Chapter 1 - Crystal Structure of Solids
Chapter 1 - Crystal Structure of Solids
Chapter 1 - Crystal Structure of Solids
Si
TAN SinTee
+6010-4281 371
tansintee@ upm.edu.my
Learning Objectives
Student able :
1. To discuss the classification of solids and unit cell.
2. To solve the crystal analysis in Cubic System.
3. To describe the diamond crystal structure.
4. To state the growth method of single crystal semiconductor
materials.
Semiconductor Materials
“Semiconductor materials having the conductivity between the metals and insulator. “
Electrical properties
Group Group
III IV
Group
II
1 Elemental
2 Si 1
GaAs Compound (Binary)
Classification of Semiconductor Materials
2 Ge Germanium
Compound Semiconductor Semiconductor with two elemental compound.
GaAs Gallium Arsenide Good optical properties and used in high speed devices.
InP Indium Posphide
Light
Light
GaN Photodetector
Type of Solids
Atomic Arrangement in Solid
Grain Boundry
Grain
Amorphous
3 Polycrystalline
Single Crystal
Ordered Region = The spatial volume where atom or molecule have a regular geometric arrangement
• Single crystalline material posses a higher electrical conductivity than the non-single crystal sample.
• Grain boundary tends to degrade the electrical characteristic via carrier recombination.
Space Lattices
Periodic arrangements
of atoms in a crystal.
Note:
The atomic arrangement of the atoms
determine the macro symmetry and
properties of the crystal. The example of
macro properties is conductivity or viscosity.
Silicon Solid: Electrical Conductivity
2 dimensional lattice
Unit Cell= Small volume of the crystal that can used to reproduce the entire crystal
Example:
A
C
Characteristic of
Cubic System
Crystal Analysis
Volume Density
Surface Density
Crystal Analysis
# Practice 1:
**Calculate the
(i) Surface density at (100) plane and (Ans= 11.89 atom/nm2 )
(ii) volume density of simple cubic system. (Ans= 41.00 atom/nm3 )
Given a = 0.29 nm
Crystal Plane
• Semiconductor devices is fabricated from the near surface.
• Surface properties of a crystal may influence the device characteristic
• The surface and the intercept plane in the crystal can be denoted from (h k l ) Miller Indices.
Sketch the
(i) (101) plane and
(ii) [111] direction in the Simple Cubic system.
Diamond Structure in Elemental Semiconductor
1 Element
• Lattice constant, a = 5.431 Å Unit cell: a/2
• Coordinate number = 8 Tetrahedral
• Atom inside the cells = 4 structure
• Atom on the plane = 6
• Atom at the edge = 8
a3 = (nM / NAρ)
Properties of Semiconductor GaAs
1.High electron mobility and saturated drift velocity, which
enables high frequency transistors operating above 250 GHz.
2.Direct bandgap which leads to efficient emission of light in LED
application.
3.Wide bandgap (1.42 eV as compared to 1.12 eV for Si) makes
GaAs more radiation hard and less susceptible to thermal effects.
4.Low parasitic capacitance and inductance.
Application of Semiconductor GaAs
LED
Opamp
High Temperature
Power Electronic
Growth of Semiconductor Materials
Czochralski
2
Epitaxial Growth
Metal Solidification
MBE
MOCVD
Liquid phase epitaxy
Czochralski Method
• Vacancy atoms
• Interstitial atoms Point defects
• Substitutional atoms
Vacancy
distortion
of planes
• Self-Interstitials:
-"extra" atoms positioned between atomic sites.
self-
interstitial
distortion
of planes
Crystalline Defects: Self-interstitial
An atom from the
crystal that is
crowded into an
interstitial site
Interstitial
Impurity: : an
impurity atom
present in the
interstitial site
Substitution and Interstitial Impurity
“Bubble Raft” Experiment:
Experimental:
Bubbling air through the soup solution and controlled the bubble size using an air
pump connected to a hollow needle.
Objective:
Identify point defect and line defect that analogous to crystal defect.
Substitution and Interstitial Impurity
“Bubble Raft” Experiment:
Substitution and Interstitial Impurity
• Two outcomes if impurity (B) added to host (A):
OR
Extra or missing
half plane of atoms
Dislocations: Line Defects
• Bragg Rules:
Crystallinity = kλ / β cos θ
where λ = 0.1542 nm
β =FWHM At specific peaks
k=Boltzmann constant
Defect Identification (ctnd…)
Bragg RULE:
nλ = 2 d sin θ
d = nλ /2 sin θ
Crystallinity = kλ / β cos θ