YBCO/manganite Layered Structures On NdGaO3 Substrates

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YBCO/manganite layered structures on NdGaO3 substrates

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2006 J. Phys.: Conf. Ser. 43 329

(http://iopscience.iop.org/1742-6596/43/1/082)

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Institute of Physics Publishing Journal of Physics: Conference Series 43 (2006) 329–332
doi:10.1088/1742-6596/43/1/082 7th European Conference on Applied Superconductivity

YBCO/manganite layered structures on NdGaO3 substrates

T Nurgaliev1*, B Blagoev1, T Donchev1, S Miteva1, P B Mozhaev2, J E Mozhaeva2,


3 3 4
G A Ovsyannikov , I M Kotelyanskii , C Jacobsen
1
Institute of Electronics BAS, 72 Tsarigradsko Chaussee, 1784 Sofia Bulgaria
2
Institute of Physics and Technology RAS, Nakhimovsky ave. 36, 117218 Moscow,
Russia
3
Institute of Radio Engineering and Electronics RAS, Mokhovaya st.11, 103907
Moscow, Russia
4
Technical University of Denmark, Building 307-309, DK-2800, Kgs.Lyngby,
Denmark

*timur@ie.bas.bg

Abstract. Results of deposition of YBa2Cu3O7-x/CeO2/( La0.7Ca0.3MnO3 or La0.7Sr0.3MnO3)


structures on the standard oriented and tilted ( = 8°) NdGaO3 substrates and results of
investigation of electrical parameters of YBa2Cu3O7-x (YBCO) films in such structures are
presented. The YBCO component of the structure exhibits lower value of the critical
parameters in comparison with those of single YBCO films. The contribution of the magnetic
layer to the microwave losses of the YBCO film in the layered structure is evaluated.

1. Introduction

High temperature superconducting (HTS) YBa2Cu3O7-x (YBCO) and magnetic La0.7Ca0.3MnO3 (LCMO)
La0.7Sr0.3MnO3 (LSMO) are oxide materials, which are characterized by compatible crystalline
structures and original physical properties [1,2]. Multilayers of HTS YBCO and magnetic manganese
LCMO and LSMO oxides have recently attracted much attention because of their specific physical
characteristics originating from the individual layers and the interlayer interaction. Fabrication and
investigation of multilayer structures is a complex procedure and the experiments were made mainly
for the cases of standard substrates and low frequency region [3,4].
In this paper we report results of deposition of YBCO/CeO2/(LCMO or LSMO) structures on
standard oriented and tilted NdGaO3 substrates and investigation of main electrical characteristics of
the YBCO film in these structures.

2. Experimental

Bottom La0.7Ca0.3MnO3 (or La0.7Sr0.3MnO3) films with a thickness ~240 nm were deposited on NdGaO3
substrates (5-mm x 5-mm x 0.5 mm) using RF magnetron sputtering technique in off-axis geometry.
The substrate surface was tilted (around the [001] axis) from the (110) plane of NdGaO3 crystal and
one of the substrate edges was perpendicular to the tilt axis. A ~100 nm thick CeO2 buffer layer was
deposited on the top of the LCMO (or LSMO) film and an YBCO film with the thickness of ~560 nm
was grown on this buffer layer by laser ablation technique. Sample 1 consisted of

© 2006 IOP Publishing Ltd 329


330

YBCO/CeO2/LCMO structure grown on standard NdGaO3 substrate and samples 2, 3 consisted of


YBCO/CeO2/LSMO and YBCO/CeO2/LCMO structures grown on tilted ( = 8°, is the tilt angle)
NdGaO3 substrates, respectively. A single layer YBCO film (sample 4) was grown on a standard
NdGaO3 substrate as well. The edge areas of the top superconducting films were removed before the
measurements, so the dimensions of YBCO film component were 4-mm x 4-mm in all samples.
The YBCO film resistance for directions, parallel and perpendicular to the step edges of the tilted
substrates (L- and T- directions, respectively), was measured at 295 K by four - probe method. Critical
temperature TC and critical current density JC were determined from investigation of AC screening
properties of the samples placed between small drive and receive coils. Magnetic moment of the
samples films was measured in magnetic field applied perpendicularly to the film surface. Effective
surface resistance RS was determined at ~8 GHz from measurements of the quality factor of a test
microstrip resonator, containing a copper ground plane, a LaAlO3 dielectric spacer and the test film,
which served as a microstrip electrode. The films were measured twice when the microwave current
direction were parallel to the L- and T- directions of the sample [5], and effective values RSL, RST of the
surface resistance were determined for these two directions. Measurements were performed at 77 K.

3. Results and Discussion


Temperature dependences of receive coil signal, which reflects AC screening ability of the layered
structures, are shown in figure 1. It should be noted, that a contribution of LCMO (or LSMO) films to
the screening ability of the structure is small (because of small thickness of the magnetic films and
because of the fact that their magnetic moments are oriented parallel to the film surface). Therefore the
dependences presented in figure 1 describe the screening properties of YBCO films in the structure.
The critical temperatures TC of these films are close to those of the standard YBCO films, although a
small second step of the superconductive transition is observed at lower temperatures.

Figure 1. Temperature dependences of AC Figure 2. Hysteresis loops of samples 1-3


responses of layered structures 1-3 (curves (curves 1-3, respectively) measured in
1-3, respectively) measured at 77 K. perpendicular magnetic field at 77 K.

Dependences of the magnetic moments of the samples on the external magnetic field H (or hysteresis
loops) measured at 77 K in a perpendicular geometry, are presented in figures 2 and 3. The magnetic
moment is due to the screening current flowing in the YBCO film. According to the estimations, the
perpendicular component of the magnetic moment of LCMO and LSMO films at μ0H< 15 mT is small
-7 2
(<10 A m ) and does not affect noticeably the behaviour of the hysteresis loops. Critical current
5 2
densities calculated from the magnetic moments were JC~ 10 A/cm at H=0 for samples 1-3 and
331

Figure 3. Hysteresis loop of a single YBCO Figure 4. Dependence of the surface


layer (sample 4) deposited on a standard resistance of a layered structure on the
NdGaO3 substrate, T = 77 K. magnetic layer thickness, calculated from
formula (1).
5 2
JC~ 7 10 A/cm for the single YBCO film (Fig.3). There was some difference between the values of
JC obtained from the screening data: JC was higher for sample 3 (YBCO/CeO2/LCMO) and lower for
sample 2 (YBCO/CeO2/LSMO) prepared on tilted substrates. In fact, such a difference between the
electrical characteristics of the samples can be seen in Fig.1 as well, and the sample 3, which is
characterized with higher TC, can be considered as the best one.
Normal state resistances RL,T of YBCO films measured at 295 K were smaller for L- direction: RL =
6.9 •,, RT =7.9 • (sample 2) and RL =4.1 •,, RT= 4.9 • (sample 3). No anisotropy of R was observed in
sample 1 (R=3.9 •)) grown on a standard substrate. It can be assumed that the anisotropy of the top
YBCO layers was induced by the tilted substrate. Normal resistance of YBCO film is higher in sample
2 (YBCO/CeO2/LSMO) than in sample 3. This can not be explained by the magnetic layer effect
(there was not a direct electrical contact between the HTS and manganite layers in the structures) but
by the quality of the surfaces of the buffer CeO2 layers. It is well known, that the resistivity of YBCO
films significantly depends on the substrate parameters [6]. Therefore, it can be assumed, that in our
experiments the quality of CeO2 buffer deposited on LCMO was better than that of CeO2 deposited on
LSMO.
The layered structures were characterized with relatively high values of the surface resistance at 8
GHz and at T=77 K: RS=0.05 • (sample 1); RSL, RST> 0.15 • (sample 2); RSL=0.061 •,, RST=0.069 •
(sample 3). The typical values of the RS were several m• for the single YBCO films grown on NdGaO3
substrates. The surface resistance characterizes the total microwave losses of the layered structures and
includes the losses of magnetic nature and the losses caused by the microwave currents in the
magnetic and superconducting layers.
In order to estimate the contribution of a magnetic layer to the total microwave losses, the surface
impedance of our layered structure was modeled using the impedance transformation rule. For this
purpose the n-th layer was considered as a transmission line with the characteristic impedance Zn
loaded to the effective surface impedance Zen-1 of n-1 th layer. The effective surface impedance Zen of
the n-th layer is equal to the input impedance of this transmission line and can be determined using the
following formula:
Z en−1 + Z nth( jk n d n )
Z en = Z n (1)
Z n + Z en−1th( jk n d n )
where j 2 = −1 ; Z n = Z 0 ( μ rn / ε rn )1 / 2 ; k n = k 0 ( μ rnε rn )1 / 2 ; Z 0 = ( μ 0 / ε 0 )1 / 2 ; k 0 = ω (ε 0 μ 0 )1 / 2 ; μ0
and 0
are the vacuum permeability and dielectric constant; is the angular frequency; ε rn = ε rn ,
ε rn = − jσ n /(ε 0ω ) , ε rn = − jσ n /(ε 0ω ) − 1 /(ω 2 λ2ε 0 μ 0 ) are the relative dielectric constants for the
332

cases of dielectric, metal and superconductor media, respectively, the relative permeability of these
media is μ r = 1 ; μ rn = μ − ( μ a2 / μ ) [7] and ε rn = − jσ n /(ε 0ω ) in the case of a conducting
magnetic layer if the external magnetic field H is applied parallel to the layer and perpendicularly to
the microwave magnetic field; μ = 1 + ω H ω M (ω H2 − ω 2 ) −1 ; μ a = ωω M /(ω H2 − ω 2 ) ;
ω H = 2πγH + jαω ; ω M = 2πγM ; M, and are the magnetization vector, the gyromagnetic ratio
and a coefficient for the damping term in the magnetic layer, respectively; n is the normal conductivity
of the medium; is the London penetration depth; dn is the thickness of n-th layer.
Some results of calculation of the surface resistance of layered structures using above formulas are
presented in figure 4 for the single-domain state of the magnetic layer (magnetic field H is applied
parallel to the film surface). Parameters of calculations were the following: /2 =8 GHz, =0.3 μm,
RS=2.18 m , d=0.56 μm for the superconducting layer; =10, d=0.1 μm for the dielectric buffer layer;
5 -1
=0.01, =2 10 ( cm) , μ0 M=25 mT (figure 4, curves 1-3) or μ0 M=30 mT (figure 4, curves 4-6) for
the ferromagnetic layer; μ0H =5 mT (figure 4, curves 1, 4), μ0H=25 mT (figure 4, curves 3, 5) and
μ0H=50 mT (figure 4, curves 2, 6). It can be seen that a thin manganite film (d<1 μm) does not affect
significantly the surface resistance of the structures because of a low normal conductivity of this
material. Therefore it can be assumed that the microwave losses in above experimental structures are
not caused by the magnetic layer and could be reduced by further optimization of the technology of
growing of layered structures.

4. Conclusion
Layered YBCO/CeO2/LCMO and YBCO/CeO2/LSMO structures were grown on the standard oriented
and tilted ( = 8°) NdGaO3 substrates and electrical parameters of YBCO films in these structures were
investigated. The YBCO component of the structures prepared on the tilted substrates exhibited
anisotropy of the normal resistance and the microwave surface resistance. The critical parameters of
YBCO films in the layered structures were lower in comparison with those of single YBCO films. The
contribution of the magnetic layer to the microwave losses of the layered structures was evaluated.

Acknowledgments
The work was supported by INTAS grant 01-0249, by the Bulgarian Science Fund - Contract F
1503/05 and by the collaboration Programme between the Russian and Bulgarian Academies of
Sciences.

References
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[4] Przyslupski P, Komissarov I, Paszkowicz W, Dluzewski P, Minikayev R, Sawicki M 2004
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[5] Nurgaliev T, Donchev T, Mateev E, Miteva S, Mozhaev P B, Mozhaeva J E 2005 Physica C
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