74VHCT08A: Quad 2-Input and Gate
74VHCT08A: Quad 2-Input and Gate
74VHCT08A: Quad 2-Input and Gate
TRUTH TABLE
A B Y
L L L
L H L
H L L
H H H
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74VHCT08A
DC SPECIFICATIONS
Symb ol Parameter T est Cond ition s Value Un it
V CC T A = 25 o C -40 to 85 o C
(V) Min. Typ . Max. Min . Max.
VIH High Level Input 4.5 to 5.5 2 2 V
Voltage
VIL Low Level Input 4.5 to 5.5 0.8 0.8 V
Voltage
VOH High Level Output 4.5 I O =-50 µA 4.4 4.5 4.4
V
Voltage 4.5 IO=-8 mA 3.94 3.8
VOL Low Level Output 4.5 I O=50 µA 0.0 0.1 0.1
V
Voltage 4.5 IO=8 mA 0.36 0.44
II Input Leakage Current 0 to 5.5 VI = 5.5V or GND ±0.1 ±1.0 µA
ICC Quiescent Supply 5.5 VI = VCC or GND 2 20 µA
Current
∆ICC Additional Worst Case 5.5 One Input at 3.4V, 1.35 1.5 mA
Supply Current other input at VCC or
GND
IOPD Output Leakage 0 VOUT = 5.5V 0.5 5.0 µA
Current
CAPACITIVE CHARACTERISTICS
Symb ol Parameter T est Cond ition s Value Un it
T A = 25 o C -40 to 85 o C
Min. Typ . Max. Min . Max.
C IN Input Capacitance 4 10 10 pF
CPD Power Dissipation 14 pF
Capacitance (note 1)
1) CPD isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
Test Circuit).Average operating current can be obtained by the following equation. ICC(opr) = CPD • VCC • fIN + ICC/4 (per Gate)
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74VHCT08A
TEST CIRCUIT
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74VHCT08A
mm inch
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 1.75 0.068
a1 0.1 0.2 0.003 0.007
a2 1.65 0.064
b 0.35 0.46 0.013 0.018
b1 0.19 0.25 0.007 0.010
C 0.5 0.019
c1 45 (typ.)
D 8.55 8.75 0.336 0.344
E 5.8 6.2 0.228 0.244
e 1.27 0.050
e3 7.62 0.300
F 3.8 4.0 0.149 0.157
G 4.6 5.3 0.181 0.208
L 0.5 1.27 0.019 0.050
M 0.68 0.026
S 8 (max.)
P013G
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74VHCT08A
mm inch
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 1.1 0.433
K 0o 4o 8o 0o 4o 8o
A A2
K L
A1 b e
c E
E1
PIN 1 IDENTIFICATION
1
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74VHCT08A
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