21
BOOT
21
22
18 IN
22
23
23
24
PMID
24
SW
(Top View)
PMID
18 IN
17 SDA
BOOT
17 SDA
16 SCL
DRV
16 SCL
bq24260
bq24261
bq24262
TS 5
14 PSEL
SYS 6
13 STAT
13 STAT
12
SYS
BAT
BAT
INT
BGATE
AGND
SYS
12
11
11
10
10
AGND
14 D+
BGATE
TS 5
SYS 6
15 N.C.
INT
CD 4
BAT
15 D
BAT
CD 4
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
Terminal Functions
TERMINAL
NAME
TERMINAL
NUMBER
bq24260
TERMINAL
NUMBER
bq24261/2
I/O
DESCRIPTION
YFF
RGE
YFF
RGE
F1
12, 20
F1
12, 20
F3-F6
8, 9
F3-F6
8, 9
I/O
Battery Connection. Connect to the positive terminal of the battery. Bypass BAT to GND with at
least 1F of ceramic capacitance. See Application section for additional details.
F2
11
F2
11
External Discharge MOSFET Gate Connection. BGATE drives an external P-Channel MOSFET
to provide a very low resistance discharge path. Connect BGATE to the gate of the external
MOSFET. BGATE is low during high impedance mode or when no input is connected. If no
external FET is required, leave BGATE disconnected. Do not connect BGATE to GND.
C6
C6
High Side MOSFET Gate Driver Supply. Connect 0.033F of ceramic capacitance (voltage
rating > 10V) from BOOT to SW to supply the gate drive for the high side MOSFET.
C5
C5
IC Hardware Disable Input. Drive CD high to place the bq24260 in high-z mode. Drive CD low
for normal operation. CD is pulled low internally with 100k
D+
D4
14
D3
15
D6
D6
Gate Drive Supply. DRV is the bias supply for the gate drive of the internal MOSFETs. Bypass
DRV to PGND with at least 1F of ceramic capacitance. DRV may be used to drive external
loads up to 10mA. DRV is active whenever the input is connected and VIN > VUVLO and VIN >
(VBAT + VSLP).
C1-C4
19
C1-C4
19
DC Input Power Supply. IN is connected to the external DC supply (AC adapter or USB port).
Bypass IN to PGND with at least a 4.7F of ceramic capacitance.
AGND
BAT
Analog Ground. Connect to the thermal pad (for QFN only) and the ground plane of the circuit.
BGATE
BOOT
CD
DRV
IN
INT
D+ and D Connections for USB Input Adapter Detection. When a source is initially connected
to the input during DEFAULT mode, and a short is detected between D+ and D, the input
current limit is set to 1.5A. If a short is not detected, the USB100 mode is selected.
E2
10
E2
10
Status Output. INT is an open-drain output that signals charging status and fault interrupts. INT
pulls low during charging. INT is high impedance when charging is complete, disabled or the
charger is in high impedance mode. When a fault occurs, a 128s pulse is sent out as an
interrupt for the host. INT is enabled /disabled using the EN_STAT bit in the control register.
Connect INT to a logic rail through a 100k resistor to communicate with the host processor.
A1-A6
21,22
A1-A6
21,22
Ground terminal. Connect to the thermal pad (for QFN only) and the ground plane of the circuit.
B1
B1
High Side Bypass Connection. Connect at least 1F of ceramic capacitance from PMID to
PGND as close to the PMID and PGND terminals as possible.
D4
14
Hardware Input Current Limit. In DEFAULT mode, PSEL selects the input current limit. Drive
PSEL high to select USB100 (bq24261) or USB500 (bq24262) mode, drive PSEL low to select
1.5A mode.
SCL
D2
16
D2
16
I2C Interface Clock. Connect SCL to the logic rail through a 10k resistor. Do not leave floating.
SDA
D1
17
D1
17
I/O
I2C Interface Data. Connect SDA to the logic rail through a 10k resistor.
PGND
PMID
PSEL
STAT
SW
E1
13
E1
13
Status Output. STAT is an open-drain output that signals charging status and fault interrupts.
STAT pulls low during charging. STAT is high impedance when charging is complete, disabled
or the charger is high impedance mode. When a fault occurs, a 128s pulse is sent out as an
interrupt for the host. STAT is enabled /disabled using the EN_STAT bit in the control register.
Connect STAT to a logic rail using an LED for visual indication or through a 100k resistor to
communicate with the host processor.
B2-B6
23, 24
B2-B6
23, 24
Inductor Connection. Connect to the switched side of the external inductor. The inductance
must be between 1.5H and 2.2H.
E3-E6
6, 7
E3-E6
6, 7
System Voltage Sense and Charger FET Connection. Connect SYS to the system output at the
output bulk capacitors. Bypass SYS locally with at least 10F of ceramic capacitance. The SYS
rail must have at least 20F of total capacitance for stable operation. See Application section for
additional details.
SYS
TS
Thermal
PAD
D5
D5
Battery Pack NTC Monitor. Connect TS to the center tap of a resistor divider from DRV to GND.
The NTC is connected from TS to GND. The TS function provides 4 thresholds for JEITA
compatibility. TS faults are reported by the I2C interface. Pull TS high to VDRV to disable the TS
function if unused. See the NTC Monitor section for more details on operation and selecting the
resistor values.
There is an internal electrical connection between the exposed thermal pad and the PGND
terminal of the device. The thermal pad must be connected to the same potential as the PGND
terminal on the printed circuit board. Do not use the thermal pad as the primary ground input for
the device. PGND terminal must be connected to ground at all times.
bq24260
bq24261, bq24262
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings (1)
over operating free-air temperature range (unless otherwise noted)
VALUE
MIN
MAX
IN
1.3
30
BOOT, PMID
0.3
30
SW
0.7
20
BAT, BGATE, CD, D+, D-, DRV, INT, PSEL, SDA, SCL, STAT,
SYS, TS
0.3
0.3
BOOT to SW
Output Current (Continuous)
SW
4.5
3.5
STAT, INT
V
A
2.75
10
mA
40
85
Junction temperature, TJ
40
125
(1)
UNIT
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage
values are with respect to the network ground terminal unless otherwise noted.
Storage temperature
HBM
ESD (1)
(1)
(2)
(3)
(2)
CDM (3)
MAX
UNIT
300
kV
500
Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in
to the device.
Level listed above is the passing level per ANSI, ESDA, and JEDEC JS-001. JEDEC document JEP155 states that 500-V HBM allows
safe manufacturing with a standard ESD control process.
Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250-V CDM allows safe
manufacturing with a standard ESD control process.
VIN
4.2
10
4.2
13.2
4.2
6.0
ISW
IBAT, ISYS
UNIT
28 (1)
(1)
MAX
4.2
IIN
TJ
NOM
IN voltage range
2.5
Charging
125
A
C
The inherent switching noise voltage spikes should not exceed the absolute maximum rating on either the BOOT or SW terminals. A
tight layout minimizes switching noise.
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
YFF
(36 TERMINALS)
RGE
(24 TERMINALS)
JA
55.8
32.6
JCtop
0.5
30.5
JB
10
3.3
JT
2.6
0.4
JB
9.9
9.3
JCbot
N/A
2.6
(1)
UNIT
C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
TEST CONDITIONS
MIN
TYP
MAX
UNIT
6.5
mA
6.65
250
15
77
80
INPUT CURRENTS
VUVLO < VIN < VOVP and VIN>VBAT+VSLP
PWM switching
IIN
IBAT_HIZ
15
POWER-PATH MANAGEMENT
VSYSREG(LO)
VMINSYS
+ 80mV
VMINSYS
+ 100mV
VMINSYS
+ 120mV
VSYSREG(HI)
VBATREG
+2.2%
VBATREG
+2.5%
VBATREG
+2.77%
VMINSYS
3.44
3.5
3.55
tDGL(MINSYS_CMP)
VBSUP1
VBSUP2
ms
VBAT
20mV
VBAT
5mV
ILIM(DISCH)
tDGL(SC1)
250
tREC(SC1)
2.5
4.5
bq24260
bq24261, bq24262
www.ti.com
TEST CONDITIONS
MIN
TYP
MAX
YFF
17
25
RGE
32
47
UNIT
BATTERY CHARGER
RON(BAT-SYS)
VBATREG
Charge Voltage
3.5
4.44
TJ = 0C to 50C
-0.5%
0.5%
TJ = 0C to 85C
-0.7%
0.7%
TJ = 0C to 85C
-0.75%
0.75%
TJ = 0C to 125C
-1.0%
1.0%
TJ = 25C
-29.2
28.1
TJ = 0C to 85C
-32.0
29.3
TJ = 0C to 125C
-40.2
29.3
500
3000
ICHARGE
500 mA ICHARGE 1A
10%
10%
5%
VBATSHRT
VBATSHRT_HYS
IBATSHRT
ITERM
1.9
ITERM 50 mA
50 mA <
ITERM
< 200 mA
ITERM 200 mA
tDGL(TERM)
VRCH
Below VBATREG
tDGL(RCH)
Deglitch time
VDET(SRC1)
VDET(SRC2)
VDET(SNK)
33.5
mV
mA
5%
2
2.1
100
mV
ms
50
66.5
30%
30%
15%
15%
15%
10%
32
100
120
mA
ms
150
mV
32
ms
VRCH
VRCH
200mV
VBATSHRT
IDETECT
mA
tDETECT(SRC)
tDETECT(SNK)
250
ms
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IINLIM
VIN_DPM
IINLIM=USB100
90
95
100
IINLIM=USB500
450
475
500
IINLIM=USB150
125
140
150
IINLIM=USB900
800
850
900
IINLIM=1.5A
1425
1500
1575
IINLIM=2A, YFF
Package
1850
2000
2150
IINLIM=2A, RGE
Package
1850
2000
2200
IINLIM=2.5A, YFF
Package
2300
2500
2700
IINLIM=2.5A, RGE
Package
2225
2500
2825
4.2
11.6
3%
3%
mA
IDRV
VDO_DRV
VIN>5V
4.3
4.8
5.3
10
mA
450
mV
0.4
0.4
IIH
V STAT = VINT = 5V
VIH
RPULLDOWN
CD pull-down resistance
Deglitch for CD and PSEL
1.4
CD Only
100
CD or PSEL rising/falling
100
D+/D- DETECTION
VD+_SRC
D+ Voltage Source
0.5
ID+_SRC
D+ Current Source
ID-_SINK
D- Sink Current
ID_LKG
50
0.6
100
0.7
14
150
-1
-1
VD+_LOW
D+ Comparator Threshold
0.85
0.9
0.95
VD-_LOW
D- Comparator Threshold
250
325
400
mV
RD-_DWN
D- Pull-Down Resistance
14.25
24.8
bq24260
bq24261, bq24262
www.ti.com
TEST CONDITIONS
MIN
TYP
MAX
3.3
3.4
UNIT
PROTECTION
VUVLO
VIN rising
VUVLO_HYS
IC active hysteresis
3.2
300
VBATUVLO
2.4
2.6
VSLP
40
120
mV
tDGL(BAT)
VSLP_HYS
tDGL(VSLP)
VOVP
1.2
40
190
mV
ms
bq24260
10.1
10.5
10.9
bq24261
13.6
14
14.4
bq24262
6.25
6.5
6.75
3.51
3.7
3.89
VIN Rising
tDGL(BUCK_OVP)
VBOVP
Battery OVP threshold voltage VBAT threshold over VOREG to turn off charger during charge
VBOVP_HYS
VBOVP hysteresis
tDGL(BOVP)
BOVP Deglitch
ICbCLIMIT
VSYS shorted
TSHTDWN
Thermal trip
1.03
VBATREG
1.05
VBATREG
ms
1.07
VBATREG
V
% of
VBATREG
1
8
4.1
30
Thermal hysteresis
Thermal regulation threshold
100
ms
30
VBATGD
TREG
V
mV
4.5
ms
4.9
150
10
125
20%
C
20%
PWM
Internal top MOSFET onresistance
75
120
80
135
RDSON_Q2
75
115
80
135
fOSC
Oscillator frequency
1.5
1.65
MHz
DMAX
DMIN
RDSON_Q1
1.35
95
27.3
30
32.6
%VDRV
VWARM
36.0
38.3
41.2
%VDRV
VCOOL
54.7
56.4
58.1
%VDRV
VCOLD
58.2
60
61.8
%VDRV
TSOFF
TS Disable threshold
80
85
%VDRV
tDGL(TS)
50
ms
VIL
0.4
VOL
0.4
IBIAS
tWATCHDOG
1.3
30
tI2CRESET
V
V
50
700
ms
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
TEST CONDITIONS
MIN
TYP
MAX
UNIT
100
4.5
5.2
3.3V<VBAT<4.5V, no switching
VBAT falling
3.3
VIN_BOOST
4.95
IBO
3.3V<VBAT<4.5V
IBLIMIT
3.3V<VBAT<4.5V
VBOOSTOVP
tDGL(BOOST_OVP)
VBURST(ENT)
5.1
5.2
5.3
VBURST(EXIT)
4.9
5.1
IQBAT_ BOOST
BOOST_ILIM = 1
1000
BOOST_ILIM = 0
500
5.05
mA
BOOST_ILIM = 1
BOOST_ILIM = 0
2
5.8
6.2
170
V
s
Oscillator frequency
DMAX
DMIN
10
TEST CONDITIONS
MIN
TYP
MAX
UNIT
1.35
1.5
1.65
Mhz
95%
0%
bq24260
bq24261, bq24262
www.ti.com
95
90
4
2
Efficiency (%)
0
-2
TA=25C
-4
85
80
VIN=5V
VIN=7V
TA=0C
-6
TA=85C
VIN=10V
75
VIN=12V
TA=60C
-8
-10
2.9
3.1
3.3
3.5
3.7
3.9
VBAT (V)
4.1
4.3
70
4.5
1.5
2
Load Current (A)
2.5
90
-0.5
VBAT Accuracy (%)
100
80
Efficiency (%)
0.5
70
60
-1.0
-1.5
-2.0
TA=25C
50
TA=60C
TA=0C
-2.5
40
2
2.5
3.5
-3.0
4.5
VBAT (V)
16
700
14
600
12
500
Input Current - mA
10
8
6
4
0.5
1
1.5
IBAT (A)
Figure 4. VBAT Accuracy vs IBAT 4.2V Setting
400
300
200
100
-100
-2
0
6
8
10
Input Voltage - V
12
14
16
11
13
15
11
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
8 Detailed Description
8.1 Overview
The bq24260/bq24261/bq24262 are highly integrated single cell Li-Ion battery charger and system power path
management devices targeted for space-limited, portable applications with high capacity batteries. The single cell
charger has a single input that supports operation from either a USB port or wall adapter supply for a versatile
solution.
The power path management feature allows the bq2426x to power the system from a high efficiency DC to DC
converter while simultaneously and independently charging the battery. The charger monitors the battery current
at all times and reduces the charge current when the system load requires current above the input current limit or
the adapter cannot support the required load, causing the adapter voltage to fall (VIN_DPM). This allows for proper
charge termination and timer operation. The system voltage is regulated to the battery voltage but will not drop
below 3.5V (VMINSYS). This minimum system voltage support enables the system to run with a defective or absent
battery pack and enables instant system turn-on even with a totally discharged battery or no battery. The powerpath management architecture also permits the battery to supplement the system current requirements when the
adapter cannot deliver the peak system currents. The power-path feature coupled with VIN-DPM, enables the use
of many adapters with no hardware change. The charge parameters are programmable using the I2C interface.
To Support USB OTG applications, the bq2426x is configurable to boost the battery voltage to 5V at the input. In
this mode, the bq2426x supplies up to 1A and operates with battery voltages down to 3.3V.
The battery is charged using a standard Li-Ion charge profile with three phases: precharge, constant current and
constant voltage. In all charge phases, an internal control loop monitors the IC junction temperature and reduces
the input current to prevent the junction temperature from rising above 125C. Additionally, a voltage-based,
JEITA compatible battery pack thermistor monitoring input (TS) is included that monitors battery temperature and
automatically changes charge parameters to prevent the battery from charging outside of its safe temperature
range.
12
bq24260
bq24261, bq24262
www.ti.com
4.8V
Reference
DRV
IN
ICbCLimit
+
BOOT
IINLIM
Q1
DC-DC CONVERTER PWM LOGIC,
COMPENSATION AND BATTERY
FET CONTROL
VINDPM
VSYS(REG)
IBAT(REG)
VBAT(REG)
SW
DIE Temp
Regulation
Q2
PGND
VSUPPLY
SYS
References
OVP
Comparator
VIN
Termination
Reference
Q3
VINOVP
+
Termination
Comparator
Sleep
Comparator
VIN
IBAT
BAT
Recharge Comparator
VBAT +VSLP
Start Recharge
Cycle
VBATREG 0.12V
VBAT
Hi-Impedance Mode
Hi-Z
Mode
CD
Enable Linear
Charge
VSYSREG Comparator
+
VSYS
VMINSYS
+
Enable HiZ in
DEFAULT mode
SDA
I2C
Interface
BGATE
VBATGD
VBATSC Comparator
SCL
Enable
IBATSHRT
VBAT
VBATSHRT
Supplement COMPARATOR
+
D+
D-
VSYS
VBAT
bq24260
USB
Adapter
Detection
Circuitry
VBSUP
VDRV
VBOVP Comparator
+
1.5A /
USB100
VBAT
VBATOVP
+
bq24261/2
DISABLE
TS COLD
PSEL
1C/
0.5C
+
TS COOL
+
VBATREG
0.14V
STAT
TS WARM
+
DISABLE
INT
CHARGE
CONTROLLER
TS HOT
TS
w/ Timers
13
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
DRV
IN
BOOT
VBOOST Amp
+
Q1
VIN_BOOST
VBURST_ENT
Burst Mode Enter
Comparator
DC-DC
Low Side Current
CONVERTER
Limit Comparator
PWM LOGIC
AND
IBLIMITI
COMPENSATION
+
VBURST_EXT
SW
VDRV
Q2
PGND
VBOOSTOVP
VBOOST
OVP Comparator
SYS
Battery SC Comparator
VBAT
CD
SDA
VBIAS
Battery Short
Circuit
Q3
+
ILIM(DISCH)
BAT
Hi-Z
Mode
2
I C
interface
SCL
BGATE
Digital Control
STAT
INT
TS
14
bq24260
bq24261, bq24262
www.ti.com
15
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
VIN
1V/div
(5V Offset)
2A/div
IIN
500mV/div
VSYS
(3.6V Offset)
IBAT
2A/div
2A/div
ISYS
800us/div
Figure 9. bq24260 VIN-DPM
Input Over-Voltage Protection
The built-in input over-voltage protection protects the bq2426x and downstream components connected
to SYS and/or BAT against damage from overvoltage on the input supply (Voltage from VIN to PGND).
When VIN > VOVP, the bq2426x turns off the PWM converter immediately. After the deglitch time
tDGL(BUCK_OVP), an OVP fault is determined to exist. During the OVP fault, the bq2426x turns the battery
FET and BGATE on, sends a single 128s pulse is sent on the STAT and INT outputs and the STATx
and FAULT_x bits are updated in the I2C. Once the OVP fault is removed, the STATx bits are cleared
and the device returns to normal operation. The FAULT_x bits are not cleared until they are read in the
I2C after the OVP condition no longer exists.
The OVP threshold for the bq24260 is 10.5V for operation from standard adapters while the bq24261 is
set to 14V to enable operation from 12V sources. The bq24262 OVP is set to 6.5V to operate from
standard USB sources.
8.4.3.2 Charge Profile
When a valid input source is connected (VIN>VUVLO and VBAT+VSLP<VIN<VOVP), the CE bit in the control register
determines whether a charge cycle is initiated. By default, the bq24260 and bq24262 enable the charge cycle
when a valid input source is connected while the bq24261 does not (CE=1 by default). When the CE bit is 1 and
a valid input source is connected, the battery FET is turned off and the SYS output is regulated to
VSYSREG(HI). A charge cycle is initiated when the CE bit is written to a 0.
16
bq24260
bq24261, bq24262
www.ti.com
Current Regulation
Phase
Voltage Regulation
Phase
Regulation
Voltage
Regulation
Current
System Voltage
VSYS
(3.6V)
VBATSHORT
(2.0V)
Battery
Voltage
Charge Current
Termination
IBATSHORT
Linear Charge
to Maintain
Minimum
System
Voltage
Battery
FET
is OFF
17
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
18
bq24260
bq24261, bq24262
www.ti.com
~850mA
0mA
1A
IBAT
0mA
200mA
3.6V
3.5V
VSYS
~3.1V
Supplement
Mode
Figure 11. Example DPPM Response (VSupply=5V, VBAT = 3.1V, 1.5A Input Current Limit)
19
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
20
bq24260
bq24261, bq24262
www.ti.com
21
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
Yes
Safety timer
fault
No
Charging suspended
Enter suspended
mode
Fault indicated in
STAT registers
STAT = Hi
Update STAT
bits
Yes
Charge Done?
ICHG < ITERM
No
No
I C Write
performed?
Yes
Charge Done?
ICHG < ITERM
STAT = Hi
Update STAT
bits
Yes
No
Yes
Safety timer expired?
Safety timer
fault
No
Charging suspended
Enter suspended
mode
Fault indicated in
STAT registers
WD timer expired?
Yes
No
Yes
Received
software watchdog
RESET?
No
Reset to default
2
values in I C
register
Restart 2 min
safety timer
22
bq24260
bq24261, bq24262
www.ti.com
4.25 V
VBAT 4.15 V
4.1 V
T1
(0C)
T2
(10C)
T3
T4
(45C) (50C)
Cold
Cool
Warm
T5
(60C)
Hot
V
V
HOT
COLD
RLO =
V
VCOLD
(1)
VDRV
-1
VCOLD
RHI =
1
1
+
RLO RCOLD
(2)
23
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
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(3)
(4)
Where RHOT is the NTC resistance at the hot temperature and RCOLD is the NTC resistance at cold
temperature.
The WARM and COOL thresholds are not independently programmable. The COOL and WARM NTC
resistances for a selected resistor divider are calculated using Equation 3 and Equation 4.
DISABLE
VBATREG
140 mV
1 x Charge/
0.5 x Charge
VDRV
TS COLD
TS COOL
TS WARM
+
VDRV
TS HOT
RHI
TS
TEMP
PACK+
bq2426x
RLO
PACK
24
bq24260
bq24261, bq24262
www.ti.com
Low
High-Impedance
Charge mode faults: Timer faults, sleep mode, VIN over voltage, VIN < UVLO or Sleep
mode, BOVP, thermal shutdown, No Battery and Battery Temperature faults
25
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
The bq2426x contains integrated over-voltage protection on the IN terminal. During boost mode, if an
over-voltage condition is detected (VIN > VBOOSTOVP), after deglitch tDGL(BOOST_OVP), the IC turns off the
PWM converter, resets EN_BOOST bit to 0, sets fault status bits and sends out a fault pulse on STAT
and INT. The converter does not restart when VIN drops to the normal level until the EN_BOOST bit is
reset to 1.
8.4.19.6.2
The bq2426x contains over current protection to prevent the device and battery damage when IN is
overloaded. When an over-current condition occurs, the cycle-by-cycle current limit limits the current from
the battery to the load. If the overload condition lasts for 8ms, the overload fault is detected. When an
overload condition is detected, the bq2426x turns off the PWM converter, resets EN_BOOST bit to 0,
sets the fault status bits and sends out the fault pulse on STAT and INT. The boost operation starts only
after the fault is cleared and the EN_BOOST bit is reset to 1 using the I2C.
8.4.19.6.3
During boost mode, when the battery voltage is below the minimum battery voltage threshold, VBATUVLO,
the IC turns off the PWM converter, resets EN_BOOST bit to 0, sets fault status bits and sends out a
fault pulse on STAT and INT. Once the battery voltage returns to the acceptable level, the boost starts
only after the EN_BOOST bit is set to 1. Proper operation below 3.3V down to the VBATUVLOis not
specified.
8.5 Programming
8.5.1 Serial Interface Description
The bq24260 uses an I2C compatible interface to program charge parameters. I2C is a 2-wire serial interface
developed by NXP (formerly Philips Semiconductor, see I2C-Bus Specification, Version 5, October 2012). The
bus consists of a data line (SDA) and a clock line (SCL) with pull-up structures. When the bus is idle, both SDA
and SCL lines are pulled high. All the I2C compatible devices connect to the I2C bus through open drain I/O
terminals, SDA and SCL. A master device, usually a microcontroller or a digital signal processor, controls the
bus. The master is responsible for generating the SCL signal and device addresses. The master also generates
specific conditions that indicate the START and STOP of data transfer. A slave device receives and/or transmits
data on the bus under control of the master device.
The bq2426x device works as a slave and supports the following data transfer modes, as defined in the I2C
Bus Specification: standard mode (100 kbps) and fast mode (400 kbps). The interface adds flexibility to the
battery charge solution, enabling most functions to be programmed to new values depending on the
instantaneous application requirements. The I2C circuitry is powered from IN when a supply is connected. If the
IN supply is not connected, the I2C circuitry is powered from the battery through BAT. The battery voltage must
stay above VBATUVLO with no input connected in order to maintain proper operation.
The data transfer protocol for standard and fast modes is exactly the same; therefore, they are referred to as the
F/S-mode in this document. The bq24260/1/2 device only supports 7-bit addressing. The device 7-bit address is
defined as 1101011 (0x6Bh).
26
bq24260
bq24261, bq24262
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Programming (continued)
To avoid I2C hang-ups, a timer (tI2CRESET) runs during I2C transactions. If the transaction takes longer than
tI2CRESET, any additional commands are ignored and the I2C engine is reset. The timeout is reset with START
and repeated START conditions and stops when a valid STOP condition is sent.
8.5.2 F/S Mode Protocol
The master initiates data transfer by generating a start condition. The start condition is when a high-to-low
transition occurs on the SDA line while SCL is high, as shown in Figure 15. All I2C -compatible devices should
recognize a start condition.
DATA
CLK
S
START Condition
STOP Condition
CLK
Data Line
Stable;
Data Valid
Change
of Data
Allowed
27
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
Programming (continued)
Data Output
by Transmitter
Not Acknowledge
Data Output
by Receiver
Acknowledge
SCL From
Master
START
Condition
Recognize STOP or
REPEATED START
Condition
Generate ACKNOWLEDGE
Signal
P
SDA
Acknowledgement
Signal From Slave
MSB
Sr
Address
R/W
SCL
S
or
Sr
ACK
ACK
Sr
or
P
28
bq24260
bq24261, bq24262
www.ti.com
NAME
READ/WRITE
FUNCTION
B7(MSB)
TMR_RST
Read/Write
Write: TMR_RST function, write 1 to reset the watchdog timer (auto clear)
Read: Always 0
(bq24260/1 only)
B6
EN_BOOST
Read/Write
0-Charger Mode
1-Boost Mode (default 0)
B5
STAT_1
Read only
B4
STAT_0
Read only
00-Ready
01-Charge in progress
10-Charge done
11-Fault
B3
EN_SHIPMODE
Read/Write
0-Normal Operation
1-Ship Mode Enabled (default 0)
B2
FAULT_2
Read only
B1
FAULT_1
Read only
B0(LSB)
FAULT_0
Read only
000-Normal
001-VIN > VOVP or Boost Mode OVP
010- Low Supply connected (VIN<VUVLO or VIN<VSLP) or Boost Mode Overcurrent
011- Thermal Shutdown
100-Battery Temperature Fault
101- Timer Fault (watchdog or safety timer)
110-Battery OVP
111-No Battery connected
29
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
NAME
READ/WRITE
B7(MSB)
RESET
Write only
B6
IN_LIMIT_2
Read/Write
B5
IN_LIMIT_1
Read/Write
B4
IN_LIMIT _0
Read/Write
B3
EN_STAT
Read/Write
B2
TE
Read/Write
B1
CE
Read/Write
0-Charger enabled
1-Charger is disabled (default 0-bq24260 / 2, 1-bq24261)
B0(LSB)
HZ_MODE
Read/Write
(1)
FUNCTION
When in DEFAULT mode, the PSEL (bq24261/2) determine the default input current limit.
RESET Bit
The RESET bit in the control register (0x01h) is used to reset all the charge parameters. Write 1 to
RESET bit to reset all the registers to default values and place the bq2426x into DEFAULT mode and turn
off the watchdog timer. The RESET bit is automatically cleared to zero once the bq2426x enters
DEFAULT mode.
CE Bit (Charge Enable)
The CE bit is used to disable or enable the charge process. A low logic level (0) on this bit enables the
charge and a high logic level (1) disables the charge. When charge is disabled, the SYS output regulates
to VSYS(REG) and battery is disconnected from the SYS. Supplement mode is available if the system load
demands cannot be met by the supply.
HZ_MODE Bit (High Impedance Mode Enable)
The HZ_MODE bit is used to disable or enable the high impedance mode. A low logic level (0) on this bit
enables the IC and a high logic level (1) puts the IC in a low quiescent current state called high
impedance mode. When in high impedance mode, the converter is off and the battery FET and BGATE
are on. The load on SYS is supplied by the battery. BGATE is low (external FET turned on) while in high
impedance mode.
30
bq24260
bq24261, bq24262
www.ti.com
NAME
READ/WRITE
B7(MSB)
VBREG5
Read/Write
FUNCTION
B6
VBREG4
Read/Write
B5
VBREG3
Read/Write
B4
VBREG2
Read/Write
B3
VBREG1
Read/Write
B2
VBREG0
Read/Write
B1
MOD_FREQ1
Read/Write
B0(LSB)
MOD_FREQ0
Read/Write
NAME
READ/WRITE
B7(MSB)
Vendor2
Read only
FUNCTION
B6
Vendor1
Read only
B5
Vendor0
Read only
B4
PN1
Read only
B3
PN0
Read only
B2
NA
Read only
NA
B1
NA
Read only
NA
B0(LSB)
NA
Read only
NA
31
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
NAME
READ/WRITE
B7(MSB)
ICHRG4
Read/Write
FUNCTION
B6
ICHRG3
Read/Write
B5
ICHRG2
Read/Write
B4
ICHRG1
Read/Write
B3
ICHRG0
Read/Write
B2
ITERM2
Read/Write
B1
ITERM1
Read/Write
B0(LSB)
ITERM0
Read/Write
32
bq24260
bq24261, bq24262
www.ti.com
BIT
NAME
READ/WRITE
B7(MSB)
MINSYS_STATUS
Read only
FUNCTION
B6
VINDPM_STATUS
Read only
B5
LOW_CHG
Read/Write
B4
D+/D EN
Read/Write
B3
CD_STATUS
Read Only
0 CD low, IC enabled
1 CD high, IC disabled
B2
VINDPM2
Read/Write
B1
VINDPM1
Read/Write
B0(LSB)
VINDPM0
Read/Write
VIN-DPM voltage offset is programmable using the VINDPM_OFF bit (bit 0 of register 0x06) and default VIN-DPM
threshold is 4.2V.
LOW_CHG Bit (Low Charge Mode Enable)
The LOW_CHG bit is used to reduce the charge current to a minimum current. This feature is used by
systems where battery NTC is monitored by the host and requires a reduced charge current setting or by
systems that need a preconditioning current for low battery voltages. Write a 1 to this bit to charge at
300mA. Write a 0 to this bit to charge at the programmed charge current.
VINDPM Bits (VINDPM Threshold setting)
Use VINDPM bits to set the VINDPM regulation threshold. The VINDPM threshold is calculated using the
following equation:
indentVINDPM = VINDPM_OFF + VINDPMCODE 2% VINDPM_OFF
33
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
NAME
READ/WRITE
B7(MSB)
2XTMR_EN
Read/Write
FUNCTION
B6
TMR_1
Read/Write
B5
TMR_2
Read/Write
B4
BOOST_ILIM
Read/Write
0 500mA
1 1A (Default 1)
B3
TS_EN
Read/Write
0 TS function disabled
1 TS function enabled (default 1)
B2
TS_FAULT1
Read only
B1
TS_FAULT0
Read only
TS Fault Mode:
00 Normal, No TS fault
01 TS temp < TCOLD or TS temp > THOT(Charging suspended)
10 TCOOL > TS temp > TCOLD (Charge current reduced by half)
11 TWARM < TS temp < THOT (Charge voltage reduced by 100mV)
B0(LSB)
VINDPM_OFF
Read/Write
0 4.2V
1 10.1V
(Default 0)
34
bq24260
bq24261, bq24262
www.ti.com
PMID
SW
47 uF
1 uF
0 .033 uF
System
Load
BOOT
SYS
IN
VBUS
D+
10 uF
DGND
4 .7 uF
BGATE
DRV
BAT
VDRV
1 uF
1 uF
PGND
STAT
PACK +
TS
TEMP
V I/O
( 1 .8 V )
PSEL
USB PHY
PACK
HOST
bq 24261
INT
GPIO 1
SDA
SDA
SCL
SCL
CD
EXAMPLE VALUE
2500 mA
4.25 V
3000 mA
4.2 V
Termination Current
50 mA
35
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
PMID
SW
1 uF
System
Load
47 uF
0 .033 uF
BOOT
10 uF
SYS
IN
VBUS
D+
D-
PGND
GND
4 .7 uF
BGATE
DRV
BAT
VDRV
1 uF
1 uF
STAT
PACK +
TS
TEMP
V SYS
( 1 .8 V )
D+
DPACK -
bq 24260
INT
HOST
GPIO 1
SDA
SDA
SCL
SCL
CD
(5)
The inductor selected must have a saturation current rating greater than or equal to the calculated IPEAK. Due to
the high currents possible with the bq2426x, a thermal analysis must also be done for the inductor. Many
inductors have 40C temperature rise rating. This is the DC current that will cause a 40C temperature rise
above the ambient temperature in the inductor. For this analysis, the typical load current may be used adjusted
for the duty cycle of the load transients. For example, if the application requires a 1.5A DC load with peaks at
2.5A 20% of the time, a 40C temperature rise current must be greater than 1.7A:
ITEMPRISE = ILOAD + D (IPEAK ILOAD) = 1.5 A + 0.2 (2.5 A 1.5 A) = 1.7 A
The internal loop compensation of the bq2426x is designed to be stable with 10F to 150F of local capacitance
but requires at least 20F total capacitance on the SYS rail (10F local + 10F distributed). The capacitance on
the SYS rail can be higher than 150F if distributed amongst the rail. To reduce the output voltage ripple, a
ceramic capacitor with the capacitance between 10F and 47F is recommended for local bypass to SYS. If
greater than 100F effective capacitance is on the SYS rail, place at least 10F bypass on the BAT terminal. Pay
special attention to the DC bias characteristics of ceramic capacitors. For small case sizes, the capacitance can
be derated as high as 70% at workable voltages. All capacitances specified in this datasheet are effective
capacitance, not capacitor value.
36
bq24260
bq24261, bq24262
www.ti.com
37
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
38
www.ti.com
bq24260
bq24261, bq24262
www.ti.com
39
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bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
www.ti.com
11 Layout
11.1 Layout Guidelines
The following provides some guidelines:
Place 1F input capacitor as close to PMID terminal and PGND terminal as possible to make high frequency
current loop area as small as possible.
Connect the GND of the PMID and IN caps as close as possible.
Place 4.7F input capacitor as close to IN terminal and PGND terminal as possible to make high frequency
current loop area as small as possible.
The local bypass capacitor from SYS to GND should be connected between the SYS terminal and PGND of
the IC. The intent is to minimize the current path loop area from the SW terminal through the LC filter and
back to the PGND terminal.
Place all decoupling capacitors close to their respective IC terminal and as close as to PGND as possible. Do
not place components such that routing interrupts power stage currents. All small control signals should be
routed away from the high current paths.
The PCB should have a ground plane (return) connected directly to the return of all components through vias.
Two vias per capacitor for power-stage capacitors and one via per capacitor for small-signal components. It is
also recommended to put vias inside the PGND pads for the IC, if possible. A star ground design approach is
typically used to keep circuit block currents isolated (high-power/low-power small-signal) which reduces noisecoupling and ground-bounce issues. A single ground plane for this design gives good results.
The high-current charge paths into IN, BAT, SYS and from the SW terminals must be sized appropriately for
the maximum charge current in order to avoid voltage drops in these traces. The PGND terminals should be
connected to the ground plane to return current through the internal low-side FET.
For high-current applications, the balls for the power paths should be connected to as much copper in the
board as possible. This allows better thermal performance as the board pulls heat away from the IC.
PMID
PMID and IN
Cap Gnds
Close together
PGND
IN Cap
Close to
IN Pin
SW
BOOT
Thermal
SYS Cap
Close to
Vias connect
To PGND
SYS Pins
BAT Cap
Close to
BAT Pins
40
bq24260
bq24261, bq24262
www.ti.com
SW
PMID
PMID and IN
Cap Gnds
BOOT
Close together
SYS Cap
IN Cap
Close to
Close to
SYS Pins
IN Pin
BAT Cap
Thermal
Close to
Vias connect
BAT Pins
To GND
41
bq24260
bq24261, bq24262
SLUSBU4B DECEMBER 2013 REVISED MARCH 2014
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Switchmode
Li-Ion
Battery
Charger
Evaluation
Module,
PRODUCT FOLDER
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
bq24260
Click here
Click here
Click here
Click here
Click here
bq24261
Click here
Click here
Click here
Click here
Click here
bq24262
Click here
Click here
Click here
Click here
Click here
12.3 Trademarks
All trademarks are the property of their respective owners.
12.5 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms and definitions.
42
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bq24261, bq24262
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43
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3-Jul-2014
PACKAGING INFORMATION
Orderable Device
Status
(1)
Eco Plan
Lead/Ball Finish
(2)
(6)
(3)
Op Temp (C)
Device Marking
(4/5)
BQ24260RGER
ACTIVE
VQFN
RGE
24
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ
24260
BQ24260RGET
ACTIVE
VQFN
RGE
24
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ
24260
BQ24260YFFR
ACTIVE
DSBGA
YFF
36
3000
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24260
BQ24260YFFT
ACTIVE
DSBGA
YFF
36
250
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24260
BQ24261RGER
ACTIVE
VQFN
RGE
24
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ
24261
BQ24261RGET
ACTIVE
VQFN
RGE
24
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ
24261
BQ24261YFFR
ACTIVE
DSBGA
YFF
36
3000
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24261
BQ24261YFFT
ACTIVE
DSBGA
YFF
36
250
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24261
BQ24262RGER
ACTIVE
VQFN
RGE
24
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ
24262
BQ24262RGET
ACTIVE
VQFN
RGE
24
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ
24262
BQ24262YFFR
ACTIVE
DSBGA
YFF
36
3000
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24262
BQ24262YFFT
ACTIVE
DSBGA
YFF
36
250
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24262
(1)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Addendum-Page 1
Samples
www.ti.com
3-Jul-2014
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
18-Aug-2014
Device
BQ24260RGER
RGE
24
BQ24260RGET
VQFN
RGE
BQ24260YFFR
DSBGA
YFF
BQ24260YFFT
DSBGA
BQ24261RGER
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
3000
330.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
24
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
36
3000
180.0
8.4
2.54
2.54
0.76
4.0
8.0
Q1
YFF
36
250
180.0
8.4
2.54
2.54
0.76
4.0
8.0
Q1
VQFN
RGE
24
3000
330.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
BQ24261RGET
VQFN
RGE
24
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
BQ24261YFFR
DSBGA
YFF
36
3000
180.0
8.4
2.54
2.54
0.76
4.0
8.0
Q1
BQ24261YFFT
DSBGA
YFF
36
250
180.0
8.4
2.54
2.54
0.76
4.0
8.0
Q1
BQ24262RGER
VQFN
RGE
24
3000
330.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
BQ24262RGET
VQFN
RGE
24
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
BQ24262YFFR
DSBGA
YFF
36
3000
180.0
8.4
2.54
2.54
0.76
4.0
8.0
Q1
BQ24262YFFT
DSBGA
YFF
36
250
180.0
8.4
2.54
2.54
0.76
4.0
8.0
Q1
Pack Materials-Page 1
18-Aug-2014
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
BQ24260RGER
VQFN
RGE
24
3000
367.0
367.0
35.0
BQ24260RGET
VQFN
RGE
24
250
210.0
185.0
35.0
BQ24260YFFR
DSBGA
YFF
36
3000
182.0
182.0
17.0
BQ24260YFFT
DSBGA
YFF
36
250
182.0
182.0
17.0
BQ24261RGER
VQFN
RGE
24
3000
367.0
367.0
35.0
BQ24261RGET
VQFN
RGE
24
250
210.0
185.0
35.0
BQ24261YFFR
DSBGA
YFF
36
3000
182.0
182.0
17.0
BQ24261YFFT
DSBGA
YFF
36
250
182.0
182.0
17.0
BQ24262RGER
VQFN
RGE
24
3000
367.0
367.0
35.0
BQ24262RGET
VQFN
RGE
24
250
210.0
185.0
35.0
BQ24262YFFR
DSBGA
YFF
36
3000
182.0
182.0
17.0
BQ24262YFFT
DSBGA
YFF
36
250
182.0
182.0
17.0
Pack Materials-Page 2
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