Am29F400B

4 Megabit (512 K x 8-Bit/256 K x 16-Bit)

CMOS 5.0 Volt-only Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
■ Single power supply operation ■ Embedded Algorithms
— 5.0 volt-only operation for read, erase, and — Embedded Erase algorithm automatically
program operations preprograms and erases the entire chip or any
— Minimizes system level requirements combination of designated sectors
— Embedded Program algorithm automatically
■ Manufactured on 0.32 µm process technology
writes and verifies data at specified addresses
— Compatible with 0.5 µm Am29F400 device
■ Minimum 1,000,000 program/erase cycles per
■ High performance sector guaranteed
— Access times as fast as 45 ns ■ 20-year data retention at 125°C
■ Low power consumption (typical values at — Reliable operation for the life of the system
5 MHz) ■ Package option
— 1 µA standby mode current — 48-pin TSOP
— 20 mA read current (byte mode) — 44-pin SO
— 28 mA read current (word mode) — Known Good Die (KGD)
— 30 mA program/erase current (see publication number 21258)
■ Flexible sector architecture ■ Compatibility with JEDEC standards
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and — Pinout and software compatible with single-
seven 64 Kbyte sectors (byte mode) power-supply Flash
— One 8 Kword, two 4 Kword, one 16 Kword, and — Superior inadvertent write protection
seven 32 Kword sectors (word mode)
■ Data# Polling and toggle bits
— Supports full chip erase
— Provides a software method of detecting
— Sector Protection features: program or erase operation completion
A hardware method of locking a sector to
■ Ready/Busy# pin (RY/BY#)
prevent any program or erase operations within
that sector — Provides a hardware method of detecting
program or erase cycle completion
Sectors can be locked via programming
equipment ■ Erase Suspend/Erase Resume
Temporary Sector Unprotect feature allows code — Suspends an erase operation to read data from,
changes in previously locked sectors or program data to, a sector that is not being
erased, then resumes the erase operation
■ Top or bottom boot block configurations available
■ Hardware reset pin (RESET#)
— Hardware method to reset the device to reading
array data

This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data Publication# 21505 Rev: D Amendment/+1
Sheet may be revised by subsequent versions or modifications due to changes in technical specifications. Issue Date: July 2, 1999
GENERAL DESCRIPTION
The Am29F400B is a 4 Mbit, 5.0 volt-only Flash Erase algorithm—an internal algorithm that automatically
memory organized as 524,288 bytes or 262,144 words. preprograms the array (if it is not already programmed)
The device is offered in 44-pin SO and 48-pin TSOP before executing the erase operation. During erase, the
packages. The device is also available in Known Good device automatically times the erase pulse widths and
Die (KGD) form. For more information, refer to publica- verifies proper cell margin.
tion number 21258. The word-wide data (x16) appears
The host system can detect whether a program or
on DQ15–DQ0; the byte-wide (x8) data appears on DQ7–
erase operation is complete by observing the RY/BY#
DQ0. This device is designed to be programmed in-system
pin, or by reading the DQ7 (Data# Polling) and
with the standard system 5.0 volt VCC supply. A 12.0 V VPP
DQ6/DQ2 (toggle) status bits. After a program or
is not required for write or erase operations. The device can
erase cycle has been completed, the device is ready to
also be programmed in standard EPROM programmers.
read array data or accept another command.
This device is manufactured using AMD’s 0.32 µm
The sector erase architecture allows memory sectors
process technology, and offers all the features and ben-
to be erased and reprogrammed without affecting the
efits of the Am29F400, which was manufactured using
data contents of other sectors. The device is fully
0.5 µm process technology.
erased when shipped from the factory.
The standard device offers access times of 45, 50, 55,
Hardware data protection measures include a low
70, 90, 120, and 150 ns, allowing high speed micropro-
VCC detector that automatically inhibits write opera-
cessors to operate without wait states. To eliminate bus
tions during power transitions. The hardware sector
contention the device has separate chip enable (CE#),
protection feature disables both program and erase
write enable (WE#) and output enable (OE#) controls.
operations in any combination of the sectors of memory.
The device requires only a single 5.0 volt power This can be achieved via programming equipment.
supply for both read and write functions. Internally
The Erase Suspend feature enables the user to put
generated and regulated voltages are provided for the
erase on hold for any period of time to read data from,
program and erase operations.
or program data to, any sector that is not selected for
The device is entirely command set compatible with the erasure. True background erase can thus be achieved.
JEDEC single-power-supply Flash standard. Com-
The hardware RESET# pin terminates any operation
mands are written to the command register using
in progress and resets the internal state machine to
standard microprocessor write timings. Register con-
reading array data. The RESET# pin may be tied to the
tents serve as input to an internal state-machine that
system reset circuitry. A system reset would thus also
controls the erase and programming circuitry. Write
reset the device, enabling the system microprocessor
cycles also internally latch addresses and data needed
to read the boot-up firmware from the Flash memory.
for the programming and erase operations. Reading
data out of the device is similar to reading from other The system can place the device into the standby
Flash or EPROM devices. mode. Power consumption is greatly reduced in this mode.
Device programming occurs by executing the program AMD’s Flash technology combines years of Flash
command sequence. This initiates the Embedded memory manufacturing experience to produce the
Program algorithm—an internal algorithm that auto- highest levels of quality, reliability and cost effective-
matically times the program pulse widths and verifies ness. The device electrically erases all bits within a sector
proper cell margin. simultaneously via Fowler-Nordheim tunneling. The data is
programmed using hot electron injection.
Device erasure occurs by executing the erase
command sequence. This initiates the Embedded

2 Am29F400B
PRODUCT SELECTOR GUIDE
Family Part Number Am29F400B

VCC = 5.0 V ± 5% -45 -50 -55

Speed Option
VCC = 5.0 V ± 10% -55 -70 -90 -120 -150

Max access time, ns (tACC) 45 50 55 70 90 120 150

Max CE# access time, ns (tCE) 45 50 55 70 90 120 150

Max OE# access time, ns (tOE) 30 30 30 30 35 50 55

Note: See “AC Characteristics” for full specifications.

BLOCK DIAGRAM
RY/BY# DQ0–DQ15 (A-1)
VCC
Sector Switches
VSS
Erase Voltage Input/Output
RESET# Generator Buffers

WE# State
Control
BYTE#
Command
Register
PGM Voltage
Generator
Chip Enable Data
Output Enable STB Latch
CE#
Logic
OE#

Y-Decoder Y-Gating
STB
Address Latch

VCC Detector Timer

X-Decoder Cell Matrix

A0–A17

21505D-1

Am29F400B 3
CONNECTION DIAGRAMS
This device is also available in Known Good Die (KGD) form. Refer to publication number 21258 for
more information.

A15 1 48 A16
A14 2 47 BYTE#
A13 3 46 VSS
A12 4 45 DQ15/A-1
A11 5 44 DQ7
A10 6 43 DQ14
A9 7 42 DQ6
A8 8 41 DQ13
NC 9 40 DQ5
NC 10 39 DQ12
WE# 11 48-Pin TSOP—Standard Pinout 38 DQ4
RESET# 12 37 VCC
NC 13 36 DQ11
NC 14 35 DQ3
RY/BY# 15 34 DQ10
NC 16 33 DQ2
A17 17 32 DQ9
A7 18 31 DQ1
A6 19 30 DQ8
A5 20 29 DQ0
A4 21 28 OE#
A3 22 27 VSS
A2 23 26 CE#
A1 24 25 A0

A16 1 48 A15
BYTE# 2 47 A14
VSS 3 46 A13
DQ15/A-1 4 45 A12
DQ7 5 44 A11
DQ14 6 43 A10
DQ6 7 42 A9
DQ13 8 41 A8
DQ5 9 40 NC
DQ12 10 39 NC
DQ4 11 38 WE#
VCC 12 48-Pin TSOP—Reverse Pinout 37 RESET#
DQ11 13 36 NC
DQ3 14 35 NC
DQ10 15 34 RY/BY#
DQ2 16 33 NC
DQ9 17 32 A17
DQ1 18 31 A7
DQ8 19 30 A6
DQ0 20 29 A5
OE# 21 28 A4
VSS 22 27 A3
CE# 23 26 A2
A0 24 25 A1

21505D-2

4 Am29F400B
CONNECTION DIAGRAMS
This device is also available in Known Good Die (KGD) form. Refer to publication number 21258 for
more information.

NC 1 44 RESET#
RY/BY# 2 43 WE#
A17 3 42 A8
A7 4 41 A9
A6 5 40 A10
A5 6 39 A11
A4 7 38 A12
A3 8 37 A13
A2 9 36 A14
A1 10 35 A15
A0 11 SO 34 A16
CE# 12 33 BYTE#
VSS 13 32 VSS
OE# 14 31 DQ15/A-1
DQ0 15 30 DQ7
DQ8 16 29 DQ14
DQ1 17 28 DQ6
DQ9 18 27 DQ13
DQ2 19 26 DQ5
DQ10 20 25 DQ12
DQ3 21 24 DQ4
DQ11 22 23 VCC

21505D-3

PIN CONFIGURATION LOGIC SYMBOL

A0–A17 = 18 addresses
DQ0–DQ14 = 15 data inputs/outputs
DQ15/A-1 = DQ15 (data input/output, word mode), 18
A-1 (LSB address input, byte mode) A0–A17 16 or 8

BYTE# = Selects 8-bit or 16-bit mode DQ0–DQ15

(A-1)
CE# = Chip enable
OE# = Output enable CE#
OE#
WE# = Write enable
WE#
RESET# = Hardware reset pin, active low
RESET#
RY/BY# = Ready/Busy# output
BYTE# RY/BY#
VCC = +5.0 V single power supply
(see Product Selector Guide for
device speed ratings and voltage
supply tolerances)
21505D-4
VSS = Device ground
NC = Pin not connected internally

Am29F400B 5
ORDERING INFORMATION
Standard Products
AMD standard products are available in several packages and operating ranges. The order number (Valid Combi-
nation) is formed by a combination of the elements below.

Am29F400B T -45 E C
OPTIONAL PROCESSING
Blank = Standard Processing
0 = VCC = 5.0 V ± 10%, 55 ns device only
(Contact an AMD representative for more information)

TEMPERATURE RANGE
C = Commercial (0°C to +70°C)
I = Industrial (–40°C to +85°C)
E = Extended (–55°C to +125°C)

PACKAGE TYPE
E = 48-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 048)
F = 48-Pin Thin Small Outline Package (TSOP)
Reverse Pinout (TSR048)
S = 44-Pin Small Outline Package (SO 044)
This device is also available in Known Good Die (KGD) form. See publication number
21258 for more information.

SPEED OPTION
See Product Selector Guide and Valid Combinations

BOOT CODE SECTOR ARCHITECTURE

T = Top sector
B = Bottom sector

DEVICE NUMBER/DESCRIPTION
Am29F400B
4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS Flash Memory
5.0 Volt-only Read, Program and Erase

Voltage
Valid Combinations Range Valid Combinations
Valid Combinations list configurations planned to be sup-
AM29F400BT-45,
EC, EI, FC, FI, SC, SI ported in volume for this device. Consult the local AMD sales
AM29F400BB-45,
office to confirm availability of specific valid combinations and
AM29F400BT-50, to check on newly released combinations.
5.0 V ± 5%
AM29F400BB-50 EC, EI, EE, FC, FI, FE,
AM29F400BT-55, SC, SI, SE
AM29F400BB-55

EC0, EI0, EE0, FC0,

AM29F400BT-55,
FI0, FE0, SC0, SI0,
AM29F400BB-55
SE0

AM29F400BT-70,
AM29F400BB-70

AM29F400BT-90, 5.0 V ± 10%

AM29F400BB-90 EC, EI, EE,
FC, FI, FE,
AM29F400BT-120, SC, SI, SE
AM29F400BB-120

AM29F400BT-150,
AM29F400BB-150

6 Am29F400B
DEVICE BUS OPERATIONS
This section describes the requirements and use of the the register serve as inputs to the internal state
device bus operations, which are initiated through the machine. The state machine outputs dictate the func-
internal command register. The command register tion of the device. Table 1 lists the device bus
itself does not occupy any addressable memory loca- operations, the inputs and control levels they require,
tion. The register is composed of latches that store the and the resulting output. The following subsections
commands, along with the address and data informa- describe each of these operations in further detail.
tion needed to execute the command. The contents of

Table 1. Am29F400B Device Bus Operations

DQ8–DQ15
BYTE# BYTE#
Operation CE# OE# WE# RESET# A0–A17 DQ0–DQ7 = VIH = VIL
Read L L H H AIN DOUT DOUT High-Z
Write L H L H AIN DIN DIN High-Z
VCC ± VCC ±
CMOS Standby X X X High-Z High-Z High-Z
0.5 V 0.5 V
TTL Standby H X X H X High-Z High-Z High-Z
Output Disable L H H H X High-Z High-Z High-Z
Hardware Reset X X X L X High-Z High-Z High-Z
Temporary Sector Unprotect (See Note) X X X VID AIN DIN DIN X
Legend:
L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, DIN = Data In, DOUT = Data Out, AIN = Address In
Note:See the sections onSector Group Protection and Temporary Sector Unprotect for more information.

Word/Byte Configuration remains enabled for read access until the command
register contents are altered.
The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operate in the byte or word configura- See “Reading Array Data” for more information. Refer
tion. If the BYTE# pin is set at logic ‘1’, the device is in to the AC Read Operations table for timing specifica-
word configuration, DQ15–DQ0 are active and con- tions and to Figure 9 for the timing diagram. ICC1 in the
trolled by CE# and OE#. DC Characteristics table represents the active current
specification for reading array data.
If the BYTE# pin is set at logic ‘0’, the device is in byte
configuration, and only data I/O pins DQ0–DQ7 are
Writing Commands/Command Sequences
active and controlled by CE# and OE#. The data I/O
pins DQ8–DQ14 are tri-stated, and the DQ15 pin is To write a command or command sequence (which
used as an input for the LSB (A-1) address function. includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
Requirements for Reading Array Data CE# to VIL, and OE# to VIH.
To read array data from the outputs, the system must For program operations, the BYTE# pin determines
drive the CE# and OE# pins to VIL. CE# is the power whether the device accepts program data in bytes or
control and selects the device. OE# is the output words. Refer to “Word/Byte Configuration” for more
control and gates array data to the output pins. WE# information.
should remain at V IH . The BYTE# pin determines
An erase operation can erase one sector, multiple sec-
whether the device outputs array data in words or
tors, or the entire device. Tables 2 and 3 indicate the
bytes.
address space that each sector occupies. A “sector
The internal state machine is set for reading array data address” consists of the address bits required to
upon device power-up, or after a hardware reset. This uniquely select a sector. The “Command Definitions”
ensures that no spurious alteration of the memory section has details on erasing a sector or the entire
content occurs during the power transition. No chip, or suspending/resuming the erase operation.
command is necessary in this mode to obtain array
After the system writes the autoselect command
data. Standard microprocessor read cycles that assert
sequence, the device enters the autoselect mode. The
valid addresses on the device address inputs produce
system can then read autoselect codes from the
valid data on the device data outputs. The device
Am29F400B 7
internal register (which is separate from the memory In the CMOS and TTL/NMOS-compatible DC Charac-
array) on DQ7–DQ0. Standard read cycle timings apply teristics tables, ICC3 represents the standby current
in this mode. Refer to the “Autoselect Mode” and specification.
“Autoselect Command Sequence” sections for more
information. RESET#: Hardware Reset Pin
ICC2 in the DC Characteristics table represents the The RESET# pin provides a hardware method of reset-
active current specification for the write mode. The “AC ting the device to reading array data. When the
Characteristics” section contains timing specification RESET# pin is driven low for at least a period of tRP, the
tables and timing diagrams for write operations. device immediately terminates any operation in
progress, tristates all output pins, and ignores all
Program and Erase Operation Status read/write commands for the duration of the RESET#
pulse. The device also resets the internal state
During an erase or program operation, the system may
machine to reading array data. The operation that was
check the status of the operation by reading the status
interrupted should be reinitiated once the device is
bits on DQ7–DQ0. Standard read cycle timings and ICC
ready to accept another command sequence, to
read specifications apply. Refer to “The Erase Resume
ensure data integrity.
command is valid only during the Erase Suspend
mode.” for more information, and to “AC Characteris- Current is reduced for the duration of the RESET#
tics” for timing diagrams. pulse. When RESET# is held at VIL, the device enters
the TTL standby mode; if RESET# is held at VSS±0.5
Standby Mode V, the device enters the CMOS standby mode.
When the system is not reading or writing to the device, The RESET# pin may be tied to the system reset cir-
it can place the device in the standby mode. In this cuitry. A system reset would thus also reset the Flash
mode, current consumption is greatly reduced, and the memory, enabling the system to read the boot-up firm-
outputs are placed in the high impedance state, inde- ware from the Flash memory.
pendent of the OE# input.
If RESET# is asserted during a program or erase oper-
The device enters the CMOS standby mode when the ation, the RY/BY# pin remains a “0” (busy) until the
CE# and RESET# pins are both held at VCC ± 0.5 V. internal reset operation is complete, which requires a
(Note that this is a more restricted voltage range than time of tREADY (during Embedded Algorithms). The
VIH.) The device enters the TTL standby mode when system can thus monitor RY/BY# to determine whether
CE# and RESET# pins are both held at VIH. The device the reset operation is complete. If RESET# is asserted
requires standard access time (tCE) for read access when a program or erase operation is not executing
when the device is in either of these standby modes, (RY/BY# pin is “1”), the reset operation is completed
before it is ready to read data. within a time of tREADY (not during Embedded Algo-
The device also enters the standby mode when the rithms). The system can read data t RH after the
RESET# pin is driven low. Refer to the next section, RESET# pin returns to VIH.
“RESET#: Hardware Reset Pin”. Refer to the AC Characteristics tables for RESET#
If the device is deselected during erasure or program- parameters and to Figure 10 for the timing diagram.
ming, the device draws active current until the
operation is completed. Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in the high imped-
ance state.

8 Am29F400B
 Table 2. Am29F400BT Top Boot Block Sector Address Table
Address Range (in hexadecimal)
Sector Size (x8) (x16)
Sector A17 A16 A15 A14 A13 A12 (Kbytes/ Kwords) Address Range Address Range
SA0 0 0 0 X X X 64/32 00000h–0FFFFh 00000h–07FFFh
SA1 0 0 1 X X X 64/32 10000h–1FFFFh 08000h–0FFFFh
SA2 0 1 0 X X X 64/32 20000h–2FFFFh 10000h–17FFFh
SA3 0 1 1 X X X 64/32 30000h–3FFFFh 18000h–1FFFFh
SA4 1 0 0 X X X 64/32 40000h–4FFFFh 20000h–27FFFh
SA5 1 0 1 X X X 64/32 50000h–5FFFFh 28000h–2FFFFh
SA6 1 1 0 X X X 64/32 60000h–6FFFFh 30000h–37FFFh
SA7 1 1 1 0 X X 32/16 70000h–77FFFh 38000h–3BFFFh
SA8 1 1 1 1 0 0 8/4 78000h–79FFFh 3C000h–3CFFFh
SA9 1 1 1 1 0 1 8/4 7A000h–7BFFFh 3D000h–3DFFFh
SA10 1 1 1 1 1 X 16/8 7C000h–7FFFFh 3E000h–3FFFFh

Table 3. Am29F400BB Bottom Boot Block Sector Address Table

Address Range (in hexadecimal)
Sector Size (x8) (x16)
Sector A17 A16 A15 A14 A13 A12 (Kbytes/Kwords) Address Range Address Range
SA0 0 0 0 0 0 X 16/8 00000h–03FFFh 00000h–01FFFh
SA1 0 0 0 0 1 0 8/4 04000h–05FFFh 02000h–02FFFh
SA2 0 0 0 0 1 1 8/4 06000h–07FFFh 03000h–03FFFh
SA3 0 0 0 1 X X 32/16 08000h–0FFFFh 04000h–07FFFh
SA4 0 0 1 X X X 64/32 10000h–1FFFFh 08000h–0FFFFh
SA5 0 1 0 X X X 64/32 20000h–2FFFFh 10000h–17FFFh
SA6 0 1 1 X X X 64/32 30000h–3FFFFh 18000h–1FFFFh
SA7 1 0 0 X X X 64/32 40000h–4FFFFh 20000h–27FFFh
SA8 1 0 1 X X X 64/32 50000h–5FFFFh 28000h–2FFFFh
SA9 1 1 0 X X X 64/32 60000h–6FFFFh 30000h–37FFFh
SA10 1 1 1 X X X 64/32 70000h–7FFFFh 38000h–3FFFFh
Note:
Address range is A17:A-1 in byte mode and A17:A0 in word mode.See the “Word/Byte Configuration” section for more
information.

Autoselect Mode
The autoselect mode provides manufacturer and the sector address must appear on the appropriate
device identification, and sector protection verification, highest order address bits (see Tables 2 and 3). Table
through identifier codes output on DQ7–DQ0. This 4 shows the remaining address bits that are don’t care.
mode is primarily intended for programming equipment When all necessary bits have been set as required, the
to automatically match a device to be programmed with programming equipment may then read the corre-
its corresponding programming algorithm. However, sponding identifier code on DQ7–DQ0.
the autoselect codes can also be accessed in-system
To access the autoselect codes in-system, the host
through the command register.
system can issue the autoselect command via the
When using programming equipment, the autoselect command register, as shown in Table 5. This method
mode requires VID (11.5 V to 12.5 V) on address pin does not require VID. See “Command Definitions” for
A9. Address pins A6, A1, and A0 must be as shown in details on using the autoselect mode.
Table 4. In addition, when verifying sector protection,

Am29F400B 9
 Table 4. Am29F400B Autoselect Codes (High Voltage Method)
A17 A11 A8 A5 DQ8 DQ7
to to to to to to
Description Mode CE# OE# WE# A12 A10 A9 A7 A6 A2 A1 A0 DQ15 DQ0

Manufacturer ID: AMD L L H X X VID X L X L L X 01h

Device ID: Word L L H 22h 23h

Am29F400B X X VID X L X L H
(Top Boot Block) Byte L L H X 23h

Device ID: Word L L H 22h ABh

Am29F400B
X X VID X L X L H
(Bottom Boot Byte L L H X ABh
Block)

01h
X
(protected)
Sector Protection Verification L L H SA X VID X L X H L
00h
X
(unprotected)

L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.

Sector Protection/Unprotection
The hardware sector protection feature disables both START
program and erase operations in any sector. The hard-
ware sector unprotection feature re-enables both
program and erase operations in previously protected RESET# = VID
sectors. (Note 1)
Sector protection/unprotection must be implemented
using programming equipment. The procedure Perform Erase or
requires a high voltage (VID ) on address pin A9 and Program Operations
OE#. Details on this method are provided in a supple-
ment, publication number 20185. Contact an AMD
representative to obtain a copy of this document. RESET# = VIH

The device is shipped with all sectors unprotected.

AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device Temporary Sector
Unprotect Completed
through AMD’s ExpressFlash™ Service. Contact an (Note 2)
AMD representative for details.
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details. 21505D-5
Notes:
Temporary Sector Unprotect 1. All protected sectors unprotected.
This feature allows temporary unprotection of previ- 2. All previously protected sectors are protected once
ously protected sectors to change data in-system. The again.
Sector Unprotect mode is activated by setting the
RESET# pin to VID. During this mode, formerly pro- Figure 1. Temporary Sector Unprotect Operation
tected sectors can be programmed or erased by
selecting the sector addresses. Once VID is removed
from the RESET# pin, all the previously protected Hardware Data Protection
sectors are protected again. Figure 1 shows the algo-
rithm, and Figure 18 shows the timing diagrams, for this The command sequence requirement of unlock cycles
feature. for programming or erasing provides data protection
against inadver tent writes (refer to Table 5 for
command definitions). In addition, the following hard-

10 Am29F400B
ware data protection measures prevent accidental Write Pulse “Glitch” Protection
erasure or programming, which might otherwise be Noise pulses of less than 5 ns (typical) on OE#, CE# or
caused by spurious system level signals during VCC WE# do not initiate a write cycle.
power-up and power-down transitions, or from system
noise. Logical Inhibit

Low VCC Write Inhibit Write cycles are inhibited by holding any one of OE# =
VIL, CE# = VIH or WE# = VIH. To initiate a write cycle,
When V CC is less than V LKO, the device does not CE# and WE# must be a logical zero while OE# is a
accept any write cycles. This protects data during VCC logical one.
power-up and power-down. The command register and
all internal program/erase circuits are disabled, and the Power-Up Write Inhibit
device resets. Subsequent writes are ignored until VCC If WE# = CE# = VIL and OE# = VIH during power up, the
is greater than V LKO. The system must provide the device does not accept commands on the rising edge
proper signals to the control pins to prevent uninten- of WE#. The internal state machine is automatically
tional writes when VCC is greater than VLKO. reset to reading array data on power-up.

COMMAND DEFINITIONS
Writing specific address and data commands or Reset Command
sequences into the command register initiates device
Writing the reset command to the device resets the
operations. Table 5 defines the valid register command
device to reading array data. Address bits are don’t
sequences. Writing incorrect address and data
care for this command.
values or writing them in the improper sequence
resets the device to reading array data. The reset command may be written between the
sequence cycles in an erase command sequence
All addresses are latched on the falling edge of WE# or
before erasing begins. This resets the device to reading
CE#, whichever happens later. All data is latched on
array data. Once erasure begins, however, the device
the rising edge of WE# or CE#, whichever happens
ignores reset commands until the operation is
first. Refer to the appropriate timing diagrams in the
complete.
“AC Characteristics” section.
The reset command may be written between the
Reading Array Data sequence cycles in a program command sequence
The device is automatically set to reading array data before programming begins. This resets the device to
after device power-up. No commands are required to reading array data (also applies to programming in
retrieve data. The device is also ready to read array Erase Suspend mode). Once programming begins,
data after completing an Embedded Program or however, the device ignores reset commands until the
Embedded Erase algorithm. operation is complete.

After the device accepts an Erase Suspend command, The reset command may be written between the
the device enters the Erase Suspend mode. The sequence cycles in an autoselect command sequence.
system can read array data using the standard read Once in the autoselect mode, the reset command must
timings, except that if it reads at an address within be written to return to reading array data (also applies
erase-suspended sectors, the device outputs status to autoselect during Erase Suspend).
data. After completing a programming operation in the If DQ5 goes high during a program or erase operation,
Erase Suspend mode, the system may once again writing the reset command returns the device to
read array data with the same exception. See “Erase reading array data (also applies dur ing Erase
Suspend/Erase Resume Commands” for more infor- Suspend).
mation on this mode.
The system must issue the reset command to re- Autoselect Command Sequence
enable the device for reading array data if DQ5 goes The autoselect command sequence allows the host
high, or while in the autoselect mode. See the “Reset system to access the manufacturer and devices codes,
Command” section, next. and determine whether or not a sector is protected.
Table 5 shows the address and data requirements. This
See also “Requirements for Reading Array Data” in the
method is an alternative to that shown in Table 4, which
“Device Bus Operations” section for more information.
is intended for PROM programmers and requires VID
The Read Operations table provides the read parame-
on address bit A9.
ters, and Figure 9 shows the timing diagram.
The autoselect command sequence is initiated by
writing two unlock cycles, followed by the autoselect

Am29F400B 11
command. The device then enters the autoselect
mode, and the system may read at any address any
number of times, without initiating another command START
sequence.
A read cycle at address XX00h or retrieves the manu-
facturer code. A read cycle at address XX01h in word
mode (or 02h in byte mode) returns the device code. A Write Program
Command Sequence
read cycle containing a sector address (SA) and the
address 02h in word mode (or 04h in byte mode)
returns 01h if that sector is protected, or 00h if it is
unprotected. Refer to Tables 2 and 3 for valid sector Data Poll
addresses. from System
Embedded
The system must write the reset command to exit the Program
algorithm
autoselect mode and return to reading array data.
in progress

Word/Byte Program Command Sequence Verify Data?

No
The system may program the device by word or byte,
depending on the state of the BYTE# pin. Program- Yes
ming is a four-bus-cycle operation. The program
command sequence is initiated by writing two unlock
write cycles, followed by the program set-up command. No
Increment Address Last Address?
The program address and data are written next, which
in turn initiate the Embedded Program algorithm. The
system is not required to provide further controls or tim- Yes
ings. The device automatically provides internally
generated program pulses and verify the programmed Programming
cell margin. Table 5 shows the address and data Completed
r e q u i re m e n t s fo r th e byt e p r o gra m c om m a n d
21505D-5
sequence.
When the Embedded Program algorithm is complete, Note:
See Table 5 for program command sequence.
the device then returns to reading array data and
addresses are no longer latched. The system can Figure 2. Program Operation
determine the status of the program operation by using
DQ7, DQ6, or RY/BY#. See “The Erase Resume
command is valid only during the Erase Suspend
mode.” for information on these status bits. Chip Erase Command Sequence
Any commands written to the device during the Chip erase is a six-bus-cycle operation. The chip erase
Embedded Program Algorithm are ignored. Note that a command sequence is initiated by writing two unlock
hardware reset immediately terminates the program- cycles, followed by a set-up command. Two additional
m i n g o pe rati o n. T h e B yte Pr o gra m com m a n d unlock write cycles are then followed by the chip erase
sequence should be reinitiated once the device has command, which in turn invokes the Embedded Erase
reset to reading array data, to ensure data integrity. algorithm. The device does not require the system to
Programming is allowed in any sequence and across preprogram prior to erase. The Embedded Erase algo-
sector boundaries. A bit cannot be programmed rithm automatically preprograms and verifies the entire
from a “0” back to a “1”. Attempting to do so may halt memory for an all zero data pattern prior to electrical
the operation and set DQ5 to “1”, or cause the Data# erase. The system is not required to provide any con-
Polling algorithm to indicate the operation was suc- trols or timings during these operations. Table 5 shows
cessful. However, a succeeding read will show that the the address and data requirements for the chip erase
data is still “0”. Only erase operations can convert a “0” command sequence.
to a “1”. Any com mand s wr i tten to th e chip d ur ing th e
Embedded Erase algorithm are ignored. Note that a
hardware reset during the chip erase operation imme-
diately terminates the operation. The Chip Erase
command sequence should be reinitiated once the

12 Am29F400B
device has returned to reading array data, to ensure sector erase operation immediately terminates the
data integrity. operation. The Sector Erase command sequence
should be reinitiated once the device has returned to
The system can determine the status of the erase oper-
reading array data, to ensure data integrity.
ation by using DQ7, DQ6, DQ2, or RY/BY#. See “The
Erase Resume command is valid only during the Erase When the Embedded Erase algorithm is complete, the
Suspend mode.” for information on these status bits. device returns to reading array data and addresses are
When the Embedded Erase algorithm is complete, the no longer latched. The system can determine the
device returns to reading array data and addresses are status of the erase operation by using DQ7, DQ6, DQ2,
no longer latched. or RY/BY#. (Refer to “The Erase Resume command is
valid only during the Erase Suspend mode.” for infor-
Figure 3 illustrates the algorithm for the erase opera-
mation on these status bits.)
tion. See the “Erase/Program Operations” tables in “AC
Characteristics” for parameters, and to Figure 14 for Figure 3 illustrates the algorithm for the erase opera-
timing diagrams. tion. Refer to the “Erase/Program Operations” tables in
the “AC Characteristics” section for parameters, and to
Sector Erase Command Sequence Figure 14 for timing diagrams.
Sector erase is a six bus cycle operation. The sector
erase command sequence is initiated by writing two Erase Suspend/Erase Resume Commands
unlock cycles, followed by a set-up command. Two The Erase Suspend command allows the system to
additional unlock write cycles are then followed by the interrupt a sector erase operation and then read data
address of the sector to be erased, and the sector from, or program data to, any sector not selected for
erase command. Table 5 shows the address and data erasure. This command is valid only during the sector
requirements for the sector erase command sequence. erase operation, including the 50 µs time-out period
during the sector erase command sequence. The
The device does not require the system to preprogram
Erase Suspend command is ignored if written during
the memory prior to erase. The Embedded Erase algo-
the chip erase operation or Embedded Program algo-
rithm automatically programs and verifies the sector for
rithm. Writing the Erase Suspend command during the
an all zero data pattern prior to electrical erase. The
Sector Erase time-out immediately terminates the
system is not required to provide any controls or
time-out period and suspends the erase operation.
timings during these operations.
Addresses are “don’t-cares” when writing the Erase
After the command sequence is written, a sector erase Suspend command.
time-out of 50 µs begins. During the time-out period,
When the Erase Suspend command is written during a
additional sector addresses and sector erase com-
sector erase operation, the device requires a maximum
mands may be written. Loading the sector erase buffer
of 20 µs to suspend the erase operation. However,
may be done in any sequence, and the number of
when the Erase Suspend command is written during
sectors may be from one sector to all sectors. The time
the sector erase time-out, the device immediately ter-
between these additional cycles must be less than 50
minates the time-out period and suspends the erase
µs, otherwise the last address and command might not
operation.
be accepted, and erasure may begin. It is recom-
mended that processor interrupts be disabled during After the erase operation has been suspended, the
this time to ensure all commands are accepted. The system can read array data from or program data to
interrupts can be re-enabled after the last Sector Erase any sector not selected for erasure. (The device “erase
command is written. If the time between additional suspends” all sectors selected for erasure.) Normal
sector erase commands can be assumed to be less read and write timings and command definitions apply.
than 50 µs, the system need not monitor DQ3. Any Reading at any address within erase-suspended
command other than Sector Erase or Erase sectors produces status data on DQ7–DQ0. The
Suspend during the time-out period resets the system can use DQ7, or DQ6 and DQ2 together, to
device to reading array data. The system must determine if a sector is actively erasing or is erase-sus-
rewrite the command sequence and any additional pended. See “The Erase Resume command is valid
sector addresses and commands. only during the Erase Suspend mode.” for information
on these status bits.
The system can monitor DQ3 to determine if the sector
erase timer has timed out. (See the “DQ3: Sector Erase After an erase-suspended program operation is com-
Timer” section.) The time-out begins from the rising plete, the system can once again read array data within
edge of the final WE# pulse in the command sequence. non-suspended sectors. The system can determine
the status of the program operation using the DQ7 or
Once the sector erase operation has begun, only the
DQ6 status bits, just as in the standard program oper-
Erase Suspend command is valid. All other commands
are ignored. Note that a hardware reset during the

Am29F400B 13
ation. See “The Erase Resume command is valid only
during the Erase Suspend mode.” for more information.
The system may also write the autoselect command START
sequence when the device is in the Erase Suspend
mode. The device allows reading autoselect codes
even at addresses within erasing sectors, since the
codes are not stored in the memory array. When the Write Erase
Command Sequence
device exits the autoselect mode, the device reverts to
the Erase Suspend mode, and is ready for another
valid operation. See “Autoselect Command Sequence”
for more information. Data Poll
The system must write the Erase Resume command from System
Embedded
(address bits are “don’t care”) to exit the erase suspend Erase
mode and continue the sector erase operation. Further algorithm
writes of the Resume command are ignored. Another in progress
Erase Suspend command can be written after the No
Data = FFh?
device has resumed erasing.

Yes

Erasure Completed

21505D-6

Notes:
1. See Table 5 for erase command sequence.
2. See “DQ3: Sector Erase Timer” for more information.

Figure 3. Erase Operation

14 Am29F400B
 Table 5. Am29F400B Command Definitions
Bus Cycles (Notes 2–5)

Cycles
Command
Sequence First Second Third Fourth Fifth Sixth
(Note 1) Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read (Note 6) 1 RA RD
Reset (Note 7) 1 XXX F0
Word 555 2AA 555
Manufacturer ID 4 AA 55 90 X00 01
Byte AAA 555 AAA
Autoselect (Note 8)

Device ID, Word 555 2AA 555 X01 2223

4 AA 55 90
Top Boot Block Byte AAA 555 AAA X02 23
Device ID, Word 555 2AA 555 X01 22AB
4 AA 55 90
Bottom Boot Block Byte AAA 555 AAA X02 AB
(SA) XX00
Word 555 2AA 555
Sector Protect Verify X02 XX01
4 AA 55 90
(Note 9) (SA) 00
Byte AAA 555 AAA
X04 01
Word 555 2AA 555
Program 4 AA 55 A0 PA PD
Byte AAA 555 AAA
Word 555 2AA 555 555 2AA 555
Chip Erase 6 AA 55 80 AA 55 10
Byte AAA 555 AAA AAA 555 AAA
Word 555 2AA 555 555 2AA
Sector Erase 6 AA 55 80 AA 55 SA 30
Byte AAA 555 AAA AAA 555
Erase Suspend (Note 10) 1 XXX B0
Erase Resume (Note 11) 1 XXX 30

Legend:
X = Don’t care PD = Data to be programmed at location PA. Data latches on the
RA = Address of the memory location to be read. rising edge of WE# or CE# pulse, whichever happens first.

RD = Data read from location RA during read operation. SA = Address of the sector to be verified (in autoselect mode) or
erased. Address bits A17–A12 uniquely select any sector.
PA = Address of the memory location to be programmed.
Addresses latch on the falling edge of the WE# or CE# pulse,
whichever happens later.

Notes:
1. See Table 1 for description of bus operations. 8. The fourth cycle of the autoselect command sequence is a
2. All values are in hexadecimal. read cycle.

3. Except when reading array or autoselect data, all bus cycles 9. The data is 00h for an unprotected sector and 01h for a
are write operations. protected sector. See“Autoselect Command Sequence” for
more information.
4. Data bits DQ15–DQ8 are don’t cares for unlock and
command cycles. 10. The system may read and program in non-erasing sectors, or
enter the autoselect mode, when in the Erase Suspend
5. Address bits A17–A11 are don’t cares for unlock and mode. The Erase Suspend command is valid only during a
command cycles, unless PA or SA required. sector erase operation.
6. No unlock or command cycles required when reading array 11. The Erase Resume command is valid only during the Erase
data. Suspend mode.
7. The Reset command is required to return to reading array
data when device is in the autoselect mode, or if DQ5 goes
high (while the device is providing status data).

Am29F400B 15
WRITE OPERATION STATUS
The device provides several bits to determine the Table 6 shows the outputs for Data# Polling on DQ7.
status of a write operation: DQ2, DQ3, DQ5, DQ6, Figure 4 shows the Data# Polling algorithm.
DQ7, and RY/BY#. Table 6 and the following subsec-
tions describe the functions of these bits. DQ7,
RY/BY#, and DQ6 each offer a method for determining
whether a program or erase operation is complete or in
START
progress. These three bits are discussed first.

DQ7: Data# Polling

The Data# Polling bit, DQ7, indicates to the host Read DQ7–DQ0
system whether an Embedded Algorithm is in progress Addr = VA
or completed, or whether the device is in Erase Sus-
pend. Data# Polling is valid after the rising edge of the
final WE# pulse in the program or erase command
sequence.
Yes
DQ7 = Data?
During the Embedded Program algorithm, the device
outputs on DQ7 the complement of the datum pro-
grammed to DQ7. This DQ7 status also applies to
programming during Erase Suspend. When the No
Embedded Program algorithm is complete, the device
outputs the datum programmed to DQ7. The system No
DQ5 = 1?
must provide the program address to read valid status
information on DQ7. If a program address falls within a
protected sector, Data# Polling on DQ7 is active for
approximately 2 µs, then the device returns to reading Yes
array data.
During the Embedded Erase algorithm, Data# Polling Read DQ7–DQ0
Addr = VA
produces a “0” on DQ7. When the Embedded Erase
algorithm is complete, or if the device enters the Erase
Suspend mode, Data# Polling produces a “1” on DQ7.
This is analogous to the complement/true datum output
described for the Embedded Program algorithm: the Yes
DQ7 = Data?
erase function changes all the bits in a sector to “1”;
prior to this, the device outputs the “complement,” or
“0.” The system must provide an address within any of
No
the sectors selected for erasure to read valid status
information on DQ7.
FAIL PASS
After an erase command sequence is written, if all
sectors selected for erasing are protected, Data#
Polling on DQ7 is active for approximately 100 µs, then Notes:
the device returns to reading array data. If not all 1. VA = Valid address for programming. During a sector
selected sectors are protected, the Embedded Erase erase operation, a valid address is an address within any
algorithm erases the unprotected sectors, and ignores sector selected for erasure. During chip erase, a valid
address is any non-protected sector address.
the selected sectors that are protected.
2. DQ7 should be rechecked even if DQ5 = “1” because
When the system detects DQ7 has changed from the DQ7 may change simultaneously with DQ5.
complement to true data, it can read valid data at DQ7–
DQ0 on the following read cycles. This is because DQ7 21505D-7
may change asynchronously with DQ0–DQ6 while
Output Enable (OE#) is asserted low. Figure 15, Data# Figure 4. Data# Polling Algorithm
Polling Timings (During Embedded Algorithms), in the
“AC Characteristics” section illustrates this.

16 Am29F400B
RY/BY#: Ready/Busy# Table 6 shows the outputs for Toggle Bit I on DQ6.
Figure 5 shows the toggle bit algorithm. Figure 16 in the
The RY/BY# is a dedicated, open-drain output pin that
“AC Characteristics” section shows the toggle bit timing
indicates whether an Embedded Algorithm is in
diagrams. Figure 17 shows the differences between
progress or complete. The RY/BY# status is valid after
DQ2 and DQ6 in graphical form. See also the subsec-
the rising edge of the final WE# pulse in the command
tion on “DQ2: Toggle Bit II”.
sequence. Since RY/BY# is an open-drain output,
several RY/BY# pins can be tied together in parallel
DQ2: Toggle Bit II
with a pull-up resistor to VCC.
The “Toggle Bit II” on DQ2, when used with DQ6, indi-
If the output is low (Busy), the device is actively erasing cates whether a particular sector is actively erasing
or programming. (This includes programming in the (that is, the Embedded Erase algorithm is in progress),
Erase Suspend mode.) If the output is high (Ready), or whether that sector is erase-suspended. Toggle Bit
the device is ready to read array data (including during II is valid after the rising edge of the final WE# pulse in
the Erase Suspend mode), or is in the standby mode. the command sequence.
Table 6 shows the outputs for RY/BY#. Figures 10, DQ2 toggles when the system reads at addresses
Figure 13 and Figure 14 shows RY/BY# for reset, pro- within those sectors that have been selected for era-
gram, and erase operations, respectively. sure. (The system may use either OE# or CE# to
control the read cycles.) But DQ2 cannot distinguish
DQ6: Toggle Bit I whether the sector is actively erasing or is erase-sus-
Toggle Bit I on DQ6 indicates whether an Embedded pended. DQ6, by comparison, indicates whether the
Program or Erase algorithm is in progress or complete, device is actively erasing, or is in Erase Suspend, but
or whether the device has entered the Erase Suspend cannot distinguish which sectors are selected for era-
mode. Toggle Bit I may be read at any address, and is sure. Thus, both status bits are required for sector and
valid after the rising edge of the final WE# pulse in the mode information. Refer to Table 6 to compare outputs
command sequence (prior to the program or erase for DQ2 and DQ6.
operation), and during the sector erase time-out.
Figure 5 shows the toggle bit algorithm in flowchart
During an Embedded Program or Erase algorithm form, and the section “DQ2: Toggle Bit II” explains the
operation, successive read cycles to any address algorithm. See also the “DQ6: Toggle Bit I” subsection.
cause DQ6 to toggle. The system may use either OE# Figure 16 shows the toggle bit timing diagram. Figure
or CE# to control the read cycles. When the operation 17 shows the differences between DQ2 and DQ6 in
is complete, DQ6 stops toggling. graphical form.
After an erase command sequence is written, if all
Reading Toggle Bits DQ6/DQ2
sectors selected for erasing are protected, DQ6 toggles
for approximately 100 µs, then returns to reading array Refer to Figure 5 for the following discussion. When-
data. If not all selected sectors are protected, the ever the system initially begins reading toggle bit
Embedded Erase algorithm erases the unprotected status, it must read DQ7–DQ0 at least twice in a row to
sectors, and ignores the selected sectors that are determine whether a toggle bit is toggling. Typically, the
protected. system would note and store the value of the toggle bit
after the first read. After the second read, the system
The system can use DQ6 and DQ2 together to deter- would compare the new value of the toggle bit with the
mine whether a sector is actively erasing or is erase- first. If the toggle bit is not toggling, the device has com-
suspended. When the device is actively erasing (that is, pleted the program or erase operation. The system can
the Embedded Erase algorithm is in progress), DQ6 read array data on DQ7–DQ0 on the following read
toggles. When the device enters the Erase Suspend cycle.
mode, DQ6 stops toggling. However, the system must
also use DQ2 to determine which sectors are erasing However, if after the initial two read cycles, the system
or erase-suspended. Alternatively, the system can use determines that the toggle bit is still toggling, the
DQ7 (see the subsection on “DQ7: Data# Polling”). system also should note whether the value of DQ5 is
high (see the section on DQ5). If it is, the system
If a program address falls within a protected sector, should then determine again whether the toggle bit is
DQ6 toggles for approximately 2 µs after the program toggling, since the toggle bit may have stopped tog-
command sequence is written, then returns to reading gling just as DQ5 went high. If the toggle bit is no longer
array data. toggling, the device has successfully completed the
DQ6 also toggles during the erase-suspend-program program or erase operation. If it is still toggling, the
mode, and stops toggling once the Embedded device did not complete the operation successfully, and
Program algorithm is complete. the system must write the reset command to return to
reading array data.

Am29F400B 17
The remaining scenario is that the system initially
determines that the toggle bit is toggling and DQ5 has
not gone high. The system may continue to monitor the START
toggle bit and DQ5 through successive read cycles,
determining the status as described in the previous
paragraph. Alternatively, it may choose to perform
other system tasks. In this case, the system must start Read DQ7–DQ0
at the beginning of the algorithm when it returns to
determine the status of the operation (top of Figure 5).

Read DQ7–DQ0 (Note 1)

DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time has
exceeded a specified internal pulse count limit. Under
Toggle Bit No
these conditions DQ5 produces a “1.” This is a failure
= Toggle?
condition that indicates the program or erase cycle was
not successfully completed.
Yes
The DQ5 failure condition may appear if the system
tries to program a “1” to a location that is previously pro-
grammed to “0.” Only an erase operation can change No
DQ5 = 1?
a “0” back to a “1.” Under this condition, the device
halts the operation, and when the operation has
exceeded the timing limits, DQ5 produces a “1.” Yes

Under both these conditions, the system must issue the

reset command to return the device to reading array Read DQ7–DQ0 (Notes
data. Twice 1, 2)

DQ3: Sector Erase Timer

After writing a sector erase command sequence, the Toggle Bit No
system may read DQ3 to determine whether or not an = Toggle?
erase operation has begun. (The sector erase timer
does not apply to the chip erase command.) If addi-
tional sectors are selected for erasure, the entire time- Yes
out also applies after each additional sector erase com- Program/Erase
mand. When the time-out is complete, DQ3 switches Operation Not Program/Erase
from “0” to “1.” If the time between additional sector Complete, Write Operation Complete
erase commands from the system can be assumed to Reset Command
be less than 50 µs, the system need not monitor DQ3.
See also the “Sector Erase Command Sequence” Notes:
section. 1. Read toggle bit twice to determine whether or not it is
toggling. See text.
After the sector erase command sequence is written,
2. Recheck toggle bit because it may stop toggling as DQ5
the system should read the status on DQ7 (Data#
changes to “1”. See text.
Polling) or DQ6 (Toggle Bit I) to ensure the device has
21505D-8
accepted the command sequence, and then read DQ3.
If DQ3 is “1”, the internally controlled erase cycle has Figure 5. Toggle Bit Algorithm
begun; all further commands (other than Erase Sus-
pend) are ignored until the erase operation is complete. of DQ3 prior to and following each subsequent sector
If DQ3 is “0”, the device will accept additional sector erase command. If DQ3 is high on the second status
erase commands. To ensure the command has been check, the last command might not have been
accepted, the system software should check the status accepted. Table 6 shows the outputs for DQ3.

18 Am29F400B
 Table 6. Write Operation Status
DQ7 DQ5 DQ2
Operation (Note 2) DQ6 (Note 1) DQ3 (Note 2) RY/BY#
Standard Embedded Program Algorithm DQ7# Toggle 0 N/A No toggle 0
Mode Embedded Erase Algorithm 0 Toggle 0 1 Toggle 0
Reading within Erase
1 No toggle 0 N/A Toggle 1
Erase Suspended Sector
Suspend Reading within Non-Erase
Data Data Data Data Data 1
Mode Suspended Sector
Erase-Suspend-Program DQ7# Toggle 0 N/A N/A 0
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits.
See “DQ5: Exceeded Timing Limits” for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.

Am29F400B 19
ABSOLUTE MAXIMUM RATINGS OPERATING RANGES
Storage Temperature Commercial (C) Devices
Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C Ambient Temperature (TA) . . . . . . . . . . .0°C to +70°C
Ambient Temperature Industrial (I) Devices
with Power Applied. . . . . . . . . . . . . . –55°C to +125°C
Ambient Temperature (TA) . . . . . . . . .–40°C to +85°C
Voltage with Respect to Ground
Extended (E) Devices
VCC (Note 1) . . . . . . . . . . . . . . . .–2.0 V to +7.0 V
Ambient Temperature (TA) . . . . . . . .–55°C to +125°C
A9, OE#, and
RESET# (Note 2). . . . . . . . . . . . –2.0 V to +12.5 V VCC Supply Voltages

All other pins (Note 1) . . . . . . . . . –0.5 V to +7.0 V VCC for ± 5% devices . . . . . . . . . . +4.75 V to +5.25 V

Output Short Circuit Current (Note 3) . . . . . . 200 mA VCC for ± 10% devices . . . . . . . . . . . +4.5 V to +5.5 V
Notes: Note:Operating ranges define those limits between which the
1. Minimum DC voltage on input or I/O pins is –0.5 V. During functionality of the device is guaranteed.
voltage transitions, input or I/O pins may overshoot VSS to
–2.0 V for periods of up to 20 ns. See Figure 6. Maximum
DC voltage on input or I/O pins is VCC +0.5 V. During
voltage transitions, input or I/O pins may overshoot to VCC
+2.0 V for periods up to 20 ns. See Figure 7.
2. Minimum DC input voltage on pins A9, OE#, and RESET#
is –0.5 V. During voltage transitions, A9, OE#, and
RESET# may overshoot VSS to –2.0 V for periods of up to
20 ns. See Figure 6. Maximum DC input voltage on pin A9
is +12.5 V which may overshoot to +13.5 V for periods up
to 20 ns.
3. No more than one output may be shorted to ground at a
time. Duration of the short circuit should not be greater
than one second.
Note:Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This is
a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the
operational sections of this data sheet is not implied.
Exposure of the device to absolute maximum rating
conditions for extended periods may affect device reliability.

20 ns
20 ns 20 ns VCC
+2.0 V
+0.8 V
VCC
+0.5 V
–0.5 V
2.0 V
–2.0 V
20 ns 20 ns
20 ns

21505D-9 21505D-10

Figure 6. Maximum Negative Overshoot Figure 7. Maximum Positive Overshoot

Waveform Waveform

20 Am29F400B
DC CHARACTERISTICS
TTL/NMOS Compatible
Parameter Description Test Conditions Min Typ Max Unit

ILI Input Load Current VIN = VSS to VCC, VCC = VCC max ±1.0 µA

A9, OE#, RESET# Input Load VCC = VCC max;

ILIT 50 µA
Current A9, OE#, RESET# = 12.5 V

ILO Output Leakage Current VOUT = VSS to VCC, VCC = VCC max ±1.0 µA

CE# = VIL, OE# = VIH,

19 40 mA
VCC Active Read Current f = 5 MHz, Byte Mode
ICC1
(Notes 1, 2) CE# = VIL, OE# = VIH,
19 50 mA
f = 5 MHz, Word Mode
VCC Active Write Current
ICC2 CE# = VIL, OE# = VIH 36 60 mA
(Notes 2, 3, 4)

ICC3 VCC Standby Current (Note 2) CE#, RESET#, and OE# = VIH 0.4 1 mA

VIL Input Low Voltage –0.5 0.8 V

VCC
VIH Input High Voltage 2.0 V
+0.5

Voltage for Autoselect and

VID VCC = 5.0 V 11.5 12.5 V
Temporary Sector Unprotect

VOL Output Low Voltage IOL = 5.8 mA, VCC = VCC min 0.45 V

VOH Output High Voltage IOH = –2.5 mA, VCC = VCC min 2.4 V

VLKO Low VCC Lock-Out Voltage 3.2 4.2 V

Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH..
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Not 100% tested.

Am29F400B 21
DC CHARACTERISTICS
CMOS Compatible
Parameter Description Test Conditions Min Typ Max Unit

VIN = VSS to VCC,

ILI Input Load Current ±1.0 µA
VCC = VCC max

A9, OE#, RESET# VCC = VCC max;

ILIT 50 µA
Input Load Current A9, OE#, RESET# = 12.5 V

VOUT = VSS to VCC,

ILO Output Leakage Current ±1.0 µA
VCC = VCC max

CE# = VIL, OE# = VIH,

20 40
VCC Active Read Current f = 5 MHz, Byte Mode
ICC1 mA
(Notes 1, 2) CE# = VIL, OE# = VIH,
28 50
f = 5 MHz, Word Mode
VCC Active Write Current
ICC2 CE# = VIL, OE# = VIH 30 50 mA
(Notes 2, 3, 4)

VCC Standby Current

ICC3 OE# = VIH, CE# and RESET# = VCC±0.5 V 0.3 5 µA
(Notes 2, 5

VIL Input Low Voltage –0.5 0.8 V

0.7 x VCC+
VIH Input High Voltage V
VCC 0.3

Voltage for Autoselect and

VID VCC = 5.0 V 11.5 12.5 V
Temporary Sector Unprotect

VOL Output Low Voltage IOL = 5.8 mA, VCC = VCC min 0.45 V

0.85
VOH1 IOH = –2.5 mA, VCC = VCC min V
VCC
Output High Voltage
VCC–
VOH2 IOH = –100 µA, VCC = VCC min
0.4

VLKO Low VCC Lock-Out Voltage 3.2 4.2 V

Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Not 100% tested.
5. ICC3 = 20 µA max at extended temperature (>+85° C).

22 Am29F400B
TEST CONDITIONS
Table 7. Test Specifications
5.0 V
-45, All
Test Condition -50, -55 others Unit
2.7 kΩ
Device Output Load 1 TTL gate
Under
Test Output Load Capacitance, CL
30 100 pF
(including jig capacitance)
CL 6.2 kΩ
Input Rise and Fall Times 5 20 ns

Input Pulse Levels 0.0–3.0 0.45–2.4 V

Input timing measurement

1.5 0.8, 2.0 V
reference levels
Note:
Diodes are IN3064 or equivalent. Output timing measurement
1.5 0.8, 2.0 V
reference levels
21505D-11
Figure 8. Test Setup

KEY TO SWITCHING WAVEFORMS

WAVEFORM INPUTS OUTPUTS

Steady

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted Changing, State Unknown

Does Not Apply Center Line is High Impedance State (High Z)

KS000010-PAL

Am29F400B 23
AC CHARACTERISTICS
Read Operations
Parameter Speed Options

JEDEC Std Description Test Setup -45 -50 -55 -70 -90 -120 -150 Unit

tAVAV tRC Read Cycle Time (Note 1) Min 45 50 55 70 90 120 150 ns

CE# = VIL
tAVQV tACC Address to Output Delay Max 45 50 55 70 90 120 150 ns
OE# = VIL

tELQV tCE Chip Enable to Output Delay OE# = VIL Max 45 50 55 70 90 120 150 ns

Output Enable to Output

tGLQV tOE Max 30 30 30 30 35 50 55 ns
Delay

Chip Enable to Output High Z

tEHQZ tDF Max 15 15 15 20 20 30 35 ns
(Note 1)

Output Enable to Output High

tGHQZ tDF Max 15 15 15 20 20 30 35 ns
Z (Note 1)

Output Read Min 0 ns

Enable
tOEH Toggle and
Hold Time Min 10 ns
(Note 1) Data# Polling

Output Hold Time From

Addresses, CE# or OE#,
tAXQX tOH Min 0 ns
Whichever Occurs First (Note
1)

Notes:
1. Not 100% tested.
2. See Figure 8 and Table 7 for test specifications.

tRC

Addresses Addresses Stable

tACC
CE#

tDF
tOE
OE#
tOEH

WE# tCE
tOH
HIGH Z HIGH Z
Outputs Output Valid

RESET#

RY/BY#
0V

21505D-12
Figure 9. Read Operations Timings

24 Am29F400B
AC CHARACTERISTICS
Hardware Reset (RESET#)
Parameter

JEDEC Std Description Test Setup All Speed Options Unit

RESET# Pin Low (During Embedded

tREADY Max 20 µs
Algorithms) to Read or Write (See Note)

RESET# Pin Low (NOT During Embedded

tREADY Max 500 ns
Algorithms) to Read or Write (See Note)

tRP RESET# Pulse Width Min 500 ns

tRH RESET# High Time Before Read (See Note) Min 50 ns

tRB RY/BY# Recovery Time Min 0 ns

Note:
Not 100% tested.

RY/BY#

CE#, OE#
tRH

RESET#

tRP
tReady

Reset Timings NOT during Embedded Algorithms

Reset Timings during Embedded Algorithms

tReady
RY/BY#

tRB

CE#, OE#

RESET#

tRP

21505D-13
Figure 10. RESET# Timings

Am29F400B 25
AC CHARACTERISTICS
Word/Byte Configuration (BYTE#)
Parameter Speed Options

JEDEC Std Description -45 -50 -55 -70 -90 -120 -150 Unit

tELFL/tELFH CE# to BYTE# Switching Low or High Max 5 ns

tFLQZ BYTE# Switching Low to Output HIGH Z Max 15 15 15 20 20 30 35 ns

tFHQV BYTE# Switching High to Output Active Min 45 50 55 70 90 120 150 ns

CE#

OE#

BYTE#

tELFL
BYTE# DQ0–DQ14 Data Output Data Output
Switching (DQ0–DQ14) (DQ0–DQ7)
from word
to byte
mode DQ15/A-1 DQ15 Address
Output Input

tFLQZ

tELFH
BYTE#

BYTE#
Switching
from byte DQ0–DQ14 Data Output Data Output
to word (DQ0–DQ7) (DQ0–DQ14)
mode
DQ15/A-1 Address DQ15
Input Output

tFHQV

21505D-14
Figure 11. BYTE# Timings for Read Operations

CE#

The falling edge of the last WE# signal

WE#

BYTE#
tSET
(tAS)
tHOLD (tAH)

Note:
Refer to the Erase/Program Operations table for tAS and tAH specifications.
21505D-15
Figure 12. BYTE# Timings for Write Operations

26 Am29F400B
AC CHARACTERISTICS
Erase/Program Operations
Parameter Speed Options

JEDEC Std Description -45 -50 -55 -70 -90 -120 -150 Unit

tAVAV tWC Write Cycle Time (Note 1) Min 45 50 55 70 90 120 150 ns

tAVWL tAS Address Setup Time Min 0 ns

tWLAX tAH Address Hold Time Min 45 45 45 45 45 50 50 ns

tDVWH tDS Data Setup Time Min 25 25 25 30 45 50 50 ns

tWHDX tDH Data Hold Time Min 0 ns

tOES Output Enable Setup Time Min 0 ns

Read Recovery Time Before Write

tGHWL tGHWL Min 0 ns
(OE# High to WE# Low)

tELWL tCS CE# Setup Time Min 0 ns

tWHEH tCH CE# Hold Time Min 0 ns

tWLWH tWP Write Pulse Width Min 30 30 30 35 45 50 50 ns

tWHWL tWPH Write Pulse Width High Min 20 ns

Programming Operation Byte Typ 7

tWHWH1 tWHWH1 µs
(Note 2) Word Typ 12

tWHWH2 tWHWH2 Sector Erase Operation (Note 2) Typ 1 sec

tVCS VCC Setup Time (Note 1) Min 50 µs

tRB Recovery Time from RY/BY# Min 0 ns

Program/Erase Valid to RY/BY#

tBUSY Min 30 30 30 30 35 50 55 ns
Delay

Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” section for more information.

Am29F400B 27
AC CHARACTERISTICS
Program Command Sequence (last two cycles) Read Status Data (last two cycles)
tWC tAS

Addresses 555h PA PA PA
tAH

CE#
tCH
tGHWL
OE#

tWP tWHWH1

WE#
tWPH
tCS
tDS
tDH

Data A0h PD Status DOUT

tBUSY tRB

RY/BY#
tVCS

VCC

Notes:
1. PA = program address, PD = program data, DOUT is the true data at the program address.
2. Illustration shows device in word mode.
21505D-16
Figure 13. Program Operation Timings

28 Am29F400B
AC CHARACTERISTICS

Erase Command Sequence (last two cycles) Read Status Data

tWC tAS
Addresses 2AAh SA VA VA
555h for chip erase
tAH
CE#
tGHWL
OE# tCH

tWP
WE#
tWPH tWHWH2
tCS
tDS
tDH
In
Data 55h 30h Progress Complete

10 for Chip Erase

tBUSY tRB

RY/BY#
tVCS
VCC

Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”).
2. Illustration shows device in word mode.
21505D-17
Figure 14. Chip/Sector Erase Operation Timings

Am29F400B 29
AC CHARACTERISTICS
tRC
Addresses VA VA VA
tACC
tCE
CE#

tCH
tOE
OE#
tOEH tDF
WE#
tOH
High Z
DQ7 Complement Complement True Valid Data

High Z
DQ0–DQ6 Status Data Status Data True Valid Data

tBUSY

RY/BY#
Note:
VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle.
21505D-18
Figure 15. Data# Polling Timings (During Embedded Algorithms)

tRC
Addresses VA VA VA VA
tACC
tCE
CE#

tCH
tOE
OE#
tOEH tDF
WE#
tOH
High Z
DQ6/DQ2 Valid Status Valid Status Valid Status Valid Data
(first read) (second read) (stops toggling)
tBUSY

RY/BY#

Note:
VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read cycle,
and array data read cycle.
21505D-19
Figure 16. Toggle Bit Timings (During Embedded Algorithms)

30 Am29F400B
AC CHARACTERISTICS
Enter
Embedded Erase Enter Erase Erase
Erasing Suspend Suspend Program Resume

WE# Erase Erase Suspend Erase Erase Suspend Erase Erase

Read Suspend Read Complete
Program

DQ6

DQ2

Note:
The system may use either CE# or OE# to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within an
erase-suspended sector.
21505D-20
Figure 17. DQ2 vs. DQ6

Temporary Sector Unprotect

Parameter

JEDEC Std Description All Speed Options Unit

tVIDR VID Rise and Fall Time (See Note) Min 500 ns

RESET# Setup Time for Temporary Sector

tRSP Min 4 µs
Unprotect

Note: Not 100% tested.

12 V

RESET#
0 or 5 V 0 or 5 V
tVIDR tVIDR
Program or Erase Command Sequence

CE#

WE#
tRSP

RY/BY#

21505D-21
Figure 18. Temporary Sector Unprotect Timing Diagram

Am29F400B 31
AC CHARACTERISTICS
Alternate CE# Controlled Erase/Program Operations
Parameter Speed Options

JEDEC Std Description -45 -50 -55 -70 -90 -120 -150 Unit

tAVAV tWC Write Cycle Time (Note 1) Min 45 50 55 70 90 120 150 ns

tAVEL tAS Address Setup Time Min 0 ns

tELAX tAH Address Hold Time Min 45 45 45 45 45 50 50 ns

tDVEH tDS Data Setup Time Min 25 25 25 30 45 50 50 ns

tEHDX tDH Data Hold Time Min 0 ns

tOES Output Enable Setup Time Min 0 ns

Read Recovery Time Before Write

tGHEL tGHEL Min 0 ns
(OE# High to WE# Low)

tWLEL tWS WE# Setup Time Min 0 ns

tEHWH tWH WE# Hold Time Min 0 ns

tELEH tCP CE# Pulse Width Min 30 30 30 35 45 50 50 ns

tEHEL tCPH CE# Pulse Width High Min 20 ns

Programming Operation Byte Typ 7

tWHWH1 tWHWH1 µs
(Note 2) Word Typ 12

tWHWH2 tWHWH2 Sector Erase Operation (Note 2) Typ 1 sec

Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” section for more information.

32 Am29F400B
AC CHARACTERISTICS
555 for program PA for program
2AA for erase SA for sector erase
555 for chip erase
Data# Polling

Addresses PA
tWC tAS
tAH
tWH

WE#
tGHEL
OE#
tCP tWHWH1 or 2

CE#
tWS tCPH
tBUSY
tDS
tDH
DQ7# DOUT
Data
tRH A0 for program PD for program
55 for erase 30 for sector erase
10 for chip erase

RESET#

RY/BY#

Notes:
1. PA = Program Address, PD = Program Data, SA = Sector Address, DQ7# = Complement of Data Input, DOUT = Array Data.
2. Figure indicates the last two bus cycles of the command sequence, with the device in word mode.
21505D-22
Figure 19. Alternate CE# Controlled Write Operation Timings

Am29F400B 33
ERASE AND PROGRAMMING PERFORMANCE
Parameter Typ (Note 1) Max (Note 2) Unit Comments

Sector Erase Time 1.0 8 s Excludes 00h programming

Chip Erase Time 11 s prior to erasure

Byte Programming Time 7 300 µs

Word Programming Time 12 500 µs Excludes system level

Byte Mode 3.6 10.8 s overhead (Note 5)
Chip Programming Time
(Note 3) Word Mode 3.1 9.3 s

Notes:
1. Typical program and erase times assume the following conditions: 25°C, 5.0 V VCC, 1,000,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 4.5 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the four-bus-cycle sequence for the program command. See Table 5
for further information on command definitions.
6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.

LATCHUP CHARACTERISTICS
Description Min Max

Input voltage with respect to VSS on all pins except I/O pins
–1.0 V 12.5 V
(including A9, OE#, and RESET#)

Input voltage with respect to VSS on all I/O pins –1.0 V VCC + 1.0 V

VCC Current –100 mA +100 mA

Includes all pins except VCC. Test conditions: VCC = 5.0 V, one pin at a time.

TSOP AND SO PIN CAPACITANCE

Parameter
Symbol Parameter Description Test Setup Typ Max Unit

CIN Input Capacitance VIN = 0 6 7.5 pF

COUT Output Capacitance VOUT = 0 8.5 12 pF

CIN2 Control Pin Capacitance VIN = 0 7.5 9 pF

Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.

DATA RETENTION
Parameter Test Conditions Min Unit

150°C 10 Years
Minimum Pattern Data Retention Time
125°C 20 Years

34 Am29F400B
PHYSICAL DIMENSIONS
TS 048
48-Pin Standard Thin Small Outline Package (measured in millimeters)
0.95
1.05

Pin 1 I.D.
1 48

11.90
12.10

0.50 BSC

24 25

18.30 0.05
18.50 0.15

19.80
20.20

16-038-TS48-2
0.08 TS 048
1.20 0.20 DT95
MAX 8-8-96 lv
0.10
0.21
0°
0.25MM (0.0098") BSC 5°

0.50
0.70

TSR048
48-Pin Reverse Thin Small Outline Package (measured in millimeters)
0.95
1.05

Pin 1 I.D.
1 48

11.90
12.10

0.50 BSC

24 25

18.30 0.05
18.50 0.15

19.80 SEATING PLANE

20.20

16-038-TS48
TSR048
0.08 DT95
1.20 0.20 8-8-96 lv
MAX 0.10
0.21
0°
0.25MM (0.0098") BSC 5°

0.50
0.70

Am29F400B 35
PHYSICAL DIMENSIONS
SO 044
44-Pin Small Outline Package (measured in millimeters)

44 23

13.10 15.70
13.50 16.30

1 22
1.27 NOM.

TOP VIEW

28.00
28.40

2.17 0.10
2.80 0.21
2.45 MAX.
0°
SEATING 8° 0.60
0.35 0.10 PLANE 1.00
0.50 0.35
END VIEW
SIDE VIEW 16-038-SO44-2
SO 044
DF83
8-8-96 lv

REVISION SUMMARY
Revision C (January 1998) Revision C+2 (April 1998)
Global Distinctive Characteristics
Formatted for consistency with other 5.0 volt-only Changed minimum 100K write/erase cycles guaran-
data sheets. teed to 1,000,000.
AC Characteristics Product Selector Guide, Ordering Information

Changed tDF and TFLQZ to 15 ns for -55 speed option. Added 55 ns ±10% speed option.
AC Characteristics
Revision C+1 (February 1998)
Word/Byte Configuration: Changed tFHQV specification
Table 2, Top Boot Block Sector Address Table for 55 ns device.
Corrected the sector size for SA10 to 16 Kbytes/ Erase/Program Operations: Changed t WHWH1 word
8 Kwords. mode specification to 12 µs. Corrected the notes refer-
DC Characteristics—TTL/NMOS Compatible ence for tWHWH1 and tWHWH2. These parameters are
100% tested. Corrected the note reference for tVCS.
Deleted Note 4.
This parameter is not 100% tested.
Changed tDS and tCP specifications for 55 ns device.
Alternate CE# Controlled Erase/Program Operations:
Changed tWHWH1 word mode specification to 12 µs.

36 Am29F400B
Corrected the notes reference for tWHWH1 and tWHWH2. Table 7, Test Specifications
These parameters are 100% tested. Test load capacitance: Removed 55 ns speed option
Changed tDS and tCP specifications for 55 ns device. from and added -45 speed option to the 30 pF.

Temporary Sector Unprotect Table DC Characteristics

Added note reference for tVIDR. This parameter is not Removed VCC = VCC max test condition for ICC1 – ICC3.
100% tested. VCC max is only valid for max specs.

Erase and Programming Performance AC Characteristics

Changed minimum 100K program and erase cycles Added the -45 speed option.
guaranteed to 1,000,000.
Revision C+4 (August 1998)
Revision C+3 (June 1998) Ordering Information
Distinctive Characteristics Added extended temperature combinations to the -55,
High Performance: Changed “Access times as fast as ±10% speed option.
55 ns” to “Access times as fast as 45 ns”. Deleted the -60 speed option.
General Description
Revision D (January 1999)
Third paragraph: Added 45 ns to access times.
Distinctive Characteristics
Product Selector Guide
Added:
Added the -45 speed option for VCC = 5.0 V ± 5% and
the -55 speed option for VCC = 5.0 V ± 10%. ■ 20-year data retention at 125°C

Ordering Information — Reliable operation for the life of the system

Added “Special Designation” to “Optional Processing” DC Characteristics—TTL/NMOS Compatible

heading; added “0” for 55 ns 10% VCC, deleted burn-in. ICC1, ICC2, ICC3: Added Note 2 “Maximum ICC
Burn-in is available by contacting an AMD representative. specifications are tested with VCC = VCCmax”.
Added -55 ± 10% and -45 speed options to the list of DC Characteristics—CMOS Compatible
valid combinations. Added extended temperature ICC1, ICC2, ICC3: Added Note 2 “Maximum ICC
ratings to -55 ±5% valid combinations. specifications are tested with VCC = VCCmax”.
Table 1, Device Bus Operations Erase and Programming Performance
Changed the BYTE#=VIL input for DQ8–DQ15 during Deleted “(4.75 V for -45 and -55xx0)” from Note 2.
temporary sector unprotect to “don’t care” (X).
Figure 6. Maximum Negative Undershoot Revision D+1 (July 2, 1999)
Waveform Global
Corrected figure title. Added references to availability of device in Known
Good Die (KGD) form.

Trademarks
Copyright © 1999 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
ExpressFlash is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.

Am29F400B 37