Ix Transistor Circuits
Ix Transistor Circuits
Ix Transistor Circuits
TRANSISTOR CIRCUITS
Prof. H. J. Zimmermann
Prof. R. B. Adler
Prof. S. J. Mason
A.
VOLTAGE-REGULATED
J. Blair
J. B. Cruz
J. Gross
C. R. Hurtig
POWER SUPPLIES
C. T. Kerk
R. B. Martindale
R. F. Meyer
The quiescent
is obtained by use of the breakdown voltage of silicon diode D3 and the 5. 6K resistor
connected to the base lead of the silicon transistor.
The capacitor from the collector
to the emitter of the 1859 transistor suppresses high-frequency oscillations.
The fre-
quency response of the voltage regulator is essentially flat up to 10, 000 cps.
The voltage-regulation characteristic
Table IX-1.
given in
is negligible.
IN9
..
43
.
43
9K
li5V
60-'
LOAD
Fig. IX-1.
(IX.
TRANSISTOR CIRCUITS)
Table IX-1.
Load Current
(ma)
Direct Voltage
(v)
B
(change from nominal
value of 20 v)
40
0.30
<0.001
50
34
-0.02
0.55
<0.001
100
28
-0.05
0.70
<0.001
140
23
-0.08
0.80
0.001
Voltage regulators of this same general configuration having nominal output voltages
from 3-25 volts were designed and tested.
determined by the availability of silicon diodes with low values of reverse breakdown
The upper limit of the output voltage is determined by the maximum voltage
voltage.
limited
by the maximum value of the reverse current of the diode D 3 , and the gain of the series
transistor.
The current in the diode is maximum at no-load and its value is determined
by the desired change in load current and the large signal gain of the series transistor
over this range.
Since the breakdown voltage of the reference diodes has some temperature dependence (the ones used varied by about 0. 08 per cent/C), the output voltage will have at
least an equal temperature dependence.
pensation by means of thermistors,
employed.
may be
temperature coefficients.
C. T. Kerk
B.
A MICROSCOPIC INTERPRETATION
TRANSISTORS
In amplifiers of the vacuum-tube variety, it is usually possible to understand the
process of power gain by tracing particles and discussing their energy changes as they
move.
While this procedure is not usually the best way to achieve a quantitative des-
cription of the device, it often serves as the root of our qualitative understanding of the
gain mechanism.
In some cases, it may indeed have been the keystone of the invention
been stressed for the transistor, and to the best of our knowledge it has not even been
discussed.
(IX.
TRANSISTOR CIRCUITS)
to treat the junction transistor through a discussion of the particle energies involved (1).
We recognize first that "class A" power gain shows up inside a resistive amplifying
device as a change in the internal power dissipation.
tion process is therefore required.
relation for clouds of holes and free electrons in a semiconductor which is slightly out
of thermal equilibrium.
In notation which is now standard (2), statistical mechanics leads to the concept of
quasi-Fermi levels for holes and free electrons out of equilibrium
=
+ (kT/q) In (p/n.)
(1)
- (kT/q) In (n/n
S=
i)
The hole and free electron current densities are then given by
P = -q Lp p V p
(2)
In = -q
n V n
p, n
+q
VY - k V[T In (n/ni)]
I (s) =
q
p
d9 =
(s) -
pmin
min
(4)
s
I1n (s) = q
Fn
di = -[(s)n
- nn min
in]
min
where the zero point is taken at the position where
of particle.
-p
Vdp
qp
p
(5)
Vdn
-I
qn
n Vn
(IX.
TRANSISTOR CIRCUITS)
The assumption of small departures from equilibrium implies that organized transport
kinetic energy terms 1/2 m vd are negligible. Therefore the work done by nonequilibrium forces goes into the lattice as "conductive dissipation"
-F
cp
dp
Pq
pp
pl
(6)
In
Pnp
Vdn
Fn
qn7
n
2
inn
If we consider the hole and free electron clouds as open systems, the energy of configuration plus thermal energy of each particle can be shown to be
E
w
g
2q
/2 kT
q
(7)
w
where E
= 3/2
2q
is the energy gap, and hole and free electron masses are taken to be equal.
g + 11
Zq
p
Eg
kT
pp = 3/2 q
kT +
n 3/
=3/2
--
+ 1
(8)
We now note that the energy of a unit volume of a cloud may change by four processes:
1.
recombination of particles, 3.
convection of particles, 2.
collision of particles
The expression of the total energy balance of the clouds per unit
ticle concentration.
p)
-V.
p)-
qr(np-
n p)p
+ I
Vp
+ qp
p
0)n
n) - qr(np - n
(In
q a (n
Vn
n + qn
(9)
at
at
If Eqs. 9 are expanded fully, they become nothing but the continuity equations for the
flow of holes and free electrons.
--
p at
p p
qr(
qr(np-
np
yields
PVp
0
(10)
=v. (
n) - [qr(np - noPo)
+ n
V n]
(IX.
TRANSISTOR
CIRCUITS)
The term in brackets, as we have seen, is the total dissipation per unit volume, and
the divergence term represents convection of energy into the volume. Thus the left
sides are interpreted as the rate of increase of stored (recoverable) energy per unit
volume.
If we treat the temperature T and the gap E
nonequilibrium potentials HI,
on, we may write Eqs.
p
n
=
=
' +I
' +
8 as
(11)
1n
p and
The equations
involving IH have been checked for dissipation in an idealized transistor under quiescent
conditions, and as a low-frequency amplifier. In both cases the dissipation checks with
and in connection
Blair
References
1.
See J. Blair, Theory of power gain in junction transistors, S. M. Thesis, Department of Electrical Engineering, M. I. T., Sept. 1, 1955, for further details.
2.