1078 01

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017
& ANSI/NCSL Z540-1-1994
TRESCAL, INC.10
7350 North Teutonia Avenue
Milwaukee, WI 53209
Dainna Lowrance Phone: 414 351 7420
CALIBRATION
Valid To: May 31, 2021 Certificate Number: 1078.01
In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations1, 10:
I. Acoustical Quantities
Parameter/Equipment Range CMC2, 8 () Comments
Sound Level
Source (85 to 140) dB 0.20 dB + 0.032 % Piston phone,
transducer
Measure (Meters) (20 to 140) dB 0.32 dB Sound level calibrator
Sound Level3
Source/Measure (20 to 140) dB 0.60 dB Sound level calibrator
(Meters)
II. Chemical
Conductivity Meters (1 to 10) µS/cm 0.34 µS/cm Conductivity

(50 to 100) µS/cm 0.96 µS/cm solutions
(1000 to 1413) µS/cm 5.5 µS/cm
(5 to 100) ms/cm 750 µS/cm
(150 to 200) ms/cm 1.5 mS/cm
(A2LA Cert. No. 1078.01) Revised 10/15/2019 Page 1 of 50

Parameter/Equipment Range CMC2 () Comments
pH Meters3 4 pH 0.011 pH Standard buffers

7 pH 0.011 pH
10 pH 0.012 pH
III. Dimensional
Angle Blocks Up to 60 (0.36 + 1.1 *Ө/20) Sine bar, gage blocks,
arcsec, gage amp & probe,
Where Ө = angle
Angle Plates3 Up to 48 in 65 µin or (12 µin/in + 30 Gage amp. probe,

µin), whichever is indi-square and test
greater indicator
Articulating Arm3 (CMM) – ASME B89.4.22-2004
Single Point Articulation (2 to 10.5) ft

Max Deviation 110 µin (2.8µm)
2sSPAT 22 µin (0.56 µm)
Effective Diameter 1 in (25.4 mm) 82 µin (2.1 µm)
Volumetric
Max Deviation (16 to 36) in 60 µin + 7.5 µin/in
(52 to 76) in 60 µin + 7.0 µin/in
Range (16 to 36) in 85 µin + 11 µin/in
(52 to 76) in 85 µin + 9.9 µin/in
2RMS (16 to 76) in 0.98 µin/in
Bench Center –
Center Parallelism Up to 24 in (68 + 4L) µin Gage amp w/probe
Base Flatness & Base Up to 24 in (62 +2.5L) µin

Parallelism

Bore Gages3 Up to 12 in 22 in or 0.6R SIP302M

(whichever is greater)
Box Parallels –
Parallelism 5 in × 10 in × 10 in 28 µin Gage amp w/probe,

Squareness 5 in × 10 in × 10 in 12 µin/in + 38 µin cylindrical square
Calipers3 (Including
Intertest, Oditest, Snap
Jaw and other OD
Calipers) –
Resolution 0.0001 in Up to 2 in 78 µin Gage blocks

(2 to 12) in 70 in + 4 in/in
Resolution 0.0005 in Up to 24 in 450 µin

(24 to 60) in 340 in + 3.7 in/in
Resolution 0.001 in Up to 30 in 840 µin

(30 to 100) in 700 in + 3.4 in/in
Chamfer Gages/Hole Up to 12 in 20 in + 0.6R Cylindrical rings

Gages3
Clinometers and Up to 360° 0.18 arcseconds + 37 Sine bar/gage blocks

Inclinometers, and parts in 106
Electronic Levels
CMMs – Imaging (Video XY diagonal up to ISO 10360-7

CMMs/Vision Systems)3 36.5 in. (Unidirectional)
Length Measurements
EUX, EUY, EUXY Up to 24 in (23 + 2.9L) in Glass scales
EUV Up to 2 in. (15 + 2.9L) in Glass scales
EZ Up to 8 in (Z-axis) (41 + 3.2L) in Gage blocks
Squareness – ESQ Up to 8 in (Z-axis) (19 + 130L) in Ballbar
Probing Performance Diameter Measured:

PF2D, PFV2D (0.012 to 0.12) in 16 in Test circles
(0.12 to 0.4) in. 25 in

CMMs3 –
Length Error (EL) Up to 52 in 38 in + 5.2 in/in ASME

B89.4.1.10360.2, ISO
Repeatability Range (R0) Up to 52 in 22 in + 3 in/in 10360-2
Coating Thickness 25 µin to 0.5 in 19 µin + 82 µin/in ULM

Shims/Precision Shims
Concentricity Gage N/A 130 in + 8 μin/in Indicator, bench center
Cylindrical Plugs3 Up to 4 in 4 in + 5 in/in ULM, gage blocks

(4 to 20) in 4 in + 5.4 in/in
Cylindrical Rings3 (0.1 to 4) in 4 µin + 5 µin/in ULM, gage blocks

(4 to 8.5) in 4 µin + 5.4 µin/in
(8.5 to 18) in 5.2 µin + 5.5 µin/in
(18 to 36) in 50 µin + 3 µin/in
External Spline Gages3 –
Measurement Over Pins Up to 8 in (170 + 28D) in ULM
Circular Tooth Up to 8 in (110 + 16L) µin Vision system

Thickness
Major Diameter Up to 8 in (28 + 12D) in ULM
Fixed Gaging – Up to 30 in (110 + 16L) µin (length Optical comparator,

Screw Pitch Gages, measures) vision system, hand
Drill Gages, Taper tools, hand gages
Gages, Center Gages,
Sheet and Wire Gages, Up to 30 in (330 + 5.8L) µin CMM
Angle Gages, Radius
Gage, Functional Up to 360 degrees 54” Vision system
Gages

Gage Amplifier and

Probe(s)3
Single Probe Up to 0.025 in 8.9 in Gage blocks

Dual Probe Up to 0.002 in 2.1 in Gage blocks
Gage Balls Up to 4 in (32 + 1.5D) in Universal length

machine (ULM)
Gage Blocks Up to 4 in (3.1 + 3.2L) in Gage blocks and

(4 to 20) in (3.3 + 3.2L) in comparator
Height Gage3 Up to 48 in 10 in/in + 0.6R Gage blocks
Height Measures3 Up to 24 in 13 in/in + 94 in Height gage
Indicators3 – Dial & Test, Up to 4 in 35 in or 0.6R Indicator calibrator

LVDTs (whichever is greater)
Indicator Calibrator3 Up to 4 in 12 in + 0.6R Gage blocks, amp

w/probe
Laser Distance Meters Up to 6.1 m 4.6 µm/m + 120 µm ULM

Parameter/Equipment Range CMC2, 4, 8 () Comments
Length & Thickness

Standards, Feeler Gages3 –
Steel Up to 4 in 4 in + 5 in/in ULM, gage blocks

(4 to 20) in 4 in + 5.4 in/in
(20 to 120) in 3.7 µin/in + 14 µin
Field Calibration Up to 16 in 5 µin + 14 µin/in + 4 ULM, gage blocks,

in/in/°C Relative to 20/°C
Levels (Spirit, Bubble, Up to 96 in 5.1 arcseconds + 37 ppm Surface plate and gage
Machinist)3 blocks
Linear Measurement of Up to 20 ft 1.5 μin/in + 0.58 μin Laser

Machine Tools Scales3
Linear Scales/Reticles and

Stage Micrometers –
2D Up to 12 in (115 + 15L) in Vision system
1D Up to 30 in 11 in + 1.5 in/in Gitterperioden

interferometer
Micrometers3 –
Inside Up to 294 in 12 in + 7 in /in + 0.2R ULM, gage blocks or

Depth Up to 12 in 18 in/in + 0.64R rings
Tri-Bores Up to 11 in 18 in/in + 0.7R
Outside Up to 42 in 18 in/in + 0.64R
Groove Up to 4 in 18 in/in + 0.64R
Bench Up to 42 in 18 in/in + 0.64R
Thread (Screw, Thread, Up to 4 in 18 in/in + 0.64R
Pitch, Point)
Microscopes3 –
Reticule Up to 25 mm 23 m Stage micrometer

Magnification Up to 1000x 2.4 %

Optical Comparator3 –
Linear Up to 12 in 0.000 2 in Glass scale

Angle 0º to 360 2’ Calibration sphere
Magnification 10x, 20x, 50x, 0.000 12 in Calibration sphere
62.5x, 100x, 200x
Optical Flats –
Flatness Up to 8 in 3.4 in Reference flat and

monochromatic light
source
Parallelism11 Up to 1.5 in 3.1 in Gage block

diameter and 1 in comparator
thickness
Parallels3 –
Parallelism Up to 72 in 1 µin/in + 20 µin Gage amp w/probe
Pitch Micrometer
Standards –
Length Up to 12 in (22 + 6L) in UMM
Angle Up to 60 54” Vision system
Precision Diameter Tapes Up to 38 in 1.3 µin/in + 280 µin Setting discs, ULM
(38 to 54) in 7.5 µin/in + 250 µin
(54 to 780) in 1.4 µin/in + 430 µin
Profilometers3 120 in Ra 2.8 in Roughness specimen
Protractor – Digital and 0 to 180 0.0076º Sine bar and gage

Mechanical3 blocks
Riser Blocks and Stands Up to 24 in 2 µin/in + 23 µin Gage amplifier

w/probe

Roundness Testers3 –
Coning Error Up to 16 in 11 in Test ball and riser

cylinder
Axial Error Up to 16 in 11 in Test ball
Radial Accuracy Up to 16 in 11 in Test ball
Z-Axis straightness (0.1 to 12) in (14 + 12H) in Cylindrical square; In

the CMC, H is the
height of the cylinder
from the base in inches.
Sine Plates/Bars3 –
Flatness/Parallelism & Up to 20 in 53 in Gage amp w/probe,

Parallelism Cylinder to angle blocks and gage
Base blocks
Angle Calibration 0º to 90º 0.00045º (1.6 arcsec,

Center of Rolls 16 µin/in)
Up to 20 in 17 µin/in (1.8 arcsec)
Sand Sieves 20 µm to 125 mm (3.2 + 6.9L) µm ASTM E11, vision

system
Snap Gages3 – Box parallel with gage

amp and probe
Parallelism Up to 20 in 97 µin
Linear Accuracy Up to 20 in 13 µin/in + 49 µin
Squares3 –
Master Squares (Class A Up to 48 in 51 µin or (7 µin/in + 21 Indi-square and test

Grade) µin), whichever is indicator, gage amp and
greater probe, gage locks
Granite, Steel, Up to 48 in
Cylindrical 65 µin or (12 µin/in +
30 µin), whichever is
greater

Straightness and Up to 72 in 1 µin/in + 19 µin Gage amplifier

Straight Edges3 w/probe
Step Gages, Step Bars, Up to 50 in 6 in + 3.9 μin/in Gage amp and probe,
Reference Stacks gage blocks
Surface Plates3 –
Flatness 18 in x 24 in to 8√D µin Electronic levels

72 in x 144 in D is the length of the
plate diagonal in
inches
Repeatability Up to 72 in x 144 in 34 in Repeat-o-meter
Surface Roughness3 (15 to 150) in Ra 3.4 µin Verification of

specimens per ASME
B46.1
Tape Measures, Rulers3 Up to 10 ft 1200 µin + 2.1 µin/in ULM

(10 to 300) ft 220 µin + 6.8 µin/in
Tapered Plugs3 –
Simple Pitch Diameter Up to 18 in (100 + 12D) in Thread wires/UMM
Notch Height Up to 18 in 13 µin/in + 94 µin Height measuring

machine
Tapered Rings3 –
Taper Up to 18 in 400 in NPT master plug,

ULM
Standoff and Thickness Up to 18 in 120 in NPT master plug and

height measuring
Functional Diameter Up to 2 in (300 + 8D) in machine

Thread Plugs3 –
Simple Pitch Diameter Up to 20 in 82 in + 6.8 in/in 3-wire method
Major Diameter Up to 4 in 4 in + 5 in/in ULM, gage blocks
(4 to 8.5) in 4 in + 5.4 in/in
(8.5 to 20) in 5.2 µin + 5.5 µin/in
Thread Rings3 –
Simple Pitch Diameter Up to 18 in (140 + 9D) in ULM
Minor Diameter Up to 2 in (70 + 13D) in
Functional Diameter Up to 18 in (100 + 8D) in w/ set plug
Thread Wires Up to 0.5 in (8.5 + 7D) in ULM, gage blocks
Universal Length Up to 4 in 1.5 µin + 1.2 µin/in Gage blocks, force

Machines3 (ULMs) (4 to 24) in 1.3 µin + 1.8 µin/in gage, optical flat,
monochromatic light
source
V-Blocks –
Parallelism Side 8 in × 8 in × 8 in 28 in Gage amplifier
w/probe
V Parallelism 8 in × 8 in × 8 in 1 µin/in + 28 µin Cylindrical square
Squareness 8 in × 8 in × 8 in 9.7 µin/in + 48 µin Cylindrical plug
Wire Crimpers3 –
Crimp Height Up to 00 gauge 0.0024 in Micrometer
Crimping Chamber Up to 00 gauge (10 + 19D) in Pin; D is the diameter
of the pin.
Ratchet Inspection Up to 00 gauge 120 in Feeler gage

IV. Electrical – DC/Low Frequency
Parameter/Range Frequency CMC2, 7 () Comments
AC Current – Max frequency up to

Generate & Measure3 3 mA is 30 kHz.
Fluke 5790A,
10 µA to 20 A 10 Hz to 50 kHz3 See Table IV.a 5700A/EP, A40s,
standard resistors
(20 to 70) A 10 Hz 85 µA/A Fluke 52120A,

(20 to 100) A 55 Hz 0.013 % A40B-100, DMM
300 Hz 0.012 %
1 kHz 0.012 %
5 kHz 0.036 %
(20 to 80) A 6 kHz 0.039 %
(20 to 50) A 10 kHz 0.092 %
Measure Only3
(100 to 1000) A 60 Hz 0.5 % Current clamp-on
meter
Generate Only–Turn
Amps3
(20 to 120) A (50 to 400) Hz 0.055 % + 0.6 A Fluke 55120A w/

(120 to 6000) A 0.80 % - 1.6 A 52120-3k and
52120-
(20 to 120) A 1000 Hz 0.24 % + 0.24 A 6k coils
AC Current – 50 Turn
Coils
(Effective Current 25 Turn Amps, 50 Hz,400 Hz 0.11 % of ratio Comparison to

Transfer Ratio) 500 Turn Amps, 50 Hz, 400 Hz 0.12 % of ratio standard coil
800 Turn Amps, 400 Hz 0.14 % of ratio
1000 Turn Amps, 50 Hz 0.14 % of ratio

TABLE IV.a AC Current Generate / Measure3 – CMCs
Current Range 10 Hz 20 Hz 40 Hz
(10 to 300) µA 170 µA/A + 0.03 nA 67 µA/A + 0.03 nA 37 µA/A + 0.03 nA
300 µA to 3 mA 170 µA/A + 0.3 nA 60 µA/A + 0.3 nA 29 µA/A + 0.3 nA
(3 to 10) mA 170 µA/A + 1 nA 69 µA/A + 1 nA 37 µA/A + 1 nA
500 mA to 1 A 170 µA/A + 6 µA 72 µA/A + 6 µA 41 µA/A + 6 µA
(1 to 2) A 170 µA/A + 12 µA 75 µA/A + 12 µA 42 µA/A + 12 µA
Current Range 400 Hz 1 kHz 5 kHz


TABLE IV.a (cont) AC Current Generate / Measure3 - CMCs
Current Range 10kHz 20kHz 50KHz

AC Power3 – Generate
PF = 1
(29 to 330) µA (10 to 20) Hz, 0.19 % Fluke 5520A
(0.33 to 3.3) mA 1 mV to 33 V 0.17 %
3.3 mA to 3.3 A 0.15 %
(29 to 330) µA (20 to 45) Hz, 0.15 %

(0.33 to 3.3) mA 1 mV to 33 V 0.11 %
(3.3 to 330) mA 0.080 %
330 mA to 3 A 0.15 %
(29 to 330) µA (45 to 100) Hz, 0.13 %
(0.33 to 3.3) mA 1 mV to 1020 V 0.088 %
(3.3 to 330) mA 0.041 %
330 mA to 1.1 A 0.052 %
(1.1 to 3) A 0.054 %
(3 to 11) A 0.065 %
(11 to 20.5) A 0.12 %

AC Power3 – Generate
PF = 1 (cont)
(29 to 330) µA 100 Hz to 1 kHz, 0.13 % Fluke 5520A

(0.33 to 3.3) mA 1 mV to 1020 V 0.088 %
(3.3 to 33) mA 0.041 %
(33 to 330) mA 0.041 %
330 mA to 1.1 A 0.052 %
(1.1 to 3) A 0.054 %
(3 to 11) A 0.095 %
(3 to 20.5) A 0.14 %
(29 to 330) µA (1 to 5) kHz, 0.28 %
(0.33 to 3.3) mA 1 mV to 1020 V 0.17 %
(3.3 to 33) mA 0.070 %
(33 to 330) mA 0.092 %
330 mA to 1.1 A 0.54 %
(1.1 to 3) A (1 to 5) kHz, 0.26 %
(3 to 11) A 1 mV to 1020 V 2.4 %
(11 to 20.5) A 2.4 %
(29 to 330) µA (5 to 10) kHz, 0.67 %

(0.33 to 3.3) mA 1 mV to 1020 V 0.40 %
(3.3 to 33) mA 0.17 %
(33 to 330) mA 0.18 %
330 mA to 1.1 A 2.3 %
(1.1 to 3) A 2.1 %
(29 to 330) µA (10 to 30) kHz, 1.3 %

(0.33 to 3.3) mA 1 mV to 330 V 0.79 %
(3.3 to330) mA 0.32 %

AC Voltage – Measure
& Generate3
(0.6 to 2.2) mV (10 to 20) Hz 0.14 % + 1.1 µV Fluke 5790A, 5720A
(20 to 40) Hz 0.062 % + 1.1 µV
40 Hz to 20 kHz 0.040 % + 1.1 µV
(20 to 50) kHz 0.067 % + 1.6 µV
(50 to 100) kHz 0.097 % + 2.0 µV
(100 to 300) kHz 0.19 % + 3.2 µV
(300 to 500) kHz 0.19 % + 6.3 µV
500 kHz to 1 MHz 0.31 % + 6.3 µV
(2.2 to 7) mV (10 to 20) Hz 0.068 % + 1.1 µV
(20 to 40) Hz 0.032 % + 1.1 µV
40 Hz to 20 kHz 0.021 % + 1.1 µV
(20 to 50) kHz 0.034 % + 1.6 µV
(50 to 100) kHz 0.049 % + 2.0 µV
(100 to 300) kHz 0.096 % + 3.2 µV
(300 to 500) kHz 0.11 % + 6.3 µV
500 kHz to 1 MHz 0.19 % + 6.3 µV
(7 to 22) mV (10 to 20) Hz 0.024 % + 1.1 µV
(20 to 40) Hz 0.016 % + 1.1 µV
40 Hz to 20 kHz 0.0096 % + 1.1 µV
(20 to 50) kHz 0.018 % + 1.6 µV
(50 to 100) kHz 0.026 % + 2.0 µV
(100 to 300) kHz 0.066 % + 3.2 µV
(300 to 500) kHz 0.074 % + 6.3 µV
500 kHz to 1 MHz 0.14 % + 6.3 µV
(22 to 70) mV (10 to 20) Hz 0.022 % + 1.2 µV
(20 to 40) Hz 0.012 % + 1.2 µV
40 Hz to 20 kHz 0.0071 % + 1.2 µV
(20 to 50) kHz 0.012 % + 1.6 µV
(50 to 100) kHz 0.025 % + 2.0 µV
(100 to 300) kHz 0.048 % + 3.2 µV
(300 to 500) kHz 0.063 % + 6.3 µV
500 kHz to 1 MHz 0.096 % + 6.3 µV
(70 to 220) mV (10 to 20) Hz 0.017 % + 1.2 µV
(20 to 40) Hz 0.0076 % + 1.2 µV
40 Hz to 20 kHz 0.0037 % + 1.2 µV
(20 to 50) kHz 0.0058 % + 1.6 µV
(50 to 100) kHz 0.013 % + 2.0 µV
(100 to 300) kHz 0.022 % + 3.2 µV
(300 to 500) kHz 0.031 % + 6.3 µV
500 kHz to 1 MHz 0.079 % + 6.3 µV

& Generate3 (cont)
(220 to 700) mV (10 to 20) Hz 0.017 % + 1.2 µV Fluke 5790A, 5720A
(20 to 40) Hz 0.0061 % + 1.2 µV
40 Hz to 20 kHz 0.0029 % + 1.2 µV
(20 to 50) kHz 0.0046 % + 1.6 µV
(50 to 100) kHz 0.0063 % + 2.0 µV
(100 to 300) kHz 0.017 % + 4.3 µV
(300 to 500) kHz 0.025 % + 6.3 µV
500 kHz to 1 MHz 0.074 % + 6.3 µV
(0.7 to 2.2) V (10 to 20) Hz 0.018 %
(20 to 40) Hz 0.0061 %
40 Hz to 20 kHz 0.0022 %
(20 to 50) kHz 0.004 %
(50 to 100) kHz 0.0057 %
(100 to 300) kHz 0.015 %
(300 to 500) kHz 0.023 %
500 kHz to 1 MHz 0.074 %
(2.2 to 7) V (10 to 20) Hz 0.016 %
(20 to 40) Hz 0.0054 %
40 Hz to 20 kHz 0.0024 %
(20 to 50) kHz 0.0041 %
(50 to 100) kHz 0.0065 %
(100 to 300) kHz 0.018 %
(300 to 500) kHz 0.035 %
500 kHz to 1 MHz 0.097 %
(7 to 22) V (10 to 20) Hz 0.016 %
(20 to 40) Hz 0.0057 %
40 Hz to 20 kHz 0.0030 %
(20 to 50) kHz 0.0039 %
(50 to 100) kHz 0.0065 %
(100 to 300) kHz 0.018 %
(300 to 500) kHz 0.033 %
500 kHz to 1 MHz 0.097 %
(22 to 70) V (10 to 20) Hz 0.016 %
(20 to 40) Hz 0.0058 %
40 Hz to 20 kHz 0.0034 %
(20 to 50) kHz 0.0050 %
(50 to 100) kHz 0.0075 %
(100 to 300) kHz 0.016 %
(300 to 500) kHz 0.032 %
500 kHz to 1 MHz 0.09 %

& Generate3 (cont)
Fluke 5790A, 5720A
(70 to 220) V* (10 to 20) Hz 0.016 % *Subject to 2.2 x 107
(20 to 40) Hz 0.0058 % V-Hz limitation
40 Hz to 20 kHz 0.0034 %
(20 to 50) kHz 0.0056 %
(50 to 100) kHz 0.0080 %
(100 to 300) kHz 0.017 %
(300 to 500) kHz 0.039 %
(220 to 700) V (10 to 20) Hz 0.016 % Fluke 5790A, 5720A,

(20 to 40) Hz 0.0080 % 5725A
40 Hz to 20 kHz 0.0038 %
(20 to 50) kHz 0.011 %
(50 to 100) kHz 0.040 %
(700 to 1000) V** (10 to 20) Hz 0.016 % ** Measure only

(20 to 40) Hz 0.0080 %
40 Hz to 20 kHz 0.0036 %
(20 to 50) kHz 0.011 %
(50 to 100) kHz 0.040 %
AC High Voltage –
Measure3
(1 to 5) kV (50 to 60) Hz 0.2 % + 1 V Vitrek 4700A

(5 to 35) kV 0.4 % + 65 V
(35 to 75) kV 0.4 % + 49 V
AC High Voltage –
Generate3
(1 to 5) kV 60 Hz 0.24 % + 1 V Assoc. res. 3565D

AC Voltage – Measure3
≤ 2 MHz
(0 to 10) mV (1 to 40) Hz 0.023 % + 2 µV Agilent/HP 3458A

40 Hz to 1 kHz 0.018 % + 0.74 µV
(1 to 20) kHz 0.026 % + 0.74 µV
(20 to 50) kHz 0.069 % + 0.74 µV
(50 to 100) kHz 0.34 % + 0.74 µV
(100 to 300) kHz 2.7 % + 1.4 µV
(10 to 100) mV (1 to 40) Hz 0.033 % + 2.7 µV

40Hz to 1kHz 0.014 % + 1.4 µV
(1 to 20) kHz 0.019 % + 1.4 µV
(20 to 50) kHz 0.037 % + 1.4 µV
(50 to 100) kHz 0.067 % + 1.4 µV
(100 to 300) kHz 0.22 % + 6.7 µV
300 kHz to 1 MHz 0.68 % + 6.7 µV
(1 to 2) MHz 1.1 % + 6.7 µV
(0.1 to 1) V (1 to 40) Hz 0.0047 % + 27 µV

40 Hz to 1kHz 0.0047 % + 14 µV
(1 to 20) kHz 0.0094 %+ 14 µV
(20 to 50) kHz 0.020 % + 14 µV
(50 to 100) kHz 0.054 % + 14 µV
(100 to 300) kHz 0.20 % + 67 µV
300 kHz to 1 MHz 0.67 % + 67 µV
(1 to 2) MHz 1.1 % + 67 µV
(1 to 10) V (1 to 40) Hz 0.0077 % + 0.27 mV

40 Hz to 1 kHz 0.0062 % + 0.14 mV
(1 to 20) kHz 0.0099 % + 0.14 mV
(20 to 50) kHz 0.021 % + 0.14 mV
(50 to 100) kHz 0.054 % + 0.14 mV
(100 to 300) kHz 0.21 % + 0.67 mV
300 kHz to 1 MHz 0.67 % + 0.67 mV
(1 to 2) MHz 1.1 % + 0.67 mV
(10 to 100) V (1 to 40) Hz 0.025 % + 2.7 mV

40 Hz to 1 kHz 0.016 % + 1.4 mV
(1 to 20) kHz 0.014 % + 1.4 mV
(20 to 50) kHz 0.025 % + 1.4 mV
(50 to 100) kHz 0.082 % + 1.4 mV
(100 to 300) kHz 0.27 % + 6.7 mV
300 kHz to 1 MHz 1.1 % + 6.7 mV
(100 to 700) V (1 to 40) Hz 0.033 % + 27 mV

40 Hz to 1 kHz 0.027 % + 14 mV
(1 to 20) kHz 0.041 % + 14 mV
(20 to 50) kHz 0.081 % + 14 mV
(50 to 100) kHz 0.21 % + 14 mV

Parameter/Range Frequency CMC2, 5, 7, 8 () Comments
Capacitance – Measure3
1 pF 1 kHz 11 µF/F AH2500A
10 pF 13 µF/F
100 pF to 1 µF 14 µF/F
(0.7 to 110) mF DC 0.012 % 5700A w/ 3458A,
charge method
10 pf to 0.1 F 12 Hz to 2 MHz See Table IV.b Quad tech 1689M, 7600
Capacitance – Generate3,
Fixed Points
100 pF 100 Hz, 1 kHz 0.054 % Standard capacitors
0.001 µF 0.068 %
0.002 µF 0.048 %
(0.01, 0.02, 0.05) µF 0.055 %
(0.1, 0.5, 1) µF 0.055 %
Table IV.b: CMC (in %) for Capacitance measured with 1689M and 7600 LCR Meter, Fixed Points
10 100 1 10 100 1 10 100 0.001 0.01 0.1

pF pF nF nF nF µF µF µF F F F
12 Hz 3.1 5 1.5 0.79 0.93 0.14 0.11 0.46 4.5
20 Hz 1.9 3 0.63 0.48 0.49 0.11 0.11 0.76
50 Hz 3.8 0.39 0.47 0.25 0.11 0.16 0.058 0.11 0.94
100 Hz 1.4 0.16 0.21 0.15 0.047 0.067 0.047 0.16 1.4
200 Hz 0.71 0.081 0.12 0.095 0.047 0.047 0.047 0.29 2.8
500 Hz 1.9 0.2 0.035 0.042 0.058 0.035 0.035 0.058 0.48 4.4
1 kHz 0.48 0.058 0.024 0.024 0.024 0.024 0.024 0.058 0.48 4.7
2 kHz 0.71 0.081 0.047 0.035 0.035 0.041 0.035 0.17 1.2
5 kHz 0.66 0.083 0.056 0.047 0.047 0.056 0.08 0.32 2.8
10 kHz 0.42 0.07 0.056 0.055 0.055 0.06 0.11 0.6
20 kHz 0.035 0.024 0.048 0.057 0.058 0.068 0.18 1.3
50 kHz 0.024 0.024 0.066 0.066 0.07 0.11 0.46 4.1
100 kHz 0.024 0.03 0.08 0.081 0.091 0.2 1.2
200 kHz 0.27 0.11 0.11 0.12 0.15 0.46 3.7
500 kHz 0.43 0.4 0.2 0.38 0.38 2.1
1 MHz 0.36 0.35 0.35 0.41 1.1
2 MHz 0.65 0.64 0.66 0.9 3.4

DC Power3 – Generate
33 mV to 1020 V 330 A to 330 mA 0.068 % Fluke 5520A

330 mA to 3 A 0.07 %
(3 to 20.5) A 0.12 %
DC Current3 –
Generate and Measure (0 to 100) nA 30 µA/A + 0.27 nA Fluke 3458A/HFL,
(0.1 to 1) µA 19 µA/A + 0.27 nA current source,
(1 to 10) µA 17 µA/A + 0.067 nA standard
resistors/current
(10 to 100) µA 5.2 µA/A + 0.01 nA shunts
(0.1 to 1 mA 4.9 µA/A + 0.1 nA
(1 to 10) mA 5.1 µA/A + 1 nA
(10 to 100) mA 5.6 µA/A + 60 nA
(0.1 to 1) A 7.3 µA/A + 6 µA
(1 to 2) A 8.9 µA/A + 12 µA
(2 to 10) A 31 µA/A + 6 µA
(10 to 20) A 31 µA/A + 12 µA
(20 to 100) A 27 µA/A + 18 µA/°C
(100 to 300) A 0.011 % + 18 µA/°C
(300 to 1000) A 0.077 % + 18 µA/°C
Generate Only (25 to 100) A 0.09 % Fluke 52120A
Turn Amps (100 to 1500) A 0.52 % w/52120-3k and
52120-6k coils
DC Voltage – Generate, 100 mV 0.82 μV/V Fluke 732B, 752A,

Fixed Points HP 34420A
1V 0.63 μV/V Fluke 732B, 752A,
HP 34420A
10 V 0.55 μV/V Fluke 732B
19 V 1.1 µV/V Fluke 732B, 720A,
752A,
HP 34420A
100 V 0.63 μV/V Fluke 732B, 752A,
HP 34420A
1000 V 0.82 μV/V Fluke 732B, 752A,
HP 34420A

DC Voltage – Generate (0 to 220) mV 5.6 μV/V + 0.39 μV Fluke 5700A/EP

220 mV to 2.2 V 3.2 μV/V + 0.63 mV
(2.2 to 11) V 2.4 μV/V + 2.4 μV
(11 to 22) V 2.4 μV/V + 3.9 μV
(22 to 220) V 3.2 μV/V + 39 μV
(220 to 1100) V 4.8 μV/V + 390 μV
DC Voltage – Measure3 Up to 100 mV 3.0 μV/V + 0.21 μV Agilent/HP 3458A

100 mV to 1 V 2.1 μV/V + 0.21 μV
(1 to 10) V 2.1 μV/V + 0.34 μV
(10 to 100) V 3.5 μV/V + 21 μV
(100 to 1000) V 3.7 μV/V + 74 μV
DC High Voltage – (1 to 6) kV 0.2 % + 1 V Vitrek 4700A

Measure3 (6 to 35) kV 0.4 % + 26 V
(35 to 100) kV 0.4 % + 140 V
DC High Voltage – (1 to 6) kV 0.21 % + 1.1 V Assoc. res. 3565D

Generate3 monitored with Vitrek
4700A
Edge Characteristics –
Amplitude (0 to 100) mV 3.0 μV/V + 0.21 μV Agilent/HP 3458A/HFL

(0.1 to 1) V 2.1 μV/V + 0.21 μV
(1 to 10) V 2.1 μV/V + 0.34 μV
(10 to 100) V 3.5 μV/V + 21 μV
Electrical Calibration of
RTD Indicating Devices3 –
Pt 385, 100  (-200 to 0) C 0.05 C Fluke 5520A

(0 to 100) C 0.07 C
(100 to 300) C 0.09 C
(300 to 400) C 0.1 C
(400 to 630) C 0.12 C
(630 to 800) C 0.14 C
Pt 3926, 100  (-200 to 0) C 0.05 C

(0 to 100) C 0.07 C
(100 to 300) C 0.09 C
(300 to 400) C 0.1 C
(400 to 630) C 0.26 C

RTD Indicating Devices3
(cont) –
PtNi 385, 120  (-80 to 100) C 0.08 C Fluke 5520A

(100 to 260) C 0.16 C
Pt 385, 200  (-200 to 100) C 0.04 C

(100 to 260) C 0.05 C
(260 to 300) C 0.12 C
(300 to 400) C 0.13 C
(400 to 600) C 0.14 C
(600 to 630) C 0.16 C
Pt 385, 500  (-200 to -80) C 0.04 C

(-80 to 100) C 0.05 C
(100 to 260) C 0.06 C
(260 to 400) C 0.08 C
(400 to 600) C 0.09 C
(600 to 630) C 0.11 C
Pt 385, 1000  (-200 to 0) C 0.03 C

(0 to 100) C 0.04 C
(100 to 260) C 0.05 C
(260 to 300) C 0.06 C
(300 to 600) C 0.07 C
(600 to 630) C 0.23 C
Pt 3916, 100  (-200 to -190) °C 0.25 °C

(-190 to -80) °C 0.04 °C
(-80 to 0) °C 0.05 °C
(0 to 100) °C 0.06 °C
(100 to 260) °C 0.07 °C
(260 to 300) °C 0.08 °C
(300 to 400) °C 0.09 °C
(400 to 600) °C 0.10 °C
(600 to 630) °C 0.23 °C

Thermocouple Indicating
Devices3 –
Type E (-250 to -100) °C 0.5 °C Fluke 5520A
(-100 to -25) °C 0.16 °C
(-25 to 350) °C 0.14 °C
(350 to 650) °C 0.16 °C
(650 to 1000) °C 0.21 °C
Type J (-210 to -100) °C 0.28 °C
(-100 to -30) °C 0.16 °C
(-30 to 150) °C 0.14 °C
(150 to 760) °C 0.17 °C
(760 to 1200) °C 0.23 °C
Type K (-200 to -100) °C 0.34 °C
(-100 to -25) °C 0.18 °C
(-25 to 120) °C 0.16 °C
(120 to 1000) ºC 0.26 °C
(1000 to 1372) °C 0.40 °C
Type S (0 to 250) °C 0.47 °C
(250 to 1000) °C 0.36 °C
(1000 to 1400) °C 0.37 °C
(1400 to 1767) °C 0.46 °C
Type T (-250 to -150) °C 0.63 °C

(-150 to 0) °C 0.24 °C
(0 to 120) °C 0.16 °C
(120 to 400) °C 0.14 °C

High Frequency
Capacitance - Generate
Fixed Points3 –
1 pF 1 kHz 0.007 % Agilent/HP 16380A

1 MHz 0.01 % series capacitors
2 MHz 0.023 %
3 MHz 0.041 %
4 MHz 0.063 %
5 MHz 0.088 %
10 MHz 0.26 %
13 MHz 0.38 %
10 pF 1 kHz 62 parts in 106

(1, 2) MHz 62 parts in 106
3 MHz 64 parts in 106
10 MHz 0.013 %
13 MHz 0.017 %

4 MHz 0.01 %
5 MHz 0.014 %
10 MHz 0.034 %
13 MHz 0.049 %

2 MHz 0.016 %
3 MHz 0.028 %
4 MHz 0.046 %
5 MHz 0.064 %
10 MHz 0.2 %
13 MHz 0.29 %
0.01 F (0.12, 1, 10, 100) kHz 63 parts in 106
0.1 F (0.12, 1, 10, 100) kHz 63 parts in 106
1.0 F 0.12 kHz 69 parts in 106

(1, 10) kHz 63 parts in 106
100 kHz 85 parts in 106

Inductance3 –
Measure (12 Hz to 0.1 H to 10 H See Table IV.c LCR meters

2 MHz)
Generate – Fixed Points 100 H 0.026 % Standard inductors

(1, 5, 10, 100) mH 0.11 %
(1, 2, 5) H 0.11 %
Table IVc: Inductance Measure CMC (in %) measured with 1689M and 7600 LCR Meters
Freq. 0.1 1 10 100 1 10 100 1 5 10

µH µH µH µH mH mH mH H H H
12 Hz 0.81 1.3 1.1 1.1 1.1
20 Hz 4.8 0.49 0.71 0.58 0.56 0.56
50 Hz 0.97 0.11 0.17 0.26 0.26 0.26
100 Hz 3.6 0.37 0.048 0.069 0.11 0.16 0.16
200 Hz 1.8 0.19 0.048 0.048 0.058 0.11 0.085
500 Hz 4.8 0.49 0.060 0.036 0.036 0.036 0.051 0.036
1 kHz 1.2 0.13 0.024 0.024 0.024 0.024 0.024 0.024
2 kHz 0.90 0.13 0.036 0.042 0.036 0.036 0.048 0.048
5 kHz 3.2 0.37 0.084 0.048 0.062 0.062 0.055 0.079 0.096
10 kHz 1.7 0.22 0.079 0.064 0.062 0.064 0.069 0.097 0.26
20 kHz 0.94 0.15 0.074 0.066 0.066 0.067 0.081 0.030 0.048
50 kHz 4.7 0.54 0.12 0.080 0.075 0.075 0.16 0.50 0.058 0.11
100 kHz 3.4 0.42 0.13 0.095 0.091 0.092 0.21 1.9 0.11 0.20
200 kHz 2.7 0.38 0.15 0.13 0.13 0.13 0.68 4.6
500 kHz 2.4 0.44 0.25 0.23 0.46 0.50 1.9
1 MHz 2.5 0.60 0.41 0.40 0.40 0.96
2 MHz 2.7 0.92 0.75 0.73 0.76 4.3
Parameter/Range Frequency CMC2 () Comments
Phase – Generate
5 Vrms (Voltage Ratio 1 Hz to 1 kHz 6.6 m° Clark-Hess 5500-2

= 1) (1 to 6.25) kHz 5.2 m° Ratio= ratio of the
(6.25 to 50) kHz 13 m° larger voltage
(50 to 200) kHz 21 m° divided by the
smaller
50 m to 100 Vrms 1 Hz to 1 kHz (6.5 + (0.05 ꞏ Ratio))m° voltage
(1 to 6.25) kHz (11 + (0.1 ꞏ Ratio))m°
(6.25 to 50) kHz (19 + (0.15 ꞏ Ratio))m°
(50 to 200) kHz (41 + (0.4 ꞏ Ratio))m°

Parameter/Range Frequency CMC2 () Comments
Phase – Generate (cont) Clark-Hess 5500-2

Ratio= ratio of the
(100 to 120) Vrms 1 Hz to 1 kHz (15 + (0.1 ꞏ Ratio)) m° larger voltage divided
(1 to 6.25) kHz (21 + (0.2 ꞏ Ratio)) m° by the smaller
(6.25 to 50) kHz (31 + (0.3 ꞏ Ratio)) m° voltage
(50 to 200) kHz (81 + (1 ꞏ Ratio)) m°
Phase – Measure
(0.01 to 0.1) Vrms 10 Hz to 10 kHz 0.21° KH 6620 phase meter

(10 to 50) kHz 0.36°
(50 to 100) kHz 0.71°
(0.1 to 120) Vrms 10 Hz to 50 kHz 0.054°

(50 to 100) kHz 0.036°
Oscilloscope Calibration3 –
Squarewave Signal (1 to 110) mV 0.27 % + 42 µV Fluke 5520A/SC1100

50  at 1 kHz Source 110 mV to 2.2 V 0.27 % + 130 µV scope option
(2.2 to 11) V 0.27 % + 1.2 mV
(11 to 1100) V 0.27 % + 12 mV
Squarewave Signal (1 to 110) mV 0.15 % + 42 µV

1 M at 1 kHz Source 110 mV to 2.2 V 0.15 % + 130 µV
(2.2 to 11) V 0.15 % + 1.2 mV
(11 to 1100) V 0.15 % + 12 mV
Leveled Sine Wave 50 kHz to 100 MHz 1.5 % + 110 µV

Flatness (relative to 50 (100 to 300) MHz 2 % + 110 µV
kHz) (300 to 600) MHz 4 % + 110 µV
(600 to 1100) MHz 5 % + 110 µV
Period 1 ns to 20 ms 2.0 parts in 106

50 ms 59 parts in 106
100 ms 97 parts in 106
200 ms 180 parts in 106
500 ms 410 parts in 106
1s 800 parts in 106
2s 1600 parts in 106
5s 3900 parts in 106

Oscilloscope Calibration3 –
(cont)
Rise Time – Generate 12.8 ps 3.9 ps Tektronix 067-1338-00
Rise Time – Measure > 5.4ps 5.4 ps Tektronix TDS8000

with 80E03
Resistance – Generate, 100 µΩ 29 µΩ/Ω Norma 80

Fixed Points3
1 mΩ 14 µΩ/Ω L&N 4222B
10 mΩ 9.5 µΩ/Ω L&N 4223B
0.1 Ω 6.5 µΩ/Ω
L&N resistors
1Ω 4.6 µΩ/Ω
10 Ω 4.2 µΩ/Ω
100 Ω 2.3 µΩ/Ω Fluke 742A, standard
1kΩ 2.5 µΩ/Ω resistors
10 kΩ 1.6 µΩ/Ω
19 kΩ 4.7 µΩ/Ω
100 kΩ 3.3 µΩ/Ω
1 MΩ 4.5 µΩ/Ω
10 MΩ 9.0 µΩ/Ω
100 MΩ 22 µΩ/Ω
1 GΩ 22 µΩ/Ω
10 GΩ 0.13 % IET high resistance

100 GΩ 0.22 % standard
1 TΩ 0.34 %
10 TΩ 1.2 %
Resistance – Measure, DC 100 µΩ 85 μ Ω/Ω + 0.48 nΩ Stable current source,

100 µΩ to1 mΩ 12 μΩ/Ω + 4.8 nΩ 3458A/HFL, standard
(1 to 10) mΩ 9.2 μ Ω/Ω + 4.8 nΩ resistors
(10 to100) mΩ 5.4 μ Ω/Ω + 48 nΩ
(0.1 to 1) Ω 2.6 μ Ω/Ω + 0.48 μΩ
(0 to 2) Ω 3.4 μΩ/Ω + 4.4 μΩ Fluke 8508A and

(2 to 20) Ω 2.1 μΩ/Ω + 15 μΩ standard resistors
(20 to 200) Ω 2.6 μΩ/Ω + 33 μΩ
200 Ω to 2 kΩ 2.5 μΩ/Ω + 0.33 mΩ
(2 to 20) kΩ 1.5 μΩ/Ω + 3.3 mΩ
(20 to 200) kΩ 2.3 μΩ/Ω + 33 mW
200 kW to 2 MΩ 4.4 μΩ/Ω + 1.1 Ω
(2 to 20) MΩ 4.4 μΩ/Ω + 11 Ω
(20 to 200) MΩ 8.3 μΩ/Ω + 110 Ω
200 MΩ to 2 GΩ 28 μΩ/Ω + 110 kΩ
(2 to 20) GΩ 0.21 % + 1.1 MΩ

Resistance – Measure, DC
(cont)
100 MΩ to 1 GΩ 0.081 % 6500A
(1 to 10) GΩ 0.12 %
(10 to 100) GΩ 0.24 %
100 GΩ to 1 TΩ 0.35 %
(1 to 10) TΩ 0.59 %
(10 to 100) TΩ 1.2 %
Resistance – Measure, AC 10 Hz to 2 MHz See Table IV.d LCR meters
Table IV.d: AC Resistance Measure CMC (in %) measured with LCR Meters
0.1 1 10 100 1 10 100 200 500 1

Ω Ω Ω Ω kΩ kΩ kΩ kΩ kΩ MΩ
12 Hz 0.60 0.11 0.11 0.11 0.11 0.11 1.7
20 Hz 0.60 0.11 0.11 0.11 0.11 0.11 0.85 2.8 4.6
50 Hz 3.1 0.31 0.058 0.058 0.058 0.058 0.058 0.38 1.3 2.0
100 Hz 2.3 0.23 0.047 0.047 0.047 0.047 0.047 0.23 0.70 1.2
200 Hz 2.3 0.23 0.047 0.047 0.047 0.047 0.047 0.15 0.44 0.70
500 Hz 1.5 0.16 0.035 0.035 0.035 0.035 0.035 0.10 0.29 0.44
1 kHz 0.77 0.09 0.024 0.024 0.024 0.024 0.024 0.082 0.24 0.35
2 kHz 1.0 0.15 0.035 0.035 0.035 0.035 0.047 0.075 0.21 0.31
5 kHz 0.90 0.14 0.047 0.047 0.047 0.047 0.063 0.072 0.20 0.30
10 kHz 1.0 0.14 0.062 0.055 0.055 0.055 0.063 0.073 0.21 0.30
20 kHz 1.1 0.16 0.066 0.057 0.057 0.057 0.067 0.077 0.22 0.33
50 kHz 1.4 0.19 0.077 0.066 0.065 0.066 0.31 0.37 1.1 1.7
100 kHz 1.9 0.26 0.10 0.081 0.079 0.081 0.40 0.47 1.5 2.2
200 kHz 3.0 0.39 0.14 0.11 0.11 0.12 0.56 0.68 2.2 3.4
500 kHz 0.79 0.26 0.20 0.20 0.26 1.1 1.4 4.2
1 MHz 1.5 0.45 0.35 0.35 0.70 1.9 2.4
2 MHz 2.8 0.85 0.65 0.64 1.4 3.5 4.5

V. Electrical – RF/Microwave
Amplitude Modulation3 –
AM Accuracy:
(0.15 to 10) MHz
5 % to 40 % AM Depth Rate:50 Hz to 10 kHz 2.3 % + 0.012 % AM Measuring
Rate: 20 Hz to 10 kHz 3.5 % + 0.012 % AM receiver
40 % to 99 % AM Depth Rate 50 Hz to 10 kHz 2.3% + 0.12 % AM

Rate: 20 Hz to 10 kHz 3.5 % + 0.12 % AM
(10 to 1300) MHz

5 % to 40 % AM Depth Rate: 50 Hz to 50 kHz 1.2 % + 0.012 % AM
Rate: 20 Hz to 100 kHz 3.5 % + 0.012 % AM

Rate: 20 Hz to 100 kHz 3.5 % + 0.12 % AM
(1.3 to 26.5) GHz Measuring

5 % to 40 % AM Depth Rate: 50 Hz to 50 kHz 1.7 % + 0.012 % AM receiver, down
Rate: 20 Hz to 100 kHz 3.5 % + 0.012 % AM converter and
local oscillator
Rate: 20 Hz to 100 kHz 3.5 % + 0.12 % AM
AM Distortion: Measuring
150 kHz to 1.3 GHz < 50 % AM Depth 1.1 dB receiver and
50 % to 95 % AM 2.1 dB distortion
analyzer
(1.3 to 26.5) GHz < 50 % AM Depth 1.1 dB
50 % to 95 % AM 2.1 dB
AM Flatness:
(0.01 to 26.5) GHz Rate: 90 Hz to 10 kHz 0.31 % Measuring
20 % to 80 % AM Depth receiver
Distortion Accuracy –
Measure3
(0 to -70) dB (2 to 20) Hz 0.43 dB Low frequency
signal analyzer
(-7 to -99.9) dB 20 Hz to 20 kHz 1.1 dB Distortion
(-7 to -99.9) dB (20 to 100) kHz 2.1 dB analyzer

Frequency Modulation3 –
FM Accuracy Rate:
(0.15 to 10) MHz
< 4 kHz FM peak Dev. 20 Hz to 10 kHz 2.4 % + 1.2 Hz Measuring receiver
< 40 kHz FM peak Dev. 20 Hz to 10 kHz 2.4 % + 12 Hz
(10 to 1300) MHz

< 400 kHz FM pk Dev. 50 Hz to 100 kHz 1.3 % + 120 Hz
20 Hz to 200 kHz 5.8 % + 240 Hz
(1.3 to 26.5) GHz

< 400 kHz FM pk Dev. 50 Hz to 100 kHz 1.3 % + 120 Hz Measuring receiver
20 Hz to 200 kHz 5.8 % + 240 Hz and distortion
analyzer
β (0 to 0.5)
Rate: (1 to 3) Hz 1 Hz to 2.6 GHz 1.6 % 89441A
Peak Dev: 1 Hz to 1.3
GHz
Rate: 3 Hz to 6.7 GHz 3 Hz to 13.2 GHz 1.6 % E4445A

GHz
 0.5 to 2
Rate: (1 to 3) Hz 1 Hz to 2.6 GHz 2.1 % 89441A
GHz

GHz
 2 to 10
Rate: 1 Hz to 3 Hz 1 Hz to 2.6 GHz 1.2 % 89441A
GHz

GHz

(cont)
 10 to 100
GHz

GHz
 100 to 200
GHz

GHz
 200 to 500
Rate: 1 Hz to 13 MHz 1 Hz to 2.6 GHz 0.24 % 89441A
GHz
Rate: 1 Hz to 7 MHz (2.6 to 18) GHz 0.24 % 89441A w/ mixer

Peak Dev: 1 Hz to 700
MHz
 500 to 5000
GHz

MHz
 5000 to 6 000 000

GHz

MHz

(cont)
FM Distortion < 10 kHz FM 0.15 % Measuring receiver

400 kHz to 10 MHz Deviation
Rate: 20 Hz to 10 kHz
10 MHz to 26.5 GHz < 100 kHz FM 0.15 %

Rate: 20 Hz to 100 kHz Deviation
Residual FM
Carrier Frequency (ƒ) Bandwidth:
< 100 MHz 50 Hz to 3 kHz 1 Hz (rms)
(100 to 1300) MHz 50 Hz to 3 kHz 0.4 Hz + (6 x 10-9) ƒ
(1.3 to 6.2) GHz 50 Hz to 3 kHz 17 Hz
(6.2 to 12.4) GHz 50 Hz to 3 kHz 33 Hz
(12.4 to 18) GHz 50 Hz to 3 kHz 49 Hz
(18 to 26.5) GHz 50 Hz to 3 kHz 65 Hz
Single Sideband Phase Noise –

Measure
CF = 5 MHz
Offset Range
20 Hz -110 dBc/Hz 1.6 dB Agilent E8251A
1 kHz -126 dBc/Hz 1.3 dB Agilent E4408B
20 kHz -131 dBc/Hz 1.0 dB
100 kHz -133 dBc/Hz 1.3 dB HP 89441A
1 MHz -139 dBc/Hz 1.3 dB w/PMSSBPNMS
5 MHz -140 dBc/Hz 1.4 dB
CF = 225 MHz
Offset
20 Hz -101 dBc/Hz 1.3 dB
100 kHz -140 dBc/Hz 1.1 dB


Measure (cont)
CF = 1 GHz
Offset
100 kHz -134 dBc/Hz 1.1 dB HP 89441A
CF = 5 GHz
Offset
20 Hz -76 dBc/Hz 1.9 dB
100 kHz -119 dBc/Hz 1.0 dB
CF = 9.6 GHz
Offset
20 Hz -70 dBc/Hz 1.1 dB
100 kHz -116 dBc/Hz 1.0 dB
CF = 15 GHz
Offset
20 Hz -66 dBc/Hz 1.8 dB
100 kHz -110 dBc/Hz 1.0 dB


Measure (cont)
CF = 18 GHz
Offset
100 kHz -109 dBc/Hz 1.0 dB HP 89441A
Phase Modulation3 –
(0.15 to 10) MHz

< 40 Radians (peak) Rate: 200 Hz to 10 4.7 % + 0.012 rad Measuring receiver
< 400 Radians (peak) kHz 4.7 % + 0.12 rad
(10 to 1300) MHz

< 4 Radians (peak) Rate: 200 Hz to 20 3.8 % + 0.0012 rad
< 40 Radians (peak) kHz 3.5 % + 0.012 rad
< 400 Radians (peak) 3.5 % + 0.12 rad
(1.3 to 26.5) GHz

< 4 Radians (peak) Rate: 200 Hz to 20 3.7 % + 0.0012 rad Measuring
< 40 Radians (peak) kHz 3.5 % + 0.012 rad receiver, down
< 400 Radians (peak) 3.5 % + 0.12 rad converter and local
oscillator
Range Calibration (Power

Meters)3 –
Zero Set (0.03 to 10) mW 0.25 % + 6.2 nW Range calibrator,

Instrument Accuracy 3 W 1.6 % Agilent 11683A or
10 W 0.46 % Agilent 8477A
30 W 0.28 %
(100, 300) W 0.26 %
(1, 2) mW 0.28 %
(10, 30, 100) mW 0.30 %

RF Power Level3 –
Generate/Measure
Absolute 0 dBm @ 50 MHz 0.11 dB + M Signal generator,

power splitter,
+35 to -127 dBm See Table V.a attenuator,
(1.3 to 26.5) GHz standard sensors,
and power meter
Relative +35 to -127 dBm See Table V.b 8902A, 11722A,

0.9 MHz to 26.5 GHz 11792A, 11793A,
E8244A
Relative 100 kHz 0.75 % + M Power sensors,

(Power Sensor 300 kHz 0.51 % + M splitters, meters
Calibration Factors) 1 MHz 0.46 % + M
3 MHz 0.46 % + M UUT Mismatch
10 MHz 0.43 % + M uncertainty (M)
30 MHz 0.43 % + M
100 MHz 0.52 % + M
300 MHz 0.61 % + M
500 MHz 0.61 % + M
1 GHz 0.65 % + M
2 GHz 0.76 % + M
3 GHz 0.92 % + M
4 GHz 1.0 % + M
5 GHz 1.1 % + M
6 GHz 1.1 % + M
7 GHz 1.1 % + M
8 GHz 1.1 % + M
9 GHz 1.2 % + M
10 GHz 1.3 % + M
11 GHz 1.2 % + M
12 GHz 1.2 % + M
13 GHz 1.2 % + M
14 GHz 1.2 % + M
15 GHz 1.3 % + M
16 GHz 1.3 % + M
17 GHz 1.3 % + M
18 GHz 1.4 % + M
19 GHz 2.2 % + M
20 GHz 2.3 % + M
21 GHz 2.3 % + M
22 GHz 2.4 % + M
23 GHz 2.4 % + M
24 GHz 2.5 % + M
25 GHz 2.7 % + M
26 GHz 2.7 % + M
26.5 GHz 2.7 % + M

Table V.a RF Power Source/Measure Absolute (CMC in dBm)
FREQUENCY
100 MHz
0.9 MHz to to 1.3 GHz to 4 GHz to 8 GHz to 17 GHz to
100 MHz 1.3 GHz 4 GHz 8 GHz 17 GHz 26.5 GHz
+ 35 dBm 0.14 0.14 0.18 --- -- --
+ 20 dBm 0.14 0.14 0.18 0.25 0.32 0.47
+10 dBm 0.12 0.13 0.13 0.15 0.18 0.23
0 dBm 0.12 0.13 0.13 0.15 0.18 0.23
-10 dBm 0.12 0.13 0.13 0.15 0.18 0.23
-20 dBm 0.13 0.13 0.14 0.15 0.18 0.23
POWER LEVEL
-30 dBm 0.13 0.14 0.14 0.15 0.18 0.23

-40 dBm 0.14 0.14 0.14 0.16 0.18 0.23
-50 dBm 0.15 0.15 0.15 0.17 0.19 0.24
-60 dBm 0.16 0.16 0.16 0.18 0.2 0.25
-70 dBm 0.17 0.17 0.18 0.18 0.21 0.25
-80 dBm 0.18 0.18 0.18 0.19 0.22 0.26
-90 dBm 0.19 0.19 0.2 0.21 0.22 0.27
-100 dBm 0.2 0.21 0.21 0.22 0.23 0.28
-110 dBm 0.22 0.22 -- -- -- --
-120 dBm 0.3 0.3 -- -- -- --
-127 dBm 0.32 0.32 -- -- -- --
Table V.b RF Power Source/Measure Relative (CMC in dB)

FREQUENCY
17 GHz
0.9 MHz 100 MHz 1.3 GHz 4 GHz 8 GHz to
to to to to to 26.5
100 MHz 1.3 GHz 4 GHz 8 GHz 17 GHz GHz
+ 35 dBm 0.12 0.12 0.16 --- -- --
+ 20 dBm 0.12 0.12 0.16 0.22 0.29 0.45
+10 dBm 0.04 0.05 0.06 0.09 0.13 0.2
0 dBm 0.04 0.05 0.06 0.09 0.13 0.2
-10 dBm 0.04 0.05 0.06 0.09 0.13 0.2
-20 dBm 0.05 0.06 0.07 0.09 0.13 0.2
POWER LEVEL
-30 dBm 0.06 0.07 0.07 0.1 0.13 0.2

-40 dBm 0.07 0.08 0.08 0.11 0.14 0.2
-50 dBm 0.09 0.1 0.1 0.12 0.15 0.21
-60 dBm 0.11 0.11 0.11 0.13 0.16 0.22
-70 dBm 0.12 0.12 0.13 0.14 0.17 0.22
-80 dBm 0.13 0.13 0.14 0.15 0.18 0.23
-90 dBm 0.15 0.15 0.16 0.17 0.19 0.24
-100 dBm 0.16 0.17 0.17 0.18 0.2 0.25
-110 dBm 0.18 0.18 -- -- -- --
-120 dBm 0.27 0.27 -- -- -- --
-127 dBm 0.29 0.29 -- -- -- --

S-Parameters3 – Reflection
S11/22 Magnitude and
Phase –
3.5 mm –
Magnitude 300 kHz to 26.5 GHz
(0 to 1.0) lin ( 0.008 to  0.062) lin 8510C or 8753ES
Network analyzer,
85052D
Phase 300 kHz to 26.5 GHz calibration kit
(0 to 0.01) lin ( 53 to  180) deg
(0.01 to 0.40) lin ( 1.3 to  7.3) deg
(0.40 to 1.0) lin ( 0.9 to  1.8) deg
7 mm –
Magnitude 300 kHz to 6 GHz
(0 to 1.0) lin ( 0.002 to  0.009) lin 8753ES Network
Analyzer, 85031B
Phase (0 to 0.01) lin ( 1.2 to  31) deg calibration kit
(0.01 to 1.0) lin ( 0.2 to  1.7) deg
N-Type –
(0 to 1.0) lin ( 0.003 to  0.04) lin 8510C or 8753ES
Network analyzer,
Phase (0 to 0.01) lin ( 1.9 to  180) deg 85054D or
(0.01 to 1.0) lin ( 0.5 to  6) deg 85032B
calibration kit
S-Parameters3 –
Transmission S12/S21
3.5 mm –
Magnitude 300 kHz to 26.5 GHz
(10 to -70) dB ( 0.018 to  0.95) dB 8510C or 8753ES
Network analyzer,
300 kHz to 6 GHz 85052D
(-70 to -90) dB ( 1.2 to  6.6) dB calibration kit
Phase 300 kHz to 26.5 GHz

(10 to 0) dB ( 0.20 to  6.5) deg
(0 to -50) dB ( 0.20 to  1.3) deg
(-50 to -70) dB ( 1.3 to  6.7) deg
300 kHz to 6 GHz

(-70 to -90) dB ( 8.3 to  180) deg

S-Parameters3 –
Transmission S12/S21
(cont)
7 mm –
(10 to -50) dB ( 0.02 to  0.71) dB 8753ES Network
(-50 to -70) dB ( 0.16 to  0.95) dB Analyzer
(-70 to -90) dB ( 1.2 to  6.6) dB
Phase (10 to 0) dB ( 5.4 to  6.5) deg

(0 to -50) dB ( 0.14 to  1.3) deg
(-50 to -70) dB ( 1.3 to  6.7) deg
(-70 to -90) dB ( 8.3 to  180) deg
N-Type –
(10 to -70) dB ( 0.02 to  1.1) dB 8510C or 8753ES
Network analyzer,
300 kHz to 6 GHz 85054D or 85032B
(-70 to -90) dB ( 1.2 to  6.6) dB calibration kit
Phase
300 kHz to 18 GHz
(10 to -50) dB ( 0.16 to  1.3) deg
(-50 to -70) dB ( 1.3 to  180) deg
300 kHz to 6 GHz

(-70 to -90) dB ( 1.3 to  180) deg
VI. Fluid Quantities
Viscosity3 –
Dynamic (Meter) (0 to 100 000) cP 0.83 % Standard viscosity
Kinematic (Cups) (0 to 100 000) cP 0.24 % + 0.84 s fluids, PRT,
stopwatch
Flow3 2 sccm to 650 slm 0.26 % Mass flow system

Hydrometers – Specific Gravity:
Baume 1.00 0.0058 % + 0.6R Distilled water

Lighter than Water
(80.5 to 57) (0.66 to 0.75) 0.0072 % + 0.6R Petroleum based

API (81 to 57) solutions
(57 to 10) (0.75 to 1) 0.006 % + 0.6R Alcohol solutions

API (57 to 10)
Heavier than Water
(0.72 to 21) (1 to 1.17) 0.0058 % + 0.6R Sulfuric acid and/or

API (10 to -11) glycerine solutions
(0.72 to 67) (1 to 1.85) 0.0058 % + 0.6R Sulfuric acid

solutions
Volumetric Calibration (0 to 200) mL 0.24 % + 130 nL Gravimetric method

200 mL to 1 L 0.24 % + 9 µL
(1 to 25) L 0.24 % + 900 µL

VII. Foundry-Industry Specific Calibrations
AFS Clay Tester9 300 s 0.42 s Stopwatch
Mold Strength Tester9 (0 to 50) psi 0.20 % + 0.6R Mold strength tester
and balances
Moisture Teller9 (100 to 300) F 2.0 F Temperature

calibrator
Permmeter9 25 perms 1.6 perms Perm standard

90 perms 5.3 perms
160 perms 9.4 perms
Sand Rammer9 (0.6 to 0.9) inches 0.0066 in + 0.6R Impact rings with
(Compactability Tester) caliper
Sand Specimen Tube3 2.0 in 0.0014 in Bore gage
Sand (Green) Strength (0 to 500) psi 0.93 % + 0.82 psi Master force proving
Machine9 gage
Welders3 (1 to 50) V 1.0 % Loadbank and DMM

(1 to 750) A 1.0 %
Wet Tensile Tester9 –
Load 0.449 N/cm2 0.002 N/cm2 Dead weight

Temperature (300 to 320) F 0.70 F Thermometer
Load Rate 0.05 N/cm2/s 0.0017 N/cm2/s Stopwatch

VIII. Mechanical
Accelerometers – Shear (5 to 2000) Hz 2.0 % Reference

and Charge3 (2 to 10) kHz 2.7 % accelerometer, back-
to-back comparison
method
Air Velocity (100 to 4000) ft/min 0.48 % + 5.5 ft/min Flowkinetics

(4000 to 7400) ft/min 0.48 % + 40 ft/min manometer
Cable Tensiometers/ (0 to 1000) lb 1.1 lb + 0.6R Deadweights

Wire Tension Meters
Durometers3 – Types A, B, C, D, E, O ASTM D2240

and DO
Indenter Shape and Pressure foot orifice 3.2 m

Extension: diameter
Indentor extension length 3.2 m Gage blocks

Cone angle 1 arcmin Vision system
Tip radius 3.2 m
Indenter thickness 3.2 μm
Durometer Spring Up to 45 N 36 mN Durometer calibrator

Display Linearity (0.001 to 0.2) in 37 µin or 0.6R, Gage blocks
whichever is greater
Durometer Calibrator Scales A, B, E, O and C, 0.20 % Scale and CMM

D, DO

Indirect Verification of
Brinell Hardness
Testers at Test
Condition(s)3 –
(3000, 1500, 500) kg 10 mm/500 kg

(50 to 70) HBW 0.13 HBW ASTM E10
(71 to 90) HBW 0.38 HBW
(91 to 109) HBW 1.1 HBW
10 mm/1500 kg
(50 to 99) HBW 0.35 HBW
(100 to 200) HBW 0.56 HBW
(201 to 345) HBW 1.4 HBW
10 mm/3000 kg
(100 to 199) HBW 0.80 HBW
(200 to 499) HBW 1.6 HBW
(500 to 650) HBW 3.7 HBW
Indirect Verification of Up to 800 HLD 7.4 HLD ASTM A956 standard

Leeb Hardness Testers test block
Microindentation Vickers, ≤ 1 kg
Hardness Testers (100 to 240) HV 11 HV ASTM E384
(Knoop and Vickers)3 – (241 to 600) HV 11 HV
(600 to >650) HV 11 HV
Knoop, ≤ 1 kg
(100 to 250) HK 5.3 HK
(251 to 650) HK 5.6 HK
(650 to >650) HK 5.2 HK

Rockwell Hardness and
Rockwell Superficial
Hardness Testers3 HRA: ASTM E18
Low 0.29 HRA
Mid 0.56 HRA
High 0.24 HRA
HRBW:
Low 0.94 HRB
Mid 0.69 HRB
High 0.62 HRB
HRC:
Low 0.78 HRC
Mid 0.92 HRC
High 0.39 HRC
HRE:
Low 0.92 HRE
Mid 1.1 HRE
High 0.89 HRE
HR15N:
Low 0.76 HR15N
Mid 0.75 HR15N
High 1.1 HR15N
HR30N:
Low 0.55 HR30N
Mid 0.48 HR30N
High 0.46 HR30N
HR45N:
Low 0.68 HR45N
Mid 0.72 HR45N
High 0.66 HR45N
HR15T:
Low 0.79 HR15T
Mid 0.52 HR15T
High 0.61 HR15T
HR30T:
Low 0.70 HR30T
Mid 0.61 HR30T
High 0.42 HR30T
HR45T:
Low 0.98 HR45T
Mid 0.78 HR45T
High 0.81 HR45T

Load Cells & (0 to 3325) lbf 0.01 % Dead weights,

Transducers – Load comparison to
Cells, Force Gauges, (up to 2 000) lbf 0.036 % + 0.60 lbf master load cell
Force Rings, and (2 to 5.5) klbf 0.028 % + 1.9 lbf
Dynamometers (5.5 to 10) klbf 0.028 % + 4.0 lbf
(10 to 50) klbf 0.21 % + 19 lbf
Mass 1 mg to 50 g 17 µg Mass
(50 to 220) g 35 µg comparison by
(220 to 400) g 0.14 mg substitution
400 g to 1.2 kg 3.7 mg
(1.2 to 8.2) kg 12 mg
(8.2 to 30) kg 0.11 g
Pressure/Vacuum To 1 inH2O 0.0006 inH2O Pressure

Gauges & Transducers3 (>1 to 5) inH2O 0.0031 inH2O calibrators and
(>5 to 10) inH2O 0.0061 inH2O sensors
(>10 to 100) inH2O 0.0016 % + 0.0058 inH2O
(>100 to 400) inH2O 0.0015 % + 0.0015 inH2O
(-15 to 15) psig 0.0069 % + 0.0023 psig
(>15 to 88) psig 0.0005 % + 0.0051 psig
(>88 to 350) psig 0.0052 % + 0.0008 psig
(> 350 to 1000) psig 0.0152 % + 0.0091 psig
(>1000 to 1485) psig 0.15 psig
(>1485 to 3000) psig 0.004 % + 0.242 psig
(>3000 to 6000) psig 0.0007 % + 0.656 psig
(>6000 to 10 000) psig 0.0038 % + 0.745 psig
To 30 psia 0.0065 % + 0.0015 psia
(>30 to 200) psia 0.0083 % + 0.0066 psia
(>200 to 1000) psia 0.0152 % + 0.0077 psia
(>1000 to 1500) psia 0.15 psia
Barometric (10 to 17) psig 0.0007 % + 0.0015 psia
Refractometers3 (0 to 100) % 0.02 % + 0.6R Standard

solutions

Scales and Balances3 (1 to 50) mg 0.016 mg + 0.58R Mass standards

51 mg to 10 g 0.03 mg + 0.58R
(11 to 50) g 0.054 mg + 0.58R
(51 to 300) g 0.24 mg + 0.58R
(301 to 1000) g 3.8 mg + 0.58R
(1 to 5) kg 11 mg + 0.58R
(5 to 30) kg 89 mg + 0.58R
Up to 0.5 lb 0.000 0015 oz + 0.58R
(0.5 to 1) lb 0.000 0030 oz + 0.58R
(1 to 2) lb 0.000 011 oz + 0.58R
(2 to 5) lb 0.000 14 oz + 0.58R
(5 to 10) lb 0.000 34 oz + 0.58R
(10 to 20) lb 0.000 68 oz + 0.58R
(20 to 50) lb 0.000 93 oz + 0.58R
(50 to 100) lb 0.0043 oz + 0.58R
(100 to 500) lb 0.0086 oz + 0.58R
(500 to 1000) lb 0.043 oz + 0.58R
Proportional Up to 750 lb 0.22 lb + 0.6R Class F weights

Calibrations (750 to 1500) lb 0.28 lb + 0.6R
(1500 to 3000) lb 0.36 lb + 0.6R
(3000 to 4500) lb 0.42 lb + 0.6R
(4500 to 6000) lb 0.48 lb + 0.6R
Tachometers3 –
Non-Contact Up to 180 000 rpm 0.8R Calibrator, LED
Contact Up to 5000 rpm 0.024 % + 1.4 rpm Tachometer

(5000 to 15 000) rpm 0.032 % + 0.84 rpm calibrator
Torque Wrenches, Up to 1.5 in∙lbf 0.0076 in∙lbf Torque calibrator

Watches, and Indicators >1.5 to 10 in∙lbf 0.17 % + 0.013 in∙lbf
>10 to 100 in∙lbf 0.25 % + 0.008 in∙lbf
>100 to 145 in∙lbf 0.38 in∙lbf
>145 to 3000 in∙lbf 0.28 % + 0.0058 in∙lbf
>3000 to 24 000 in∙lbf 0.25 % + 3 in∙lbf
Testers and Transducers Up to 2000 ft∙lbf 0.05 % Weights, loading

arms
Ultrasonic Thickness (0 to 10) in (800 + 13L) in Standard thickness

Testers3 specimen

IX. Optical Quantities
Gloss Meters3 20° 0.73 GU Gloss standards; GU

represents gloss
60°, 85° 0.54 GU units.
X. Thermodynamics
Dew Point (-20 to 60) °C -0.44 ºC + 0.6R Thunder Scientific

humidity chamber
Infrared (-15 to 120) °C 0.6 ºC + 0.6R Hart 9132 radiation

Thermometers – (35 to 500) °C 0.8 ºC + 0.6R source
Measuring Equipment3
(500 to 1100) °C 1.6 ºC + 0.0043 ºC/ ºC Isotech Pegasus 92R
radiation source
Temperature Measuring (-40 to 650) °C 0.013 % rdg +0.0028 °C Temperature source,

Equipment– Indicators, or 0.011 °C SPRT
RTD’s, Thermocouples3 -80 °C fixed point (Whichever is greater)
(650 to 1000) °C 0.011 % rdg +0.45 °C
Relative Humidity –
Measure
Hygrometers (10 to 30) % RH 0.59 % RH Humidity generator,

(30 to 60) % RH 0.60 % RH Thunder Scientific
(60 to 90) % RH 0.63 % RH 2500ST
Psychrometers (5 to 35) °C 0.1 °C + 0.84R Comparison to SPRT in

temp bath

XI. Time & Frequency
Frequency – Measuring 10 MHz 3 parts in 1011 GPS

Equipment & Measure
0.01 Hz to 200 kHz 3 parts in 1011 + 1.4 µHz Function generator,
+ 0.58R signal generator,
frequency counter or
spectrum analyzer with
ext. GPS timebase
Stopwatches & Timers3 10 s to 72 hr 28 ms + 18 µs/s Function generator,

frequency counter
(2 to 960) s 0.037 s/day Timometer
Satellite Location:
TRESCAL, INC.
2951 S. Oakwood Rd
Oshkosh, WI 54904
Carol Shipley Phone: 414 351 7420
CALIBRATION
I. Dimensional
Bore Gages3 Up to 12 in 21 µin/in + 0.6R SIP302M

(whichever is greater)

Calipers3 (Including
Intertest, Oditest, Snap
Jaw and other OD
Calipers) –
Up to 2 in 78 µin Gage blocks
Resolution 0.0001 in (2 to 12) in 70 in + 4 in/in
Up to 24 in 450 µin
Resolution 0.0005 in (24 to 60) in 340 in + 3.7 in/in
Up to 30 in 840 µin
Resolution 0.001 in (30 to 100) in 700 in + 3.4 in/in
Chamfer Gages/Hole Up to 12 in (20 + 0.6R) μin Cylindrical rings

Gages3
Indicators3 – Dial & Test, Up to 4 in 35 in or 0.6R Indicator calibrator

LVDTs (whichever is greater)
Height Gage3 Up to 48 in 10 in/in + 0.6R Gage blocks
Micrometers3 –
Inside Up to 294 in 12 in + 7 in /in + 0.2R ULM, gage blocks,

Depth Up to 12 in 18 in/in + 0.64R rings
Tri-Bores Up to 11 in 18 in/in + 0.7R
Outside Up to 42 in 18 in/in + 0.64R
Groove Up to 4 in 18 in/in + 0.64R
Bench Up to 42 in 18 in/in + 0.64R
Thread (Screw, Thread, Up to 4 in 18 in/in + 0.64R
Pitch, Point)
Pin and Plug Gages (0 to 1) in 6.7 in/in + 79 in ULM

II. Mechanical
Torque Wrenches Up to 1000 inꞏlbf 0.6 % + 0.6R Torque calibrator

Up to 250 ftꞏlbf 0.6 % + 0.1 ftꞏlbf
______________________________________
1
This laboratory offers commercial calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration and this laboratory meets A2LA R104 – General
Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations.
Please note the actual measurement uncertainties achievable on a customer's site can normally be
expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such
as the environment at the place of calibration and for other possible adverse effects such as those caused
by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced
by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result
in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
4
In the statement of CMC, L is the numerical value of the nominal length in inches; R is the resolution of
the unit under test; D is the diameter in inches; H is the height of the unit under test (except where noted);
and fs represents full scale. Ra is the numerical value of the nominal roughness of the surface measured
in micrometer roughness, except where noted; the value is defined as the percentage of reading, unless
otherwise noted.
5
CMC for calibrations performed in the laboratory with the Agilent/HP 3458A/HFL is based upon 90-day
specifications. CMC for calibrations performed field with the Agilent/HP 3458A is based upon 1-year
specifications. The measurands stated are generated with the Agilent/HP 3458A. This capability is
suitable for the calibration of the devices intended to measure the stated measurand in the ranges
indicated. CMC are expressed as either a specific value that covers the full range or as a fraction of the
reading plus a fixed floor specification. Unless otherwise noted, percentages are defined as percent of
reading.
6
CMC for calibrations performed with the Fluke 5520A is based upon 1-year specifications. CMC for
calibrations performed with the Fluke 5720A/EP is based upon 90-day specifications. The measurands
stated are generated with the Fluke 5500, 5700 and 732B series of instruments. This capability is suitable
for the calibration of the devices intended to measure the stated measurand in the ranges indicated. CMC
are expressed as either a specific value that covers the full range or as a fraction of the reading plus a
fixed floor specification. Unless otherwise noted, percentages are defined as percent of reading.

7
CMC for calibrations performed with the Fluke 5790A is based upon 1-year specifications. The
measurands stated are generated with the Fluke 5700 series of instruments. This capability is suitable
for the calibration of the devices intended to measure the stated measurand in the ranges indicated.
CMCs are expressed as either a specific value that covers the full range or as a fraction of the reading
plus a fixed floor specification. Unless otherwise noted, percentages are defined as percent of reading.
8
In the statement of CMC, the value is defined as the percentage of reading, unless otherwise noted.
9
This calibration is offered for “Field Service” only.
10
This accreditation covers calibrations performed at the main laboratory listed above, and the following
satellite laboratory located at 2591 S. Oakwood Road, Oshkosh, WI 54904.
11
Parallelism measurements apply only to optical parallels; calibrated for flatness and parallelism.

Accredited Laboratory
A2LA has accredited
TRESCAL, INC.
Milwaukee, WI
for technical competence in the field of
Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSLI
Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-
IAF Communiqué dated April 2017).
Presented this 26th day of June 2019.
_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1078.01
Valid to May 31, 2021
Revsied October 15, 2019
For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.

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SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

Valid To: May 31, 2021 Certificate Number: 1078.01

Parameter/Equipment Range CMC2, 8 () Comments

Measure (Meters) (20 to 140) dB 0.32 dB Sound level calibrator

Parameter/Equipment Range CMC2, 4 () Comments

Conductivity Meters (1 to 10) µS/cm 0.34 µS/cm Conductivity

(A2LA Cert. No. 1078.01) Revised 10/15/2019 Page 1 of 50

pH Meters3 4 pH 0.011 pH Standard buffers

Parameter/Equipment Range CMC2, 4 () Comments

Angle Plates3 Up to 48 in 65 µin or (12 µin/in + 30 Gage amp. probe,

Articulating Arm3 (CMM) – ASME B89.4.22-2004

Single Point Articulation (2 to 10.5) ft

Effective Diameter 1 in (25.4 mm) 82 µin (2.1 µm)

Center Parallelism Up to 24 in (68 + 4L) µin Gage amp w/probe

Base Flatness & Base Up to 24 in (62 +2.5L) µin

(A2LA Cert. No. 1078.01) Revised 10/15/2019 Page 2 of 50

Bore Gages3 Up to 12 in 22 in or 0.6R SIP302M

Parallelism 5 in × 10 in × 10 in 28 µin Gage amp w/probe,

Resolution 0.0001 in Up to 2 in 78 µin Gage blocks

Resolution 0.0005 in Up to 24 in 450 µin

Resolution 0.001 in Up to 30 in 840 µin

Chamfer Gages/Hole Up to 12 in 20 in + 0.6R Cylindrical rings

Clinometers and Up to 360° 0.18 arcseconds + 37 Sine bar/gage blocks

CMMs – Imaging (Video XY diagonal up to ISO 10360-7

EUV Up to 2 in. (15 + 2.9L) in Glass scales

EZ Up to 8 in (Z-axis) (41 + 3.2L) in Gage blocks

Squareness – ESQ Up to 8 in (Z-axis) (19 + 130L) in Ballbar

Probing Performance Diameter Measured:

(A2LA Cert. No. 1078.01) Revised 10/15/2019 Page 3 of 50

Length Error (EL) Up to 52 in 38 in + 5.2 in/in ASME

Coating Thickness 25 µin to 0.5 in 19 µin + 82 µin/in ULM

Concentricity Gage N/A 130 in + 8 μin/in Indicator, bench center

Cylindrical Plugs3 Up to 4 in 4 in + 5 in/in ULM, gage blocks

Cylindrical Rings3 (0.1 to 4) in 4 µin + 5 µin/in ULM, gage blocks

External Spline Gages3 –

Measurement Over Pins Up to 8 in (170 + 28D) in ULM

Circular Tooth Up to 8 in (110 + 16L) µin Vision system

Major Diameter Up to 8 in (28 + 12D) in ULM

Fixed Gaging – Up to 30 in (110 + 16L) µin (length Optical comparator,

(A2LA Cert. No. 1078.01) Revised 10/15/2019 Page 4 of 50

Gage Amplifier and

Single Probe Up to 0.025 in 8.9 in Gage blocks

Gage Balls Up to 4 in (32 + 1.5D) in Universal length

Gage Blocks Up to 4 in (3.1 + 3.2L) in Gage blocks and

Height Gage3 Up to 48 in 10 in/in + 0.6R Gage blocks

Height Measures3 Up to 24 in 13 in/in + 94 in Height gage

Indicators3 – Dial & Test, Up to 4 in 35 in or 0.6R Indicator calibrator

Indicator Calibrator3 Up to 4 in 12 in + 0.6R Gage blocks, amp

Laser Distance Meters Up to 6.1 m 4.6 µm/m + 120 µm ULM

(A2LA Cert. No. 1078.01) Revised 10/15/2019 Page 5 of 50

Length & Thickness

Steel Up to 4 in 4 in + 5 in/in ULM, gage blocks

Field Calibration Up to 16 in 5 µin + 14 µin/in + 4 ULM, gage blocks,

Linear Measurement of Up to 20 ft 1.5 μin/in + 0.58 μin Laser

Linear Scales/Reticles and

2D Up to 12 in (115 + 15L) in Vision system

1D Up to 30 in 11 in + 1.5 in/in Gitterperioden

Inside Up to 294 in 12 in + 7 in /in + 0.2R ULM, gage blocks or

(700 to 1000) V (10 to 20) Hz 0.016 % Measure only