High Precision Current Transducers

High Precision Current

Transducers Catalogue

Current Transducers for High Precision applications

LEM solutions for High Precision current measurement

IT Current Transducers:
Setting the benchmark for accurate current measurement
This catalog summarizes the most common LEM
product offerings for highly-accurate electrical current
measurements for industrial and laboratory applications.
It is LEMs business to provide you with both standard
and customized products and solutions optimized to your
specific needs and requirements.
Certain power-electronics applications require such high
performance in accuracy, drift and/or response time that
is necessary to switch to other technologies to achieve
these goals. The validation of customer equipment is made
through recognized laboratories using high-performance
test benches supported by high-technology equipment
including extremely accurate current transducers. These
transducers are still in need today for such traditional
applications but are more and more in demand in
high-performance industrial applications, specifically
medical equipment (scanners, MRI, etc.), precision motor
controllers, and metering or accessories for measuring
and test equipment. LEM has been the leader for years
in producing transducers with high performance and
competitive costs for these markets. The 2009 acquisition
of the Danish company, Danfysik ACP A/S, as being the
worlds leader in the development and manufacturing of
very-high precision current transducers reinforces this
position.

To achieve this challenging target of accuracy and

performance, LEMs IT current transducers do not use
the Hall Effect but are based upon Flux-gate technology,
an established and proven technology we have used for
many years and is already the heart of several current and
voltage transducer families. Today, LEM uses different
versions of Flux-gate technologies, each providing
different levels of performance and cost to match the
customers requirements and needs. For the IT family,
closed-loop Flux-gate is used as the most efficient
and cost effective. Thanks to this technology, we can
speak about accuracies in the parts per million (PPMs)
of the nominal magnitude and is representative of the
performance achieved.
The high-accuracy product range covers transducers for
nominal current measurements from 12.5 A to 24 kA while
providing overall accuracies at ambient temperatures
(25C) of only a few PPM. Thermal offset drifts are
extremely low from only 0.1 to 6.7 PPM/K (per Kelvin).
Models from 12.5 to 60 A nominal can be used for PCBmounting, whereas models from 60 A to 24 kA are
intended for panel and/or rack-mounting with either onboard or separate electronics. In addition, the Flux-gate
technologies used provide Galvanic isolation for current
measurements of all types of waveforms including AC, DC,
mixed signal or complex waveform.

Content
Most of the IT transducers feature a round aperture
which can accommodate primary conductors of various
diameters according to the model used (except the ITN
12-P which uses an integrated primary conductor). In
addition to their normal current or voltage outputs, these
models offer an output indicating the transducer state
(operational status) via normally-open or closed contacts
and an external LED (except the ITN 12-P and ITL 4000S models). ITZ models provide even more features with
additional outputs indicating if the measured current is
extremely low or high, or if the transducer is in overload,
with each of these conditions being supported by a
dedicated LED.
The ITB 300-S and ITL 4000-S operate in extended
temperature ranges from -40 to 85C and -40 to 70C
respectively versus the other models of their families,
allowing their use in broader applications. Although the
ITB uses the same technology as the other IT current
transducers, it is positioned at a lower price while still
offering a level of performance just slightly lower than the
other models of the family.
These products are all equipped with an electrostatic
shield built inside the case to ensure their best immunity
against external interference. A shielded output cable and
plug are advised to ensure the maximum immunity. IT
models react very quickly to sudden changes in primary
current thanks to their secondary windings working as
an excellent current transformer. This feature allows wide
bandwidths (up to 800 kHz @ -3dB).
These transducers are all CE compliant and also conform
to EN 61010-1 for safety requirements. LEM has ISO 9000
and ISO TS-16949 qualifications globally (ISO 9001:2008
at the Copenhagen, Denmark production and design
center) and offers a five (5) year warranty on all of our
products. We constantly strive to innovate and improve
the performance, cost and size of our products. LEM is
a world-wide company with sales offices across the globe
and production facilities in Europe (including Russia) and
Asia.
We hope you will find this catalog a useful guide for the
selection of our products. Visit our Web site at www.lem.
com or contact our sales team for further assistance.
Detailed data sheets and application notes are available
upon request.
Hans Dieter Huber

Franois Gabella

Vice President Industry

President & CEO LEM

Introduction & content

IT - Fluxgate Technology Principle

Pages
2-3
4-7

Application:
Precision motion control
for photolithographic scanning steppers

8-9

Magnetic Resonance Imaging

10 - 13

Test & Measurement

14 - 17

Products:
Current transducers, 12.5... 1000 A

18 - 19

Current transducers, 80... 4000 A

20 - 21

Current transducers, 40 ... 24000 A

ITZ series

22 - 23

Product Coding

24

LEMs Warranty

25

Selection Guide

26 - 29

LEM International Sales Representatives

30

About Products:
ITN 12-P model

18

ITB 300-S model

18

IT 60...1000-S Series

19

IT 700-SB model

19

IT 700-SPR model

20

ITN 600...900-S Series

20

ITL 900...4000 Series

21

ITZ 600...24000 Series

22 - 23

LEM - At the heart of power electronics.

IT Fluxgate Technology Principle

IT - Fluxgate Technology Principle

For accurate measurement of DC currents, the
methods used since the beginning of the 20th
century consist in compensating the current
linkage P created by the current IP to be
measured by an opposing current linkage S
created by a current IS flowing through a known
number of turns NS, to obtain (fig. 1):
P - S=0
orNPIP-NSIS=0
NP: Number of primary turns
NS: Number of secondary turns
To obtain an accurate measurement, it is
necessary to have a highly accurate device to
measure the condition = 0 precisely. The aim is
to obtain a current transducer with the following
characteristics:

Operation principle
To achieve really accurate compensation of the
two opposing current linkages (P, S), a detector
capable of accurately measuring = 0 must be
available, which means that the detector must
be very sensitive to small values of a residual
magnetic flux c (created by the current linkage )
in order to achieve the greatest possible detector
output signal.
Fluxgate detectors rely on the property of
many magnetic materials to exhibit a non-linear
relationship between the magnetic field strength H
and the flux density B.
The hysteresis cycles of the magnetic cores have
a form comparable to the one represented in fig.2
(more or less square according to the type of
material used).

P
IP
NP

Flux
sensor

NS

Fig 1. ITxx Fluxgate Technology Principle

Excellent linearity
Outstanding long-term stability
Low residual noise
High frequency response
High reliability

Current
source

Fig 2. Hysteresis cycles of the magnetic cores

Observing B = f(H) on the magnetization curve,

notice that for a given field strength H1 a flux
density variation nB1 corresponds to nH1. But,
also observe that further along the cycle, for
another given field strength H2, for the same
variation nB2 = nB1, the nH2 variation must be
much greater.
The detection of the zero flux condition (c = 0) is
based on this phenomenon.

If the primary current IP = 0, the compensation

current IS will be equal to 0. When IP varies,
the flux varies. Therefore, we detect an error
^
^
| +V | - | -V | which controls the power amplifier to
supply a compensation current IS until c=0, thus:

When a DC current flows through the aperture of

the core, the curve of the hysteresis cycle is then
shifted causing asymmetry of the current produced
by the square wave voltage (fig. 3c) and leading to
a measured voltage at the terminals of the resistor
^
^
where | +V | >| -V | . By using peak detection to
^
^
measure +V and -V and by comparing the two
peak values, the deviation of the flux in the core is
thus detected. As soon as the flux c is not zero, an
^
^
error voltage | +V | - | -V | is supplied to a power
amplifier that drives a current into a compensation
^
^
winding until c=0, thus | +V | = | -V | .

NSIS=NPIP
The current IS flows through a measuring resistor,
transforming the current into a proportional
voltage.

- +

1/f

a)
0

power
amplifier

IS

b)
^

+V
0

Flux
detector

output
amplifier

-V

output
c)
0

Fig 3. Square wave voltage (3a); Current created (3b); Asymmetry of

the created current (3c)

IP

standard
resistor

Fig 4. Simplified base circuit for DC current compensation

IT Fluxgate Technology Principle

Fig. 4 shows a very simplified base circuit for the

compensation of a DC current.

When applying a square wave voltage (fig.3a) to a

saturable inductor until its magnetic core starts to
saturate, a current (fig.3b) is created. This current
flowing through a measuring resistor will provide
a symmetric voltage relative to zero with peak
^
^
values +V = -V .

IT Fluxgate Technology Principle

The accuracy of the measurement will not only

depend on the accuracy of the measuring resistor
but also strongly on the sensitivity of the flux
detector. However, in spite of the DC measurement
function accuracy, there are some drawbacks to
this DC measurement system (fig.5):

We recommend only applying primary current

to the transducer after powering up the current
transducer. Failing to do so will result in oscillation
on the output, and a delayed lock-on to the
primary current. It will further more result in an
additional offset.

As the winding D of the flux detector is coupled

with the compensation winding S, the applied
square wave voltage is re-injected into the
compensation winding and creates a parasitic
current in the measurement resistor.

The magnetic part of the transducer is realized as

schematically represented in fig.6:

However, the square wave voltage induced in the

S winding by this flux may be practically cancelled
out when a second D winding is mounted on a
second detector core (identical to D) inside the
compensation winding S. The residual flux (the
sum of the opposed fluxes in D and D) will create
very small voltage peaks that cause the remaining
signal correlated with the fluxgate excitation
(fig.5and6).

A fourth winding W is wound before the

compensation winding S on the main core to
extend the frequency range of the transformer
effect to lower frequencies. It is connected to
a circuit that adds some voltage via the power
amplifier to compensate the too small induced
voltage in a frequency range too high for the
fluxgate detector.
The diagram of the compensation loop is
shown in fig.7.

Nested
cores

IS

Hollow
core

D
D

S
D'

IP

Fig 5. Solution against voltage peaks re-injection

If the application does not need a large

bandwidth, the systems cut-off frequency can be
designed to be lower than the excitation frequency
of the fluxgates. LEM offers transducers that allow
a synchronization of the fluxgate excitation with a
user supplied clock to provide a workaround.

Fig 6. The various windings used and their arrangements

IP

Fluxgate

Regulator

IS

Zs

Zm = Main inductance
Zs = Secondary inductance
Fig 7. Compensation loop diagram

The simplified overall diagram is shown in fig. 8 and can be directly deduced from the diagram, fig. 7. The saturation
detector is activated when the output voltage exceeds its specified range.

ITL 4000 model does not integrate W winding and uses a lower oscillation frequency for the fluxgate excitation.
The design of the measuring head is simplified in comparison with the other ITxx models.
Fig 8. ITxx operation principle: simplified overall diagram

Fluxgate
Excitation
Saturation
Detector

S
D

Signal
Conditioning

S
W

IS

Power
Amplifier

IP

Measuring
Resistor

IT Fluxgate Technology Principle

Zm

Application

Precision motion control for

photolithographic scanning steppers
Semiconductor manufacturing relies on complex
photolithographic processes, to image and create the
nanoscale structures that form the integrated circuit
components on the chip. The basics are to a large
extent comparable to a standard photographic process,
wherein an illuminated object is imaged onto a lightsensitive surface such as a film emulsion or a CCD
array through the use of a lens. Speaking in terms of
wafer illumination, the object is a mask containing a
(large-scale) geometrical model of the structure to be
formed and the film/CCD is a silicon wafer with a socalled photoresist spun onto its surface. Illumination is
not made by visible light, but by use of deep UV (ultraviolet) light-sources like an excimer laser operating
at 193nm. The use of a very short wavelength is
crucial since the resolution of the process is directly
proportional to the wavelength so by using a shorter
wavelength for the illumination, smaller geometries can
be created and in the end a higher integration level
(transistors/area) can be achieved.

The kind of machinery that illuminates a wafer by

shining UV light through a photomask is called a
wafer stepper. The term stepper stems from the
fact that the machine steps the wafer through a series
of positions in order to produce a number of dies
(identical circuits or chips) on each wafer. When
illuminating one specific die, mask, wafer and lightsource are kept stationary relative to each other (fig. 1).
Because the full die is exposed in one process during
each step, aberrations (imaging flaws) in the optics
sets an upper limit to the die area and to the achievable
detail of geometry. To overcome this, the method of
scan-stepping the photomask pattern onto the die
has been developed. Using this method each die is
exposed in a process where mask and wafer are moved
opposite each other during the illumination. In this way,
the photomask pattern effectively sweeps the wafer
only by use of the center portion of the lens system and
a relatively large area can be covered, yet keeping the
beam at the center of the optics to keep resolution and
detail at max (fig. 2).

Fig 1. The basic principle of photolithography.

Light source

Photomask

Imaging (focusing) lens

Wafer

X - Y Stepping fixture

Application
Light source

Photomask
X - Y scanning
fixture 1
Imaging (focusing) lens
Wafer
X - Y scanning
fixture 2
X - Y Stepping fixture

Fig 2. The photolithographic scanning stepper.

Since the core technique in the scanning stepper is

to move object and film while exposing, and still
hoping to reproduce nanometer scale geometries,
it seems evident that position and motion control
is vital in this scheme. Positioning is split over two
mechanisms: stepping positioning, wherein the
wafer is positioned to a specific die position, and the
challenging scanning positioning, where the scanning
positioning mechanism controls movement of wafer
and photomask in opposite directions.
The scanning positioning mechanism has limited travel
(on the order of 10-20mm) and is typically laid out
using a linear (voice coil) actuator. Motion control
of this kind of mechanism can be implemented by
measuring the drive current in the actuating coil;
however, since it is of highest importance that nearperfect synchronization between the two movements
is achieved, a high precision current measurement with
extremely high differential linearity is crucial. Ultra-

high precision DC Current Transducers like the PCB

mount LEM ITN 12-P offers the required precision and
differential linearity for use in this type of application.
The only valid alternative offering the same level of
linearity is a simple shunt resistor, but since the drive
currents typically are several amperes (5-15A) this
method is on the edge in terms of power loss and
consequential temperature induced drift. Furthermore,
the output from a shunt resistor intrinsically carries a
common-mode contribution this is not present using
a DCCT where primary and secondary are galvanically
isolated.
In conclusion, despite the higher cost of an ultrahigh precision DCCT, the advantages offered by this
technology outperforms the simpler alternative of a
shunt resistor for applications in scanning steppers for
semiconductor manufacturing.

Application

Fluxgate current sensors sharpen MRI images

MRI magnetic resonance imaging is a powerful
medical technology that has revolutionised diagnosis
of a very wide range of illnesses and injuries, greatly
reducing or in many cases eliminating the need for
exploratory surgery. It provides medical practitioners
with two- and three-dimensional images, as well as
high-accuracy cross-section, of internal structures and
organs within a patients body.
Underpinning the results achieved by MRI scanning
is a wide range of advanced technologies, including
precision measurement techniques: the almost
unbelievable sharpness of the pictures that MRI
produces depends directly on measurements of basic
electrical parameters.
MRI frequently sits alongside and in some ways is
complementary to CT (computer tomography). CT
scans are based on X-rays and are best at imaging
high-density structures (such as bones), whereas MRI
scanning reveals the details of soft-tissue structures.
The working principle of MRI is based on nuclear
magnetic resonance. In fact, what MRI actually detects
is the magnetic resonance of the protons of hydrogen
atoms contained in the water within the human
body: water represents up to 70% of body weight.
In more exact terms, MRI observes the response of
the hydrogen nuclei exposed to excitation by both
magnetic and electromagnetic fields.
The collected energy per volume element (voxel)
depends on the water distribution in the place under
analysis. So MRI can provide a three-dimensional
image of the water distribution inside the human
body. As each type of body tissue has a characteristic
proportion of water within it, it becomes possible to
image those tissues, and any deterioration, by looking
at changes in water distribution.

Working principle of the nuclear magnetic

resonance (NMR):
The nuclei of atoms have the property of behaving
like magnetic dipoles or magnets when excited by a
magnetic field (fig. 3). Nuclei of atoms have a spin (or
magnetic moment) which we conventionally represent
by a vector along the rotation axis.
Fig 3. Atomic nuclei of atoms have a magnetic moment, represented a
vector quantity with its direction along the rotation axis.

In the absence of any external influence, this tiny

magnet is not oriented in any particular direction. As
soon as this magnet is illuminated by a constant and
homogeneous static magnetic field (referred to as Ho)
it aligns with Ho in two directions: parallel and antiparallel to the field. The nuclear magnetic moment is
tiny and requires an intense applied field to achieve
the alignment; the related magnetic induction Bo is
commonly between 0.2 and 3 Tesla. In the following
necessarily, simplified explanation, only the parallel
alignment is considered.

Without Ho:
Random orientation of the magnetic moments
Anti-parallel

Ho
Parallel

With Ho:
The magnetic moments line up with Ho
Fig 4. With a DC magnetic field H0 between 0.2 and 3 [T], the spins
are in line with the field.

Fig 5. At any instant, the spin axis is not aligned with the applied field but
due to its precession the average x and y components cancel out

Z
Ho
Electro magnet
superconductor

10

Magnetization Mo due to nuclei

Mz = Mo, mean Mx,y = 0

Application
The alignment process is more subtle than a simple
setting of the spin axis along the field lines. If we take
the z-axis (see fig. 5) as parallel to the applied field,
the spin precesses or rotates around the z axis along
a cone at angular speed 0 . The related frequency is
called the Larmor frequency

During the application of H1, the spin axes of the nuclei

are no longer aligned with H 0 (z axis) but move into the
x-y plane. After the H1 excitation is turned off, the spin
axes once again align with H0, and the extra energy
they gained from the H1 excitation radiates away in the
form of a damped electromagnetic wave (also known as
relaxation). An antenna detects damped wave, yielding
an induced voltage called Free Induction Decay (FID).

The precession speed is therefore proportional to the

static magnetic field; for example, a field of B 0 =1Tesla
gives a frequency f0 = 42.5 MHz .

It is the FID signal that the MRIs computer processes

to a 3D or section image.

Applying the magnetic fields

Resonance of the nuclei

The Static magnetic field H 0, as previously noted,

must be very intense, with very high stability and
homogeneity within the volume inside the aperture of
the MRI scanner, where the patient lies.

In order to observe the resonance of the nuclei, some

energy has to be provided allowing nuclei to move
from steady state to excited one. This is achieved by
applying a high frequency magnetic field H1. When
the frequency of H1 equals the Larmor frequency,
resonance occurs and the nuclei move to a higher
energy state.

H1
Ho
Y

M, Mz = 0

Exciting antenna

Fig 6. An excitation antenna excites the nuclei with a frequency

matched to the Larmour frequency

Fig 7. Atomic nuclei radiate energy as they re-align with the static
magnetic field, allowing their distribution to be mapped.

Induced
voltage (FID)

Z
Damped wave

M
Ho
Y

X
Picking up antenna

11

Application
Most of todays MRIs generate the static field by
means of a superconducting magnet located around
the cylinder of the scanner. The coils of the magnet are
made up of niobium-titanium (NbTi) wires immersed in
liquid Helium at a temperature of 4K.

In fact, 3 pairs of gradient coils are located around the

cylinder of the MRI apparatus to create 3 orthogonal
magnetic fields. So, it is possible to adjust the magnetic
field at any point in the volume of the cylinder. Gradient
amplifiers operating in a closed servo-type loop drive
the currents in the gradient coils (fig. 9). Each MRI
therefore needs three such current control loops.

The Gradient coils superimpose a magnetic gradient

to H 0 in order to provide a spatial coding of the image.
Imaging takes place only in just one plane or slice at a
time, and to ensure that signals are received only from
nuclei in that plane, only those nuclei have to be pushed
to resonance.

As can be seen from the principle of MRI outlined

above, the quality, the clarity and resolution of the
images are directly linked to those of the magnetic field
applied, and therefore to those of the current injected
into the gradient coils. One of the key elements in
the current control loop is the global accuracy of the
current transducer.

The appearance of the resonance is strongly dependent

on the value of the magnetic field H 0 : the gradient coils
superimpose a magnetic field to ensure that the final
magnetic field is exactly equal to H 0 only in the plane of
interest.

In particular, the following parameters of the current

transducer are critical :

How the gradient coils work

To create a gradient along an axis, a pair of coils
is needed. In each pair, currents flow in opposite
directions (the principle is shown in fig. 8).

Superimposed H onto H0

I
Fig 8. Gradient coils add to the static field at one end and diminish it at
the other, controlling the plane in which the total field has exactly
the correct value.

12

Application
As well as precise current control in gradient amplifiers
for medical imaging, the ITL 900 is equally applicable
to measuring feedback in precision current regulated
power supplies, current measurement for power
analysis, calibration equipment for test benches, and
laboratory and metrology equipment which also require
high accuracy.

Extremely low non linearity error (< 3 ppm of

measuring range)
Very low random noise (low frequency noise from
0.1Hz to 1kHz)
Very low offset and sensitivity drifts over temperature
range (<0.3 ppm/K)
Very high stability of offset versus time (one reason
for this is the duration of MRI scans, some of which
may last several tens of minutes)

In its present form, the technology is limited to a

relatively narrow operating temperature (typically
+10 C to +50 C). However, LEM is confident that the
technology can be developed further and that the ITL
900 transducer could prove to be as significant for the
future of MRI scanning as the Hall Effect transducers
were for its introduction. As with Hall Effect itself, with
its leading edge performance ITL900 could possibly
enable any number of future applications.

Measuring range (around 1000 A peak)

Bandwidth (3dB point of 200 kHz)
To reach these performance levels, Hall Effect current
transducers which were used in previous generations
of MRI scanners are no longer adequate. The solution
developed by LEM, primarily for this application area,
has similarities to the Hall Effect technique but offers
significant advantages. It is described as a double
fluxgate closed loop transducer and identified as
type ITL 900. Although fluxgate technology has been
available for some time, LEM was able to take this
technology and adapt and improve it.

Target I

Gradient
Amplifier

One pair of
Gradient coil

High accurate
current transducer

Fig 9. Feedback from output current transducers is fundamental to obtaining the required
degree of precision from the gradient current amplifier

13

Application

LEM High Precision Current Transducers

for the Test & Measurement Market
General Overview
The world has to become more efficient and power
electronics have played a crucial part to reach this
goal. Hybrid- and electric vehicles, wind turbines and
solar systems, industrial inverters and motors of higher
efficiency. All these components must be optimized
according their losses. Efficiency measurement for
power electronics and drives components needs a
power measurement system of highest accuracy.
During the past 10 years the LEM IT and ULTRASTAB
high precision current transducers became the
standard for current range extension in power analysis
and efficiency calculation.

2) Phase error
How long is the time (phase shift) between the sampling
of voltage u (t) and current i (t)
Voltages up to 1000 V can be measured with a power
meter directly. For current signals above some amps
associated current transducers of highest precision are
needed.
The influence of a phase error caused by an instrument
or transducer increases with the decreasing of the
power factor. Figure 12 shows this problem. At power
factor 1 there is no phase shift between voltage

Fig 11. Power signal (blue) calculated from u (t) (yellow) and i (t) (green)

Fig 10. Six channel power measurement at KEB inverter

Demands on a Power Measurement System

Active electric power is defined in the following formula:
P = 1/T

p (t) dt with p (t) = u (t) i (t)

The multiplication of voltage and current integrated

over one signal period gives you active power. Besides
a precise synchronization on the fundamental signal
period the power accuracy depends on two items:
1) Amplitude error
How precise is voltage u (t) and current i (t) measured

14

and current and even an additional phase shift of 1

caused by a current transducer would result in a small
power error of 0.2 %. At power factor 0.1 the phase
shift between voltage and current is already 84. An
additional transducer phase error of 1 would lead to a
huge power error of 17.4 %.
Fig 12. Influence of power factor

Application
Problem of Differential Measurement
and high Efficiencies

Optimum Current Transducer for Power

Measurement

The biggest problem in efficiency calculation is that

losses cannot be measured directly with a high enough
accuracy. The most precise power meters offer a basic
accuracy of 0.02 to 0.1 %. The problem is that the
losses cannot be measured directly but only inputand output power. The losses must be calculated from
both power values. In the worst case the errors of both
measurements are opposite. This problem increases
with the efficiency of the load. Electric drives have an
efficiency of around 95 %, inverters even up to 99 %.
Only instruments and current transducers of highest
precision are able to deliver reliable results.

LEM IT ULTRASTAB current transducers combine all

the requirements for a power measurement current
transducer. Offset and linearity are in the ppm range.
1 ppm is equal to 0.0001 %. Since the offset is so
small one transducer can be used from a few A up to
the kA-range. The transducers measure from DC up to
several kHz large signals and some hundred kHz small
signal bandwidths. The phase error of all transducer
types is far below 1 minute which is 1/60 degree. The
transducer is galvanically isolated. The analysis of
medium voltage inverters and drives is fully sustainable.
Due to the galvanic isolation there is no common mode
signal which influences the result.

Fig 13. Deviations of input- and output power measured with a power
system of 0.1 % accuracy. Result: Total power error of 0.195 W
(worst case) compared to actual losses of 5 W is equal to an
error of 3.9 % for the losses

Fig 14. Calibration protocol of a 2000 A transducer. Even at low range

of 50 A the accuracy is better than 0.005 % and the phase
error below 0.05 min.

15

Application
Special Solutions for Power Analyzers

Applications

Most power measurement applications are 3-, 4- or

even six channel applications. For an easy installation,
wiring and use of our transducers we provide complete
multi channel solutions including power supply
and transducer connection cables. Thus a power
measurement setup consisting of power meter and
transducers is done within minutes.

You can find our current transducers everywhere where

inverters or drives need to be developed or tested.
The ITZ 2000 and ITZ 5000 range of products are
normally used for final test of large low voltage and
medium voltage motors and generators. Even if the
machine is a pure 50 or 60 Hz drive our transducers
are a very economic way to measure. Other current
sensor technologies demand to switch between
different sensors to cover the entire current range. This
increases the price of the test system remarkably. The
large ITZ transducers for 2 kA and 5 kA are used for
development of wind generators and solar inverters.

Fig 15. LEM multi channel system

Fig 16. Electric vehicle

16

Application
Fig 17. Wind turbine, solar panel

The IT transducer family can be used from 60 A to

1000 A for development and test of lower current
applications such as small solar inverters, small and
medium motors and industrial inverters and power
electronics components for automotive applications.

Most of the transducers are used for power and signal

analysis but since this technology is so precise some
of the transducers are used in calibration labs for DC
and AC current calibration.

Fig 18. Calibration lab

17

Product specification

ITN 12-P
Nominal current DC

12.5 A

Nominal current RMS

8.8 A

Power Supply

15 V

Output

50 mA / 12.5 A

Frequency (Bandwidth) (3 dB)

DC 500 kHz*

Size (mm)

66 x 64 x 44.5

Operating temperature range

+10 +45 C

Mounting

Printed Circuit Board

Construction

Onboard Electronics
Metal Housing

Primary conductor integrated

*small signal 0.5% of IPN (DC)

Packaging: n 1

ITB 300-S
Nominal current DC

300 A

Nominal current RMS

300 A

Power Supply

15 V

Output

150 mA / 300 A

Frequency (Bandwidth) (3 dB)

DC 100 kHz*

Size (mm)

113 x 92.5 x 64

Operating temperature range

Left view

-40 +85 C

Mounting
Construction

Front view

Panel
Onboard Electronics
Electrostatic shield

4)

Aperture 21.5 mm for primary conductor crossing

*small signal 0.5% of IPN (DC)

Top view

18

Packaging: n 2

Product specification

IT 60-S, IT 200-S, IT 400-S

Nominal current DC

60 A
200 A
400 A

Nominal current RMS

42 A
141 A
282 A

Power Supply

15 V

Output

100 mA / 60 A
200 mA / 200 A
200 mA / 400 A

Frequency (Bandwidth) (3 dB)

DC 800 kHz*
DC 500 kHz*
DC 500 kHz*

Size (mm)

93 x 77 x 47

Operating temperature range

+10 +50 C

Mounting
Construction

Panel
Onboard Electronics
Electrostatic shield

Aperture 26 mm for primary conductor crossing

*small signal 0.5% of IPN (DC)

Packaging: n 3

IT 700-S, IT 700-SB, IT 1000-S/SP1

700 A
700A
1000 A
495 A
495 A
707 A

Nominal current DC

Nominal current RMS

Power Supply

15 V
400 mA / 700 A
10V / 700 A
1 A / 1000 A
DC 100 kHz*
DC 100 kHz*
DC 500 kHz
128 x 106 x 67
128 x 106 x 67
128 x 106 x 85

Output

Frequency (Bandwidth) (3 dB)

Size (mm)
Operating temperature range

+10 +50 C

Mounting
Construction

Panel
Onboard Electronics
Electrostatic shield

Aperture 30 mm for primary conductor crossing

*small signal 0.5% of IPN (DC)

Packaging: n 4

19

Product specification

IT 700-SPR
Nominal current DC

700 A

Nominal current RMS

495 A

Power Supply

15 V

Output

400 mA / 700 A

Frequency (Bandwidth) (3 dB)

DC 100 kHz*

Size (mm)

128 x 106 x 67

Operating temperature range

+10 +50 C

Mounting
Construction

Panel
Onboard Electronics
Electrostatic shield

Aperture 30 mm for primary conductor crossing

*small signal 0.5% of IPN (DC)
Programmable from 80A in steps of 10A

Packaging: n 5

ITN 600-S, ITN 900-S

Nominal current DC

600 A
900 A

Nominal current RMS

424 A
636 A

Power Supply

15 V

Output

400 mA / 600 A
600 mA / 900 A

Frequency (Bandwidth) (3 dB)

DC 300 kHz*

Size (mm)

128 x 106 x 67

Operating temperature range

+10 +50 C

Mounting
Construction

Panel
Onboard Electronics
Electrostatic shield

Aperture 30 mm for primary conductor crossing

*small signal 0.5% of IPN (DC)

Packaging: n 6

20

ITL 900-T
400 A
To limit heating on primary
integrated busbar

Nominal current RMS

400 A

Power Supply

15 V

Output

600 mA / 900 A

Frequency (Bandwidth) (3 dB)

DC 200 kHz*

Size (mm)
Operating temperature range

160.52 x 106.84 x 66.75

+10 +50 C

Mounting
Construction

Product specification

Nominal current DC

Panel
Onboard Electronics
Electrostatic shield

Primary busbar integrated (conductor)

*small signal 32 A RMS

Packaging: n 7

ITL 4000-S
Nominal current DC

4000 A

Nominal current RMS

4000 A

Power Supply

24 V

Output

1.6 A / 4000 A

Frequency (Bandwidth) (1 dB)

DC 50 kHz*

Size (mm)
Operating temperature range

643 x 500 x 118

-40 +70 C

Mounting
Construction

Panel
Onboard Electronics
Electrostatic shield

Large aperture 268 mm for primary conductor crossing

*small signal 40 A RMS

Packaging: n 8

21

Model
(-S: current output)
(-SB: Voltage output)
(-SPR: Current output/

programmable)
(-SBPR: Voltage output/

programmable)

ITZ 600-SPR & -SBPR

ITZ 2000-S & -SB &
-SPR & -SBPR
ITZ 5000-S & -SB

ITZ 10000-S & -SB

ITZ 16000-S & -SB
ITZ 24000-S & -SB

Nominal current DC

600 A
2000 A
5000 A

10000 A
16000 A
24000 A

Nominal current RMS

424 A
1414 A
3535 A

7070 A
11314 A
16970 A

Power Supply

DC 500 kHz
DC 300 kHz
(DC 80 kHz for
ITZ 2000 -SPR & -SBPR)
DC 80 kHz
Measuring heads:

Size (mm)

ITZ standard delivery:

Transducer head
Electronics for 19 rack installation
Cable transducer electronics, length 10 m
Cable output, length 1.5 m

1 A or 10 V / 600 A
& 2000 A (for -SPR & -SBPR models)
2 A or 10 V / 2 & 5 & 10 & 16 KA
3 A or 10 V / 24 KA

Output (-S & -SB models)

Frequency*
(Bandwidth) (3 dB)

19 Electronics Rack

100-240 VAC / 50-60 Hz

25.4
50
140.3

Operating
temperature range
Mounting
Construction

DC 20 kHz
DC 3 kHz
DC 2 kHz

Electronic:

100
150.3
150.3

19 Electronics
Rack

Packaging: n 9

Measuring heads: 0 +55 C

Electronics Rack: +10 +40 C
19 Electronics Rack
Measuring head +
deported 19 Electronics rack

*small signal 1% of IPN (DC)

ITZ 600 & 2000 models are available in -SPR and -SBPR versions,
as programmable models for the primary current to be measured,
providing respectively current and voltage output.
The 600A head can be programmed from 40A to 620A in steps of 20A
The 2000A head can be programmed from 125A to 2000A in steps of 125A

Measuring head 2kA

WITH 25POL D-SUB ( 1 : 2 )

Optional programming connector

96

67,5

67,5

35

M8x1,25 - 6H

WITH OUT 25POL D-SUB ( 1 : 2 )

50

30,5

100

169,5

200

Product specification

ITZ 60024000-S & -SB & -SPR & -SBPR

169

70
SOURIAU UT001619SH

Packaging: n 9b

22

Product specification

Measuring head 5kA

Measuring head 600A

28,2 MAX

57

121

174,5

284

350

3
0,
14

69

25,4 MIN
350

192

134

73

122

10,5 THRU

66

98

SOURIAU UT001619SH
290

Packaging: n 9c

Packaging: n 9a

Measuring head 10kA

Measuring head 16-24kA

139
110

351

SOURIAU UT001619SH

213

0
10

213

90

M12x1.75 - 6H

209

69

176,5

284

Lifting Eyebolt DIN 582 - M12

210

350

77,5

240

152

412,5

15
0,3

480

10,5 4x

SOURIAU UT001619SH
90

290
480

Packaging: n 9d

180

Packaging: n 9e

23

Product Coding

PRODUCT CODING / Industry Transducers

Family
A
:
C
:
D
:
F
:
H
:
I
:
L
:
R
:
T
:

transducers using the principle of isolation amplifier

transducers using the principle of fluxgate compensation
digital transducers
transducers using the detector of fields
transducers using the Hall effect without magnetic compensation
compensation current transducers with high accuracy
transducers using the Hall effect with magnetic compensation
transducers using the principle of the Rogowski loop
transducers using the simple transformer effect

Group:
A or AK or AL or AS 1)
or AT or AX or AZ
AR or AW or AC or X or XN
AF
AH
AIS, XS, ASS, AFS
ASR, KSR
AY
B
C
D
HS
F
I
MS
OP
TC
TD
TKS, TFS
TP, TO, TN, TZ, TL, T, TA, TB, TY
TR
TS
TSR, TSP
TT
V
Y

:
:
:
:
:

:
:
:
:
:
:


:
:
:
:
:
:
:
:
:
:
:
:
:
:

with rectangular laminated magnetic circuit

with rectangular laminated magnetic circuit
with rectangular laminated magnetic circuit and flat housing
vertical mounting
rectangular laminated magnetic circuit +
unidirectional power supply + reference access
rectangular magnetic circuit + unipolar power supply + reference access
rectangular magnetic circuit + hybrid
double toroidal core
apparent printed circuit
differential measurement
Hall effect without magnetic compensation; magnetic concentrators
+ unidirectional power supply + reference access. When used with
F (FHS): Minisens, SO8 transducer
flat design
shunt isolator
surface mounted device + unidirectional power supply + reference access
opening laminated magnetic circuit
transducer reserved for the traction
double measurement
core, flat case + unidirectional power supply + reference access
toroidal core
opening core
core + unipolar power supply
core + unipolar power supply + reference access
triple measurement
voltage measurement
compact hybrid for PCB mounting

Nominal Amperage
- current transducer : rms amperes
- voltage tranducer : rms amperes-turns

- 0000 : Nominal Voltage (-1000 meaning 1000 V, with built in primary resistor R1)

- AW/2 : particular type of voltage transducer

- AW/2/200: Nominal voltage for AW/2 design (200 meaning 200V with built in primary resistor R1)
Execution
N
: multiple range
P
: assembly on printed circuit
S(I) : with through-hole for primary conductor
T(I) : with incorporated primary busbar
Particularities (1or 2 optional characters or figures)
B
: bipolar output voltage
BI : bipolar current output
C
: fastening kit without bus bar
F
: with mounting feet
FC : with mounting feet + fastening kit
P
: assembly on printed circuit
PR : programmable
R
: rms output
RI : rms current output
RU : rms voltage output
Variants
Differing from the standard product... /SPXX

ITZ 600-SPR/...
24

LEMs Warranty
5 Year Warranty on LEM Transducers
We design and manufacture high quality and highly reliable products for our customers
all over the world.
We have delivered several million current and voltage transducers since 1972 and most of them
are still being used today for traction vehicles, industrial motor drives, UPS systems and many
other applications requiring high quality standards.
The warranty granted on LEM transducers is for a period of 5 years (60 months) from the date of
their delivery (not applicable to Energy-meter product family for traction
and automotive transducers where the warranty period is 2 years).
During this period LEM shall replace or repair all defective parts at its cost (provided the defect
is due to defective material or workmanship).
Additional claims as well as claims for the compensation of damages, which do not occur on the
delivered material itself, are not covered by this warranty.
All defects must be notified to LEM immediately and faulty material must be returned to the
factory along with a description of the defect.
Warranty repairs and or replacements are carried out at LEMs discretion.
The customer bears the transport costs. An extension of the warranty period following repairs
undertaken under warranty cannot be granted.
The warranty becomes invalid if the buyer has modified or repaired, or has had repaired by a
third party the material without LEMs written consent.
The warranty does not cover any damage caused by incorrect conditions of use and cases of
force majeure.
No responsibility will apply except legal requirements regarding product liability.
The warranty explicitly excludes all claims exceeding the above conditions.
Geneva, 21 June 2011

Franois Gabella
President & CEO LEM
June 2011/Version 1

25

Selection guide

Performances
Performances/Features

/Features

Model
Model

IPN

IPN

IP

(A DC)

(A
RMS)

(A)

VOUT
IOUT

Turns
Ratio

VC
(V)

@ I PN (DC)

IOE
L
Linearity
Offset
(ppm)
(ppm)
Note 1) & 3) Note 3) & 4)

Noise (RMS)
(ppm) (DC-100Hz)
(Note 3)

Stand-alone DC/AC Current Transducers

ITN 12-P

12.5

8.8

+/-12.5

50 mA

250

+/-15V DC

<4

500

<0.5

IT 60-S

60

42

+/-60

100 mA

600

+/-15V DC

<20

<250

<1

IT 200-S

200

141

+/-200

200 mA

1000

+/-15V DC

<3

<80

<1

IT 400-S

400

282

+/-400

200 mA

2000

+/-15V DC

<3

<40

<0.5

IT 700-S

700

495

+/-700

400 mA

1750

+/-15V DC

<3

<50

<0.5

IT 700-SPR

700

495

+/-700

400 mA

1750

+/-15V DC

<3

<50

<1

IT 700-SB

700

495

+/-700

10V

N/A

+/-15V DC

<30

<60

<2

IT 1000-S/SP1

1000

707

+/-1000

1000 mA

1000

+/-15V DC

<3

<50

N/A

ITB 300-S

300

300

+/-450

150 mA

2000

+/-15V DC

10

666

N/A

ITN 600-S

600

424

+/-600

400 mA

1500

+/-15V DC

<1.5

<15

<0.3

ITN 900-S

900

636

+/-900

600 mA

1500

+/-15V DC

<1

<10

<0.2

ITL 900-T

400

400

+/-900

266.66 mA

1500

+/-15V DC

<1

<10

<0.017 (0.125Hz-1kHz)

ITL 4000-S

4000

4000

+/-12000

1600 mA

2500

+/-24V DC

<100

<62.5

<125 (0.1 Hz-10 kHz)

<11 (DC-10kHz)

Rack System DC/AC Current Transducers

ITZ 600-SPR

600

424

+/-600

1000 mA

600

100-240V AC - 50/60Hz

<1

<2

ITZ 600-SBPR

600

424

+/-600

10 V

600

100-240V AC - 50/60Hz

<3

<2

ITZ 2000-S

2000

1414

+/-2000

2000 mA

1000

100-240V AC - 50/60Hz

<2

<2

ITZ 2000-SB

2000

1414

+/-2000

10 V

2000

100-240V AC - 50/60Hz

<4

<2

ITZ 2000-SPR

2000

1414

+/-2000

1000 mA

2000

100-240V AC - 50/60Hz

<2

<2

ITZ 2000-SBPR

2000

1414

+/-2000

10 V

2000

100-240V AC - 50/60Hz

<4

<2

ITZ 5000-S

5000

3535

+/-5000

2000 mA

2500

100-240V AC - 50/60Hz

<3

<2

ITZ 5000-SB

5000

3535

+/-5000

10 V

2500

100-240V AC - 50/60Hz

<5

<2

ITZ 10000-S

10000

7070

+/-10000

2000 mA

5000

100-240V AC - 50/60Hz

<5

<2

ITZ 10000-SB

10000

7070

+/-10000

10 V

5000

100-240V AC - 50/60Hz

<7

<2

ITZ 16000-S

16000

11314

+/-16000

2000 mA

8000

100-240V AC - 50/60Hz

<6

<2

ITZ 16000-SB

16000

11314

+/-16000

10 V

8000

100-240V AC - 50/60Hz

<8

<2

ITZ 24000-S

24000

16970

+/-24000

3000 mA

8000

100-240V AC - 50/60Hz

<6

<2

ITZ 24000-SB

24000

16970

+/-24000

10 V

8000

100-240V AC - 50/60Hz

<10

<2

1) Linearity measured at DC
2) Bandwidth is measured under small signal conditions amplitude of 0.5% IPN (DC)

26

8)

<3 (DC-10kHz)
8)

<7 (DC-10kHz)
8)

<2.5 (DC-10kHz)
8)

<8 (DC-10kHz)
8)

<8 (DC-10kHz)
8)

<8 (DC-10kHz)

3) All ppm figures refer to VOUT or IOUT @ IPN (DC) except for ITL
900-T where it refers to IOUT=600 mA

4) Electrical offset current + self magnetization + effect

of earth magnetic field @ TA = + 25C

8)

Packaging n

Busbar Aperture

Integrated

26

+10+50

26

>500

+10+50

26

<0.5

>100

+10+50

30

<16

<0.5

>100

+10+50

30

<10

<4

<100

+10+50

30

<6

<0.5

>500

+10+50

30

N/A

6.66

>100

-40+85

21.5

<15 (DC-100kHz)

<0.5

>300

+10+50

30

<10

<0.3

>300

+10+50

30

Noise (RMS)

TCIOE

Bandwidth

TA

(ppm) (DC-50kHz)
(Note 3)

(ppm/K)
(Note 3)

+/-3dB (kHz)
(Note 2)

(C)

<10 (DC-100kHz)

<2

>500

+10+45

<15

<2.5

>800

+10+50

<15

<2

>500

<8

<1

<6

Mounting
PCB

On-board
Panel

Measuring head +
19 rack electronic

(mm)

<0.006 (1kHz-30kHz)

<0.3

>2005)

+10+50

Integrated busbar
19 mm diameter

<125 (0.1 Hz-10 kHz)

<1.38

>50 6)

-40+70

268

<28 (DC-100kHz)

<0.1

>5007)

9 + 9a

25.4

<0.6

>3007)

9 + 9a

25.4

<0.1

>3007)

9 + 9b

50

<0.6

>3007)

9 + 9b

50

<0.1

>807)

9 + 9b

50

<0.6

>807)

9 + 9b

50

<0.1

>807)

9 + 9c

140.3

<0.6

>807)

9 + 9c

140.3

<0.1

>207)

9 + 9d

100

<0.6

>207)

9 + 9d

100

<0.1

>37)

9 + 9e

150.3

<0.6

>37)

9 + 9e

150.3

<0.1

>27)

9 + 9e

150.3

<0.6

>27)

0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.
0+55 Head
+10+40 Elec.

9 + 9e

150.3

8)

<27 (DC-100kHz)
8)

<42 (DC-100kHz)
8)

<20 (DC-100kHz)
8)

<20 (DC-100kHz)
8)

<20 (DC-100kHz)
8)

<20 (DC-100kHz)
8)

5) Small signal 5 % of IPN (DC), 32 A RMS

6) Small signal 40 A RMS @ +/- 1 dB

7) Bandwidth is measured under

conditions - amplitude of 1% IPN (DC)
N/A: Not Available
8) Under request - Check online

small

signal

27

Special features

Performances

Electrostatic Transducer Transducer Transducer Transducer

External
Synchronization /Features
Shield
State output State output State output State output Synchronization Status Output
between
(operation
(Low
(High current (Overload
primary and
status)
measured
condition)
condition)
Model Model
secondary
current status)

Stand-alone DC/AC Current Transducers

Metal housing for high immunity
against external interference

Programmable from
80A in steps of 10A
Voltage output
+/-10VDC for I PN(DC)
High bandwidth

Large aperture

ITN 12-P

IT 60-S

IT 200-S

IT 400-S

IT 700-S

IT 700-SPR

IT 700-SB

IT 1000-S/SP1

ITB 300-S

ITN 600-S

ITN 900-S

ITL 900-T
ITL 4000-S

Rack System DC/AC Current Transducers

Programmable by steps of
20 A from 40 A to 620 A
Programmable by steps of
20 A from 40 A to 620 A

Programmable by steps of
125 A from 125 A to 2000 A
Programmable by steps of
125 A from 125 A to 2000 A

ITZ 600-SPR

ITZ 600-SBPR

ITZ 2000-S

ITZ 2000-SB

ITZ 2000-SPR

ITZ 2000-SBPR

ITZ 5000-S

ITZ 5000-SB

ITZ 10000-S

ITZ 10000-SB

ITZ 16000-S

ITZ 16000-SB

ITZ 24000-S

ITZ 24000-SB

28

EN 55024

Stand-alone DC/AC Current Transducers

ITN 12-P

IT 60-S

IT 200-S

IT 400-S

IT 700-S

IT 700-SPR

IT 700-SB

IT 1000-S/SP1

ITB 300-S

ITN 600-S

ITN 900-S

ITL 900-T

ITL 4000-S

EN
EN
61010-1 61326-1

Rack System DC/AC Current Transducers

ITZ 600-SPR

ITZ 600-SBPR

ITZ 2000-S

ITZ 2000-SB

ITZ 2000-SPR

ITZ 2000-SBPR

ITZ 5000-S

ITZ 5000-SB

ITZ 10000-S

ITZ 10000-SB

ITZ 16000-S

ITZ 16000-SB

ITZ 24000-S

ITZ 24000-SB

29

Selection guide

EN 55022

EN
61000-6-4

EN
61000-6-3

EN
61000-6-2

IEC
61010-1

EN 50155
(2001)

Standards
EN 50178
(1997)

LED
Active
Power supply

LED
Measuring head
Range indication

LED
Overload
Condition

LED
High current
Condition

LED
Low measured
Current

Model
Model

LED
Normal
Operation

Performances
/Features

Europe Middle East

Africa America
Asia Pacific

LEM International Sales Representatives

Austria and CEE

Eltrotex HandelsgesmbH
Grundauerweg 7
A-2500 Baden
Tel. +43-2252-47040-0
Fax +43-2252-47040-7
e-mail: office@eltrotex.at
LEM
Concorde Business Park 2/F/6
A-2320 Schwechat
Tel. +43 1 706 56 14-10
Fax +43 1 706 56 14-30
e-mail: tbu@lem.com
Belarus and Baltic Republics
DACPOL Sp. z o.o.
ul. Pulawska 34
PL-05-500 Piaseczno
Tel. +48 22 7035100
Fax +48 22 7035101
e-mail: dacpol@dacpol.com.pl
BeNeLux
LEM Belgium sprl-bvba
Route de Petit-Roeulx, 95
B-7090 Braine-le-Comte
Tel. : +32 67 55 01 14
Fax : +32 67 55 01 15
e-mail : lbe@lem.com
Bosnia, Croatia, Herzegovina,
Serbia and Slovenia
Proteus Electric S.r.l.
Via di Noghere 94/1
I-34147 Muggia-Aquilinia
Tel. +39 040 23 21 88
Fax +39 040 23 24 40
e-mail: dino.fabiani@
proteuselectric.it
Czech Republic, Slovakia
PE & ED, spol. s r.o.
Koblovska 101/23
CZ-71100 Ostrava
Tel. +420 596 239 256
Fax +420 596 239 531
e-mail: peedova@peed.cz

Denmark
Motron A/S
Torsoevej 3
DK-8240 Risskov
Tel. +45 87 36 86 00
Fax +45 87 36 86 01
e-mail: motron@motron.dk
Finland
ETRA Electronics Oy
Lampputie 2
FI-00740 Helsinki
Tel. +358 207 65 160
Fax +358 207 65 23 11
e-mail: markku.soittila@etra.fi
Field Applications Engineer
Mr. Pasi Levelahti
Kausantie 668, 17150 Urajrvi
Tel. +358 50 5754435
Fax +358 37667 141
e-mail: pli@lem.com
France
LEM France Sarl
15, avenue Galois
F. 92340 Bourg-La-Reine
Tel. +33 1 45 36 46 20
Fax +33 1 45 36 06 16
e-mail: lfr@lem.com
Germany
Central Office:
LEM Deutschland GmbH
Frankfurter Strasse 74
D-64521 Gross-Gerau
Tel. +49 6152 9301 0
Fax +49 6152 8 46 61
e-mail: postoffice.lde@lem.com
Hauber & Graf electronics GmbH
Bavaria / Baden Wrttemberg
Hpfigheimer Str. 8
D-71711 Steinheim
Tel. +49 7144 33905-0
Fax +49 7144 33905-55
e-mail: info@hg-electronics.de

Hungary
Ineltron GmbH
Hugenottenstr. 30
D-61381 Friedrichsdorf
Tel.: +36 20 7711744
Tel.: +49 (0)6172 598809
Fax.:+49 (0)617275933
email: i.laszlo@ineltron.hu
Israel
Ofer Levin Technological
Application
PO Box 18247
IL- Tel Aviv 611 81
Tel.+972 3 5586279
Fax +972 3 5586282
e-mail: ol_teap@netvision.net.il

ofer.levin@tec-apps.co.il
Italy
LEM Italia Srl
via V. Bellini, 7
I-35030 Selvazzano Dentro, PD
Tel. +39 049 805 60 60
Fax +39 049 805 60 59
e-mail: lit@lem.com
Poland
DACPOL Sp. z o.o.
ul. Pulawska 34
PL-05-500 Piaseczno
Tel. +48 22 7035100
Fax +48 22 7035101
e-mail: dacpol@dacpol.com.pl
Portugal
QEnergia, Lda
Centro Empresarial S. Sebastio
Rua de S. Sebastio Lt 11 n. 10,
Albarraque
2635-448 Rio de Mouro
Portugal
Tel. +351 214 309 320
Fax +351 214 309 299
e-mail: qenergia@qenergia.pt

Romania
SYSCOM -18 Srl.
Calea Plevnei 139B Sector 6
RO-060011 Bucharest
Tel. +40 21 310 26 78
Fax +40 21 316 91 76
e-mail:
george.barbalata@syscom18.com
Russia
Central Office:
TVELEM. LLC
Str. Staritskoye shosse,15
170040 Tver / Russia
Tel./fax: + 7 4822 655672, 73
E-mail: tvelem@lem.com
Scandinavia
LEM
Hassellunden 16
2765 Smrum
Tel. +45 88 24 5555
e-mail: kck@lem.com
Spain
LEM France Sarl
15, avenue Galois
F-92340 Bourg-la-Reine
Tel. +34 93 886 02 28
Fax +34 93 886 60 87
e-mail: slu@lem.com
Sweden
ADIATOR AB
Hlsingegatan 40
SE-11343 Stockholm
Tel. +46 8 729 1700
Fax +46 8 729 1717
e-mail: info@adiator.se
Beving Elektronic AB
Storstragrnd 10
S. 12739 Skrholmen
Tel. +46 8 680 1199
Fax +46 8 680 1188
e-mail: lars.g.pahlsson@beving.se

Switzerland
SIMPEX Electronic AG
Binzackerstrasse 33
CH-8622 Wetzikon
Tel. +41 44 931 10 30
Fax +41 44 931 10 31
e-mail: contact@simpex.ch
LEM SA
8, Chemin des Aulx
CH-1228 Plan-les-Ouates
Tel. +41 22 706 11 11
Fax +41 22 794 94 78
e-mail: lsa@lem.com
Turkey
zdisan Electronik Pazarlama
DES Sanayi Sitesi,
104.Sok.A07 Blok N:02
TR-34776 Y.Dudullu
Umraniye / Istanbul
Tel. +90 216 420 1882
Fax +90 216 466 3686
e-mail: Ozdisan@ozdisan.com
Ukraine
SP DACPOLCoLtd.
Snovskaya str., 20
UA-02090, KIEV, UKRAINE
Tel. +380 44 501 93 44
Fax +380 44 502 64 87
e-mail: kiev@dacpol.com
United Kingdom and Eire
LEM UK Ltd
West Lancs
Investment Centre
Whitemoss Business Park
Skelmersdale, Lancs WN8 9TG
Tel. +44 1 695 71 25 60
Fax +44 1 695 71 25 61
e-mail: luk@lem.com
Pulse Power & Measurement Ltd
65 Shrivenham Hundred
Business Park
Watchfield
Swindon
Wiltshire
SN6 8TY
Tel. +44 (0) 1793 784389
Fax +44 (0)1793 784391
e-mail: sales@ppm.co.uk

Argentina
Semak S.A.
Av. Belgrano 1580, 5 Piso
AR-1093 BUENOS AIRES
Tel. +54 11 4381 2108
Fax +54 11 4383 7420
e-mail: comex@semak.com.ar
Brazil
AMDS4 Imp. Exp. e Com. de
Equip. Eltricos Ltda.
Rua Dr. Ulha Cintra, 489,
Piso Superior, Centro.
13800-061-Moji Mirim-So Paulo
Brazil.
Tel. +55 19 3806-1950/8509
Fax +55 19 3806-8422
e-mail : jeduardo@amds4.com.br

Canada Ontario East

Optimum Components Inc.
7750 Birchmount Road Unit 5
CAN-Markham ON L3R 0B4
Tel. +1 905 477 9393
Fax +1 905 477 6197

South Africa
Denver Technical Products Ltd.
P.O. Box 75810
SA-2047 Garden View
Tel. +27 11 626 20 23

LEM U.S.A., Inc

991, Michigan Avenue.
USA-Columbus, OH 43201
Tel. +1 414 353 07 11 ext. 200
Fax +1 614 540 74 36
Mobile +1 614 306 73 02
e-mail: afg@lem.com
LEM U.S.A., Inc.
37 Thornton Ferry Road II
USA-Amherst, NH 03031
Tel. +1 800 236 53 66 ext. 202
Fax +1 603 672 71 59
e-mail: gap@lem.com

LEM U.S.A., Inc.

6275 Simms st.
Suite # 110
USA Arvada, CO 80004
Tel. +1 800 236 53 66 ext. 201
Fax +1 303 403 15 89
e-mail: dlw@lem.com
LEM U.S.A, Inc.
1151 Sanborn Avenue
U.S.A - Los Angeles, CA 90029
Tel. +1 800 236 53 66 ext. 206
Fax +1 323 908 04 67
e-mail: dbl@lem.com

Korea
S&H TRADING
#B1 15-02, Chungang Yutong, 1258,
Gurobon-dong, Guro-gu,
Seoul, 152-721, Korea
Tel. +82 2 2686 83 46

+82 2 2613 83 45
Fax +82 2 2686 83 47
e-mail: snhlim@yahoo.co.kr
Young Woo Ind. Co.
C.P.O. Box 10265
K-Seoul
Tel. +82 312 66 88 58
Fax +82 312 66 88 57
e-mail: c.k.park@ygwoo.co.kr
Malaysia
ACEI Systems Sdn. Bhd.
1A & 1A-1, Lintasan
Perajurit 6,
Taman Perak
31400 Ipoh
Perak Darul Ridzuan
Malaysia
Tel. +60 5 547 0761/0771
Fax +60 5 547 1518
e-mail: enquiry@aceisys.com.my

Singapore
Overseas Technology Center Pte Ltd

Australia and New Zealand

Fastron Technologies Pty Ltd.
25 Kingsley Close
Rowville - Melbourne Victoria 3178
Tel. +61 3 9763 5155
Fax +61 3 9763 5166
e-mail: sales@fastron.com.au
China
LEM Electronics (China) Co., Ltd.
No. 28, Linhe Str. Linhe
Industrial Development Zone
Shunyi District, Beijing, China
Post code : 101300
Tel. +86 10 89 45 52 88
Fax +86 10 80 48 43 03

+86 10 80 48 31 20
e-mail: bjl@lem.com
LEM Electronics (China) Co., Ltd.
Shanghai Office
Room 510
Hualian Development Mansion,
Xinhua Road
Changning District
Shanghai, 200052 P.R. China
Tel. +86 21 3226 0881

e-mail: mikep@
optimumcomponents.com

Canada Manitoba West

William P. Hall Contract Services
7045 NE 137th st.
CAN-Kirkland,
Washington 98034
Tel. +1 425 820 6216
Fax +1 206 390 2411

Fax +27 11 626 20 09

e-mail: denvertech@pixie.co.za
U.S.A
Central Office:
LEM U.S.A., Inc.
11665 West Bradley Road
USA Milwaukee, Wi 53224
Tel. +1 414 353 07 11
Toll free: 800 236 53 66
Fax +1 414 353 07 33
e-mail: lus@lem.com

Fax +86 21 5258 2262

e-mail: bjl@lem.com
LEM Electronics (China) Co., Ltd.
Shenzhen Office
R1205, Liantai Mansion, Zhuzilin,
Shennan Avenue, Futian District,
Shenzhen 518040 P.R. China
Tel. +86 755 3334 0779

+86 755 3336 9609
Fax +86 755 3334 0780
e-mail: bjl@lem.com
LEM Electronics (China) Co., Ltd.
Xian Office
R2909, HIBC, Technology Road 33,
High-tech District, Xian
710075 P.R. China
Tel. +86 29 8833 7168
Fax +86 29 8833 7158
e-mail: bjl@lem.com
India
LEM Management Services Sarl
India Branch Office
Mr. Sudhir Khandekar
Level 2, Connaught Place,
Bund Garden Road,

Pune-411001
Tel. +91 20 401 47 575
Mobile +91 98 331 35 223
e-mail: skh@lem.com
GLOBETEK
No.122, 27th Cross,
7th Block, Jayanagar,
Bangalore-560070 INDIA
Tel: +91 80 2663 5776

+91 80 2664 3375
Fax: +91 80 2653 4020
e-mail: sales@globetek.in
Japan
LEM Japan K.K.
2-1-2 Nakamachi
J-194-0021Machida-Tokyo
Tel. +81 4 2725 8151
Fax +81 4 2728 8119
e-mail: ljp@lem.com
LEM Japan K.K.
1-14-24-701 Marunouchi,Naka-ku,
Nagoya
460-0002 Japan
Tel. +81 52 203 8065
Fax +81 52 203 8091
e-mail: ljp@lem.com

Distributor

LEM International SA
8, Chemin des Aulx, CH-1228 Plan-les-Ouates
Tel. +41/22/7 06 11 11, Fax +41/22/7 94 94 78
e-mail: Isa@lem.com; www.lem.com
Publication CAE110901/0

Blk 1003, Unit 04-16

Bukit Merah Central
Inno Center
RS-159836 Singapore
Tel. +65 272 6077
Fax. + 65 278 2134
e-mail: info@overseastechnology.com.sg

Taiwan
POWERTRONICS CO. LTD
The Tapei SUN-TECH Technology Park
10th Floor, No. 205-2, Section 3,
Beixin Road, Xindian City, Taipei
County
23143, Taiwan, R. O. C.
Tel. +886 2 7741 7000
Fax +886 2 7741 7001
e-mail: sales@powertronics.com.tw
Tope Co., Ltd.
3F-4, 716 Chung Cheng Road
Chung Ho City, Taipei Hsien,
Taiwan 235, R.O.C
Tel. +886 2 8228 0658
Fax +886 2 8228 0659
e-mail: tope@ms1.hinet.net