Unit IV - MCQs
Unit IV - MCQs
Unit IV - MCQs
7 The oxide . thickness tox of typical integrated circuit MOSFET is less than---
a) 100 angstroms b) 200 angstroms c) 400 angstroms d) none of these
8 As VDs increases beyond VDs(sat) effective channel length ---
9 As VDs increases beyond VDs(sat) effective channel length · _decreases. This phenomenon is known
as ---.
a) channel. height modulation c) channel width modulation
b) channel length modulation d) Channel expansion
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a) channel width c) channel length
b) mobility of the electrons in the inversion layer d) both a and b
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Answer Key
Q.N Ans Q.N Ans Q.N Ans Q.No Ans Q.No Ans Q.No Ans
o o o
1 2 3 4 5 6
7 8 9 10 11 12
13 14 15 16 17 18
19 20 21 22 23 24
25 26 27 28 29 30
31 32 33 34 35 36
37 38 39 40 41 42
43 44 45 46 47 48
49 50 51 52 53 54
55 56 57 58 59 60
61 62 63 64 65 66
67 68 69 70 71 72
73 74 75 76 77 78
79 80 81 82 83 84
85 86 87 88 89 90
91 92 93 94 95 96
97 98 99 100 101 102
103 104 105 106 107 108
109 110 111 112 113 114
115 116 117 118 119 120
121
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