Labview: Statistical Process Control Toolkit Reference Manual

aBook Page 1 Wednesday, April 22, 1998 8:21 AM
LabVIEW ®
Statistical Process Control Toolkit

Reference Manual
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All rights reserved. September 1994
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aBook Page v Wednesday, April 22, 1998 8:21 AM
Contents
About This Manual ...............................................................ix

Organization of This Manual ...................................................ix
Conventions Used in This Manual............................................x
Related Documentation ............................................................xii
Customer Communication .......................................................xii
Chapter 1
Introduction to Statistical
Process Control in LabVIEW .............................................1-1
Installation ................................................................................1-1
Windows ...........................................................................1-1
SPARCstation ...................................................................1-2
Macintosh .........................................................................1-3
Requirements for Using the SPC Toolkit ................................1-3
SPC Toolkit Organization ........................................................1-4
VI Libraries .......................................................................1-4
Custom Controls ................................................................1-6
LabVIEW SPC Toolkit Examples ....................................1-7
Implementing SPC Applications in LabVIEW ........................1-8
Representation of Process Data in LabVIEW ..................1-8
Viewing Raw Process Data ..............................................1-9
Creating Control Charts and
Determining Whether the Process Is in Control ...............1-13
Detecting Out-of-Control Points and Process Shift ..........1-15
Process Capability Analysis .............................................1-19
Pareto Analysis .................................................................1-20
Chapter 2
Control Chart VIs ....................................................................2-1
Calculating Control Chart Limits and Points ...........................2-1
Variables Chart VIs ..........................................................2-2
Attributes Charts VIs ........................................................2-3
VIs for Drawing Charts ....................................................2-4
VIs for Plotting Control Chart Points and Limits ......2-5
VIs for Creating Graphs of Raw Process Data ..........2-5
Rule Checker VIs for Testing
Out of Limits, Run Rules, and Process Shift ....................2-7
© National Instruments Corporation v LabVIEW SPC Toolkit Reference Manual

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Contents
Variables Chart VIs ..................................................................2-7

X-Bar & s Chart .........................................................2-7
X-Bar & R Chart .......................................................2-11
X & mR Chart ...........................................................2-14
mX-bar & mR Chart ..................................................2-18
Single Point X-Bar & R/S .........................................2-22
Single Point x/mX-bar & mR ....................................2-23
Attributes Charts VIs ...............................................................2-24
p chart ........................................................................2-24
np Chart .....................................................................2-27
c Chart .......................................................................2-29
u Chart .......................................................................2-32
Draw Control Chart VIs ...........................................................2-35
Draw Control Chart ...................................................2-35
Draw Chart with Zones .............................................2-36
Draw Chart with Var Limits ......................................2-37
Draw Run Chart .........................................................2-38
Draw Tier Chart .........................................................2-40
Rule Checker VIs .....................................................................2-42
Check Control Limits ................................................2-42
Rule Checker (AT&T/WE) .......................................2-43
Rule Checker (Nelson) ..............................................2-44
Process Shift Detector ...............................................2-46
Sequence Checker .....................................................2-47
Chapter 3
Process Statistics VIs ..............................................................3-1
Process Mean and Sigma ...........................................3-1
Compute Process Capability ......................................3-3
Sample Statistics VI ..................................................3-5
General Histogram .....................................................3-6
Fit Nrml PDF to Histogram .......................................3-8
Normal PDF Graph with Limits ................................3-9
Plot Normal PDF .......................................................3-10
Vertical Bar Graph with Limits .................................3-12
Vertical Bar Graph ....................................................3-13
Rotate Graph ..............................................................3-14
Chapter 4
Pareto Analysis VIs .................................................................4-1
Pareto Counter ...........................................................4-2
Pareto Chart ...............................................................4-3
Cause Code Lookup ..................................................4-4
Array to Bar/Comb Graph .........................................4-5
LabVIEW SPC Toolkit Reference Manual vi © National Instruments Corporation

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Contents
Appendix
Customer Communication....................................................A-1
Glossary ........................................................................................G-1
Figures
Figure 1-1. Basic Run Chart ...........................................................1-10
Figure 1-2. Diagram for Basic Run Chart .......................................1-10
Figure 1-3. Basic Histogram Plot ....................................................1-11
Figure 1-4. Diagram for Basic Histogram Plot ...............................1-12
Figure 1-5. Basic Tier Chart ...........................................................1-12
Figure 1-6. Diagram for Basic Tier Chart .......................................1-13
Figure 1-7. X-bar and S Chart Example ..........................................1-14
Figure 1-8. Diagram for X-bar and S Chart Example .....................1-14
Figure 1-9. p Chart with Variable Limits VI Example ...................1-15
Figure 1-10. Diagram for p Chart with Variable Limits VI
Example........................................................................................1-15
Figure 1-11. X-bar and R Chart Check Limits Example ................1-16
Figure 1-12. Diagram for X-bar and R Chart Check Limits
Example .......................................................................................1-17
Figure 1-13. Zone Rule Test (AT&T/WE) Example ......................1-18
Figure 1-14. Diagram for Zone Rule Test (AT&T/WE) Example...1-18
Figure 1-15. Process Capability Example 1 ....................................1-20
Figure 1-16. Diagram for Process Capability Example 1 ...............1-20
Figure 1-17. Pareto Chart Example .................................................1-21
Figure 1-18. Diagram for Pareto Chart Example ............................1-21
© National Instruments Corporation vii LabVIEW SPC Toolkit Reference Manual

aBook Page ix Wednesday, April 22, 1998 8:21 AM
Introduction
About This Manual

The LabVIEW Statistical Process Control Toolkit Reference Manual
describes the LabVIEW add-on package you can use for implementing
statistical process control functions.
Organization of This Manual

This manual is organized as follows:
• Chapter 1, Introduction to Statistical Process Control in LabVIEW,

contains installation instructions, gives an overview of Statistical
Process Control (SPC), and discusses the LabVIEW SPC Toolkit
VIs and examples.
• Chapter 2, Control Chart VIs, describes the control chart VIs,

which include the variables charts, attributes charts, chart drawing,
and rule checking VIs. The control chart VIs compute control limits
for control charts, create control chart graphs, and apply rules to
control chart data that detect out-of-control conditions.
• Chapter 3, Process Statistics VIs, describes the process statistics

VIs, which are useful for process capability analysis and for
viewing and measuring process distribution.
• Chapter 4, Pareto Analysis VIs, describes the Pareto analysis VIs,

which include the Pareto Counter VI, the Pareto Chart VI, and the
Cause Code Lookup VI. The Array to Bar/Comb VI, which the
Pareto Analysis VIs use as a subVI, is also included.
• The Appendix, Customer Communication, contains forms you can

use to request help from National Instruments or to comment on our
products and manuals.
• The Glossary contains an alphabetical list and description of terms

used in this manual, including abbreviations, acronyms, metric
prefixes, mnemonics, and symbols.
© National Instruments Corporation ix LabVIEW SPC Toolkit Reference Manual

aBook Page x Wednesday, April 22, 1998 8:21 AM
About This Manual
Conventions Used in This Manual

The following conventions are used in this manual:
bold Bold text denotes menus, menu items, and VI
input and output parameters.
italic Italic text denotes emphasis, a cross reference, or
an introduction to a key concept. Italic text also
denotes a variable such as filename or N when
it appears in a text passage.
bold italic Bold italic text denotes a note, caution, or
warning.
monospace Monospace font denotes text or characters that
you enter using the keyboard. File names,
directory names, drive names, sections of code,
programming examples, syntax examples, and
messages and responses that the computer
automatically prints to the screen also appear in
this font.
!
Warning: This icon to the left of bold italicized text denotes
a warning, which alerts you to the possibility of
damage to you or your equipment.
!
Caution: This icon to the left of bold italicized text denotes
a caution, which alerts you to the possibility of
data loss or a system crash.
Note: This icon to the left of bold italicized text denotes

a note, which alerts you to important
information.
LabVIEW SPC Toolkit Reference Manual x © National Instruments Corporation

aBook Page xi Wednesday, April 22, 1998 8:21 AM
About This Manual
LabVIEW Data Each VI description gives a data type picture for

Types each input and output parameter, as illustrated in
the following table.
Control Indicator Data Type

Signed 8-bit integer
Unsigned 8-bit integer
Single-precision floating-point number
Double-precision floating-point number
Extended-precision floating-point number
String
Boolean
Array of signed 32-bit integers
Cluster
File Refnum
Abbreviations, acronyms, metric prefixes, mnemonics, symbols, and

terms are listed in the Glossary.
© National Instruments Corporation xi LabVIEW SPC Toolkit Reference Manual

aBook Page xii Wednesday, April 22, 1998 8:21 AM
About This Manual
Related Documentation
The following documents contain information that you may find helpful
as you read this manual:
• Your LabVIEW tutorial
• Your LabVIEW user manual
• American Society for Quality Control. American National

Standard. Definitions, Symbols, Formulas, and Tables for Control
Charts, 1987. Publication number: ANSI/ASQC A1-1987.
• Breyfogle, Forest W., Statistical Methods for Testing, Development,

and Manufacturing, John Wiley and Sons, 1992.
• Montgomery, Douglas C., Introduction to Statistical Quality

Control, J. Wiley and Sons, 2nd edition, 1991.
• Wheeler, Donald J. and Chambers, David S., Understanding

Statistical Process Control, SPC Press, 2nd edition, 1992.
Customer Communication
National Instruments wants to receive your comments on our products
and manuals. We are interested in the applications you develop with our
products, and we want to help if you have problems with them. To make
it easy for you to contact us, this manual contains comment and technical
support forms for you to complete. These forms are in the appendix,
Customer Communication, at the end of this manual.
LabVIEW SPC Toolkit Reference Manual xii © National Instruments Corporation

Chapter Introduction to Statistical

Process Control in
1 LabVIEW
This chapter contains the installation procedure, gives an overview of
Statistical Process Control (SPC), and discusses the LabVIEW SPC
Toolkit VIs and examples.
Installation
The following sections contain instructions for installing the SPC Toolkit
on Windows, Sun SPARCstation, and Macintosh. The SPC Toolkit
comes in compressed form on floppy disks. Installing the SPC Toolkit
requires approximately 4 MB.
Windows
You can install the SPC Toolkit from the DOS prompt, the Windows File
Manager, or with the Run... command from the File menu of the
Program Manager.
1. Insert the first SPC Toolkit disk into the 3.5-in. disk drive and run the
SETUP.EXE program using one of the following three methods.
a. From Windows, select Run... from the File menu of the

Program Manager. A dialog box appears. Type X:\SETUP
(where X is the proper drive designation). Press <enter> or
select OK.
b. From Windows, launch the File Manager. Click on the drive

icon that contains the installation disk. Find SETUP.EXE in the
list of files on that disk and double-click on it.
2. After you choose an installation option, follow the instructions that

appear on the screen. The installer will prompt you to name the
directory that contains LabVIEW and its associated files.
After you install the LabVIEW SPC Toolkit, your LabVIEW directory
should contain a new SPC directory, and the LabVIEW Functions and
Controls menus will contain SPC entries the next time you launch
LabVIEW.
© National Instruments Corporation 1-1 LabVIEW SPC Toolkit Reference Manual

Introduction to Statistical Process Control in LabVIEW Chapter 1
SPARCstation
You can install the SPC Toolkit as shown in the following steps. You do
not need root privileges to install the SPC Toolkit, but you must be able
to write to the LabVIEW directory where the SPC Toolkit will be
installed.
On systems running Solaris 2.2 or later you must determine whether your
system is running the volume manager, by entering the following
command:
ps -a | fgrep vold
The following message usually appears to tell you that the volume
manager is running:
14818 pts/9 S 0:01 /usr/sbin/vold
If volume manager is running, install the SPC toolkit as follows:
1. Use the cd command to change to a directory where you have write

permission, such as /var/tmp or your home directory.
2. Insert the first SPC Toolkit disk into the 3.5 in. disk drive.
3. Type volcheck.
4. Type tar xf /vol/dev/aliases/floppy0 INSTALL to

extract the installation script.
5. To run the installation script, type ./INSTALL. Follow the

instructions on the screen. The installer will prompt you to name the
If volume manager is not running or if your system runs Solaris 1, install

the SPC toolkit as follows:
1. Use the cd command to change to a directory where you have write

permission, such as /var/tmp or your home directory.
2. Insert the first SPC Toolkit disk into the 3.5 in. disk drive.
3. Type tar xf /dev/rfd0c INSTALL to extract the installation

script.
4. To run the installation script, type ./INSTALL. Follow the

instructions on the screen. The installer will prompt you to name the
LabVIEW SPC Toolkit Reference Manual 1-2 © National Instruments Corporation

Chapter 1 Introduction to Statistical Process Control in LabVIEW
LabVIEW.
Macintosh
1. Insert the first SPC Toolkit disk into the 3.5 in. disk drive and
double-click on the LabVIEW SPC Toolkit Installer icon.
2. After you select the Install button, you are prompted to select a
destination directory. Select your LabVIEW folder.
3. Follow the instructions on the screen.
LabVIEW.
Requirements for Using the SPC Toolkit

Some of what you need to build an SPC application is already part of the
LabVIEW programming environment. The SPC Toolkit package adds
the missing pieces you need to complete your application. The SPC
Toolkit consists of a set of VI libraries that implement key SPC functions
such as control charts, process statistics, and Pareto analysis. The SPC
Toolkit also contains several subVIs that generate the typical SPC
graphical presentations.
To use Statistical Process Control effectively, you must be trained in

SPC methods. SPC training is necessary because success in an SPC
program depends on educated judgment and experience. Rote
application of pre-existing templates is no substitute for this judgment.
The SPC Toolkit package is a way to use LabVIEW to create SPC
applications. If you are using this package to analyze and improve your
process, you must receive training in SPC methods or have access to
someone who has SPC expertise.
Two good sources on Statistical Process Control methods are the

Wheeler and Chambers work and the Montgomery work cited in the
Related Documentation section of About This Manual. The first
reference can help you understand how to apply SPC methods, and the

second reference provides a good theoretical and mathematical basis

for SPC.
You must have LabVIEW programming experience to use this package.

You can explore the simple examples included in the SPC_EXMP library
after going through Chapter 1 in both the LabVIEW user and tutorial
manuals which cover basic LabVIEW principles. To modify the more
advanced SPC application examples successfully, however, you must be
an advanced LabVIEW user.
In the next section you will take a brief look at the organization of the
SPC VIs. Then the following section guides you through some of the
LabVIEW programming techniques you will use in statistical
processing.
SPC Toolkit Organization

The SPC Toolkit is organized into three sections: VI Libraries, Custom
Controls, and Examples.
VI Libraries
After you have read this chapter, you are ready to begin using the SPC
Toolkit VIs. Click on the block diagram to activate it and select SPC
under the Functions menu. You see the menu and submenu shown in the
following illustration. Then select the VI you want; the icon
corresponding to that VI will appear in the block diagram, ready for you
to wire it.
Note: The screens illustrated in this manual were taken on the Macintosh. If
you are using Sun or Windows, your screens will look slightly different,
but the information on the screens is the same across all three
platforms.

The Control Chart VIs include VIs for calculating control chart limits for
both attributes and variables charts, drawing control chart graphs, and
applying run rules to control charts.
The Process Statistics VIs include VIs for estimating process distribution
and capability, calculating and plotting histograms, and functions for
plotting and fitting normal probability distribution functions to
histograms.
The Pareto Analysis VIs include VIs for counting and sorting assigned
causes and for creating Pareto charts.
When you view the VIs from your block diagram using the help window,
notice that some of the input parameters are labeled in bold typeface.
Bold typeface identifies parameters that should be wired to make the VI
operate properly. Plain typeface identifies input parameters that are
optional. Optional parameters can help you take advantage of advanced
modes of operation, but are not necessary for the VI to work. When you
do not wire the optional input parameters they are automatically set to
reasonable default values.

Custom Controls
A set of custom controls for SPC graphs and legends are also installed as
part of the LabVIEW front panel Controls menu. These include XY
graphs specially preformatted to match the multiplot XY graphs output
by the various SPC subVIs. The following illustration shows the SPC
Graphs & Legends palette with a set of custom controls for use with the
SPC Toolkit VIs.
The custom controls are installed as part of SPC Toolkit. These custom
controls are pre-formatted and labeled X-Y graphs and legends for
wiring directly to the outputs of the drawing VIs for control charts,
process statistics and Pareto analysis. They are as follows:
Basic Control Chart. A pre-formatted X-Y graph for use with the Draw
Control Chart VI.
Control Chart Lines cluster. A cluster displaying values for the control
chart lines for use as a legend with all the drawing VIs for control charts.
Control Chart with Zones. A pre-formatted X-Y graph for use with the
Draw Control Chart with Var Limits VI.
Control Chart Zones cluster. A cluster displaying values for the control
chart zones A, B and C, for use as a legend with the Draw Control Chart
with Zones VI.

Control Chart with Var Limits. A pre-formatted X-Y graph for use
with the Draw Control Chart with Var Limits VI.
Control Chart (show pts not in control). A pre-formatted X-Y graph

useful for highlighting out of control points. See the example VI X-bar
& S Chart correct limits in SPC_EXMP.llb for a demonstration of how
to use this type of graph format.
Control Chart with Zones (show pts). A pre-formatted X-Y graph

useful for highlighting out of control points on a Control Chart with
Zones. See the example VI Zone Rule Test (Nelson) Example in
SPC_EXMP.llb for a demonstration of how to use this type of graph
format.
Control Chart and Limits cluster. A cluster containing a pre-formatted

X-Y graph and three numeric indicators for the control chart lines. This
is a useful organization and grouping for a control chart and limit values.
Run Chart with Limits. A pre-formatted X-Y graph for use with the
Draw Run Chart VI.
Tier Chart. A pre-formatted X-Y graph for use with the Draw Tier Chart
VI.
Histogram Bar Graph with Limits. A pre-formatted X-Y graph for use
with the Draw Vertical Bar Graph with Limits VI.
Normal PDF Graph with Limits. A pre-formatted X-Y graph for use
with the Normal PDF Graph with Limits VI.
Histogram and Normal PDF Plot. A pre-formatted X-Y graph for use
with histogram and superimposed normal PDF plot with limits. See the
example VI Proc Cap Example 2 in SCP_EXMP.llb for a
demonstration of how to use this type of graph format.
Pareto Chart. A pre-formatted X-Y graph for use with either Pareto
Chart output of the Pareto Chart VI.
Pareto Chart legend. A pre-formatted table indicator for use with the
legend output of the Pareto Chart VI.
LabVIEW SPC Toolkit Examples

There are two libraries of examples with the SPC Toolkit. The
SPC_EXMP.llb library contains basic to intermediate SPC examples.

These examples are useful for getting started and learning how to group
the SPC VIs to perform typical SPC calculations and presentations.
The SPC_DEMO.llb (SPC demonstration library) contains an example

application, the Real-time SPC Demo, that analyzes process data
acquired point by point. This is a more advanced VI that you could
modify once you are more proficient at using the SPC Toolkit.
These libraries of examples are contained in the SPC directory in your

LabVIEW folder or directory.
Implementing SPC Applications in LabVIEW

This section discusses the main components that make up an SPC
application and guides you through some of the programming techniques
you can use in your statistical processing. These programming
techniques include representation of process data, viewing raw process
data, creating control charts and determining whether your process is in
control, detecting out-of-control points, and using process capability and
Pareto analysis.
This section also directs you to the relevant standard LabVIEW features
or the additional SPC Toolkit features to use when implementing an
application. Definitions of the SPC terms used in this overview appear in
the Glossary at the end of this manual. All examples that appear in this
section are located in the SPC_EXMP.llb library.
Representation of Process Data in LabVIEW

In SPC applications, some key characteristics of the process are
measured or counted, and then tracked. In this manual, measurements of
these processes are referred to as individual observations or individuals.
These measurements are often grouped into samples or subgroups. The
number of observations in a sample is referred to as the sample size (also
known as subgroup size). Deciding which measurements to make, how
many and how often to make them, and how they are grouped is beyond
the scope of this manual. See “rational subgrouping” in the sources cited
in the Related Documentation section of About This Manual for more
information on this topic.
In the SPC VIs for calculations on variable (measured) data, samples

consisting of a number of individual observations are handled as 2D
arrays. The arrays are set up where each row is a sample, and the columns

contain the observations. To use these VIs, group your measured process
data into appropriate 1D array samples (subgroups), and then group the
samples together to form a 2D array. All samples in a 2D array must be
the same size. The control chart VIs automatically calculate sample size
by measuring the width of the 2D array. You can use the LabVIEW
Reshape Array function to convert a 1D array to a 2D array.
If you have a sample (subgroup) size of one, you can keep your data in
1D arrays. In this case, you will be limited to using the X & moving
Range chart or mX-bar & moving Range VIs. Attribute data, such as
number of defects per unit, are handled as 1D arrays.
There are two ways you can graphically present your measured data in
LabVIEW—as you acquire each data point or sample, and after you have
acquired a collection of samples. LabVIEW has several standard
methods for viewing process data. Three basic graph types—the
waveform chart, the waveform graph, and the XY graph—are all useful
to you.
You can implement a run chart (a plot of the individual observations

plotted in time order) by wiring a 1D array containing your observations
to the standard waveform graph. If you want to monitor your incoming
data one point at a time, use a waveform chart. If you are plotting all the
points at once, you can use a waveform graph.
SPC charts typically plot process data against reference lines, which may
be specification limits, control chart limits, or some other useful
reference. In LabVIEW, you can use an XY graph to plot a set of points
and reference lines by specifying the reference lines as X-Y pairs. The
LabVIEW SPC Toolkit automatically generates these types of XY
graphs for you.
The SPC Toolkit includes a set of custom SPC controls, including XY

graphs that are preformatted for various types of SPC charts and chart
legends. These charts are preformatted to work with the SPC VIs that
create SPC graphs.
If you are updating a waveform chart one point at a time, you can group
each point into a cluster with the reference points, and wire the cluster to
your waveform chart.
Viewing Raw Process Data

It is useful to view your raw process data before calculating control limits
and plotting control charts. The SPC VIs provide three methods for

viewing your raw process data—a basic run chart, a histogram, and a tier
chart. An example of a basic run chart is illustrated in Figure 1-1. A run
chart is a plot of the individual measurements plotted in time order. It is
displayed on an XY graph and generated by the Draw Run Chart VI. The
specification limits are shown against the individuals in the example. The
block diagram for the example VI Basic Run Chart is illustrated in
Figure 1-2.
Figure 1-1. Basic

Run Chart
Figure 1-2. Diagram

for Basic Run Chart
Another useful reference for viewing the raw process data is the natural
process limits, calculated from the average mean and sigma of the group
of samples. The natural process limits measure the distribution of the
process data. The natural process limits are typically the process mean
+/- 3.0 * process sigma. The Process Mean and Sigma VI, in the process

statistics library, estimates the process mean and sigma from the process
samples.
For viewing the distribution of your data, a histogram is useful. The

General Histogram VI computes a histogram, automatically estimating a
reasonable number of bins based on Sturges’ rule. You can also choose
the number of bins, or specify bin sizes. LabVIEW then plots the
histogram using the Vertical Bar Graph VI and an XY graph.
You can superimpose the specification limits on the histogram, which the
Vertical Bar Graph with Limits VI does for you. Figure 1-3 shows a basic
histogram plot of the individual observations in the 2D samples array
plotted against both the natural process limits calculated by the Process
Mean and Sigma VI, and the specification limits. Figure 1-4 illustrates
the block diagram for the Basic Histogram Plot VI example.
Figure 1-3. Basic

Histogram Plot

Figure 1-4. Diagram for

Basic Histogram Plot
Another useful way to view the raw process data is on the tier chart, also
known as a tolerance diagram. This plot charts the observations in each
sample in a straight, vertical line. With this vertical line plot, you can
visualize the spread and location of the observations in each sample. The
Draw Tier Chart VI generates the tier chart for you, as shown in Figure
1-5. Figure 1-6 illustrates the block diagram for the Basic Tier Chart VI.
Figure 1-5. Basic

Tier Chart

Figure 1-6. Diagram

for Basic Tier Chart
Creating Control Charts and Determining Whether the Process is

in Control
You use control charts to determine if a process is in control. The
LabVIEW SPC Toolkit VIs generate the following standard types of
control charts.
• Variables charts:
– X-bar and standard deviation (X-bar & s Chart VI)
– X-bar and range (X-bar & R Chart VI)
– X and moving range (x & mR Chart VI)
– moving average and moving range (mX-bar & mR Chart VI)
• Attributes Charts:
– p (p Chart VI)
– np (np Chart VI)
– u (u Chart VI)
– c (c Chart VI)
The control chart VIs calculate the control limits for a control chart.
Normally, the control chart VIs use the process data to calculate the
control limits. You must choose the set of samples from which to
calculate the control limits. Variables charts typically use the first 20 to
30 samples of sample size four or five, for a total of about 100 individual
observations of the process. The control chart VIs can also calculate
control limits from standard values.
Once the VI calculates the limits, there are several ways to plot the
control charts with corresponding VIs that will generate the XY graphs

for the different chart styles. The most common presentation is a control
chart that draws the data against the three standard error control limits
illustrated in Figure 1-7, in which the Draw Control Chart VI does the
graphing. Figure 1-8 shows the block diagram for this VI example.
Figure 1-7. X-bar

and S Control Chart
Example
Figure 1-8. Diagram

for X-bar and S Control
Chart Example

The Draw Chart with Zones VI divides the area between the three sigma
control limits into six zones that are one sigma wide, and draws the zones
against the control chart points. This presentation is useful when you
want to apply rules to the chart to detect out-of-control points. This use
of a zones chart is illustrated in the next section, Detecting
Out-of-Control Points (Figures 1-13 and 1-14).
Some of the attributes charts calculate variable control limits, which are
plotted by the Draw Chart with Var Limits VI. The front panel and block
diagram of the p Chart with Variable Limits VI Example, which uses the
Draw Chart with Var Limits VI, are shown in Figures 1-9 and 1-10.
Figure 1-9. p Chart

Example, Var Limits
Figure 1-10. Diagram

for p Chart Example,
Var Limits
Detecting Out-of-Control Points and Process Shift

After a variable or attribute chart VI calculates the control limits, you can
determine if the process is in control. The most basic way to determine if
a process is in control is to observe which points exceed the upper and

lower control limits. The Check Limits VI identifies the index of each
sample that exceeds the process limits.
Figure 1-11 shows the Check Limits VI applied to the X-bar chart in the
X-bar & Range Chart Check Limits example; its block diagram is
illustrated in Figure 1-12. Notice that, out of the given 40 samples, 25
samples (index zero to 24) are selected for calculating the control limits.
The VI calculates the points of the remaining samples for the graph, but
does not include them in the control limit calculation.
Figure 1-11. X-bar

& Range Chart Check
Limits Example


for X-bar & Range
Chart Check Limits
Example
Control points calculated from a process can stay within the control
limits but still exhibit nonrandom behavior such as repeated patterns in
the data. To detect such patterns you can use the rule checker VIs to
apply run rules to the control chart array. The run rules included in the
SPC Toolkit are AT&T/Western Electric and Nelson rules. The rule
checker VIs identify the indices of samples that violate the run rules. You
can individually enable run rules. Figure 1-13 shows the Zone Rule Test
(AT&T/WE) Example, which applies the AT&T/Western Electric rules
to an X-bar chart. Figure 1-14 shows the block diagram for this example.

Figure 1-13. Zone

Rule Test
(AT&T/WE) Example

for Zone Rule Test
(AT&T/WE) Example
After you have identified samples that have violated run rules, you can
recalculate the control limits by calling the Control Chart VI again, and
pass in the list of sample indices to ignore.
Note: Before ignoring a sample in a control limit calculation, you must know
what caused the sample to be out of control (that is, you need to know
the assignable cause).
You can also apply run rules to detect process shift, which indicates that
control chart limits should be recalculated because the process has
changed (shifted with respect to the center line). The Process Shift

Detector VI uses four rules to detect process shift and identifies the first
point of the process shift.
Process Capability Analysis

Using process capability analysis, you can quantify the ability of your
process to create product within specification. Once your process is in
control, you can calculate its capability, which is a predictor of the
process performance, as long as the process remains in control. It is
misleading to perform these computations unless your process is in
control. If it is not in control, process capability analysis is no longer
predictive, but can still characterize the past performance of your
process.
Two common measures of process capability are the process capability

index (PCI or Cp), which measures the process variability with respect
to the specification limits, and the centered capability index, or Cpk,
which measures how centered the process is with respect to the
specification limits. The Compute Process Capability VI performs these
calculations.
If your process is normally distributed, you can estimate the process

fraction non-conforming in parts per million. The Compute Process
Capability VI performs this computation, but is invalid unless the
process is normally distributed. One method for determining whether
your process is normally distributed is to view a histogram of the
observations against a normal curve fitted to the histogram.
It is useful to visualize the distribution of the process relative to the

specification limits. Figure 1-15 shows a histogram of the process
observations against the specification limits and natural process limits. A
normal distribution curve is fitted to the histogram. The process
capability measures, Cp, Cpk, and reject rate, are also calculated and
displayed. Figure 1-16 illustrates the block diagram for this example.

Figure 1-15. Process

Capability Example 1

for Process Capability
Example 1
Pareto Analysis
In SPC applications, you often need to quantify and prioritize assignable
causes that prevent a process from being in control or otherwise prevent
a product from conforming to specifications. You can assign causes to a
sample when you detect samples being out of control from a control
chart. There are other things that can prevent a product from conforming
to specifications that need to be analyzed such as tabulated results from
product inspection. You can totalize, order, and present causes using the

Pareto VIs. Figure 1-17 shows the Pareto analysis and presentation
example, Pareto Chart Example. Figure 1-18 illustrates the block
diagram for this example.
Figure 1-17. Pareto

Chart Example

for Pareto Chart
Example

Chapter
2 Control Chart VIs
This chapter describes the control chart VIs which include the variables
charts, attributes charts, chart drawing, and rule checking VIs. The
control chart VIs compute control limits for control charts, create control
chart graphs, and apply rules to control chart data that detect
out-of-control conditions.
Calculating Control Chart Limits and Points

The variables and attributes chart VIs compute the points to be plotted on
the control charts, as well as the center line and control limits for the
control chart. The process data input to the chart VIs is a one- or
two-dimensional array of samples. The control chart VIs pass output
arrays and chart limits clusters to one of the chart drawing VIs to create
the desired control chart graph.
The chart limits cluster contains the upper control limit (UCL), center
line (CL), lower control limit (LCL), and the standard error from which
the upper and lower control limits are calculated. The limits are center
line +/- 3 standard errors by default.
To compute the control limits from the input sample data, you select a
subset of the array input to the Control Chart VI by wiring an index
specifier. The index specifier designates the start and end index of the
samples the control chart limit calculations use. You can also exclude
specific samples from the control limit calculation by wiring an array of
the sample indices to the indices to ignore input of the VI. Doing this is
useful when samples are detected to be out of control by one of the rule
checking VIs. The # samples in calc output returns the actual number of
samples the VI used to calculate the control limits. If you do not wire
either input, the VI calculates the control limits from the entire input
array.
Normally the control limits are calculated from the input sample data,
however the control chart VIs will calculate control limits based on
standard values if you wire the chart limit src input cluster.

Control Chart VIs Chapter 2
The standard error multiplier input specifies the multiplier for the VI to
use when calculating the upper and lower control limits, normally three.
You do not need to wire this input unless you are using upper and lower
control limits that are not at +/- 3.0 standard errors.
Variables Chart VIs

You use variables charts to detect out-of-control conditions on measured
process values. The VIs for creating variables charts generate outputs for
two control charts—sample mean and variation. The chart for sample
mean tracks variation in the mean of each sample against control limits.
The chart for sample variation tracks the variation in the distribution of
each sample against control limits. A typical variables control chart VI,
the X-bar & R Chart VI, is shown in the following illustration.
The variables chart VIs, whose names appear in the following list, are
described in more detail in this chapter.
• X-bar & s Chart
• X-bar & R Chart
• x & mR Chart
• mX-bar & mR Chart
• Single Point X-bar & R/S
• Single Point x/mX-bar & mR
The X-bar & s Chart and X-bar & R Chart VIs take a two-dimensional
input array of samples, where each column contains an individual
observation within a sample, and each row is a sample. The sample size
is the number of columns in the 2-D array. The X-bar & R Chart VI is
limited to sample sizes of 25 or less (25 columns). The X-bar & s Chart
VI has no limit on the sample size.

Chapter 2 Control Chart VIs
The x & mR Chart VI and mX-bar & mR Chart VI take a

one-dimensional input array of individual observations. The VIs
calculate the moving average range from n consecutive observations,
where n is sample size input. By default, n is set to two.
The Single Point X-bar & R/S VI calculates points for sample mean and
variation control charts one sample at a time and uses both the range and
sample standard deviation calculations. This VI is useful for calculating
individual points for a control chart when generating control charts in
real time. It is still necessary to use the X-bar & s or X-bar & R VI for
calculating the control limits.
The Single Point x/mX-bar & mR VI calculates the individual points for
an X and moving range or moving average and moving range control
chart. This VI is useful for calculating individual points for a control
chart when generating control charts in real time. It is still necessary to
use the X & mR or mX-bar & mR VI for calculating the control limits.
The variables control chart VIs are each described in more detail later in
this chapter.
Attributes Chart VIs

You use attributes charts to detect out-of-control conditions on process
data that is counted, such as the number of parts defective in a sample of
n units inspected. The attributes charts included in the SPC Toolkit are
the following.
• p chart
• np chart
• c chart
• u chart
The attributes chart VIs take one or more one-dimensional arrays as the
input data. The p chart and u chart can handle both a fixed sample size or
variable sample sizes. If the sample sizes are variable, the VI calculates
the variable control limits.

A typical attributes chart VI, the p Chart VI, is shown in the following
illustration.
The attributes chart VIs generate outputs for a single control chart. Inputs
are one or more 1D arrays that contain values counted from the process.
The output includes an array of points for the control chart and the chart
limits. In the case of the p chart (shown in the preceding illustration) and
the u chart, the sample size inspected may vary for each value of # units
non-conforming, or the sample size may be constant. So, you can choose
one of the following two inputs: a scalar input for a constant number
inspected, n, or an array input for a variable number inspected, n. You
should use only one of these two inputs.
The output arrays UCL and LCL are the variable control limits (p and
u charts only). The chart limits cluster contains the average upper control
limit (UCL), center line (CL), average lower control limit (LCL), and the
standard error from which the VI calculates the upper and lower control
limits.
The attributes chart VIs are described in more detail later in this chapter.
VIs for Drawing Charts

The control chart VI library contains several VIs for graphing control
charts and raw process data. You can also use the built-in LabVIEW
waveform chart and XY graphs to present SPC data. The VIs in this
library use the XY graph to draw limits against control chart points, a
format that is typical of SPC graph presentations. The following
illustration shows a typical diagram using the control charts and draw
control charts VIs.

Custom controls already preformatted for use with the VIs for drawing
charts are available in the SPC Graphs & Legends Control Menu.
VIs for Plotting Control Chart Points and

Limits
The control chart VIs calculate control chart limits and points. The VIs
in the following list generate a graph of center lines, the upper and lower
limit lines, and the computed points from the control chart.
• Draw Control Chart—to use with constant control limits—this is

your basic control chart graph
• Draw Chart with Zones—draws zones or warning limits (from

constant control limits)—useful for testing run rules
• Draw Control with Var Limits—to use with variable control limits
(p and u charts)
These VIs are described in more detail later in this chapter.
VIs for Creating Graphs of Raw Process Data

The Draw Run Chart and Draw Tier Chart VIs create graphs that are
independent of the type of control chart you use, and are convenient for
viewing the individual observations that make up your samples. This
class of graphs will optionally plot your data against specification limits
or natural process limits.

Specification limits are user-defined tolerances for the process output.

Natural process limits are computed from the samples and represent the
process mean and 3 sigma. The natural process limits are not control
limits, but are a statistic of the variability in your raw data. The Draw Run
Chart and Draw Tier Chart VIs are described as follows.
• Draw Run Chart VI—plots a run chart of the individuals within

each sample in order of occurrence. This VI optionally displays
specification limits and/or natural process limits (process mean and
3 sigma) against the data.
• Draw Tier Chart VI (variables charts only)—plots all observations

(individuals) within each sample. This VI optionally displays
specification limits and/or natural process limits (process mean and
3 sigma) against the data.
These VIs have a display mode specifier that you can use to turn on and
off drawing of the specification limits or the natural process limits. The
display specifier also designates the sigma multiplier for the VI to use for
the natural process limits (default 3). You can leave the display mode
input unwired, in which case the graphing VI will use the defaults. The
defaults are not the same for all the VIs.
The x-axis on all the graphs in the control chart VI library is labeled by
sample number (the default starting sample number is zero). You can
wire a different number to suit your needs. Notice that array index
counting in LabVIEW is zero-based; therefore, numbering samples
starting from zero is the least confusing method to use. The control chart
VIs use simple (X,Y) pairs to define horizontal limit lines drawn on the
XY graph.
An easy way to use these graphing VIs is to copy the graph on the front
panel of the VI, and paste it on the front panel of your application. The
graph already has appropriate labels, colors, and patterns selected for all
the graph lines. You can then size and customize the graph display to fit
your needs.
You can also use waveform charts (sometimes called strip charts) to plot
your control charts, in which case the VI passes information to the chart
one sample at a time. The SPC Toolkit does not provide VIs for strip
chart presentation. To draw control chart, natural process, or
specification limits against your control chart points, cluster the limit
values with your point, and wire the cluster to your waveform chart.
The VIs for drawing charts are described in more detail later in this
chapter.

Rule Checker VIs for Testing Out of Limits, Run Rules and
Process Shift
The SPC Toolkit contains the following rule checker VIs to test whether
points exceed the control limits or whether any of the run rules are
violated, and to detect process shift.
• Check Control Limits—identifies samples that exceed the upper

and lower control limits.
• Rule Checker (AT&T/WE)—identifies samples that violate one or

more of the selected AT&T/Western Electric run rules.
• Rule Checker (Nelson)—identifies samples that violate one or more

of the selected Nelson run rules.
• Process Shift Detector—detects process shift with respect to center

line.
• Check Sequence—identifies samples violating a generic n out of m

sequence.
After a VI has identified out-of-control points, you can wire the rule
checker VI output to the indices input of the control chart VIs and
exclude these samples from the control limit calculation.
The rule checker VIs are described in more detail later in this chapter.
Variables Chart VIs

As described earlier in this chapter, you use the variables chart VIs to
detect out-of-control conditions on measured process characteristics.
These VIs generate outputs for control charts for sample mean and
variation.
X-Bar & s Chart

Computes points and limits for X-bar and s control charts. These are
control charts for showing mean and sample standard deviation.
Optionally, you can choose a range of indices for samples to use and
indices of samples to ignore in the control limit calculation. The VI
outputs the actual number of samples used to calculate the control limits.
By default, control limits are calculated from the input samples. You can

also calculate control limits from standard values by wiring the chart
limit src input.
samples X. Samples on which to compute control limits and points for

the X-bar and s charts. Each row is a sample with n observations, where
n is the number of columns in the 2D array. N is also known as the
subgroup size. The minimum sample/subgroup size is 2.
index spec. Use this cluster to choose a range of samples to use for the
control limits calculation.
start index. Index of the first sample to include in the

control limit calculation. Default is zero, which is the index
of the first sample in samples X array.
end index. Index of the last sample to include in the control

limit calculation. Default is zero which selects the last
sample in samples X array.
If you do not wire this cluster, the VI includes all samples in the samples
X input array in the control limit calculation.
indices to ignore. Indices of samples to exclude from the control limit

calculation. This is useful for eliminating out-of-control points from the
control limit calculation. By default, this is an empty array.
std error multiplier. The multiplier to use for the upper and lower
control limits. Normally you leave std error multiplier unwired, and the
VI sets the control chart limits to +/- 3.0 standard errors. The default is
3.0.
X-bar-bar. This is an estimate of the process mean based on the grand

average of the samples included in the control limit calculation. If the
control limits are calculated from standard values, this is set to the
standard mean.
X-bar. The mean of each input sample. This is the array plotted on the
X-bar control chart.

X-bar chart limits. This cluster contains the limits for the X-bar chart.
UCLx. The upper control limit for the X-bar chart.
CLx. The center line for the X-bar chart.

Clx = X-bar-bar or standard mean and is also the estimated
process mean, if calculated from the input samples.
LCLx. The lower control limit for the X-bar chart.
standard error. The standard error associated with CLx.
s. The sample standard deviation of each input sample. This is the array
plotted on the s control chart.
s chart limits. This cluster contains the limits for the s chart.
UCLs. The upper control limit for the s chart.
CLs. The center line for the s chart. Cls = s-bar if calculated
from the input samples, or is standard s0 or standard sigma
*c4.
LCLs. The lower control limit for the s chart.
standard error. The standard error associated with CLs.
s-bar/c4. This is an estimate of the process sigma (standard deviation)

based on the average standard deviation of the samples included in the
control limit calculation.
# samples in calc. The number of samples the VI used in the control

limits calculation. If the control limits are calculated from standard
values, this is set to standard s0/c4 or sigma.
chart limit src. Specifies whether or not to use standard values for the
chart limit calculations. If unwired, this cluster defaults to the common
case where the chart limits are calculated from the data in the input
sample array. You do not have to wire this cluster unless you want the
chart limits to be calculated from standard values. When using standard
values, the center line for the X-bar control chart, X-bar-bar, is set to std
mean, and the center line for the s control chart, s-bar, is set to std s0, or
std sigma*c4.
source. Selects one of three sources for chart limits

calculation:
0: from data—chart limits are calculated from the data in

the samples X array as qualified by the index spec and

indices to ignore inputs (default selection).
1: use std mean, s0—chart limits are calculated from
standard values for mean and sample standard variation
2: use std mean, sigma—chart limits are calculated from
standard values for mean and sigma.
std mean. The standard mean value to use when

calculating chart limits from standard values.
std s0/sigma. The standard s0 or sigma value to use in

The control limit calculations for the chart limits are as follows.
If standard values are used for the control limit calculations, then
X (X-bar-bar) is set to std mean
s (s-bar) is set to std s0 or std sigma * c4, otherwise, X and

s are calculated from the input samples as specified by the index spec and
indices to ignore inputs.
UCLx = X + stderr mult  ------------

s
 c n
4
CLx = X
LCLx = X + stderr mult  ------------

s
 c n
4
s
standard error = ------------
c4 n
 s 1 –c4 
2
UCLs = s + stderr mult  --------------------
 c4 
CLs = s
 s 1 –c4 
2
LCLs = s – s tderr mult  --------------------
 c4 

2
s 1 –c4
standard error = --------------------
c4
X-Bar & R Chart

Computes points and limits for X-bar and Range control charts. These
are control charts for charting mean and range. Optionally, you can
choose a range of indices for samples to use and indices of samples to
ignore in the control limit calculation. The VI outputs the actual number
of samples it uses to calculate the control limits.
Note: Use the Range Chart for samples or subgroups of 25 or less, because
for sample size of ten or more, the sample range loses efficiency of
sample variance. For sample sizes of ten or larger, you should use the
X-bar & s Chart VI instead of Range Chart.
samples X. Samples on which to compute control limits and points for

the X-bar and Range charts. Each row is a sample with n observations
where n is the number of columns in the 2D array. N is also known as the
subgroup size. The maximum sample/subgroup size permitted is 25, the
minimum is 2.
index spec. Use this cluster to choose a range of samples to use for the
start index. Index of the first sample to include in the

end index. Index of the last sample to include in the control

limit calculation. Default is zero, which selects the last
sample in samples X array.

If you do not wire this cluster, the VI includes all the samples in the
samples X input array in the control limit calculation.
indices to ignore. Indices of samples to exclude from the control limit

calculation. Excluding samples is useful for eliminating out-of-control
points from the control limit calculation. By default, this is an empty
array.
std error multiplier. The standard error multiplier to use for the upper
and lower control limits. Normally you leave std error multiplier
unwired, and the VI sets the control chart limits to +/- 3.0 standard errors.
The default is 3.0.
X-bar-bar. This is an estimate of the process mean based on the grand

average of the samples included in the control limit calculation. If the
standard mean.
X-bar. The mean of each input sample. This is the array plotted on the
X-bar control chart.
X-bar chart limits. This cluster contains the limits for the X-bar chart.
UCLx. The upper control limit for the X-bar chart.
CLx. The center line for the X-bar chart.

Clx = X-bar-bar or standard mean and is also the
estimated process mean if calculated from the input
samples.
LCLx. The lower control limit for the X-bar chart.
range R. The range of each input sample. This is the array plotted on the
R control chart.
R chart limits. This cluster contains the limits for the Range chart.
UCLr. The upper control limit for the R chart.
CLr. The center line for the R chart. CLr = R-bar if

calculated from the input samples, otherwise this is
standard R0 or standard sigma*d2.
LCLr. The lower control limit for the R chart.

standard error. The standard error associated with CLr.
R-bar/d2. This is an estimate of the process sigma (standard deviation)

based on the average range of the samples included in the control limit
calculation. If the control limits are calculated from standard values, this
is set to standard R0/d2 or standard sigma.
# samples in calc. The number of samples the VI used in the control

limits calculation.
chart limit calculations. If unwired this defaults to the common case
where the chart limits are calculated from the data in the input sample
array. You do not have to wire this cluster unless you want the chart
limits to be calculated from standard values. When using standard values
the center line for the X-bar control chart, X-bar-bar is set to std mean,
and the center line for the Rcontrol chart, R-bar, is set to std R0, or std
sigma*d2.

calculation:
the samples X array as qualified by the index spec and
1: use std mean, R0—chart limits are calculated from
standard values for mean and sample standard variation

std R0/sigma. The standard R0 or sigma value to use in

The control limit calculations for the chart limits are as follows.
=
X (X-bar-bar) is set to std mean
R (R-bar) is set to std R0 or std sigma * d2, otherwise,

X and R are calculated from the input samples as specified by the index
spec and indices to ignore inputs.

UCLx = X + stderr mult  ------------ = X + A 2 R for stderr mult = 3.0

= R =
 d n
2
CLx = X
LCLx = X + stderr mult  ------------ = X – A 2 R for stderr mult = 3.0

R =
 d n
2
R
d2 n
d3 R
UCLr = R + stderr mult --------- = D 4 R for stderr mult = 3.0
d2
CLr = R
 d 3 R
LCLr = R – s tderr mult  --------- = D 3 R for stderr mult = 3.0
 d2 
d3 R
standard error = --------
-
d2
X& mR Chart
Computes points and limits for individuals x and moving Range charts.
These are control charts for charting mean and moving range. This VI
computes for a moving range from n consecutive observations. By
default, n is two. Optionally, you can choose a range of indices for
individuals to use and indices of individuals to ignore in the control
calculation. The actual number of individuals the VI uses to calculate the
control limits is also output. By default, control limits are calculated from
the input samples. You can also calculate control limits from standard
values by wiring the chart limit src input.

individuals x. Individual observations (or samples of subgroup size 1)

on which to compute control limits.
index spec. Use this cluster to choose a range of individuals to use for
start index. Index of the first individual to include in the

control limit calculation. Default is zero or index of the first
individual in individuals x array.
end index. Index of the last individual to include in the

control limit calculation. Default is zero which selects the
last sample in individuals x array.
If you do not wire this cluster, all values in individuals x input array are
included in the control limit calculation.
indices to ignore. Indices of individuals to exclude from the control limit

3.0.
x-bar. This is an estimate of the process mean based on the average of

the individuals included in the control limit calculation. If the control
limits are calculated from standard values, this is set to the standard
mean.
x. The individual observations. This is the array plotted on the x control

chart.
x chart limits. This cluster contains the limits for the x chart.
UCLx. The upper control limit for the x chart.

CLx. The center line for the x control chart. Clx = x-bar or
standard mean and is also the estimated process mean if
calculated from the input individuals.
LCLx. The lower control limit for the x chart.
moving range mR. The moving range of individuals

{x[i], ...., x[i-n+1]}, where n is the sample size. This is the array plotted
on the mR control chart.
mR chart limits. This cluster contains the limits for the mR chart.
UCLmr. The upper control limit for the mR chart.
CLmr. The center line for the mR control chart.

Clmr = mR-bar if calculated from the input data
individuals, or standard R0 or standard sigma*d2.
LCLmr. The lower control limit for the mR chart.
standard error. The standard error associated with

CLmr.
mR-bar/d2. This is an estimate of the process sigma (standard deviation)

based on the average of the moving range between individuals included
in the control limit calculation.
# individuals in calc. The number of individuals the VI uses in the

where the chart limits are calculated from the data in the input individuals
limits to be calculated from standard values. When using standard values
the center line for the x control chart, x-bar is set to std mean, and the
center line for the mR control chart, mR-bar, is set to std R0, or std
sigma*d2.

calculation:
the individuals x array as qualified by the index spec and

standard values for mean and range



n: sample size. The number of consecutive individual values to use in

the moving range calculation. n: sample size may range from 2 to 25. By
default, n: sample size is 2.
x-bar & mR-bar/d2. This cluster contains estimates on process mean

and sigma based on individuals included in the control limit calculation,
or on standard values.
x-bar. This is an estimate of the process mean based on the

average of the individuals included in the control limit
calculation. If the control limits are calculated from
standard values, this is set to the standard mean.
mR-bar/d2. This is an estimate of the process sigma based

on the average of the moving ranges included in the control
limit calculation. If the control limits are calculated from
standard values, this is set to the standard R0/d2, or the
standard sigma.
The control limit calculations are as follows.
x (x-bar) is set to std mean
mR (mR-bar) is set to std R0 or std sigma * d2,

otherwise, X and mR are calculated from the input samples as specified
by the index spec and indices to ignore inputs.
UCLx = x + stderr mult  --------- = x + E 2 R for stderr mult = 3.0

mR
 d2 
CLx = x

LCLx = x + – stderr mult  --------- = x – E 2 R for stderr mult = 3.0

mR
 d2 
mR
standard error = ---------
d2
 d 3 mR
UCLmr = mR + stderr mult  -------------- = D 4 mR for stderr mult = 3.0
 d2 
CLmr = mR
 d 3 mR
LCLmr = mR – stderr mult  -------------- = D 3 mR for stderr mult = 3.0
 d2 
 d 3 mR
standard error =  --------------
 d2 
mX-bar & mR Chart

Computes points and limits for mX-bar and moving Range charts. These
are control charts for charting moving average and moving range. This
VI computes moving average and range over n observations. By default,
n is 2. Optionally, you can choose a range of indices for individuals to
use and indices of individuals to ignore in the control calculation. The
actual number of individuals the VI uses to calculate the control limits is
also output. By default, control limits are calculated from the input
samples. You can also calculate control limits from standard values by
wiring the chart limit src input.
individuals x. Individual observations (or samples of subgroup size 1)

on which to compute control limits.

index spec. Use this cluster to choose a range of individuals to use for
start index. Index of the first individual to include in the

control limit calculation. Default is zero or index of the first
individual in individuals x array.
end index. Index of the last individual to include in the

last sample in individuals x array.
If you do not wire this cluster, all values in individuals x input array are
included in the control limit calculation.
indices to ignore. Indices of individuals to exclude from the control limit

3.0.
x-bar-bar. This is an estimate of the process mean based on the moving

average of the individuals included in the control limit calculation. If the
standard mean.
moving Average mX-bar. The moving average of individuals

on the x control chart.
mX-bar chart limits. This cluster contains the limits for the moving
average chart.
UCLmx. The upper control limit for the moving average

chart.
CLmx. The center line for the x control chart. Clmx = x-

bar-bar or standard mean and is also the estimated process
mean if calculated from the input individuals.
LCLmx. The lower control limit for the moving average

chart.
standard error. The standard error associated with CLmx.

moving range mR. The moving range of individuals

on the mR control chart.
mR chart limits. This cluster contains the limits for the mR chart.
UCLmr. The upper control limit for the mR chart.
CLmr. The center line for the mR control chart.

Clmr = mR-bar if calculated from the input data
individuals, or standard R0 or standard sigma*d2.
LCLmr. The lower control limit for the mR chart.
standard error. The standard error associated with

CLmr.
# individuals in calc. The number of individuals the VI uses in the

where the chart limits are calculated from the data in the input individual
limits to be calculated from standard values. When using standard
values, the center line for the mX-bar control chart, X-bar-bar, is set to
std mean, and the center line for the mR control chart, mR-bar, is set to
std R0, or std sigma*d2.

calculation:
the individuals x array as qualified by the index spec and
standard values for mean and range



n: sample size. The number of consecutive individual values to use in

the moving range calculation. n: sample size may range from 2 to 25. By
default, n: sample size is 2.
mX-bar & mR-bar/d2. This cluster contains estimates on process mean

and sigma based on individuals included in the control limit calculation,
or on standard values.
mX-bar-bar. This is an estimate of the process mean based

on the average of the moving averages included in the
control limit calculation. If the control limits are calculated
from standard values, this is set to the standard mean.
mR-bar/d2. This is an estimate of the process sigma based

on the average of the moving ranges included in the control
limit calculation. If the control limit \ s are calculated from
standard values, this is set to the standard R0/d2, or the
standard sigma.
The control limit calculations are as follows.
X (X-bar) is set to std mean
mR (mR-bar) is set to std R0 or std sigma * d2,

otherwise, X and mR are calculated from the input samples as specified
by the index spec and indices to ignore inputs.
UCLx = X + stderr mult  ------------ = X + A 2 R for stderr mult = 3.0

= R =
 d n
2
CLx = X
LCLx = X + stderr mult  ------------ = X - A 2 R for stderr mult = 3.0

R =
 d n
2
R
d2 n
 d 3 mR
UCLmr = mR + stderr mult  -------------- = D 4 mR for stderr mult = 3.0
 d2 

CLmr = mR
 d 3 mR
LCLmr = mR – stderr mult  -------------- = D 3 mR for stderr mult = 3.0
 d2 
 d 3 mR
standard error =  --------------
 d2 
Single Point X-Bar & R/S

Computes single points for both X-bar and Range or X-bar and s control
charts. Computing single points is useful for plotting control charts one
point at a time while you are collecting samples. You must continue to
use the X-bar & R or X-bar & s Chart VIs to calculate the control limits
for the chart.
sample X. Sample on which to compute the control chart points. sample

X contains two or more individual observations.
X-bar. The mean of the input sample. Wire this output to the waveform
chart to create an X-bar control chart.
range R. The range of the input sample. Wire this output to the
waveform chart to create an range R control chart.
std dev S. The sample standard deviation of the input sample. Wire this
output to the waveform chart to create an s control chart.

Single Point x/mX-bar & mR

Computes single points for the x and moving range or moving average
and moving range control charts. Computing single points is useful for
plotting control charts one point at a time while you are collecting
samples. You must still use the x & mR Chart or mX-bar & mR Chart
VIs to calculate the control limits for the chart. This VI is reentrant so
that you can use multiple copies. Each time it is called, this VI saves a
copy of the previous n-1 individuals to use in calculating the next moving
Average and Range.
individual x. Individual on which to compute the control chart points.
n: sample size. The sample size to use for the moving average and
moving range calculations. n: sample size ranges from 2 to 25. By
default, sample size is 2.
first point(F). Use this input to initialize the VI. first point should be
TRUE for the first point, FALSE afterwards. The VI will calculate the
first point moving range mR as zero.
individual x. Wire this output to the waveform chart to create an

X control chart.
moving Average mX-bar. The average of the current individual x and

the previous sample size n-1 individual x values. Wire this output to the
waveform chart to create a moving average control chart.
moving Range mR. The range of the current individual x and the
previous sample size n-1 individual x values. Wire this output to the
waveform chart to create a moving range control chart.
valid mX-bar/mR. This is set to TRUE when the VI has accumulated

sample size n points to calculate the moving Average and Range. For
example, for sample size n = 2, the VI would have to be called twice in
order to have accumulated 2 individual x values from which it calculates
the moving average and range. Until sample size n values have been

accumulated, the moving average and range are calculated from a

smaller sample size, and valid mX-bar/mR is set to FALSE.
Attributes Chart VIs

As described earlier in this chapter, you use the attributes chart VIs to
detect out-of-control conditions on counted process data.
p chart
Computes points and limits for a p chart, a control chart for fraction non-
conforming. Number of units inspected n can be constant for all r or vary
for each element of r. Calculates both variable and constant chart limits.
Optionally, you can choose a range of indices for samples to use and
indices of samples to ignore in the control calculation. The actual number
of samples the VI uses to calculate the control limits is also output. By
default, control limits are calculated from the input samples. You can
also calculate control limits from standard values by wiring the chart
limit src input.
r: # units non-conforming/sample unit. The number of units non-

conforming in each sample inspected.
n: sample size (variable). The number of units inspected per sample for
each value of r. Use this array if a variable number of units were
inspected for each entry in r. The array length must be the same the
length of the array r.
n: sample size (constant). Use this input if the same number of units was
inspected for each entry in r. Otherwise, if you are providing an array for
n, leave this input unwired.

3.0.
index spec. Use this cluster to choose a range of samples to use in r for
the control limits calculation.
start index. Index of the first element of r to include in the

of the first sample in r array.
end index. Index of the last element of r to include in the

last sample in r array.
If you do not wire this cluster, the VI includes all elements in the r input
array in the control limit calculation.
indices to ignore. Indices of r to exclude from the control limit

calculation. This input is useful for eliminating out-of-control points
from the control limit calculation. By default, this is an empty array.
# samples in calc. The number of samples used in the control limits

calculation.
p: fraction non-conforming. The number of units non-conforming

divided by the number inspected. This is the fraction non-conforming in
each input sample. This is the array plotted on the p control chart.
UCLp. The variable limit for the upper control limits. If std error
multiplier is three, this will be p-bar + 3 standard errors. The standard
error calculation varies with n.
LCLp. The variable limit for the lower control limits. If std error
multiplier is three, this will be u-bar - 3 standard errors. The standard
p chart limits. This cluster contains the constant limits for the p chart.
average UCLp. The average value of the variable upper

control limit for the p chart. If the number inspected is
constant, use this for the upper control limit.
CLp. The center line for the p chart, p-bar or standard p0.
p-bar is the estimated fraction non-conforming for the
process if calculated from the input data.

average LCLp. The average value of the variable lower

control limit for the p chart. If the number inspected is
constant, use this for the lower control limit.
standard error. The standard error associated with CLp.
chart limit calculations. If unwired this defaults to the most common case
where the chart limits are calculated from the data in the input array(s).
You do not have to wire this cluster unless you want the chart limits to
be calculated from standard values. When using standard values the
center line for the control chart, p-bar, is set to p0.
source. Selects one of two sources for chart limits

calculation:

the input arrays as qualified by the index spec and indices
to ignore inputs (default selection).
1: use std p0—chart limits are calculated from the standard
value p0.
std p0. The standard p0 value to use when calculating chart

limits from standard values. The center line for the control
chart p-bar will then be set to p0.
The control limit calculations are as follows:
p-bar is set to std p0, otherwise, p-bar is calculated from the input
samples as specified by the index spec and indices to ignore inputs.
∑ r
p = ----------- if calculated from input data, otherwise p = p0
∑ n
r(i)
p ( i ) = ---------
n(i)
p(1 – p)
UCLp = p + stderr mult --------------------
n
CLp = p

p(1 – p)
LCLp = p – stderr mult --------------------
n
p(1 – p)
standard error = --------------------
n
np Chart
Computes points and limits for an np chart, a control chart for number
non-conforming. Optionally, you can choose a range of indices of
samples to use and indices of samples to ignore in the control calculation.
The actual number of samples the VI uses to calculate the control limits
is also output. By default, control limits are calculated from the input

conforming per sample inspected.
n: sample size. Number of units in each sample.
3.0.
index spec. Use this cluster to choose a range of samples in r to use for
the control limit calculation.
start index. Index of the first element of r to include in the


end index. Index of the last element of r to include in the

control limit calculation. Default is zero, which selects the
last sample in r array.
If you do not wire this cluster, the VI includes all elements in r input array
in the control limit calculation.
indices to ignore. Indices of r to exclude from the control limit


calculation.

conforming found per sample unit. This is identical to the input array r.
These are the points plotted on the np control chart.
np chart limits. This cluster contains the limits for the np chart.
UCLnp. The upper control limit for the np chart. If Std

error multiplier is three, this will be np-bar + 3 standard
errors.
CLnp. The center line for the np chart, np-bar or standard

p0*n. np-bar is the estimated number non-conforming for
the process if calculated from the input data.
LCLnp. The lower control limit for the np chart. If Std

error multiplier is three, this will be np-bar - 3 standard
errors.
standard error. The standard error associated with CLnp.
where the chart limits are calculated from the data in the input array. You
do not have to wire this cluster unless you want the chart limits to be
calculated from standard values. When using standard values, the center
line for the control chart, np-bar, is set to n*p0.

calculation:


1: use std p0—chart limits are calculated from the standard

value p0.
std p0. The standard p0 value to use when calculating chart

chart n*p-bar will then be set to n*p0.
np-bar is set to std n*p0, otherwise, np-bar is calculated from the input
samples as specified by the index spec and indices to ignore inputs.
∑ r
p = ------------------------------------------- , if calculated from input data,
n ( r array length )
otherwise p = p0
UCLnp = n x p + stderr mult ( np ( 1 – p ) )
CLnp = n x p
LCLnp = n x p – stderr mult ( np ( 1 – p ) )
standard error = np ( 1 – p )
c Chart
Computes points and limits for a c chart, a control chart for number of
non-conformities or defects. Optionally, you can choose a range of
indices for samples to use and indices of samples to ignore in the control
calculation. The actual number of samples the VI uses to calculate the
control limits is also output. By default, control limits are calculated from
the input samples. You can also calculate control limits from standard
values by wiring the chart limit src input.

c: # defects/ sample. The number of non-conformities or defects per

sample inspected.
3.0.
index spec. Use this cluster to choose a range of samples in c to use for
start index. Index of the first element of c to include in the

control limit calculation.The default is zero, which is the
index of the first sample in samples X array.
end index. Index of the last element of c to include in the

control limit calculation. The default is zero, which selects
the last sample in c array.
If you do not wire this cluster, the VI includes all elements in c input
indices to ignore. Indices of c to exclude from the control limit


calculation.
c: # non-conformities/inspection unit. The number of non-conformities

or defects found per sample unit. This is identical to the input array c.
These are the points plotted on the c control chart.
c chart lines. This cluster contains the limits for one c chart.
UCLc. The upper control limit for the c chart. If std error
multiplier is three, this will be c-bar + 3 standard errors.

CLc. The center line for the c chart, c-bar or standard c0.
c-bar is the estimated number of non-conformities for the
process if calculated from the input data.
LCLc. The lower control limit for the c chart. If std error
multiplier is three, this will be np-bar - 3 standard errors.
standard error. The standard error associated with CLc.
where the chart limits are calculated from the data in the input array. You
do not have to wire this cluster unless you want the chart limits to be
calculated from standard values. When using standard values, the center
line for the control chart, c-bar, is set to c0.

calculation:

1: use std c0—chart limits are calculated from the standard
value c0.
std c0. The standard c0 value to use when calculating chart

chart c-bar will then be set to c0.
c-bar is set to std c0, otherwise, c-bar is calculated from the input samples
as specified by the index spec and indices to ignore inputs.
∑ c
c = ----------------------------------- if calculated from the input data,
c array length
otherwise c = c0
UCLc = c + stderr mult c
CLc = c

LCLnp = c – stderr mult c
standard error = c
u Chart
Computes points and limits for a u chart, a control chart for fraction of
non-conformities or defects. Number of units inspected n can be constant
for all c or vary for each element in c. Calculates both variable and
constant chart limits. Optionally, you can choose a range of indices for
samples to use and indices of samples to ignore in the control calculation.
The actual number of samples the VI uses to calculate the control limits
is also output. By default, control limits are calculated from the input
c: # defects/sample. The number of non-conformities or defects found

for each number inspected.
n: sample size (variable). The number of units inspected for each value
of c. Use this array if a variable number of units were inspected for each
entry in c. The array length must be the same as the length of the array c.
n: sample size (constant). Use this input if the same number of units was
inspected for each entry in c. Otherwise, if you are providing an array for
n, leave this input unwired.
3.0.
index spec. Use this cluster to choose a range of samples in u to use for

start index. Index of the first element of u to include in the

control limit calculation.The default is zero, which is the
index of the first sample in samples X array.
end index. Index of the last element of u to include in the

control limit calculation. The default is zero, which selects
the last sample in c array.
If you do not wire this cluster, the VI includes all elements in u input
indices to ignore. Indices of u to exclude from the control limit

u: average # defects/unit. The number of defects divided by the number

inspected. This is the average number of non-conformities or defects per
unit inspected. This array is plotted on the u control chart.
UCLu. The variable limit for the upper control limits. If std error
multiplier is three, this output will be u-bar + 3 standard errors.
LCLu. The variable limit for the lower control limits. If std error
multiplier is three, this will be u-bar - 3 standard errors. The standard
u chart limits. This cluster contains the constant limits for the u chart.
average UCLu. The average value of the variable upper

control limit for the u chart. If the number inspected is
constant, use this for the upper control limit.
CLu. The center line for the u-chart, u-bar or standard u0.
u-bar is the estimated fraction of non-conformities or
defects for the process if calculated from the input data.
average LCLu. The average value of the variable lower

control limit for the chart. If the number inspected is
constant, use this for the lower control limit.
standard error. The standard error associated with CLu.
where the chart limits are calculated from the data in the input array(s).
You do not have to wire this cluster unless you want the chart limits to

be calculated from standard values. When using standard values, the

center line for the control chart, u-bar, is set to u0.

calculation:

1: use std u0—chart limits are calculated from the standard
value u0.
std u0. The standard u0 value to use when calculating chart

chart u-bar will then be set to u0.
∑ c
u = ----------- , if calculated from input data,
∑ n
otherwise u = u0
c(i)
u ( i ) = ---------
n(i)
u
UCLu = u + stderr mult ---
n
CLu = u
u
LCLu = u – stderr mult ---
n
u
standard error = ---
n

Draw Control Chart VIs

As described earlier in this chapter, you use the draw control chart VIs
for graphing control charts and raw process data.
Draw Control Chart

Given an array of control chart points and the chart limits cluster as
created by the chart VIs, creates a control chart (XY graph indicator)
with points plotted against upper and lower control limits and center line.
points. The points to be plotted on the control chart, normally the output
of one of the control chart VIs, such as an X-bar array.
chart limits. This cluster is output by the control chart VIs.
UCL. The upper control limit for the control chart.
CL. The center line for the control chart.
LCL. The lower control limit for the control chart.
standard error. The standard error associated with CL.
starting sample number. The sample number of the first sample the VI
uses to label the chart x-axis. If you do not wire this input, sample
labeling on the x-axis will start at zero.
control chart. A control chart XY graph with points and limit lines
drawn. You can wire this to the Basic Control Chart custom SPC control.
control chart lines. This cluster is useful as a legend for the limit lines.
You can wire this to the Control Chart Lines custom SPC control.
UCL. The upper control limit value for the control chart.
CL. The center line value for the control chart.

LCL. The lower control limit value for the control chart.
Draw Chart with Zones

Given an array of control chart points and the chart limits cluster as
created by the chart VIs, creates a control chart graph (XY graph
indicator) with points plotted against zones. This VI is useful when
visually applying run rules to a control chart.
points. The points to be plotted on the control chart. (Normally the

output of one of the control chart VIs, such as an X-bar array).
chart limits. This cluster is output by the control chart VIs.
UCL. The upper control limit for the control chart.
LCL. The lower control limit for the control chart.
# zones. The number of zones to mark on the control chart. If you do not
wire this input, three zones—zone A, B, and C—are marked on the chart.
uses to label the chart x-axis. If you do not connect this input, sample
labeling on the x-axis will start at zero.
control chart with zones. A control chart XY graph with points and
horizontal zone lines drawn. You can wire this to the Control Chart with
Zones custom SPC control.
control chart zones. This cluster is useful as a legend for the zone lines.
You can wire this to the Control Chart Zones Cluster custom SPC
control.

zone A+. The upper 3 standard error control limit value for
the control chart.
zone B+. The upper 2 standard error control limit value for
the control chart.
zone C+. The upper 1 standard error control limit value for
the control chart.
zone C-. The lower 1 standard error control limit value for
the control chart.
zone B-. The lower 2 standard error control limit value for
the control chart.
zone A-. The lower 3 standard error control limit value for
the control chart.
Draw Chart with Var Limits

Given an array of control chart points, arrays for the upper and lower
control limits, and the control chart limits cluster as created by the chart
VIs, creates a variable limits control chart (XY graph indicator). Use this
VI with the u chart and p chart if you have a variable number n per unit
inspected.
points. The points to be plotted on the control chart, normally the output
of one of the control charts, such as an u chart array.
UCL. The variable upper limit to be drawn on the control chart.
LCL. The variable lower limit to be drawn on the control chart.
chart limits. This cluster is output by control chart VIs.

average UCL. The average upper control limit for the

control chart.
average LCL. The average lower control limit for the

control chart.
uses to label the chart x-axis. If you do not wire this input, sample
labeling on the x-axis will start at one.
control chart. A control chart XY graph with points and variable limit
lines drawn. You can wire this to the Control Chart with Var Limits
custom SPC control.
control chart lines. This cluster is useful as a legend for the constant
limit lines. You can wire this to the Control Chart Lines custom SPC
control.
UCL. The average upper control limit value for the control
chart.
LCL. The average lower control limit value for the control
chart.
Draw Run Chart

Draws a run chart of the individuals making up the samples X array in
time order. The VI interprets the individual observations in the samples
array to be in time order by row, and the individuals within each row by
column. Optionally, the VI plots the specification limits and/or the
natural process limits against the observations.

You can turn on and off drawing of the specification limits or the natural
process limits, and choose the sigma multiplier to use for the natural
process limits (default three), by wiring in the display mode. If you do
not wire the display mode, the VI does not draw the specification limits
and natural process limits by default.
samples X. The points to be plotted on the run chart. Each row is a

sample with n observations where n is the number of columns in the 2D
array. N is also known as the subgroup size. You can generate a run chart
from a 1D array by wiring it to a build array primitive before wiring it to
the samples X input.
starting individual number. The individual number of the first

individual the VI uses to label the chart x-axis. If you do not wire this
input, sample labeling on the x-axis will start at zero.
upper spec limit. The upper specification limit of the process.
lower spec limit. The lower specification limit of the process.
process mean. The estimated process mean. See the description of the
Process Mean and Sigma VI in Chapter 3, Process Statistics VIs, for an
explanation of how the process mean and process sigma values are
calculated.
process sigma. The estimated process sigma.
display mode. Optional display mode specifier. If unwired, the VI will

not draw the specification and natural process limits by default. This
cluster contains the following.
show spec limits. If TRUE, the VI will draw the

specification limits on the chart. The default is FALSE.
show natural process limits. If TRUE, the VI will draw

the natural process limits on the chart. The default is
FALSE.

NP limit sigma. The sigma multiplier for the natural

process limits. By default, this is 3.0. The natural process
limits drawn on the chart will then be
process mean +/- NP limit sigma*process sigma.
Note: If you wire the display mode cluster to change one of the default
settings, you must specify all three elements.
run chart. An XY graph with the individual observations in each sample

plotted in order of occurrence. Optionally the VI plots the upper and
lower specification limits and the mean specification value, and/or the
natural process limits and process mean against the sample plots. You
can wire this to the Run Chart with Limits custom SPC control.
Draw Tier Chart

Draws a tier chart (also known as a tolerance diagram). Plots the spread
of the observations in each sample. Optionally, the specification limits
and/or the natural process limits are also plotted against the observations.
process limits, and choose the sigma multiplier to use for the natural
process limits (default three), by wiring in the display mode. If you do
not wire the display mode, the specification limits and natural process
limits are not drawn.
samples X. The values to be plotted on the tolerance chart. Each row is

a sample with n observations where n is the number of columns in the 2D
array. n is also known as the subgroup size.
uses to label the chart x-axis. If unwired, sample labeling on the x-axis
will start at zero.

Process Mean and Sigma VI in Chapter 3, Process Statistics VIs, for an
explanation of how the process mean and process sigma values are
calculated.

not draw the specification limits and the natural process limits by default.
This cluster contains the following.
show spec limits. If TRUE, the VI will draw the

specification limits. The default is FALSE.
show natural process limits. If TRUE, the VI will draw

the natural process limits on the plot. The default is
FALSE.

process limits. By default, this is 3. The natural process
limits drawn on the plot will then be
process mean +/- NP limit sigma*process sigma.
settings, you must select all three elements.
tier chart. A graph in which the VI plots the observations in each sample
vertically. Optionally the VI plots the upper and lower specification
limits and the mean specification value, and/or the natural process limits
and process mean against the sample plots. You can wire this to the Tier
Chart custom SPC control.

Rule Checker VIs

As described earlier in this chapter, you use the rule checker VIs to test
whether points exceed the control limits or whether any of the run rules
are violated.
Check Control Limits

Given a set of control chart points, and the upper and lower control limits
from the control chart VIs, this VI checks for points that exceed the
control limits. If such points exist, the VI lists the index of each point that
exceeds the limits, in the order of how much each point exceeds the
control limits.
points. The points plotted on the control chart, normally the output of
one of the control chart VIs, such as an X-bar array.
upper control limit. The upper limit line from the control chart VI limits
cluster.
lower control limit. The lower limit line from the control chart VI limits
cluster.
points exceeded limits. TRUE if any of the points exceeded the limits
given.
out of control points. Lists the index of each point in the points array
that exceeded the limits. The out of control points are listed in order of
how much each point exceeds the control limits. The most extremely out-
of-control point is listed first, followed by the next most out-of-control
point, and so forth.

Rule Checker (AT&T/WE)

Applies AT&T/Western Electric run rules to the input points array.
Given a set of control chart points, and the center line and std error
from the control chart VIs, this VI checks whether points are out of
control (or non-randomly distributed) according to the rules enabled.
The front panel in the following illustration lists which rules you can
enable. The VI outputs the rules that are violated along with the first
point and length of the sequence of points violating the rule, and a list of
all points violating any of the enabled rules.
center line. The center line from the control chart VI limits cluster.
std error. The standard error associated with CL from the control chart
VI limits cluster.
rule enable. The run rules to apply to the points array. Each element of
the array corresponds to a rule 1, 2, 3, 4 from element 0 to 3, in that order

(see front panel for rule explanation). Set the corresponding element to
TRUE for each rule you want to apply. (An easy way to do this from the
diagram is to use an unsigned 8-bit integer, set the appropriate bits, and
then use the number for binary array conversion.)
rule 4a/4b. Selects rule 4a or 4b, when rule 4 is enabled.
rule violations. This cluster lists the rules being violated and which
sequence of points violated the rule.
rule. The rule violated (1, 4a, and so forth).
first point. The index of the first point of the sequence of

points violating the given rule.
run length. The length of the sequence of points violating

the given rule.
that the VI identified as out of control according to the applied rules.
Rule Checker (Nelson)

Applies Nelson tests to the input points array. Given a set of control chart
points, and the center line and std error from the control chart VIs, this
VI will check whether points are out of control (or non-randomly
distributed) according to the enabled Nelson tests.
The front panel in the following illustration lists which tests you can
enable. The VI outputs the rules that are violated along with the first
point and length of the sequence of points violating the tests, and a list of
all points violating any of the enabled tests.

std error. The standard error associated with CL from the control chart
VI limits cluster.
test enable. The run rules to apply to the points array. Each element of
the array corresponds to a test 1, 2, 3, … 8 from element 0 to 7, in that
order (see front panel for test explanation). Set the corresponding
element to TRUE for each test you want to apply. (An easy way to do this
from the diagram is to use an unsigned 8-bit integer, set the appropriate
bits, and then use the number to binary array conversion.)
tests flagged. This cluster lists the tests violated and which sequence of
points violated the test.
test. The test violated (1, 4, and so forth).
first point. The index of the first point of the sequence of

points violating the given test.
run length. The length of the sequence of points violating

the given test.

that the VI identified as out of control according to the applied tests.
Process Shift Detector

Uses run rules to detect a process shift in a control chart with respect to
the center line. Returns whether or not a process shift was detected, and
if so, the index of the first point of shift and the pattern detected are
output. This VI can be used to determine when to recalculate control
limits.
The VI searches for the following patterns that signal a process shift:
Pattern 1: At least 10 out of 11 consecutive data points are on the same

side of the center line.



process shift detected. If true, the VI detected one or more of the four
patterns listed above in the control chart points with respect to the center
line, indicating a process shift.
first point of shift. If process shift detected is true, this outputs the index
of the first point in the detected process shift. This point can be used as
the start index for recalculating control limits.

pattern #. If process shift detected is true, this outputs the number of the
first pattern [1 to 4] the VI found.
Sequence Checker
Searches Boolean input array point exceeds bound for # violations per
run set to TRUE within run length. Values in the point exceeds bound
array are set to TRUE if they violate some rule limit. Returns arrays with
the index of each violation point and run length associated with that
point. You use this VI as a generic building block in the rule checker VIs.
For example, to test the rule four out of five points above two standard
errors, set # violations per run to four and run length to five, test
whether each of the control chart points is greater than center line plus
two standard errors, and wire resulting boolean array to point exceeds
bound input.
point exceeds bound. Set each element to TRUE if point exceeds test
bound.
# violations per run. The number of violations per run length that
indicate a rule has been violated.
run length. The run length for the rule.
violation start point. Start point of each sequence violating the rule.
violation run length. The length of each sequence violating the rule.

Chapter
3 Process Statistics VIs
This chapter describes the process statistics VIs, which are useful for
process capability analysis and for viewing and measuring process
distribution.
The process statistics VIs perform the following operations.
• compute process mean and sigma
• compute process capability ratios and reject rates
• create and graph histograms
• plot normal probability distribution functions against histograms

and process specification limits
Process Mean and Sigma

Computes process mean and sigma and upper and lower natural process
limits from process samples. You can estimate the process sigma in
several ways. If the sample size is greater than one, you can use either
sample standard deviation s or range R to estimate the process sigma.
You select s or R by the type input. If the sample size is one, the VI
automatically uses the moving range to estimate the process sigma.
samples X. Samples on which to compute process mean and process

sigma. Each row is a sample with n observations where n is the number
of columns in the 2D array. To calculate process mean and sigma on a
1D array, use the array builder primitive to create a 2D array and then
wire to the samples X input.
type: s/R. Type of process sigma computation to perform.

Process Statistics VIs Chapter 3
s: base process sigma estimate on mean sample standard deviation

(default)
R: base process sigma estimate on mean sample range
Note: If sample size is 1, process sigma estimate is based on mean moving

range.
sigma multipler. The sigma multiplier for calculating upper NPL and
lower NPL. By default, sigma is multiplied by 3.0.
process mean. Mean of the process, estimated from X-bar-bar (or x-bar
if sample size is one).
process sigma. The sigma of the process, estimated from
s
---- if type is S,
c4
R
----- if type is r, or
d2
mR
--------- if sample size is 1.
d2
upper NPL. The upper natural process limit of the process computed as
process mean + sigma multiplier * process sigma. By default, this is
process mean + 3.0 * process sigma.
lower NPL. The lower natural process limit of the process computed as
process mean - sigma multiplier * process sigma. By default, this is
process mean - 3.0 * process sigma.
n for moving Range. This input is ignored unless the sample size
(number of columns) in the input array samples X is one, in which case
the moving range is used as a basis for estimating process mean and
sigma. n for moving Range ranges from 2 to 25. By default, n for
moving Range is set to 2.

Chapter 3 Process Statistics VIs
Compute Process Capability

Given the specification limits and the process mean and process sigma,
computes the process capability ratios Cp, Cpk, and Cpkm as well as the
estimated process fraction non-conforming in parts per million (ppm).
Notice that the fraction non-conforming is valid only if the process is
normally distributed. Computes one-sided upper and one-sided lower in
addition to two-sided process capability ratios and fraction non-
conforming.
Process Mean and Sigma VI in this chapter, for an explanation of how
the values for process mean and process sigma are calculated.
mode. Selects whether to calculate two-sided, one-sided upper only or

one-sided lower only process capability and fraction non-conforming.
By default mode is two-sided.
0: two-sided—Cpk and fraction non-conf are calculated with respect to
both the upper and lower specification limits.
1: upper only—Cpk and fraction non-conf are calculated with respect
to the upper specification limit only. In this case, Cpk = CpU and
fraction non-conf = fraction > USL.
2: lower only—Cpk and fraction non-conf are calculated with respect
to the lower specification limit only. In this case, Cpk = CpL and
fraction non-conf = fraction < LSL.
The values Cp and Cpkm are always calculated from both the upper and
lower specification limits, regardless of the value of mode.
sigma tolerance. The sigma multiplier to use in the process capability

calculations. If sigma tolerance is left unwired, a value of 6.0 is used by

default, which is the tolerance spread most commonly used for process
capability calculations.
CpU & CpL. This cluster contains the one-sided upper and lower
process capability ratios.
CpU. The one-sided upper process-capability ratio.
upper spec limit – process mean__

CpU = 0.5 sigma tolerance*process sigma
By default, 0.5 sigma tolerance=3.0.
CpL. The one-sided lower process-capability ratio.
process mean – lower spec limit

CpU = 0.5 sigma tolerance*process sigma
By default, 0.5 sigma tolerance=3.0.
Cp. The process capability index (also known as PCR or PCI).
upper spec limit – lower spec limit

Cp = sigma tolerance*process sigma
Cp is always calculated with respect to both the upper and lower

specification limits. By default, sigma tolerance=6.0.
Cpk. The centered capability ratio also known as the Cpk index.
Cpk= MIN(CpU, CpL).
Cpkm. A centered process capability ratio.
CpU = upper sigma

spec limit – lower spec limit
tolerance*tau
where tau=
process sigma 2 +  process mean –  ------------------------------------------------------------------------------------ 

upper spec limit-lower spec limit 2
  2  

fraction non-conf. The estimated fraction non-conforming in parts per

million based on a normal process distribution.
U & L fraction non-conf. This cluster contains the estimated fraction

non-conforming in parts per million above and below the specification
limits.
fraction>USL. The estimated fraction non-conforming in

parts per million above the upper spec limit based on a
normal process distribution.
fraction<LSL. The estimated fraction non-conforming in

parts per million below the lower spec limit based on a
normal process distribution.
Note: If your process distribution is not normal, the fraction non-conforming

estimates are invalid.
Sample Statistics VI
Computes statistics on the input array sample X.
sample X. Individual observations on which to compute sample

statistics.
median. The center value of the points in sample X when sorted in

ascending order. If the number of points in sample X is even, the median
is the average of the center pair of points.
mean. The average of the points in sample X.
sample std dev. sample standard deviation computed as:
sum ( x [ i ] – x ) 2
-------------------------------------
n–1
where n is the number of points in X.

skewness. degree of asymmetry in the distribution of the points in

sample X around the mean. A normal distribution has a skewness of 0.
Skewness is computed as
sum (x[i]-x)3
n*sample std dev3
kurtosis. The relative peakedness or flatness of the distribution of the

points in sample X. A normal distribution has a kurtosis of 3. Kurtosis is
computed as
sum (x[i]-x)4
n*sample std dev4
General Histogram
Finds the discrete histogram of the input sequence X based on the given
bin specifications.
X. The input data.
bins specifies the boundaries of each bin of the histogram.
The input Bins is an array of clusters where each cluster defines the range
of values for a bin. The cluster includes the following elements.
lower specifies the lower boundaries of the bin.
upper specifies the upper boundaries of the bin.

inclusion specifies how the boundaries of each bin are

treated. The acceptable values for inclusion are listed as
follows.
0: lower
1: upper
2: both
Choosing 0 causes the lower boundary to be part of the bin

but not the upper boundary. Choosing 1 is exactly opposite.
Both boundaries can be included by choosing 2.
If no bin specifications are provided in the input bins, the

inputs max, min, # bins, and inclusion will be used to
specify a set of uniformly spaced bins.
max specifies the maximum value to include in the histogram. This

parameter is optional as explained below.
min specifies the minimum value to include in the histogram. This

parameter is optional as explained below.
If you do not wire the inputs max and min, the VI will use the maximum
and minimum values in the input sequence Xd.
# bins specifies the number of bins in the histogram. This parameter is

optional as explained below.
If # bins is left unwired, the number of bins will be determined according

to Sturges' Rule (number of bins = 1 + 3.3log(sizeof(X))).
inclusion specifies how the boundaries of each bin are handled. The
valid values for inclusion are:
0: include the lower boundary
1: include the upper boundary
2: include both boundaries
histogram specifies the resulting histogram.
axis specifies the center values for each bin of Histogram.
The centers of each bin are set according to the following equation and
returned in the output array axis.
lower + upper
center [ i ] = ------------------------------------
2

# outside is the output cluster. # outside contains three elements:
total. Upon successful execution, the element total will

contain the total number of points in X not falling in any
bin.
The elements above and below have meaning only if Bins

are specified such that Bin[0].upper =< Bin[1].lower <
Bin[1].upper, and so on.
above represents the number of values in X above

Bin[sizeof(Bins)-1].upper.
below represents the number of values in X below

Bin[0].lower.
error. No errors are returned. This output maintains compatibility with

the Advanced Analysis Library General Histogram VI.
Fit Nrml PDF to Histogram

Given the bin centers from a histogram (axis values output from the
General HistogramVI), the estimated sigma of the observations for the
histogram, and the total number of observations in the histogram,
calculates the height for a normal probability distribution function (PDF)
that fits the histogram.
bin centers. The x-axis values for the center of each histogram bin.
Connect the x values output of the histogram VI to this input.
sigma. The estimated sigma of the observations from which the

histogram was created. See the description of the Process Mean and
Sigma VI or the Sample Statistics VI in this chapter for an explanation
of how this value is calculated.
number of observations. The number of observations from which the

histogram was created.

normal PDF height. The height of the normal PDF that will fit the
histogram. Use this as an input to the Plot Normal PDF VI or Normal
PDF Graph with Limits VI.
Normal PDF Graph with Limits

Given the specification limits and the process mean and process sigma,
creates a graph of a normal probability distribution function (PDF) of the
process against the specification limits and process mean and sigma.
process limits, and specify the sigma multiplier to use for the natural
process limits (default 3), by wiring in the display mode. If you do not
wire the display mode, the VI automatically draws the specification
limits and natural process limits.
Process Mean and Sigma VI in this chapter for an explanation of how the
process mean and process sigma is calculated.
# PDF points to plot. The number of points to create for the normal
PDF plot. In most cases, you can leave this unwired. By default 50 points
are plotted.
PDF height. The height to draw the PDF. If zero, the VI will draw the
PDF with a height proportional to 1/(process sigma), corresponding to an
area of one under the PDF curve. When fitting a normal PDF to a

histogram, use the PDF height output from the Fit Normal PDF to
Histogram VI.
PDF width. The width to draw the PDF in terms of +/- sigma. If
unconnected, the VI draws the PDF from -3 sigma to +3 sigma by
default.
display mode. Optional display mode specifier. If you do not wire this
cluster, the specification limits and the natural process limits will be
drawn by default. This cluster contains the following inputs.
show spec limits. If true, the specification limits will be

drawn.
show natural process limits. If true, the natural process

limits will be drawn on the plot.

process limits. By default, this is three. The natural process
limits drawn will then be
process mean +/- NP limit sigma * process sigma.
normal PDF graph with limits. An XY graph with the normal PDF of
the process plotted against the specification limits and process mean and
standard deviation. You can wire this output to the normal PDF graph
with Limits custom SPC control.
Plot Normal PDF

Given the process mean and sigma, creates a graph of a normal
probability distribution function (PDF) for the process. Also returns an
array of XY values for the normal distribution. This graph is useful for

viewing the estimated distribution of a sample or group of samples or for

plotting a normal PDF against a histogram.
process mean. The estimated process mean. See the Process Mean and
Sigma VI or the Sample Mean and Std Dev VI to calculate this value.
process sigma. The estimated process sigma. See the Process Mean and
Sigma VI or the Sample Statistics VI to calculate this value.
# points to plot. The number of points to create for the PDF plot.
Normally, you can leave this unwired. By default, 50 points are plotted.
PDF height. The height to draw the PDF. If 0, the VI will draw the PDF
with a height proportional to 1/sigma, corresponding to an area of 1
under the PDF curve. When fitting a normal PDF to a histogram, use the
PDF height output from the Fit Normal PDF to Histogram VI.
PDF width. The width to draw the PDF in terms of +/- sigma. By default,
the width is 3, and the VI draws the PDF from -3 sigma to +3 sigma.
normal PDF values. XY values making up the PDF plot. An array of

clusters made up of the following inputs.
X. The X value of each normal PDF plot point.
Y. The Y axis value of each normal PDF plot point.
This output can also be treated as an XY graph output; you can wire it
directly to an XY graph.
normal PDF graph. An XY graph of a normal PDF with the specified

height, width, and number of points.

Vertical Bar Graph with Limits

Creates a vertical bar graph centered at each of the bin centers x[] and
plots the specification limits and natural process limits as vertical lines
against the bar graph. This type of bar graph is useful for viewing the
results of a histogram against relevant limits.
process limits, and specify the sigma multiplier to use for the natural
process limits (default 3), by wiring in the display mode. If you do not
wire the display mode, the VI will draw the specification limits and
natural process limits (at +/-3 sigma) by default.
histogram y[]. Each element of this array is arranged so that the number
of observations in each bin of the histogram is from left to right. This is
an output from the Histogram VI or the General Histogram VI.
bin centers/axis x[]. The x-axis values for the center of each histogram
bin. Connect the x values output of the Histogram or General Histogram
VI to this input.
Process Mean and Sigma VI in this chapter for an explanation of how the
process mean and process sigma are calculated.

draw the specification limits and the natural process limits by default.
Cluster of the following inputs.
show spec limits. If set to TRUE, the VI draws the

specification limits. By default, this is TRUE.

show natural process limits. If set to TRUE, the VI draws

natural process limits on the plot. By default, this is
FALSE.

process limits. The natural process limits are drawn at
process mean +/- NPLimit sigma*process sigma. By
default, this is 3.0.
vertical bar graph with limits. Centered vertical bar graph, in which
each bar is the height given in the histogram input and is centered at the
values given in the bin centers input. You can wire this output to the
Histogram Bar Graph with Limits custom SPC control.
Vertical Bar Graph

Creates a centered vertical bar graph. Bars are centered at the x[] values
with height y[]. Can be used to plot a histogram.
histogram. Each element of this array is arranged so that the number of

observations in each bin of the histogram is from left to right. This is an
output from the Histogram VI.
bin centers. The x-axis values for the center of each histogram bin.
Connect the x values output of the histogram VI to this input.
bar graph. Centered vertical bar graph. Each bar is of the height given
in the histogram input and centered at the values given in the bin
centers input.

Rotate Graph
Given a multiplot XY graph, transposes the X and Y values so that the
graph is rotated clockwise 90°.
You can use this general purpose VI to rotate any XY graph. It is

particularly useful for plotting horizontal histograms and normal
distributions when comparing them against the Y axis of control charts.
multi-plot X-Y graph. An array of clusters of an array of clusters

containing:
X. X value of point.
Y. Y value of point.
This array is equivalent to an X-Y multi-plot graph.
rotated X-Y graph. An array of clusters of an array of clusters

containing:
X. X value of point.
Y. Y value of point.
This array is equivalent to a multi-plot graph in which the input X and Y

values have been transposed.

Chapter
4 Pareto Analysis VIs
This chapter describes the Pareto analysis VIs, which include the Pareto
Counter VI, the Pareto Chart VI, and the Cause Code Lookup VI. The
Array to Bar/Comb VI, which the Pareto Analysis VIs use as a subVI, is
also included.
• Pareto Counter—given either an unsorted list of causes or a list of

causes and corresponding count, produces a set of Pareto totals for
each cause, including frequency, cumulative frequency, percentage
of total, and cumulative percentage of total for each cause. The VI
sorts the list from the cause with the highest occurrence to the cause
with the lowest occurrence.
• Pareto Chart—given a set of Pareto values, creates a Pareto chart of

the frequency of occurrence of each cause, and a Pareto chart of the
percentage contribution of each cause.
• Cause Code Lookup—given an unsorted list of numeric cause

codes, and a list of the cause for each cause code, produces of list of
causes with the count for each cause, sorted from the cause with the
highest count to the cause with the lowest count.
See Figure 1-17 in Chapter 1 for an example of a Pareto chart application.
The Pareto Counter VI will accept two alternative inputs. You can either
pass in an unsorted list of causes (an array of strings) or an array of
clusters with each cluster containing a cause string and the corresponding
total number of occurrences of that cause. You may be using numeric
cause codes instead of strings. In this case, you can use the Cause Code
Lookup VI to count the number of occurrences of cause codes and
generate a list of cause strings with the count for each cause to be passed
to the Pareto Counter VI. If no cause string is given for a cause code, the
code itself will be put in string form.

Pareto Analysis VIs Chapter 4
Pareto Counter
Given an unsorted list of causes and the number of occurrences for each
cause, sorts the list from the cause with the largest number of occurrences
to the smallest and computes Pareto statistics for each cause.
causes with count. An array of clusters for which the number of

occurrences for each cause is already counted. If the cause input is
empty, the VI calculates the Pareto values from the causes with the count
input.
causes with count. The number of occurrences of cause.
cause. The name of the assigned cause.
The causes with count array has the number of occurrences for each
cause counted. If the causes input is empty, the Pareto values are
calculated from the causes with count input.
Pareto Values. An array of clusters consisting of the following outputs.
cause.
frequency. The number of occurrences of cause.
cumulative frequency. The total of occurrences at the

time this value was read.
percent of total. The percent contribution of cause.
cumulative percent. The total of percentages at the time

this value was read, sorted by frequency of occurrence of
reach cause.
total # of occurrences. The total number of occurrences of all causes.

Chapter 4 Pareto Analysis VIs
Pareto Chart
Given a set of Pareto values (output of the Pareto Counter VI), creates
two Pareto charts and the associated legend. One is a bar chart of the
frequency of occurrence of each cause. The other is a bar chart of the
percentage contribution of each cause. The legend is a list of cause codes
with their rank in a table (2D array of strings) format.
Pareto Values. An array of clusters consisting of the following.
cause. The name of the assigned cause.
frequency. The number of occurrences of cause.
cumulative frequency. The total number of occurrences at

the time this value was read.
percent of total. The percent contribution of cause.
cumulative percent. The total of percentages at the time

this value was read.
Entries are sorted by frequency of occurrence of each cause.
Pareto chart (freq). Bar graph of frequency of occurrence of each cause

with superimposed cumulative plot of frequency. You can wire this
output to the Pareto Chart custom SPC control.
Pareto chart (percent). Bar graph of percentage contribution of

occurrence of each cause with superimposed cumulative plot of
frequency. You can wire this output to the Pareto Chart custom SPC
control.
Legend. A table (2D array of strings) listing the cause (string) for each
bar in the Pareto chart from the rank of 1 (cause with highest frequency
of occurrence) on. You can wire this output to the Pareto Chart Legend
custom SPC control.

Pareto Analysis VIs Chapter 4
Cause Code Lookup

Given an unsorted list of numeric cause codes (an array of numbers), and
a cause code lookup list containing the cause string for each cause code,
returns a sorted list of causes with the count of the number of occurrences
of each cause.
cause codes. Array of 32-bit integers.
code lookup table. An array of clusters consisting of the following.
cause code. The code for cause.
cause name. String associated with the cause code.
causes with count. An array of clusters consisting of the following.
causes on count. The number of occurrences of cause.
cause. Name of cause.

Chapter 4 Pareto Analysis VIs
Array to Bar/Comb Graph

Makes a vertical bar graph from a single array of numbers. The X-axis
values begin at x0 with increments of dx. The width of the bars can be
between 0 (single line “comb plot”) to 100 percent (space between bars).
The Pareto Graph VI uses this general purpose bar graph as a subVI.
width. Width of bar in percent. Default is 100 percent.
y Array. An array of heights for each bar.
x0. The reference point of first bar. Default is 0.0.
dx. Bar spacing. Default is 1.0.
baseline. Baseline of bar graph. Default is 0.0.
alignment. Alignment of bar from reference point x.

0 = Left
1 = Center
2 = Right
Default is 0 = Left.
bar graph. An XY graph.

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Title: LabVIEW® Statistical Process Control Toolkit Reference Manual
Edition Date: September 1994
Part Number: 320753A-01
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Glossary
Prefix Meaning Value

µ- micro- 10-6
m- milli- 10-3
k- kilo- 103
A
Assignable Cause A cause that can be detected and identified as contributing to process
variation.
Attribute Data Data from counting process results such as number of units non-
conforming per inspected sample, or number of defects per inspected
sample containing n units. As opposed to measured data, attribute data
has a discrete number of possible values. p, np, u and c control charts
are used to track attribute data.
Attributes Chart A control chart that tracks whether a process is in control by tracking
attribute data—data counted from the process. p, np, u, c charts are
attributes charts.
B
block diagram Pictorial description or representation of a program or algorithm. In
LabVIEW, the block diagram, which consists of executable icons called
nodes and wires that carry data between the nodes, is the source code for
the VI. The block diagram resides in the Diagram window of the VI.
Boolean controls Front panel objects used to manipulate and display or input and output
and indicators Boolean (TRUE or FALSE) data. Several styles are available, such as
switches, buttons and LEDs.
C
c Chart Control chart that uses number of defects per sample to monitor the
stability of the process. Each sample contains n units, and contains c
defects per sample (zero or more defects per unit). The value of n must
be constant from sample to sample.
© National Instruments Corporation G-1 LabVIEW SPC Toolkit Reference Manual

Glossary
center line A line on a control chart representing average long-term value of the
statistic plotted on the control chart.
cluster A set of ordered, unindexed data elements of any data type including
numeric, Boolean, string, array, or cluster. The elements must be all
controls or all indicators.
connector Part of the VI or function node that contains its input and output
terminals, through which data passes to and from the node.
control Front panel object for entering data to a VI interactively or to a subVI
programmatically.
control chart A charting method for determining the stability of a process; that is,
whether or not a process is in a state of statistical control. Shewart
control charts monitor process stability by plotting sample statistics
against a center line and control limits.
control limits Upper and lower limits on a control chart represent the amount of
variation about a center line that can be attributed to chance causes for a
given process characteristic. Control chart points that fall outside the
control limits signal that the process is not in control and that some
action should be taken. Control limits may be calculated from process
data or from standard values.
Cp process A measure in sigma units of the process capability that is a ratio
capability index of the spread between the specification limits over the m sigma spread of
the process variation, where m is normally 6.
Cpk centered A measure in sigma units of the process capability with respect to how
capability ratio well the process is centered relative to the specification limits, also
known as distance to nearest specification.
current VI VI whose Panel window, Diagram window, or icon editor window is the
active window.
D
Diagram window VI window that contains the block diagram code.
Defect A measured characteristic of a specific unit of product or service that
prevents the unit from meeting a specification requirement or is
otherwise undesirable. In a unit, one or more defects are possible, and
many different types of defects are possible. Also known as a
non-conformity, if the characteristic prevents the unit from meeting a
specification requirement.
LabVIEW SPC Toolkit Reference Manual G-2 © National Instruments Corporation

Glossary
F
fraction non- the number of units in a sample not conforming to specification divided
conforming by the total number of units in the sample.
front panel The interactive user interface of a VI. Modeled from the front panel of
physical instruments, it is composed of switches, slides, meters, graphs,
charts, gauges, LEDs, and other controls and indicators.
H
Help window Special window that displays the names and locations of the terminals
for a function or subVI, the description of controls and indicators, the
values of universal constants, and descriptions and data types of control
attributes.
Histogram A graphical summary of data in which the individual values are sorted
by the range of values into which they fall (also known as bins), and in
which the number of individuals falling within a each bin is counted.
The data is plotted by showing the number of values (frequency) in each
bin.
I
icon Graphical representation of a node on a block diagram.
in-control process A stable process whose variation is due only to chance causes; that is,
no assignable causes of variation are present.
indicator Front panel object that displays output.
individual A single measurement of a process characteristic.
observation
M
matrix Two-dimensional array.
measurement data Data that is a result of observations or measurements of a characteristic
that has a continuous range. As opposed to attribute data, measurement
data is not discrete; that is, any discreteness in measurement data is due
to the resolution of the measuring device, not the characteristic.
moving Average Control chart that uses the average of n successive individual
chart observations from a process to track the stability of the process mean.
This type of control chart is typically used when the sample size is one.
moving Range Chart Control chart that uses the range between n successive individual
observations from a process to track the stability of the process

Glossary
variation. This type of control chart is typically used when sample size
is one.
N
natural process The limits which contain a stated fraction of the individual
limits observations in a population. For a normally distributed population, the
stated fraction is typically the process mean +/- 3.0 sigma.
non-conforming unit A unit of product or service that does not meet a specification
requirement.
normally distributed If a process is normally distributed, expected values for individuals
within the process population fall on a normal or bell-shaped curve.
np Chart Control chart that uses the number of non-conforming units in a sample
to monitor the stability of the process. The sample contains n units, and
zero or more units may be non-conforming. The value n be constant
from sample to sample.
numeric controls Front panel objects used to manipulate and display or input and output
and indicators numeric data.
O
observation A measurement of a process characteristic.
P
p chart Control chart that uses the fraction of non-conforming units in a sample
to monitor the stability of the process. The sample contains n units, and
zero or more units may be non-conforming. The value n may vary from
sample to sample.
Panel window VI window that contains the front panel, the execution palette, and the
icon/connector pane.
plot A graphical representation of an array of data shown either on a graph or
a chart.
pop up To call up a special menu by clicking on an object with the right mouse
button.
pop-up menus Menus accessed by command-clicking, usually on an object. Menu
options pertain to that object specifically.
Pareto chart A chart of a set of counted or totalized characteristics in which the
characteristics are ranked in order of their frequency of occurrence. In
SPC, Pareto charts are normally used to evaluate relative contribution of
assignable causes and prioritize corrective action.

Glossary
process capability A measure of the ability of a process to produce product within

specification, assuming the process is stable. Specifically the variability
that can be expected for a given process characteristic with respect to the
specification limits for the characteristic.
pull-down menus Menus accessed from a menu bar. Pull-down menu options are usually
general in nature.
R
R (Range) chart Control chart that uses the sample range R to track the stability of the
variation in the process. Sample range is max sample value minus min
sample value. Sample size must be two or more.
representation Subtype of the numeric data type, of which there are signed and
unsigned byte, word, and long integers, as well as single-, double-, and
extended-precision floating-point numbers, both real and complex.
run chart A chart of the individual observations in a set of samples plotted in time
order of occurrence.
run rules Rules applied to a consecutive set of points on a control chart, that are
used to detect changes in the process such as out-of-control conditions,
or process shift.
S
s (std dev) chart Control chart that uses the sample standard deviation s to determine the
stability of variation in the process. Sample size must be two or more.
sample For measurement data, this is the number of observations (or
(or subgroup) size individual measurements) making up the sample. For attribute data, this
is the number of units n inspected for the counted characteristic.
sample a set of measurements (observations) or units (from which counted data
is taken) used as a basis for evaluating the process.
specification limits Limits that define the range within which a product or characteristic
conforms to specification or user requirements (also known as tolerance
limits).
standard values known standard values for process range, sample standard deviation,
mean or sigma from which control limits can be calculated.
subdiagram Block diagram within the border of a structure.
subgroup a set of measurements (observations) taken from a larger set.
subVI VI used in the block diagram of another VI; comparable to a subroutine.

Glossary
T
tier chart A chart in which the individual observations in each sample are plotted
vertically. It is a useful means of visualizing the variation or spread in
each sample.
top-level VI VI at the top of the VI hierarchy. This term distinguishes the VI from its
subVIs.
U
u chart Control chart that uses the average number of defects per sample to
monitor the stability of the process. The sample contains n units, and
contains c defects per sample (zero or more defects per unit). The value
n may vary from sample to sample.
V
variables chart A pair of control charts that track whether a process is in control by
tracking mean and variability of samples of measured data. Variables
charts include X-bar and s, X-bar and R, x and mR charts, and mX-bar
and mR charts.
VI library Special file that contains a collection of related VIs for a specific use.
W
waveform chart A numeric plotting indicator modeled after a paper strip chart recorder,
which scrolls as it plots data.
wire Data path between nodes.
Wiring tool Tool used to define data paths between source and sink terminals.
X
x (individual) chart Control chart that uses the individual observations from a process to
track the stability of the process mean. This type of control chart is
typically used when sample size is one.
X-bar chart Control chart that uses the sample mean, X-bar, to track the stability of
the process mean. Sample size must be two or more.

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aBook Page 1 Wednesday, April 22, 1998 8:21 AM

Statistical Process Control Toolkit

© Copyright 1994 National Instruments Corporation. Part Number 320753A-01

National Instruments Corporate Headquarters

EXCEPT AS SPECIFIED HEREIN, NATIONAL INSTRUMENTS MAKES NO WARRANTIES,

LabVIEW® is a trademark of National Instruments Corporation.

WARNING REGARDING MEDICAL AND CLINICAL USE

About This Manual ...............................................................ix

© National Instruments Corporation v LabVIEW SPC Toolkit Reference Manual

Variables Chart VIs ..................................................................2-7

LabVIEW SPC Toolkit Reference Manual vi © National Instruments Corporation

© National Instruments Corporation vii LabVIEW SPC Toolkit Reference Manual

About This Manual

Organization of This Manual

• Chapter 1, Introduction to Statistical Process Control in LabVIEW,

• Chapter 2, Control Chart VIs, describes the control chart VIs,

• Chapter 3, Process Statistics VIs, describes the process statistics

• Chapter 4, Pareto Analysis VIs, describes the Pareto analysis VIs,

• The Appendix, Customer Communication, contains forms you can

• The Glossary contains an alphabetical list and description of terms

© National Instruments Corporation ix LabVIEW SPC Toolkit Reference Manual

About This Manual

Conventions Used in This Manual

Note: This icon to the left of bold italicized text denotes

LabVIEW SPC Toolkit Reference Manual x © National Instruments Corporation

About This Manual

LabVIEW Data Each VI description gives a data type picture for

Control Indicator Data Type

Signed 16-bit integer

Signed 32-bit integer

Unsigned 8-bit integer

Unsigned 16-bit integer

Unsigned 32-bit integer

Single-precision floating-point number

Double-precision floating-point number

Extended-precision floating-point number

Array of signed 32-bit integers

Abbreviations, acronyms, metric prefixes, mnemonics, symbols, and

© National Instruments Corporation xi LabVIEW SPC Toolkit Reference Manual

About This Manual

• Your LabVIEW tutorial

• Your LabVIEW user manual

• American Society for Quality Control. American National

• Breyfogle, Forest W., Statistical Methods for Testing, Development,

• Montgomery, Douglas C., Introduction to Statistical Quality

• Wheeler, Donald J. and Chambers, David S., Understanding

LabVIEW SPC Toolkit Reference Manual xii © National Instruments Corporation

Chapter Introduction to Statistical

a. From Windows, select Run... from the File menu of the

b. From Windows, launch the File Manager. Click on the drive

2. After you choose an installation option, follow the instructions that

© National Instruments Corporation 1-1 LabVIEW SPC Toolkit Reference Manual

Introduction to Statistical Process Control in LabVIEW Chapter 1

14818 pts/9 S 0:01 /usr/sbin/vold

If volume manager is running, install the SPC toolkit as follows:

1. Use the cd command to change to a directory where you have write

4. Type tar xf /vol/dev/aliases/floppy0 INSTALL to

5. To run the installation script, type ./INSTALL. Follow the

If volume manager is not running or if your system runs Solaris 1, install