Info - Iec61300 3 6 (Ed2.0) en
Info - Iec61300 3 6 (Ed2.0) en
Info - Iec61300 3 6 (Ed2.0) en
INTERNATIONAL IEC
STANDARD 61300-3-6
Second edition
2003-02
Part 3-6:
Examinations and measurements –
Return loss
Partie 3-6:
Examens et mesures – Puissance réfléchie
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
CONTENTS
FOREWORD .......................................................................................................................... 3
1 Scope .............................................................................................................................. 5
2 Normative references ....................................................................................................... 5
3 General description .......................................................................................................... 5
3.1 Method 1 ................................................................................................................ 6
3.2 Method 2 ................................................................................................................ 6
3.3 Method 3 ................................................................................................................ 6
3.4 Method 4 ................................................................................................................ 6
3.5 Selection of reference measurement method........................................................... 6
4 Apparatus and symbols .................................................................................................... 7
4.1 Device under test (DUT).......................................................................................... 7
4.2 Method 1: measurements with OCWR ..................................................................... 7
4.3 Method 2: measurements with OTDR ...................................................................... 9
4.4 Method 3: measurements with OLCR ...................................................................... 9
4.5 Method 4: measurements with OFDR .....................................................................11
5 Procedure .......................................................................................................................12
5.1 Launch conditions ..................................................................................................12
5.2 Pre-conditioning .....................................................................................................13
5.3 DUT output port .....................................................................................................13
5.4 Method 1: measurement with OCWR......................................................................13
5.5 Method 2: measurement with OTDR .......................................................................17
5.6 Method 3: measurement with OLCR .......................................................................20
5.7 Method 4: measurements with OFDR .....................................................................20
6 Details to be specified .....................................................................................................22
6.1 Return loss measurement with OCWR ...................................................................22
6.2 Return loss measurement with OTDR.....................................................................22
6.3 Return loss measurement with OLCR .....................................................................23
6.4 Return loss measurement of with OFDR .................................................................23
6.5 Measurement procedure ........................................................................................24
Annex A (informative) Comparison of return loss detectable by four different methods ..........25
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-6 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This second edition cancels and replaces the first edition published in 1997 and its
amendments 1 (1998) and 2 (1999). This edition constitutes a technical revision.
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 61300 consists of the following parts, under the general title Fibre optic interconnecting
devices and passive components – Basic test and measurement procedures:
The committee has decided that the contents of this publication will remain unchanged until
2007. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
1 Scope
This part of IEC 61300 presents procedures for the measurement of the return loss (RL) of
a fibre optic device under test (DUT). RL, as used in this standard, is the ratio of the power (P i )
incident on, or entering, the DUT to the total power reflected (P r ) by the DUT, expressed
in decibels:
P
RL = −10 ⋅ log r (1)
Pi
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 61300-1, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 1: General and guidance
IEC 61300-3-1, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 3-1: Examinations and measurements – Visual examination
IEC 61300-3-39, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 3-39: Examinations and measurements – PC optical connector
reference plug selection
3 General description
These four measurement methods have different characteristics and different applications in
terms of spatial resolution and detectable RL (in annex A a comparison of return loss
detectable by the four different methods is reported).