Adc0831 N
Adc0831 N
Adc0831 N
Typical Application
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2 All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Copyright © 1999–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
ADC0831-N, ADC0832-N, ADC0834-N, ADC0838-N
SNAS531B – AUGUST 1999 – REVISED MARCH 2013 www.ti.com
Connection Diagrams
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
(1) All voltages are measured with respect to the ground plugs.
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not
apply when operating the device beyond its specified operating conditions.
(3) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
(4) Internal zener diodes (6.3 to 8.5V) are connected from V+ to GND and VCC to GND. The zener at V+ can operate as a shunt regulator
and is connected to VCC via a conventional diode. Since the zener voltage equals the A/D's breakdown voltage, the diode insures that
VCC will be below breakdown when the device is powered from V+. Functionality is therefore ensured for V+ operation even though the
resultant voltage at VCC may exceed the specified Absolute Max of 6.5V. It is recommended that a resistor be used to limit the max
current into V+. (See Figure 24 in Functional Description)
(5) When the input voltage (VIN) at any pin exceeds the power supply rails (VIN < V− or VIN > V+) the absolute value of current at that pin
should be limited to 5 mA or less. The 20 mA package input current limits the number of pins that can exceed the power supply
boundaries with a 5 mA current limit to four.
(6) Human body model, 100 pF discharged through a 1.5 kΩ resistor.
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not
apply when operating the device beyond its specified operating conditions.
(2) All voltages are measured with respect to the ground plugs.
(1) Typicals are at 25°C and represent most likely parametric norm.
(2) Tested limits are ensured to TI's AOQL (Average Outgoing Quality Level).
(3) Ensured but not 100% production tested. These limits are not used to calculate outgoing quality levels.
(4) Total unadjusted error includes offset, full-scale, linearity, and multiplexer errors.
(5) Cannot be tested for ADC0832-N.
(6) For VIN(−) ≥ VIN(+) the digital output code will be 0000 0000. Two on-chip diodes are tied to each analog input (see Functional Block
Diagram) which will forward conduct for analog input voltages one diode drop below ground or one diode drop greater than the VCC
supply. Be careful, during testing at low VCC levels (4.5V), as high level analog inputs (5V) can cause this input diode to
conduct—especially at elevated temperatures, and cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of
either diode. This means that as long as the analog VIN or VREF does not exceed the supply voltage by more than 50 mV, the output
code will be correct. To achieve an absolute 0 VDC to 5 VDC input voltage range will therefore require a minimum supply voltage of 4.950
VDC over temperature variations, initial tolerance and loading.
(7) Internal zener diodes (6.3 to 8.5V) are connected from V+ to GND and VCC to GND. The zener at V+ can operate as a shunt regulator
and is connected to VCC via a conventional diode. Since the zener voltage equals the A/D's breakdown voltage, the diode insures that
VCC will be below breakdown when the device is powered from V+. Functionality is therefore ensured for V+ operation even though the
resultant voltage at VCC may exceed the specified Absolute Max of 6.5V. It is recommended that a resistor be used to limit the max
current into V+. (See Figure 24 in Functional Description)
(8) Leakage current is measured with the clock not switching.
AC Characteristics
The following specifications apply for VCC = 5V, tr = tf = 20 ns and 25°C unless otherwise specified.
Tested Design Limit
Parameter Conditions Typ (1)
Limit (2) Limit (3) Units
Min 10 kHz
fCLK, Clock Frequency
Max 400 kHz
tC, Conversion Time Not including MUX Addressing Time 8 1/fCLK
Min 40 %
Clock Duty Cycle (4)
Max 60 %
tSET-UP, CS Falling Edge or Data Input Valid
250 ns
to CLK Rising Edge
tHOLD, Data Input Valid after CLK Rising
90 ns
Edge
CL=100 pF
tpd1, tpd0—CLK Falling Edge to Output Data
Data MSB First 650 1500 ns
Valid (5)
Data LSB First 250 600 ns
CL=10 pF, RL=10k (See TRI-STATE
t1H, t0H,—Rising Edge of CS to Data Output 125 250 ns
Test Circuits and Waveforms)
and SARS Hi–Z
CL=100 pf, RL=2k 500 ns
CIN, Capacitance of Logic Input 5 pF
COUT, Capacitance of Logic Outputs 5 pF
(1) Typicals are at 25°C and represent most likely parametric norm.
(2) Tested limits are ensured to TI's AOQL (Average Outgoing Quality Level).
(3) Ensured but not 100% production tested. These limits are not used to calculate outgoing quality levels.
(4) A 40% to 60% clock duty cycle range insures proper operation at all clock frequencies. In the case that an available clock has a duty
cycle outside of these limits, the minimum, time the clock is high or the minimum time the clock is low must be at least 1 μs. The
maximum time the clock can be high is 60 μs. The clock can be stopped when low so long as the analog input voltage remains stable.
(5) Since data, MSB first, is the output of the comparator used in the successive approximation loop, an additional delay is built in (see
ADC0838-N Functional Block Diagram) to allow for comparator response time.
Figure 8. Figure 9.
Figure 14.
t0H t0H
Timing Diagrams
Figure 15. Data Input Timing Figure 16. Data Output Timing
*Make sure clock edge #18 clocks in the LSB before SE is taken low
Functional Description
Multiplexer Addressing
The design of these converters utilizes a sample-data comparator structure which provides for a differential
analog input to be converted by a successive approximation routine.
The actual voltage converted is always the difference between an assigned “+” input terminal and a “−” input
terminal. The polarity of each input terminal of the pair being converted indicates which line the converter expects
to be the most positive. If the assigned “+” input is less than the “−” input the converter responds with an all zeros
output code.
A unique input multiplexing scheme has been utilized to provide multiple analog channels with software-
configurable single-ended, differential, or a new pseudo-differential option which will convert the difference
between the voltage at any analog input and a common terminal. The analog signal conditioning required in
transducer-based data acquisition systems is significantly simplified with this type of input flexibility. One
converter package can now handle ground referenced inputs and true differential inputs as well as signals with
some arbitrary reference voltage.
A particular input configuration is assigned during the MUX addressing sequence, prior to the start of a
conversion. The MUX address selects which of the analog inputs are to be enabled and whether this input is
single-ended or differential. In the differential case, it also assigns the polarity of the channels. Differential inputs
are restricted to adjacent channel pairs. For example channel 0 and channel 1 may be selected as a different
pair but channel 0 or 1 cannot act differentially with any other channel. In addition to selecting differential mode
the sign may also be selected. Channel 0 may be selected as the positive input and channel 1 as the negative
input or vice versa. This programmability is best illustrated by the MUX addressing codes shown in the following
tables for the various product options.
The MUX address is shifted into the converter via the DI line. Because the ADC0831-N contains only one
differential input channel with a fixed polarity assignment, it does not require addressing.
The common input line on the ADC0838-N can be used as a pseudo-differential input. In this mode, the voltage
on this pin is treated as the “−” input for any of the other input channels. This voltage does not have to be analog
ground; it can be any reference potential which is common to all of the inputs. This feature is most useful in
single-supply application where the analog circuitry may be biased up to a potential other than ground and the
output signals are all referred to this potential.
Since the input configuration is under software control, it can be modified, as required, at each conversion. A
channel can be treated as a single-ended, ground referenced input for one conversion; then it can be
reconfigured as part of a differential channel for another conversion. Figure 22 illustrates the input flexibility which
can be achieved.
The analog input voltages for each channel can range from 50 mV below ground to 50 mV above VCC (typically
5V) without degrading conversion accuracy.
3. On each rising edge of the clock the status of the data in (DI) line is clocked into the MUX address shift
register. The start bit is the first logic “1” that appears on this line (all leading zeros are ignored). Following the
start bit the converter expects the next 2 to 4 bits to be the MUX assignment word.
4. When the start bit has been shifted into the start location of the MUX register, the input channel has been
assigned and a conversion is about to begin. An interval of ½ clock period (where nothing happens) is
automatically inserted to allow the selected MUX channel to settle. The SAR status line goes high at this time to
signal that a conversion is now in progress and the DI line is disabled (it no longer accepts data).
5. The data out (DO) line now comes out of TRI-STATE and provides a leading zero for this one clock period of
MUX settling time.
6. When the conversion begins, the output of the SAR comparator, which indicates whether the analog input is
greater than (high) or less than (low) each successive voltage from the internal resistor ladder, appears at the
DO line on each falling edge of the clock. This data is the result of the conversion being shifted out (with the
MSB coming first) and can be read by the processor immediately.
7. After 8 clock periods the conversion is completed. The SAR status line returns low to indicate this ½ clock
cycle later.
8. If the programmer prefers, the data can be provided in an LSB first format [this makes use of the shift enable
(SE) control line]. All 8 bits of the result are stored in an output shift register. On devices which do not include the
SE control line, the data, LSB first, is automatically shifted out the DO line, after the MSB first data stream. The
DO line then goes low and stays low until CS is returned high. On the ADC0838-N the SE line is brought out and
if held high, the value of the LSB remains valid on the DO line. When SE is forced low, the data is then clocked
out LSB first. The ADC0831-N is an exception in that its data is only output in MSB first format.
9. All internal registers are cleared when the CS line is high. If another conversion is desired, CS must make a
high to low transition followed by address information.
The DI and DO lines can be tied together and controlled through a bidirectional processor I/O bit with one wire.
This is possible because the DI input is only “looked-at” during the MUX addressing interval while the DO line is
still in a high impedance state.
Reference Considerations
The voltage applied to the reference input to these converters defines the voltage span of the analog input (the
difference between VIN(MAX) and VIN(MIN)) over which the 256 possible output codes apply. The devices can be
used in either ratiometric applications or in systems requiring absolute accuracy. The reference pin must be
connected to a voltage source capable of driving the reference input resistance of typically 3.5 kΩ. This pin is the
top of a resistor divider string used for the successive approximation conversion.
In a ratiometric system, the analog input voltage is proportional to the voltage used for the A/D reference. This
voltage is typically the system power supply, so the VREF pin can be tied to VCC (done internally on the ADC0832-
N). This technique relaxes the stability requirements of the system reference as the analog input and A/D
reference move together maintaining the same output code for a given input condition.
For absolute accuracy, where the analog input varies between very specific voltage limits, the reference pin can
be biased with a time and temperature stable voltage source. The LM385 and LM336 reference diodes are good
low current devices to use with these converters.
The maximum value of the reference is limited to the VCC supply voltage. The minimum value, however, can be
quite small (see Typical Performance Characteristics) to allow direct conversions of transducer outputs providing
less than a 5V output span. Particular care must be taken with regard to noise pickup, circuit layout and system
error voltage sources when operating with a reduced span due to the increased sensitivity of the converter (1
LSB equals VREF/256).
a) Ratiometric b) Absolute with a reduced Span
where
• fCM is the frequency of the common-mode signal
• VPEAK is its peak voltage value
• fCLK, is the A/D clock frequency (1)
For a 60 Hz common-mode signal to generate a ¼ LSB error (≈5 mV) with the converter running at 250 kHz, its
peak value would have to be 6.63V which would be larger than allowed as it exceeds the maximum analog input
limits.
Due to the sampling nature of the analog inputs short spikes of current enter the “+” input and exit the “−” input at
the clock edges during the actual conversion. These currents decay rapidly and do not cause errors as the
internal comparator is strobed at the end of a clock period. Bypass capacitors at the inputs will average these
currents and cause an effective DC current to flow through the output resistance of the analog signal source.
Bypass capacitors should not be used if the source resistance is greater than 1 kΩ.
This source resistance limitation is important with regard to the DC leakage currents of input multiplexer as well.
The worst-case leakage current of ±1 μA over temperature will create a 1 mV input error with a 1 kΩ source
resistance. An op amp RC active low pass filter can provide both impedance buffering and noise filtering should
a high impedance signal source be required.
Optional Adjustments
Zero Error
The zero of the A/D does not require adjustment. If the minimum analog input voltage value, VIN(MIN), is not
ground a zero offset can be done. The converter can be made to output 0000 0000 digital code for this minimum
input voltage by biasing any VIN (−) input at this VIN(MIN) value. This utilizes the differential mode operation of the
A/D.
The zero error of the A/D converter relates to the location of the first riser of the transfer function and can be
measured by grounding the VIN(−) input and applying a small magnitude positive voltage to the VIN(+) input. Zero
error is the difference between the actual DC input voltage which is necessary to just cause an output digital
code transition from 0000 0000 to 0000 0001 and the ideal ½ LSB value (½ LSB=9.8 mV for VREF=5.000 VDC).
Full-Scale
The full-scale adjustment can be made by applying a differential input voltage which is 1 ½ LSB down from the
desired analog full-scale voltage range and then adjusting the magnitude of the VREF input (or VCC for the
ADC0832) for a digital output code which is just changing from 1111 1110 to 1111 1111.
where
• VMAX = the high end of the analog input range
• VMIN = the low end (the offset zero) of the analog range. (Both are ground referenced.) (2)
The VREF (or VCC) voltage is then adjusted to provide a code change from FEHEX to FFHEX. This completes the
adjustment procedure.
Power Supply
A unique feature of the ADC0838-N and ADC0834-N is the inclusion of a zener diode connected from the V+
terminal to ground which also connects to the VCC terminal (which is the actual converter supply) through a
silicon diode, as shown in Figure 24 (1).
This zener is intended for use as a shunt voltage regulator to eliminate the need for any additional regulating
components. This is most desirable if the converter is to be remotely located from the system power source.
Figure 25 and Figure 27 illustrate two useful applications of this on-board zener when an external transistor can
be afforded.
An important use of the interconnecting diode between V+ and VCC is shown in Figure 26 and Figure 28. Here,
this diode is used as a rectifier to allow the VCC supply for the converter to be derived from the clock. The low
current requirements of the A/D and the relatively high clock frequencies used (typically in the range of 10k–400
kHz) allows using the small value filter capacitor shown to keep the ripple on the VCC line to well under ¼ of an
LSB. The shunt zener regulator can also be used in this mode. This requires a clock voltage swing which is in
excess of VZ. A current limit for the zener is needed, either built into the clock generator or a resistor can be used
from the CLK pin to the V+ pin.
(1) Internal zener diodes (6.3 to 8.5V) are connected from V+ to GND and VCC to GND. The zener at V+ can operate as a shunt regulator
and is connected to VCC via a conventional diode. Since the zener voltage equals the A/D's breakdown voltage, the diode insures that
VCC will be below breakdown when the device is powered from V+. Functionality is therefore ensured for V+ operation even though the
resultant voltage at VCC may exceed the specified Absolute Max of 6.5V. It is recommended that a resistor be used to limit the max
current into V+. (See Figure 24 in Functional Description)
APPLICATIONS
Figure 25. Operating with a Temperature Figure 26. Generating VCC from the Converter
Compensated Reference Clock
Figure 29. Digital Link and Sample Controlling Software for the Serially Oriented COP420 and the Bit
Programmable I/O INS8048
Controller performs a routine to determine which input polarity (9-bit example) or which channel pair (10-bit example)
provides a non-zero output code. This information provides the extra bits.
REVISION HISTORY
www.ti.com 17-Mar-2017
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 17-Mar-2017
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Dec-2014
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Dec-2014
Pack Materials-Page 2
MECHANICAL DATA
NPA0014B
www.ti.com
MECHANICAL DATA
N0020A
NFH0020A
N20A (Rev G)
www.ti.com
MECHANICAL DATA
N0014A
NFF0014A
N14A (Rev G)
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PACKAGE OUTLINE
DW0020A SCALE 1.200
SOIC - 2.65 mm max height
SOIC
13.0 2X
12.6 11.43
NOTE 3
10
11
0.51
20X
7.6 0.31 2.65 MAX
B 0.25 C A B
7.4
NOTE 4
0.33
TYP
0.10
0.25
SEE DETAIL A GAGE PLANE
1.27 0.3
0 -8 0.40 0.1
DETAIL A
TYPICAL
4220724/A 05/2016
NOTES:
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.43 mm per side.
5. Reference JEDEC registration MS-013.
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EXAMPLE BOARD LAYOUT
DW0020A SOIC - 2.65 mm max height
SOIC
1
20
20X (0.6)
18X (1.27)
SYMM
(R0.05)
TYP
10 11
(9.3)
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EXAMPLE STENCIL DESIGN
DW0020A SOIC - 2.65 mm max height
SOIC
20X (2)
SYMM
1
20
20X (0.6)
18X (1.27)
SYMM
10 11
(9.3)
4220724/A 05/2016
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
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