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    DCP100 DS

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    Adrian Balan
    DCP-100 series probe holder delivers the measurement accuracy needed for advanced on-wafer process and device characterization. With superior guarding and shielding, the probe overcomes the performance limitations of non-coaxial needle probes. For full-triaxial current / voltage measurements using combined signal, guard and shield cables, the probe should be used with Cascade Microtech's probing systems with MicroChamber (r)

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    DCP100 DS

    Uploaded by

    Adrian Balan
    140 views2 pages
    DCP-100 series probe holder delivers the measurement accuracy needed for advanced on-wafer process and device characterization. With superior guarding and shielding, the probe overcomes the performance limitations of non-coaxial needle probes. For full-triaxial current / voltage measurements using combined signal, guard and shield cables, the probe should be used with Cascade Microtech's probing systems with MicroChamber (r)

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    DCP100_DS (1)

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    DCP-100 series probe holder delivers the measurement accuracy needed for advanced on-wafer process and device characterization. With superior guarding and shielding, the probe overcomes the performance limitations of non-coaxial needle probes. For full-triaxial current / voltage measurements using combined signal, guard and shield cables, the probe should be used with Cascade Microtech's probing systems with MicroChamber (r)

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    140 views2 pages

    DCP100 DS

    Uploaded by

    Adrian Balan
    DCP-100 series probe holder delivers the measurement accuracy needed for advanced on-wafer process and device characterization. With superior guarding and shielding, the probe overcomes the performance limitations of non-coaxial needle probes. For full-triaxial current / voltage measurements using combined signal, guard and shield cables, the probe should be used with Cascade Microtech's probing systems with MicroChamber (r)

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PDF, TXT or read online from Scribd
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    Precision DC probe holder for advanced on-wafer process and device characterization

    DCP-100
    DC Probe Holder
    The DCP-100 series probe holder delivers the measurement accuracy needed for advanced on-wafer process and device characterization, as well as reliability testing. With superior guarding and shielding, DCP-100 series probe overcomes the performance limitations of non-coaxial needle probes. For full-triaxial current/voltage measurements using combined signal, guard and shield cables, the DCP-100 probe should be used with Cascade Microtechs probing systems with MicroChamber . The MicroChamber system provides full-EMI shielding around the wafer chuck and the probes, offering a fully-shielded, guarded, dark measurement environment. The triaxial connections from DC parametric semiconductor test instruments are then extended to the probe tip.

    FeATURes AnD BeneFiTs


    Low-noise electrical performance Field-replaceable coaxial probe tips Full-electrical guarding to probe tip Ultra-low, fA-level current and fF-level capacitance measurements Tips can be easily replaced within minutes and guarantee fully-guarded measurements in fA and fF levels Enables full utilization of semiconductor parametric instrumentation performance

    Dimensions
    Single 250 in. 6.35 mm Kelvin 250 in. 6.35 mm Bottom view of single with replaceable tip

    .30 in., 7.62 mm .25 in., 6.35 mm .31 in., 7.87 mm 0.034 in. 0.86 mm Coax 1.55 in. 39.37 mm 1.69 in. 42.93 mm

    .60

    25 or 50 m choice

    Dimensions for the DCP 100 Probe Holder.

    sPeCiFiCATions

    sPeCiFiCATions
    Breakdown voltage Isolation resistance Frequency response (3 dB) Temperature range Characteristic impedance Tip material Body material Connector type >500 V >1 x 10E13 150 MHz -65C to 150C 50 Tungsten Gold plated SSMC

    oRDeRing inFoRmATion

    DCP-100
    Part number Description

    Probe holders with replaceable tips DCP-105R DCP-115R DCP-150R DCP-150GPR-50 Replaceable probe tips 107-157 107-158 107-159 Replacement tips, 1.5 m tip radius, box of 10 Replacement tips, 5 m tip radius, box of 10 Replacement tips, 0.5 m tip radius, box of 10 DC coaxial probe holder, single, replaceable tip (0.5 m radius) DC coaxial probe holder, single, replaceable tip (1.5 m radius) DC coaxial probe holder, single, replaceable tip (5.0 m radius) DC coaxial probe holder, with ground needle (50 m pitch)

    Non-replaceable dual-tip Kelvin coaxial probe tips DCP-150K-25 DCP-150K-50 DC coaxial probe, Kelvin, 25 m pitch, 5.0 m radius tip DC coaxial probe, Kelvin, 50 m pitch, 5.0 m radius tip

    Copyright 2010 Cascade Microtech, Inc. All rights reserved. Cascade Microtech and MicroChamber are registered trademarks of Cascade Microtech, Inc. All other trademarks are the property of their respective owners. Data subject to change without notice

    Cascade microtech, inc. toll free: +1-800-550-3279 phone: +1-503-601-1000 email: cmi_sales@cmicro.com Cascade microtech gmbH phone: +49-89-9090195-0 email: cmg_sales@cmicro.com

    Cascade microtech Japan phone: +81-3-5615-5150 email: cmj_sales@cmicro.com Cascade microtech shanghai phone: +86-21-3330-3188 email: cmc_sales@cmicro.com

    Cascade microtech singapore phone: +65-6873-7482 email: cms_sales@cmicro.com Cascade microtech Taiwan phone: +886-3-5722810 email: cmt_sales@cmicro.com

    DCP100-SS-0810

    www.cascademicrotech.com

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