166x Umen0104 PDF

Manual Supplement
Manual Title: 1662/1663/1664 FC Users Supplement Issue: 4

Print Date: October 2015 Issue Date: 6/19
Revision/Date: 1, 4/16 Page Count: 3
This supplement contains information necessary to ensure the accuracy of the

above manual.
© 2016-2019 Fluke Corporation. All rights reserved. x

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1662/1663/1664 FC Users Manual Supplement
Change #1, 579

On page 74, under General Specifications, add the following under the Electromagnetic
Compatibility (EMC)
Some mobile devices that transmit RF energy may transmit levels that far exceed 3 V/m and may damage sensitive electronic
circuits. To insure the best performance, do not allow a device which is transmitting RF energy in excess of 3 V/m to be within
30 cm of the Tester while in use.
Change #2, 594

On page 84, replace the Test Signals table with:
Test Signals
RCD Type Test Signal Description
AC The waveform is a sinewave starting at zero crossing, polarity
(sinusoidal) determined by phase selection (0 ° phase starts with low to high zero
crossing, 180 ° phase starts with high to low zero crossing). The
magnitude of the test current is I∆n x Multiplier for all tests.
A The waveform is a half wave rectified sinewave starting at zero,
(half wave) polarity determined by phase selection (0 ° phase starts with low to
high zero crossing, 180 ° phase starts with high to low zero crossing).
The magnitude of the test current is 0.7 x IΔn (rms) x Multiplier for all
tests where the multiplier is x0.5 (x1/2). The magnitude of the test
current is 2.0 x IΔn (rms) x Multiplier for all tests where both the
multiplier is ≥ x1 and IΔn = 0.01A. The magnitude of the test current is
1.4 x IΔn (rms) x Multiplier for all tests for all other settings.
B (DC) This is a smooth DC current according to EN61557-6 Annex A
Change #3, 426

On page 63, replace the Memory Mode section with:
Memory Mode
You can store up to 3000 measurements on the Tester. The information stored
for each measurement consists of the test function and all user selectable test
conditions.
The location identifier includes a location set number (a), location subset
number (b), and location ID number (c). You can store multiple measurements
to the same memory location (a, b, c) and view later with the Tester or a
software program such as Fluke DMS Software. With DMS you have additional
tools to apply custom labels to these memory locations. See the DMS Software
User Manual for more information.
' Use the location set field (a) to indicate a site reference
number.
Use the location subset field (b) to indicate a location such
as a room or electrical panel number.
h Use the location ID field (c) for circuit number.
To enter Memory mode:
1. Press M to enter Memory mode. See Figure Error! Reference source not found..
6/19 1
Manual Supplement 1662/1663/1664 FC Users
On page 63 in the German manual, replace the Speichermodus, section with:

Speichermodus
Es können bis zu 3.000 Messungen im Tester gespeichert werden. Die für jede Messung gespeicherten Informationen
umfassen die Messfunktion und alle Messparameter, die der Bediener auswählen kann. Der Standortbezeichner inkludiert
eine Nummer für die Ebene a (Anlage), die Ebene b (Verteiler) und die Ebene c (Stromkreis). Sie können mehrere
Messwerte auf derselben Speicherposition (a, b, c) speichern und später mit dem Tester oder einem Softwareprogramm
wie Fluke DMS anzeigen. DMS bietet Ihnen zusätzliche Tools, um diesen Speicherpositionen benutzerdefinierte
Kennungen zuzuweisen. Weitere Informationen finden Sie im Bedienungshandbuch zur DMS Software.
' Das Feld für die Ebene a (Anlage)

Das Feld für die Ebene b (Verteiler)
h Das Feld für die Ebene c (Stromkreis)
Aktivieren des Speichermodus:

1. M drücken, um den Speichermodus zu aktivieren. Siehe Abbildung 15.
Change #4, 692

On page 12, Table 6, replace number  with:
 A Turn on and turn off the backlight. Hold 1 second to get into IT mode selection.
On page 20, Table 10, replace the second row with:

IT mode toggle In IT mode, a loop test or an RCD test is allowed even if the voltage N-PE
O 2 IT mode is higher than 25 V / 50 V. The default setting is IT OFF. See page 12, number , for IT
toggle mode selection.
On page 35, Table 14, replace the first row with:
 • • •
Input section:
 • • •
Input select for IT mode:
On page 36, replace the Note, with:
Note
Errors may occur due to equipment on the circuit under test. If the measurement
is too noisy, “Err5” will alternate with the measured value. Pressing the U key will
show the available readings in the secondary display. If the Tester shows 0.00 Ω,
consider that no perfect circuit exists. Check for correct leads connection to
instrument, leads are zeroed, and fuse is good.
2 6/19
1662/1663/1664 FC Users Manual Supplement
On page 39, under Loop Impedance in IT System Measurement, replace the paragraph
and Figure 6 with:
Select IT mode with the power up option or use the backlight key on the front panel:
• Press the backlight key for 1 second to see the IT mode status.
• Use the   arrow key to toggle On/Off for IT mode.
• L-PE loop measurement not available in NT loop during IT mode.
Figure 6. Loop Impedance Test in IT System
On page 53, replace the second paragraph with:

To test an RCD at the mains socket, put the Tester into the IT mode. In this mode the Tester accepts any voltage between
N and PE. The precondition for trip time and current measurements is that the resistance of the earth ground system is low
enough to allow the test current to flow.
6/19 3

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Manual Supplement

Manual Title: 1662/1663/1664 FC Users Supplement Issue: 4

This supplement contains information necessary to ensure the accuracy of the

© 2016-2019 Fluke Corporation. All rights reserved. x

Change #1, 579

Change #2, 594

Change #3, 426

To enter Memory mode:

On page 63 in the German manual, replace the Speichermodus, section with:

' Das Feld für die Ebene a (Anlage)

Aktivieren des Speichermodus:

Change #4, 692

On page 20, Table 10, replace the second row with:

On page 35, Table 14, replace the first row with:

On page 36, replace the Note, with:

Figure 6. Loop Impedance Test in IT System

On page 53, replace the second paragraph with:

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