Switching Regulator Applications: Absolute Maximum Ratings
Switching Regulator Applications: Absolute Maximum Ratings
Switching Regulator Applications: Absolute Maximum Ratings
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (MACHII π-MOSVI)
2SK3911
Switching Regulator Applications
Unit: mm
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook (“Handling Precautions”/’’Derating Concept and Methods’’) and individual reliability data (i.e.
reliability test report and estimated failure rate, etc).
Thermal Characteristics
Note 1: Ensure that the channel temperature does not exceed 150°C during
use of the device.
1 2009-09-29
2SK3911
Electrical Characteristics (Ta = 25°C)
Marking
TOSHIBA
[[G]]/RoHS COMPATIBLE or [[G]]/RoHS [[Pb]]
K3911 Part No. (or abbreviation code)
Lot No. Please contact your TOSHIBA sales representative for details as to
environmental matters such as the RoHS compatibility of Product.
Note 4 The RoHS is the Directive 2002/95/EC of the European Parliament
and of the Council of 27 January 2003 on the restriction of the use of
certain hazardous substances in electrical and electronic equipment.
2 2009-09-29
2SK3911
ID – VDS ID – VDS
20 50
10 COMMON COMMON SOURCE 10
SOURCE Tc = 25°C 8
8 6.5 Tc = 25°C PULSE TEST
16 Pulse test 40
DRAIN CURRENT ID (A)
6.5
8 20
5.5
6
4 VGS = 5 V 10
5.5
VGS = 5 V
0 0
0 2 4 6 8 10 0 4 8 12 16 20
VDS = 20 V Tc = 25°C
PULSE TEST PULSE TEST
40 25 16
DRAIN CURRENT ID (A)
30 12
100 Tc = −55°C
20 8
ID = 20 A
10 4
5 10
0 0
0 2 4 6 8 10 0 4 8 12 16 20
DRAIN−SOURCE ON RESISTANCE
VGS = 10 V
10
RDS (ON) (mΩ)
Tc = −55°C 100
⎪Yfs⎪ (S)
25 100
0.1 10
0.1 1 10 100 1 10 100
3 2009-09-29
2SK3911
PULSE TEST
800 PULSE TEST
RDS (ON) (mΩ)
10
600
400 ID = 20 A 10
5
1 5
200 3
10 1
VGS = 0 V
0 0.1
−80 −40 0 40 80 120 160 0 −0.4 −0.8 −1.2 −1.6
C – VDS Vth − Tc
10000 5
COMMON SOURCE
Vth (V)
Ciss VDS = 10 V
ID = 1 mA
PULSE TEST
4
(pF)
1000
GATE THRESHOLD VOLTAGE
Coss
CAPACITANCE C
100
2
COMMON SOURCE
10 VGS = 0 V Crss
1
f = 1 MHz
Tc = 25°C
1 0
−80 −40 0 40 80 120 160
0.1 1 10 100
DRAIN−SOURCE VOLTAGE VDS (V) CASE TEMPERATURE Tc (°C)
DYNAMIC INPUT/OUTPUT
PD – Tc CHARACTERISTICS
200 500 20
COMMON SOURCE
PD (W)
ID = 20 A
DRAIN−SOURCE VOLTAGE VDS (V)
(V)
Tc = 25°C
VDS PULSE TEST
160 400 16
GATE−SOURCE VOLTAGE VGS
DRAIN POWER DISSIPATION
VGS
40 100 4
0 0 0
0 40 80 120 160 200 0 20 40 60 80 100
4 2009-09-29
2SK3911
rth – tw
10
NORMALIZED TRANSIENT THERMAL
IMPEDANCE rth (t)/Rth (ch-c)
1
Duty=0.5
0.2
0.1
0.1
0.05
0.02 PDM
SINGLE PULSE
t
0.01
0.01
T
Duty = t/T
Rth (ch-c) = 0.833°C/W
0.001
10μ 100μ 1m 10m 100m 1 10
800
ID max (CONTINUOUS)
DRAIN CURRENT ID (A)
400
1 ms *
10
200
DC OPERATION
Tc=25℃
0
1 25 50 75 100 125 150
0.1
RG = 25 Ω 1 ⎛ B VDSS ⎞
Ε AS = ⋅ L ⋅ I2 ⋅ ⎜ ⎟
VDD = 90 V, L = 3.46 mH 2 ⎜B − V ⎟
⎝ VDSS DD ⎠
5 2009-09-29
2SK3911
6 2009-09-29