Geometric Origins of Topological Insulation in Twisted Layered Semiconductors
Geometric Origins of Topological Insulation in Twisted Layered Semiconductors
Geometric Origins of Topological Insulation in Twisted Layered Semiconductors
strongly correlated electron phases. This is because the moiré pattern introduced by the relative
twist between layers introduces long-wavelength effective potentials which lead to electron localiza-
tion. Here, we develop a generalized continuum model for the electronic structure of moiré patterns,
based on first-principles calculations and tailored to capture the physics of twisted bilayer 2D semi-
conductors. We apply this model to a database of eighteen 2D crystals covering a range of atomic
relaxation and electronic structure features. Many of these materials host topologically insulating
(TI) moiré bands in a certain range of twist angles, which originate from the competition between
triangular and hexagonal moiré patterns, tuned by the twist angle. The topological phases occur in
the same range as the maximally flat moiré bands.
Quantum materials, engineered by creative manipula- It is difficult to model twistronic systems at small twist
tion of the features of conventional crystals, offer new angles (θ ' 1◦ ) using first-principles calculations, be-
possibilities for breakthroughs in understanding electron cause the number of atoms in the MSL scales as θ−2 .
correlations and superconductivity. What is intrigu- To overcome this limitation, continuum models with a
ing is that these phenomena emerge at a length scale low-energy effective Hamiltonian based on first-principles
much larger than the underlying crystal lattice constant (density-functional theory, DFT) calculations were devel-
(by a factor of 10 to 1000), through features due to oped for electronic structures of TBG; this approach can
strain patterns, controlled by geometric constraints. A accurately describe flat bands and magic angles [9, 15–
new platform for such studies are systems comprising 17]. Although continuum models have also been applied
few-layer two-dimensional (2D) crystals, like twisted bi- to the twisted bilayer semiconductors [14, 18], they have
layers of graphene or transition metal dichalcogenides yet to include the effect of atomic relaxations which play
(TMDCs) [1–5]. The slight lattice mismatch between two an important role at small angles [11, 12, 19, 20].
layers of a 2D material at a relative twist angle results in
In this letter, we present results from a DFT-based
a moiré superlattice (MSL) and a long-wavelength peri-
generalized continuum method designed specifically for
odic modulation of the effective electronic potential [6, 7].
twisted bilayer semiconductors. The computed electronic
In a narrow range of the twist angle, the moiré poten-
structures are consistent with full-DFT results [2, 11, 12]
tials act as confining wells for the electrons of the con-
but only require a relatively inexpensive set of bilayer cal-
stituent monolayers, causing isolated flat bands and lo-
culations. These calculations involve systems with only
calized wave functions near the Fermi surface [8, 9].
a handful of atoms per unit cell, in contrast to the many
thousands of atoms necessary in the calculation of a full
In the moiré flat bands, the kinetic energy is heavily
MSL. We derive a database of relaxation and the corre-
suppressed and electronic interactions play a dominant
sponding coefficients of tight-binding electronic structure
role, with the intensity of the interactions controlled by
hamiltonians for eighteen materials with various lattice
the twist angle; this effect has been dubbed “twistron-
symmetries and band edge momenta. These coefficients
ics” [10]. Compared to twisted bilayer graphene (TBG),
do not capture the material’s entire band structure, but
the twisted bilayer semiconductors can host flat bands in
rather focus on the details of the parabolic band edges.
a large range of twist angles [11, 12] instead of at pre-
Each layer contributes one band to the full twisted bi-
cisely a magic angle [1]. This makes it possible to over-
layer model, and these bands are coupled through a set
come some experimental challenges in twisted bilayers of
of stacking-dependent electronic interactions.
semiconductors; thus, the twist angle becomes an addi-
tional degree of freedom for fine-tuning other physical ef- In Fig. 1 we provide an overview of the different phases
fects in the strongly correlated regime [13]. Intriguingly, and their geometric origins, as the twist angle is changed
topological insulator (TI) moiré bands were predicted in in a moiré bilayer (Fig. 1a). The full interaction be-
a twisted bilayer of MoTe2 [14]; this work introduced tween the bands can be decomposed into two comple-
a possible candidate for observing concurrent correlated mentary parts. The first describes the tendency for elec-
and TI phases in the same material. trons in one layer to tunnel to the other, as shown in
2
(a) L2 (b) Interlayer Tunneling ΔT potentials naturally lead to quantum harmonic oscillator
AA
(QHO) states at small twist angles [21–23], whose pres-
ence underlies the appearance of the moiré flat bands
and whose competition explains the large number of TI
(c) Electrostatic Repulsion Δt/Δb phases possible in twisted semiconductors.
We briefly introduce the methodology here. To cap-
BA ture the stacking-dependent electronic and atomic de-
AB tails, we perform DFT calculations on aligned bilayers
L1
over a grid sampling all possible interlayer displacements.
Using the effective mass approximation, we treat the dis-
(d) Dominant interaction (e) QHO-TR QHO-HC persion around the monolayer band extrema as a kinetic
1 TI
Band Energy
unrelaxed 3 2
TR energy term in a continuum Hamiltonian. Including the
ΔT
SC/MI relaxed 2 TI
2 4
three stacking-dependent potentials described in the in-
TI 3 troduction, we obtain the effective Hamiltonian:
Δt/Δb
Metallic Bands
HC Δt/Δb !
ΔT − ~ (∇−ik
2 2
0)
0° θ 5° Dominant Potential 2m∗ + ∆t (r) ∆∗T (r)
H=
− ~ (∇−ik
2 2
0)
∆T (r) 2m∗ + ∆b (r)
FIG. 1. (a) A moiré pattern of a twisted TMDC with areas (1)
of aligned (AA) stacking and eclipsed (AB or BA) stacking where m∗ is the effective mass, ∆t,b are the electrostatic
highlighted. (b) At AA stacking, the local electronic Hamil-
potentials for the top and bottom layer, and ∆T is the
tonian is described by interlayer tunneling between the layers
(∆T ), forming a triangular (TR) lattice. (c) At AB or BA interlayer tunneling strength. At small twist angles we
stacking, the electronic Hamiltonian is described by interlayer also include the all-important relaxation effects by mini-
electrostatic potentials (∆t, ∆b), forming a honeycomb (HC) mizing the total mechanical energy of the moiré patterns
lattice. (d) Dependence of the dominant moiré interaction on [20]. The local electronic structures can then be derived
twist angle, with atomic relaxation of the superlattice (red from the DFT through the expansion:
line) or without it (blue line): evolution of the lattice charac-
ter from TR to HC with decreasing θ induces TI states and ~2 (k − k0 )2
flat bands at small angles, leading to Mott insulator (MI) and E (±) (r, k) = E (±) (θ × r + 2u) + (2)
2m∗
superconducting (SC) behavior. (e) The TI phase is caused by
band hybridization as the electrons transition between quan- To determine the ∆t/b , ∆T (r) from the local electronic
tum harmonic oscillator (QHO) states on a TR to a HC lat- structure, the Bloch wave functions at band extrema are
tice.
extracted from DFT calculations to assess the layer po-
larization of each band. The moiré bands can then be
Fig. 1b – labeled ∆T for “Tunneling”. The tunneling co- calculated by diagonalizing the matrix form of the Hamil-
efficients are strongest at AA (aligned) stacking regions tonian for a truncated basis set in k-space (see SM for
and form a triangular (TR) lattice across the MSL. The details).
second contribution captures the stacking dependence of The aligned (AA) stacking configuration has higher en-
the monolayer bands’ on-site energies, which depends on ergy than the partially eclipsed (AB/BA) configuration
the electrostatic potential from the opposite layer, shown for TMDCs and hBN homo-bilayers (θ ' 0◦ ). Conse-
in Fig. 1c) – labeled ∆t and ∆b for “top/bottom” layer. quently, relaxation tends to reduce the in-plane area of
The electrostatic potentials have maxima at the AB and AA stacking region and to increase that of the AB/BA
BA stacking regions, forming a honeycomb (HC) lattice. stacking region, thus minimizing the total energy [16, 20].
In the majority of materials studied here, the in- Upon relaxation, the large values of ∆t,b , at AB and
plane atomic relaxation of the twisted bilayers enhances BA stacking, expand to cover a larger area, while the
the effects of the electrostatic potential fluctuations and peak regions of ∆T , at AA stacking, shrink, with relaxed
reduces that of the interlayer tunneling, especially at structures showing stronger electrostatic potential effects
small twist angles. Electron localization transitions, from and weaker tunneling effects, which causes a clear angle-
the tunneling-dominated TR lattice to the electrostatic- dependent transition of the moiré electronic structure.
dominated HC lattice, occur at low twist angle in various In Fig. 2a,b we present the angle-dependent bands and
materials, as illustrated in Fig. 1d. In the low-angle re- real-space localization of twisted bilayer MoTe2 as a rep-
gion, ultra-flat moiré bands are predicted, likely to host resentative case. The top-most valence bands for both
superconducting (SC) and Mott insulating (MI) phases. the relaxed and unrelaxed moiré systems have a band-
The topologically insulating (TI) moiré bands appear for width less than 10 meV when the twist angle is below
intermediate values of the twist angle, during the transi- 2.5◦ . Using the Coulomb repulsion energy (U ) in TBG
tion between the two types of lattice geometries for the and twisted hBN as a guide [4, 11], this small kinetic
interlayer electronic interactions (Fig. 1e). The electronic energy implies that strongly correlated states could exist
3
(a) MoTe2 (c) Unrelaxed: TR QHO erate), and double excitation states (3-fold degenerate).
Unrelaxed (0, 0) (2, 0) LDOS
0 n = 8
n = 1
After relaxation, the competition between the two
-20 n = 2 types of lattices is greatly altered, as shown in Fig. 2d.
ave[En] (meV)
10 meV
(1, 0) (1, 1) 4 The two top bands in the low-angle case (θ = 0.7◦ ) lo-
-40
1 calize in the AB/BA HC potential wells to from 2-fold
-60 10 0
(0, 1) (0, 2)
degenerate ground states of the HC QHO model, while
-80 2 the third band is one of the 4-fold degenerate first ex-
cited states. In contrast, the localization of the upper-
(b) Relaxed (d) Relaxed: TR vs HC most band gradually changes to the AA stacking in the
0 0.70 20 LDOS
3 high-angle case (θ = 2◦ ) with the second band localized
ave[En] (meV)
FIG. 3. Topological phase diagram for moiré bands. (a) Phase of the moiré bands as a function of the intensity of potential
and tunneling fluctuations (1st Fourier components). The light (dark) green areas represent X (Y) type TI phase, while the
orange and light blue areas represent topologically trivial HC and TR QHO states, respectively. The twist-angle dependence
of the relaxed band structures is shown by the solid lines for selected materials. The band structures and Chern numbers for
unrelaxed and relaxed moiré bands in 1◦ twisted bilayer WSe2 are compared. (b) Berry curvature of the uppermost band for
X-type (1◦ ) and Y-type (1.5◦ ) twisted bilayer WSe2 in the MBZ.
also verified that the bands and real space localization of C. Tan, M. Claassen, D. M. Kennes, Y. Bai, B. Kim,
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FIG. 2. Comparison of relaxation and electronic coefficients. (a) First order Fourier components of the GSFE energy c1 vs
anisotropic strain coefficient G. The relative intensity of intralayer and interlayer energy coefficients from stiff to soft is remarked
by the color from dark to bright. (b) Inverse effective mass vs the range of potential energy fluctuation in the MBZ. The relative
importance of energy terms is remarked by white and red color for kinetic energy dominant and potential energy dominant
condition, respectively.
TABLE I. Strain and GSFE coefficients and critical twist angles for atomic relaxation. The coefficients K and G are strain
modulus for isotropic and anisotropic distortion with the unit of eV per unit cell, respectively. c1 is 2 times of the 1st order
Fourier component of GSFE as defined in ref.[6]. The critical twist angle θc for evident relaxation effect is evaluated as equ. 11,
with regarding the critical twist when the separate domain walls begin to appear.
Materials G (eV/u.c.) K (eV/u.c.) c1 (meV/u.c.) θc (0 )
MoS2 27.36 45.45 14.25 1.7
MoSe2 28.52 43.17 13.54 1.7
MoTe2 22.16 35.63 20.18 2.2
WS2 35.27 52.33 14.93 1.6
WSe2 31.67 46.22 13.11 1.6
WTe2 23.61 33.82 17.67 2.1
hBN 40.66 59.65 4.82 0.8
SiH 19.33 31.47 1.13 0.6
Ars. 12.62 36.04 36.71 3.0
BP 25.14 43.23 25.67 2.3
Bi2 10.15 16.81 43.71 4.8
InSe 9.1 25.47 22.01 2.8
Gr. 47.78 67.87 4.9 0.8
GaS 24.11 38.9 13.53 1.7
SnS 20.62 34.1 11.04 1.7
MnBr2 13.79 20.41 10.68 2.1
ZnBr2 5.3 20.93 5.74 1.6
GaSe 22.98 36.67 13.2 1.8
number of each bands can then be computed as the in- laxation and electronic structures. The coefficients for
tegral of the Berry curvature through the 1st Brillouin mechanical properties related to atomic relaxation are
zone [9]. shownR in Fig I. Strain modulus K and G are fitted as
E = 21 K(uxx + uyy )2 + 12 G[(uxx − uyy )2 + 4u2xy ], repre-
senting the isotropic and anisotropic strain modulus, re-
RELAXATION AND ELECTRONIC spectively. The GSFE
COEFFICIENTS OF MATERIALS P energy i(ubis expanded as the Fourier
1 +vb2 )·r
series: GSFE(r)= u,v Fuv e . For materials
st
with hexagonal lattices, the 1 order components of Fij
Applying our algorithm to 18 different twisted bilayer are equal and we adopted two times of them as c1 to rep-
materials, we derive the coefficients for both atomic re-
4
TABLE II. Coefficients of the band extrema properties. Most band extrema locate at high-symmetry k-points of K, Γ, and M.
If there are two competing band extrema, we denote K1 /K2 (K1 ) where K1 is the band extrema for untwisted structures, and
the following data is for K1 edge. K1 − K2 − K3 means the band extrema locate on the high symmetry line between the referred
high symmetry points. m∗ , V , and w denote the effective mass, the 1st -order Fourier coefficients of electrostatic potential and
tunneling matrix elements. θc is the critical twist angle for the electronic localization when the width of the uppermost band
is 10 meV.
Materials Band Extrema m∗ (me ) V (meV) w (meV) θc (0 )
MoS2 conduction K 0.54 5.64 4.8 1.95
valence Γ 2.6 12.01 95.8 4.11
MoSe2 conduction K 0.53 6.48 7.12 2.07
valence Γ 5.74 20.29 107.96 >6
MoTe2 conduction K 0.57 8.01 4.57 2.30
valence K 0.68 9.34 10.3 2.81
WS2 conduction K 0.34 2.02 1.52 1.48
valence Γ 3.21 2.67 64.22 4.85
WSe2 conduction K 0.35 9.18 8.75 1.70
valence K/Γ (K) 0.46 8.55 11.1 2.14
WTe2 conduction K 0.32 6.85 7.28 1.74
valence K 0.45 10.27 11.4 2.34
hBN conduction K/M (K) 0.69 99.21 134.85 3.48
valence K 0.52 45.42 58.53 2.55
SiH conduction Γ 0.23 1.35 3.5 1.34
valence Γ (degenerate) – – – –
InSe conduction Γ 0.32 15.3 138.37 1.70
valence Γ (degenerate) – – – –
BP conduction Γ 1.18 26.77 174.95 3.44
valence Γ 3.09 19.93 109.75 1.57
Ars. conduction Γ 2.01 37.55 249.52 >6
valence Γ 1.95 29.62 156.15 >6
GaS conduction Γ 0.29 11.78 67.93 1.37
valence K-Γ-M – – – –
GaSe conduction Γ 0.21 15.59 91.95 1.25
valence K-Γ-M – – – –
resent the GSFE intensity.[6] For materials with other als can be generally divided into three class: the materi-
lattices, we use 29 (max GSFE -min GSFE) for compari- als with high strain modulus and low GSFE coefficients
son, as this is consistent with the previous definition for (graphene, h-BN, SiH) are stiffer during relaxation, and
hexagonal lattices. The relative intensity of the GSFE their characteristic angles θc are about 1◦ ; the materials
and strain energy determines the characteristic twist an- with the intermediate proportion between the two coeffi-
gle when the in-plane relaxation effects play important cients (TMDCs, BP, etc.) have θc in the range of 1 − 3◦ ;
role. Large GSFE leads to strong in-plane relaxation, or while the materials with high GSFE coefficients and low
namely, large upper-limit of the twist angle where the strain modulus (InSe, Asenene, Bi) have low stiffness and
relaxation plays dominant role on the atomic structure. displays evident relaxation around or above 3◦ . This es-
According the analysis in previous work [10], the width timation is also well confirmed by the computed results
of the domain wall wd and critical twist angle θc are es- of relaxation.
timated as follow: The electronic properties of twisted bilayers are di-
r r vided into Moire molecule and Moire crystals according
a K 4 c1 to the degree of real space localization[6], which is de-
wd = , θc = √ (11)
4 c1 3 K termined by the relative importance of the kinetic and
potential energy in the MBZ. The comparison of the ef-
where a is the unit cell parameter (of hexagonal lattices).
fective mass and band edge energy fluctuation in config-
We set the criterion of θc as the condition when the do-
uration space are visualized in Fig 2b. As the kinetic
main walls overlap at AB/BA stacking.
energy scales with θ as T ∝ θ2 (m∗ )−1 , electronic √ local-
a
The energy coefficients of these materials are also plot- ization appears in the low θ region where θ < π~ m∗ V .
ted in Fig 2a to visualize their comparison. The materi- The critical twist angles for each materials when the up-
5
FIG. 3. Moire electronic properties of TB MoS2 . Band structures of (a) 5.08◦ and (b) 5.08◦ MoS2 . The VBM and CBM derive
from Γ and K-edges, respectively. The red lines represent the results with full relaxation, and the black dash lines represent
the results without in-plane relaxation. (c) Realspace distribution of the MoS2 conduction and valance bands represented by
the local density of states (LDOS) with and without the in-plane relaxation. The LDOS are normalized to have the average
value of 1 in the MSL and plotted with the same color scale from 0 to 2. (d) Valence bands of twisted bilayer WSe2 . The red
and blue dots are the projection weight to the top and bottom layers. (e) Angle-dependence of moiré bands for twisted bilayer
h-BN. The format of this panel is the same as Fig. 3b in the main text. The small panel is the band structure at θ = 10 .
permost band width is about 10 meV are listed in the CONSISTENCY WITH PREVIOUS WORK
table. The h-BN, V group elementary substances and
Γ-edge TMDs typically have a high ratio of the poten- To validate our methods, we also do calculations that
tial to kinetic energy coefficients, indicating the evident could compare with the previous full DFT calculations,
localization appears for θ at about 3 − 4◦ ; while the com- as shown in Fig 3. The bands of 3.50 and 5.080 twisted
mon TMDs with K-edge and some other materials (like bilayer MoS2 in Fig 3a,b are consistent with the full DFT
InSe, SiH, ect.) display significant localization only for results in ref [12]. The real-space localization of the up-
small twist angle of about 1 − 2◦ . Otherwise, the prod- permost band states at AB/BA stacking in Fig 3c is
uct of the two coefficients determines the frequency ωθ in also the same with the full DFT results of the relaxed
the harmonic oscillator model[11], which determines the system. Valence bands of 5.080 twisted bilayer WSe2
slope of the average energy of the top bands to the twist shown in Fig 3d are accurately consistent with ref [13]
angle. regarding both the band energy and projection weight
to the top and bottom layer. This panel is also a good
example to show how the moiré bands originate from the
The complete data is listed in Tab II including the ML bands as illustrated in Fig 2b in the main text. The
band extrema and relative intensity of electrostatic po- angle-dependent bands of twisted bilayer h-BN are shown
tential, tunneling, and kinetic energy (represented by ef- in Fig 3e. We derive the consistent results of the pairing
fective mass). Specifically, the band extrema at Γ point behavior (single uppermost band and pairing 2nd and 3rd
typically host stronger tunneling and energy fluctuations, bands) and angle dependence with the moiré bands in ref
as well as a larger scale of bandgap variation during the [14].
inter-layer displacement and twisting.
(a)
(b)
X-type
wm*/θ2 (meV)
HC HC HC
HC TI TR
φ
Energy (meV)
Vm*/θ2 (meV)
Y/TR transition
X Y
TR TR TR TR TR
Angle φ
FIG. 4. Band reordering during the transition from TL to HL QHO conditions. (a) Calculated moire band structures for the
points on the 1/4 circle in the phase diagram with a radius of 4 meV and twist angle φ as shown in the left-top panel. The
angle φ gradually changes from 00 to 900 and the band structures change from HL, A-type, B-type, to TL condition through
the closing and reopening of the band gaps. (b) Evolution of the moire band maximum and minimum as a function of φ. The
1st , 2nd , 3rd , and 4th bands are denoted by black, red, blue, and purple lines, respectively. For each color, the upper line is the
band maximum and the lower line is the band minimum.
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