FZ34NS: N-Channel 60 V (D-S) MOSFET
FZ34NS: N-Channel 60 V (D-S) MOSFET
FZ34NS: N-Channel 60 V (D-S) MOSFET
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N-Channel 60 V (D-S) MOSFET
D2PAK (TO-263)
G D S
S
N-Channel MOSFET
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Fig. 2 - Typical Output Characteristics, TC = 150 °C Fig. 4 - Normalized On-Resistance vs. Temperature
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Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage Fig. 7 - Typical Source-Drain Diode Forward Voltage
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage Fig. 8 - Maximum Safe Operating Area
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RD
VDS
VGS
D.U.T.
Rg
+
- VDD
5V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
VDS
90 %
10 %
VGS
td(on) tr td(off) tf
Fig. 9 - Maximum Drain Current vs. Case Temperature
Fig. 10b - Switching Time Waveforms
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L
VDS VDS
Vary tp to obtain
tp
required IAS
VDD
Rg D.U.T. +
V DD
- VDS
I AS
5V
tp 0.01 Ω
IAS
Fig. 12a - Unclamped Inductive Test Circuit Fig. 12b - Unclamped Inductive Waveforms
Current regulator
Same type as D.U.T.
QG 50 kΩ
12 V 0.2 µF
5V 0.3 µF
QGS QGD +
VDS
D.U.T. -
VG
VGS
3 mA
Charge
IG ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform Fig. 13b - Gate Charge Test Circuit
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- +
-
Rg • dV/dt controlled by Rg +
• Driver same type as D.U.T. VDD
-
• ISD controlled by duty factor “D”
• D.U.T. - device under test
VGS = 10 Va
Reverse
recovery Body diode forward
current current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
VDD
Re-applied
voltage
Body diode forward drop
Inductor current
Ripple ≤ 5 % ISD
Note
a. VGS = 5 V for logic level devices
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0.420
(10.668)
(9.017)
0.355
(16.129)
0.635
0.145
(3.683)
0.135
(3.429)
0.200 0.050
(5.080) (1.257)
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