KIK614441 IC Part1
KIK614441 IC Part1
KIK614441 IC Part1
Intel Pentium IV
Microprocessor
Moore's Law
In 1965, Gordon Moore
noted that the number of
transistors on a chip
doubled every 18 to 24
months.
He made a prediction that
semiconductor
technology will double its
effectiveness every 18
months
http://www.extremetech.com/extreme/203490-moores-law-is-dead-long-live-moores-law
https://humanswlord.files.wordpress.com/2014/01/moores-law-graph-gif.png
Other Device
Cell
Phone
Small
Signal RF
Power
RF
Power
Management
Analog
Baseband
Digital Baseband
(DSP + MCU)
Design Abstraction
SYSTEM
MODULE
+
GATE
CIRCUIT
DEVICE
G
S
n+
D
n+
IC Manufacture
http://www.ibtimes.co.uk/ibms-ultra-powerful-computer-chip-puts-moores-law-back-track-1510060
http://www.fullman.com/semiconductors/semiconductors.html
SEMICONDUCTORS:
Here, there, and everywhere!
the process of
holes, and filling them facilitates current
flow
n-type semiconductor
Silicon is doped with
element having a
valence of 5.
To increase the
concentration of free
electrons (n).
One example is
phosophorus, which
is a donor.
n-type semiconductor
Silicon is doped with
element having a
valence of 5.
To increase the
concentration of free
electrons (n).
One example is
phosophorus, which
is a donor.
n electron mobility
vpdrift pE
vndrift nE
E electric field
E electric field
Figure 4.1 Physical structure of the enhancement-type NMOS transistor: (a) perspective view; (b) cross-section. Typically L = 0.1 to 3
m, W = 0.2 to 100 m, and the thickness of the oxide layer (tox) is in the range of 2 to 50 nm.
Figure 4.2 The enhancement-type NMOS transistor with a positive voltage applied to the gate. An n channel is
induced at the top of the substrate beneath the gate.
Figure 4.3 An NMOS transistor with vGS > Vt and with a small vDS applied. The device acts as a resistance whose
value is determined by vGS. Specifically, the channel conductance is proportional to vGS Vt and thus iD is
proportional to (vGS Vt) vDS. Note that the depletion region is not shown (for simplicity).
Figure 4.4 The iDvDS characteristics of the MOSFET in Fig. 4.3 when the voltage applied between drain and
source, vDS, is kept small. The device operates as a linear resistor whose value is controlled by vGS.
Figure 4.6 The drain current iD versus the drain-to-source voltage vDS for an enhancement-type NMOS
transistor operated with vGS > Vt.
Figure 4.9 Cross-section of a CMOS integrated circuit. Note that the PMOS transistor is formed in a separate
n-type region, known as an n well. Another arrangement is also possible in which an n-type body is used and
the n device is formed in a p well. Not shown are the connections made to the p-type body and to the n well; the
latter functions as the body terminal for the p-channel device.
The four terminals of a Field Effect Transistor (gate, source, drain and bulk)
connect to conductors that generate a set of electric fields in the channel region
which depend on the relative voltages of each terminal.
MIT Open Course Ware 6.004 Computation Structures
The use of both NFETs and PFETs complimentary transistor types is a key
to CMOS (complementary MOS) logic families.
MIT Open Course Ware 6.004 Computation Structures
CMOS Recipe
pullup
pulldown
f (output)
On
Off
Driven 1
Off
On
Driven 0
On
On
Driven X
Off
Off
NC
CMOS Complements
NAND Gate
Current technology:= 14nm
It is composed of an array of identical pixels. Each pixel has a photodiode (a pn junction photodiode), that converts incident light into photocurrent, and an
addressing transistor that acts as a switch, as shown in Fig. 19a. A Yaddressing or scan register is used to address the sensor line by line, by
activating the in-pixel addressing transistor. An X-addressing or scan register is
used to address the pixels on one line, one after another. Some of the readout
circuits need to convert the photocurrent into electric charge or voltage and to
read it off the array.
S. M. Sze, M. K. Lee, Semiconductor Devices Physics and Technology
1. N-Well Diffusion
2. Active Area
3. Poly Gate
4. n+ Source-Drain Diffusion
5. p+ Source-Drain Diffusion
6. Contact Holes