Unit III PDF
Unit III PDF
Unit III PDF
OPTICAL SOURCES
3.1 Optical Sources
Optical transmitter coverts electrical input signal into corresponding optical signal.
The
optical signal is then launched into the fiber. Optical source is the major component in an
optical transmitter .Popularly used optical transmitters are Light Emitting Diode (LED) and
semiconductor
Laser Diodes (LD)
Characteristics of Light Source of Communication
To be useful in an optical link, a light source needs the following characteristics
It must be possible to operate the device continuously at a variety of temperatures for
many years.
It must be possible to modulate the light output over a wide range of modulating
frequencies. For fiber links, the wavelength of the output should coincide with one of
transmission windows for the fiber type used.
To couple large amount of power into an optical fiber, the emitting area should be
small.
To reduce material dispersion in an optical fiber link, the output spectrum should be
narrow.
The power requirement for its operation must be low.
The light source must be compatible with the modern solid state devices.
The optical output power must be directly modulated by varying the input current to
the device.
Better linearity of prevent harmonics and intermodulation distortion.
High coupling efficiency.
High optical output power.
High reliability.
Low weight and low cost.
Two types of light sources used in fiber optics are light emitting diodes (LEDs) and laser
diodes (LDs).
LED configurations
At present there are two main types of LED used in optical fiber links
Surface emitting LED
Edge emitting LED.
Both devices used a DH structure to constrain the carriers and the light to an active layer.
Surface Emitting LEDs
In surface emitting LEDs the plane of active light emitting region is oriented perpendicularly
to the axis of the fiber. A DH diode is grown on an N-type substrate at the top of the diode as
shown in Fig. 3.1.2. A circular well is etched through the substrate of the device. A fiber is
then connected to accept the emitted
At the back of device is a gold heat sink. The current flows through the p-type material
and forms the small circular active region resulting in the intense beam of light.
shown in Fig. 3.1.3. The beam intensity is maximum along the normal.
The power is reduced to 50% of its peak when θ = 60o, therefore the total half-power
beamwidth is 120o. The radiation pattern decides the coupling efficiency of LED.
Edge Emitting LEDS (ELEDs)
In order to reduce the losses caused by absorption in the active layer and to make the beam
more directional, the light is collected from the edge of the LED. Such a device is known as edge
emitting LED or ELED.
It consists of an active junction region which is the source of incoherent light and two guiding
layers. The refractive index of guiding layers is lower than active region but higher than outer
surrounding material. Thus a waveguide channel is form and optical radiation is directed into
the fiber. Fig. 3.1.4 shows structure of LED
semiconductors the electrons and holes on either side of bandgap have same value of
crystal momentum. Hence direct recombination is possible. The recombination occurs within
10-8 to 10-10 sec.
In indirect bandgap semiconductors, the maximum and minimum energies occur at different
values of crystal momentum. The recombination in these semiconductors is quite slow i.e. 10-
2 and 10-3 sec.
The active layer semiconductor material must have a direct bandgap. In direct bandgap
semiconductor, electrons and holes can recombine directly without need of third particle to
conserve momentum. In these materials the optical radiation is sufficiently high. These
materials are compounds of group III elements (Al, Ga, In) and group V element (P, As, Sb).
Some tertiary allos Ga1-x Alx As are also used.
The peak output power is obtained at 810 nm. The width of emission spectrum at half
power (0.5) is referred as full width half maximum (FWHM) spectral width. For the
given LED FWHM is 36 nm.
The fundamental quantum mechanical relationship between gap energy E and
frequency
v is given as
where, energy (E) is in joules and wavelength (λ) is in meters. Expressing the gap energy (Eg)
in electron volts and wavelength (λ) in micrometers for this application.
Eg = 1.513 eV
now
Example 3.1.2 : For an alloy In0.74 Ga0.26 As0.57 P0.43 to be sued in Led. Find the
wavelength emitted by this source.
Solution : Comparing the alloy with the quartenary alloy composition. In1-x Gax As P1-y it is
found that
x = 0.26 and y= 0.57
Eg = 1.35 – 0.72 y + 0.12 y2
Using
Eg = 1.35-(0.72 x 0.57) + 0.12 x 0.572
Eg = 0.978 eV
now
Where,
Rr is radiative recombination rate.
Rnr is non-radiative recombination rate.
If n are the excess carriers, then radiative life time, and non-radiative life time,
The internal quantum efficiency is given The recombination time of carriers in active region is
τ. It is also known as bulk recombination life time.
Therefore internal quantum efficiency is given as –
If the current injected into the LED is I and q is electron charge then total number of re
combinations per second is –
Example 3.1.3 : The radiative and non radiative recombination life times of minority
carriers in the active region of a double heterojunction LED are 60 nsec and 90 nsec
respectively. Determine the total carrier recombination life time and optical power generated
internally if the peak emission wavelength si 870 nm and the drive currect is 40 mA.
Solutions:
Given : λ = 870 nm 0.87 x 10-6 m
τr = 60 nsec.
τnr = 90 nsec.
I = 40 mA = 0.04 Amp.
i) Total carrier recombination life time:
iii)
iv)
Example 3.1.4 : A double heterjunciton InGaAsP LED operating at 1310 nm has radiative
and non-radiative recombination times of 30 and 100 ns respectively. The current injected is
40 Ma.
Calculate – Bulk recombination life time. Internal quantum efficiency Internal power level.
Disadvantages of LED
1. Refraction of light at semiconductor/air interface.
2. The average life time of a radiative recombination is only a few nanoseconds, therefore
3. Modulation BW is limited to only few hundred megahertz.
4. Low coupling efficiency.
5. Large chromatic dispersion.
Comparison of Surface and Edge Emitting LED
LED type Max. modulation freq. (MHz) Output power (mW) Fiber coupled power
Surface emitting 60 <4 < 0.2
Edge emitting 200 <7 < 1.0
Spontaneous emission gives incoherent radiation while stimulated emission gives coherent
radiation. Hence the light associated with emitted photon is of same frequency of incident
photon, and in same phase with same polarization.
It means that when an atom is stimulated to emit light energy by an incident wave, the
liberated energy can add to the wave in constructive manner. The emitted light is bounced
back and forth internally between two reflecting surface. The bouncing back and forth of light
wave cause their intensity to reinforce and build-up. The result in a high brilliance, single
frequency light beam providing amplification.
Emission and Absorption Rates
It N1 and N2 are the atomic densities in the ground and excited states.
Rate of spontaneous emission
Rspon = AN2
Rate of stimulated emission
Rstim = BN2 ρem
Rate of absorption
Rabs = B’ N1 ρem
where,
A, B and B’ are constants.
ρem is spectral density.
Under equilibrium condition the atomic densities N1 and N2 are given by Boltzmann
statistics.
where,
KB is Boltzmann constant.
T is absolute temperature.
Under equilibrium the upward and downward transition rates are equal.
AN2 + BN2 ρem = B’ N1 ρem
Spectral density ρem
Comparing spectral density of black body radiation given by Plank’s formula,
Therefore, … A and B are called Einstein’s coefficient.
Fabry – Perot Resonator
Lasers are oscillators operating at frequency. The oscillator is formed by a resonant
cavity providing a selective feedback. The cavity is normally a Fabry-Perot resonator i.e. two
Light propagating along the axis of the interferometer is reflected by the mirrors back
to the amplifying medium providing optical gain. The dimensions of cavity are 25-500 μm
longitudinal 5-15 μm lateral and 0.1-0.2 μm transverse. Fig. 3.1.10 shows Fabry-Perot resonator
cavity for a laser diode.
The two heterojunctions provide carrier and optical confinement in a direction normal to the
junction. The current at which lasing starts is the threshold current. Above this current the
output power increases sharply.
Distributed Feedback (DFB) Laser
In DFB laster the lasing action is obtained by periodic variations of refractive index along the
longitudinal dimension of the diode. Fig. 3.1.11 shows the structure of DFB laser diode
where, is optical field confinement factor or the fraction of optical power in the active layer.
α is effective absorption coefficient of material.
g is gain coefficient.
h v is photon energy.
z is distance traverses along the lasing cavity.
The condition of lasing threshold is given as –
For amplitude : I (2L) = I (0)
For phase : e-j2β L = 1
Optical gain at threshold = Total loss in the cavity.
i.e. Γ gth = αt
where,
Αend is mirror loss in lasing cavity. An important condition for lasing to occur is that gain, g ≥
g th i.e. threshold gain.
Example 3.1.5 : Find the optical gain at threshold of a laser diode having following
parametricvalues – R1 = R2 = 0.32, α = 10cm-1 and L = 500 μm.
where,
ηi = Internal quantum efficiency (0.6-0.7).
gth = Threshold gain.
α = Absorption coefficient
Typical value of ηext for standard semiconductor laser is ranging between 15-20 %.
Resonant Frequencies
At threshold lasing
2β L = 2π m
where, (propagation constant)
m is an integer.
Since c = vλ
Substituting λ in 3.1.30
Gain in any laser is a function of frequency. For a Gaussian output the gain and frequency are
related by expression –
where, g(0) is maximum gain. λ0 is center wavelength in spectrum.is spectral width of the
gain.The frequency spacing between the two successive modes is –
At low current laser diode acts like normal LED above threshold current, stimulated emission
i.e. narrowing of light ray to a few spectral lines instead of broad spectral distribution, exist.
This enables the laser to easily couple to single mode fiber and reduces the amount of
uncoupled light (i.e. spatial radiation distribution). Fig. 3.1.14 shows spectral and spatial
distribution difference between two diodes
LASER
1.
2.
3.
OPTICAL DETECTORS
➢ The photo-diode is in fact a p-n junction put to the exact opposite use as the LED
➢ The variation in current is a function of the incident light
➢ Use of the stimulated absorption of light by the semiconductor material for the
generation of electron-hole pairs.
➢ The energy of the absorbed photons to transfer the electrons from the ground to the
excited state contributes to the variation in circuit current.
➢ The energy of the absorbed photon must at least be equal to the band-gap of the
material for the material to respond to the incoming photons.
PIN diode
➢ A simple way to increase the depletion-region width is to insert a layer of undoped (or
lightly doped) semiconductor material between the p–n junction.
➢ Since the middle layer consists of nearly intrinsic material, such a structure is referred
to as the p–i–n photodiode.
➢ When photon enters photodetector, the low band gap absorption layer absorbs the
photon, and an electron-hole pair is generated. This electron hole pair is called
photocarrier.
➢ These photocarriers, under the influence of a strong electric field generated by a
reverse bias potential difference across the device as shown in figure produce
photocurrent proportional to number of incident photons.
➢ APD is similar to PIN diode the exception is the addition of high intensity electric field
region.
➢ In this region primary electron hole pairs are generated by the incident photons which
are able to absorb enough kinetic energy from strong electric field to collide with the
atoms present in this region, thus generating more electron hole pairs.
➢ The physical phenomenon behind the internal current gain is known as the impact
ionization.
➢ This impact ionization leads to avalanche breakdown in ordinary reverse bias. It
requires very high reverse bias voltage in order that the new carriers created by
impact ionization can themselves produce additional carriers by same mechanism.
➢ This process of generating more than one electron hole pair from incident photon
through ionization process is referred to as the avalanche effect.
➢ Thus the avalanche multiplication results in amplification of photodiode current.
➢ Multiplication factor: Multiplication factor M is a measure of internal gain provided by
APD. It is defined as the ratio of total multiplied output current to the primary un
multiplied current.
M=IIpM=IIp
1 PIN does not have high APD has high intensity electric field region.
intensity electric field region.
2 Photo current (IpIp) generated Photo current (IpIp) generated is more compared to PIN,
is less compared to APD
Ip=qNθ.M
Ip=qNθ,
q = electron charge,
q = electron charge,
Nθ= carrier number,
Nθ = carrier number
M = multiplication factor
3 Responsively of PIN is limited. Responsively of APD can have much larger values.
4 They exhibit lower noise levels. They exhibit higher noise levels as compared to PIN due
to impact ionization and photocurrent multiplication.
5 Response time of PIN is half Response time of APD is almost double that of PIN.
that of APD.
The PIN-diode is an alteration of the PN-junction for particular applications. After the PN-
junction diode was developed in the year 1940s, the diode was first exercised as a high-
power rectifier, low-frequency during the year 1952. The occurrence of an intrinsic layer can
significantly increase the breakdown voltage for the application of high-voltage. This intrinsic
layer also offers exciting properties when the device operates at high frequencies in the
range of radio wave and microwave. A PIN diode is a one kind of diode with an undoped,
wide intrinsic semiconductor region between a P-type and N-type semiconductor
region. These regions are normally heavily doped as they are used for Ohmic contacts. The
wider intrinsic region is indifference to an ordinary p–n diode. This region makes the diode an
inferior rectifier but it makes it appropriate for fast switches, attenuators, photo detectors
and high voltage power electronics applications.
The PIN diode is a one type of photo detector, used to convert optical signal into an
electrical signal. The PIN diode comprises of three regions, namely P-region, I-region and N-
region. Typically, both the P and N regions are heavily doped due to they are utilized for
Ohmic contacts. The intrinsic region in the diode is in contrast to a PN junction diode. This
region makes the PIN diode a lower rectifier, but it makes it appropriate for fast switches,
attenuators, photo detectors and applications of high voltage power electronics.
Photo detectors:
These are Opto-electric devices i.e. to convert the optical signal back into electrical impulses.
The light detectors are commonly made up of semiconductor material. Photo detectors made up of
semiconductor material. When the light strikes the light detector a current is produced in the external
circuit proportional to the intensity of the incident light.
Optical signal generally is weakened and distorted when it emerges from the end of the fiber,
the photo detector must meet following strict performance requirements.
➢ A high sensitivity to the emission wavelength range of the received light signal
➢ A minimum addition of noise to the signal
➢ A fast response speed to handle the desired data rate
➢ Be insensitive to temperature variations
➢ Be compatible with the physical dimensions of the fiber
➢ Have a Reasonable cost compared to other system components
➢ Have a long operating lifetime
Quantum Efficiency
It is the ratio of primary electron-hole pairs created by incident photon to the photon
incident on the diode material.
Detector Responsivity
This is the ratio of output current to input optical power.Hence this is the efficiency of
the device.
This is the range of wavelengths over which the device will operate.
Noise Characteristics
The level of noise produced in the device is critical to its operation at low levels of input light.
Response Time
This is a measure of how quickly the detector can respond to variations in the input light intensity.
➢ PIN Photodiode
➢ Avalanche Photodiode
PIN photodiode
Pin Photodetector
the high electric field present in the depletion region causes photogenerated carriers
to separate and be collected across the reverse – biased junction. This gives rise to a current
flow in an external circuit, known as photocurrent.
Photo carriers:
Incident photon, generates free (mobile) electron-hole pairs in the intrinsic region.
These charge carriers are known as photocarriers, since they are generated by a photon.
Photocurrent:
The electric field across the device causes the photocarriers to be swept out of the
intrinsic region, thereby giving rise to a current flow in an external circuit. This current flow is
known as the photocurrent.
An incident photon is able to boost an electron to the conduction band only if it has an
energy that is greater than or equal to the bandgap energy
Beyond a certain wavelength, the light will not be absorbed by the material since the
wavelength of a photon is inversely proportional to its energy
Thus, a particular semiconductor material can be used only over a limited wavelength range.
The upper wavelength λc cutoff is determined by the band-gap energy E g of the material.
• As the charge carriers flow through the material some of them recombine and disappear.
• The charge carriers move a distance L n or L p for electrons and holes before recombining. This
distance is known as diffusion length
• Where D n and D p are the diffusion coefficients for electrons and holes respectively.
Photocurrent
• If Pin is the optical power falling on the photo detector at x=0 and P ( x) is the power level at a
distance x into the material then the incremental change be given as
So that
• Optical power absorbed, P(x), in the depletion region can be written in terms of incident optical
power, Pin :
• Absorption coefficient αs (λ) strongly depends on wavelength. The upper wavelength cut-off for any
semiconductor can be determined by its energy gap as follows:
• Taking entrance face reflectivity into consideration, the absorbed power in the width of depletion
region, w, becomes:
The response time of photodiode together with its output circuit depends mainly on the
following three factors:
2.The diffusion time of the photocarriers generated outside the depletion region.