9 N 90 e

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9A 900V

KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

1.Description

These N-Channel enhancement mode power field effect transistors are produced using
Fairchild’s proprietary, planar stripe, DMOS technology.This advanced technology has been especially
tailored to minimize on-state resistance, provide superior switching performance, and withstand high
energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient
switched mode power supplies, active power factor correction, electronic lamp ballast based on half bridge
to pology.

2. Features

n 9A, 900V, RDS(on)=1.12Ω @ VGS=10 V


n Low gate charge ( typical 70 nC)
n Low Crss ( typical 14pF)
n Fast switching
n 100% avalanche tested
n Improved dv/dt capability
n RoHS compliant

3. Pin configuration

Pin Function

1 Gate

2 Drain

3 Source

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9A 900V
KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

4. Absolute maximum ratings

(TC= 25 ºC , unless otherwise specified)


Parameter Symbol Ratings Units
Drain-source voltage VDSS 900 V
TC=25°C 9.0 A
Drain current ID
TC=100°C 5.7 A
Drain current (note1) IDM 36 A
Gate-source Voltage VGSS ± 30 V
Single pulsed avalanche energy (note2) EAS 900 mJ
Avalanche current (note1) IAR 9.0 A
Repetitive avalanche energy (note1) EAR 28 mJ
Peak diode recovery dv/dt (note 3) dv/dt 4.0 V/ns
TC=25°C 280 W
Power dissipation PD
Derate above 25°C 2.22 W/°C
Operating and storage temperature range TJ, TSTG -55 to +150 °C
Maximum lead temperature for soldering purposes,
TL 300 °C
1/8" from case for 5 seconds

5. Thermal characteristics

Parameter Symbol Typ Max Units


Thermal resistance, junction-to-case RθJC - 0.45 °C/W
Thermal resistance, case-to-sink RθCS 0.24 - °C/W
Thermal resistance, junction-to-ambient RθJA - 40 °C/W

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9A 900V
KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

6. Electrical characteristics
(TC=25°C,unless otherwise notes)
Parameter Symbol Test Conditions Min Typ Max Units
Off characteristics
Drain-source breakdown voltage BVDSS VGS=0V,ID=250μA 900 - - V
VDS=900V,VGS=0V - - 10 μA
Zero gate voltage drain current IDSS
VDS=720V,TC=125°C - - 100 μA
Gate-body leakage Forward VGS=30V,VDS=0V - - 100 nA
IGSS
current Reverse VGS=-30V,VDS=0V - - -100 nA
Breakdown voltage temperature ID=250μA
△BVDSS/△TJ - 0.9 - V/°C
coefficient Referenced to 25°C
On characteristics
Gate threshold voltage VGS(th) VDS=VGS, ID=250μA 3.0 - 5.0 V
Static drain-source on-resistance RDS(on) VGS=10V,ID=4.5A - 1.12 1.4 Ω
VDS=40V,ID=4.5A
Forward transconductance gFS - 9.0 - S
(note4)
Dynamic characteristics
Input capacitance CISS - 2780 pF
VDS=25V,VGS=0V,
Output capacitance COSS - 228 pF
f=1MH Z
Reverse transfer capacitance CRSS - 28 pF
Switching characteristics
Turn-on delay time tD(ON) - 55 ns
Rise time tR VDD=450V,ID=9.0A, - 130 ns
Turn-off delay time tD(OFF) RG=25Ω (note4, 5) - 110 ns
Fall time tF - 80 ns
Total gate charge QG - 70 nC
VDS=720V, ID=9.0A,
Gate-source charge QGS - 13.5 - nC
VGS=10V (note4, 5)
Gate-drain charge QGD - 27 - nC
Drain-source diode characteristics and maximum ratings
Maximum continuous drain-source
diode forward current IS - - 9.0 A
Maximum pulsed drain-source diode
forward current ISM - - 36.0 A

Drain-source diode forward voltage VSD VGS=0V,IS=9.0A - - 1.4 V


Reverse recovery time tRR VGS=0V,IS=9.0A, - 850 - ns
dIF/dt=100A/μs
Reverse recovery charge QRR (note 4) - 10 - μC
Note:1. Repetitive rating : pulse width limited by maximum junction temperature
2. L=21mH, IAS= 9.0A, VDD=50V, RG=25Ω, starting TJ=25°C
3. ISD≤9.0A, di/dt≤200A/μs, VDD≤BVDSS, Starting TJ=25°C
4. Pulse test : pulse width≤300μs, duty cycle≤2%
5. Essentially independent of operating temperature

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9A 900V
KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

7.Test circuits and waveforms

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900V
KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

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900V
KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

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900V
KIA
SEMICONDUCTORS
N-CHANNEL MOSFET 9N90H

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