"Analog Circuit Faulty Parameter Identification Based on Two-Objective ..."

Chenglin Yang (2021)

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DOI: 10.1109/TIM.2020.3034125

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type: Journal Article

metadata version: 2021-02-11

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Chenglin Yang:
Analog Circuit Faulty Parameter Identification Based on Two-Objective Evolutionary Algorithm. IEEE Trans. Instrum. Meas. 70: 1-11 (2021)

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