"A simple Bayes analysis of Weibull Based Accelerated Test model."

Rijji Sen, Rakesh Ranjan, Satyanshu K. Upadhyay (2017)

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DOI: 10.1007/S13198-015-0389-8

access: closed

type: Journal Article

metadata version: 2024-10-06

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Rijji Sen, Rakesh Ranjan, Satyanshu K. Upadhyay:
A simple Bayes analysis of Weibull Based Accelerated Test model. Int. J. Syst. Assur. Eng. Manag. 8(1s): 505-511 (2017)

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