General Description: AOT11S65/AOB11S65/AOTF11S65
General Description: AOT11S65/AOB11S65/AOTF11S65
General Description: AOT11S65/AOB11S65/AOTF11S65
General Description
The AOT11S65 & AOB11S65 & AOTF11S65 have been fabricated using the advanced αMOSTM high voltage process that is designed to deliver high levels of
performance and robustness in switching applications. By providing low RDS(on), Qg and EOSS along with guaranteed avalanche capability these parts can be
adopted quickly into new and existing offline power supply designs.
Features
VDS @ Tj,max 750V
IDM 45A
RDS(ON),max 0.399Ω
Qg,typ 13.2nC
Eoss @ 400V 2.9µJ
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25 20
10V 7V
20 16 10V
7V
6V
6V
15 12
5.5V
ID (A)
ID (A)
5.5V 8
10 5V
5V 4 VGS=4.5V
5
VGS=4.5V
0
0
0 5 10 15 20
0 5 10 15 20
VDS (Volts) VDS (Volts)
Figure 1: On-Region Characteristics@25°C Figure 2: On-Region Characteristics@125°C
100 1.2
-55°C
VDS=20V
10 0.9
RDS(ON) (Ω )
125°C
VGS=10V
ID(A)
1 0.6
0.01 0.0
2 4 6 8 10 0 5 10 15 20 25
VGS(Volts) ID (A)
Figure 3: Transfer Characteristics Figure 4: On-Resistance vs. Drain Current and
Gate Voltage
3 1.2
Normalized On-Resistance
2.5
VGS=10V
1.1
ID=5.5A
BVDSS (Normalized)
1.5 1
1
0.9
0.5
0 0.8
-100 -50 0 50 100 150 200 -100 -50 0 50 100 150 200
Temperature (°C) TJ (oC)
Figure 5: On-Resistance vs. Junction Temperature Figure 6: Break Down vs. Junction Temperature
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1.0E+01
12 VDS=480V
125°C
1.0E+00 ID=5.5A
VGS (Volts)
1.0E-01 25°C
IS (A)
1.0E-02 6
1.0E-03
3
1.0E-04
1.0E-05 0
0.0 0.2 0.4 0.6 0.8 1.0 0 4 8 12 16 20
VSD (Volts) Qg (nC)
Figure 7: Body-Diode Characteristics (Note E) Figure 8: Gate-Charge Characteristics
10000 6
Ciss 5
1000
Capacitance (pF)
Eoss(uJ)
4
100
Coss
3 Eoss
10
2
Crss
1
1
0 0
0 100 200 300 400 500 600 0 100 200 300 400 500 600
100 100
RDS(ON) RDS(ON)
10 limited 10µs
10µs 10 limited
ID (Amps)
ID (Amps)
100µs 100µs
1 DC 1
1ms 1ms
10ms DC 10ms
0.1 0.1s
0.1
1s
TJ(Max)=150°C TJ(Max)=150°C
TC=25°C TC=25°C
0.01 0.01
1 10 100 1000 1 10 100 1000
VDS (Volts) VDS (Volts)
Figure 11: Maximum Forward Biased Safe Figure 12: Maximum Forward Biased Safe Operating
Operating Area for AOT(B)11S65 (Note F) Area for AOTF11S65(Note F)
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100 150
RDS(ON) 10µs
120
10 limited
EAS(mJ)
100µs
ID (Amps)
90
1 1ms
DC 10ms 60
0.1 0.1s
TJ(Max)=150°C 1s 30
TC=25°C
0.01 0
1 10 100 1000 25 50 75 100 125 150 175
VDS (Volts) TCASE (°C)
Figure 13: Maximum Forward Biased Safe Operating Figure 14: Avalanche energy
Area for AOTF11S65L(Note F)
12
10
Current rating ID(A)
0
0 25 50 75 100 125 150
TCASE (°C)
Figure 15: Current De-rating (Note B)
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1 RθJC=0.63°C/W
0.1
PD
Single Pulse
0.01
Ton
T
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10
Pulse Width (s)
Figure 16: Normalized Maximum Transient Thermal Impedance for AOT(B)11S65 (Note F)
10
D=Ton/T In descending order
Zθ JC Normalized Transient
1 RθJC=3.25°C/W
0.1
PD
0.01
Ton
Single Pulse
T
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100
Pulse Width (s)
Figure 17: Normalized Maximum Transient Thermal Impedance for AOTF11S65 (Note F)
10
D=Ton/T In descending order
Zθ JC Normalized Transient
1 RθJC=4°C/W
0.1
PD
0.01
Single Pulse
Ton
T
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100
Pulse Width (s)
Figure 18: Normalized Maximum Transient Thermal Impedance for AOTF11S65L (Note F)
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Vgs
Qg
+ 10V
VDC
+ Vds Qgs Qgd
- VDC
DUT -
Vgs
Ig
Charge
Res istive Switching Test Circuit & Waveforms
RL
Vds
Vds
90%
DUT
+
Vgs VDC Vdd
Rg -
10%
t on t off
Id Vds
Vgs + Vdd I AR
Vgs VDC
Rg - Id
DUT
Vgs Vgs
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