5.variable Control Chart
5.variable Control Chart
5.variable Control Chart
VARIABLES
Dr. M. S. Memon
Dept. of Industrial Engineering and Management
Mehran University of Engineering and Technology
https://msmemon.wordpress.com/scmlab/
How to select control chart?
Introduction
• Rather than compute 𝜎𝑥ҧ from the raw data, we can use the
relation between the process standard deviation σ (or the
standard deviation of the individual items) and the mean of
ത
the ranges (𝑅).
• Multiplying factors used to calculate the centerline and
control limits are given in Appendix A-7.
• When sampling from a population that is normally
distributed, the distribution of the statistic W = R/σ (known
as the relative range) is dependent on the sample size n.
• The mean of W is represented by d2 and is tabulated in
Appendix A-7. Thus, an estimate of the process standard
deviation is
CONTROL CHARTS FOR THE MEAN AND RANGE
CONTROL CHARTS FOR THE MEAN AND RANGE
CONTROL CHARTS FOR THE MEAN AND RANGE
Solution
• The centerline and the control limits for the X-
chart are as follows
Example 2
Example 2
ത
• The 𝑋-chart based on the standard value is shown in
Figure 7-6. Several points fall outside the control
limits—four points below and two points above.
ത
• In first Example, the revised centerline for the 𝑋-chart
was found to be 20.864. Our target centerline is now
21.0.
• Adjusting controllable process parameters could
possibly shift the average level up to 21.0.
• However, the fact that there are points outside both the
upper and lower control limits signifies that process
variability is the issue here.
Example 2
Interpretation and Inferences from the Charts
Solution (a)
• From the revised R-chart, we found the
centerline to be 𝑅ത = 3.50. The estimated
process standard deviation is
Example 3
Example 3
The specification limits on flow width are 1.50 ± 0.50 microns. The control chart data
may be used to describe the capability of the process to produce wafers relative to these
specifications. Assuming that flow width is a normally distributed random variable,
with mean 1.5056 and standard deviation 0.1398, we may estimate the fraction of
nonconforming wafers produced as
Example 4
That is, about 0.035 percent [350 parts per million (ppm)] of the wafers produced
will be outside of the specifications.
Another way to express process capability is in terms of the process capability ratio
(PCR) Cp (See Process Capability Slides for details)
Example 4
Example 4
Example 4
CONTROL CHARTS FOR INDIVIDUAL UNITS
MR- Chart
• For some situations in which the rate of production is
low, it is not feasible for a sample size to be greater
than 1.
• Additionally, if the testing process is destructive and the
cost of the item is expensive, the sample size might be
chosen to be 1.
• Furthermore, if every manufactured unit from a process
is inspected, the sample size is essentially 1.
• Service applications in marketing and accounting often
have a sample size of 1.
CONTROL CHARTS FOR INDIVIDUAL UNITS
Solution
Note that there are 19 moving-range values for 20 observations. The average of
the moving ranges is
Example 5
Example 5