Zeiss SmartSEM Software Manual PDF
Zeiss SmartSEM Software Manual PDF
Zeiss SmartSEM Software Manual PDF
®
SmartSEM V05.06
Operating software for
Scanning Electron Microscopes
Carl Zeiss Microscopy - Electron and Ion beam Microscopy
Software Manual
®
SmartSEM V05.06
Operating software for Scanning Electron
Microscopes
Software Manual SmartSEM® V05.06
Operating software for Scanning Electron Microscopes
Original instructions
346000-8077-000
This document or any part of it must not be translated, reproduced or transmitted in any form or by any means, electronic or
mechanical, including photocopying, recording, or by any information or retrieval system. Violations will be prosecuted.
The use of general descriptive names, registered names, trademarks, etc. in this document does not imply, even in the absence of a
specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use.
Software programs will fully remain the property of Carl Zeiss Microscopy. No program, documentation or subsequent upgrade thereof
may be disclosed to any third party, unless prior written consent of Carl Zeiss Microscopy has been procured to do so, nor may they be
copied or otherwise duplicated, even for the customer’s internal needs apart from a single back-up copy for safety purposes.
Due to an ongoing process of improvement Carl Zeiss Microscopy reserves the right to make modifications of this document without
notice.
Contents
Table of Contents
1. Introduction ................................................................................................ 11
1.1. For your safety ............................................................................................... 11
1.1.1. Intended use .......................................................................................................... 11
1.2. About this manual .......................................................................................... 11
1.2.1. Safety instructions in this manual .......................................................................... 12
1.2.2. Typographical conventions .................................................................................... 13
1.2.3. Definition of terms ................................................................................................. 14
2. Description ................................................................................................. 15
2.1. System requirements ..................................................................................... 15
2.1.1. Operating system .................................................................................................. 15
2.1.2. Dongles ................................................................................................................. 15
2.2. Installation ...................................................................................................... 15
2.3. SmartSEM® program suite ............................................................................ 16
2.4. Available licences .......................................................................................... 19
2.5. Principle of operation .................................................................................... 23
2.6. SmartSEM® user interface ............................................................................ 24
2.7. User access levels ......................................................................................... 26
4. Operation ..................................................................................................... 59
4.1. Controlling the vacuum ..................................................................................59
4.1.1. Checking the current vacuum status ..................................................................... 59
4.1.2. Ventilating the specimen chamber ........................................................................ 61
4.1.3. Evacuating the specimen chamber ....................................................................... 63
4.1.4. Working with variable pressure (VP instruments only) .......................................... 64
4.2. Navigating the specimen ...............................................................................66
4.2.1. Moving the specimen with the soft joystick ............................................................ 66
4.2.2. Moving the specimen at high magnifications (Beam Shift) .................................... 67
4.2.3. Improving stage repeatability by activating the function ....................................... 68
4.2.4. Compensating for image drift by shifting the beam (licence: DRIFT CORR) ........ 69
4.2.5. Using fisheye mode (licence: FISHEYE) ............................................................... 72
4.2.6. Using the stage navigation functions ..................................................................... 74
4.2.7. Eucentrically driving a non-eucentric stage (licence: COMPU) ............................. 78
4.2.8. Saving and recalling stage coordinates (licence: STAGECO) ............................... 84
4.2.9. Centering a spot or an area (licence: CENTRE) ................................................... 85
4.2.10. Using Stage Map (licence: CENTRE) .................................................................. 86
4.2.11. Scanning defined image fields (licence: STAGESCAN) ...................................... 87
4.2.12. Toggling between survey view and detail view (licence: SURVEY) .................... 88
4.2.13. Defining a user specific coordinate system (licence: STAGEREG) ..................... 91
4.3. Setting SEM conditions ..................................................................................93
4.3.1. Controlling the gun ................................................................................................ 93
4.3.2. Controlling the EHT ............................................................................................... 95
4.3.3. Blanking the beam ................................................................................................. 97
4.3.4. Modifying the probe current ................................................................................... 98
4.3.5. Aligning the aperture ........................................................................................... 102
4.3.6. Correcting astigmatism ........................................................................................ 103
4.3.7. Showing SEM parameters (SEM status window) ................................................ 104
4.3.8. Recording SEM parameters ................................................................................ 106
4.4. Imaging ..........................................................................................................109
4.4.1. Setting detection parameters ............................................................................... 109
4.4.2. Setting the working distance ................................................................................ 121
4.4.3. Setting scan parameters ...................................................................................... 122
4.4.4. Setting the magnification ..................................................................................... 130
4.4.5. Imaging tilted specimen ....................................................................................... 131
4.4.6. Improving the signal-to-noise ratio (noise reduction) ........................................... 135
4.4.7. Improving image illumination by using Look Up Tables (LUT) ............................ 138
4.4.8. Processing the image (licence: IMMATH) ........................................................... 143
4.5. Annotating images ....................................................................................... 153
4.5.1. Adding text .......................................................................................................... 153
4.5.2. Adding geometrical objects ................................................................................. 154
4.5.3. Adding EM parameters ........................................................................................ 155
4.5.4. Adding a bitmap or metafile ................................................................................. 156
4.5.5. Zone magnification .............................................................................................. 156
4.5.6. Adding micron markers ....................................................................................... 157
4.5.7. Measuring ............................................................................................................ 158
4.5.8. Editing Annotations ............................................................................................. 161
4.5.9. Displaying crosshairs or graticules (licence: GRATICULE) ................................. 163
4.6. Working with recipes ................................................................................... 166
4.6.1. Saving a user-specific recipe .............................................................................. 166
4.6.2. Saving a common recipe ..................................................................................... 166
4.6.3. Viewing a recipe .................................................................................................. 167
4.6.4. Executing a recipe ............................................................................................... 168
4.6.5. Deleting a recipe ................................................................................................. 168
4.6.6. Creating an ingredient list .................................................................................... 169
4.6.7. Using the MiniBar to work with recipes ............................................................... 172
4.7. Saving and managing images ..................................................................... 173
4.7.1. Saving images ..................................................................................................... 173
4.7.2. Taking videos (licence: AVI capture) ................................................................... 178
4.7.3. Loading images ................................................................................................... 179
4.7.4. Using the Image Gallery ...................................................................................... 180
4.7.5. Printing images .................................................................................................... 181
4.7.6. Copying images to the Windows® buffer (licence: CLIP) .................................... 182
4.7.7. Transmitting data to a FTP server or a network printer (licence: REMARCH) .... 184
4.7.8. Using the Large Image Store Wizard .................................................................. 187
4.8. Managing users ............................................................................................ 190
4.8.1. Managing user profiles ........................................................................................ 190
4.8.2. Managing user accounts (licence: ACCOUNT) ................................................... 198
4.9. Customising the SmartSEM® software ...................................................... 206
4.9.1. Customising joystick and control panel settings .................................................. 206
4.9.2. Setting mouse adjustment preferences ............................................................... 206
4.9.3. Disabling the splash screen on startup ............................................................... 207
4.9.4. Personalising the user interface (User Preferences) ........................................... 208
4.9.5. Customising the data zone .................................................................................. 212
4.9.6. Customising the toolbar ....................................................................................... 215
4.9.7. Customising the magnification display ................................................................ 220
4.9.8. Showing the installed licences ............................................................................ 223
4.10. Remotely controlling the SEM/FESEM ..................................................... 224
4.10.1. Using RS232 (licence: REMCON) ..................................................................... 224
4.10.2. Using Windows XP Remote Desktop Connection (licence: Remote SEM) ....... 225
1. Introduction
Read the instructions in this software manual carefully. Keep the software manual nearby the
scanning electron microscope (SEM) or field emission scanning electron microscope (FESEM)
and hand it over to future owners of the
instrument.
The SmartSEM® software is intended for the operation of Carl Zeiss SEMs/FESEMs such as SU-
PRA™, ULTRA, and Cross Beam® series.
The SmartSEM® software has to be run exclusively on a personal computer delivered by Carl
Zeiss.
Any other applications are not allowed.
This software manual is designed for operators who have been trained to operate the
SEM/FESEM by an authorised expert. It is assumed that the operator is familiar with Windows®
based programs.
Operators of the SEM/FESEM must not deviate from the instructions provided in this manual.
The safety instructions in this manual follow a system of risk levels, that are defined as follows:
CAUTION
This safety symbol and signal word indicates a potentially hazardous situation.
Disregarding this warning MAY result in minor or moderate injury.
CAUTION
This signal word used without a safety symbol indicates a potentially hazardous situation.
Disregarding this warning MAY result in property damage.
IMPORTANT
This symbol and signal word draws your attention to important and useful
information.
For the description of software, the following typographical conventions are used:
Typography Meaning
Type <key1, key2> Type key 1 first, then type key 2 on the keyboard.
Type <Ctrl + Alt + Del>. Simultaneously type CTRL key, ALT key and DEL
key on the keyboard.
Click the High voltage icon. Icons, buttons, and menus are printed in bold.
Select Aperture size from the drop down list.
Select Aperture size 30 µm from the drop-down Values to be selected are printed in italics.
list.
Text Meaning
Carl Zeiss service engineer, Specially trained service expert, either Carl Zeiss staff or authorised
Carl Zeiss service staff service partner of Carl Zeiss.
2. Description
IMPORTANT
The screenshots shown in this software manual are taken from SmartSEM® V05.06 that
runs on Windows® XP.
If SmartSEM® V05.06 is run on Windows® 7, the screenshots look slightly different.
This does not affect operation of the software.
IMPORTANT
The paths in the software are described for Windows® XP. The only difference on
Windows® 7 is that the software and its components can be found under
“Start/All Programs ...“ instead of “Start/Programs...“.
CAUTION
The integrated personal computer delivered with the SEM/FESEM should mainly be used
to control the SEM/FESEM and to archive images, because the installation of additional
software programs might cause problems.
Before installing additional software programs contact your local Carl Zeiss service engi-
neer for his/her recommendation.
2.1.2. Dongles
IMPORTANT
If a dongle is lost, contact your local Carl Zeiss service engineer to order one.
Microscope type and serial number have to be mentioned in the order.
2.2. Installation
The fundamental part of the SmartSEM® program suite is the EM server, which implements the
internal communication between control software and microscope hardware.
Besides EM Server, the SmartSEM® program suite includes several programs and utilities.
Select Start/Programs/...
FTP Image Archiving For transferring data via FTP Requires REMARCH licence
SEM Drift Correction Compensates for the drift of the speci- Requires DRIFT-CORR
men by using a reference image and licence.
by controlling the beam shift
...SmartSEM Calibration Wizard Service activities For Carl Zeiss service staff
Service only
Gun Monitor Utility for monitoring important para- Refer to section 4.3.8.
meters of the SEM/FESEM.
Smart Stage Mapping Service activities For Carl Zeiss service staff
only
Upgrade Server Database Service activities For Carl Zeiss service staff
only
SmartBackup Tool Utility for backing up configuration and Refer to section 4.12.
calibration data.
Merlin Alignment Wizard Service activities For Carl Zeiss service staff
only
Merlin Database Wizard Service activities For Carl Zeiss service staff
only
Select Start/Programs/...
Online Help Instructions how to use the applica- Requires the licence Smart-
...SmartStitch tion. Stitch.
(if installed)
SmartStitch Image Stitch- Opens the SmartStitch user interface.
ing Application
Select Start/Programs/...
...Smart3D Smart3D Opens the Smart3D user interface. Requires particular soft- and
(if installed) hardware.
Smart3D Help Instructions how to use the applica-
tion.
Software licences are used to enable specific functionality in the SmartSEM® software.
Some licences are provided as standard with a specific model of SEM/FESEM, others are pur-
chased as options. When the SEM/FESEM is delivered, the standard and the additionally pur-
chased licences are already installed.
16 Bit TIFF TIFF16 348224-6052 Enables to save TIFF images with a grey value depth /
grey level depth of 16 bit.
Adjustable Reduced REDUCED 350076-0372 Allows using a scan window with variable size and
Raster position, especially recommended for the adjustment
of parameters such as focus or stigmator.
Analytical I/F Particle PARTICLE 348224-6032 Specific software for automatic particle analysis.
Scan Application Requires particular hardware.
API (Application Pro- STDAPI 348224-6036 Allows SmartSEM® to be controlled via external pro-
gramming Interface) grams. For example 3D EDS software uses this
functionality
AVI Capture AVI 348224-6056 Enables capture of image sequences and storage in
an AVI file.
Centre Feature/Stage CENTRE 348224-6005 Enables the point centring (Centre Point) and feature
Map centring (Centre Feature) functions. Enables the func-
tion "stage overview map" (Stage Map).
Colour Mode COLOUR- 348224-6074 Enables functionality that converts the signal from dif-
MODE ferent signal sources in real time and displays it live in
false colours without losing important information.
Customer Calibration CUSTOMER_C 351434-6133 Allows the user to change service calibration
Privilege ALIB_PRIV parameters.
Cut & Paste CLIP 350076-0370 Enables the user to copy and insert SEM images to
and from the buffer store.
Defect Review DEFECT- 351434-6024 Defect Review is used to find defects on a wafer or a
REVIEW mask based on the results from KLA Tencor results
file. The defect review dialog allows the user to open a
wafer defect file (.rff/.001) and view the defect list (with
associated images) and file header details.
Requires: Licence STAGEREG 348224-6029
Useful: Licence CENTRE 348224-6005
Depth Mode DEPTH_MODE 348224-6084 Enables higher depth of field at lower resolution.
Different levels of relief-like specimens with height var-
iations can be in focus at the same time.
Drift Correction DRIFT- 348224-6058 Image analysis software to compensate for image drift
CORR by beam shift control.
Requires additional hardware.
Dual Channel DUAL- 348224-6062 Enables the display of two different detector signals in
CHANNEL different SmartSEM® windows.
Dual Image DUAL IMAGE 348224-6047 Dual image - Win 2k uniplinth only.
Dual Magnification DUALMAG 348224-6003 Enables a user defined area on the left hand half of a
split screen display to be zoomed from 1x to 10x.
Images from different detectors can be displayed at
the different magnifications.
Dynamic Focus DYNFOCUS 350076-0364 Enables a dynamic adaptation of the focus to tilted
specimen surfaces during beam passage.
Field Mode FIELD_MODE 350700-0743 Ability to select field mode (wide field of view) on EVO
systems
Fisheye FISHEYE 348224-6080 Enables fisheye image of sample holder and interior of
the specimen chamber.
FTP Remote Archiving REMARCH 348224-6038 Enables to send files to a FTP server or network
printer.
Graticule GRATICULE 350076-0379 Allows display of a grid on the screen with a line dis-
tance between 50 and 512.
High Current Mode HIGH- 348224-6048 Special control of the electron optics to increase the
CURRENT specimen current.
Not available for SUPRA™ 25.
Image Maths IMMATH 348224-6013 Allows mathematic manipulation of the content of the
image memory, e.g. by using Kernel functions, by
adding or subtracting images or by detecting grey
levels.
Image stitching licence IMAGESTITCH 351434-6113 SmartStitch, standalone application for producing tiled
images or montages from a set of individual over-
palling images captured via SmartSEM®.
Input Gamma GAMMALUT 348224-6009 Release of the Input LUT function to individually adjust
the characteristic input line of a detector.
Input Signal Invert INVERT 350076-0367 Enables to invert of the signal using Input-LUT.
Knights Camelot KNIGHTS 351434-6043 Knights Camelot software is a CAD navigation tool for
Integration CAMELOT locating specific features on a semiconductor die. It
works by registering the sample with the design of the
die to allow the CAD image and SEM images to be
synchronised to the same field of view. It is also possi-
ble to overlay the image with parts of the design.
Large Beamshift LARGE-BEAM- 348224-6072 Allows working with an expanded beam shift (+/-
SHIFT 100 µm in X and Y).
Requires particular hardware.
Low Voltage Working LOWVOLTS 348224- 6041 Acceleration voltage range minimum is set to 0.1 kV
(without this licence only 0.5 kV can be set).
Pivot Point Calibration PIVOT_POINT_ 354734-6108 Allows user to ise software thad does a very precise
CAL mag calibration for forensic work.
Plasma Cleaning PLASMA 351434-6177 Enables software control of the Plasma Cleaner.
Remote SEM REMOTESEM 348224-6057 Remote operation of the microscope is possible using
the Windows XP Remote Desktop Connection feature.
RS232 Remote Control REMCON 348224-6014 Allows remote operation and interrogation of the SEM/
FESEM by serial communication using RS 232.
Scan Rate Expansion SCANEXP 350076-0358 Makes fifteen different scan speeds available (without
this licence only three are available).
Scan Rotation SCANROT 350076-0359 Allows electronic rotation of the image by changing the
scan direction.
Signal Mixing SIGMIX 350076-0350 Allows continued mixing of two detector signals in the
range between 0 and 100%.
SmartBrowse SMART- 351434-6144 The additional software SmartBrowse allows the user
BROWSE to sort images by various parameters, such as stage
position or detector used.
Smart Stage Mapping SMART- 348224-6081 Calibration routine that optimises the stage accuracy.
STAGE-
MAPPING
SmartSEM Report REPORT_GEN 351434-6092 Enables an Office 2007 add in ribbon that imports
Generator ERATOR CZTIFF images and can read the tags so users can
create reports. The CZTIFF images can be created by
previous software versions.
Spot Mode SPOT 350076-0383 Spot positioning of the electron beam on a given spot
of the specimen.
Stage Coordinate store STAGECO 348224-6006 Allows saving stage coordinates together with the
and recall magnification and the working distances. The stage
can automatically be driven to these positions.
Stage Fine Step FINESTEP 348224-6050 Allows more precise movement of the stage.
Stage Registration STAGEREG 348224-6029 Defines user specific coordinate systems for the speci-
men stage.
Stage Scan STAGESCAN 348224-6007 Allows analysis of a sample range in the form of a
series of exactly defined regularly dispersed image
fields.
Stage Survey Mode SURVEY 348224-6040 Magnifications and working distances for two different
working modes can be started automatically.
User Align USERALIGN 351434-6022 The user align function keeps track of which alignment
values each user has utilised for different operating
conditions.
When these conditions are next used, the previous
alignment values will be reloaded. The operation of
user align requires no extra involvement of the user,
once the function has been enabled on the SEM condi-
tions page of the user preferences dialog.
The SEM/FESEM is operated by the SmartSEM® software: All commands, settings and functions
necessary for the handling of the SEM/FESEM are controlled by the SmartSEM® software using
keyboard and/or mouse.
The motorised stage can be operated by the dual joystick or by the software.
In most cases, the SmartSEM® user interface offers more than one possibility to run a function.
For instance, to switch on the EHT you can use
• the menu bar or
• the status bar or
• the MiniBar or
• the Gun tab in the SEM Controls panel.
This allows the user to operate the SmartSEM® software according to his/her individual pre-
ferences.
The SmartSEM® software is operated via a graphical user interface that can be used intuitively.
radio button
caption bar icon panel
menu bar toolbar tab checkbox
Menu bar When left-clicking on a menu, the pull-down menu shows the different submenus.
User toolbar Most icons in the toolbar are assigned twice. The different functions and parameters can be
activated by pressing the left or the middle mouse button. When moving the cursor across the
icon, tool tips show the different assignments.
MiniBar The MiniBar provides quick access to recently used dialogs and to the recipe management.
Status bar The status bar shows the active mouse assignment:
• Left: left mouse button
• Mid: middle mouse button
Moreover, it shows the Coarse/Fine toggle button and allows access to a pop-up menu for quick
control of important SEM parameters.
Annotation bar The annotation bar allows putting additional information on the SEM image. Text, SEM parameter
data, and even bitmaps (like logos etc.) can easily be added to the image. Moreover, it provides
several measurement functions.
Data zone The data zone contains important information on the recording parameters of the current image.
Each user can design the data zone as desired and store it together with the image.
Panel Confi- The panel configuration bar allows accessing to several functions which are listed alphabetically.
guration Bar
Red dot A red dot displayed in the lower right corner of the
image area indicates that the image has been fro-
zen.
SmartSEM® distinguishes three user access levels. The user access level defines which para-
meters are displayed for selection purposes (e.g. in the status window selection, annotation para-
meter selection).
• Novice
Displays only those items assigned as novice category. These include most frequently used
parameters.
• Expert
Displays items assigned as novice and expert category. These include parameters useful for
advanced operators.
• Service/Full
Displays all items, also including infrequently uses items and calibrations.
The user profile is the collection of privileges and settings associated with the username.
3. First steps
Prerequisites:
• The SEM/FESEM is switched on.
• The Windows® operating system has been loaded.
The EM Server is minimised to a small element (icon) on the right side of the Windows® task bar.
Several toolbars such as user toolbar, status bar, and annotation bar are available for easy
access to the SmartSEM® functions.
1 Select View/Toolbars.
Alternatively, type <Ctrl+B>.
The data zone is a special group of annotation objects which are used to display current para-
meters. You can also include a µ-marker to show the base magnification.
To take advantage of the full monitor size to display the microscopic image, show a full screen
image.
It is possible to dock various panels onto the main window. The purpose of the docking panel is
to keep the area of the image completely clear, as the docking panel is outside the main window.
3 To move the docking panel to the left hand side, pick up the panel by clicking on the title bar
and drag it to the other side of image area.
4 To stick a control panel to the docking panel, click the title bar of the control panel and drag
it to the docking panel.
The following section summarizes basic sequences to quickly obtain an image using the SE2 de-
tector. To simplify the procedure, the method described mainly uses SEM Controls panel and
status bar functions.
Dependent on your type of SEM/FESEM (Standard vacuum system, VP vacuum system, Cross
Beam® series), the SmartSEM®user interface may differ slightly.
Prerequisite:
• SmartSEM® software has been started and is ready to control the SEM/FESEM.
Lint-free gloves -
IMPORTANT
Contamination caused by fingerprints can lead to vacuum deterioration or prolonged
pumping times. Always wear lint-free gloves when touching specimen, sample holder or
stage.
CAUTION
Risk of damaging the objective lens and/or your specimen
Ensure not to hit the objective lens while driving the stage. Change to TV mode to observe
the moving stage.
CAUTION
Suffocation hazard due to lack of oxygen, since the specimen chamber is ventilated with
nitrogen.
After the specimen exchange, keep the chamber door open as short as possible.
Avoid inhaling the air from within the specimen chamber.
IMPORTANT
Contamination caused by fingerprints can lead
to vacuum deterioration or prolonged pumping
times.
Always wear lint-free gloves when touching
specimen, sample holder or stage. Keep the
chamber door open as short as possible.
CAUTION
Pinch hazard when closing the chamber door
Use the door handle to close the chamber door. Ensure not to get your fingers caught in
the chamber door gap.
CAUTION
Risk of damaging the objective lens and/or your specimen.
Ensure not to hit the objective lens while driving the stage. Change to TV mode to observe
the moving stage.
2 Move the specimen by using the dual joystick (optional) or by calling the Soft Joystick via
Tools/Goto Panel/Soft Joystick.
’EHT’ stands for acceleration voltage. This voltage has to be applied to the gun in order to make
it emit electrons.
10 Correct astigmatism:
a Select a detail (e.g. a mark or an edge) on
the specimen surface.
b Click the Reduced Raster icon.
Ensure the selected detail is in the raster.
The SmartSEM® user interface offers a multitude of help texts containing information on the
operation of the SEM/FESEM, the optimization of the images and the handling of accessory
options.
1 Press <F1>.
Alternatively, select Help/SmartSEM help from the menu.
1 Press <SHIFT+F1>.
Alternatively, select Help/What’s This from
the menu.
Many functions and menus which are often used in the SmartSEM® user interface can also be
opened using the keyboard. A list of shortcuts (key combinations) can be displayed in the Smart-
SEM® help.
1 Press < F9>.
Alternatively, select Help/Keys help from the menu.
3.6.2. Exiting
4. Operation
Because a good vacuum is essential for the operation of the SEM/FESEM it is recommended
keeping always an eye on the vacuum in specimen chamber and gun head.
Alternatively:
Select Vacuum/Vacuum Status from the
menu.
Alternatively:
Type <CTRL+SHIFT+V>.
In order to be able to open the specimen chamber for specimen exchange, the vacuum has to be
broken in a controlled manner. This is done by filling the specimen chamber with gaseous nitro-
gen.
Alternatively:
1 Go to the Gun tab and select EHT Off
from the drop-down list.
2 In the Vacuum tab, click Vent.
Alternatively:
1 In the status bar, click All:.
2 Select EHT Off from the pop-up menu.
a Click Vac:.
b Select Vent.
Alternatively:
1 In the MiniBar, click Start.
2 Select EHT Off.
To continue operation after a specimen exchange, the specimen chamber has to be evacuated
again.
Alternatively:
1 In the Vacuum tab, click Pump.
Alternatively:
1 In the status bar, click Vac:.
2 Select Pump from the pop-up menu.
Alternatively:
1 Select Start/Pump from the MiniBar.
Working with variable pressure (VP) allows you to analyse and image non-conducting, strongly
gassing or humid specimens. This is made possible by a special pumping system, which allows
setting partial pressures of 1 to 133 Pa in the specimen chamber, while preserving the ultra high
vacuum in gun area and beam path.
Using VP mode is only possible with a VP type SEM/FESEM.
Alternatively:
Double-click the VP Target field and enter the
pressure value.
3 Click Go To VP.
IMPORTANT
In VP mode, InLens detector and SE2 detector cannot be used.
Instead, backscattered electron detectors or specially designed VPSE detectors should be
selected.
1 Click Go To HV.
Alternatively to the dual joystick, you can navigate the specimen by using the software function
Soft joystick. This function is helpful when you wish to move a single axis without the risk of mov-
ing another axis as well.
Alternatively:
Click Stage stop in the Stage tab of the SEM
Controlss panel.
IMPORTANT
To prevent damage, a touch alarm is integrated
in the SEM/FESEM: If specimen or sample hold-
er touch chamber walls, detectors or objective
lens, the stage is stopped immediately. An audi-
ble warning and an on-screen message are
given.
The Beam Shift function is helpful when moving the specimen at magnifications above 100,000
x. At this magnification range it is generally difficult to exactly position an image feature by driving
the stage. Therefore, the image of the specimen can be moved by shifting the electron beam in-
stead of displacing the specimen itself.
Alternatively:
Select Tools/Goto Control Panel/Apertures.
The left mouse button is assigned to Beam Shift X and Y. The middle mouse button keeps the
current assignment.
The electron beam can be shifted by +/- 7.5 µm in the X and Y directions.
is employed to take up the necessary mechanical play in the stage motors, so that any absolute
stage position is always approached from the same direction, improving the repeatability of mo-
torised stage movement.
A submenu opens.
3 Select /On.
4.2.4. Compensating for image drift by shifting the beam (licence: DRIFT
CORR)
The drift correction is a program to compensate for the drift of the specimen by using a reference
image and by controlling the beam shift. This function has two main applications:
• Improvement of the drive precision of the stage
When viewing a specific image section and driving the stage to another point, a drift is often
observed when moving back to the specific point.
• Long-term analysis
If an image section is scanned for a longer time, mechanical, thermal and electrical effects
will always cause a drift of the respective image section.
It is essential to find a striking detail of the specimen to be defined as a reference image. This
detail will be sought later on in the current image by using image analytical algorithms.
Requires the licence DRIFT CORR and the installation of the Matrox Imaging Library, which is
protected by a dongle.
1 Select Start/Programs/SmartSEM.
SEM/FESEM: Select Drift Prepare.
XB: Select SEM Drift Correction.
Defines the precision of the drift correction. Indicates the largest allowed pixel distance be-
tween the current image and the corrected image. If this pixel distance is exceeded, the drift
correction will not be accepted.
For most applications this parameter should be set to 1 to 4.
Defines how often the algorithm will try to compensate a possible image drift by using the
beam shift.
For most applications this parameter should be set to 5 to 15.
Defines the precision of the correlation between reference image and found image section.
For most applications this parameter should be set to 40% to 60%.
Fisheye mode allows you to get a survey of the complete specimen chamber by providing a top
view on the sample holder at a low Z.
Requires the licence FISHEYE.
IMPORTANT
Since the image is deformed due to the fisheye lens effect, measurements and the exact
specification of the magnification are not possible. Therefore, a question mark is shown
next to the micron marker.
IMPORTANT
This function requires the stage to be initialised.
2 Select your type of sample holder from the Sample Holder drop-down list.
1 3
4 Select the installed sample holder from the list of icons on the left.
The Is available checkbox is ticked to indicate that the selected sample holder can be
installed on the system.
This function allows rotation-eucentric and tilt-eucentric control of a non-eucentric stage by using
software.
Requires the licence COMPU.
Different calibration procedures are required before the compucentric software can be used:
• Calibration of the rotation centre of the stage
(required for rotation-eucentric control and tilt-eucentric control)
• Calibration of the distance between specimen surface and rotation centre of the tilt axis
(additionally required for tilt-eucentric control)
IMPORTANT
The calibration of the rotation centre is independent of the used sample holder and the
used specimen. Therefore, this calibration can be use generally.
It is recommended that you use a single stub holder and a calibration grid or a TEM grid as spe-
cimen. The specimen must be mounted centrally on the stub.
Alternatively:
4 Click Next.
The stage is initialised.
7 Click Next.
The stage is driven back to its initial position.
8 Click Next.
The stage rotates by 180°.
During stage rotation observe the striking fea-
ture on the specimen in order to be able to
relocate it after rotation.
11 Click Next.
The stage returns to the initial position.
IMPORTANT
As the calibrated distance depends on specimen and sample holder, this routine must be
performed separately for each specimen and sample holder.
IMPORTANT
The more precisely and thoroughly the calibration is done, the more precisely the stage
can be driven by the compucentric software.
IMPORTANT
If only the stage centre has been calibrated, only rotation-eucentric control in the horizon-
tal line (Tilt = 0) will be possible.
CAUTION
Danger of malfunction of the stage, when using the joystick.
After activating the compucentric software functions, only drive the stage to absolute or
relative coordinates. To do so, use the ’Go To’ fields or the ’Delta’ buttons.
7 Click Finish.
This function offers the possibility to save a list of stage positions together with magnification and
working distance. Thus, the user can recall these positions easily.
Requires the licence STAGECO.
The feature range is being moved to the centre of the image area and magnified.
This function allows using a frozen image in the left zone (zone 0) as an overview for the selection
of interesting features on the specimen surface.
Requires the licence CENTRE.
5 Select a feature of interest in the left zone by placing the cross and clicking.
In the right zone (zone 1), the selected feature is displayed. You can modify the image, e.g. mag-
nify as required.
This function allows you to scan an exactly defined series of regularly distributed image fields.
This is useful when searching for particles or other objects in a large sample range, as it is en-
sured that no part of the interesting area will be omitted.
Four scan patterns and several methods are available to determine the scan range.
Requires the licence STAGESCAN.
4.2.12. Toggling between survey view and detail view (licence: SURVEY)
This function offers the possibility to save two different settings for magnification and working dis-
tance and to switch between these settings. The settings are called Survey Mode (provides a
survey view) and Resolution Image (provides a detail view).
Requires the licence SURVEY.
IMPORTANT
This function requires the stage to be initialised.
Alternatively:
Select Stage/Survey/Survey Mode from the
menu.
Alternatively:
Select Stage/Survey/Survey Mode in order
to untick the function in the menu.
This function offers the possibility to define a user specific 2D coordinate system based on three
reference points. Within this coordinate system, the stage can move to specific spots on the
specimen, while the stage coordinates can be saved.
Requires the licence STAGEREG.
If there are three spots on the specimen, whose distances to the saved stage coordinates are
defined, these spots can be used as reference points.
It is possible to create up to nine different coordinate systems.
6 Enter a name.
7 Click Setup Registration.
15 Click Finish.
IMPORTANT
The In-lens detector can be used up to an acceleration voltage of 20 kV.
At higher acceleration voltages the efficiency of the In-lens detector will be markedly re-
duced.
IMPORTANT
SUPRA™ 25 only:
To be able to set a value below 0.5 kV, the licence LOWVOLTS is required.
To be able to set a value from 20 kV to 30 kV, the licence EXTVOLTS is required.
Alternatively:
Select Beam/EHT On from the menu.
Alternatively:
Select Beam/EHT Off from the menu.
To protect sensitive specimens from the electron beam, you can blank the beam.
IMPORTANT
This procedure does not refer to the optional Beam Blanker for MERLINTM.
For information on the optional MERLINTM Beam Blanker, refer to the Instruction Manual
Beam Blanker delivered with the Beam Blanker.
Alternatively:
Select Beam/Aperture from the menu.
The probe current (beam brightness) is determined by aperture size and extractor voltage. More-
over, it can be increased by using the high current mode.
Depending on your application, choose one of these three possibilities to modify the probe cur-
rent.
Using the option OptiProbe offers the possibility to automatically set the probe current.
Alternatively:
Select Beam/Aperture from the menu.
CAUTION
Performance and resolution of the SEM/FESEM can be impaired.
Avoid reducing the extractor voltage.
If at all, reduce the extractor voltage only for a short time (1-2 h) and by maximum 500 V.
IMPORTANT
The newly set extractor voltage is only valid for the current work session.
After a restart of the SmartSEM® software, the SEM/FESEM will restore the nominal volt-
age.
Alternatively:
Select Beam/Aperture from the menu.
IMPORTANT
After cathode replacement or after re-alignment of the electron optical column, OptiProbe
has to be calibrated. Refer to section 5.3.
The alignment of the aperture in the beam path has a decisive effect on resolution and sharpness
of the image.
The aperture alignment should therefore be adjusted or checked anytime the aperture is changed
and after major modifications of the EHT setting.
Whenever the image is shifting while you are focusing, the aperture should be re-aligned.
Alternatively:
Select Beam/Aperture from the menu.
Astigmatism is an aberration of lenses, that can be corrected by means of the so-called stigmator.
3 Click Stigmation.
Adjust the stigmation by using the X and Y
sliders or the arrow buttons in the
Stigmation box.
Alternatively:
1 In the toolbar, click the Stigmation/Alignment
icon.
The SEM status window is helpful to show, edit and set frequently used parameters. The SEM
status window lists the operation parameters selected by the individual user.
The Gun Monitor utility offers the possibility of recording and displaying important parameters of
the SEM/FESEM at defined intervals during operation of the SmartSEM® user interface.
Eight different channels are available, six of them are predefined to record extractor voltage, ex-
tractor current, filament current heating, gun vacuum, liner tube voltage, and acceleration voltage.
4.4. Imaging
Alternatively:
Alternatively:
The Auto BC function allows you to automatically adjust brightness or contrast or both brightness
and contrast.
To quickly activate/deactivate the mixing function, select Detection/Mixing from the menu.
When active, the function is ticked.
4 To displace the anchor symbol, hold the left mouse button and drag.
5 To invert the signal of the respective zone, select Invert A = On.
To quit the Windowing mode, untick the Windowing checkbox and close the Windowing dialog.
Alternatively:
Select Scanning/Split from the menu.
Alternatively:
Select Scanning/Dual Mag from the menu.
Alternatively:
Tick the Dual Mag checkbox under SEM Con-
trolss Panel/Scanning.
2 To modify size and position of the frame, click it with the left mouse button:
a To change the size of the frame, place the mouse cursor on a mark.
Alternatively, double-click the Zoom factor field in the SEM Controlss/Scanning tab
and enter the zoom factor.
The zoom factor determines the magnification ratio between the left and the right zone.
Alternatively:
1 Select the Detectors tab of the SEM Con-
trolss panel.
2 Select Aux 1 from the Signal A = drop-down
list.
The working distance (WD) is the distance between the focused specimen surface and the end
of the objective lens. The WD determines the possible resolution, the signal-to-noise ratio, the
depth of focus and the lowest possible magnification (low power magnification).
Alternatively:
1 Select Tools/Goto Control Panel/Scanning.
2 To display the drop-down list, click the Scan
Speed = field.
Alternatively:
Select Scanning/Reduced from the menu.
Alternatively:
a Open the SEM Status window: Select View/SEM Status from the menu.
b Display Spot at X and Spot at Y.
c Double-click Spot at X and Spot at Y in order to enter fixed values.
To quit spot mode, deactivate the submenu Spot or untick the Spot checkbox.
CAUTION
Danger of damaging the specimen if the electron beam scans along the same line position
a longer period of time. This can result in a scan mark on the specimen.
When using the Line Scan function for image optimisation place the Line Scan on a spec-
imen area adjacent to the actual area of interest.
A horizontal line is displayed together with a diagram which shows the course of the signal
along this line.
The displayed graph represents the grey value distribution along the line. The grey values are
represented from 0 to 255 on the ordinate. The illumination of the image can thus be adjusted at
the representative spot.
A pop-up menu opens, where you can select the colour of the graph and a grey background.
1 Select Scanning/Rotate/Tilt.
IMPORTANT
The scan marker will only be displayed when you use slow scan speeds (5 - 15). At quicker
scan speeds (4 and faster) it will be deactivated automatically.
The magnification of the SEM/FESEM will be reset to the level that was active before the Magni-
fication Table was used for the first time.
2 Displace the reduced raster to the very upper or the lower image margin.
IMPORTANT
The best application of the dynamic focus is only possible with tilted plane specimens. If
the specimen presents strong differences in height (topography) or different inclinations
of slope, the depth of focus must be optimised as well.
IMPORTANT
When you use an extremely tilted specimen, you should adjust the dynamic focus as well.
IMPORTANT
With Cross Beam series instruments:
If you wish to measure the height, note that you have to enter ’90° - tilt angle value’ in the
’Tilt Angle=’ field.
The signal entering the image processor is made up of two components: image and noise. Image
is the signal of interest and correlates with the object being scanned, noise is random in nature.
Therefore, by averaging multiple scans of the same area, the signal will be reinforced, while the
noise will be reduced. This is the basis on which the noise reduction works.
The signal-to-noise ratio is an important factor for image quality. It does not only depend on the
parameters EHT, aperture size and working distance, but also on the dwell time of the electron
beam per image spot.
To reduce the noise level of an image, you can
• increase the dwell time of the electron beam per pixel or
• scan the respective specimen spot several times and integrate the generated signal.
Frame Average Averaging of two or more consecutive frames: Frame averaging is used to reduce random
(Continuous Aver- Frames are scanned continuously and the image noise.
aging) is formed as the average of a number of succes-
sive frames. It can be selected with any scan speed but is
generally most useful at the faster speeds
The live signal is proportionally mixed with the where a larger amount of noise reduction can
stored signal so that the image reflects the aver- be obtained without introducing a long cycle
age of the recent frames. The proportion of live time.
to stored can be adjusted with the parameter N
which represents the number of frames to be
averaged.
Frame Integrate Addition of two or more consecutive frames. The Frame integration is used to enhance contrast
image automatically freezes at the end of the and reduce noise.
integration cycle.
It is useful when applied to beam sensitive
The scan speed defines the time to complete a materials, since the image can be obtained
frame and the noise reduction parameter N while the beam remains scanning quickly and
defines the number of frames to integrate. not allowed to dwell too long on any point of the
specimen. In this mode the image is formed as
the average of a number of successive frames.
Line Average The image is built up by averaging a number of Use Line average when the result of the noise
lines. Each line is scanned a number of times reduction needs to be seen without waiting for
before the scan moves on. The average line sig- the cycle to complete.
nal is stored and displayed. Suitable for most applications.
The noise reduction parameter N defines the
number of times a line is to be averaged before The image will automatically freeze at the end
moving to the next line. of the frame.
Pixel Average A single frame is scanned. Suitable for specimens with good electric and
thermal conductivity.
The frame time is controlled by the scan speed
parameter as follows (100 x 2n-1):
Speed 1: 100 ns per pixel
Speed 2 : 200 ns per pixel
Speed 3 : 400 ns per pixel
Speed 4 : 800 ns per pixel
Speed 5 : 1.6 µs per pixel
Speed 6 : 3.2 µs per pixel
Speed 7 : 6.4 µs per pixel
Speed 8 : 12.8 µs per pixel
Speed 9 : 25.6 µs per pixel
Speed 10 : 51.2 µs per pixel
Speed 11 : 102.4 µs per pixel
Speed 12 : 204.8 µs per pixel
Speed 13 : 409.6 µs per pixel
Speed 14 : 819.2 µs per pixel
Speed 15 : 1.6384 ms per pixel
Continuous Displays an image within which each pixel is Most useful for stable, conductive specimens
Average measured repeatedly and the average signal where the beam has little or no damaging effect
(Pixel Averaging) displayed. on the specimen.
Select Mode
Displaces and deletes points of the transfer characteristic.
Displace: Place the mouse cursor on the point and displace it by holding the left mouse
button.
Delete: Place the mouse cursor immediately near the point and press the middle mouse
button.
Add/Remove Points
Adds and deletes points in the transfer characteristics.
Add: Place the mouse cursor in the graphic field and press the left mouse button.
Delete: Place the mouse cursor immediately near the point and press the middle mouse
button.
Open LUT
Loads specific Input LUT settings and apply these settings to the current image.
Reset LUT
Returns the Input LUT to the basic condition (linear characteristic)
Invert LUT
Inverts the current transfer characteristic.
Step LUT
Adds a step function as a transfer
characteristic to convert the transfer
characteristic into a regular
sequence of grey values.
Select Mode
Displaces and deletes points of the transfer characteristic.
Displace: Place the mouse cursor on the point and displace it by holding the left mouse
button.
Delete: Place the mouse cursor immediately near the point and press the middle mouse
button.
Add/Remove Points
Adds and deletes points in the transfer characteristics.
Add: Place the mouse cursor in the graphic field and press the left mouse button.
Delete: Place the mouse cursor immediately near the point and press the middle mouse
button.
Open LUT
Loads specific Input LUT settings and applies these settings to the current image.
Reset LUT
Returns the Input LUT to the basic condition (linear characteristic)
Invert LUT
Inverts the current transfer characteristic.
Step LUT
Adds a step function as a transfer
characteristic to convert the transfer
characteristic into a regular
sequence of grey values.
The Gamma option allows to define the transfer characteristic as a curve to enlarge lower
and higher grey scales. This function can be used to improve images containing a large
quantity of detailed information in few grey scales.
Inserts a grey wedge (continuous distribution of the grey scales from white to black) as
current image to adjust particular output media.
Sets the level of a point in the transfer characteristic after selection of a point.
Switches from grey value LUT to RGB LUT and selects the transfer characteristic for the
colour red.
Subsequent modifications of this transfer characteristic refer only to the colour red.
Switches from grey value LUT to RGB LUT and selects the transfer characteristic for the
colour green.
Subsequent modifications of this transfer characteristic refer only to the colour green.
Switches from grey value LUT to RGB LUT and selects the transfer characteristic for the
colour blue.
Subsequent modifications of this transfer characteristic refer only to the colour blue.
The functions in Image Processing offer the possibility of mathematically manipulating the image
content pixel-by-pixel by using the grey value (0=black, 255=white). Different filter functions, ba-
sic mathematic operations and the detection of grey values can be used.
Requires the licence IMMATH.
IMPORTANT
If stored images contain annotations or measurements, the grey values of these annota-
tions will be included in calculation and presentation.
b Click Execute.
IMPORTANT
Stereo glasses are required to be able to recognise the 3D effect in the colour image.
4.4.8.4. 2D filtering
The 2D Filters function enables selection of a kernel to be applied to the image in the source im-
age store.
Filter Process
Edge Detect Performs irregular edge detection by using a combined detection of horizon-
tal and vertical edges in the image
Edge Detect 2 Performs irregular edge detection by using a combined detection of horizon-
tal and vertical edges in the image
Laplacian Detects edges in the image by realising a Laplace transformation using the
four neighbouring pixels.
Laplacian 2 Detects edges in the image by realising a Laplace transformation using the
eight neighbouring pixels.
5 Select a Destination.
Defining user-
specific filters
1 Under Filter, select User Defined.
2 Click Execute.
Smooth Smoothes the image. Recommended for live images with a high
noise ratio.
Set the degree of smoothing by using
the Smoothing slider.
Differentiate Differentiates the image. Increases the grey value differences of the
Set the degree of smoohting by using individual pixels. Accentuates fine struc-
the Differentiate slider. tures and increases the focus of the
image.
Being prone to interferences, this filter
should not be used for very noisy images.
The annotation toolbar provides several tools to add notes or graphical objects to your image.
For example, you can insert lines, arrows or texts. Moreover, it is possible to measure distances
or the size of a rectangular area, the diameter of a circle or angle etc.
The image can be saved with the annotation overlaid on the image. Measurements can be per-
formed on either saved or live image.
A dialog opens.
A micron marker is a horizontal bar which indicates the size of an object in the image. Above the
bar its length is displayed.
4.5.7. Measuring
2 To show annotations:
a Select View/Hide Annotations from the
menu.
b From the submenu select which kind of
annotation you wish to show.
4.5.9.1. Crosshairs
Crosshairs are displayed in the image area. In the drop-down menu, Crosshairs is ticked.
4.5.9.3. Graticules
1 Select View/Graticules from the menu.
Graticules are displayed in the image area. In the drop-down menu, Graticules is ticked.
Recipes are used to save a set of SEM parameters which are ideal for a certain type of specimen.
When this type of specimen needs to be re-analysed in the future, the SEM parameters can be
recalled by opening the saved recipe. Only fine adjustments should then be required.
An Expert user (supervisor privilege) may set the SEM parameters for a range of applications and
save them as a common recipe that is available to all users. This enables Novice users to recall
such recipes.
A recipe is a file defining the specific set of parameters of the SEM/FESEM. A default ingredient
list defines the parameters to be saved in the recipe.
Common recipes are available to all users. Saving a common recipe requires the supervisor priv-
ilege.
In order to check the content of a recipe you can display a list of saved parameters.
A list is displayed.
2 Mark the recipe you wish to view and confirm.
3 If you wish to omit a particular parameter on the list, remove the respective tick.
4 Click Execute.
The ingredient list defines the contents of the recipe, i.e. the combination of saved parameters.
Parameters can be added and deleted.
6 To change the order of the parameters, use the Move Up and Move Down buttons.
Saving user-defined recipes, editing, and executing is also possible via MiniBar.
After optimising and freezing the image, it can be saved as a TIF (Tagged Image Format) file.
• 24 Bit Colour
(16 millions of colours)
IMPORTANT
Images saved as colour images (24 Bit Colour) cannot be reloaded to the SmartSEM® user
interface, but they can be implemented to most Windows® user programs.
• 16 Bit Grey
(65536 grey scales)
Exclusively reserved for later image modification by means of commercial programs.
IMPORTANT
When selecting 16 Bit Grey, no annotations, measurements or data zones will be saved.
IMPORTANT
Images in BMP and JPEG format cannot be reloaded to the SmartSEM® user interface.
Besides, it is not possible to save additional information with the image.
A dialog opens.
The value can be between 5 and 95. The smaller the value, the higher the compression (re-
duced storage place) and the worse the quality of the image when printed.
A default value of 75 is set for JPEG Quality. In most cases, this value represents a good
compromise between compression of the storage place and quality of the image.
IMPORTANT
Depending on the image content of the respective image, quality and information may be
lost even when saving images at high level of JPEG Quality (75-95).
4.7.1.3. Saving images together with the Windows® overlay (Image Capture Mode)
Actually, the image displayed on the monitor consists of the SEM image itself and a Windows®
overlay. The overlay contains status bar, toolbar etc., while the centre (scan range) is set to trans-
parent.
When you take a screenshot by using the <PRINT> key on the keyboard, the saved image shows
only the Windows® overlay, whereas the SEM image range is displayed as a green or orange
section.
Image Capture Mode should be used to avoid this effect.
The function AVI Capture Mode allows taking video sequences in order to show dynamic proc-
esses. The video can be played using the SmartSEM® user interface or another Windows® ap-
plication.
Requires the licence AVI Capture.
The images of a directory can be displayed as an image gallery. The images are shown as thumb-
nails together with the respective file name.
2 If you wish to print annotations and measurements together with the image, tick the respec-
tive checkbox.
To print colour annotations or measurements, the Colour Merge checkbox must be ticked as
well.
3 In the Size section, select the size of the printed image.
If you tick Zoom, you should also enter a zoom factor and select the position on the sheet
(Top, Middle or Bottom).
4 To select the printer, click Printer.
5 To start the printing process, click Print.
The clipboard functions may be used to copy images to the Windows® buffer. As the image is not
saved to a storage device such as hard disk or floppy disk but to the central memory of the com-
puter, it can be used for other Windows® applications with access to the buffer store.
SEM images or sections of images can thus be copied to other programs without prior storage.
On the other hand, SEM images in the clipboard can be added to the stored image.
The field File information lists size and type of the image in the buffer.
The FTP Remote Archiving program offers the possibility of transmitting images to a FTP server
or a network printer by using a network (TCP/IP).
Requires the licence REMARCH.
1 Select Start/Programs/SmartSEM/ImageArchiving.
2 In the middle field of the Source tab, select the files to be sent.
To select several files at the same time, hold the CTRL key and click the files.
3 Click the >> button to copy the selected files to the Image for Archive field.
To copy all files at the same time, click Add All.
5 Use the radio buttons to select the destination of the image (Codonics Network Printer or FTP
Archive).
6 Click Host Settings.
7 Enter the required settings.
8 Confirm.
9 If you wish to sent the data to the network printer, go to the Network Printer tab.
10 Tick the Enable Transfers to Network Printer checkbox.
The Large Image Store Wizard guides you through a process with three main steps to obtain im-
ages with high pixel resolution.
IMPORTANT
No annotations can be saved when using the Large Image Store Wizard.
1 From the menu, select Tools/Goto Panel and then Large Image Store Wizard.
The size of the FOV and the pixel sizes for each
store resolution are shown in the wizard.
The coloured bar to the right helps you to select a
suitable store resolution. Resolutions marked in
red and yellow can also be selected, but these
resolutions will not provide an optimal image
quality.
The store resolution can still be selected accord-
ing to your requirements, as the coloured bar can
only give you a hint on the technical possibilities to
exclude resolutions that are too high for the se-
lected area.
Step 2 of 3 is displayed.
An image preview is displayed at the bottom left of the window. A green rectangle shows the area
of interest displayed in the large image. The field of view and the rectangle represent the image
displayed in the SmartSEM® main window. To change the detail displayed in the large image, the
green rectangle can be moved in the in the image preview or the SmartSEM® main window.
4 To check the alignment, move the green rectangle to different areas. If necessary, optimise
the alignment. If you have problems to obtain satisfactory results, restart the procedure by
clicking Previous.
Step 3 of 3 is displayed.
Depending on the selected store resolution, the acquisition might take several minutes. You can
observe the process by moving the green square in the Image preview to a region that is already
displayed. If you need to stop the scan to change any settings, you can go back to step 2 by click-
ing Previous.
The selected End of scan action will be performed.
If you have selected Save as TIFF, a message
appears to confirm that the image has been suc-
cessfully saved.
The SmartSEM® software uses the SmartSEM® Administrator for user management. By means
of the SmartSEM® Administrator you can create new users and assign them with certain privileg-
es.
The Administrator creates the various user directories and edits existing folders and user config-
urations. A user directory is a closed data path which saves frequently modified configuration pa-
rameters of the SmartSEM® user interface and system software files for the various users.
If each user has their own directory for configuration parameters, the software can be configured
in such a way that toolbar, menus, data zones, etc. meet the specific requirements of each user.
Thus there is no need to reconfigure the user interface each time SmartSEM® is started.
2 Log on as follows:
IMPORTANT
Record the System password in a safe place. If you lose the password a chargeable
service visit will be required.
IMPORTANT
Logging on requires Supervisor privileges.
IMPORTANT
New user profiles are based on user templates or on existing users. This reduces the
workload when allocating rights for new users, while still being able to refine the profiles
later on.
2 To create a new user based on a user template or on an existing user, tick one of the radio
buttons.
3 Select a profile or an existing user from the
drop down list.
4 Click OK.
In the user directory, all user specific parameters and configurations such as appearance of
toolbar, data zone, and coordinates are stored and can be loaded again.
Checkbox Privilege
Change Image Directory Enables the user to change the location, where all images will be saved.
Change User Directory Enables the user to change the location, where all user specific
parameters and configurations are saved.
Gun Align Enables the user to modify the alignment of the electron beam.
IMPORTANT
Assign SUPERVISOR privileges only to a restricted number of authorised users.
The SUPERVISOR privilege permits the user to start the Administrator and to edit or create
user directories.
IMPORTANT
The default password for a new user is the user name.
2 Click Edit.
2 Click Edit.
2 Click Delete.
3 Confirm.
The utility SmartSEM User Accounting allows recording of important information during individual
working sessions on the SEM/FESEM. The information is stored in a separate database file.
The SmartSEM User Accounting is part of the SmartSEM® program suite.
Requires the licence ACCOUNT.
IMPORTANT
Only Supervisor level users and higher are supposed to manage user accounts and use
the SmartSEM Administrator.
An empty file (’Account.accdb’) is created in the directory C:\Program Files\Carl Zeiss Microscopy
Ltd\SmartSEM\system.
If a file has already been created, a warning message will pop up.
1 Click Delete.
1 Click Owners.
2 Click Add.
To delete an owner:
1 Mark the owner.
2 Click Delete.
3 Confirm.
You can change the settings for joystick speed, stigmator sensitivity and the sensitivity of the con-
trol panel encoders such as the Focus encoder.
This option allows you to use the right mouse button for parameter adjustment when selecting
’3 Button wheel mouse’.
You may also show or hide the mouse adjustment image.
The user preferences offer the possibility to define user-specific pre-settings in the SmartSEM®
user interface.
The data zone displays a special group of annotation objects which are used to show current
parameters, such as SEM parameters, username, time or date.
The toolbar is fully customisable and can be altered to fit the needs of each individual user.
IMPORTANT
If ’Use Common Toolbar’ has been assigned to a user in the user profile, the functions
Move Up, Move Down, Save, Load, Remove, Add Button, Add Separator are NOT available.
4 Assign a function:
a Double-click in the Type column.
b Select a function from the drop-down list:
Commands: Lists different commands
such as ’EHT on’.
Dialogs: Lists the commands to call up
menus and windows.
Macros: Lists all macros of the standard
macro library as well as individual macros
which have been implemented to this
library.
Parameters: Lists different commands to
read or set important parameters of the
SEM/FESEM.
Special Functions: Lists the Restore Sys-
tem Conditions and Save System Condi-
tions routines.
Toggle: Lists digital parameters which can
be used as a switch.
c Confirm.
6 Confirm.
7 Confirm.
8 Click the vertical lines and use them to mark an exactly defined distance on the image.
Refer to the documents delivered with the calibration standard.
The licences installed on your SEM/FESEM can be shown from the SmartSEM® Administrator.
You can sort the list according to part numbers, sales codes or descriptions. To do so, click into
the respective column title.
The program RemCon32 offers the possibility of remotely controlling the SEM/FESEM by using
the serial interface (RS232). Thus, it is possible to read or control specific parameters of the SEM/
FESEM. This option is especially useful if an EDX/WDX system is attached to the SEM/FESEM
as it enables communication between both systems by means of the serial interface.
Remote operation of the SEM/FESEM is possible using the Windows XP Remote Desktop Con-
nection feature.
See the Window help on Using Remote Desktop Connection or contact your network administra-
tor for information on configuring Windows XP Remote Desktop Connection to operate over your
network.
To see the live microscope image over a remote connection, Image Capture Mode must be
turned on.
Image Capture Update Frequency should be set to the minimum value of 100 ms, which is only
available if the Remote SEM licence is present.
Remote SEM requires a minimum of 10 Mbps network bandwidth for useable operation, but a
100 Mbps LAN connection is recommended for true real time remote operation. If bandwidth is
limited, fast scan rates should be avoided and reduced raster should be used when possible to
minimise network traffic.
Knights Camelot software is a CAD navigation tool for locating specific features on a semicon-
ductor die. It works by registering the specimen with the design of the die to allow the CAD image
and SEM images to be synchronized to the same field of view. It is also possible to overlay the
image with parts of the design.
Requires the licence KNIGHTS CAMELOT.
Defect review is used to find defects on a wafer or mask based on the results from KLA Tencor
results file.
Requires DEFECT REVIEW licence as well as STAGEREG and CENTRE licences.
Requires the KLA Tencor Resultsfile Specification V1.7
When upgrading to a new PC or when reinstalling Windows on the PC, SmartSEM® configuration
and calibration data is lost. SmartBackup allows you to keep the data without having to recalibrate
the workstation.
Once a backup has been made, it can be restored to regain the configuration and calibration data
on a new PC or new Windows installation.
1 Close the EM Server.
2 Select Start/Programs/SmartSEM Service/SmartBackup Tool.
8 Click Restore.
The Laser Finder is an accessory option that is designed to ease finding the area of interest on
the specimen surface. It consists of a chamber mounted laser, which is only illuminated in TV
mode. The laser spot is visible in the image of the CCD camera. It is used to make specimen
navigation easier.
For details on operation refer to the Instruction Manual Laser Finder.
The specimen current is the current flowing through the specimen. It corresponds to the total
number of electrons that hit the specimen.
A specimen current monitor can be attached to the SEM/FESEM as an optional accessory.
The Faraday cup consists of a strongly absorbing material with a cavity covered by an electron-
microscopic aperture.
CAUTION
For all SEM/FESEM, except MERLIN:
Risk of damaging objective lens or specimen due to collision
During specimen current measurement the touch alarm is deactivated. Ensure to untick
the SCM On checkbox after finishing the specimen current measurement.
The Plasma Cleaner is an optional accessory that allows you to decontaminate the specimen
chamber and any loaded specimens.
The Plasma Cleaner generates reactive gas-phase radicals in a plasma. This plasma is fully con-
tained in the Plasma Cleaner unit. The radicals migrate into the specimen chamber and chemi-
cally react with unwanted hydrocarbons.
After a plasma cleaning cycle, the specimen surface provides optimal imaging conditions even at
very low imaging voltages.
CAUTION
Sensitive specimen materials might suffer damage from plasma cleaning.
We recommend to test this on specimens of the same material before cleaning any impor-
tant specimens.
CAUTION
Unstable pressure or unwanted reactions with inserted gas can damage specimen or vac-
uum system.
The chamber pressure needs to be stable during plasma cleaning. If the gas injection sys-
tem or the charge compensation function are active, the gas insertion will affect the
pressure range and can create unwanted reactions with the inserted gas. Do not use GIS
or CC when using the Plasma Cleaner.
1 Check that the gate valve of the airlock is closed. Do not use the airlock while using the Plas-
ma Cleaner.
2 Switch off the EHT.
CAUTION
The pressure range applied during plasma cleaning can damage the electron source.
To protect the electron source from the harmful pressure range, close the column cham-
ber valve.
4 From the menu, select Tools/Goto Panel and then Plasma Cleaning.
To avoid damage, various parameters are changed automatically in the following sequence:
• The turbo pump is slowed down by 10 nitrogen impulses
• The specimen chamber is vented for 40 seconds
• The turbo pump is switched off
• Only the pre-vacuum pump remains active
IMPORTANT
You can view a log file that contains all relevant events by clicking ‘View Log...‘
This log file can be used for troubleshooting and to determine when the next plasma clean-
ing process should be sheduled.
The Cleaning Recipes list is displayed with the five preset recipes. These recipes are fixed. This
means they can not be edited or deleted. Therefore, Edit... and Delete... are greyed out.
If you want to know whether or not a recipe can be edited, check the respective entry in the Type
column.
2 To create a new recipe, click Add...
The recipe is now added to the list of available recipes. In the Type column the new recipe will
be displayed as User, which tells you that the recipe can be edited or deleted.
The cleaning cycle schedule is now active. 30 seconds before the scheduled cleaning cycle a
countdown will be displayed to inform you that a cleaning cycle is about to start.
You have the following options:
• To abort the countdown and start the cleaning cycle right away, click Start Now.
• To abort the countdown and cancel the scheduled cleaning cycle, click Cancel.
• To start the cleaning cycle as scheduled, no action needs to be taken.
5. Troubleshooting
Error When an error message occurs, a message window will pop up. This indicates a serious condition
messages which must immediately be drawn to the operator's attention.
Most error messages are self-explaining.
The following table summarises important error symptoms and how to remedy.
Stage Stage does not move. Stage needs to be initialised. Initialise the stage.
Refer to section 5.1.
Stage does not move accu-
rately.
Stage/Joystick Under TV control, the direc- TV joystick angle does not fit for Change the joystick TV angle.
tion of dual joystick move- the selected CCD camera. Refer to section 5.2.
ment and direction of stage
movement seem to be differ-
ent.
Stage/Joystick Stage cannot be moved by Joystick Disable checkbox is Untick the checkbox in the
using the joystick ticked Stage tab of the SEM Controls
panel
Touch alarm Touch alarm message is Specimen or sample holder has Reset touch alarm.
shown. touched objective or wall of the Refer to section 5.4.
specimen chamber.
Temperature, Error message Flow of cooling water is not OK. Check water flow and tempera-
water flow ’Stage Board too hot’ (or sim- ture.
ilar) is shown. Refer to section 5.5.
EHT EHT cannot be switched on. Column chamber valve is Select Airlock panel from the
closed. Panel Configuration Bar. Click
Open Column Chamber Valve.
MERLINTM The workstation has crashed. CAN communication has failed. Check the CAN communication
workstation freeze as described in section 5.7.
The stage needs to be initialised before any absolute stage movement can be executed.
Executing this function requires the Stage Initialise privilege in the user profile.
Prerequisite: Specimen chamber has to be evacuated.
IMPORTANT
If initialisation of the stage does not solve the
stage problem, contact your Carl Zeiss service
engineer.
You can configure the position to which the stage drives after the initialisation procedure. Other-
wise the stage will drive to the centre position.
Changing this setting requires the Supervisor privilege.
Alternatively:
a Move the stage to the required position.
b Click Set to current Posn.
4 To activate the function, tick the Post Init. Posn Valid checkbox.
In TV mode (chamberscope) it might occur that dual joystick (optional) and stage seem to move
to opposite directions. This is because the selected CCD camera is installed in a certain angle
relatively to the stage. Thus, the camera shows a side-inverted view.
To remedy, change the joystick TV angle setting in the software. Changing this setting requires
the Supervisor privilege.
IMPORTANT
If you are working with two CCD cameras: The joystick TV angle can only be set for one
CCD camera. When selecting the other CCD camera, you have to change the setting.
180°
4 Enter an angle depending on the installation
location of the CCD camera.
90°
When the CCD camera is installed:
at the back: Enter 180°.
at the front: Enter 0°.
chamber door
at the side: Enter 90°.
0°
After cathode replacement or after re-alignment of the electron optic column, OptiProbe has to
be calibrated.
A calibration wizard facilitates the calibration procedure.
3 Select Start/Programs/SmartSEM/Opti-
Probe calibration.
The OptiProbe Cal dialog opens.
4 Click OK.
6 Click OK.
An automatic calibration routine is performed,
which takes about fifteen minutes.
To prevent damage, a touch alarm is integrated in the SEM/FESEM: If specimen or sample holder
touch chamber walls, detectors or objective lens, the stage is stopped immediately. An audible
warning and an on-screen message are given.
6.1. Menus
The different panels and dialogs necessary to operate the SEM/FESEM can be called by using
the menu bar and its submenus.
• Help
Calls the help function.
• Cancel
Aborts the selection.
• Execute
Runs the selected recipe.
Delete Recipe
• Select file to delete section
Allows you to select a recipe.
• OK
Confirms the selection.
• Cancel
Aborts the selection.
• Help
Calls the help function.
• Change Directory
Selects the directory.
• Save xxx.tif
Saves the file.
• Annotation
Has to be ticked, when annotations
or measurements should be saved with the
image.
• Colour merge
Has to be ticked, when colour annotations
or measurements should be saved with the
image.
6.1.1.12. Exit
Shuts down the SmartSEM® user interface.
The EM Server remains active.
• Yes
Confirms the action.
• No
Aborts the action.
6.1.2.3. Toolbar
Opens the Configure Toolbar window.
• OK
Confirms the action.
• Cancel
Aborts the action.
• Move Up
Changes the position of the selected toolbar icon.
• Move Down
Changes the position of the selected toolbar icon.
• Save
Save As: Saves the toolbar with a user-specific name.
Save As Common Toolbar: Saves the toolbar that can be recalled by other users.
• Load
Loads a previously saved toolbar.
• Remove
Deletes the selected toolbar icon.
• Add Button
Inserts a new toolbar icon.
• Add Separator
Inserts a space between the toolbar icons.
• Options
Opens the Global Toolbar Options panel.
• Help
Calls the help function.
6.1.2.4. Annotation
Shows annotations.
Alternatively, type <Ctrl + A>.
Time Now
Inserts the current time.
Date Now
Inserts the current date.
User Name
Inserts the name of the current user.
• WordWrap Enabled
If ticked, text is made up.
• OK
Confirms the selection.
• Undo
Cancels the selection.
• Insert New
Adds another annotation.
• Cancel
Aborts the selection.
6.1.2.7. Copy
Copies an item.
Alternatively, type <Ctrl + C>.
6.1.2.8. Paste
Inserts an item.
Alternatively, type <Ctrl + V>.
6.1.2.9. Clipboard
Allows you to copy and paste images by using the buffer store.
Requires the licence CLIP.
• Store resolution
Selects the storage resolution.
• Copy
Copies the image to the buffer.
• Reduction
Allows you to reduce the size of the stored image. Selection possible between 1 (original size)
and 8.
• Annotation
If ticked, data zone, annotations and measurements are copied together with the image.
• Colour Merge
Has to be ticked, if colour annotations or measurements should be copied.
• Whole
If ticked, the whole screen area, which will be overlayed blue, will be copied as the image.
• Dimensions
Sets the image dimensions.
• Set
Adopts the dimension settings.
• Store resolution
Selects the storage resolution.
• Centre
Displaces the position of the shown graticule.
• Origin
Displaces the position of the shown graticule.
• YX
Displaces the position of the shown graticule.
• Paste
Inserts the image.
• Image Reduction
Sets the image reduction factor.
6.1.3.1. Toolbars
Opens the Toolbar Views window.
Alternatively, type <CTRL+B>.
• One of the radio buttons below User Toolbar Tool Tips has to be selected.
Show immediately/Show: A short explanation (tool tip) is displayed whenever the mouse button
is placed on one of the user toolbar icons.
Hide: The tool tip information is not shown.
6.1.3.6. Crosshairs
• Displays crosshairs
If this function is activated, a tick is shown in the pull-down menu.
6.1.3.7. Graticule
• Shows a grid on the image.
If this function is activated, a tick is shown in the pull-down menu.
• Display
Shows the selected parameters.
• Select
Allows you to select the parameters to be
shown.
• File
Allows you to load, save or delete a combina-
tion of parameters.
6.1.3.10. Thumbnails
Shows thumbnails.
Each Schottky emitter has its individual values for filament heating current and extractor voltage.
The respective values are set by the Carl Zeiss service staff after the cathode has been changed.
CAUTION
Modifications of the filament heating current affect emitter life and resolution.
Therefore, any modification should be discussed with the local service engineer in
advance.
6.1.4.3. Emission
Changes to emission image mode.
Mainly used by service engineers.
• OK
Confirms the setting.
• Cancel
Aborts the setting.
6.1.4.5. Apertures
Brings the Apertures tab to the fore of the SEM Controls panel.
6.1.5.1. Detectors
Allows you to select a detector.
The selected detector is ticked.
6.1.5.2. Mixing
Allows you to mix the signals of two different detectors.
If active, this submenu is ticked.
Requires the licence SIGMIX.
• Freeze on =
Selects the moment of freezing the image.
• Noise Reduction
Selects the noise reduction method.
Refer to section 4.4.6.
• Freeze/Unfreeze
Freezes/unfreezes the live image.
6.1.6.2. Freeze/Unfreeze
Freezes respectively unfreezes the live image.
Threshold tab
• Black threshold
Sets the threshold for black.
• White Threshold
Sets the threshold for black.
• Image Detect
Selects the type of threshold.
• Reset LUT
Resets the Look-up-table.
• Update
Calculates the area fraction.
• Source
Selects the source.
• Source 2
Selects source 2.
• Operation
Selects the operation.
• Execute
Executes the selected operation.
• Undo
Aborts the settings.
2D Filters tab
• Source
Selects the storage to which the transforma-
tion will be applied to.
• Filter
Selects a filter from the drop-down list.
• Destination
Defines the buffer.
• Execute
Starts the image processing.
• Undo
Aborts the settings.
Pre-defined kernel
filter matrices:
• Filter type
Selects the type of filter, e.g. Smooth and Dif-
ferentiate.
• Smoothing
Sets the degree of smoothing.
• Differentiate
Sets the degree of differentiation.
6.1.6.5. Copy To
Selects the buffer the image is to be copied to.
6.1.7.1. Speeds
Offers the possibilty to select the scan speed.
• OK
Confirms the selection.
• Cancel
Aborts the selection.
6.1.7.2. Normal
Returns from special scanning modes such as
Reduced, Spot, Line, Split, or Dual Mag to the nor-
mal scanning mode.
If active, this submenu is ticked.
6.1.7.3. Reduced
Scans only a small frame (reduced raster), which
is suitable for alignment procedures.
If active, this submenu is ticked.
6.1.7.4. Split
Activates the split screen function: The image
area is subdivided into two zones. Different detec-
tors can be assigned to each zone.
Requires the licence SPLIT.
6.1.7.5. Quad
Activates the quad split screen function: The im-
age area is subdivided into four zones. Different
detectors can be assigned to each zone.
Requires the licence QUAD.
6.1.7.7. Spot
Positions the electron beam on a particular spot
on the specimen surface.
Requires the licence SPOT.
6.1.7.9. Rotate/Tilt
Opens the Rotate/Tilt panel.
• Scan Rot
If ticked, the scan rotation is active.
Requires the licence SCANROT.
• Scan Rotation
Allows setting of the scan rotation angle.
• Tilt Corrn.
If ticked, the tilt correction is active.
• Tilt Angle
Allows adjustment of the tilt angle.
• Dyn. Focus
If ticked, the dynamic focus is active.
• FCF Setting
Sets the degree of the dynamic focus
(FCF=Frame Corrected Focus).
6.1.8.2. Store/Recall
Opens the Stage Points List (refer to section 6.2.35.).
• Setup Wizard
Opens the wizard.
6.1.8.8. Survey
Opens the submenu.
Requires the licence SURVEY.
6.1.8.9. Navigation
• Toggle view
Changes the view.
• Stage stop
Stops the stage immediately.
• Z move on Vent
If ticked, the stage is driven to the lowest Z when the specimen chamber is ventilated.
• Track Z
If ticked, the focus will be automatically re-adjusted after every change if the Z coordinate
• Protected Z
If ticked, the current Z coordinate is compared with the new coordinate when calling saved
stage coordinates.
If the new Z position is higher than the current one, the stage drives to the X/YT/R coordinate
first, then to the new Z position.
If the new Z position is lower than the current one, Z is moved first, then the other axes.
• Settings
Opens the Stage Navigation setting dialog.
• More stage functionality
Opens a drop-down list.
IMPORTANT
If the SEM/FESEM is vented or partially vented, it is NOT possible to start the bakeout.
VP vacuum system
• System Vacuum
Indicates the vacuum in the specimen cham-
ber.
• Vent inhibit
None
Beam Present: EHT is on
• Vac Status
Indicates status of vacuum release.
Ready: Specimen chamber is evacuated and
ready to switch on EHT/Gun.
At Air: Specimen chamber is ventilated.
• EHT Vac ready
Indicates status for high voltage release
• Pump / Vent:
Evacuates/Ventilates the specimen chamber.
Vent is available when the electron beam is
switched off.
Pump is available after changing the speci-
men.
• Partial Vent on Standby
If ticked, the specimen chamber will be venti-
lated partially when the SEM/FESEM is
switched to STANDBY mode.
Tick the checkbox, if the vacuum is OK and
the SEM/FESEM will not be operated for a
longer time (e.g. weekend). This can help to
prevent oil vapours from penetrating into the
specimen chamber during STANDBY mode.
IMPORTANT
If the SEM/FESEM is vented or partially vent-
ed, it is NOT possible to start the bakeout.
• Go to HV @ Shutdown
If ticked, the SEM/FESEM is automatically
switched to HV mode, when switching the
SEM/FESEM to STANDBY.
• Chamber
Indicates the actual pressure in the
specimen chamber in VP mode
• VP Target
Slider used to adjust the desired pressure in
the specimen chamber
• Go To HV / Go To VP
Changes to High vacuum mode/Variable
pressure mode.
Apertures tab
• Aperture Size.
Indicates the selected aperture sizes.
Drop-down list allows selection of another
aperture
• Focus Wobble
If ticked, the focus wobble is active in a reduced
raster. Used to optimise the image
• Wobble Fast
Accelerated wobble speed
• Wobble Amplitude
Allows changing the extent of the wobble move-
ment if the Focus Wobble checkbox is ticked.
• Beam Blanked
If ticked, the electron beam is removed from the
beam path, the specimen is not scanned any
more. This function blanks / unblanks the beam
with the scanning coils in the column.
The optional Beam Blanker is not controlled by
this checkbox.
• Emission
Changes to emission mode, which is mainly re-
served to Carl Zeiss service staff.
• Navigation box
Navigation box for adjustment of the
parameters shown on the buttons on the left.
• Mag/Focus
Allows setting of the magnification
• Aperture Align
Allows setting of the aperture alignment
• Gun Align
Allows setting of the gun alignment
• Stigmation
Allows setting of the stigmator
• Beam Shift
Allows setting of the beam shift.
• Fisheye Mode
If ticked, Fisheye Mode is active.
Requires licence FISHEYE.
• High Current
If ticked, high current mode is active.
Requires licence HIGH CURRENT.
Detectors tab
• Collector Bias
Sets the collector voltage.
• Signal A
Selects the active signal to be displayed on the
monitor
• Signal B
Selects the signal to be mixed with A
• Mixing
If ticked, the signals A and B are mixed
(requires the licence SIGMIX)
• Signal
Indicates the percentage of signal A while
mixing
• AutoBC
Sets the AutoBC function
Off: Switched the function off
B: Automatic adjustment of brightness
C: Automatic adjustment of contrast
BA: Automatic adjustment of brightness and
contrast
• Brightness
Adjusts brightness
• Contrast
Adjusts contrast
• Input LUT
Trans: Regular image display
Gamma: Allows user to adjust gamma with the
Gamma slider
Inverse: Inverts the image display
User: Opens the EM LUT Editor window
(section 6.1.2.1.)
• Gamma
Adjusts gamma
Gun tab
• EHT
Indicates actual acceleration voltage
• Extractor V
Indicates the current value of the extractor
voltage
• Ext I Monitor
Indicates the current value of the extractor
current
• Fil I
Indicates the current value of the filament heat-
ing current
• Beam state
Indicates the beam state
Drop-down list allows to switch EHT on/off and
to switch the gun on/off
• Leave Gun On at Shutdown
If ticked, the gun stays on when closing the
SmartSEM® software and changing to
STANDBY mode.
• EHT Off@ Log Off
If ticked, the EHT is automatically shut down
when the SmartSEM® software is closed by
using Log Off or Exit from the menu
• FIL I Target
Allows user to set the filament heating current
• Extractor V Target
Requires Service setting under Tools/User Preferences/User Access Level
• EHT Target
Allows user to set the
acceleration voltage
Each Schottky emitter has its individual values for filament heating current and extractor
voltage. The respective values are set by the Carl Zeiss service staff after the cathode has
been changed.
• OptiProbe
Allows automatic setting of the probe current.
With additional hardware only.
Scanning tab
• Operating Mode
Selects the operating mode
Normal
Split: Subdivides the image area into two zones
(requires the licence SPLIT)
Reduced: Scan a small frame (reduced raster)
Emission: Changes to emission mode
• Store resolution
Select the stored resolution
• Line Scan
If ticked, a line is scanned permanently
• Spot
If ticked, spot mode is active (requires the li-
cence SPOT)
• Dual Mag
If ticked, the dual mag function is active (re-
quires the licence DUALMAG)
• Scan Speed
Sets the velocity of the scan
• Cycle Time
Indicates the cycle time depending on the
selected scan speed
• Zoom factor
Sets the zoom factor
• Freeze on
Defines when the image is frozen.
• Noise Reduction
Selects the noise reduction method
• Scan+/Scan-
Increases/decreases the scan speed
• Freeze/Unfreeze
Freezes/Unfreezes the scan
Stage tab
• Stage At
Indicates position of the stage axis
• Go To
Coordinates to be approached
• Stage Is
Current state of the stage
Busy: stage is moving
Idle: stage is standing still
• Z move on Vent
If ticked, the stage is driven to the lowest Z
when the specimen chamber is ventilated.
• Track Z
If ticked, the focus will be automatically re-ad-
justed after every change of the Z coordinate.
• Protected Z
If ticked, the current Z coordinate is compared
with the new coordinate when calling saved
stage coordinates.
If the new Z position is higher than the current
one, the stage drives to the X/Y/T/R coordinate
first, then to the new Z position.
If the new Z position is lower than the current
one, Z is moved first, then the other axes.
• Stage XY + Z
Affects the Stage Scan function.
If ticked, Z is moved in relation to the Z start co-
ordinate if the stage moves in tilt direction.
• Joystick Disable
If ticked, the dual joystick is disabled.
• Undo Go To
Cancels the last movement.
• Stage Stop
Stops the stage immediately.
• Column mode
Selects the column mode.
Crossover Free
Crossover
Depth of Field
Fish-eye
• EHT Target
Sets the EHT target.
• I Probe
Sets the I probe.
• Wobble Amplitude
Allows changing the extent of the wobble
movement if the Focus Wobble checkbox is
ticked.
• Focus Wobble
If ticked, the focus wobble is active in a
reduced raster. Used to optimise the image.
• Wobble Fast
Accelerated wobble speed.
• Beam Blanked
If ticked, the electron beam is removed from
the beam path, the specimen is not scanned
any more. This function blanks / unblanks the
beam with the scanning coils in the column.
The optional Beam Blanker is not controlled
by this checkbox.
• Offset Correction
Performs an offset correction.
• Navigation box
Navigation box for adjustment of the
parameters shown on the buttons on the left.
• Mag/Focus
Allows setting of the magnification
• Aperture Align
Allows setting of the aperture alignment
• Gun Align
Allows setting of the gun alignment
• Stigmation
Allows setting of the stigmator
• Beam Shift
Allows setting of the beam shift.
Vacuum tab
Refer to section 6.1.9.
• OK
Confirms the settings.
• Cancel
Aborts the settings.
• 3 Button wheel/standard
Selects the type of mouse
• Show the mouse adjustment...
If ticked, the mouse image is shown.
6.1.10.11. Administrator
Changes to the SmartSEM® Administrator.
Starts record
Stops record
Pauses record
6.1.11.2. Search
Opens the search function.
6.1.11.6. How To
Opens a a step-by-step guide for frequently used operation sequences.
To access the Panel Configuration bar, select Tools/Goto Panel from the menu.
Alternatively, click the arrow button at the right side of the image area.
• ...
Opens the Docking Panel Options dialog.
• Toggle
Shows/hides the docking panel.
• Help
Calls the help function.
• >
Hides the Panel Configuration Bar.
6.2.2. Bakeout
CAUTION
To prevent parts of the SEM/FESEM from being damaged, refer to the detailed instructions
in the instruction manual of the SEM/FESEM before starting the bakeout procedure.
• Bakeout
Selects the bakeout duration.
Quick: 2 h heating / 1 h cooling
Overnight: 8 h heating / 2 h cooling
Weekend: 40 h heating / 3 h cooling
User: To be defined by the operator.
• Bakeout State =
Indicates the current state.
Idle/Heating/Cooling
• Bakeout Heat=
Indicates the heating period set.
• Bakeout Cool
Indicates the cooling period set.
• Bakeout Start
Starts the bakeout procedure.
• Bakeout Cancel
Aborts the bakeout procedure.
CAUTION
To prevent parts of the SEM/FESEM from being damaged, refer to the detailed instructions
in the instruction manual of the SEM/FESEM before starting the bakeout procedure.
• Bakeout
Selects the bakeout duration.
Quick: 2 h heating / 1 h cooling
Overnight: 8 h heating / 2 h cooling
Weekend: 40 h heating / 3 h cooling
User: To be defined by the operator.
• Bakeout State =
Indicates the current state.
Idle/Heating/Cooling
• Target /°C
Displays the target temperature.
• Actual /°C
Displays the current temperature.
• Heat /hours
Displays the selected heating duration in
hours.
• Cool /hours
Displays the selected cooling duration in
hours.
• Total /hours
Displays the total bakeout duration including
heating and cooling.
• Bakeout Start
Starts the bakeout procedure.
• Bakeout Cancel
Aborts the bakeout procedure.
• Mag/Focus
Changes to magnification and focus setting.
• Beam Shift
Activates the beam shift function.
Assigns beam shift X and Y to the left mouse
button.
• Quadrants
Symbolise the four quadrants
Normal (+)
Inverted (-)
Disabled
• BSD Gain
Selects the gain range.
• BSD:COMPO
Activates compositional mode (all quadrants
are in normal mode)
• BSD:TOPO
Activates topography mode.
• Apply
Applies the changes
• BSD: Set TOPO
Changes the settings for TOPO.
• BSD Auto range
If ticked, the auto range function is activated.
Displays the status of the Controller Area Network (CAN) communication for EHT, vacuum and
stage.
This dialog is only used to display the communica-
tion states of the subsystems for diagnostic
purposes.
• Centre: Pos X
Indicates the last value for X.
• Centre: Pos Y
Indicates the last value for Y.
• OK
Confirms the settings.
• Cancel
Aborts the settings.
• Next
Leads to the next step of the calibration pro-
cedure
This dialog should only be used by authorised Carl Zeiss service staff.
• Brightness A
Sets brightness of signal A
• Contrast A
Sets contrast of signal A
• Colour Mode
Select colour mode
• Brightness B
Sets brightness of signal B
• Contrast B
Sets contrast of signal B
• Load
Loads a defect file (*rff).
• Properties
Shows properties of the selected defect file.
• Wafer map
Shows a two dimensional view of the wafer.
• Define Text ID
Shows the name
• Define Image Width
Indicates the width
This dialog is used to configure external detector outputs on the system. There are two detector
outputs on each detector board fitted. Each may be configured as Signal A, Signal B or a speci-
fied detector name e.g. Inlens. A separate configuration can be selected for internal scan and
each of the 4 external scan inputs. A detector signal can only be assigned to one video out.
• Scan Source
Allows you to select the scan source.
Internal
Ext 0
Ext 1
Ext 2
Ext 3
• Video Out 0-5
Allows you to select the signal depending on
the selection in the other Video Out drop down
lists.
• Reference Image
- Display Rectangle
Displays a movable frame. The image range
inside the frame defines the reference image
for the drift correction.
- Hide Rectangle
Hides the movable frame.
- Create Reference
Acquires a reference based on the current
settings.
• SEM drift status =:
- No reference
Reference has not yet been set.
- Busy
Busy creating reference.
- Ready
Reference has been created.
Do SEM Drift Corrn can be clicked.
• Do SEM Drift Corrn
Starts the SEM drift correction.
• Settings
- Drift Max. Pix.Error =
This determines how close consecutive drift
correction attempts should be to each other if
they are to be considered as the same.
- Drift Min Conf =
As the drift correction algorithm uses a statistical image matching algorithm there is an ele-
ment of uncertainty over whether the drift values it returns are correct. The certainty level de-
termines the minimum certainty that the drift values are correct required to use those values
to adjust the drift. Generally this should be a bit lower than the values returned during the test
drift correction on the Take reference image page. A minimum of 25% is allowed. Values of
50% are quite reasonable and although you can enter up to 100% it is unlikely that an image
would match with that strength of correlation. Note: The percentages are measures of corre-
lation, not of probability; for example a certainty of 50% does not mean that for every 10
matches returned with this value 5 are wrong, in fact it is quite likely that they are all correct.
- Drift Max Tries =
When the drift correction algorithm is being used it takes the current image more than once
and sees if the drift values returned are the same within certain limits on consecutive attempts
this helps prevent mistakes. Max attempts sets how many times it should try to get a match
before it decides that the drift correction is not working. If you set this to 0 then no drift cor-
rection will be used. If more than Max Attempts are required to find a matching image then
the system assumes that the drift correction is not working and ignores it until the next drift
interval.
- Default Settings
Restores the default settings.
- Periodic Drift Correction Period(s)
Allows you to schedule a periodic drift correction. A drift correction will be carried out every-
time the set timespan in seconds has expired. This can only be used after a reference has
been created.
• Beam Shift
- X/Y
Displays the current beam shift in X/Y.
- Zero Beam Shift
Sets the X/Y beam shift to zero.
- Go to Reference
Moves the specimen stage to the reference
point.
• Options
- Use Stage
If activated, only the stage is used for drift cor-
rection.
- Field Search
If activated, the reference point is searched in
a larger field outside the rectangle.
Recommended in case of stronger drift .
- Auto Brightness
If activated, the Auto Brightness is activated to
optimise image recognition.
• Ext On
Switches external scan control on
• Ext Off
Switches external scan control off
• Ext. Scan Select
Allows you to set the Ext Scan value
Allows you to load an image from a variety of sources and then set-up a stage registration be-
tween the image and the stage. This will enable to navigate the stage by clicking on the image.
There are two ways to register an image: manually (Manual Registration) or automatically (Auto
Registration).
CAUTION
Danger of damaging stage or stubscope
When using the stubscope, the stage will often be at high Z values.
Tick the ’Protected Z’ checkbox and set an appropriate value for Safe Z whenever moving
between electron axis and stubscope axis.
• External Image
Loads an externally generated image from a file.
• Setup
Starts the Stage Registration wizard.
• Clear registration
Cancels the registration.
• Load
Loads an image.
• Save
Saves an image.
• Current SEM Image
Loads the current SEM image.
The Large Image Store Wizard guides you through a process with three main steps to obtain im-
ages with high pixel resolution.
• Field of view:
Displays the currently selected field of view in
µm.
• Store resolution:
Allows you to select a store resolution and the
corresponding pixel size.
• Image preview:
Displays a preview of the currently selected
ROI.
• Next (active if resolution has been selected):
Continues with the next step.
• Previous (active in steps 2 and 3):
selects the previous step.
• Cancel wizard:
Closes the Large Image Store Wizard.
The Laser Finder is an accessory option designed to ease finding the area of interest on the spec-
imen surface.
CAUTION
To prevent parts of the SEM/FESEM from being damaged, refer to the detailed instructions
in the Instruction Manual Laser Finder before using the Laser Finder.
• Laser Finder
If ticked, the Laser beam is active.
• Laser Illumination
Changes brightness of laser spot.
• CCD Illum.
Changes brightness of infrared light for CCD
TV camera detection.
• Calibration mode
Selects the calibration mode
Cal Mode Off
Cal Stig Balance
Cal Output Dev
Cal User Magnification
This window refers to the optionally available Piezo Substage for AURIGA®.
For detailed information on the Piezo Substage, refer to the Instruction Manual Piezo Substage.
• Piezo at X
Displays the current position of the Piezo
stage in X direction.
• Piezo at Y
Displays the current position of the Piezo
stage in Y direction.
• X/Y high/low limit hit
If a X/Y high/low limit is reached, a message
box is displayed in red.
Otherwise the box is hidden.
• Nanomotor Step
This function allows you to select the step size
from a drop down menu.
Coarse
Medium
Fine
The arrow buttons can be used to move the stage in single steps of the defined size, or to
continuously move the Piezo stage when pressing down one of the arrow buttons.
To be able to move the Piezo stage with the arrow buttons, the Piezo Manual checkbox has
to be ticked.
• Piezo Exchange Defined
Indicates whether a specimen exchange position is defined for the Piezo stage or not.
An exchange position can be set by clicking on Set Exchange Position.
• Piezo Goto X / Y
Allows you to enter predefined coordinates in a separate window.
When clicking on OK, the Piezo stage will move to the entered coordinates.
• Piezo State
Indicates the current state of the Piezo stage
Idle: stage is standing still
Moving: stage is moving
Uninitialised: stage has not been initialised yet
• Piezo Manual
Activates/deactivates the arrow buttons.
• Die Navigation
• Fold in / out icon
Folds in / out the lower part of the window.
• Set Exchange Position
Allows you to set a specimen exchange position for the Piezo stage.
• Piezo Initialise
Initialises the Piezo stage
• Peltier
Indicates if a Peltier cool stage is fitted and the
Peltier Fitted checkbox in the SmartSEM®
Administrator is ticked.
• Peltier Temp
Indicates the current Peltier temperature if a
Peltier cool stage is fitted and the Peltier Fitted
checkbox in the SmartSEM® Administrator is
ticked.
• Peltier Target
Indicates the Peltier target temperature.
Plasma Cleaner
• Connected
If active, the Plasma Cleaner controller hard-
ware is switched on and connected.
• Enabled
If active, a plasma cleaning process is run-
ning. This LED is also present on the Plasma
Cleaner controller hardware (ENABLE/DISA-
BLE).
• RF On
If active, a plasma cleaning cycle is running
and the radio frequency is on, which is neces-
sary for the plasma to start. This LED is also
present on the Plasma Cleaner controller
hardware (RF ON).
• Plasma On
If active, a plasma cleaning cycle is running
and the plasma has ignited. This LED is also
present on the Plasma Cleaner controller
hardware (PLASMA ON).
• Fault
If active, the Plasma Cleaner is in error state.
• Plasma Cleaning Sequence
Displays the steps of the currently running
plasma cleaning cycle and their completion
status.
• View Log...
Opens the Log file.
Start cleaning
Starts a plasma cleaning cycle using the current
settings.
Stop cleaning
Stops the currently running plasma cleaning cycle
and pumps the chamber.
• Type
Displays the type of recipe:
- Fixed: Not editable and not deletable
- User: Editable and deletable
• Recipe Name
Displays the name of the recipe.
• Ignition Pressure (mbar)
Displays the plasma ignition pressure.
• Plasma Pressure (mbar)
Displays the plasma operating pressure.
• Plasma Power (Watts)
Displays the plasma operating power. Up to 20 Watts can be selected.
• Plasma Time (hh:mm)
Displays the plasma time.
For recipes without nitrogen purge, Plasma Time equals Total Time.
• Purge Pressure (mbar)
Displays the nitrogen purge pressure.
• Purge Time (hh:mm)
Displays the timespan for each nitrogen purge.
• Cycles
Shows the number of cycles. One cycle consists of plasma cleaning and a nitrogen purge.
This value is only present if the recipe includes one or more nitrogen purges.
• Total Time (hh:mm)
Displays the total time required to run the recipe. It is determined by the values Plasma Time,
Purge Time and Cycles.
• Add...
Opens a dialog that allows you to create a new recipe.
• Edit...
Opens a dialog that allwos you to edit the currently selected recipe. This is only available for
‘User‘ type recipes.
• Delete...
Opens a dialog that allows you to delete the currently selected recipe. This is only available
for ‘User‘ type recipes.
• Close...
Closes the Cleaning Recipes list.
6.2.26. Rotate/Tilt
• Scan Rot
If ticked, the scan rotation is active.
Requires the licence SCANROT.
• Scan Rotation
Allows setting of the scan rotation angle.
• Tilt Corrn.
If ticked, the tilt correction is active.
• Tilt Angle
Allows adjustment of the tilt angle.
• Show Gallery
Shows the Sample Holder Gallery
• Calibrate Stage Centre
Calibrates the centre of the stage.
• Calibrate
Calibrates the height of the stage.
• Save/Load
- Load
This function loads the coordinate list from a
previously saved file. The current list of position
data is deleted.
- Save
Saves the active list to the user directory.
The extension is *.XYZ.
• On Goto
Opens a drop-down list with these entries:
- Set Magnification
If activaded, the magnification of a list entry will
be applied when the respective entry is select-
ed. If deactivated, the magnification will remain
at the current setting.
- Set Working Distance
If activated, the working distance will of a list
entry will be applied when the respectivy entry
is selected. If deactivated, the magnification will
remain at the current setting.
- Move XY Only
If activated, the stage will only move in X and Y
when a list entry is selected.
• Add
Opens the Label Request dialog that allows
you to add a new stage position with a custom
label.
• Del
Allows you to delete a stage position from the list. Only available if a list entry has been se-
lected.
• Edit
Allows you to edit a stage position on the list. Only available if a list entry has been selected.
• Undo Stage Goto
Cancels the stage movement.
• Stage stop
Stops the movement.
• Goto
- First
Moves the stage to the position defined by the first entry in the Stage Points List.
- Next
Moves the stage the position defined by the next entry in the Stage Points List.
- Prev
Moves the stage to the position defined by the previous entry in the Stage Points List.
- Selected
Moves the stage to the position defined by the highlighted entry in the Stage Points List.
Allows you to scan an exactly defined series of regularly distributed image fields.
• Setup Wizard
Starts the wizard
Survey Mode provides the facility to enter a defined state Survey Mode State. Typically a long
working distance and low magnification to achieve a wide field of view in which the specimen may
be reviewed for features of interest. (Refer to the SmartSEM® help for a detailed description)
.
• Joystick speed
Changes the speed of the joystick
• Stig Sensitivity
Changes the sensitivity of the stigmator
• Panel Sensitivity
Changes the sensitivity of the control panel
encoders such as Focus
• Reset User Align
Resets the user-specific user alignment table
• OK
Confirms the settings
• VP Target
Sets the desired pressure.
• Go To HV/Go To VP
Toggles between high vacuum mode (HV)
and variable pressure mode (VP).
• Collector Bias
Sets the collector bias of the VPSE detector.
• EO Temp
Only in case of an error: Indicates the current
temperature of the EO Board.
• EO Temp Limit
Only in case of an error: Indicates the limit
temperature of the EO Board.
• SEM Overheat
Indicates the status.
• Reset Overheat
Quits the error message.
• Close
Closes the Water Flow/Temperature dialog.
EO
This section covers all water supply of the EO
board, which is divided in the EO dynamic and the
EO static.
• EO dynamic flow
Indicates the status of the EO dynamic water
flow.
• EO dynamic temperature
Indicates the status of the EO dynamic water
temperature.
• EO static water flow
Indicates the status of the EO static board
water flow.
• EO static water temperature
Indicates the status of the EO static water
temperature.
Water Flow
This section covers overall water flow and
temperatures
• Water OK
Indicates the water flow status.
• Water flow temperature
Indicates the water flow temperature.
• Water return temperature
Indicates the water return temperature.
• Close
Closes the Water Flow/Temperature dialog.
6.2.43. Windowing
• Windowing
If ticked, the windowing function is active.
• Zone =
Selects the active zone.
Zone 0: outside the reduced raster
Zone 1: inside the reduced raster
• SignalA =
Selects the detector signal
• Invert A = On/Off
Activates/deactivates the inversion of the sig-
nal of the respective zone
Icon Tool tip text Left mouse button Middle mouse button
Restore Conditions/ Loads the state stored last when Activates the window loading a
Load State the program was ended. stored state (Load State).
Accelerating Voltage/ Opens the EHT target window to Calls the Gun tab in the SEM
Gun Control set the acceleration voltage Controls window
Specimen Change/ Ventilates the specimen cham- Calls the Gun Vacuum tab in
Vacuum Control ber. the SEM Controls window.
Pumps the specimen chamber.
VP Control/VP Target Calls the VP Control panel. Assigned with the VP Target
Pix Avg 1/ Cont Avg 2 Pixel averaging at scan speed 2 Continuous frame averaging at
scan speed 2
Pix Avg3/Cont Avg4 Pixel averaging at scan speed 3 Continuous frame averaging at
scan speed 4
Pix Avg6/Cont Avg? Pixel averaging at scan speed 6 Continuous frame averaging at
scan speedspeed 6
Pix Avg 9/Frame Int 5 Pixel averaging at scan speed 9 Frame averaging at scan speed
5 (image is frozen after scan)
Frame Int/Frame Int 8 Frame averaging at scan speed Frame averaging at scan speed
7 (image is frozen after scan) 8 (image is frozen after scan)
Normal/Scanning Normal screen mode (Scan Calls Scanning tab in the SEM
range displayed over the com- Controls window
plete monitor). Wobbler is
switched off. Mouse button
assignment: magnification/focus
Icon Tool tip text Left mouse button Middle mouse button
Reduced Raster/ Switches between reduced scan Calls Aperture tab in the SEM
Apertures and normal screen mode. Controls Panel.
Split Screen/ Switches between split screen Calls Detectors tab in the SEM
Detectors and normal screen mode. Controls Panel.
Dual Magnification/ Switches between dual magnifi- Calls Detectors tab in the SEM
Detectors cation and normal screen mode. Controls Panel.
ChamberScope/ Activates the CCD TV camera. Calls Detectors tab in the SEM
Detector Control Mouse button assignment: Controls Panel.
brightness/contrast
Toggle INLENS:SE2/ Switches between In-lens and Calls Detectors tab in the SEM
Detector Control SE2 detector Controls Panel.
Magnification + Mouse button assignment: mag- Calls Auto Focus and Auto Stig-
Focus/ nification/focus mator algorithm.
Auto Focus + Stig
Save TIFF/ Saving an image as TIFF file with Calls Export TIFF window.
TIFF Export Dialog the agreed settings
Print Image/ Prints the image on the default Calls Print Setup window
Printer Dialog printer.
EM Parameter Adds parameters, the user has selected from a list dis-
played.
Sticky Panel Adds a rectangle to the overlay plane onto which anno-
tation objects can be "stuck". The rectangle can be
transparent or filled with a pattern.
Fixed Micron Marker Adds a horizontal bar which indicates the size of an
object in the image. The bar represents a fixed dimen-
sion.
Point to Point Measure Allows you to measure the size of a certain feature.
Width Measurement Cursors Comprises a related pair of vertical lines. Each line may
be adjusted in position.
Height Measurement Cursors Comprises a related pair of horizontal lines. Each line
may be adjusted in position.
6.6. Shortcuts
Many functions and menus which are often used in the SmartSEM® user interface can also be
opened using the keyboard.
The function keys F5, F6, F7, F8 and F11 as well as SHIFT + F5, F6, F7, F8 and F11 can be
assigned with different functions via the macro editor.
The different keys and key combinations in the SmartSEM® software are briefly explained in the
table below.
<CTRL + E> Calls the Export TIFF dialog for saving the image.
<CTRL + F4> During the use of the Magnification Table: Returns to the
previously used magnification.
7. Abbreviations
2D Two dimensional
BMP Bitmap
CC Charge compensation
DB Database
EM Electron microscope
HV High vacuum
I Current
ID Identification
SE Secondary electron
V Voltage
VP Variable pressure
WD Working distance
XB Cross Beam®
8. Glossary
Annotation Software function that allows adding notes or graphical objects to the
image.
Crosshairs A graphical object for assessing the relative position of objects in the
image.
Eucentric Type of stage, the rotation axes of which intersect in the same point.
The specimen surface is located in the eucentric point, where the tilt axis
meets the beam axis. This guarantees that the focus is maintained when
the specimen is tilted at a certain working distance.
Expert One of the SmartSEM® user levels, good for a person with special knowl-
edge and training in operating a FESEM.
High current Mode which increases the active probe current obtained by a stronger
activation of the condenser lens.
Ingredient list A list that defines the contents of a recipe, i.e. the combination of saved
parameters.
Licence Licences are used to enable specific functionality in the SmartSEM® soft-
ware.
LUT Look Up Table which can be used to improve the image illumination.
Magnification Table Function of SmartSEM® that allows you to enter fixed magnifications for
quick access during the imaging procedure.
MiniBar Part of the SmartSEM® user interface which allows quick access to
recently used dialogs and to the recipe management.
Novice One of the SmartSEM® user levels, good for a person who is new and
has little experience in operating a FESEM.
OptiProbe Optional function which allows you to continuously adjust the probe cur-
rent.
Recipes Function of SmartSEM® that allows you to save a set of SEM parameters
which are ideal for a certain type of specimen.
Supervisor Privilege that permits to start the Administrator and - among others - ena-
bles to edit or create user directories and to start the bakeout function.
User Preferences Section that allows you to define user-specific pre-setting of the Smart-
SEM® user interface e.g. language or pressure units.
Zone Part of the image area when displaying different detector signals or
image areas.
9. Index
A D
Acceleration voltage 95 Data zone 25, 212, 260
Accounting 198 DEFECT REVIEW 227
Administrator 190 Detector Signal Out Configuration 300
Airlock 291 Detectors 109
Anchor symbol 25, 114 Dongles 15
Annotation bar 25 Dot, blue 26
Annotation icons 326 Dot, red 26
Annotations 153 Drift Correction 301
Any Level 194 Drift Max Tries = 301
Aperture 102 Drift Max. Pix.Error = 301
Aperture size 98 Drift Min Conf = 301
Astigmatism 103 Dynamic Focus 131
Auto Stigmation 103
AutoBC 112 E
AVI 178 EDX 124
EHT 95
B Error messages 239
Backlash 68 Evacuating 63
Backup 228 Expert 26, 194, 209
Bakeout 292 Ext Scan Control 303
Beam shift 67, 263 Extractor voltage 99
Beam shift, large 67
Blanking the beam 97 F
BMP 175 Fisheye mode 72
Brightness 111 Focus wobble 48, 102
Frame Average 135
C Frame Integrate 135
Calibrating magnification 220 FTP server 184
Camelot software 226 Full 194
CAN Communication 295
CCD camera 120, 241 G
Centre feature function 85 Graticule spacing 261
Centre point function 85 Graticules 163, 165, 261
ChamberScope 120 Gun 93, 94
Cleaning Recipes 311 Gun Monitor 106
Clipboard 257 Gun Vacuum 59, 60
Collector Bias 110
Collector voltage 110 H
Colour mode 117 Help 53
Column Chamber Valve 275, 291 High current mode 100
Compucentric 78 HV mode 65
Continous Average 136
Continuous Centre Point 85 I
Contrast 111 Icons 216
Control panel 206 Image area 115
Coordinate system 91 Image Capture Mode 177
Copying images 182 Image drift 69
Crosshairs 163, 261 Image Gallery 180
Crosshairs, movable 164, 260 Image Navigation 304
Image stitching 20
Image Stitching Application 17
K Q
Knights Camelot 226 Question mark near micron marker 72
Quiet Mode 232
L
Language 208 R
Large Image Store Wizard 187, 305 Recipe 248
Laser Finder 232, 305 Recipe, common 166
Licence 15, 19, 223 Recipe, user-specific 166
Line 126 Recipes 166
Line Average 135 Reduced raster 123
Line Integrate 135 RS232 224
Line Scan 126
Loading images 179 S
Logo 213 Safety 11, 12
Long Distance Measurement 306 Sample Holder 75
Look Up Tables 138 Sample Holder Gallery 77
LUT 138, 147 Saving images 173, 177
Scan mark 126
M Scan marker 129
Macros 278 Scan speed 122
Magnification 118, 130, 220 Scanning 269
Magnification Table 130, 210 SCANROT 128
Magnifications, pre-defined 130, 210 SEM parameters 104, 106
Measuring 158 SEM Status 261
Menu bar 25 SEM status window 104
Menus 247 Service 209
Micron marker 72, 157 Service/Full 26
MiniBar 25, 172, 325 Signal-to-noise ratio 135
Mixing 113 SmartSEM® Administrator 190
Mouse 206 SmartStitch 17, 18
Mouse buttons 323 Soft joystick 66
Specimen chamber 74
N Specimen current 233
Nano Motor Control 307 Specimen exchange 61
Noise reduction 135, 137 Splash screen 207
Novice 26, 194, 209 Spot 124
Stage centre 78
O Stage coordinates 84
OptiProbe 101, 239, 242 Stage initialise 195, 240
Overheat 244 Stage Map 86
Owners 203 Stage navigation 74
Stage, non-eucentric 78
P Status bar 25
Panel Configuration Bar 25, 34, 290 Stereo image 144
Partial Vent on Standby 275 Stigmator 103, 206
Password 191, 195 Supervisor 191, 195
Peltier Stage 308 Survey Mode 88, 90
System requirements 15
System Vacuum 59
T
Taking videos 178, 287
Temperature 244, 245
Terms 14
TIF 173
Tilt Correction 133
Toolbar 25, 215, 255, 259
Toolbar icons 323
Touch alarm 66, 239, 244
Triangle, red 26, 177
Troubleshooting 239
Typography 13
U
User 190
User access levels 26, 209
User accounting 198
User interface (UIF) 24, 208
User Level Permissions 194
User preferences 208
User profile 192, 196
User toolbar 25
Users 198
V
Vac Quiet Mode 232
Vacuum 59
Variable pressure 64
Ventilating 61
VP instruments 59, 64
VP mode 64
W
Wafer defect files 227
Water flow 244, 245, 246
WDX 124
Windowing 114
Windows XP Remote 225
Wobble 48, 102
Working distance 121
working session 198
Z
Z 195
Z move on Vent 195, 274, 283
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