Packaging Code: GRT31CR61H106KE01 - (1206, X5R, 10uf, DC50V) Reference Sheet
Packaging Code: GRT31CR61H106KE01 - (1206, X5R, 10uf, DC50V) Reference Sheet
Packaging Code: GRT31CR61H106KE01 - (1206, X5R, 10uf, DC50V) Reference Sheet
(Unit:mm)
(1)-1 L (1)-2 W (2) T e g
3.2±0.2 1.6±0.2 1.6±0.2 0.3 to 0.8 1.5 min.
4.Rated value
(3) Temperature Characteristics Specifications and Test
(4) (6)
(Public STD Code):X5R(EIA) (5) Nominal Methods
Rated Capacitance
Temp. coeff Temp. Range Capacitance (Operating
Voltage Tolerance Temp. Range)
or Cap. Change (Ref.Temp.)
-55 to 85 °C
-15 to 15 % DC 50 V 10 uF ±10 % -55 to 85 °C
(25 °C)
5.Package
mark (8) Packaging Packaging Unit
L f180mm Reel
2000 pcs./Reel
EMBOSSED W8P4
K f330mm Reel 6000 pcs./Reel
EMBOSSED W8P4
Product specifications in this catalog are as of Apr.17,2015,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
GRT31CR61H106KE01-01 1
■AEC-Q200 Murata Standard Specification and Test Methods
1 Pre-and Post-Stress
-
Electrical Test
2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 1000±12 hours at maximum operating
Exposure (Storage) specifications in the following table. temperature ±3℃.
Appearance No marking defects Set for 24±2 hours at room temperature, then measure.
Capacitance R6, C8: Within ±12.5%
Change
Dissipation R6, C8: 0.2 max.
Factor
3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table. the same conditions as (18). Perform the 1000 cycles test according
Appearance No marking defects to the four heat treatments in the following table.
Capacitance R6, C8: Within ±7.5% Set for 24±2 hours at room temperature, then measure.
Change
Step 1 2 3 4
Dissipation R6, C8: 0.2 max.
Temp. -55+0/-3 Room 85 +3/-0 (For R6) Room
Factor (C) Temp. 105+3/-0 (For C8) Temp.
Time
(min.) 153 1 153 1
Insulation 50Ω・F min.
Resistance ・Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
JEMCGS-01744J 2
■AEC-Q200 Murata Standard Specification and Test Methods
6 Operational Life The measured and observed characteristics should satisfy the Apply 100% of the rated voltage for 1000±12 hours at maximum operating
specifications in the following table. temperature ±3℃. Set for 24±2 hours at room temperature, then measure.
Appearance No marking defects The charge/discharge current is less than 50mA.
Capacitance R6,C8: Within ±12.5%
Change ・Initial measurement for high dielectric constant type
Dissipation R6,C8: 0.2max Perform a heat treatment at 150+0/-10℃ for one hour and then set
Factor for 24±2 hours at room temperature.
Perform the initial measurement.
10 Mechanical Appearance No marking defects Three shocks in each direction should be applied along 3 mutually
Shock Capacitance Within the specified tolerance perpendicular axes of the test specimen (18 shocks).
Change The specified test pulse should be Half-sine and should have a
Dissipation R6,C8: 0.125max duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.
Factor
11 Vibration Appearance No defects or abnormalities Solder the capacitor to the test jig (glass epoxy board) in the same
Capacitance Within the specified tolerance manner and under the same conditions as (18). The capacitor
Change should be subjected to a simple harmonic motion having a total
Dissipation R6,C8: 0.125max amplitude of 1.5mm, the frequency being varied uniformly between
Factor the approximate limits of 10 and 2000Hz. The frequency range, from
10 to 2000Hz and return to 10Hz, should be traversed in
approximately 20 minutes. This motion should be applied for 12
Insulation 50Ω ・F min. items in each 3 mutually perpendicular directions (total of 36 times).
Resistance
12 Resistance to The measured and observed characteristics should satisfy the Immerse the capacitor in a eutectic solder solution at 260±5℃ for
Soldering Heat specifications in the following table. 10±1 seconds. Set at room temperature for 24±2 hours, then
Appearance No marking defects measure.
Capacitance Within the specified tolerance
Change ・Initial measurement for high dielectric constant type
Dissipation R6,C8: 0.125max Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
Factor for 24±2 hours at room temperature.
Perform the initial measurement.
JEMCGS-01744J 3
■AEC-Q200 Murata Standard Specification and Test Methods
13 Thermal Shock The measured and observed characteristics shall satisfy the Fix the capacitor to the supporting jig in the same manner and under
specifications in the following table. the same conditions as (18). Perform the 300 cycles according to
Appearance No marking defects the two heat treatments listed in the following table (Maximum
Capacitance R6,C8: Within ±10.0% transfer time is 20 seconds).
Change Set for 24±2 hours at room temperature, then measure.
Step 1 2
Temp. 105+3/-0 (For C8)
Dissipation R6,C8: 0.125max -55+0/-3 85+3/-0 (For R6)
(℃)
Factor Time
15±3 15±3
(min.)
Insulation 50Ω ・F min.
Resistance ・Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
14 ESD Appearance No marking defects Per AEC-Q200-002
Capacitance Within the specified tolerance Voltage setting level : 2kV
Change
Dissipation R6,C8: 0.125max
Factor
Insulation 50Ω ・F min. The insulation resistance should be measured with a DC voltage not
Resistance exceeding the rated voltage at 25℃ and maximum operating temperature※
25℃ within 1 minute of charging.
Insulation 5Ω ・F min.
Resistance ※85+3/-0℃(For R6), 105+3/-0℃(For C8)
85℃(For R6)
105℃(For C8)
Dielectric No failure No failure should be observed when 250% of the rated voltage is
Strength applied between the terminations for 1 to 5 seconds, provided the
charge/ discharge current is less than 50mA.
JEMCGS-01744J 4
■AEC-Q200 Murata Standard Specification and Test Methods
17 Board Flex Appearance No marking defects Solder the capacitor on the test jig (glass epoxy board) shown in
Fig1 using a eutectic solder. Then apply a force in the direction
shown in Fig 2 for 5±1sec. The soldering should be done by the
reflow method and should be conducted with care so that the
Capacitance Within specified tolerance soldering is uniform andコンデンサ
free of defects such as heat shock.
Change
Dissipation R6,C8: 0.125max Type a b c
GRT03 0.3 0.9 0.3
Factor
GRT15 0.5 1.5 0.6
45 45 支持台
GRT18 0.6 2.2 0.9
GRT21 0.8 3.0 1.3
Insulation 50Ω ・F min. GRT31 2.0 4.4 1.7
Resistance
(in mm)
1.75±0.1
b *1,2:2.0±0.05
114 4.0±0.1
20
Pressurizing *1 *2
φ1.5 +0.1
-0
speed:1.0mm/sec
C Pressurize
R4
3.5± 0.05
40
c
8.0±0.3
A
B
Flexure:≦2
0.05以下
100 (Chip thickness>0.85mm rank
Capacitance meter
High Dielectric Type)
Fig.1 45 45 Flexure:≦1 t
t : 1.6mm (Chip thickness≦0.85mm rank
(GRT03,15:0.8mm) Fig.2
High Dielectric Type))
18 Terminal Appearance No marking defects Solder the capacitor to the test jig (glass epoxy board) shown in
Strength Fig.3 using a eutectic solder. Then apply *18N force in parallel with
Capacitance Within specified tolerance the test jig for 60sec.
Change The soldering should be done either with an iron or using the reflow
Dissipation R6,C8: 0.125max method and should be conducted with care so that the soldering is
Factor uniform and free of defects such as heat shock
*2N(GRT03,15)
Type a b c
Insulation 50Ω ・F min. GRT03 0.3 0.9 0.3
Resistance GRT15 0.4 1.5 0.5
GRT18 1.0 3.0 1.2
GRT21 1.2 4.0 1.65
GRT31 2.2 5.0 2.0
(in mm)
c
t : 1.6mm
ランド
b
f4.5 (GRT03,15:0.8mm)
b
Solder resist
Baked electrode
c
or copper foil
Fig.3
a
19 Beam Load Test Destruction value should be exceed following one. Place the capacitor in the beam load fixture as Fig 4.
< Chip L dimension : 2.5mm max. > Apply a force.
Chip thickness > 0.5mm rank : 20N < Chip Length : 2.5mm max. >
Chip thickness ≦0.5mm rank : 8N
< Chip L dimension : 3.2mm min. >
Chip thickness < 1.25mm rank : 15N Iron Board
Chip thickness ≧1.25mm rank : 54.5N
0.6L
Fig.4
JEMCGS-01744J 5
■AEC-Q200 Murata Standard Specification and Test Methods
20 Capacitance Capacitance R6 : Within ±15% The capacitance change should be measured after 5 min. at
Temperature Change (-55℃ to +85℃) each specified temperature stage.
Characteristics The ranges of capacitance change compared with the above 25℃
C8 : Within ±22% value over the temperature ranges shown in the table should be
(-55℃ to +105℃) within the specified ranges.
Step Temperature.(C)
1 25±2
2 -55±3
3 25±2
4 85±3(for R6), 105±3(for C8)
5 25±2
JEMCGS-01744J 6
Package
GRT Type
+0.1 *1 *2
φ1.5 -0
3.5±0.05
8.0±0.3
A A
B
B
0.05 max.
LW Dimensions
Type A *3 B *3 t
Tolerance(Chip)
JEMCGP-01742F 7
Package
GRT Type
1.75±0.1
+0.1
2.0±0.1
φ1.5 -0
3.5±0.05
A
8.0±0.3
B
LW Dimensions T Dimensions
Type
Tolerance(Chip) (Chip)
A B t
0.8±0.1
±0.15 within 1.05±0.10 1.85±0.10
GRT18 8 0.8±0.15
±0.2 0.8±0.2 1.10±0.10 2.00±0.10
0.6±0.1
6 ±0.1
0.6+0/-0.15 1.1 max.
GRT21 1.55±0.15 2.30±0.15
0.85±0.1
9 ±0.15 within
0.85+0/-0.2
6 ±0.15 0.6±0.1
GRT31 2.00±0.20 3.60±0.20
9 ±0.2 within 0.85±0.1
(3)GRT21/31/32(Plastic Tape)
4.0±0.1 4.0±0.1
1.75±0.1
0.25±0.1(T≦2.0mm)
2.0±0.1
+0.1 0.3±0.1(T:2.5mm)
φ1.5 -0
3.5±0.05
8.0±0.3
A
B
LW Dimensions T Dimensions
Type
Tolerance(Chip) (Chip)
A B t
±0.1 1.25±0.1 1.45±0.20 2.25±0.20 1.7 max.
GRT21 B ±0.15 1.25±0.15
1.50±0.20 2.30±0.20 2.0 max.
±0.2 1.25±0.2
±0.15 1.15±0.1
M 1.7 max.
GRT31 ±0.2 1.15±0.15 1.90±0.20 3.50±0.20
C ±0.2 1.6±0.2 2.5 max.
N 1.35±0.15 2.5 max.
L:±0.3
GRT32 D 2.0±0.2 2.80±0.20 3.50±0.20 3.0 max.
:2.0±0.1
W:±0.2
E 2.5±0.2 3.7 max.
JEMCGP-01742F 8
max.(T≦1.8mm)
め状態 (単位:mm)
Package
GRT Type
Chip
2.0±0.5
φ21±0.8
φ180+0/-3.0
φ330±2.0
φ50 min.
φ13±0.5
w1
JEMCGP-01742F 9
Package
1 チップ詰め状態 (単位:mm) GRT Type
1.4 Part of the leader and part of the vacant section are attached as follows.
(in mm)
Tail vacant Section Chip-mounting Unit Leader vacant Section
Leader Unit
(Top Tape only)
Direction
of Feed
1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.
1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.
1.8 There are no jointing for top tape and bottom tape.
1.12 Peeling off force : 0.1N to 0.6N* in the direction as shown below.
* GRT03:0.05N to 0.5N
1.13 Label that show the customer parts number, our parts number, our company name, inspection
number and quantity, will be put in outside of reel.
JEMCGP-01742F 10
! Caution
■Limitation of Applications
Please contact us before using our products for the applications listed below which require especially high reliability
for the prevention of defects which might directly cause damage to the third party's life, body or property.
①Aircraft equipment ②Aerospace equipment ③Undersea equipment ④Power plant control equipment
⑤Medical equipment ⑥Transportation equipment(vehicles,trains,ships,etc.) ⑦Traffic signal equipment
⑧Disaster prevention / crime prevention equipment ⑨Data-processing equipment
⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.
This series is designed for use in Car Multimedia, Car Interior, Car Comfort application and General
Electronic equipment. It shall not be used in applications critical to passenger safety and car driving
function(e.g. ABS,AIRBAG, etc.).
■Rating
1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature
changes. The following actions are recommended in order to ensure suitable capacitance values.
(1) Select a suitable capacitance for the operating temperature range.
(2) The capacitance may change within the rated temperature.
When you use a high dielectric constant type capacitors in a circuit that needs a tight (narrow) capacitance
tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and
carefully confirm the various characteristics in actual use conditions and the actual system.
15
15
Capacitance Change (%)
10
10
5
5
0
0
-5
-5
-10 -10
-15 -15
-20 -20
-75 -50 -25 0 25 50 75 100 125 150 -75 -50 -25 0 25 50 75 100
Temperature (°C) Temperature (°C)
JEMCGC-01743C 11
! Caution
2.Measurement of Capacitance
1. Measure capacitance with the voltage and frequency specified in the product specifications.
1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.
Please confirm whether a prescribed measured voltage is impressed to the capacitor.
1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.
Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.
3.Applied Voltage
1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.
1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.
(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.
When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.
(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.
E E E 0 E
0
0 0
(E:Maximum possible applied voltage.)
1.Confirm the operating conditions to make sure that nolarge current is flowing into the capacitor due to the
continuous application of an AC voltage or pulse voltage.
When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current
or pulse current will flow into the capacitor; therefore check the self-heating condition.
Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits
of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is
used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.
<Applicable to Rated Voltage of less than 100VDC> [Example of Temperature Rise (Heat Generation) in Chip
1-1. The load should be contained to the level Monolithic Ceramic Capacitors in Contrast to Ripple
such that when measuring at atmospheric Current]
temperature of 25°C, the product's self-heating Sample: R1 characteristics 10μF, Rated voltage: DC10V
remains below 20°C and the surface
temperature of the capacitor in the actual circuit Ripple Current
100
remains within the maximum operating
Temperature Rise (°C)
temperature.
10
100kHz
500kHz
1MHz
1
0 1 2 3 4 5 6
Current (Ar.m.s.)
JEMCGC-01743C 12
! Caution
0
1-1. The capacitance of ceramic capacitors may change
-20
sharply depending on the applied voltage. (See figure)
Please confirm the following in order to secure the -40
capacitance. -60
(1) Determine whether the capacitance change caused -80
by the applied voltage is within the allowed range .
-100
(2) In the DC voltage characteristics, the rate of 0 10 20 30 40 50
capacitance change becomes larger as voltage DC Voltage (V)
increases, even if the applied voltage is below
the rated voltage. When a high dielectric constant
type capacitor is used in a circuit that requires a
[Example of AC Voltage Characteristics]
tight (narrow) capacitance tolerance (e.g., a time
Sample: R7 Characteristics 10μF, Rated Voltage 6.3VDC
constant circuit), please carefully consider the
30
Capacitance Change (%)
voltage characteristics, and confirm the various
20
characteristics in actual operating conditions in 10
an actual system. 0
-10
2. The capacitance values of high dielectric -20
-30
constant type capacitors changes depending
-40
on the AC voltage applied. -50
Please consider the AC voltage characteristics -60
0 0.5 1 1.5 2
when selecting a capacitor to be used in a AC Voltage (Vr.m.s.)
AC circuit.
6. Capacitance Aging
[ Example of Change Over Time (Aging characteristics) ]
1. The high dielectric constant type capacitors 20
have the characteristic in which the capacitance
10
value decreases with the passage of time.
Capacitance Change(%)
1. Please confirm the kind of vibration and/or shock, its condition, and any generation of resonance.
Please mount the capacitor so as not to generate resonance, and do not allow any impact on the terminals.
JEMCGC-01743C 13
! Caution
1.Mounting Position
1. Confirm the best mounting position and direction that minimizes the stress imposed on the capacitor during flexing
or bending the printed circuit board.
1-1.Choose a mounting position that minimizes the stress imposed on the chip during flexing or bending of the board.
[Component Direction]
①
1A
[Chip Mounting Close to Board Separation Point]
It is effective to implement the following measures, to reduce stress in separating the board.
It is best to implement all of the following three measures; however, implement as many measures as possible
to reduce stress.
D
A 1A
Slit
③② 1C 1B
[Mounting Capacitors Near Screw Holes]
When a capacitor is mounted near a screw hole, it may be affected by the board deflection that occurs during
the tightening of the screw. Mount the capacitor in a position as far away from the screw holes as possible.
Recommended
Screw Hole
3. Confirm the mechanical stress under actual process and equipment use.
4. Confirm the rated capacitance, rated voltage and other electrical characteristics before assembly.
5. Prior to use, confirm the solderability for the capacitors that were in long-term storage.
6. Prior to measuring capacitance, carry out a heat treatment for capacitors that were in long-term storage.
7.The use of Sn-Zn based solder will deteriorate the reliability of the MLCC.
Please contact our sales representative or product engineers on the use of Sn-Zn based solder in advance.
JEMCGC-01743C 14
! Caution
1. Make sure that the following excessive forces are not applied to the capacitors.
1-1. In mounting the capacitors on the printed circuit board, any bending force against them shall be kept
to prevent them from any bending damage or cracking. Please take into account the following precautions
and recommendations for use in your process.
(1) Adjust the lowest position of the pickup nozzle so as not to bend the printed circuit board.
(2) Adjust the nozzle pressure within a static load of 1N to 3N during mounting.
Deflection
Board
Board Guide
[Correct]
Backup Pin
2.Dirt particles and dust accumulated between the suction nozzle and the cylinder inner wall prevent
the nozzle from moving smoothly. This imposes greater force upon the chip during mounting,
causing cracked chips. Also, the locating claw, when worn out, imposes uneven forces on the chip
when positioning, causing cracked chips. The suction nozzle and the locating claw must be maintained,
checked and replaced periodically.
JEMCGC-01743C 15
! Caution
4-1.Reflow Soldering
1. When sudden heat is applied to the components, the [Standard Conditions for Reflow Soldering]
mechanical strength of the components will decrease
because a sudden temperature change causes Reflow
deformation inside the components. In order to prevent Temperature(℃)
Soldering
mechanical damage to the components, preheating is Peak Temperature
Gradual
required for both the components and the PCB. 220℃ (200℃) Cooling
Preheating conditions are shown in table 1. It is required to ΔT
keep the temperature differential between the solder and 190℃ (170℃)
170℃ (150℃)
the components surface (ΔT) as small as possible. 150℃ (130℃)
Preheating
GRT32 ΔT≦130℃
Time
60-120 seconds 20 seconds max.
Peak 270
230 to 250℃ 230 to 240℃ 240 to 260℃
Temperature 260
Saturated vapor 250
Atmosphere Air Air or N2
of inactive solvent 240
Pb-Sn Solder: Sn-37Pb 230
Lead Free Solder: Sn-3.0Ag-0.5Cu 220
0 30 60 90 120
Soldering Time(s)
JEMCGC-01743C 16
! Caution
4-2.Flow Soldering
1. Do not apply flow soldering to chips not listed in Table 2. [Standard Conditions for Flow Soldering]
Table 2 Temperature(℃)
Soldering Soldering
Part Number Temperature Differential Peak
Gradual
Temperature
ΔT Cooling
Preheating
2. When sudden heat is applied to the components, the
mechanical strength of the components will decrease Time
because a sudden temperature change causes 30-90 seconds 5 seconds max.
deformation inside the components. In order to prevent
mechanical damage to the components, preheating is
required for both of the components and the PCB.
Preheating conditions are shown in table 2. It is required to [Allowable Flow Soldering Temperature and Time]
keep the temperature differential between the solder and
the components surface (ΔT) as low as possible. 280
Soldering mperature(℃)
270
3. Excessively long soldering time or high soldering 260
temperature can result in leaching of the outer electrodes,
250
causing poor adhesion or a reduction in capacitance value
240
due to loss of contact between the electrodes and end termination.
230
5-1. The top of the solder fillet should be lower than the
thickness of components. If the solder amount is
excessive, the risk of cracking is higher during
board bending or any other stressful condition. in section
Adhesive
JEMCGC-01743C 17
! Caution
When sudden heat is applied to the capacitor, distortion caused by the large temperature difference occurs internally,
and can be the cause of cracks. Capacitors also tend to be affected by mechanical and thermal stress depending
on the board preheating temperature or the soldering fillet shape, and can be the cause of cracks.
Please refer to "1. PCB Design" or "3. Optimum solder amount" for the solder amount and the fillet shapes.
[Figure 1]
One-hole Nozzle
an Angle of 45°
JEMCGC-01743C 18
! Caution
5.Washing
Excessive ultrasonic oscillation during cleaning can cause the PCBs to resonate, resulting in cracked chips
or broken solder joints. Take note not to vibrate PCBs.
1. Confirm position of the backup pin or specific jig, when inspecting the electrical performance of a
capacitor after mounting on the printed circuit board.
1-1. Avoid bending the printed circuit board by the pressure of a test-probe, etc.
The thrusting force of the test probe can flex the PCB, resulting in cracked chips or open solder
joints. Provide backup pins on the back side of the PCB to prevent warping or flexing.
Install backup pins as close to the test-probe as possible.
1-2. Avoid vibration of the board by shock when a test -probe contacts a printed circuit board.
Test-probe
Test-probe
1. After mounting a capacitor on a printed circuit board, do not apply any stress to the capacitor that
caused bending or twisting the board.
1-1. In cropping the board, the stress as shown at right may cause the capacitor to crack.
Cracked capacitors may cause deterioration of the insulation resistance, and result in a short.
Avoid this type of stress to a capacitor.
①
[Bending] [Twisting]
1A
2. Check the cropping method for the printed circuit board in advance.
2-1. Printed circuit board cropping shall be carried out by using a jig or an apparatus (Disk separator, router
type separator, etc.) to prevent the mechanical stress that can occur to the board.
· Board handling
Hand and nipper
· Board handling · Layout of slits
separation apply a high
· Board bending direction · Design of V groove
Notes level of stress. Board handling
· Layout of capacitors · Arrangement of blades
Use another method.
· Controlling blade life
* When a board separation jig or disk separator is used, if the following precautions are not observed,
a large board deflection stress will occur and the capacitors may crack.
Use router type separator if at all possible.
JEMCGC-01743C 19
! Caution
V-groove
Bottom Blade
Printed Circuit Board V-groove
Not recommended
Recommended
Top-bottom Misalignment Left-right Misalignment Front-rear Misalignment
Top Blade Top Blade Top Blade Top Blade
JEMCGC-01743C 20
! Caution
8. Assembly
1. Handling
If a board mounted with capacitors is held with one hand, the board may bend.
Firmly hold the edges of the board with both hands when handling.
If a board mounted with capacitors is dropped, cracks may occur in the capacitors.
Do not use dropped boards, as there is a possibility that the quality of the capacitors may be impaired.
Suction Nozzle
JEMCGC-01743C 21
! Caution
■ Others
1-1. Do not touch a capacitor directly with bare hands during operation in order to avoid the danger of an electric shock.
1-2. Do not allow the terminals of a capacitor to come in contact with any conductive objects (short-circuit).
Do not expose a capacitor to a conductive liquid, inducing any acid or alkali solutions.
1-3. Confirm the environment in which the equipment will operate is under the specified conditions.
Do not use the equipment under the following environments.
(1) Being spattered with water or oil.
(2) Being exposed to direct sunlight.
(3) Being exposed to ozone, ultraviolet rays, or radiation.
(4) Being exposed to toxic gas (e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammonia gas etc.)
(5) Any vibrations or mechanical shocks exceeding the specified limits.
(6) Moisture condensing environments.
1-4. Use damp proof countermeasures if using under any conditions that can cause condensation.
2. Others
2-1. In an Emergency
(1) If the equipment should generate smoke, fire, or smell, immediately turn off or unplug the equipment.
If the equipment is not turned off or unplugged, the hazards may be worsened by supplying continuous power.
(2) In this type of situation, do not allow face and hands to come in contact with the capacitor or burns may be caused
by the capacitor's high temperature.
2-4. Remarks
Failure to follow the cautions may result, worst case, in a short circuit and smoking when the product is used.
The above notices are for standard applications and conditions. Contact us when the products are used in special
mounting conditions.
Select optimum conditions for operation as they determine the reliability of the product after assembly.
The data herein are given in typical values, not guaranteed ratings.
JEMCGC-01743C 22
Notice
■ Rating
1.Operating Temperature
1-1. Capacitors, when used in the above, unsuitable, operating environments may deteriorate due to the corrosion
of the terminations and the penetration of moisture into the capacitor.
1-2. The same phenomenon as the above may occur when the electrodes or terminals of the capacitor are subject
to moisture condensation.
1-3. The deterioration of characteristics and insulation resistance due to the oxidization or corrosion of terminal
electrodes may result in breakdown when the capacitor is exposed to corrosive or volatile gases or solvents
for long periods of time.
3.Piezo-electric Phenomenon
1. When using high dielectric constant type capacitors in AC or pulse circuits, the capacitor itself vibrates
at specific frequencies and noise may be generated.
Moreover, when the mechanical vibration or shock is added to capacitor, noise may occur.
JEMCGC-01743C 23
Notice
1.PCB Design
1-1. Unlike leaded components, chip components are susceptible to flexing stresses since they are mounted
directly on the substrate.
They are also more sensitive to mechanical and thermal stresses than leaded components.
Excess solder fillet height can multiply these stresses and cause chip cracking.
When designing substrates, take land patterns and dimensions into consideration to eliminate the possibility
of excess solder fillet height.
1-2. There is a possibility of chip cracking caused by PCB expansion/contraction with heat, because stress
on a chip is different depending on PCB material and structure.When the thermal expansion coefficient
greatly differs between the board used for mounting and the chip,it will cause cracking of the chip due to
the thermal expansion and contraction. When capacitors are mounted on a fluorine resin printed circuit
board or on a single-layered glass epoxy board, it may also cause cracking of the chip for the same reason.
Pattern Forms
Prohibited Correct
Chassis
Solder (ground) Solder Resist
in section in section
in section in section
Solder Resist
ソルダレジスト
Lateral Mounting
JEMCGC-01743C 24
Notice
2. Land Dimensions
Chip Capacitor
c
for flow soldering, table 2 for reflow soldering.
JEMCGC-01743C 25
Notice
3. Board Design
When designing the board, keep in mind that the amount of strain which occurs will increase depending on the size
and material of the board.
Relationship with amount of strain to the board thickness, length, width, etc.]
3PL
ε= Relationship between load and strain
2Ewh2
ε:Strain on center of board (μst)
L:Distance between supporting points (mm)
w :Board width (mm)
h :Board thickness (mm)
E :Elastic modulus of board (N/m2=Pa)
Y :Deflection (mm)
P :Load (N)
2.Adhesive Application
1. Thin or insufficient adhesive can cause the chips to loosen or become disconnected during flow soldering.
The amount of adhesive must be more than dimension c, shown in the drawing at right, to obtain the correct bonding
strength. The chip's electrode thickness and land thickness must also be taken into consideration.
Chip Capacitor
a a=20 to 70μm
c b=30 to 35μm
Adhesive b c=50 to 105μm
Board Land
2. Low viscosity adhesive can cause chips to slip after mounting. The adhesive must have a viscosity of
5000Pa • s (500ps) min. (at 25℃)
3. Adhesive Coverage
Size (L×W) (in mm) Adhesive Coverage*
1.6 × 0.8 0.05mg min.
2.0 × 1.25 0.1mg min.
3.2 × 1.6 0.15mg min.
*Nominal Value
3.Adhesive Curing
1. Insufficient curing of the adhesive can cause chips to disconnect during flow soldering and causes
deterioration in the insulation resistance between the outer electrodes due to moisture absorption.
Control curing temperature and time in order to prevent insufficient hardening.
4.Flux
1. An excessive amount of flux generates a large quantity of flux gas, which can cause a deterioration of solderability,
so apply flux thinly and evenly throughout. (A foaming system is generally used for flow solderring.)
2. Flux containing too high a percentage of halide may cause corrosion of the outer electrodes unless there is
sufficient cleaning. Use flux with a halide content of 0.1% max.
JEMCGC-01743C 26
Notice
5.Flow Soldering
Set temperature and time to ensure that leaching of the [As a Single Chip]
outer electrode does not exceed 25% of the chip end A
area as a single chip (full length of the edge A-B-C-D B
shown at right) and 25% of the length A-B shown as D
mounted on substrate. Outer Electrode
C
6.Washing
1. Please evaluate the capacitor using actual cleaning equipment and conditions to confirm the quality,
and select the solvent for cleaning.
2. Unsuitable cleaning solvent may leave residual flux or other foreign substances, causing deterioration of
electrical characteristics and the reliability of the capacitors.
3. Select the proper cleaning conditions.
3-1. Improper cleaning conditions (excessive or insufficient) may result in the deterioration of the performance
of the capacitors.
7.Coating
1. A crack may be caused in the capacitor due to the stress of the thermal contraction of the resin during curing process.
The stress is affected by the amount of resin and curing contraction. Select a resin with low curing contraction.
The difference in the thermal expansion coefficient between a coating resin or a molding resin and the capacitor
may cause the destruction and deterioration of the capacitor such as a crack or peeling, and lead to the deterioration
of insulation resistance or dielectric breakdown.
Select a resin for which the thermal expansion coefficient is as close to that of the capacitor as possible.
A silicone resin can be used as an under-coating to buffer against the stress.
2. Select a resin that is less hygroscopic.
Using hygroscopic resins under high humidity conditions may cause the deterioration of the insulation resistance
of a capacitor. An epoxy resin can be used as a less hygroscopic resin.
■ Others
1.Transportation
1. The performance of a capacitor may be affected by the conditions during transportation.
1-1. The capacitors shall be protected against excessive temperature, humidity and mechanical force during transportation.
(1) Climatic condition
・ low air temperature : -40℃
・ change of temperature air/air : -25℃/+25℃
・ low air pressure : 30 kPa
・ change of air pressure : 6 kPa/min.
(2) Mechanical condition
Transportation shall be done in such a way that the boxes are not deformed and forces are not directly passed
on to the inner packaging.
1-2. Do not apply excessive vibration, shock, or pressure to the capacitor.
(1) When excessive mechanical shock or pressure is applied to a capacitor, chipping or cracking may occur
in the ceramic body of the capacitor.
(2) When the sharp edge of an air driver, a soldering iron, tweezers, a chassis, etc. impacts strongly on the surface
of the capacitor, the capacitor may crack and short-circuit.
1-3. Do not use a capacitor to which excessive shock was applied by dropping etc.
A capacitor dropped accidentally during processing may be damaged.
JEMCGC-01743C 27
! NOTE
1.Please make sure that your product has been evaluated in view of your specifications with our
product being mounted to your product.
2.Your are requested not to use our product deviating from this product specification.
3.We consider it not appropriate to include any terms and conditions with regard to the business
transaction in the product specifications, drawings or other technical documents. Therefore,
if your technical documents as above include such terms and conditions such as warranty clause,
product liability clause, or intellectual property infringement liability clause, they will be deemed to
be invalid.
4.GRT series is manufactured under a quality management system compliant to ISO9001,
but is not registered to ISO/TS16949.
JEMCGC-01743C 28