Design Qualification Test Report FC1/FJ FC1-15-01-T/FJ-15-D-06.00-4

Project Number: Design Qualification Test Report Tracking Code: 270482_Report_Rev_1
Requested by: Catie Eichhorn Date: 3/12/2014

Part #: FC1-15-01-T/FJ-15-D-06.00-4 Tech: Peter Chen
Part description: FC1/FJ Qty to test: 75
Test Start: 10/29/2013 Test Completed: 11/29/2013
DESIGN QUALIFICATION TEST REPORT
FC1/FJ
FC1-15-01-T/FJ-15-D-06.00-4
Page 1 of 40
Tracking Code: 270482_Report_Rev_1 Part #: FC1-15-01-T/FJ-15-D-06.00-4
Part description: FC1/FJ
REVISION HISTORY
DATA REV.NUM. DESCRIPTION ENG

02/27/2014 1 Initial Issue PC
Page 2 of 40
CERTIFICATION
All instruments and measuring equipment were calibrated to National Institute for Standards and Technology (NIST)
traceable standards according to IS0 10012-l and ANSI/NCSL 2540-1, as applicable.
All contents contained herein are the property of Samtec. No portion of this report, in part or in full shall be
reproduced without prior written approval of Samtec.
SCOPE
To perform the following tests: Design Qualification test. Please see test plan.
APPLICABLE DOCUMENTS
Standards: EIA Publication 364
TEST SAMPLES AND PREPARATION

1) All materials were manufactured in accordance with the applicable product specification.
2) All test samples were identified and encoded to maintain traceability throughout the test sequences.
3) After soldering, the parts to be used for LLCR and DWV/IR testing were cleaned according to TLWI-0001.
4) Either an automated cleaning procedure or an ultrasonic cleaning procedure may be used.
5) The automated procedure is used with aqueous compatible soldering materials.
6) Parts not intended for testing LLCR and DWV/IR are visually inspected and cleaned if necessary.
7) Any additional preparation will be noted in the individual test sequences.
8) Solder Information: Lead free
9) Re-Flow Time/Temp: See accompanying profile.
10) Samtec Test PCBs used: PCB-105848-TST,PCB-105849-TST, PCB-105850-TST.
Page 3 of 40
TYPICAL OVEN PROFILE (Soldering Parts to Test Boards)
Page 4 of 40
FLOWCHARTS
Page 5 of 40
FLOWCHARTS Continued
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Page 11 of 40
ATTRIBUTE DEFINITIONS
The following is a brief, simplified description of attributes.
THERMAL SHOCK:
1) EIA-364-32, Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors.
2) Test Condition 1: -55°C to +85°C
3) Test Time: ½ hour dwell at each temperature extreme
4) Number of Cycles: 100
5) All test samples are pre-conditioned at ambient.
6) All test samples are exposed to environmental stressing in the mated condition.
THERMAL:
1) EIA-364-17, Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors.
2) Test Condition 4 at 105° C
3) Test Time Condition B for 250 hours.
4) All test samples are pre-conditioned at ambient.
HUMIDITY:
1) Reference document: EIA-364-31, Humidity Test Procedure for Electrical Connectors.
2) Test Condition B, 240 Hours.
3) Method III, +25° C to + 65° C, 90% to 98% Relative Humidity excluding sub-cycles 7a and 7b.
4) All samples are pre-conditioned at ambient.
MATING/UNMATING:
1) Reference document: EIA-364-13, Mating and Unmating Forces Test Procedure for Electrical Connectors.
2) The full insertion position was to within 0.003” to 0.004” of the plug bottoming out in the receptacle to
prevent damage to the system under test.
3) One of the mating parts is secured to a floating X-Y table to prevent damage during cycling.
MECHANICAL SHOCK (Specified Pulse):

1) Reference document: EIA-364-27, Mechanical Shock Test Procedure for Electrical Connectors
2) Test Condition C
3) Peak Value: 100 G
4) Duration: 6 Milliseconds
5) Wave Form: Half Sine
6) Velocity: 12.3 ft/s
7) Number of Shocks: 3 Shocks / Direction, 3 Axis (18 Total)
VIBRATION:
1) Reference document: EIA-364-28, Vibration Test Procedure for Electrical Connectors
2) Test Condition V, Letter B
3) Power Spectral Density: 0.04 G² / Hz
4) G ‘RMS’: 7.56
5) Frequency: 50 to 2000 Hz
6) Duration: 2.0 Hours per axis (3 axis total)
NANOSECOND-EVENT DETECTION:
1) Reference document: EIA-364-87, Nanosecond-Event Detection for Electrical Connectors
2) Prior to test, the samples were characterized to assure the low nanosecond event being monitored will trigger
the detector.
3) After characterization it was determined the test samples could be monitored for 50 nanosecond events
Page 12 of 40
ATTRIBUTE DEFINITIONS Continued

TEMPERATURE RISE (Current Carrying Capacity, CCC):
1) EIA-364-70, Temperature Rise versus Current Test Procedure for Electrical Connectors and Sockets.
2
2) When current passes through a contact, the temperature of the contact increases as a result of I R (resistive)
heating.
3) The number of contacts being investigated plays a significant part in power dissipation and therefore
temperature rise.
4) The size of the temperature probe can affect the measured temperature.
5) Copper traces on PC boards will contribute to temperature rise:
a. Self heating (resistive)
b. Reduction in heat sink capacity affecting the heated contacts
6) A de-rating curve, usually 20%, is calculated.
7) Calculated de-rated currents at three temperature points are reported:
a. Ambient
о
b. 40 C
о
c. 50 C
о
d. 70 C
8) Typically, neighboring contacts (in close proximity to maximize heat build up) are energized.
9) The thermocouple (or temperature measuring probe) will be positioned at a location to sense the maximum
temperature in the vicinity of the heat generation area.
10) A computer program, TR 803.exe, ensures accurate stability for data acquisition.
11) Hook-up wire cross section is larger than the cross section of any connector leads/PC board traces, jumpers,
etc.
12) Hook-up wire length is longer than the minimum specified in the referencing standard.
LLCR:
1) EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets.
2) A computer program, LLCR 221.exe, ensures repeatability for data acquisition.
3) The following guidelines are used to categorize the changes in LLCR as a result from stressing
a. <= +5.0 mOhms:----------------------------- Stable
b. +5.1 to +10.0 mOhms:---------------------- Minor
c. +10.1 to +15.0 mOhms: -------------------- Acceptable
d. +15.1 to +50.0 mOhms: -------------------- Marginal
e. +50.1 to +2000 mOhms: ------------------- Unstable
f. >+2000 mOhms:----------------------------- Open Failure
Page 13 of 40

GAS TIGHT:
To provide method for evaluating the ability of the contacting surfaces in preventing penetration of harsh
vapors which might lead to oxide formation that may degrade the electrical performance of the contact
system.
3) The following guidelines are used to categorize the changes in LLCR as a result from stressing
a. <= +5.0 mOhms:----------------------------- Stable
b. +5.1 to +10.0 mOhms:---------------------- Minor
c. +10.1 to +15.0 mOhms: -------------------- Acceptable
d. +15.1 to +50.0 mOhms: -------------------- Marginal
e. +50.1 to +2000 mOhms: ------------------- Unstable
f. >+2000 mOhms:----------------------------- Open Failure
4) Procedure:
a. Reference document: EIA-364-36, Test Procedure for Determination of Gas-Tight Characteristics
for Electrical Connectors, Sockets and/or Contact Systems.
b. Test Conditions:
i. Class II--- Mated pairs of contacts assembled to their plastic housings.
ii. Reagent grade Nitric Acid shall be used of sufficient volume to saturate the test chamber
iii. The ratio of the volume of the test chamber to the surface area of the acid shall be 10:1.
iv. The chamber shall be saturated with the vapor for at least 15 minutes before samples are
added.
v. Exposure time, 55 to 65 minutes.
vi. The samples shall be no closer to the chamber walls than 1 inches and no closer to the
surface of the acid than 3 inches.
vii. The samples shall be dried after exposure for a minimum of 1 hour.
о
viii. Drying temperature 50 C
ix. The final LLCR shall be conducted within 1 hour after drying.
NORMAL FORCE (FOR CONTACTS TESTED IN THE HOUSING):
1) Reference document: EIA-364-04, Normal Force Test Procedure for Electrical Connectors.
2) The contacts shall be tested in the connector housing.
3) If necessary, a “window” shall be made in the connector body to allow a probe to engage and deflect the
contact at the same attitude and distance (plus 0.05 mm [0.002”]) as would occur in actual use.
4) The connector housing shall be placed in a holding fixture that does not interfere with or otherwise influence
the contact force or deflection.
5) Said holding fixture shall be mounted on a floating, adjustable, X-Y table on the base of the Dillon TC2,
computer controlled test stand with a deflection measurement system accuracy of 5.0 µm (0.0002”).
6) The nominal deflection rate shall be 5 mm (0.2”)/minute.
7) Unless otherwise noted a minimum of five contacts shall be tested.
8) The force/deflection characteristic to load and unload each contact shall be repeated five times.
9) The system shall utilize the TC2 software in order to acquire and record the test data.
10) The permanent set of each contact shall be measured within the TC2 software.
11) The acquired data shall be graphed with the deflection data on the X-axis and the force data on the Y-axis
and a print out will be stored with the Tracking Code paperwork.
.
Page 14 of 40

INSULATION RESISTANCE (IR):
To determine the resistance of insulation materials to leakage of current through or on the surface of these
materials when a DC potential is applied.
1) PROCEDURE:
a. Reference document: EIA-364-21, Insulation Resistance Test Procedure for Electrical Connectors.
b. Test Conditions:
i. Between Adjacent Contacts or Signal-to-Ground
ii. Electrification Time 2.0 minutes
iii. Test Voltage (500 VDC) corresponds to calibration settings for measuring resistances.
2) MEASUREMENTS:
3) When the specified test voltage is applied (VDC), the insulation resistance shall not be less than 1000
megohms.
DIELECTRIC WITHSTANDING VOLTAGE (DWV):
To determine if the sockets can operate at its rated voltage and withstand momentary over potentials due to
switching, surges, and other similar phenomenon. Separate samples are used to evaluate the effect of
environmental stresses so not to influence the readings from arcing that occurs during the measurement
process.
1) PROCEDURE:
a. Reference document: EIA-364-20, Withstanding Voltage Test Procedure for Electrical Connectors.
b. Test Conditions:
i. Between Adjacent Contacts or Signal-to-Ground
ii. Barometric Test Condition 1
iii. Rate of Application 500 V/Sec
iv. Test Voltage (VAC) until breakdown occurs
2) MEASUREMENTS/CALCULATIONS
a. The breakdown voltage shall be measured and recorded.
b. The dielectric withstanding voltage shall be recorded as 75% of the minimum breakdown voltage.
c. The working voltage shall be recorded as one-third (1/3) of the dielectric withstanding voltage (one-
fourth of the breakdown voltage).
Page 15 of 40

CONNECTOR PULL:
1) Secure cable near center and pull on connector
a. At 90°, right angle to cable
b. At 0°, in-line with cable
Fig. 1
(Typical set-up, actual part not depicted.)
0° Connector pull, notice the electrical continuity hook-up wires.
Page 16 of 40

CABLE DURABILITY:
1) Oscillate and monitor electrical continuity for open circuit indication.
a. ± 70° Pendulum Mode, bend up to 500 cycles with 4 oz. load on cable end.
Fig. 2
Page 17 of 40
RESULTS
Temperature Rise, CCC at a 20% de-rating
• CCC for a 30°C Temperature Rise----------4.3A per contact with 1 adjacent contacts powered
• CCC for a 30°C Temperature Rise----------1.4A per contact with all adjacent contacts powered
Mating – Unmating Forces

（
Thermal Aging Group FC1-15-01-T/FJ-15-D-06.00-4 ）
• Initial
o Mating
Min --------------------------------------- 5.53 Lbs
Max--------------------------------------- 6.54 Lbs
o Unmating
Min --------------------------------------- 4.25 Lbs
Max--------------------------------------- 4.81 Lbs
• After Thermal
o Mating
Min --------------------------------------- 4.29 Lbs
Max--------------------------------------- 5.66 Lbs
o Unmating
Min --------------------------------------- 2.85 Lbs
Max--------------------------------------- 4.55 Lbs
（
Mating-Unmating Durability Group FC1-15-01-T/FJ-15-D-06.00-4 ）
• Initial
o Mating
Min --------------------------------------- 5.25 Lbs
Max--------------------------------------- 6.71 Lbs
o Unmating
Min --------------------------------------- 2.77 Lbs
Max--------------------------------------- 5.54 Lbs
• After 25 Cycles
o Mating
Min --------------------------------------- 4.31 Lbs
Max--------------------------------------- 6.10 Lbs
o Unmating
Min --------------------------------------- 2.65 Lbs
Max--------------------------------------- 3.71 Lbs
• Humidity
o Mating
Min --------------------------------------- 5.36 Lbs
Max--------------------------------------- 6.70 Lbs
o Unmating
Min --------------------------------------- 3.16 Lbs
Max--------------------------------------- 4.36 Lbs
Page 18 of 40
RESULTS Continued
Mating – Unmating Forces
（
Mating-Unmating Basic FC1-25-01-T/FJ-25-D-06.00-4 ）
• Initial
o Mating
Min --------------------------------------- 8.14 Lbs
Max--------------------------------------11.49 Lbs
o Unmating
Min --------------------------------------- 6.64 Lbs
Max--------------------------------------- 9.20 Lbs
• After 25 Cycles
o Mating
Min --------------------------------------- 6.87 Lbs
Max--------------------------------------- 9.20 Lbs
o Unmating
Min --------------------------------------- 4.34 Lbs
Max--------------------------------------- 5.87 Lbs
（
Mating-Unmating Basic FC1-05-01-T/FJ-05-D-06.00-4 ）
• Initial
o Mating
Min --------------------------------------- 1.66 Lbs
Max--------------------------------------- 2.11 Lbs
o Unmating
Min --------------------------------------- 1.37 Lbs
Max--------------------------------------- 1.78 Lbs
• After 25 Cycles
o Mating
Min --------------------------------------- 1.32 Lbs
Max--------------------------------------- 1.76 Lbs
o Unmating
Min --------------------------------------- 1.11 Lbs
Max--------------------------------------- 1.45 Lbs
Normal Force at 0.0040 inch deflection
• Initial
o Min----------------------------------------------- 299.80 gf Set ----- 0.0000 in
o Max ---------------------------------------------- 353.40 gf Set ----- 0.0001 in
• Thermal
o Min----------------------------------------------- 278.70 gf Set ----- 0.0001 in
o Max ---------------------------------------------- 316.60 gf Set ----- 0.0011 in
Cable Pull force
o 0 °
Min --------------------------------------- 5.65Lbs
Max--------------------------------------- 6.87 Lbs
o 90 °
Min --------------------------------------19.68 Lbs
Max--------------------------------------25.14 Lbs
Page 19 of 40
RESULTS Continued
Insulation Resistance minimums, IR
Pin to Pin
• Initial
o Mated------------------------------------------------10000 Meg Ω ------------------------ Passed
o Unmated --------------------------------------------10000 Meg Ω ------------------------ Passed
• Thermal Shock
• Humidity
Dielectric Withstanding Voltage minimums, DWV
• Minimums
o Breakdown Voltage ----------------------------------875 VAC
o Test Voltage -------------------------------------------656 VAC
o Working Voltage -------------------------------------215 VAC
Pin to Pin
• Initial DWV --------------------------------------------------Passed
• Thermal DWV-----------------------------------------------Passed
• Humidity DWV----------------------------------------------Passed
CABLE FLEX
Insulation Resistance minimums, IR
Pin to Pin
• Initial
• After flex test
Dielectric Withstanding Voltage minimums, DWV

• Minimums
o Breakdown Voltage ----------------------------------875 VAC
o Test Voltage -------------------------------------------656 VAC
o Working Voltage -------------------------------------215 VAC
Pin to Pin
• Initial DWV --------------------------------------------------Passed
• After Flex DWV ---------------------------------------------Passed
Page 20 of 40
RESULTS Continued
LLCR Thermal Aging Group (104 LLCR test points)
• Initial --------------------------------------------------------------- 51.00 mOhms Max
• Thermal
o <= +5.0 mOhms ---------------------------------- 101 Points ------------------------- Stable
o +5.1 to +10.0 mOhms -----------------------------------3 Points ------------------------- Minor
o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable
o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal
o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable
o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure
LLCR Mating/Unmating Durability Group (104 LLCR test points)

• Durability, 25 Cycles
o <= +5.0 mOhms ------------------------------------ 84 Points ------------------------- Stable
o +5.1 to +10.0 mOhms --------------------------------- 20 Points ------------------------- Minor
• Thermal Shock
• Humidity
o +5.1 to +10.0 mOhms --------------------------------- 43 Points ------------------------- Minor
LLCR Gas Tight Group (104 LLCR test points)
• Gas-Tight
Page 21 of 40
RESULTS Continued
LLCR Shock & Vibration Group (104 LLCR test points)
• Shock &Vibration
o <= +5.0 mOhms ---------------------------------- 102 Points ------------------------- Stable
Mechanical Shock & Random Vibration:

o Shock
No Damage---------------------------------- ---------------------------------- Pass
50 Nanoseconds ----------------------------- ---------------------------------- Pass
o Vibration
No Damage---------------------------------- ---------------------------------- Pass
50 Nanoseconds ----------------------------- ---------------------------------- Pass
Page 22 of 40
DATA SUMMARIES
TEMPERATURE RISE (Current Carrying Capacity, CCC):
1) High quality thermocouples whose temperature slopes track one another were used for temperature
monitoring.
2) The thermocouples were placed at a location to sense the maximum temperature generated during testing.
3) Temperature readings recorded are those for which three successive readings, 15 minutes apart, differ less
than 1° C (computer controlled data acquisition).
4) Adjacent contacts were powered:
a. Linear configuration with 1 adjacent conductors/contacts powered
270482
1 (1x1) Signal Pins Powered in Series(contact area)
Part Numbers: FC1-25-01-T/FJ-25-D-12.00-4
Current Rating per Contact (30 Deg. Rise, 20% Derated) = 4.3 Amps
8.0 7.6
Room Temp= 20.4 °C
7.0
80°C
6.2 Limit
6.0
Maximum Current, Amps per Contact
6.1 5.4
5.0
5.0
4.0 4.3
3.1
3.0
2.0 2.5
1.0
0.0
20 30 40 50 60 70 80 90
Ambient Temperature (°C)

Base Curve Derated 20 % Measured Current RT Peak Amp RT Derated Amp 40°C Peak Amp
40°C Derated Amp 50°C Peak Amp 50°C Derated Amp 70°C Peak Amp 70°C Derated Amp Limit
Page 23 of 40
DATA SUMMARIES Continued

270482
50
45
40
Temperature Rise (°C above ambient)
35
30
25
20
15
10
0
0 1 2 3 4 5 6 7
Current (Amps)
Actual 20% Derated
Page 24 of 40

b. Linear configuration with 2 adjacent conductors/contacts powered
270482
7.0
Room Temp= 21 °C
5.9
6.0
80°C
4.9 Limit
5.0
4.8 4.2
4.0
3.9
3.0 3.4
2.4
2.0
1.9
1.0
0.0
20 30 40 50 60 70 80 90

270482
50
45
40
35
30
25
20
15
10
0
0 1 2 3 4 5 6
Current (Amps)
Actual 20% Derated
Page 25 of 40

c. Linear configuration with 3 adjacent conductors/contacts powered
270482
5.5
Room Temp= 21 °C
5.0 4.7
4.5
80°C
3.8 Limit
4.0
3.5 3.7 3.3
3.0
3.1
2.5
2.6
1.9
2.0
1.5
1.5
1.0
0.5
0.0
20 30 40 50 60 70 80 90

270482
50
45
40
35
30
25
20
15
10
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
Current (Amps)
Actual 20% Derated
Page 26 of 40

d. Linear configuration with 4 adjacent conductors/contacts powered
270482
5.0
Room Temp= 21.4 °C
4.5 4.3
4.0
80°C
3.5
Limit
3.5
3.1
3.4
3.0
2.8
2.5
2.4
2.0 1.8
1.5
1.4
1.0
0.5
0.0
20 30 40 50 60 70 80 90

270482
45
40
35
30
25
20
15
10
0
0 0.5 1 1.5 2 2.5 3 3.5 4
Current (Amps)
Actual 20% Derated
Page 27 of 40

e. Linear configuration with all adjacent conductors/contacts powered
270482
All (1x25) Signal Pins Powered in Series(contact area)
3.0
Room Temp= 21.1 °C
2.5
2.5
80°C
Limit
2.0
2.0
2.0 1.7
1.5 1.6
1.4
1.0
1.0
0.8
0.5
0.0
20 30 40 50 60 70 80 90

270482
All (1x25) Signal Pins Powered in Series(contact area)
50
45
40
35
30
25
20
15
10
0
0 0.5 1 1.5 2 2.5
Current (Amps)
Actual 20% Derated
Page 28 of 40

MATING-UNMATING FORCE:
Thermal Aging Group （FC1-15-01-T/FJ-15-D-06.00-4）
Initial After Thermals
Mating Unmating Mating Unmating
Newtons Force (Lbs) Newtons Force (Lbs) Newtons Force (Lbs) Newtons Force (Lbs)
Minimum 24.60 5.53 18.90 4.25 19.08 4.29 12.68 2.85
Maximum 29.09 6.54 21.39 4.81 25.18 5.66 20.24 4.55
Average 27.41 6.16 20.18 4.54 22.32 5.02 16.16 3.63
St Dev 1.50 0.34 0.96 0.22 1.97 0.44 2.58 0.58
Count 8 8 8 8 8 8 8 8
Mating-Unmating Durability Group （FC1-15-01-T/FJ-15-D-06.00-4）

Initial After 25 Cycles
Minimum 23.35 5.25 12.32 2.77 19.17 4.31 11.79 2.65
Maximum 29.85 6.71 24.64 5.54 27.13 6.10 16.50 3.71
Average 26.88 6.04 18.58 4.18 23.89 5.37 13.57 3.05
St Dev 2.36 0.53 3.86 0.87 2.86 0.64 1.45 0.33
Count 8 8 8 8 8 8 8 8
After Humidity
Mating Unmating
Newtons Force (Lbs) Newtons Force (Lbs)
Minimum 23.84 5.36 14.06 3.16
Maximum 29.80 6.70 19.39 4.36
Average 26.22 5.89 16.40 3.69
St Dev 2.45 0.55 1.78 0.40
Count 8 8 8 8
Page 29 of 40

Mating-Unmating Basic （FC1-25-01-T/FJ-25-D-06.00-4）
Minimum 36.21 8.14 29.53 6.64 30.56 6.87 19.30 4.34
Maximum 51.11 11.49 40.92 9.20 40.92 9.20 26.11 5.87
Average 45.35 10.20 33.92 7.63 36.21 8.14 23.39 5.26
St Dev 5.64 1.27 4.00 0.90 4.13 0.93 2.54 0.57
Count 8 8 8 8 8 8 8 8
Mating-Unmating Basic （FC1-05-01-T/FJ-05-D-06.00-4）

Minimum 7.38 1.66 6.09 1.37 5.87 1.32 4.94 1.11
Maximum 9.39 2.11 7.92 1.78 7.83 1.76 6.45 1.45
Average 8.40 1.89 6.92 1.56 6.91 1.55 5.77 1.30
St Dev 0.67 0.15 0.67 0.15 0.66 0.15 0.62 0.14
Count 8 8 8 8 8 8 8 8
Page 30 of 40

Mating\Unmating Force Comparison
Mating/Unmating Data for 5, 15 and 25 Position FC1/FJ
Mating (Initial) Unmating (Initial) Mating (25 Cycles) Unmating (25 Cycles)
12.00
10.00
8.00
Force (lbs)
6.00
4.00
2.00
0.00
5 Pos. 15 Pos. 25 Pos.
Number of Terminals per Row
Page 31 of 40

NORMAL FORCE (FOR CONTACTS TESTED OUT THE HOUSING):
1) Calibrated force gauges are used along with computer controlled positioning equipment.
2) For Normal force 8-10 measurements are taken and the averages reported.
Initial Deflections in inches Forces in Grams
0.0004 0.0008 0.0012 0.0016 0.0020 0.0024 0.0028 0.0032 0.0036 0.0040 SET
Averages 38.66 74.98 109.38 146.41 181.03 217.37 248.82 279.39 305.34 321.97 0.0004
Min 32.00 61.10 95.90 132.70 161.70 193.60 224.40 254.50 279.60 299.80 0.0000
Max 53.90 93.50 123.40 162.10 197.30 238.70 275.40 304.00 333.80 353.40 0.0007
St. Dev 5.652 9.000 9.561 9.879 12.369 16.778 16.840 18.974 18.397 15.817 0.0002
Count 12 12 12 12 12 12 12 12 12 12 12
After
Thermals Deflections in inches Forces in Grams
0.0004 0.0008 0.0012 0.0016 0.0020 0.0024 0.0028 0.0032 0.0036 0.0040 SET
Averages 1.24 26.98 66.22 103.58 138.95 173.55 205.72 239.57 270.13 295.97 0.0005
Min -0.20 0.50 41.20 79.20 117.80 154.70 189.70 216.80 249.90 278.70 0.0001
Max 8.90 41.90 79.60 117.70 155.10 194.10 222.90 264.60 293.50 316.60 0.0011
St. Dev 2.815 11.501 12.282 11.996 13.298 12.936 11.566 15.814 14.761 12.948 0.0003
Count 12 12 12 12 12 12 12 12 12 12 12
Normal Force - Average Initial vs Average Thermal

350
322.0
295.97
300 305.3
270.13
279.4
250 239.57
248.8
205.72
217.4
Force-Grams
200
173.55
181.0
150 138.95
146.4
103.58
100 109.4
66.22
75.0
50
26.98
38.7
1.24
0
0.0
0 0.001 0.002 0.003 0.004 0.005 0.006
Deflection-Inches Average Initial Normal Force
Average Normal Force after Thermals
Page 32 of 40

CABLE PULL FORCE
0° Pull
Force
(lbs)
Minimum 5.65
Maximum 6.87
Average 6.24
90° Pull
Force
(lbs)
Minimum 19.68
Maximum 25.14
Average 22.38
INSULATION RESISTANCE (IR):

Pin to Pin
Mated Unmated Unmated
Minimum FC1/FJ FC1 FJ
Initial 10000 10000 10000
Thermal 10000 10000 10000
Humidity 10000 10000 10000
Voltage Rating Summary

Minimum FC1/FJ
Break Down Voltage 875
Test Voltage 656
Working Voltage 215
Pin to Pin
Initial Test Voltage Pass
After Thermal Test Voltage Pass
After Humidity Test Voltage Pass
Page 33 of 40
CABLE FLEX
INSULATION RESISTANCE (IR)
Pin to Pin
Mated
Minimum
Initial 45000
After 500 Flex Cycles 45000

Voltage Rating Summary
Minimum
Break Down Voltage 875
Test Voltage 656
Working Voltage 215
Pin to Pin
Initial Test Voltage Passed
After 500 Flex Cycles Test Voltage Passed
Page 34 of 40

LLCR Thermal Aging Group
1) A total of 104 points were measured.
4) The following guidelines are used to categorize the changes in LLCR as a result from stressing.
a. <= +5.0 mOhms:--------------------------------- Stable
b. +5.1 to +10.0 mOhms: -------------------------- Minor
c. +10.1 to +15.0 mOhms: ------------------------ Acceptable
d. +15.1 to +50.0 mOhms: ------------------------ Marginal
e. +50.1 to +2000 mOhms ------------------------ Unstable
f. >+2000 mOhms: --------------------------------- Open Failure
LLCR Measurement Summaries by Pin Type
Date 11/11/2013 11/25/2013
Room Temp (Deg C) 24 21
Rel Humidity (%) 53 48
Technician Peter Chen Peter Chen
mOhm values Actual Delta Delta Delta
Initial Thermal
Pin Type 1: Signal
Average 45.78 0.93
St. Dev. 1.19 1.26
Min 43.43 0.01
Max 51.00 6.44
Summary Count 104 104
Total Count 104 104
LLCR Delta Count by Category

Stable Minor Acceptable Marginal Unstable Open
mOhms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 >1000
Thermal 101 3 0 0 0 0
Page 35 of 40

LLCR Mating/Unmating Durability Group
1). A total of 104 points were measured.
2). EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets.
3). A computer program, LLCR 221.exe, ensures repeatability for data acquisition.
4). The following guidelines are used to categorize the changes in LLCR as a result from stressing.
a. <= +5.0 mOhms: ---------------------------------- Stable
b. +5.1 to +10.0 mOhms: -------------------------- Minor
c. +10.1 to +15.0 mOhms: ------------------------- Acceptable
d. +15.1 to +50.0 mOhms: ------------------------- Marginal
e. +50.1 to +2000 mOhms ------------------------- Unstable
f. > +2000 mOhms:--------------------------------- Open Failure

Date 11/7/2013 11/13/2013 11/18/2013 11/29/2013
Room Temp (Deg C) 24 22 22 22
Rel Humidity (%) 52 54 54 43
Peter Peter Peter Peter
Technician Chen Chen Chen Chen
Therm
Initial 25 Cycles Shck Humidity
Pin Type 1: Signal
Average 45.71 2.84 2.35 4.32
St. Dev. 0.74 2.14 1.77 2.64
Min 43.43 0.04 0.06 0.01
Max 48.58 9.88 7.42 9.88
Summary Count 104 104 104 104
Total Count 104 104 104 104
mOhms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 >1000
25 Cycles 84 20 0 0 0 0
Therm Shck 96 8 0 0 0 0
Humidity 61 43 0 0 0 0
Page 36 of 40

LLCR Gas Tight Group
a. <= +5.0 mOhms: --------------------------------- Stable
b. +5.1 to +10.0 mOhms:--------------------------- Minor
c. +10.1 to +15.0 mOhms: ------------------------- Acceptable
d. +15.1 to +50.0 mOhms: ------------------------- Marginal
e. +50.1 to +2000 mOhms: ------------------------ Unstable
f. >+2000 mOhms:---------------------------------- Open Failure

Date 11/7/2013 12/13/2013
Technician Peter Chen Peter Chen
Initial Acid Vapor
Pin Type 1: Signal
Average 45.36 1.28
St. Dev. 0.60 1.87
Min 42.79 0.02
Max 46.62 9.95
Total Count 104 104
mOhms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 >1000
Acid Vapor 97 7 0 0 0 0
Page 37 of 40

LLCR Shock & Vibration Group
a. <= +5.0 mOhms: ------------------------------------ Stable
b. +5.1 to +10.0 mOhms:---------------------------- Minor
c. +10.1 to +15.0 mOhms: -------------------------- Acceptable
d. +15.1 to +50.0 mOhms: -------------------------- Marginal
e. +50.1 to +2000 mOhms -------------------------- Unstable
f. >+2000 mOhms: ----------------------------------- Open Failure
Date 12/13/2013 2/7/2014
Technician Aaron McKim Aaron McKim
Initial Shock-Vib
Pin Type 1: Signal
Average 85.10 1.50
St. Dev. 0.80 1.08
Min 82.02 0.06
Max 86.77 5.40
Total Count 104 104
mOhms <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 >1000
Shock-Vib 102 2 0 0 0 0
Nanosecond Event Detection:
Shock and Vibration Event Detection Summary

Contacts tested 60
Test Condition C, 100g's, 6ms, Half-Sine
Shock Events 0
Test Condition V-B, 7.56 rms g
Vibration Events 0
Total Events 0
Page 38 of 40
EQUIPMENT AND CALIBRATION SCHEDULES
Equipment #: HZ-TCT-01
Description: Normal force analyzer
Manufacturer: Mecmesin Multitester
Model: Mecmesin Multitester 2.5-i
Serial #: 08-1049-04
Accuracy: Last Cal: 4/26/2013, Next Cal: 4/25/2014
Equipment #: HZ-OV-01
Description: Oven
Manufacturer: Huida
Model: CS101-1E
Serial #: CS101-1E-B
Equipment #: HZ-THC-01
Description: Humidity transmitter
Manufacturer: Thermtron
Model: SM-8-8200
Serial #: 38846
Equipment #: HZ-HPM-01
Description: NA9636H
Manufacturer: Ainuo
Model: 6031A
Serial #: 089601091
Equipment #: HZ-MO-05
Description: Micro-ohmmeter
Manufacturer: Keithley
Model: 3706
Serial #: 1285188
Equipment #: HZ-TSC-01
Description: Vertical Thermal Shock Chamber
Manufacturer: Cincinnatti Sub Zero
Model: VTS-3-6-6-SC/AC
Serial #: 10-VT14994
Accuracy: See Manual
… Last Cal: 06/28/2013, Next Cal: 06/27/2014
Page 39 of 40
EQUIPMENT AND CALIBRATION SCHEDULES Continued

Equipment #: MO-04
Description: Multimeter /Data Acquisition System
Model: 2700
Serial #: 0798688
… Last Cal: 04/30/2013, Next Cal: 04/30/2014
Equipment #: HZ-MO-01
Description: Micro-ohmmeter
Model: 2700
Serial #: 1199807
Equipment #: HZ-PS-01
Description: Power Supply
Manufacturer: Agilent
Model: 6031A
Serial #: MY41000982
Equipment #: SVC-01
Description: Shock & Vibration Table
Manufacturer: Data Physics
Model: LE-DSA-10-20K
Serial #: 10037
… Last Cal: 11/31/2013, Next Cal: 11/31/2014
Equipment #: ACLM-01
Description: Accelerometer
Manufacturer: PCB Piezotronics
Model: 352C03
Serial #: 115819
… Last Cal: 07/09/2013, Next Cal: 07/09/2014
Equipment #: ED-03
Description: Event Detector
Manufacturer: Analysis Tech
Model: 32EHD
Serial #: 1100604
… Last Cal: 06/04/2013, Next Cal: 06/04/2014
Page 40 of 40

Design Qualification Test Report FC1/FJ FC1-15-01-T/FJ-15-D-06.00-4

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Project Number: Design Qualification Test Report Tracking Code: 270482_Report_Rev_1

Requested by: Catie Eichhorn Date: 3/12/2014

DESIGN QUALIFICATION TEST REPORT

DATA REV.NUM. DESCRIPTION ENG

TEST SAMPLES AND PREPARATION

TYPICAL OVEN PROFILE (Soldering Parts to Test Boards)

MECHANICAL SHOCK (Specified Pulse):

ATTRIBUTE DEFINITIONS Continued

ATTRIBUTE DEFINITIONS Continued

ATTRIBUTE DEFINITIONS Continued

ATTRIBUTE DEFINITIONS Continued

ATTRIBUTE DEFINITIONS Continued

Mating – Unmating Forces

Dielectric Withstanding Voltage minimums, DWV

LLCR Mating/Unmating Durability Group (104 LLCR test points)

Mechanical Shock & Random Vibration:

a. Linear configuration with 1 adjacent conductors/contacts powered

Ambient Temperature (°C)

DATA SUMMARIES Continued

DATA SUMMARIES Continued

Ambient Temperature (°C)

DATA SUMMARIES Continued

3.5 3.7 3.3

Ambient Temperature (°C)

DATA SUMMARIES Continued

Ambient Temperature (°C)

DATA SUMMARIES Continued

Ambient Temperature (°C)

DATA SUMMARIES Continued

Mating-Unmating Durability Group （FC1-15-01-T/FJ-15-D-06.00-4）

DATA SUMMARIES Continued

Mating-Unmating Basic （FC1-05-01-T/FJ-05-D-06.00-4）

DATA SUMMARIES Continued

Mating/Unmating Data for 5, 15 and 25 Position FC1/FJ

DATA SUMMARIES Continued

Normal Force - Average Initial vs Average Thermal

DATA SUMMARIES Continued

INSULATION RESISTANCE (IR):

DIELECTRIC WITHSTANDING VOLTAGE (DWV):

Voltage Rating Summary

DATA SUMMARIES Continued

DIELECTRIC WITHSTANDING VOLTAGE (DWV):

DATA SUMMARIES Continued

LLCR Delta Count by Category

DATA SUMMARIES Continued

LLCR Measurement Summaries by Pin Type

DATA SUMMARIES Continued

LLCR Measurement Summaries by Pin Type

DATA SUMMARIES Continued

Nanosecond Event Detection:

Shock and Vibration Event Detection Summary

EQUIPMENT AND CALIBRATION SCHEDULES

EQUIPMENT AND CALIBRATION SCHEDULES Continued

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