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- SRAS (spatially resolved acoustic spectroscopy) a non-destructive acoustic microscopy microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure and crystallographic orientation of the material. Traditionally, the information provided by SRAS has been acquired by using diffraction techniques in electron microscopy - such as EBSD. The technique was patented in 2005, EP patent 1910815. SRAS measures the surface acoustic wave velocity across a specimen, the surface acoustic wave (SAW) velocity is in turn a function of the material state, including parameters such as crystallographic orientation, elastic constants, temperature and stress. (en)
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- SRAS FTT (en)
- SRAS waveform (en)
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- plane (en)
- An example of a SRAS time domain signal (en)
- Vector map, from combing the two velocity maps (en)
- Velocity map, waves propagating left to right (en)
- Velocity map, waves propagating top to bottom (en)
- Taking the FFT of the time-domain signal reveals the SAW velocity (en)
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- Combining orthogonal velocity maps into a vector map highlights the anisotropy of the microstructure and improves contrast between grains in this large grain Titanium 685 sample. (en)
- Calculated SAW velocities on the three principle planes of Silicon. (en)
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- SRAS Titanium 685 left to right.png (en)
- SRAS Titanium 685 top to bottom.png (en)
- SRAS Titanium 685 vector.png (en)
- SRAS time-domain signal.png (en)
- Surface acoustic wave velocity plane Si.png (en)
- Fast Fourier transform of SRAS time domain signal.png (en)
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- SRAS (spatially resolved acoustic spectroscopy) a non-destructive acoustic microscopy microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide information about the structure and crystallographic orientation of the material. Traditionally, the information provided by SRAS has been acquired by using diffraction techniques in electron microscopy - such as EBSD. The technique was patented in 2005, EP patent 1910815. (en)
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