Interferometry
Interferometry
Collimator
Diffraction
pattern
LASER INTERFEROMETER
bxtern
Beam spliter Fixed internal al
•cube comer
cube
Two
frequency
zeeman
laser f2-*f
2&f,±Af
comer
Beam splitter
Axisl ^Axis
33% I
25%
50%
67%
100%
33
Axis3 33%rCl ^3% beam laser^ 25%
* _\ spli iter Axis3
100%
laser
25%
Axis4
Various version of ACLI
• Signal beams
Standard Interferometer
Measured chances in,
ihis distance
Interferometer
MICHELSON INTERFEROMETER
Semi
reflecting
laser Fixed mirror
M2
Beam spliter
Extended (50%
monochromati Refletance)
Compensating
c source
plate Movable
mirror
M,
Eye or
detector
TWYMAN-GREEN INTERFEROMETER
MACHINE TOOL TESTING
High accuracy
• Straightness.
• Flatness.
• Rotations
• Out of round.
• Eccentricity
• Radial throw of an axis.
• Run out
• Periodical axial slip
• Camming
VARIOUS TESTS CONDUCTED ON ANY MACHINE TOOLS
Types of CMM
Working
«• The table and probes are in imperfect alignment.
* The probes may have a degree of run out and move up and
down in the Z-axis may occur perpendicularity errors
Dimensional errors of a CMM is influenced by
Straightness and perpendicularity of the guide ways, o Scale
division and adjustment, o Probe length.
o Probe system calibration, repeatability, zero point setting and
reversal error.
o Error due to
digitization.
CAUSES OF ERRORS IN CMM
The photon comes in contact with another atom or molecule in the higher energy
level E2 then it will cause the atom to return to ground state energy level Ei by
releasing another photon
CALIBRATION OF THREE CO-ORDINATE MEASURING
MACHINE
CALIBRATION OF THREE CO-ORDINATE MEASURING
MACHINE
APPLICATION
CMM Interface of
CAD Software
CMM Source
Program
CM
M
Post
Processor
1
Pre CMM
Processor
------ n_ e\
SHOPFI.OOK |
"
1
LASER INTERFEROMETRY
Optical elements
o Beam splitter c Beam
benders o Retro
reflectors
Measurement display
Image formation
Compiled by:
D.Vasanth Kumar
Assistant Professor,
Department of Mechanical
Engineerin
Jansons Institute of Technology.
Coimbatore.
• Laser Telemetric system
• Laser and LED based distance measuring instruments
• Scanning Laser gauge
• Diffraction pattern technique
• Gauging wide diameter from the diffraction pattern
formed in a laser
\ /
1_ 1-
E
f*
H s
E
1 \
c™
\ */
1/1
\/ *
r V b
•
Control unit
u i i h dispia)
Scanning Laser gauge
Rotating mirror
scanner motor Linear
scanner lens
photocell
V
Object to be
measured
Scan count
photocell
Ray 2
(ii) Combination of two rays antiphased
ffi
A method of producing bands of interference is shown in Fig
m
Light passes through a very narrow slit A and then through the slits B and C
which are close together
m
Thus, two separate beams of light are formed which may be assumed to be in
phase
m
If the ray paths BO and CO are exactly equal then the waves on these paths will
be in phase at the screen and a band of light will occur at point O
as At some point M the ray path difference will be equal to one half wavelength
i.e., C M - B M = K X
O Thus, at the screen, the waves will be 180° out of phase and a band of darkness
will occur at M, and similarly at N
O At point P, the ray path difference will be one wavelength, and the waves again
will be in phase, giving a band of light at point P and similarly at Q
O Thus, a series of light and dark bands are produced
* These dark bands are known as interference fringes
I I Screen |
M et ho d fo r Pr od u c i ng I nt e rf e r e nc e B a n ds
Fig shows a section of an optical flat inclined slightly to a flat surface
Optical flats in case. About 1 inch
(2.5 cm) in diameter
o Phenomenon of optical interference is used in certain methods of fine
measurement
* For testing the flatness of surfaces, an optical flat is used
* Optical flat is a disc of glass or quartz, the faces of which are highly polished
and flat to within a few hundredths of a micrometer
* When put into close contact with a nearly flat surface, dark bands are seen,
which form a contour map of the surface exactly similar to the contours on a
map of the land
n A ray of light entering the optical flat at A is partly reflected at B along BC and
partly transmitted to be reflected at D along the path DEF
C3 The rays emerging at C and F have slightly different directions but they can be
brought together by an optical system such as the eye
B The difference between the lengths of the paths taken by the two rays is BD+DE,
and if this distance is an even number of half-
wavelengths, then the rays will be in phase and a bright band can be seen
Out of phase
• At another position G, if the path difference HKL is an odd number of
half-wavelengths, then the rays from J and M interfer to cause dark band or
fringe
• The bright and the dark fringes in this case are straight because the surface is
flat and the fringes always follow a line of constant distance between the
surface and the lower face of the flat
• Straight fringes always lie parallel to the line of contact or line of minimum
displacement of the optical flat from the surface
►The rate of separation of the lower surface of the flat and the surface under
test depends on the angle (59) of the air wedge
►If this angle is too large the rate of separation is correspondingly too great
and the fringes will be so close together that they cannot be distinguished
from one another
►If the angle is too small the fringes will be far apart
►Thus the pitch of the fringes varies inversely with respect to the angle 59
►The path difference from one fringe to the next similar fringe is one
whole wavelength (^)
►When the angle 86 is very small the vertical displacement of the
surface becomes (1/2) X
►The change in elevation between the optical flat and the surface can
be calculated by counting the number of fringes and multiplying by the
length of one half wavelength of the light used
For example as shown in the Fig, if the
wavelength X of the incident light is = 0.5
Lim = (1/2) X= 0.25 Lim and the number of
fringes = 3, Then the separation = 3 x (1/2)
X = 0.75 Lim
Thus knowing the wavelength of the
light used, the inaccuracies in the surface
can be measured
The change in separation per band is
usually taken as 0.25 Lim, and as it is often
possible to estimate to a tenth of the
distance between bands, the accuracy of
measurement may approach 0.02 Lim
Destructive Constructive
interference interference
Reflected Reflected
waves ISO" waves in
out of phase phase
} PatJn length
difference =
odd multiple
Path length
difference =
of M 2
even multiple of
}J2
►Constructive interference:
►At surface locations (b) where the path length difference
between the two rays is equal to an even multiple of half a
wavelength (A/2) of the light waves, the reflected waves will be
in phase, so the "troughs" and "peaks" of the waves coincide.
Therefore the waves will reinforce (add) and the resulting light
intensity will be greater. As a result a bright area will be
observed there.
Destructive interference:
► At other locations (a) where the path length difference is
equal to an odd multiple of a half-wavelength, the reflected
waves will be 180° out of phase, so a "trough" of one wave
coincides with a "peak" of the other wave. Therefore the
waves will cancel (subtract) and the resulting light intensity
will be weaker or zero. As a result a dark area will be observed
there
► Optical flats being used to calibrate metal
parts.
Interference Patterns
�64598
The pattern at (a) and (b) represent flat surfaces. The differences in spacing of the fringes
represents different inclinations of the optical flat to the surface. The inclination of the optical
flat is more in case of (b) when compared to (a)
► The circular concentric fringes with decreasing diameter at (c) represents
a spherical surface of either convex or concave nature. To determine
whether the surface is convex or concave, light finger pressure may be
applied at the centre of the rings
Typical interference Fringe
patterns
o If the fringes move away from the centre as shown in (d),
then the surface will be concave. A test for convexity is to
press lightly at opposite edges alternately, as shown in the
<► Fig (e), thereby rocking the optical flat and causing the
centre of the rings to move to and fro
o Figure at (f) shows a surface which is curved more in one
direction than the other
o Fig (g) represents a smooth cylindrical surface, while Fig (h)
shows either a ridge or a valley on the surface, and a light
pressure will indicate which of the two is the case
Finally, the Fig (i) indicates the pattern over a vee block
Optical Flats
►An optical flat is a circular piece of unstressed glass or quartz
usually about 5 cm in diameter or more
►The upper and lower surfaces are ground optically flat to get
reference planes
►They provide the most advantageous combination of
precision and accuracy of measurement
►Optical flats are made in a range of sizes, shapes and
materials
►Materials range from inexpensive glass to very
expensive sapphire
►However, high-quality optical quartz or borosilicate glass
are most commonly used
►The flats can also be coated with thin film of titanium oxide to reduce the
light lost by the reflection
►Optical flats are of two types; Type A has only one flat surface while Type B
has two parallel flat surfaces
►Cleanliness is of tremendous importance in optical
flat measurements
►Even a stray particle of dust that might settle on the part before the flat is
placed over it can result in inaccurate measurement
►Temperature changes are more apparent when using optical flats
►Optical flats are heated rapidly by handling and hence requires longer time
to regain the ambient temperature
« Principle of Autocollimator
►Autocollimator is an optical instrument used for the
measurement of small angular differences accurately
►It is essentially an infinity telescope and a collimator combined
►The position of the final image does not depend upon the distance of the
reflector from the collimating lens i.e., separation x is independent of the
position of reflector from the lens
►But if the reflector is moved too much back, then the reflected rays will
completely miss the lens and no image will be formed
►Thus, for the full range of readings of the instrument, the maximum
remoteness of the reflector is limited
► For high sensitivity i.e., for large value of x corresponding to a small
angular deviation '9', a long focal length is required
Principle of the Microptic Autocollimator Reflector
work piece
on
Lamp
A flat reflector placed in front of the objective lens and exactly
normal to the optical axis reflects the parallel beam of light back
along their original paths
They are then brought to focus in the plane of the target graticule
and exactly coincide with its intersection
A portion of the returned light passes straight through the beam
splitter and the return image of the target crossline is therefore
visible through the eyepiece
In this mode, it operates as a telescope focussed at infinity
► If the reflector is tilted through a small angle then the
reflected beam of light will be deflected by twice the angle
of tilt and will be brought to focus in the plane of the target
graticule but linearly displaced from the actual target
Lamp
------------------------------------ f
I I Diffuser
Reflector on
9f
work piece
crosslines by an amount 2
□ Linear displacement of the graticule image in the plane of
the eyepiece is therefore directly proportional to reflector
tilt and can be measured by an eyepiece graticule or optical
micrometer
□ The autocollimator is set permanently at infinity focus and
no device is required for focusing
□ The focal length determines the sensitivity and angular
measuring range
Eyepiece Eyepiece Reticle Beam Splitter
Introduction to Screw Threads
n A screw thread comprises a helical groove of specified
cross-sectional shape. The cross-section of the helical
groove is called the "Form" of the thread
tt
There are number of minor errors arising in a screw thread
measurement which have their own origin in the
specification of the thread
n
The terminology employed must be precise
n Screw threads are essentially used in fastening and the
threads of this nature are simple in design and easy to
produce
♦ The most common form of the threads is V, although there
are several variations of this form are available
♦ Another function of a screw thread is to transmit power.
For example lead screw of a lathe, screw jack etc
♦ Apart from this, screw threads are used in measuring
devices like micrometers
♦ The form of the screw thread influences the function it has to
perform
♦ The aim of screw thread dimensional control is to ensure
mechanical strength, which is governed by the amount of
flank contact rather than by the fit in the threaded hole
♦ It is necessary to control the dimensions of threads
^ When a helical groove is formed on the exterior, then the thread is called an
external thread, or a screw
^ When the helical groove is formed on the interior of a circular hole then it is
called internal thread or nut
^ If there is a single helical groove then it is called single-start thread
^ If there are 'n' helical ridges running side by side around a cylinder then they
are known as n-start thread or multi-start threads
^ A taper thread may be defined in the same way, but is formed on the
exterior of a right circular cone or on the interior of a right circular conical
hole
External screw thread terminology
Flank angle: This is the angle between the individual flank and the
perpendicular to the axis of the thread which passes through the vertex of
the fundamental triangle
It is commonly known as half angle of thread
► Helix angle :
It is the angle made by the helix of a thread at the pitch
line with the axis. This angle is measured in an axial plane
► Dedundum : This is the radial distance between the pitch line and the
minor diameter for external thread and for internal thread this is the
radial distance between the major diameter and the pitch line
External screw thread terminology
► Major diameter : This is the diameter of an imaginary cylinder, co-axial with
the screw, which just touches the crests of an external thread or the roots
of an internal threads. It is often referred to as the outside diameter, crest
diameter or full diameter
Periodic errors :
Periodic errors are those which vary in magnitude along
the length of the thread and occurs at regular intervals
If the error occurs for every revolution, then the thread is
called "drunken"
In drunken thread, the advance of the helix is irregular in
one complete revolution
the pitch measured parallel to the thread axis will always
be correct, the only error is that the thread is not cut to a
true helix
n If the screw thread is regarded as an inclined plane wound round a cylinder and if
the thread is unwound from the cylinder, then the drunkness can be visualised
The helix will be a curve in the case of drunken thread and not a straight line
Errors of this type are most frequently caused by lack of squareness in the thrust
bearing of the lead screw used to produce the thread
External screw thread terminology
Erratic Errors :
External screw thread terminology
blocks
Measurement of Minor Diameter
The principle of measuring the minor diameter is same as that of
measuring the major diameter, but vee -shaped prisms are used
Prisms of suitable sizes are placed between the standard cylinder and the
instrument anvils in order to take a first micrometer reading R1
* The protractor arm is now swung about its pivot and adjusted in order to
measure the angle ofthe same flank
n The mean of these two readings is then the angle between this flank and a
normal to the screw axis
Measurement of Effective Diameter
For measuring effective diameter two small cylinders or wires are
inserted in the grooves of the thread
ft The diameter must be same for both wires and must be known very
accurately
ft A correct value of the effective diameter will be obtained only if the
wires make contact at the pitch line. Wires of this size are called
as "best size" wires
^ The diameter of the wires used should be such that they
contact the flanks at a distance from the pitch line not
exceeding one-twentieth of the length of the straight flank
OA OB . cosec
—2
d e
— cosec —
2 2
AG OA - OG
\
— cosec --- 1
2I 2
In the triangle AFD%
AF DF . cot
-2
Assuming the wires touches the flank exactly at the effective diameter,
= £.«** 4 2
where DF = —
FG = AF - AG 4
P J d
cosec — 1 I
= — . cot ---------
4 2 2
2 But, E - T = 2 x FG
(Considering FG on either side of the thread]
H = DE cot -
2
= — cot —
2
And, CD = - F/ = — cot -
2
4
Further, ft = An - CD
n ■ — cosec — — — cot —
2 2
1 2
i -
:. E = D - 0.6495 p , 0 = 60°,
6 6
cosec - = 2, and cot - = 1.732
2 2
work table
carriage
Mirror
Eye pieces
optical head *"trP''
____ C
O Crosslines ore engraved on the ground-glass screen which can be
rotated through 360° and the measurements are made by these
cross lines
& The angle of rotation of the screen can be read through an auxiliary
eyepiece provided on the optical head
Cleat a nc
Clearance cir
Root or
dedendurn
circle
Terminology of Gear Teeth
H Base circle :
It is the circle from which the gear teeth profiles are generated H
Pitch circle :
It is an imaginary circle which by pure rolling action, would give the same
motion as the actual gear
H Pitch circle diameter:
It is the diameter of the circle which by pure rolling action would produce
the same motion as the toothed gear wheel
The size of the gear is usually specified by the pitch circle diameter
B Pitch point:
It is a common point of contact between two pitch circles of two meshing
gear wheels
■ Pressure angle :
It is the angle between the common normal to two gear teeth at the point
of contact and the common tangent at the pitch point
TOOTH PARTS
PINEON
Whnli; Dc-prh
i :i m u Ni i 'Oin.
__ T r a n s v e r s e S e c t i o n
• • Addenum :
It is the radial distance from the pitch circle to the tip of the tooth
• * Dedendum :
It is the radial distance from the pitch circle to the bottom of the
tooth
Dendendum = Addendum + Clearance
• • Clearance :
It is defined as the radial distance from the tip of a tooth to the bottom
of a mating tooth space, when the teeth are symmetrically engaged
• • Face of tooth :
It is that part of the tooth surface which is above the pitch surface
Flank of the tooth :
It is that part of the tooth surface which is lying below the
pitch surface
Addendum circle and Dedendum circle :
These are the circles drawn through the top of the teeth and
the bottom of the teeth respectively
Circular pitch :
It is the distance measured on the circumference of the pitch
circle from a point on one tooth to the corresponding point
on the adjacent tooth
Diametral pitch :
It is the ratio of number of teeth to the pitch circle diameter
in millimeters
Pd =T/D
» Module :
It is the ratio of the pitch circle diameter in millimeters to the number of
teeth
m=D/T
u Total depth :
It is the radial distance between the addendum and the dedendum circle
► Working depth :
It is the radial distance from the addendum circle to the clearance circle
L- th thickness :
It is the width of the tooth measured along the pitch circle from its
intercept with one flank to its intercept with the other flank of the same
tooth
L Backlash:
It is the difference between the tooth space and the mating tooth
thickness measured along the pitch circle
► Face width : It is the width of the gear tooth measured parallel
to its axis
Gear Measurement:
►For proper inspection of gear, it is essential to pay attention to the
raw material, each process in the production cycle, machining of
the blanks, heat treatment, the cutting and surface finish of the
teeth
►The gear blank should be tested for dimensional accuracies like face
width, bore, outside diameter of the hub and its eccentricity
►As outside diameter forms the datum from where the tooth
thickness is measured, it forms an important item to be controlled
►Concentricity of the blanks is also essential and the side faces
should be true to the bore
Concentricity of Gear Teeth
► If the gear teeth are not concentric then there is a
fluctuation in velocity while transmitting the motion
The tooth concentricity can be checked by,
(I Mounting the gear between the bench centres, placing a standard roller in
each tooth space and measuring the deviation using a dial indicator
• Using a projector in which case the teeth are brought against a stop and
each image of the tooth on the screen should coincide with a line on the
screen
*l Using a gear testing fixture fitted with a spring loaded slide and dial
indicator, in which the spring exerts a constant pressure on the mating
teeth and the movements of the dial indicator gives the measure of the
eccentricity of the teeth
Alignment of each tooth :
►Alignment of each tooth on a gear wheel is essential
otherwise the load will not be distributed evenly over its
face
►Tooth alignment can be checked by placing a standard roller
in the tooth space and checking for parallelism with a
surface plate
►The accuracy of any gear wheel mainly depends upon its
cutting tool accuracy and the setting of the machine
►For most of the gears, optical projection and rolling tests are
sufficient
► In the manufacture of high precision gears it is necessary to determine the
accuracy of individual elements like tooth thickness, pitch of the teeth and the
form of the teeth etc
: a) Analytical Method
► In analytical inspection, all the individual elements of the gear teeth are checked.
This method is slow and tedious and not of much use for industry. The analytical
inspection of gears consists of determining the following teeth elements
► Profile
► Thickness of tooth
► Backlash
► Spacing
► Run out or eccentricity or concentricity
► Pitch
b) The Functional Method
►This method of inspection consists of carrying out the
running test of gear with another gear which is more
accurate and is known as control gear or master gear
►This method of inspection determines composite error,
vibration, noise level or variation in action
►However, the master gear used as a reference has to be
measured on elemental basis only
Checking of Composite Error (Rolling Gear Test)
In the A l e ADO,
w
=
2
R =
si
n
I
A
D
A
O
0
(
;
p
i
t
c
h
c
i
r
c
l
e
r
a
d
i
u
s
)
4
/
V
N
m
.
f
3
6
0
^
w
=
2
.
.
s
i
n
4
/
V
and OD = R cos 9
cos
Nm 2
, Nm Nm (90^
.". d = ---- + m --------- cos —
2 2 \N
Nm '1 + ----
2 f90A
cos —
yv I n,
UNIT-IV
LASER METROLOGY
PRECISION INSTRUMENT BASED ON LASER:
v Laser stands lor Light Amplification b> Stimulated Emission of Radiation.
V Laser instrument is a device to produce powerful, monochromatic, collimaled beam
of light in which the waves are coherent.
V Laser development Is for production of clear coherent light. The advantage ol
coherent light is that whole of the energy appears to be emanating from a very small
point.
V The beam can be focused easily into either a parallel beam or onto a \cr> small point
by use of lenses A major impact on optical measurement has been nude by
development in elector optics, providing automation, greater acuity of setting and
faster response time.
V Radiation sources have developed in a number of areas, the most important
developments are light emitting diodes and lasers.
v The laser is used extensively for interferometry particularly the He- Ne gas type. The
laser distance measuring interferometer has become an industry standard.
This produces 1 to 2mm diameter beam of red light power of 1MW and focused at a
V
point of very high intensity. The beam begins to expand at a rate of 1 mm/m. The laser
beam is visible and it can be observed easily.
V This is used for very accurate measurements of the order of O.lum is 100m. LASER
METROLOGY
V Metrology lasers are low power instruments. Most are helium-neon type.
Wave-output laser that emit visible or infrared light. He-Ne lasers produce light at a
wavelength of 0.6um that is in phase, coherent and a thousand times more intense
than any other monochromatic source.
V Laser systems have wide dynamic range, low optical cross talk and high contrast.
V Laser fined application in dimensional measurements and surface inspection because
of the properties of laser light.
v These are useful where precision, accuracy, rapid non-contact gauging of soft, delicate
oi hot moving points.
USE OF LASER
1. Laser Telemetric system:
V Laser telemetric system is a non-contact gauge that measures with a collimaled laser
beam. It measures at the rate of 150 scans per second.
V It basically consists of three components, a transmitter, a receiver and processor
electronics. The transmitter module produces a collimaled parallel scanning laser
beam moving at a high constant, linear speed.
V The scanning beam appears a red line. The receiver module collects and photoelically
senses the laser light transmitted past the object being measured.
V The processor electronics takes the received signals to convert them 10 a convenient
form and displays the dimension being gauged.
V The transmitter contains a low power helium-neon gas laser and its power supply, a
specially designed collimating lens, a synchronous motor, a multi faceted
1
V Laser equipment produces real straight line, whereas an alignment telescope
provides an imaginary line that cannot be seen in space.
v This is important when it is necessary to check number of components to a
predetermined straight' line. Particularly it' they are spaced relatively long
distances apart, as in aircraft production and in shipbuilding.
V Laser equipment can also be used for checking flatness of machined surface by
direct displacement. By using are optical square in conjunction with laser
equipment squareness can be checked with reference to the laser base line.
TART-A
PART-B
1. What s meant by alignment test on machine tools? Why they are accessary? Explain.
2. Slate the basic principle and use of Laser.
3. Distinguish between geometrical and practical lest on machine -l.Sketeh and explain the
Michelson interferometer in detail. 5.Sketch and describe the optical system in any two of the
following.
a. Laser interferometer.
b. N.P.L. Flatness interferometer.
6. Sketch and explain the Two frequency interferometer in detail.
7.Slate the applications of Lasers in Linear and Angular measurements
8. State the applications of Laser Interferometer in testing of machine tools?
Dynamic tests:
V I f the alignment tests arc carried out under dynamic loading condition. The accuracy
of machine tools which cut metal by removing chips is tested by two types of test namely.
1. Geometrical tests
2. Practical tests.
Geometrical tests:
V In this test, dimensions of components, posit-on of components and displacement of
component relative to one another is checked.
Practical tests:
V In these test, test pieces are machined in the machines. The test pieces must be
appropriate to the fundamental purpose for which the machine has been designed.
189
5. Rotations.
Main spindle is lo be tested for
1) Out of round.
2) Eccentricity
3) Rudiul throw of un uxi.s.
4) Runout
5) Periodical axial slip
6) Camming
190
LNTERFEROMETRIC MEASl'REMENT OF ANGLE
V With laser interferometer it is possible to measure length lo an accuracy of 1 part in 106
on a routine basis.
V With the help of two retro reflectors placed at a fixed distance and a length measuring
laser interferometer the change in angle can be measured to an accuracy of 0.1 second.
The device uses sine Principle. The line joining the poles the retro-reflectors makes the
V hypotenuse of the right iriangle. The change in the path difference of the reflected beam
represents the side of the iriangle opposite to lite angle being measured.
Such laser interferometer can be used to measure an angle up to ± 10 degrees with a
V resolution of 0. 1 second. The principle of operauon is shown in fig.
t,
Laser
Inlcrferomcicr
Re lice lor mourn
LASER EQUIPMENT FOR ALIGNMENT TESTING
V This testing is particularly suitable in aircraft production, shipbuilding etc. Where a
number of components, spaced long distance apart, have to be checked lo a predetermine
straight line.
V Other uses of laser equipment arc testing of flatness of machined surfaces, checking
square ness with the help of optical square etc. These consist of laser tube will produces a
cylindrical beam of laser about 10mm diameter and an auto reflector with a high degree of
accuracy. Laser tube consist of helium-neon plasma tube in a hea aluminum cylindrical
housing. The laser beam comes out of the housing from its centre and parallel to Ihe
housing within 10" of arc and alignment stability is the order of 0.2" of arc per hour.
V Auto reflector consists of detector head and read out unit. No. of photocell are arranged to
compare laser beam in each half horizontally and vertically. This is housed on a shard
V which has two adjustments to translate the detector in its two orthogonal measuring
directions perpendicular lo the laser beam. The devices delect the alignment of flat
surfaces perpendicular lo a reference line of sight.
MACHINE TOOL TESTING
V 'Die accuracy of manufactured parts depends on the accuracy of machine tools. The quality of
V work piece depends on Rigidity and stillness of machine tool and its components.
V Alignment of various components in relation to one another Quality and accuracy of driving
mechanism and control devices. It can be classified into
V 1. Static tests
2. Dynamic tests.
Static tests:
V I f the alignment of ihe components of the machine tool are checked under static
conditions then the test are called static test.
v This system can be used for both incremental displacement and angle measurements. Due to
large counting range it is possible to attain a resolution of 2mm in 10m measuring range.
v Means arc also provided to compensate for the influence of ambient temperature, material
temperature, atmospheric pressure and humidity fluctuation.
TWYMAN-GREEN INTERFEROMETER
V The Twyman-Green interferometer is used as a polarizing interleromelcr with variable
amplitude balancing between sample and reference waves.
V For an exact measurement of the test surface, the instrument error can be detennined by an
absolute measurement. This error is compensated by storing the same in microprocessor
system and subtracting from the measurement of the test surface.
V It has following advantages
1. It permits testing of surface with wide varying reflectivity.
2. It avoids undesirable feed back of light reflected of the tested surface and
the instrument optics.
3. It enables utilization of the maximum available energy.
191
4. Polarisation permits phase variation to be effected with the necessary
precision.
LASER VIEWERS
v The profile of complex components like turbine blades can be checked by the use
of optical techniques. It is based on use of laser and CCTV. V A section of the blade,
around its edge is delineated by two flat beam of laser
light. This part of the edge is viewed at a narrow angle by the TV camera or beam
splitter.
V Both blade and graticule are displayed as magnified images on the monitor, the
graticule position being adjustable so that its image can be superimposed on the
profile image.
V The graticule is effectively viewed at the same angle as the blade. So. distortion due lo
viewing angle affects both blade and graticule. This means thai the graticule images
arc direct 1:1.
192
MICHELSON INTERFEROMETER
V Michclson interferometer consist of a monochromatic light source a beam splitter and
two mirrors.
V The schematic arrangement of Michclson interferometer is shown in fig. The
monochromatic light falls on a beam splitter, which splits the light into two rays of
equal intensity at right angles. One ray is transmitted to mirror M| and other is
reflected through beam splitter to mirror M:..
V From both these mirrors, the rays are reflected back and these return at the
semi-reflecting surface from where they are transmitted to the eye.
V Mirror M< is fixed and mirror Mj is movable. If both the mirrors arc at same distance
from beam splitter, then light will arrive in phase and observer will see bright spot due
to constructive interference.
V If movable mirror shifts by quarter wavelength, then beam will return to observer 180°
out of phase and darkness will be observed due to destructive interference
V Each half-wave length of mirror travel produces a change in the measured optical path
of one wavelength and the reflected beam from the moving mirror shifts through 360°
phase change.
v When the reference beam reflected from the fixed mirror and the beam reflected from
the moving mirror rejoin at the beam splitter, they alternately reinforce and cancel
each other as the mirror moves Thus each cycle of intensity at the eye represents 7J2
of mirror travel.
V When white light source is used then a compensator plate is introduced in each of the
path of mirror M( So that exactly the same amount of glass is introduced in each of the
path.
V To improve the Michclson interferometer
ti) Use of laser the measurements can be made over longer distances and highly
accurate measurements when compared to other monochromatic sources. I.U)
Mirrors are replaced by cube-comer reflector which reflects light parallel to its
angle of incidence.
liii) Photocells are employed which convert light intensity variation in voltage
pulses to give the amount and direction of position change.
DUAL FREQUENCY LASER LNTERFEORMETER
V This instrument is used to measure displacement, high-precision measurements of
length, angle, speeds and refractive indices as well as derived static and dynamic
quantities.
LASER INTERFEROMETER
V II is possible to maintain the quality of interference fringes over longer distance when
lamp is replaced by a laser source:
V Laser interferometer uses AC laser as the light source and the measurements to be
made over longer distance.
V Laser is a monochromatic optical energy, which can be collimaled into a directional
beam AC. Laser interferometer (ACLI) has the following advantages.
0 High repeatability
0 High accuracy
0 Long range optical path
0 Easy installations
0 Wear and tear
V Schematic arrangement of laser interferometer is shown in fig. Two-frequency
zeeman laser generates light of two slightly different frequencies with opposite
circular polarisation.
V These beams gel split up by beam splitter B One part travels towards B and from
there lo external cube corner here the displacement is lo he measured.
hxtcrnai
V This interferometer uses cube corner reflectors which reflect light parallel to its angle
of incidence. Beam splitter B> optically separates the frequency J which alone is sent
to the movable cube corner reflector.
V The second frequency from B 2 is sent to a fixed reflector which then rejoins IT at the
beam splitter B 2 to produce alternate light and dark interference flicker at about 2
Mega cycles per second. Now if the movable reflector moves, then the returning beam
frequency Doppler-shifted slightly up or down by Af
V Thus the light beams moving towards photo detector P 2 have frequencies f> and (fi ±
Af d and P 2 changes these frequencies into electrical signal.
V Photo detector P2 receive signal from beam splitter B 2 and changes the reference beam
frequencies f| and i2 into electrical signal.
V An AC amplifier A separates frequency, difference signal i2 - fj and A2 separates
frequency difference signal.
V The pulse converter extracts i. one cycle per half wavelength of motion. The up-down
puLses arc counted electronically and displayed in analog or digital form.
194
b) Beam lenders:
V These are used to deflect the light beam around corners on its path from the laser to
each axis.
V These arc actually just flat mirrors but having absolutely flat and very high reflectivity.
Normally these are restricted to 90° beam deflections to avoid disturbing the
polarizing vectors.
c) Retro reflectors:
V These can be plane mirrors, roof prism or cube comers. Cube corners are three
mutually perpendicular plane mirrors and the reflected beam is always parallel to the
incidental beam./
V Each ACLI transducers need two retro reflectors. All ACLI measurements are made by
sensing differential motion between two retro reflectors relative to an interferometer.
V Plane mirror used as retro reflectors with the plane mirror interferometer must be flat
to within 0.06 micron per cm.
' iii) Laser head's measurement receiver
V During a measurement the laser beam is directed through optics in the
measurement path and then returned to the laser head is measurement receiver
which will detect part of the returning beam and a doppler shifted frequency
component.
(iv) Measurement display
V It contains a microcomputer to compute and display results. The signals from
receiver and measurement receiver located in the laser head arc counted in two
separate pulse converter and subtracted.
V Calculations are made and the computed value is displayed. Other input signals for
correction are temperature, co-efficient of expansion, air velocity etc.. which can be
displayed.
(v| Various version of ACLI
a) Standard
Interferometer:
v Least expensive.
V Retro reflector for this instrument is a cube corner.
V Displacement is measured between the interferometer and cube corner.
this distance
|^ ___ ('
From liisef
source Interferometer
To receiver
PRINCIPLE OF LASER
v The pliolon emitted during stimulated emission has the same energy, phase and
frequency as the incident photon.
V This principle states that the photon comes in contact with another atom or
molecule in the higher energy level E2 then it will cause the atom to return lo
ground slate energy level El by releasing another photon.
V The sequence of triggered identical photon from stimulated atom is known as
stimulated emission. This multiplication of photon through stimulated
emission leads to coherent, powerful, monochromatic, collimatcd beam of
light emission. This light emission is called laser.
195
0 If the laser source is deviated from one of the four optimum positions, the photo receiver
will decrease. At 45° deviation the signal will decrease to zero, (ii) Optical elements: (a)
Beam splitter:
V Fig shows the beam splitters lo divide laser output along different axes. These divide
the laser beam into separate beams.
V To avoid attenuation it is essential that the beam splitters must be oriented so that the
reflected beam forms a right angle with the transmitted beam
V So that these two beams: arc coplanar with one of the polarisation vectors of the input
form.
lAxte)
% 25%
Axis2 3J% 150% 25%
beam I Axis2
splilcr
50%
67%
100%
Axis3 33 V. 33% beam laser 25%
splilcr A.\is3
25% Axlvl
196
Reference Reforetlectof
beam (S (fixed)
From laser 1
V
— Mcasurmcnt
beam
source 1 / (P polarised)
To electronic
v
Interferomet
er
polarised)
receiver
V The two-frequency laser head provides one frequency with P polarisation and
another frequency with S-polarisation.
V The laser beam is split at the polarizing beam splitter into its two separate
frequencies.
The measuring beam is directed through the interferometer to reflect off a target mirror or
retro reflector attached to the object to be measured. The reference beam is reflected from
V fixed retro reflector. The measurement beam on its return path rccombines with
the reference beam and is directed to the electronic receiver. 7. Gauging wide diameter from
the diffraction pattern formed in a laser
v Fig.( 1) shows a method of measuring the diameter of thin wire using the
interference fringes resulting from diffraction of the light by the wire in the
laser beam.
V A measure of the diameter can be obtained by moving the photo detector until
the output is restored to its original value.
V Changes in wire diameter as small as 0.2% over wire diameter from 0.005 to
0.2mm can be measured..
Collimator Diffraction
partem
V Fig. (2) shows the length measurement by fringe counting. The laser output,
which may be incoherent illumines three slits at a time in the first plane which
form interference fringes.
V The movement can be determined by a detector. The total number of slits in die
first plane is governed by the length over which measurement is required
Grating
The spacing between the slits and
distance of the slit to the
plane of the grating depend on the
wavelength of the light used.
Interference \
Ro I a ling mimx
photocell
197
scanner motor
Display - lip based dam Hdgc
sensint
operator ■u ,| .1. -u.il & & decoding
:onso!c control system eleciromcs
198
V
Scunner
Gate
—| sensin
— g
»- Output {Digital display system)
2. Laser and LED based distance measuring instruments
V These can measure distances from 1 to 2in with an accuracy of the order of 0. 1
to 1% of the measuring range When the light emitted by laser or LED hits an
object, scatter and same of this scattered light is seen by a position sensitive
detector or diode array.
V If the distance between die measuring head and the object changes, the angle
at which the light enters the detector will also change.
V The angle of deviation is calibrated in terms of distance and output is provided
as 0-2OmA. Such instruments are very reliable because there are no moving
parts their response time is milliseconds.
V The measuring system uses two distance meters placed at equal distance on
either side of the object and a control unit to measure the thickness of an
object. The distance meter is focused at the centre of the object.
i
1
\ /
\ /
> ■
c
: )
Control
unit with
display
199
V Laser equipment produces real straight line, whereas an alignment
telescope provides an imaginary line that cannot be seen in space.
V This is important when it is necessary lo check number of components to
a predetermined straight * line. Particularly if they are spaced relatively
long distances apart, as in aircraft production and in shipbuilding.
V Laser equipment can also be used for checking flatness of machined
surface by direct displacement. By using are optical square in conjunction
with laser equipment squareness can be checked with reference to the
laser base line.
PART-A
PART-B
1. What is meant by alignment test on machine tools? Why they are necessary? Explain.
2. State the basic principle and use of Laser.
3. Distinguish between geometrical and practical test on machine 4.Sketch and explain
the Michelson interferometer in detail. 5.Sketch and describe the optical system in any
two of the following.
a. Laser interferometer.
b. N.P.L. Flatness interferometer.
6. Sketch and explain the Two frequency interferometer in detail.
7.Slate the applications of Lasers in Linear and Angular measurements
8. State the applications of Laser Interferometer in testing of machine tools?
Dynamic tests:
V I f the alignment tests are carried out under dynamic loading condition. The accuracy of machine
tools which cut metal by removing chips is tested by two types of test namely.
1. Geometrical tests
2. Practical tests.
Geometrical tests:
V In this test, dimensions of components, position of components and displacement of component
relative to one another is checked.
Practical tests:
V In these test, test pieces arc machined in the machines. The test pieces must be appropriate to the
fundamental purpose for which the machine has been designed.
Laser Interferometer
Re lice tor mount
LASER EQUIPMENT FOR ALIGNMENT TESTING
V This testing is particularly suitable in aircraft production, shipbuilding etc. Where a
number of components, spaced long distance apart, have to be checked lo a predetermine
straight line.
V Other uses of laser equipment arc testing of flatness of machined surfaces, checking
square ness with the help of optical square etc. These consist of laser tube will produces a
V cylindrical beam of laser about 10mm diameter and an auto reflector with a high degree
of accuracy. Laser tube consist of helium-neon plasma tube in a hea aluminum
cylindrical housing. The laser beam comes out of the housing from its centre and parallel
to Ihe housing within 10" of arc and alignment stability is the order of 0.2" of arc per
hour.
V Auto reflector consists of detector head and read out unil. No. of photocell are arranged
to compare laser beam in each half horizontally and vertically. This is housed on a shard
V which has two adjustments to translate the detector in its two orthogonal measuring
directions perpendicular lo the laser beam. The devices delect the alignment of flat
surfaces perpendicular lo a reference line of sight.
MACHINE TOOL TESTING
V 'Die accuracy of manufactured parts depends on the accuracy of machine tools. The quality of
V work piece depends on Rigidity and stillness of machine tool and its components.
V Alignment of various components in relation to one another Quality and accuracy of driving
mechanism and control devices. It can be classified into
V 1. Static tests
2. Dynamic tests.
Static tests:
V I f the alignment of ihe components of the machine tool are checked under static
conditions then the test are called static test.
v This system can be used for both incremental displacement and angle measurements. Due to
large counting range it is possible to attain a resolution of 2mm in 10m measuring range.
v Means arc also provided to compensate for the influence of ambient temperature, material
temperature, atmospheric pressure and humidity fluctuation.
TWYMAN-GREE.N INTERFEROMETER
V The Twyman-Grccn interferometer is used as a polarizing interferometer with variable
amplitude balancing between sample and reference waves.
V For an exact measurement of the test surface, the instrument error can be determined by an
absolute measurement. This error is compensated by storing tlie same in microprocessor
system and subtracting from the measurement of the test surface.
V It has following advantages
1. It permits testing of surface with wide varying reflectivity.
2. It avoids undesirable feed back of light reflected of the tested surface and
the instrument optics.
3. It enables utilization of the maximum available energy.
202
4. Polarisation permits phase variation to be effected with the necessary
precision.
LASER VIEWERS
V The profile of complex components like turbine blades can be checked by the use of
optical techniques. It is based on use of laser and CCTV.
V A section of the blade, around its edge is delineated by two flat beam of laser light.
This part of the edge is viewed at a narrow angle by the TV camera or beam splitter.
V Both blade and graticule are displayed as magnified images on the monitor, the
graticule position being adjustable so that its image can be superimposed on the
profile image.
V The graticule is effectively viewed at the same angle as the blade. So. distortion due
to viewing angle affects both blade and graticule. This means that the graticule
images arc direct 1:1.
203
MICHELSON INTERFEROMETER
V Michclson interferometer consist of a monochromatic light source a beam splitter and
two mirrors.
V The schematic arrangement of Michclson interferometer is shown in fig. The
monochromatic light falls on a beam splitter, which splits the light into two rays of
equal intensity at right angles. One ray is transmitted to mirror M| and other is
reflected through beam splitter lo mirror M:..
V From both these mirrors, the rays are reflected back and these return at the
semi-reflecting surface from where they are transmitted lo the eye.
V Mirror M< is fixed and mirror Mj is movable. If both the mirrors arc at same distance
from beam splitter, then light will arrive in phase and observer will see bright spot due
to constructive interference.
V If movable mirror shifts by quarter wavelength, then beam will return to observer 180°
out of phase and darkness will be observed due lo destructive interference
V Each half-wave length of mirror travel produces a change in the measured optical path
of one wavelength and the reflected beam from the moving mirror shifts through 360°
phase change.
v When the reference beam reflected from the fixed mirror and the beam reflected from
the moving mirror rejoin at the beam splitter, they alternately reinforce and cancel
each other as the mirror moves Thus each cycle of intensity at the eye represents ~k!2
of mirror travel.
V When white light source is used then a compensator plate is introduced in each of the
path of mirror M( So that exactly the same amount of glass is introduced in each of the
path.
V To improve the Michclson interferometer
ti) Use of laser the measurements can be made over longer distances and highly
accurate measurements when compared lo other monochromatic sources, lii)
Mirrors are replaced by cube-comer reflector which reflects light parallel lo its
angle of incidence.
liii) Photocells are employed which convert light intensity variation in voltage
pulses to give the amount and direction of position change.
DUAL FREQUENCY LASER LNTERFEORMETER
V This instrument is used to measure displacement, high-precision measurements of
length, angle, speeds and refractive indices as well as derived static and dynamic
quantities.
LASER INTERFEROMETER
V II is possible 10 maintain the quality of interference fringes over longer distance when
lamp is replaced by a laser source:
V Laser imcrferometer uses AC laser as the light source and the measurements to be
made over longer distance.
V Laser is a monochromatic optical energy, which can be collimaled into a directional
beam AC. Laser interferometer (ACLI) has the following advantages.
0 High repeatability
0 High accuracy
0 Long range optical path
0 Easy installations
0 Wear and tear
V Schematic arrangement of laser interferometer is shown in fig. Two-frequency
zceman laser generates light of two slightly different frequencies with opposite
circular polarisation.
V These beams gel split up by beam splitter B One part travels towards B and from
there to external cube comer here the displacement is to he measured.
txtcrnai
V This interferometer uses cube comer reflectors which reflect light parallel to its angle
of incidence. Beam splitter B> optically separates the frequency J which alone is sent
to the movable cube comer reflector.
V The second frequency from B 2 is sent to a fixed reflector which then rejoins f 1 at the
beam splitter B 2 to produce alternate light and dark interference flicker at about 2
Mega cycles per second. Now if the movable reflector moves, then the returning beam
frequency Doppler-shifted slightly up or down by Af
V Thus the light beams moving towards photo detector P 2 have frequencies f> and (fi ±
Af d and P 2 changes these frequencies into electrical signal.
V Photo detector P2 receive signal from beam splitter B 2 and changes the reference beam
frequencies f| and i2 into electrical signal.
V An AC amplifier A separates frequency, difference signal i2 - fj and A2 separates
frequency difference signal.
V The pulse converter extracts i. one cycle per half wavelength of motion. The up-down
puLses arc counted electronically and displayed in analog or digital form
b) Beam lenders:
V These are used to deflect the light beam around corners on its path from the laser lo
each axis.
V These arc actually just flat mirrors but having absolutely flat and very high reflectivity.
Normally these are restricted to 90° beam deflections to avoid disturbing the
polarizing vectors.
c) Retro reflectors:
V These can be plane mirrors, roof prism or cube comers. Cube corners are three
mutually perpendicular plane minors and the reflected beam is always parallel lo the
incidental beam./
V Each ACLJ transducers need two retro reflectors. All ACLI measurements are made by
sensing differential motion between two retro reflectors relative lo an interferometer.
V Plane mirror used as retro reflectors with the plane mirror interferometer must be flat
lo within 0.06 micron per cm.
' iii) Laser head's measurement receiver
V During a measurement the laser beam is directed ihrough optics in the
measurement path and then returned lo ihe laser head is measurement receiver
which will detect part of the returning beam and a doppler shifted frequency
component.
(iv) Measurement display
V It contains a microcomputer lo compute and display results. The signals from
receiver and measurement receiver located in the laser head arc counted in two
separate pulse converter and subtracted.
V Calculations are made and the computed value is displayed. Other input signals for
correction are temperature, co-efficient of expansion, air velocity etc.. which can be
displayed.
(v| Various version of ACLI
a) Standard
Interferometer:
v Least expensive.
V Retro reflector for this instrument is a cube corner.
V Displacement is measured between the interferometer and cube corner.
this distance
|^ ___ ('
From liiser
source Interferometer
To receiver
PRINCIPLE OF LASER
v The plioton emitted during stimulated emission has the same energy, phase and
frequency as the incident photon.
V This principle states that the photon comes in contact with another atom or
molecule in the higher energy level E2 then it will cause the atom to return to
ground stale energy level El by releasing another photon.
V The sequence of triggered identical photon from stimulated atom is known as
stimulated emission. This multiplication of photon through stimulated
emission leads to coherent, powerful, monochromatic, collimaled beam of
light emission. This light emission is called laser.
206
0 If the laser source is deviated from one of the four optimum positions, the photo receiver
will decrease. At 45° deviation the signal will decrease to zero, (ii) Optical elements: (a)
Beam splitter:
V Fig shows the beam splitters to divide laser output along different axes. These divide
the laser beam into separate beams.
V To avoid attenuation it is essential that the beam splitters must be oriented so that die
reflected beam forms a right angle with the transmitted beam.
V So that these two beams: arc coplanar with one of the polarisation vectors of the input
form.
Mxisl
% 25%
150% 25%
Axis2
beam
splitcr
50%
67%
100%
Axis3 33 V. 33% beam laser 25%
spliier A.\is3
25% Axlvl
207
Reference beam
Reforetleciof
(S polarised)
(fixed)
From laser
1
V
— Measurmcnt beam
source 1
/ (P polarised)
To electronic
v
Interferometer
receiver
V The two-frequency laser head provides one frequency with P polarisation and
another frequency with S-polarisation.
V The laser beam is split at the polarizing beam splitter into its two separate
frequencies.
The measuring beam is directed through the interferometer to reflect off a target mirror or
retro reflector attached lo the object to be measured. The reference beam is reflected from
V fixed retro reflector. The measurement beam on its return path rccombines wiih
the reference beam and is directed to the electronic receiver. 7. Gauging wide diameter from
Ihe diffraction pattern formed in a laser
v Fig.( 1) shows a method of measuring the diameter of thin wire using the
interference fringes resulting from diffraction of the light by the wire in the
laser beam.
V A measure of the diameter can be obtained by moving the photo detector until
the output is restored to its original value.
V Changes in wire diameter as small as 0.2% over wire diameter from 0.005 lo
0.2mm can be measured..
Collimator Diffraction
partem
V Fig. (2) shows the length measurement by fringe counting. The laser output,
which may be incoherent illumines three slits at a time in the first plane winch
form interference fringes.
V The movement can be determined by a detector. The total number of slits in the
first plane is governed by the length over which measurement is required
Grating
The spacing between the slits and
distance of the slit to the
piano of the grating depend on the
wavelength of the light used.
Interference \
208
3. Scanning Laser gauge
V Fig shows a schematic diagram of a scanning laser gauge. It consist of transmitter, receives
and processor electronics.
V A thin band of scanning laser light is made to pass through a linear scanner lens to render it
parallel beam. "The object placed in a parallel beam casts a time dependent shadow.
V Signal from the light entering the photocell (receiver) arc proc by a microprocessor to
provide display of the dimension represented by ihe time difference between the shadow
edges.
V It can provide results to an accuracy otIJ.25 for l()-4()mni diameter objects. It can be used
for objects 0.05mm to 450mm diameter: and offers repeatability of 0 .1 urn
LASER METROLOGY
PRECISION INSTRl'MENT BASED ON LASER:
v laser stands tor Light Amplification h> Stimulated Emission or Radiation.
V Laser instrument is a device to produce powerfuL monochromatic, collimated beam of light in
which the waves are coherent.
v Laser development is for production of clear coherent light. The advantage of coherent light is that
whole of the energy appears to be emanating from a very small point.
v The beam can be focused easily into either a parallel beam or onto a very small point by use of lenses
A major impact on optical measurement has been made by development in elector optics, providing
automation, greater acuity of setting and faster response time.
V Radiation sources have developed in a number of areas, the most important developments are light
emitting diodes and lasers.
V The laser is used extensively for intcrferometry particularly ihe He- Nc gas type. The laser distance
measuring interferometer has become an industry standard.
v This produces 1 to 2mm diameter beam of red light power of IMW and focused at a point of very high
intensity. The beam begins to expand at a rate of lmm/m. The laser beam is visible and it can be
observed easily.
v This is used for very accurate measurements of the order of O.lum is 100m. LASER METROLOGY
v Metrology lasers are low power instruments. Most arc helium-neon type. Wave output laser that emit
visible or infrared light. Hc-Nc lasers produce light at a wavelength of 0.6um that is in phase,
coherent and a thousand times more intense than any other monochromatic source.
V Laser systems have wide dynamic range, low optical cross talk and high contrast, v Laser fined
application in dimensional measurements and surface inspection
because of the properties of laser light.
V These arc useful where precision, accuracy, rapid non-contact gauging of soli, delicate or hot
moving points.
L'SE OF LASER
1. Laser Telemetric system:
V Laser lelemelric system is a non-contact gauge that measures with a collimated laser beam. It
measures at the rate of 150 scans per second.
v It basically consists of three components, a transmitter, a receiver and processor
electronics. The transmitter module produces a collimated parallel scanning laser
beam moving at a high constant, linear speed, v The scanning beam appears a red line. The receiver
module collects and
209
photoclically senses the laser light transmitted past the object being measured, v The processor
electronics takes the received signals to convert them 10 a
convenient form and displays the dimension being gauged, v The transmitter contains a low power
helium-neon gas laser and its power supply.
a specially designed collimating lens, a synchronous motor, a multi faceted
210
V
Gat Edge
Scunner
e
1 sensi
Output ni
(Digital
display
2. Laser and LED based distance measuring instruments system)
V These can measure distances from I to 2in with an accuracy of the order of 0. 1 to I %
of the measuring range When the light emitted by laser or LED hits an object, scatter
and same of this scattered light is seen by a position sensitive detector or diode array.
If the distance between the measuring head and the object changes, the angle at
V which the light enters the detector will also change.
The angle of deviation is calibrated in terms of distance and output is provided as
v 0-2OmA. Such instruments are very reliable because there arc no moving parts their
response time is milliseconds.
The measuring system uses two distance meters placed at equal distance on cither
V side of the object and a control unit to measure the thickness of an object. The
distance meter is focused at the centre of the object.
Control
unit »ith
disnlaj
3. Scanning Laser gauge
V Fig shows a schematic diagram of a scanning laser gauge. It consist of transmitter.
receives and processor electronics, v A thin band of scanning laser light is made to
pass through a linear scanner lens to
render it parallel beam. "The object placed in a parallel beam casts a time
dependent shadow, v Signal from the light entering the photocell (receiver) arc proc
by a
microprocessor lo provide display of ihe dimension represented by the time
difference between the shadow edges, v ll can provide results to an accuracy
of<).25 for 10—50mm diameter objects. It
can be used for objects 0.05mm to 450mm diameter; and offers repeatability of
O.lum
Routing muii
Scan
photoce
K ll
scanner
motor
Display pp based data
*
jperator acquisition & & decoding.
211
V Its use is restricted to small wires. The measurement accuracy is more for smaller parts. The
distance between the alternating light and dark hands in the diffraction pattern is a (tired
function of the wile diameter, wavelength of laser beam and the local length of the lens.
6. Two- frequency laser interferometer
V Fig. shows schematic arrangement. This consists of two frequency laser head, beam
directing and splitting optics, measurement optics, receivers, and wavelength
compensators and electronics.
V ll is ideally suited for measuring linear positioning straightness in two planes, pilch
and yaw.
212
Reference beam
Reforefiector
(S
(fixed)
lo elecironic
polari
sed) Interferometer
receiver
V The iwo-frcqucncy laser head provides one frequency with P polarisation and another
frequency with S-polarisation.
V The laser beam is split at the polarizing beam splitter into its two separate frequencies.
V The measuring beam is directed through the interferometer lo reflect off a target mirror
or retro reflector attached lo the object to be measured. The reference beam is reflected from fixed
V retro reflector. The measurement beam on its return path recombines with the reference
beam and is directed to the electronic receiver. 7. Gauging wide diameter from the diffraction
pattern formed in a laser
V Fig.( 1) shows a method of measuring the diameter of thin wire using the interference
fringes resulting from diffraction of the light by the wire in the laser beam.
V A measure of the diameter can be obtained by moving the photo detector until the
output is restored lo its original value.
V Changes in wire diameter as small as 0.2% over wire diameter from 0.005 to 0.2mm
can be measured..
Collimator Diuraction
V partem
Fig. (2) shows the length measurement by fringe counting. The laser output, which
may be incoherent illumines three slits at a time in the first plane which form
V interference fringes.
The movement can be determined by a detector. The total number of slits in the
first plane is governed by the length over which measurement is required
Grating
The spacing between the slits and
Detector
distance of the slit lo the plane of the
grating depend on the wavelength
of the light used.
Interference \
213
PRINCIPLE OF LASER
V The photon emitted during stimulated emission has the same energy, phase and
frequency as the incident photon.
v This principle states that the photon comes in contact with another atom or molecule in
the higher energy level E2 then it will cause the atom lo return to ground slate energy
level El by releasing another photon.
v The sequence of triggered identical photon from stimulated atom is known as
stimulated emission. This multiplication of photon through stimulated emission
leads to coherent, powerful monochromatic, collimated beam of light emission. This
Ught emission is called laser.
Axis2 50%
33% beam
ipliler
67%
13Hbc
AjcM am *
iplitci A.\i
33%f 3
bl Beam benders:
V These arc used lo deflect the light beam around corners on its path from the laser to each
axis.
V These arc actually just flat mirrors but having absolutely flat and very high reflectivity.
Normally these arc restricted to 90° beam deflections to avoid disturbing the polarizing
vectors.
c) Rvlru reflectors:
V These can be plane mirrors, roof prism or cube comers. Cube corners are three mutually
perpendicular plane mirrors and the reflected beam is always parallel to the incidental beam./
V Each ACU transducers need two retro reflectors. All ACLI measurements arc made by
sensing differential motion between two retro reflectors relative to an interferometer.
V Plane mirror used as retro reflectors with the plane mirror interferometer must be flat to
within 0.06 micron per cm.
(iii) Laser head's measurement receiver
v During a measurement the laser beam is directed through optics in the measurement path and then
returned to the laser head is measurement receiver which will detect part of the returning beam and a
doppler shifted frequency component. ti\ i Measurement display
v It contains a microcomputer to compute and display results. The signals from receiver and
measurement receiver located in the laser head are counted in two separate pulse converter and
subtracted. V Calculations arc made and the computed value is displayed. Other input signals for
correction are temperature, co-efficient of expansion, air velocity etc.. which can be displayed, (v)
Various version of ACLI a) Standard Interferometer:
V Least expensive.
V Retro reflector for this instrument is a cube corner.
V Displacement is measured between the interferometer and cube comer.
.Measured
chance* in_ ihis distance
Interferometer
To receiver
214
h,Signal beams Interferometer:
V Beam traveling between the interferometer and the retro reflector.
V Its operation same as standard interferometer.
V The interferometer and retro reflector for this system arc smaller than the
standard system.
V Long range optical path
V Easy installation
V Wear and tear.
215
LASER INTERFEROMETER
v It is possible lo maintain the quality of interference fringes over longer distance when lamp is
replaced by a laser source:
v Laser interferometer uses AC laser as the light source and the measurements to be made over
longer distance.
Laser is a monochromatic optical energy, which can be collimated into a directional beam
AC. Laser interferometer (ACLI) has the following advantages. 0 High repeatability High
accuracy Long range optical path Easy installations Wear and tear
O Schematic arrangement of laser interferometer is shown in fig.
0 Two-frequency zceman laser generates light of two slightly different
o frequencies with opposite circular polarisation.
These beams gel split up by beam splitter B One pan travels towards B and
V from o
Reference signal
A■
V This interferometer uses cube comer reflectors which reflect light parallel to its angle of
incidence. Beam splitter B 2 optically separates the frequency J which alone is sent to the
movable cube corner reflector.
V The second frequency from B2 is sent to a fixed reflector which then rejoins f 1 at the beam
splitter B 2 to produce alternate light and dark interference flicker at about 2 Mega cycles
per second. Now if the movable reflector moves, then the returning beam frequency
Doppler-shifted slightly up or down by Af
V Thus the light beams moving towards photo detector P2 have frequencies i2 and (fi ± Af i,
and P2 changes these frequencies into electrical signal. Photo detector P 2 receive signal
V from beam splitter B2 and changes the reference beam frequencies f( and f 2 into electrical
signal
V An AC amplifier A separates frequency, difference signal f 2 - ft and A2 separates
frequency difference signal.
The pulse converter extracts i. one cycle per half wavelength of motion. The up-down
pukes arc counted electronically and displayed in analog or digital form
216
Ml< TIKLSON INTERFEROMETER
V Michclson interferometer consist of a monochromatic light source a beam splitter and two
mirrors.
v The schematic arrangement of Michclson interferometer is shown in fig. The rnonochromatic
light falls on a beam splitter, which splits the light into two rays of equal intensity at right
angles. One ray is transmitted lo mirror M| and other is reflected through beam splitter to
mirror M2,.
V From both these mirrors, the rays arc reflected back and these return at ihe semi-reflecting
surface from where they are transmitted lo the eye.
V Mirror M2 is fixed and mirror M| is movable. 11 both the mirrors are at same distance from
beam splitter, then light will arrive in phase and observer will see bright spot due to
constructive interference.
v If movable mirror shifts by quarter wavelength, then beam w ill return lo observer 180° out of
phase and darkness will be observed due to destructive interference
Fined mirror V ,
V Each half-wave length of mirror travel produces a change in the measured optical path of one
wavelength and ihe reflected beam from ihe moving mirror shifts through 360° phase change.
v When Ihe reference beam reflected from the fixed mirror and the beam reflected from ihe
moving mirror rejoin ai Ihe beam splitter, they alternately reinforce and cancel each other as
the mirror moves Thus each cycle of intensity at the eye represents A/2 of mirror travel.
V When while Ught source is used then a compensator plate is introduced in each of the path of
mirror Mi So (hat exactly ihe same amount of glass is introduced in each of the path.
V To improve the Michelson inierferometer
li) Use of laser Ihe measurements can be made over longer distances and highly
accurate measurements when compared lo other monochromatic sources, lii) Minors
are replaced by cube-comer reflector which reflects light parallel to iis angle of
incidence.
liii) Photocells are employed which convert light intensity variation in voltage pulses to give the
amount and direction of position change. I > I VI- FREQUENCY LASER INTERFEORMETER
v This instrument is used to measure displacement, high-precision measurcmenis of length,
angle, speeds and refractive indices as well as derived sialic and dynamic quantities.
s
v This system can be used for both incremental displacement and angle measurements. Due to
large counting range it is possible to attain a resolution of 2mm in 1 Om measuring range.
V Means arc also provided to compensate for the influence of ambient temperature, material
temperature, atmospheric pressure and humidity fluctuation.
TWYMAN-GREEN INTERFEROMETER
V The Twyman-Grecn interferometer is used as a polarizing interferometer with variable
amplitude balancing between sample and reference waves.
V For an exact measurement of the test surface, the instrument error can be determined by an
absolute measurement. This error is compensated by storing the same in microprocessor
system and subtracting from the measurement of the test surface.
V It has following advantages
1. It permits testing of surface with wide varying reflectivity.
2. It avoids undesirable feed back of light reflected of the tested surface and
the instrument optics.
3. It enables utilization of the maximum available energy.
4. Polarisation permits phase variation to be effected with the necessary
precision.
LASER VIEWERS
V The profile of complex components like turbine blades can be checked by the use of
optical techniques. It is based on use of laser and CCTV.
V A section of the blade, around its edge is delineated by two flat beam of laser
light. This part of the edge is viewed at a narrow angle by the TV camera or beam
splitter.
V Both blade and graticule are displayed as magnified images on the monitor, the
graticule position being adjustable so that its image can be superimposed on the
profile image.
V The graticule is effectively viewed at the same angle as the blade. So. distortion due
lo viewing angle affects both blade and graticule. This means that the graticule
images arc direct 1:1.
218
interfekometric measurement of angle
V With laser interferometer it is possible to measure length to an accuracy of 1 part in
106 on a routine basis.
V With the help of two retro reflectors placed at a fixed distance and a length measuring
laser interferometer the change in angle can be measured to an accuracy of 0.1
second. The device uses sine Principle.
V The line joining the poles the retro-reflectors nukes the hypotenuse of the right
triangle. The change in the path difference of the reflected beam represents the side of
the triangle opposite to the angle being measured.
Such laser interferometer can be used to measure an angle up to ± 10 degrees with a
resolution of 0. 1 second. The principle of operation is shown in fig.
t,
InterferonwkT
Um Reflctlor mourn
219
4) Runout
5) Periodical axial slip
6) Camming
PART-A
PART-B
1. What Is meant by alignment test on machine tools? Why they arc necessary? Explain.
2. Slate the basic principle and use of Laser.
3. Distinguish between geometrical and practical test on machine 4.Skctch and explain the
Michclson interferometer in detail. 5.Skctch and describe the optical system in any two of the
following.
a. Laser interferometer.
b. N.P.L. Flatness interferometer.
6. Sketch and explain the Two frequency interferometer in detail.
7.Slale the applications of Lasers in Linear and Angular measurements
8. Slate the applications of Laser Interferometer in testing of machine tools?
220
INTERFEROMETR1C MEASUREMENT OF ANGLE
v Wkh laser intcrfcn>me!cr it is possible lo measure length to an accuracy of 1 part
in 106 on a routine basis, v With the help of two retro reflectors placed al a fixed
distance and a length
measuring laser Interferometer the change in angle can be measured to an
accuracy of 0.1 second. The device uses sine Principle, v The line joining the poles the
retro-reflectors nukes the hypotenuse of the right
iriangle. The change in the path difference of the reflected beam represents the
&
side of the triangle opposite lo the angle being measured.
V Such laser interferometer can be used to measure an angle up lo ± 10 degrees with a
resolution of 0. 1 second. The principle of operation is shown in fig.
L|
Ke Hector mount
LASER EQUIPMENT FOR ALIGNMENT TESTING
v This testing is particularly suitable in aircraft production, shipbuilding etc.
Interferometer
Laser
Where
a number of components, spaced long distance apart. ha\c to be checked to a
predetermine straight line, v Other uses of laser equipment arc testing of flatness of
machined surfaces.
checking square ncss with the help of optical square etc. v These consist of laser lube
will produces a cylindrical beam of laser about 10mm
diameter and an auto reflector with a high degree of accuracy.
V Laser tube consist of helium-neon plasma tube in a hea aluminum cylindrical housing.
The laser beam comes out of the housing from its centre and parallel to ihe housing
within 10" of arc and alignment stability is the order of 0.2" of arc per hour.
V Auio reflector consists of detector head and read out unit. No. of photocell arc
arranged to compare laser beam in each half horizontally and vertically.
V This is housed on a shard which has two adjustments to translate the detector in its
two orthogonal measuring directions perpendicular lo the laser beam. The devices
deled the alignment of flat surfaces perpendicular lo a reference line of sight.
MACHINE TOOL TESTING
V The accuracy of manufactured parts depends on ihe accuracy of machine tools.
V The quality of work piece depends on Rigidity and stiffness of machine tool and its
components.
V Alignment of various components in relation to one another Quality and accuracy of driving
mechanism and control devices.
V It can be classified into
1. Static tests
2. Dynamic lesis.
Static tests:
v If the alignment of ihe components of ihe machine tool are checked under static
conditions then the lest are called static lest.
V This system can be used for both incremental displacement and angle measurements. Due
to large counting range it is possible to attain a resolution of 2mm in 10m measuring
range.
V Means arc also provided lo compensate for the influence of ambient temperature, material
temperature, atmospheric pressure and humidity fluctuation.
TWYMAN-GREEN INTERFEROMETER
V The Twyman-Green interferometer is used as a polarizing interferometer with variable
amplitude balancing between sample and reference waves.
V For an exact measurement of the test surface, the instrument error can be determined by
an absolute measurement. This error is compensated by storing the same in
microprocessor system and subtracting from the measurement of the test surface.
V It has following advantages
1. It permits testing of surface with wide varying reflectivity.
2. It avoids undesirable feed back of light reflected of the tested surface
and the instrument optics.
3. It enables utilization of the maximum available energy.
4. Polarisation permits phase variation to be effected with the necessary
precision.
LASER VIEWERS
V The profile of complex components like turbine blades can be checked by the use
of optical techniques. It is based on use of laser and CCTV.
V A section of the blade, around its edge is delineated by two flat beam of laser light.
This part of the edge is viewed at a narrow angle by the TV camera or beam
splitter.
221
V Both blade and graticule are displayed as magnified images on the monitor, the
graticule position being adjustable so that its image can be superimposed on the
profile image.
V The graticule is effectively viewed at the same angle as the blade. So, distortion
due lo viewing angle affects both blade and graticule. This means that the
graticule images arc direct 1:1.
UNIT-IV
LASER METROLOGY
PRECISION INSTRUMENT BASED ON LASER:
V Laser stands for Light Amplification by Stimulated Emission of Radiation.
V Laser instrument is a device to produce powerful, monochromatic, collimated beam
of light in which the waves are coherent
V Laser development Ls for production of clear coherent light. The advantage of
coherent light Ls that whole of the energy appears to be emanating from a very small
point.
V The beam can be focused easily into either a parallel beam or onto a very small point
by use of lenses A major impact on optical measurement has been made by
development in elector optics, providing automation, greater acuity of selling and
faster response time.
V Radiation sources have developed in a number of areas, the most important
developments are light emitting diodes and lasers.
v The laser is used extensively for interfcrometry particularly the He- Ne gas type. The
laser distance measuring interferometer has become an industry standard.
V This produces 1 lo 2mm diameter beam of red light power of 1MW and focused at a
point of very high intensity. The beam begins to expand at a rale ol lmm/m. The laser
beam is visible and il can be observed easily.
V This is used for very accurate measurements <>l the order of O.lum is 100m. LASER
METROLOGY
V Metrology lasers are low power instruments. Most are hchum-ncon type.
Wave-output laser that emit visible or infrared light. Hc-Nc lasers produce light at a
wavelength of 0.6um that is in phase, coherent and a thousand times more intense
than any other monochromatic source.
V Laser systems have vv ide dynamic range, low optical cross talk and high contrast.
V Laser fined application in dimensional measurements and surface inspection because
of the properties of laser light.
V These are useful where precision, accuracy, rapid non-contact gauging of soft,
delicate or hot moving points.
USE OF LASER
1. Laser Telemetric system:
V Laser telemetric system is a non-contact gauge thai measures with a collimated laser
beam. It measures al the rate of 150 scans per second.
V It basically consists of three components, a transmitter, a receiver and processor
electronics. The transmitter module produces a collimated parallel scanning laser
beam moving at a high constant, linear speed.
V The scanning beam appears a red line. The receiver module collects and photoelically
senses the laser light transmitted past the object being measured.
V The processor electronics takes the received signals lo convert them 10 a convenient
lorm and displays the dimension being gauged.
v The transmitter contains a low power helium-neon gas laser and its power supply, a
specially designed collimating lens, a synchronous motor, a multi faceted
222
reflector pnsin. a synchronous pulse pholo detector and a protective replaceable
window.
The high speed of scanning permits on line gauging and thus it is possible lo detect
changes in dimensions when components are moving on a continuous product such as
in rolling process mov ing at very high speed. There is no need of waiting or product lo
V cool for taking measurements. 11ns system can also be applied on production machines
and control then with closed Iced back loops.
Since the output of this system is available in digital form, it can run a process controller
V limit alarms can be provided and output can be taken on digital printer.
Hystersis
synchronous
Object to !>c
measured
Output (Digital
I La*--' display system)
f---------------- *W
Counter
U
L 41
O
b
B
Conlri
.l unit
with Ji
.f ■
223
3. Scanning Laser gauge
V Fig shows a schematic diagram of a scanning laser gauge. It consist of transmitter,
receives and processor electronics.
V A thin band of scanning laser light is made lo pass through a linear scanner lens lo
render it parallel beam. 'The object placed in a parallel beam, casts a time dependent
shadow.
V Signal from the light entering the photocell (receiver) arc proc by a microprocessor
to provide display of the dimension represented by the time difference between the
shadow edges.
V It can provide results to an accuracy oil).25 for l()—SOmm diameter objects. It can
be used for objects 0.05mm to 450mm diameter: and offers repeatability of 0.1 urn
Rotating mimn
scanner motor Linear
a
Referenc Reforetlector
e /(fixed)
leasurmcnt beam
I MWit
M.I!
(f polarised)
,:si
To electronic Target
receive mirror
r
bean (S
polaristdL
V The iwo-frequeney laser head provides one frequency w nh F polarisation and another
frequency with S-polarisation.
V The laser beam is split at the polarizing beam splitter into its two separate frequencies.
v The measuring beam is directed through the interferometer to reflect off a target mirror or
retro reflector attached to the object to be measured.
V The reference beam is reflected liom fixed retro rellector. The measurement beam on its
return path rccombmcs with the reference beam and is directed to the electronic receiver.
7. Gauging wide diameter from the diffraction pattern formed in a laser
V Fig.( 1) shows a method of measuring the diameter of thin w ire using the interference
fringes resulting from diffraction of the light by the wire in the laser beam.
V A measure of the diameter can be obtained by moving the photo detector until the output
is restored to us original value.
v Changes in w ire diameter as small as 0.2% over w ire diameter from 0.005 to 0.2mm can
be measured..
Plane
ot
mcasurme
ni
Diffraction
partem
V Fig. (2) shows the length measurement by fringe counting. The laser output, which
may be incoherent illumines three slits at a time in the fust plane which form
interference fringes.
V The movement can be determined by a detector. The total number of slits in the first
plane is governed by the length over
which measurement is required
Fqui-spaced Detector
slits & counter Orating
The spacing belw ecu the slits and
distance of the slit to the plane of
Interference
the IV grating depend on the wavelength
of the light used.
V
PRINCIPLE OF LASER
V The photon emitted during stimulated emission has the same energy, phase and
frequency as the incident photon.
V This principle states that the photon comes in contact with another atom or
molecule in the higher energy level 1:2 then it will cause the atom to return to
ground state energy level Ll by releasing another photon.
v The sequence of triggered identical photon from stimulated atom Ls known as
stimulated emLssion. ThLs multiplication of photon through stimulated emission
leads lo coherent, powerful, monochromatic, collimated beam of light emLssion.
This light emLssion is called laser.
2 Axi
* toon
33%
beam
Agjjj
33 %i laser 5 S3
splilcr
100 %
'Axiv
%
laser t
25%
5
b) Beam benders:
V These are used to deflect the light beam around corners on its path from the laser to each
.IMS.
V These are actually just Hal mirrors but having absolutely flat and very high reflectivity.
Normally these are restricted to l K f beam deflections to avoid disturbing the polarizing vectors.
e) Retro reflectors:
V These can be plane mirrors, roof prism or cube comers. Cube corners are three mutually
perpendicular plane mirrors and the reflected beam is always parallel to the incidental beam.."
V Each ACLI transducers need two retro reflectors. All ACLI measurements are made by sensing
differential motion between two retro reflectors relative to an interferometer.
V Plane mirror used as retro reflectors with the plane mirror interferometer must be flat to within
0.06 micron per cm.
in Laser head's measurement receiver
V During a measurement the laser beam is directed through optics m the measurement
path and then returned to the laser head is measurement receiver which will delect part of the
returning beam and a doppler shifted frequency component.
(iv) Measurement display
V It contains a microcomputer to compute and display results. The signals from receiver and
measurement receiver located in the laser head are counted in two separate puLse converter
and subtracted.
V Calculations are made and the computed value is displayed. Other input signals for
correction are temperature, co-efficient of expansion, air velocity etc.. which can be
displayed. (v) Various
version of ACLI a I Standard
Interferometer:
V Least expensn e
V Retro reflector for this instrument is a cube corner.
V Displacement is measured between the interferometer and cube corner.
. m __ Measured chances in r.
■his distance
To receiver
V This interferometer uses cube coiner reflectors which reflect light parallel to its angle of
incidence. Beam splitter B3optically separates the frequency J which alone is sent to the movable
cube corner reflector.
V The second frequency from B; is sent to a fixed reflector which then rejoins 1 1 at the beam
splitter B2 to produce alternate light and dark interference flicker at about 2 Mega cycles per
second. Now if the movable reflector moves, then the returning beam frequency Dopplcr-shiftcd
slightly up or down by Af
V Thus the light beams moving towards photo detector P2 have frequencies 1: and (f 1 ± Af 1, and
P; changes these frequencies into electrical signal.
V Photo detector P2 receive signal from beam splitter B2 and changes the reference beam
frequencies 1, and f; into electrical signal.
V An AC amplifier A separates frequency, difference signal f2 - f, and A: separates frequency
difference signal.
V The pulse converter extracts i. one cycle per half wavelength of motion. The up-down puLses
are counted electronically and displayed in analog or digital form.
227
MICHELSON INTERFEROMETER
V Michclson interferometer consist of a monochromatic light source a beam splitter and two
mirrors.
V The schematic arrangement of Michclson interferometer is shown m fig. The monochromatic
light falls on a beam splitter, which splits the light into two rays of equal intensity at right angles.
One ray is transmitted to mirror Mi and other is reflected through beam splitter lo mirror Mi..
V From both these mirrors, the rays are reflected back and these return at the serni-rcfleeting surface
from where thcv arc transmitted to the eye.
V Mirror M; is fixed and mirror M, is movable. II both the mirrors are at same distance from beam
splitter, then light will arrive in phase and observer will see bright spot due to constructive
interference.
V If movable mirror shifts by quarter wavelength, then beam will return to observer 180° out of
phase and darkness w ill be observed due to destructiv c interference
Fixed mirror M,
Beam spliter
<5<r%Reflettnce
)
sourc
e
Eye or
detecto
r
v Each half-wave length of mirror travel produces a change in the measured optical path of one
wavelength and the reflected beam from the moving mirror shifts through 360° phase-change.
V Wlien the reference beam reflected from tlx.* fixed mirror and the beam reflected from the
moving mirror rejoin at the beam splitter, they alternately reinforce and cancel each other as the
mirror moves Thus each cycle of intensity at the eve represents hll of mirror travel.
V When white light source is used then a compensator plate is introduced in each of the path of
mirror Mi So that exactly the same amount of glass is introduced in each of the path.
V To improve the Michclson interferometer
li) Use of laser the measurements can be made over longer distances and highly accurate
measurements when compared to other monochromatic sources. Iiii Mirrors are replaced
by cube-corner reflector which reflects light parallel lo its angle of incidence.
liii) Photocells are employed which convert light intensity variation in voltage-pulses lo
give the amount and direction of position change.
DUAL FREQUENCY LASER INTERFEORMETER
V fhis instrument is used to measure displacement, high-precision measurements ol length, angle,
speeds and refractive indices as well as derived static and dynamic quantities.
228
v This system can be used for both incremental displacement and angle measurements. Due
to large counting range it Ls possible lo attain a resolution of 2mm in 10m measuring
range.
v Means arc also provided to compensate for the influence of ambient temperature, material
temperature, atmospheric pressure and humidity fluctuation.
TWYMAVGREEN INTERFEROMETER
V The Twyman-Green interferometer is used as a polarizing interferometer with variable
amplitude balancing between sample and reference waves.
V For an exact measurement of the test surface, the instrument error can be determined by
an absolute measurement. This error is compensated by storing the same in
microprocessor system and subtracting from the measurement of the test surface.
V It has following advantages
1. It permits testing of surface with wide varying reflectivity.
2. It avoids undesirable feed back of light reflected of the tested surface
and the instrument optics.
3. It enables utilization of the maximum available energy.
4. Polarisation permits phase variation to be effected with the necessary
precision.
LASER VIEWERS
V The profile of complex components like turbine blades can be checked by the use
of optical techniques. It is based on use of laser and CCTV.
V A section of the blade, around its edge is delineated by two flat beam of laser
light. This part of the edge is viewed at a narrow angle by the TV camera or beam
splitter.
V Both blade and graticule are displayed as magnified images on the monitor, the
graticule position being adjustable so that its image can be superimposed on the
profile image.
V The graticule is effectively viewed at the same angle as the blade. So. distortion
due lo viewing angle affects both blade and graticule. This means thai the
graticule images arc direct 1:1.
229
INTERFEROMETRIC MEASUREMENT OF ANGLE
V With laser interferometer it ls possible to measure length to an accuracy of I part in 106 on a routine basis.
V With the help of two retro reflectors placed at a fixed distance and a length measuring laser interferometer the
change in angle can be measured to an accuracy of 0.1 second. The device uses sine Principle.
v The line joining the poles tlic retro-reflectors makes the hypotenuse of the right triangle. The change in the path
difference of the reflected beam represents the side of the triangle opposite to the angle being measured.
V Such laser interferometer can be used to measure an angle up to r 10 degrees with a resolution of 0. 1 second. The
principle of operation is shown in fig.
L,
Interferometer
Laser Reflector mount
These consist of laser tube will produces a cylindrical beam of laser about 10mm diameter and an auto reflector with
a high degree of accuracy. Laser lube consist of helium-neon plasma lube in a hea aluminum cy hndrical housing.
V The laser beam comes out of the housing from its centre and parallel to the housing within 10" of arc and alignment
stability is the order of 0.2"' of arc per hour.
V Auto reflector consists ol detector head and read out unit. No. of photocell are arranged to compare laser beam in
each halt horizontally and vertically.
V This is housed on a shard which has two adjustments to translate the detector in its two orthogonal measuring
directions perpendicular to the laser beam. The de\ ices detect the alignment of flat surfaces perpendicular lo a
reference line of siuhl.
MACHINE TOOL TESTING
V The accuracy of manufactured parts depends on the accuracy of machine tools
V The quality of work piece depends on Rigidity and stillness of machine tool and its components.
V Alignment of various components in relation lo one another l)ualny and accuracy of driving mechanism and control de\ ices.
V It can be classified into
1. Static tests
2. Dynamic tests.
Static tests:
V I f the alignment of the components of the machine lool are checked under static-conditions then the lest are called
static test.
Dynamic tests:
V If the alignment tests are carried out under dynamic loading condition. The
accuracy of machine tools which cut metal by removing chips is tested by two types
of test namely.
1. Geometrical tests
2. Practical tests.
Geometrical tests:
V In this test, dimensions of components, position of components and displacement
of component relative lo one another Ls checked.
Practical tests:
V In these lest, test pieces arc machined in the machines. The test pieces must be
appropriate to the fundamental purpose for which the machine has been designed.
230
Main spindle is lo be tested for
1) Out of round.
2) Eccentricity
3) Radial throw of an axis.
4) Runout
5) Periodical axial slip
6) Camming
PART-A
PART-B
1. What is meant by alignment test on machine tools? Why (hey are necessary? Explain.
2. Stale the basic principle and use of Laser.
3. Distinguish between geometrical and practical test on machine -l.Sketch and
explain the Michclson interferometer in detail.
5.Sketch and describe ihe optical system in any two of the following.
a. Laser interferometer.
b. N.P.L Flatness interferometer.
6 Sketch and explain the Two frequency interferometer in detail. 7.Slate the applications of
Lasers in Linear and Angular measurements
8. State the applications of Laser Interferometer in testing of machine tools?
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