Ingaas Kird0005e
Ingaas Kird0005e
Ingaas Kird0005e
InGaAs Photodiodes
Near infrared detectors with low noise and superb frequency characteristics
InGaAs Photodiodes
Near infrared detectors with low noise and superb frequency
characteristics
Based on unique, in-house compound semiconductor process technology, Hamamatsu has designed and
developed advanced InGaAs photodiodes that feature high speed, high sensitivity, and low noise over a spec-
tral range from 0.5 μm to 2.6 μm. InGaAs photodiodes are used in a wide variety of applications ranging from
optical communications to chemical analysis and measurement fields. Hamamatsu provides a wide range of
products in different packages including metal, ceramic and surface mount packages as well as linear and area
We also manufacture custom products to meet your specific requirements. Please feel free to contact us.
Selection guide · · · · · · · · · · · · · · · · · · · · · · · · · · · · 3
· Spectral response range · · · · · · · · · · · · · · · · · · · · 3
· Response speed · · · · · · · · · · · · · · · · · · · · · · · · · · 5
· Packages · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 6
· Application examples · · · · · · · · · · · · · · · · · · · · · · · 7
Hamamatsu provides a wide lineup of InGaAs photodiodes with different spectral response characteristics ranging from 0.5 μm to 2.6 μm.
1.0
Long wavelength
0.8 type InGaAs (to 1.9 μm)
Si photodiode
0.6 S1337-BR type
0.4
Standard
0.2 type InGaAs
0
0 0.5 1.0 1.5 2.0 2.5 3.0
1.0
wavelength
type InGaAs
0.8 (to 1.9 μm)
0.6
0.4
Long wavelength
0.2
type InGaAs
(to 2.1 μm)
0
0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8
G12430 series
(1.31 μm)
ROSA G12072-54 11
Non-cooled type (0.9 to 1.9 μm)
InGaAs APD
Spectral response range (μm)
Type Type no. Page
0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8
APD G8931 series 12 Non-cooled type (0.95 to 1.7 μm)
InGaAs photodiodes 4
Response speed
G14006-512DE 512 ch
*1: When the integration time is set to the minimum value. *2: When two video lines are used for readout, the line rate is equal to that for 256 channels.
G13441-01 192 × 96 ch
Packages
G11193 series 5
G8941 series 10 6
G7150/G7151-16 9
Array 10
G8909-01 10
G12430 series 11
ROSA G12072-54 11 12
InGaAs APD
Metal
Surface
Type Type no. Page Non-cooled One-stage Two-stage Ceramic mount type
type TE-cooled type TE-cooled type
APD G8931 series 12 13
G11508 series 15
Standard type 13
G10768 series 16
G11608 series 17
G11135 series 13 18
G12230-512WB 14 15
G12460-0606S 21
G13393 series 23
G13441-01 23
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16
17 18 19 20 21 22 23
InGaAs photodiodes 6
Application examples
InGaAs APD
Radiation Moisture Gas Spectro- Laser DWDM Optical Optical Distance
Type Type no. Page thermometer meter analysis photometry monitor monitor power communication measurement
meter
APD G8931 series 12 O O
7 InGaAs photodiodes
Selection guide
Application examples of InGaAs photodiodes
Optical fiber
InGaAs PIN
photodiode
InGaAs PIN photodiode detects the temperature at the bottom InGaAs PIN photodiode is used to detect the level of near infra-
of a frying pan. red light passing through an optical fiber, etc.
Mini-spectrometer Rangefinder
InGaAs APD
Focusing lens
Entrance slit
KIRDC0097EA KIRDC0098EA
InGaAs linear image sensor is used in some of our mini-spec- InGaAs APD detects the distance to an object with high speed
trometers. and accuracy.
CCD
InGaAs linear
image sensor InGaAs area
image senser
Light source
Light source
Spectroscopy imaging
Spray nozzle
Grain sorters irradiate light onto the falling grains and detect the A hyperspectral image of the ground environment is to be ob-
transmitted light to sort out unwanted grains from good ones. tained by using an InGaAs area image sensor from a helicopter,
(InGaAs linear image sensor detects near infrared light, and etc.
CCD detects visible light.)
InGaAs photodiodes 8
InGaAs PIN photodiodes, InGaAs APD
The G10899 series is an InGaAs PIN photodiode that covers a wide spectral response range from 0.5 μm to 1.7 μm. While stan-
dard InGaAs PIN photodiodes have spectral response ranging from 0.9 μm to 1.7 μm, the G10899 series has sensitivity extend-
ing to 0.5 μm on the shorter wavelength side. A wide spectral range can be detected with a single detector.
Features Applications
Wide spectral response range Spectrophotometry
Low noise, low dark current Radiation thermometers
Large photosensitive area available
(Typ. Ta=25 °C)
InGaAs PIN photodiodes have large shunt resistance and low noise. A wide variety of packages are available including highly re-
liable metal types and surface mount types.
Features Applications
Low noise, low dark current Laser monitor
Various photosensitive areas available Optical measurement instruments
Optical communications
Metal package (Typ.)
Spectral Peak sensitivity Photosensitivity Dark current Cutoff
Cooling Photosensitive response range wavelength S ID frequency Option
Type no. (measurement area Package Photo
condition) λ λp λ=λp VR=1 V fc (sold separately)
(mm) (μm) (μm) (A/W) (nA) (MHz)
G12180-003A ϕ0.3 0.1*1 600 (VR=5 V)
G12180-005A ϕ0.5 0.15*1 200 (VR=5 V) TO-18
G12180-010A ϕ1 0.8*1 60 (VR=5 V)
G12180-020A ϕ2 1.5 13 (VR=1 V)
TO-5
G12180-030A ϕ3 2.5 7 (VR=1 V)
G12180-050A Non-cooled ϕ5 5 3 (VR=1 V) TO-8
0.9 to 1.7 C4159-03
(Ta=25 °C)
G8370-81*3 ϕ1 1 35 (VR=1 V) TO-18
G8370-82*3 ϕ2 5 4 (VR=1 V)
TO-5
G8370-83*3 ϕ3 1.1 15 2 (VR=1 V)
1.55
G8370-85*3 ϕ5 25*4 0.6 (VR=0 V) TO-8
G12180-110A ϕ1 0.02 40 (VR=1 V)
G12180-120A One-stage ϕ2 0.1 13 (VR=1 V) C4159-03
TE-cooled 0.9 to1.67 A3179
G12180-130A (Tchip*2=-10 °C) ϕ3 0.15 7 (VR=1 V) C1103-04
G12180-150A ϕ5 0.33 3 (VR=1 V)
TO-8
G12180-210A ϕ1 0.01 40 (VR=1 V)
G12180-220A Two-stage ϕ2 0.04 13 (VR=1 V) C4159-03
TE-cooled 0.9 to 1.65 A3179-01
G12180-230A (Tchip=-20 °C) ϕ3 0.07 7 (VR=1 V) C1103-04
G12180-250A ϕ5 0.15 3 (VR=1 V)
Non-cooled 0.08*1 TO-18
G6854-01 (Ta=25 °C) ϕ0.08 0.9 to 1.7 0.95 2000 (VR=5 V) with CD lens -
*1: VR=5 V *2: Element temperature *3: Low PDL (polarization dependence loss) type *4: VR=0.1 V
9 InGaAs photodiodes
Ceramic package (Typ. Ta=25 °C)
Cutoff
Photosensitive Spectral Peak sensitivity Photosensitivity Dark current frequency
Type no. area response range wavelength S ID fc Package Photo
λ λp λ=λp VR=5 V VR=5 V
(mm) (μm) (μm) (A/W) (nA) (MHz)
200 0.1
G8370-10 ϕ10 0.95 (VR=10 mV) (VR=0 V) -
G8941-01 ϕ1 1 35
Surface
mount
G8941-02 ϕ0.5 0.9 to 1.7 0.95 0.5 200 type
(unsealed)
G8941-03 ϕ0.3 0.3 400
G6849 ϕ2 0.5
30
(quadrant) (VR=1 V)
TO-5
G6849-01 ϕ1 0.15
120
(quadrant) (VR=1 V)
InGaAs photodiodes 10
ROSA (Typ. Ta=25 °C, Vcc=3.3 V, unless otherwise noted)
Minimum Maximum Optical
Wavelength Responsivity receivable receivable Trans- return loss
Type no. band R Data rate sensitivity sensitivity impedance ORL Photo
Pmin Pmax Tz min.
(μm) (A/W) (Gbps) (dBm) (dBm) (kΩ) (dB)
2.25
G12072-54 1.31 0.8 8.5 to 11.3 -19.5 +5 12
(single end)
Pigtail/receptacle type (InGaAs PIN photodiodes with preamp) (Typ. Ta=25 °C, Vcc=3.3 V, unless otherwise noted)
Minimum Maximum Optical return
Photosensitivity Cutoff receivable receivable Trans- loss
Type no. S frequency sensitivity sensitivity impedance ORL Package Photo
fc Pmin Pmax Tz min.
(V/mW) (GHz) (dBm) (dBm) (kΩ) (dB)
FC board
G9821-22 receptacle
12
FC panel
G9821-32 receptacle
1.8
1.5 2.1 -25.5 +1 min. (single end) Pigtail
G9822-11 coaxial SC
27
Pigtail
G9822-12 coaxial FC
Pigtail/receptacle type (InGaAs PIN photodiodes) (Typ. Ta=25 °C, unless otherwise noted)
Spectral response Peak sensitivity Photosensitivity Dark current Cutoff frequency
range wavelength S ID fc
Type no. Package Photo
λ λp λ=1.55 μm VR=5 V VR=5 V
(μm) (μm) (A/W) (pA) (GHz)
These are InGaAs PIN photodiodes whose spectral response range extends up to 2.6 μm. Three groups are available with differ-
ent peak sensitivity wavelengths of 1.75 μm, 1.95 μm, and 2.3 μm. Thermoelectrically cooled, low noise types are also available.
These are InGaAs APDs designed for distance measurement, FSO, low-light-detection, and optical communication, etc. The
G8931-20 of large photosensitive area ϕ0.2 mm is also available.
(Typ. Ta=25 °C)
Spectral Peak Photosensitivity Cutoff
Photosensitive response sensitivity S Dark current frequency
Type no. Cooling area range wavelength λ=1.55 μm ID fc Package Photo
λ λp M=1 VR=VBR × 0.9 M=10
(mm) (μm) (μm) (A/W) (nA) (GHz)
G8931-04 ϕ0.04 40 4
G8931-10 Non-cooled ϕ0.1 0.95 to 1.7 1.55 0.9 90 1.5 TO-18
G8931-20 ϕ0.2 150 0.9
InGaAs photodiodes 12
InGaAs image sensors
InGaAs linear image sensors are comprised of an InGaAs photodiode array with high sensitivity in the near infrared region,
charge amplifier arrays, an offset compensation circuit, a shift register, and a timing generator. The signal from each pixel is read
out in charge integration mode. The G11135/G11620/G12230 series use a back-illuminated structure to allow signal readout from
a single video line.
Spectral response range
G11608-256DA 50 256 ±1
Non-cooled 12.8 × 0.5 0.5 to 1.7 1.0 1 -
(Ta=25 °C)
G11608-512DA 25 512 ±0.5
13 InGaAs photodiodes
Spectral Photo-
Pixel Photosensitive response sensitivity Dark current Defective Applicable
Type no. Cooling pitch Number area range S ID pixels Photo driver circuit
of pixels λ λ=λp Ta=25 °C max. (sold separately)
(μm) (mm × mm) (μm) (A/W) (pA) (%)
G11620-256SA One-stage 50 256
TE-cooled 12.8 × 0.5 0.95 to 1.67 0.82 ±0.5 1 -
G11620-512SA (Tchip=-10 °C) 25 512
Two-stage 0.95 to 1.65*1 0.82*1 ±0.2*1
G12230-512WB TE-cooled 25 512 12.8 × 0.25 2 -
(Tchip=-20 °C) 1.4 to 2.15*2 1.0*2 5*2
*1: 1 to 254 ch (Tchip=-20 °C) *2: 259 to 512 ch (Tchip=-20 °C)
G11478-256WB 50 256 5
0.9 to 2.55 1.3 ±100
G11478-512WB 25 512 4
InGaAs area image sensors have a hybrid structure consisting of a CMOS readout circuit (ROIC: readout integrated circuit) and
a back-illuminated type InGaAs photodiode area array.
(Typ. unless otherwise noted)
Spectral Photo-
Cooling Pixel Number Photosensitive response sensitivity Dark current Defective Applicable
Type no. (measurement pitch of area range S ID pixels Photo driver circuit
condition) pixels λ λ=λp max. (sold separately)
(μm) (mm × mm) (μm) (A/W) (pA) (%)
One-stage
G11097-0606S TE-cooled 2
0.95 to 1.7 0.8 (Tchip=25 °C)
(Tchip=25 °C)
50 64 × 64 3.2 × 3.2 1 C11512
One-stage
G12460-0606S TE-cooled 8
1.12 to 1.9 1.1 (Tchip=0 °C)
(Tchip=0 °C)
Two-stage
G13393-0808W TE-cooled 20 320 × 256 6.40 × 5.12 0.95 to 1.7 0.5
0.8 (Tchip=15 °C)
(Tchip=15 °C)
0.37
G13393-0909W 640 × 512 12.8 × 10.24 -
Two-stage 30
G13441-01 TE-cooled 50 192 × 96 9.6 × 4.8 1.3 to 2.15 1 1
(Tchip=-20 °C)
(Tchip=-20 °C)
InGaAs photodiodes 14
Related products
Two-color detectors
Two-color detectors use a combination of two light sensors with different spectral response, in which one sensor is mounted
over the other sensor along the same optical axis to provide a broad spectral response range. As the combination of two light
sensors, an infrared-transmitting Si photodiode and an InGaAs PIN photodiode (standard type or long wavelength type) or an in-
frared-transmitting InGaAs PIN photodiode (standard type) and an InGaAs PIN photodiode (long wavelength type) are available.
Thermoelectrically cooled two-color detectors are also provided that cool the sensors to maintain their temperatures constant,
allowing high precision measurement with an improved S/N.
Features Applications
Wide spectral response range Spectrophotometers
Simultaneously detects light of multiple Radiation thermometer
wavelengths in the same optical path Flame monitor
High S/N (One-stage TE-cooled type) Laser monitor
(Typ.)
Spectral Peak Photo- Cutoff frequency
Cooling Photosensitive response sensitivity sensitivity fc Option
Type no. (measurement Detector area range wavelength S VR=0 V Package Photo (sold
condition) λ λp λ=λp RL=1 kΩ separately)
(mm) (μm) (μm) (A/W) (MHz)
Si 2.4 × 2.4 0.94 0.45 1.75
K1713-05 0.32 to 1.7
InGaAs ϕ0.5 1.55 0.55 200
Si 2.4 × 2.4 0.94 0.45 1.75 C9329
K1713-08 0.32 to 2.6
InGaAs ϕ1 2.3 0.60 6*1 C4159-03
Non-cooled Si 2.4 × 2.4 0.94 0.45 1.75
K1713-09 (Ta=25 °C) 0.32 to 1.7 TO-5
InGaAs ϕ1 1.55 0.55 50
InGaAs 2.4 × 2.4 1.55 0.95 2* 1
K11908-010K 0.9 to 2.55
InGaAs ϕ1 2.1 1.0 6*1
C4159-03
InGaAs 2.4 × 2.4 1.55 0.95 2
K13085-010K 0.9 to 1.85
InGaAs ϕ1 1.75 0.8 10
Si 2.4 × 2.4 0.94 0.45 1.75
K3413-05 0.32 to 1.67
InGaAs ϕ0.5 1.55 0.55 200 C9329
One-stage Si 2.4 × 2.4 0.94 0.45 1.75
TE-cooled C4159-03
K3413-08 0.32 to 2.57 TO-8
(Tchip=-10 °C) InGaAs ϕ1 2.3 0.60 15 A3179-03
Si 2.4 × 2.4 0.94 0.45 1.75 C1103-04
K3413-09 0.32 to 1.67
InGaAs ϕ1 1.55 0.55 50
Si 2.4 × 2.4 0.96 0.45 2*1
K12728-010K 0.32 to 1.65 -
Non-cooled InGaAs ϕ1 1.55 0.55 10*1
(Ta=25 °C) Ceramic
InGaAs 2.4 × 2.4 1.55 0.95 2*1
K12729-010K 0.9 to 2.55 1 -
InGaAs ϕ1 2.1 1.0 6*
*1: VR=0 V, RL=50 Ω
15 InGaAs photodiodes
Infrared detector modules with preamps
These are infrared detector modules using an InGaAs PIN photodiode and a preamp integrated into a compact case. Thermo-
electrically cooled types and liquid nitrogen cooled types are provided for applications requiring low noise. Custom products are
also available with different spectral response ranges, time response characteristics, and gains.
Features Applications
Easy to use Various infrared detections
Just connecting it to a DC power supply provides a voltage
output that varies with the incident light level.
Compact size
Low noise, high sensitivity (TE-cooled type, liquid nitrogen
cooled type)
(Typ.)
Cutoff Peak sensitivity Photosensitivity
Cooling Photosensitive wavelength wavelength S
Type no. Detector (measurement area Photo
condition) λc λp λ=λp
(mm) (μm) (μm) (V/W)
Non-cooled
G6121 G8370-05 ϕ5 1.7 1.55 1 × 106
(Ta=25 °C)
InGaAs photodiodes 16
Options
A variety of options are provided to facilitate using InGaAs photodiodes.
Connection example
*1
Power supply (±15 V)
POWER
OUT
*2 Measurement instrument
TE-cooled
detector*3
Amplifier for infrared detector
C4159-03
Heatsink for
TE-cooled Power suppy
detector (100 V, 115 V, 230 V)
A3179 series
ûC
Temperature controller
C1103-04
KIRDC0101EC
Features Accessories
Low noise Instruction manual
3 ranges switchable Power cable A4372-02
(one end with 4-pin connector for connection to amplifier and
Specification the other end unterminated, 2 m)
(Typ.)
Parameter Condition Specification Unit Photo
Applicable detector*4 *5 InGaAs -
Conversion impedance 107, 106, 105 (3 ranges switchable) V/A
Frequency response Amp only, -3 dB DC to 15 kHz -
Output impedance 50 Ω
Maximum output voltage 1 kΩ load +10 V
Output offset voltage ±5 mV
Equivalent input noise current f=1 kHz 2.5 pA/Hz1/2
Reverse voltage Can be applied from external unit -
External power supply*6 ±15 V
Current consumption ±15 max. mA
Note: A power supply is needed to use this amplifier.
*4: These amplifiers cannot operate multiple detectors.
*5: Consult us before purchasing if you want to use with a detector other than listed here.
*6: Recommended DC power supply (analog power supply): ±15 V
Current capacity: more than 1.5 times the maximum current consumption
Ripple noise: 5 mVp-p or less
17 InGaAs photodiodes
Heatsinks for TE-cooled detectors For InGaAs PIN photodiode and two-color detector
The A3179 series heatsinks are designed specifically for thermoelectrically cooled infrared detectors. When used at an ambient
temperature of 25 °C, the A3179 and A3179-03 provide a temperature difference (ΔT) of about 35 °C and the A3179-01 provides
a temperature difference (ΔT) of about 40 °C.
Features Accessories
A3179: for one-stage TE-cooled type Instruction manual
A3179-01: for two-stage TE-cooled type 4-conductor cable (no connector, 2 m): for TE-cooler and thermistor*7 *8
A3179-03: for two-color detector K3413 series Coaxial cable (2 m): for signal*7
Compact size
Note:
*7: When used in combination with the C1103-04 temperature controller, do
not use the 4-conductor cable supplied with the A3179 series, but use the
4-conductor cable A4372-05 (sold separately, with a connector).
*8: No socket is supplied for connection to infrared detectors. Connect infra-
red detectors by soldering. Cover the soldered joints and detector pins
with vinyl insulating tubes.
A3179-01
The C1103-04 is a temperature controller designed for TE-cooled infrared detectors. The C1103-04 allows temperature setting for
the TE-cooler mounted in an infrared detector.
Accessories
Instruction manual
4-conductor cable A4372-05 (with a connector, 3 m): for TE-cooler and thermistor*9
Power supply cable
Specifications
Parameter Specification Photo
Applicable detector*10 One-stage /two-stage TE-cooled InGaAs PIN photodiode
Setting element temperature -30 to +20 °C
Temperature stability within ±0.1 °C
Output current for temperature control 1.1 A min., 1.2 A typ., 1.3 A max.
Power supply 100 V ± 10% ∙ 50/60 Hz*11
Power consumption 30 W
Dimensions 107 (W) × 84 (H) × 190 (D) mm
Weight Approx. 1.9 kg
*9: When used in combination with the A3179 series heatsink, do not use an 4-conductor cable supplied with the A3179 series, but use the A4372-05 instead.
*10: This temperature controller does not support TE-cooled infrared detector modules with preamps and cannot set temperatures on two or more TE-coolers.
*11: Please specify power supply requirement (AC line voltage) from among 100 V, 115 V and 230 V when ordering.
InGaAs photodiodes 18
Multichannel detector heads For InGaAs image sensor
Multichannel detector head for InGaAs linear image sensor (G10768 series) C10854
The C10854 is a multichannel detector head designed for applications such as sorting machines and SD-OCT (spectral domain-opti-
cal coherence tomography) where high-speed response is essential. The C10854 is optimized for use with the G10768 series InGaAs
linear image sensors and controllable from a PC by using the supplied application software (DCam-CL) that runs on Windows 7 (32-bit,
64-bit) /10 (32-bit, 64-bit).
Features Applications
High-speed operation: 5 MHz Near infrared multichannel spectroscopy
Line rate: 31.25 kHz Foreign object screening
Supports CameraLink OCT (optical coherence tomography)
Multichannel detector heads for InGaAs area image sensors (G11097/G12460-0606S, G12242-0707W) C11512 series
The C11512 series is a multichannel detector head designed for the G11097/G12460-0606S, G12242-0707W InGaAs area image sen-
sors. The C11512 series supports a variety of near infrared imaging applications and is controllable from a PC by using the supplied
application software (DCam-CL) that runs on Windows 7 (32-bit, 64-bit) /10 (32-bit, 64-bit).
Features Applications
Built-in temperature control circuit Thermal imaging
[Tchip=10 °C typ. (Ta=25 °C)] Laser beam profiler
Supports CameraLink Foreign object inspection
Compact size
External trigger input
Adjustable offset and gain
Pulse output setting
19 InGaAs photodiodes
Driver circuits For InGaAs image sensor
G9494-256D
C10820 High gain setting suitable for low-level-light G9494-512D
G11620-128DA
G11620-256DF
C11513 USB 2.0 interface (USB bus power) G11620-256DA
G11620-512DA
G11135 series
C11514 Supports CameraLink G14006-512DE
A.GND 10 A.GND
Power supply
+15 V 3 +15 V
Ex: PW18-1T
NC 11 -15 V
made by
TEXIO CORPORATION
-15 V 4 +5 V
D.GND 12 D.GND
+5 V 5 +5 V
D.GND 13 D.GND
D.GND 14 D.GND
M-CLK 7 CLK
D.GND
GND
KACCC0499EB
InGaAs photodiodes 20
Description of terms
Spectral response Terminal capacitance: Ct
The relation (photoelectric sensitivity) between the incident In a photodiode, the PN junction can be considered as a
light level and resulting photocurrent differs depending on type of capacitor. This capacitance is termed the junction
the wavelength of the incident light. This relation between capacitance and is an important parameter in determining
the photoelectric sensitivity and wavelength is referred to the response speed. In current-to-voltage conversion circuits
as the spectral response characteristic and is expressed in using an op amp, the junction capacitance might cause
terms of photosensitivity or quantum efficiency. gain peaking. At HAMAMATSU, we specify the terminal
Photosensitivity: S capacitance including this junction capacitance plus the
package stray capacitance.
The ratio of photocurrent expressed in amperes (A) or output
voltage expressed in volts (V) to the incident light level expressed Rise time: tr
in watts (W). Photosensitivity is represented as an absolute The rise time is the time required for the output to rise from
sensitivity (A/W or V/W) or as a relative sensitivity (%) to the 10% to 90% of the maximum output value (steady-state
peak wavelength sensitivity normalized to 100. We usually define value) in response to input of step-function light.
the spectral response range as the range in which the relative Cutoff frequency: fc
sensitivity is higher than 5% or 10% of the peak sensitivity.
This is the measure used to evaluate the time response of
Quantum efficiency: QE high-speed PIN photodiodes to a sinewave-modulated light
This is the number of electrons or holes that can be extracted input. It is defined as the frequency at which the photodiode
as photocurrent divided by the number of incident photons. output decreases by 3 dB from the output at 100 kHz. The
It is commonly expressed in percent (%). The quantum light source used is a laser diode (1.3 μm or 1,55 μm) and the
efficiency QE and photosensitivity S (unit: A/W) have the load resistance is 50 Ω. The rise time tr has a relation with
following relationship at a given wavelength (unit: nm). the cutoff frequency fc as follows:
0.35
tr [s]=
fc [Hz]
Short circuit current: Isc
Noise equivalent power: NEP
This is the output current that flows in a photodiode when
load resistance is zero. This is called "white light sensitivity" NEP is the incident light level equivalent to the noise level of
to differentiate it from the spectral response, and is a device. In other words, it is the light level required to obtain
measured with light from a standard tungsten lamp at 2856 a signal-to-noise ratio (S/N) of 1. We define the NEP value at
K distribution temperature (color temperature). Our product the peak sensitivity wavelength (λp). Since the noise level is
catalog lists the short circuit current measured under an proportional to the square root of the frequency bandwidth,
the bandwidth is normalized to 1 Hz.
illuminance of 100 lx.
Peak sensitivity wavelength: λp
This is the wavelength at which the photosensitivity of the
detector is at maximum. Reverse voltage: VR max
A p p l y i n g a r eve r s e vo l t a g e t o a p h o t o d i o d e t r i g g e r s
Cutoff wavelength: λ c
a b r e a k d ow n a t a c e r t a i n vo l t a g e a n d c a u s e s s eve r e
This represents the long wavelength limit of spectral deterioration of the device performance. Therefore the
response and in datasheets is listed as the wavelength at absolute maximum rating is specified for reverse voltage at
which the sensitivity becomes 10% of the value at the peak the voltage somewhat lower than this breakdown voltage.
sensitivity wavelength. The reverse voltage shall not exceed the maximum rating,
Dark current: ID even instantaneously.
A small current which flows when a reverse voltage is applied
to a photodiode even in a dark state. This current is called Reference (Physical constants relating to light and opto-semiconductors)
the dark current. Noise resulting from dark current becomes
dominant when a reverse voltage is applied to photodiodes (PIN Constant Symbol Numerical value Unit
photodiodes, etc.). Electron charge q 1.602 × 10-19 C
Shunt resistance: Rsh Speed of light in vacuum c 2.998 × 108 m/s
This is the voltage/current ratio of a photodiode operated in Planck's constant h 6.626 × 10-34 J·s
the vicinity of 0 V. In our product catalog, the shunt resistance Boltzmann's constant k 1.381 × 10-23 J/K
is specified by the following equation, where the dark current Thermal energy at room kT 0.0259 (300 K) eV
(ID) is a value measured at a reverse voltage of 10 mV. temperature
Energy of 1eV eV 1.602 × 10-19 J
Wavelength equivalent to - 1240 nm
1 eV in vacuum
Noise generated from the shunt resist ance becomes 10-12
Permittivity of vacuum εo 8.854 × F/m
dominant in applications where a reverse voltage is not
Band gap energy of silicon Eg Approx. 1.12 (25 °C) eV
applied to the photodiode.
21 InGaAs photodiodes
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