DFX-244 Manual

Dakota Ultrasonics
OPERATOR’S MANUAL
DFX-244
 1998 Dakota Ultrasonics, Inc. All rights reserved.
Information in this document is subject to change without notice. No

part of this manual may be reproduced or transmitted in any form or by
any means, electronic or mechanical, including photocopying and
recording for any purpose without the express written permission of
Dakota Ultrasonics, Inc.
Dakota Ultrasonics
1650-B Mansfield Street
Santa Cruz, CA 95062
U.S.A
Phone: (831) 465-8585
Fax: (831) 465-8558
Email: sales@dakotainst.com
See Disclaimers And Notices On Page 1

DFX-244 Operator’s Manual Issue 1
TABLE OF CONTENTS
1. Disclaimers And Notices .......................................................................... 1
1.1 General Warnings ................................................................................ 1

1.2 Operator Training ................................................................................. 1
1.3 Testing Limitations ............................................................................... 2
1.4 Critical Operating Factors .................................................................... 2
1.5 Disclaimer of Liability ........................................................................... 4
1.6 Electromagnetic Compatibility.............................................................. 5
2. How to Use this Manual............................................................................ 7
3. Features of the DFX-244 ........................................................................... 9
3.1 Instrument Characteristics ................................................................... 9

3.2 Functional Testing Methods ............................................................... 10
4. Fundamentals of Ultrasonic Testing ..................................................... 11
4.1 Discontinuity Considerations.............................................................. 12

4.2 Ultrasonic Transducers/Probes & Sound Fields ................................ 12
4.3 Straight Beam Testing........................................................................ 16
4.4 Dual Element Testing......................................................................... 16
4.5 Angle Beam Testing........................................................................... 18
4.6 Immersion Testing.............................................................................. 20
5. Quick Start ............................................................................................... 23
5.1 Front Panel Controls .......................................................................... 23

5.2 Panel Calibration Memory.................................................................. 27
5.3 Flaw Detection ................................................................................... 28
5.4 Thickness Gauging ............................................................................ 29
6. Detailed Operating Instructions............................................................. 31
6.1 Basic Menu Functions........................................................................ 31

6.1.1 Main Menu............................................................................................. 31
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6.1.2 Function Menu ....................................................................................... 36

6.1.3 Memory Menu........................................................................................ 41
6.2 Menu Tree ..........................................................................................48

6.3 Storage & Recall of Calibration Setups ..............................................50
6.4 Flaw Testing .......................................................................................52
6.4.1 Basic Flaw Testing................................................................................. 52
6.4.2 DAC Operation ...................................................................................... 54
6.4.3 TCG Operation ...................................................................................... 57
6.4.4 Weld Inspection Using Trigonometry Mode ........................................... 62
6.4.5 Weld Inspection Using the AWS Menu .................................................. 65
6.4.6 A-LOG, A-Scan Storage ........................................................................ 66
6.4.7 REF, Reference Waveform Comparisons.............................................. 68
6.4.8 Contour & Peak Echo Dynamics............................................................ 69
6.5 Thickness Gauging .............................................................................71

6.5.1 Basic Thickness Gauging ...................................................................... 71
6.5.2 A-Cal...................................................................................................... 75
6.5.3 TCG for Reliable Gauging ..................................................................... 77
6.5.4 T-LOG Thickness Storage (Numeric) .................................................... 77
6.5.5 T-LOG Thickness Storage (Sequential & Download)............................. 78
6.5.6 T-FN Thickness Log Editing and Printing .............................................. 80
7. Power Supply ...........................................................................................83
7.1 NiCd Battery Pack ..............................................................................83

7.2 Battery Charging/Discharging.............................................................84
7.3 Servicing the NiCd Battery Pack ........................................................85
7.4 Fast Charge Pack ...............................................................................87
7.5 Alkaline Cells ......................................................................................87
7.6 Mains Pack .........................................................................................87
7.7 Optional Power Packs ........................................................................88
8. Interface Connections .............................................................................89
8.1 Interface Port ......................................................................................90

8.2 RS232 .................................................................................................91
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8.3 RF Out................................................................................................ 92
8.4 Composite Video................................................................................ 92
9. Specifications .......................................................................................... 93
10. Warranty ............................................................................................... 97
11. Index...................................................................................................... 98
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Table of Figures
Figure 1 – Basic Ultrasonic Testing ..................................................................11
Figure 2 – Ultrasonic Energy Field Distribution ................................................14
Figure 3 – Ultrasonic Beam Spread and Half-Angle.........................................15
Figure 4 – Typical Dual Element Transducer/Probe.........................................16
Figure 5 – Thickness Gauging on Pipe.............................................................17
Figure 6 – Couplant use on Pitted Surfaces .....................................................17
Figure 7 – Typical Angle Beam Transducer/Probe...........................................18
Figure 8 – Typical Weld Inspection...................................................................19
Figure 9 – Immersion Testing Method ..............................................................20
Figure 10 – Focusing in Immersion Testing......................................................21
Figure 11 – Front Panel of the DFX-244...........................................................23
Figure 12 – Cursor Selection of Echoes for DAC .............................................56
Figure 13 – DAC Curve and -6dB/-14dB Curves..............................................57
Figure 14 – Cursor Selection of Echoes for TCG .............................................59
Figure 15 – Equalization of Echoes Using TCG ...............................................61
Figure 16 – Trigonometry Mode Measurements...............................................62
Figure 17 – Trigonometry Mode Measurements...............................................64
Figure 18 – Peak Echo Dynamics.....................................................................70
Figure 19 – Broadband Echo ............................................................................72
Figure 20 – Narrowband Echo ..........................................................................72
Figure 21 – NiCd Battery Box ...........................................................................83
Figure 22 – NiCd Battery Connectors ...............................................................84
Figure 23 – Battery Charger..............................................................................85
Figure 24 – NiCd Cells in the Battery Box ........................................................86
Figure 25 – DFX-244 Interface Connectors......................................................89
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1. Disclaimers And Notices

The following information must be read and understood by any user of a
Dakota Ultrasonics ultrasonic flaw detector or thickness gauge. Failure
to follow these instructions can lead to serious errors in test results or
damage to the flaw detector. Decisions based on erroneous results can
lead to property damage, personal injury or death.
Anyone using this instrument should be fully qualified by their
organization in the theory and practice of ultrasonic testing, or be under
the direct supervision of such a person.
1.1 General Warnings

Proper use of the ultrasonic test equipment requires three essential
elements:
A. Knowledge of the specific test or inspection
application and applicable test equipment.
B. Selection of the correct test equipment based on
a knowledge of the application.
C. Competent training of the instrument operator.
This operating manual provides instruction in the basic operation of
the DFX-244 flaw detector. In addition to the methods included herein,
many other factors can affect the use of this flaw detector. Specific
information regarding these factors is beyond the scope of this
manual. The user should refer to appropriate textbooks on the subject
of ultrasonic testing and thickness gauging for more detailed
information.
1.2 Operator Training

Operators must receive adequate training before using this ultrasonic
flaw detector. Operators must be trained in general ultrasonic testing
procedures and in the set-up and performance required by each
specific test or inspection. Operators must understand:
A. Sound wave propagation theory.
B. Effects of the velocity of sound in the test
material.
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C. Behavior of the sound wave at the interface of

two different materials.
D. Sound wave spread and mode conversion.
More specific information about operator training, qualification,
certification and test specifications can be obtained from technical
societies, industry groups and government agencies. The user is
referred to the American Society of Nondestructive Testing at
(http://www.anst.org), the American Welding Society at
(http://www.aws.org), and the British Institute of Nondestructive
testing (http://www.powertech.co.uk/bindt/).
1.3 Testing Limitations

In ultrasonic testing, information is obtained only from within the
confines of the sound beam as it propagates into the test material.
Operators must exercise great caution when making inferences about
the nature of the test material outside the limits of the sound beam.
The condition of materials can vary significantly and the results can
be erratic in the absence of exercising good judgment.
1.4 Critical Operating Factors

The following procedures must be observed by all users of this
ultrasonic flaw detector in order to obtain proper and accurate results.
A. Calibration of the Sound Velocity. An ultrasonic
flaw detector operates on the principle of
measuring the time of flight of a burst of high
frequency sound through the test piece as well
as evaluating the amplitude of reflected or
transmitted echoes. This time is multiplied by
the sound velocity of the test piece which must
be calibrated in order to obtain an accurate
distance or thickness reading. Since the actual
sound velocity in materials can vary from the
published values, the best result is obtained
when the instrument is calibrated on a reference
block made from the same material as the test
piece. This block should be flat, smooth and as
thick as the maximum thickness expected of the
test piece.
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Users should also be aware that the sound

velocity may not be constant throughout the test
piece due to effects such as heat treating. This
must be taken into consideration when evaluating
the results of ultrasonic thickness testing. The
calibration should always be checked after
testing to minimize errors.
B. Transducer/Probe Zero Procedure. The
transducer/probe calibration procedures must be
performed as described in this manual. The
calibration block must be clean, in good
condition and free of noticeable wear. Failure
to perform the transducer/probe zero and
calibration procedure will cause inaccurate
thickness readings.
C. Flaw Detection Calibration. When performing flaw
detection, it is important to note that the
amplitude of indications is not only related to
just the size of the discontinuity. The depth of
a discontinuity below the test piece surface
will also have an effect on the amplitude due to
characteristics of the sound beam spread and
near field zone of transducer/probe. In
addition, the characteristics of the
discontinuity such as orientation and
classification, can alter the expected amplitude
response. For these reasons, calibration should
be performed on test blocks made of the same
material as the test piece with artificial
discontinuities within the range of size and
depth in the material desired to be detected.
The user is again cautioned to refer to
reference materials which are beyond the scope
of this manual.
D. Effects of Temperature on Calibration. The sound
velocity in test pieces and the transducer/probe
wear face changes with temperature variations.
All calibrations should be performed on site
with test blocks at or near the same temperature
as that expected on the test piece, to minimize
errors.
E. Transducer/Probe Condition. The transducer/probe
used for testing must be in good condition,
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without noticeable wear of the front surface.

The specified range of the transducer/probe must
encompass the complete range of the thickness to
be tested and/or the types of discontinuities to
be investigated. The temperature of the material
to be tested must be within the
transducer/probe's specified temperature range.
F. Use of Couplants. Operators must be familiar
with the use of ultrasonic couplants. Testing
skills must be developed so that couplant is
used and applied in a consistent manner to
eliminate variations in couplant thickness which
can cause errors and inaccurate readings.
Calibration and actual testing should be
performed under similar coupling conditions,
using a minimum amount of couplant and applying
consistent pressure to the transducer/probe.
SONATECH brand couplants are available from
Dakota Ultrasonics in both oil and water based
formulations.
1.5 Disclaimer of Liability

All statements, technical information and recommendations contained
in this manual or any other information supplied by Dakota Ultrasonics
in connection with the use, features and qualifications of the DFX-244
are based on tests believed to be reliable, but the accuracy or
completeness thereof is not guaranteed. Before using the product you
should determine its suitability for your intended use based on your
knowledge of ultrasonic testing and the characteristics of materials.
You bear all risk in connection with the use of the product.
Your are reminded that all warranties as to merchantability and fitness
for purpose are excluded from the contract under which the product
and this manual have been supplied to you. The Seller’s only
obligation in this respect is to replace such quantity of the product
proved to be defective.
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Neither The Seller Not The Manufacturer Shall Be Liable

Either In Contract Or In Tort For Any Direct Or Indirect Loss
Or Damage (Whether For Loss Of Profit Or Otherwise),
Costs, Expenses Or Other Claims For Consequential Or
Indirect Compensation Whatsoever (And Whether Caused
By The Negligence Of The Company, Its Employees Or
Agents Or Otherwise).
1.6 Electromagnetic Compatibility

This product conforms to the European Directive 89/336/EEC.
However, in order to ensure the equipment meets the requirements,
the following should be read:
Warning: This Is A “CLASS A” Product. In A Domestic
Environment, This Product May Cause Radio
Interference, In Which Case The User May Be
Required To Take Adequate Measures.
Note: This Product Should Not Be Connected To
Cables Greater Than Three (9) feet In Length.
If This Is Necessary, The Installation May
Require Further EMC Testing To Ensure
Conformity.
For any questions relating to the proper use of this product,

please contact the manufacturer at the number indicated on the
inside front cover copyright page.
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2. How to Use this Manual

This manual has been designed so that a person with a good
understanding of the basics of ultrasonic nondestructive testing may
understand the operation and use of the features offered by the DFX-
244. The user is advised, however, of the important nature of ultrasonic
nondestructive testing and is referred to Section 1 for important
information on the proper use of this technology.
Section 3 entitled Features of the DFX-244, is a quick reference listing
the pertinent characteristics of the instrument and the various functional
testing methods that may be used with the instrument.
Section 4 entitled Fundamentals of Ultrasonic Testing, will provide a
user unfamiliar with the technology of ultrasonic testing guidance for
seeking more training and understanding and is a good adjunct to the
precautions mentioned in Section 1.
Section 5 entitled Quick Start, provides a user familiar with ultrasonic
testing a means to operate the instrument’s basic functions and to
quickly achieve familiarity without having to understand all of it’s
features in detail.
Section 6 entitled Detailed Operating Instructions, is an in-depth tutorial
describing all of the advanced features of the DFX-244. A study of this
section will allow the user to become adept at performing various
ultrasonic testing methods with a higher level of productivity than is
available with other, conventional ultrasonic flaw detectors.
Section 7 describes important aspects of using and caring for the
battery power supply to get maximum battery duration time useful life.
Section 8 is for users who desire to operate the DFX-244 with ancillary
equipment.
The function keys are shown throughout this manual with the
mnemonics as shown in Section 5.1, “Front Panel Controls,” on page
23. A unique “Help” button provides the user with a quick guide and
description of the controls.
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3. Features of the DFX-244

The DFX-244 is a user-friendly ultrasonic digital flaw detector and
thickness gauge which is simple to use and provides the experienced
ultrasonic operator with a full-function device that incorporates many
productivity enhancing features. All of the features of the DFX-244 are
accessed through a menu system under the control of tactile touch
keypads.
3.1 Instrument Characteristics

The main instrument characteristics of the DFX-244 include:
• 110dB Gain Amplifier • Echo Freeze Mode
• Testing Range From 1mm • Depth & Thickness
(0.050”) Measurement Modes
• RF (Unrectified) Display Mode • Echo to Echo Measurement
• Reference Gain Display Mode
• Reference Waveform • Thickness Display & Logging
Comparisons • Thickness Minimum Mode
• Analogue Outputs • Panel Calibration Memories
• RS232 Output • A-Scan Memories
• Dual Independent Gates • Self Check Feature
• Context Sensitive Help • High Contrast and Brightness
Screens Colour TFT-LCD Display
• Calibration in Metric, English • Alpha-Numeric Labeling of
or Microseconds Thickness Logging
• DAC (Distance Echo • Dry Cell or NiCd Battery
Amplitude Correction) Curves • Eight Hour Operation on NiCd
• TCG (Time Corrected Gain) Cells
Function • Three Hour Fast Charge
• Trigonometric Weld Option
Measurement Feature • Real-Time Math for AWS D1.1
• Peak Echo Dynamics Mode Weld Inspection
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3.2 Functional Testing Methods

The DFX-244 supports the following ultrasonic testing methods:
• Pulse-Echo Flaw Detection
• Transmit-Receive Flaw Detection
• Contact or Immersion Methods
• Angle Beam (Shear Wave) Testing
• Angle Beam (Surface Wave) Testing
• Crack Diffraction Methods
• Depth of Flaw Measurement
• Single Transducer/Probe Thickness Measurement
• Dual Transducer/Probe Thickness Measurement
• Indirect Measurement of Sound Velocity in Materials
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4. Fundamentals of Ultrasonic Testing

The DFX-244 is a single-channel ultrasonic inspection instrument used
for the inspection of homogeneous materials for the presence of
inclusions, porosity and other discontinuities that could affect the
performance of materials and components. It can also be used for
thickness gauging of homogeneous materials, requiring access from
only one side of the test piece.
High frequency sound waves are
introduced into the test material
from a transducer/probe which is
usually coupled to the test part by
water or other suitable liquid
coupling. The transducer/probe
converts the electrical impulses of
the instrument into high frequency
sound energy. A short burst of
ultrasonic energy is introduced
into the test material and some or
all of the energy is reflected by
discontinuities and/or the far Figure 1 – Basic Ultrasonic
surface of the test part. The Testing
reflection of sound energy is a
function of the ratio between the
acoustic impedance of the
discontinuity and the base material. The acoustic impedance of a given
material is the product of the density and the velocity of sound in the
material. The higher the ratio, the more sound energy that will be
reflected. The principle of ultrasonic testing is shown in Figure 1 which
shows the ultrasonic energy in the test piece and the resulting
instrument display.
Thickness gauging with the DFX-244 operates on the principle of time-
of-flight of measurement. This principle utilizes the precise timing of the
transit time of a short burst of high frequency sound energy through a
material under test. The sound waves travel to the far side of the test
piece and reflect back to the transducer/probe where they are
converted into electronic signals and a measurement is obtained. This
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technique, derived from sonar and radar, has been widely applied to
nondestructive inspection and dimensional measurement processes.
4.1 Discontinuity Considerations

The size and geometric shape of the discontinuity relative to the
sound beam size and directivity are also factors that affect the
sensitivity of the test. As the sound beam enters the material, it
spreads and becomes weaker. Therefore, discontinuities farther from
the transducer or front surface of the test part produce a weaker
response from the system. This can be overcome by selectively
adjusting the gain of the instrument as a function of distance traveled
through the use of the DFX-244’s Time Corrected Gain feature. In
addition, discontinuities which present their predominant planar
surface to the axis of the sound beam will produce larger reflections
than those which only present an edge to the sound beam. Some
knowledge of these factors along with an understanding of how
discontinuities are formed in the test part are important for the proper
use and effectiveness of this instrument.
4.2 Ultrasonic Transducers/Probes & Sound Fields

The transducer/probe comprises a piezoelectric ceramic material that
generates short bursts of mechanical vibration or sound waves when
it is excited by a short electrical pulse from the DFX-244. The
frequency of the generated sound waves is far beyond the range of
human hearing and can be in the range of 0.1 to 20 MHz. Sound
energy at these high frequencies does not travel well through air. For
this reason, a coupling which in most cases is liquid, must be used
between the transducer/probe and the test piece.
Higher frequency transducer/probes are more sensitive to small
discontinuities due to their smaller wavelength. The wavelength if a
function of the frequency and the velocity of sound in the test material
according to the following equation:
v
λ =
f
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Where: λ = wavelength
v = velocity of sound in the material
f = frequency of the transducer/probe
In addition, higher frequency transducer/probes tend to have better
resolution due to shorter energy bursts and the smaller wavelength.
Resolution is the ability of a transducer/probe and instrument
combination to give distinct and separate indications from
discontinuities lying close to one another both laterally and axially. On
the other hand, higher frequency sound energy attenuates more and
tends to scatter in large grain material, causing a loss of sensitivity in
thicker sections of material. Proper ultrasonic testing requires careful
selection of the frequency to obtain a desired balance between
sensitivity and penetration.
The sound field of a transducer/probe is characterized by a near field
and a far field. The near field is the region directly in front of the
transducer/probe where the sound energy goes through a series of
maxima and minima both axially and radially. Responses from small
discontinuities in the near field can be irregular. The far field of the
transducer/probe is a region of more regular sound energy variations
beginning with the highest maximum and gradually declining to zero.
The highest maximum point is known as the near field distance and is
represented by N or Y0+ . This is also the natural focal point of the
transducer/probe. Figure 2 below demonstrates the axial variations of
a typical transducer/probe.
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Figure 2 – Ultrasonic Energy Field Distribution
The near field distance is a function of the transducer/probe

frequency, diameter, and the sound velocity in the test material
according to the following equation:
D2 f
Y+ =
0 4c
Where: D = diameter of the transducer/probe element

c = velocity of sound in the material
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Transducer/probes also exhibit a characteristic called beam spread.

The sound beam tends to spread as a function of the distance from
the transducer/probe as represented in Figure 3 below.
Figure 3 – Ultrasonic Beam Spread and Half-Angle
Beam spread is an important consideration when inspecting

discontinuities that may be close to geometric features of the test
piece such as corners and fillets. Such geometric features can cause
erroneous indications at distances where the beam spread is a factor.
For flat or non-focused transducers/probes, beam spread is defined
as the angle of the –6dB pulse-echo energy response according to
the following equation:
 α  .514 c
Sin  =

2 fD
Where: α = angle of beam spread at –6dB
c = velocity of sound in the material
D = diameter of the transducer/probe element
It can be seen from this relationship that beam spread can be
controlled by selecting a transducer/probe with a combination of
higher frequency or larger element diameter.
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4.3 Straight Beam Testing

Straight beam testing is the introduction of the sound energy normal
to the test piece surface utilizing longitudinal or compression waves. A
longitudinal wave is one in which the particle motion is in the same
direction as the propagation of the wave. Straight beam testing is
used for most flaw detection and thickness gauging.
4.4 Dual Element Testing

Dual element transducer/probes
contain separate transmitting and
receiving elements as shown in
Figure 4, usually mounted on delay
lines with a slight included angle.
This design improves near surface
resolution by separating the initial
pulse from the received echoes and
by providing a slight focus of the
sound beam. Dual transducer / Figure 4 – Typical Dual
probes are therefore, suitable for the Element Transducer/Probe
thickness gauging of pitting and
corrosion. Although dual element
angle beam transducer/probes are made for special situations, almost
all dual element transducer/probes are used for thickness gauging for
corrosion.
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When using dual element

transducer/probes it is important to
follow good practice in the use of the
couplant. Any excess buildup of
couplant could cause readings that
are thicker than the actual. This is
because the couplant can add to the
measured value. When measuring
small diameter piping, always place
the split in the transducer/probe
across the pipe and use only
enough couplant to obtain the
reading as shown in Figure 5.
The same precautions should be
observed for pitted front surfaces as
shown in Figure 6. Figure 5 – Thickness
Gauging on Pipe
NOTE: SONATECH brand couplants
are available from Dakota
Ultrasonics in both oil and water
based formulations.
Figure 6 – Couplant use on Pitted Surfaces
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4.5 Angle Beam Testing

Angle beam testing is the introduction of sound energy at an angle to
the surface of the test piece. In
most angle beam testing, the
wave energy is mode converted
from a longitudinal wave to a
shear wave by the refraction
principle using a
transducer/probe as shown in
Figure 7. A shear wave is one in
which the particle motion is
perpendicular to the direction of
propagation. Shear waves have
lower velocities and
correspondingly larger
Figure 7 – Typical Angle Beam
wavelengths than the longitudinal
Transducer/Probe
wave. In fact, the velocity of
shear waves is almost half that of
the longitudinal wave in most materials.
The incident angle necessary to produce a desired refracted wave
can be calculated from Snell’s Law as indicated in the following
equation:
Sin θ
i = Sinθr
C Cr
i
Where: θ1 = incident angle of the transducer/probe wedge
θ2 = desired refracted angle
Ci = sound velocity in the wedge
Cr = sound velocity of a shear wave in the test material
The transducer/probe wedge is usually manufactured from a polymer
material so that the difference in sound velocity is large enough to
produce the desired refraction.
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Angle beam or shear

wave testing is most
often used for the
inspection of welds.
The reason for this is
to be able to position
the transducer/probe
away from the weld
bead yet propagate
energy into the weld
zone. Another reason Figure 8 – Typical Weld Inspection
to use angle beam
testing on welds is to
position the sound beam more normal to the expected discontinuities
since the flaws in welds are usually perpendicular to the test surface
with the exception of porosity. Figure 8 shows the principle of angle
beam weld testing.
Depending on the incident angle, refracted sound beams can also
produce components of longitudinal energy, surface wave energy and
Lamb wave energy. Although these advanced topics are beyond the
scope of this manual, it is important to know that multiple modes can
occur simultaneously which may lead to spurious indications. Surface
wave inspection can be used to detect cracks on the surface of
materials.
NOTE: Angle beam testing is a more advanced ultrasonic testing
method. The user is advised to seek training and/or supervision in the
use of these methods for weld inspection.
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4.6 Immersion Testing

Immersion ultrasonic testing is used to automate the process and to
provide improved reliability for testing and test piece coverage.
Immersion testing offers the advantages of more uniform coupling,
increased testing speeds
and the ability to focus the
sound beam. All of these
factors can lead to
improved sensitivity and
reliability.
Most immersion testing
uses single element
transducer/probes with a
focusing lens applied to
the front face. This has the
effect of concentrating the
sound energy for improved
sensitivity and resolution.
The focal length of an Figure 9 – Immersion Testing Method
immersion
transducer/probe is
usually expressed in water distance. The focal length of a given
transducer/probe is limited to the near field distance described
previously. When the sound beam strikes a test piece, however, the
energy is usually focused more sharply, resulting in a reduction of the
focal length. The reason for this is the same principle of refraction as
described above for angle beam transducer/probes. This re-focusing
effect is shown in Figure 10.
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In order to
compensate for the
shortening of the focal
length, the following
equation can be used
to calculate a correct
water path distance
from the
transducer/probe to
the test piece surface:
Figure 10 – Focusing in Immersion Testing
C 
 
WP = F - MP  m 
C 
 w 
Where: WP = water path
MP = metal path
F = focal length in water
Cm = sound velocity in the test material
Cw = sound velocity in water
In addition to the refraction effect on the focal length, surface
curvature can change the focusing distance. Concave surfaces tend
to increase the focal distance and spread the sound beam. Convex
surfaces tend to refract the sound beam even more and shorten the
focal distance.
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5. Quick Start
5.1 Front Panel Controls

The front panel controls consist of a series of green and white sealed,
pressure sensitive, tactile buttons that control the instrument set-up
and movement through the menus on the screen. These buttons are
described below along with the mnemonics used throughout this
manual.
Figure 11 – Front Panel of the DFX-244
When the term “Highlighted” is used, it refers to the text within the
menu that has a bright background and dark letters, being the
selected item.
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Button/Mnem Description
“Power On” push button and “Power Off” push button

for switching the instrument On and Off. Operates as a
PWR toggle.
ST EP Press to select the dB step value of amplifier gain as

0.5, 2, 6, 14, or 20dB. The selected value is indicated at
STEP the top right-hand corner of the Gain box which is
always located at the bottom right side of the screen.
This is a momentary button with no repeat.
Press to increment or decrement the gain value
indicated in the Gain box which is always located at the
GAINU bottom right side of the screen. This is a repeat button
with acceleration to facilitate quick scrolling of the value.
GAIND
SING LE Selects either Single or Double probe operation. The
DOUBLE
mode selected is displayed in a highlighted box below
S/D the gain box at the lower right of the display. This is a
momentary button with no repeat.
These buttons move the highlighted cursor along the
top of the screen left and right to the sub menu desired
CURL to be selected. These are momentary buttons with no
repeat. The parameter boxes on the right of the screen
change as the sub menu is selected.
CURR
ACCEPT This button operates in conjunction with the memory

menus to accept a Store or to accept a Recall of a
ACPT memory already in storage. In the print mode, ACPT
acts as the print button.
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This button operates in connection with the plain white

buttons adjacent to the parameter boxes to increase the
INC value or step the selection in the positive direction. In
the case of Transducer/Probe Zero or Delay, it moves
the signals to the right. This is a repeat button with
acceleration to facilitate quick scrolling of the value.
This button operates in connection with the plain white
buttons next to the parameter boxes to decrease the
DEC value or step the selection in the reverse direction. In
the case of Transducer/Probe Zero or Delay, it moves
the signals to the left. This is a repeat button with
acceleration to facilitate quick scrolling of the value.
MEMO RY This button switches between the two main menus at

the top of the screen. The menus are described in
MEM Section 6.1 that follows. This is a momentary button
with no repeat.
F REEZ E Press this button once to select Freeze mode for the A-
PEAK
Scan display. This is a useful feature for holding an
FZ/PK echo for evaluation. When in this mode, a box is
highlighted showing FREEZE below the graticule.
Pressing the button a second time selects Peak mode,
which holds and updates all echoes on the display
during inspection. This feature allows an envelope or
echo dynamic pattern to be drawn on the screen which
is useful in angle beam inspection to locate the peak
signal. When in this mode, a box is highlighted showing
PEAK below the graticule.
Pressing the button a third time returns the A-Trace

display to normal mode. This is a momentary button
with no repeat.
FN The Function button selects a menu along the top of the

display with additional functions not on the start-up
FN menu. The menus are described in Section 6.1 that
follows. This is a momentary button with no repeat.
- 25 -
HELP This button selects the help menu which overlays the
display. The help menu explains how the DFX-244
HELP operates through three different modes:
UP/RT Using the SS230.
ACPT Description of the active menu.
DN/LT Calibration procedure.
Pressing the HELP button again at any point when in
help mode returns the display to normal mode.
The four white buttons on the right side of the display
are used to select the menu boxes which appear to the
YBLK right side of the A-Trace. When a menu box is selected,
it will be highlighted. The menu boxes contain a single
or double arrow point indicating slow or fast adjustment
mode. Press the button next to the selected box a
second time to toggle between slow and fast modes.
BNC or Lemo 1 connector is the receiver socket used
for twin or dual transducer/probe operation.
Rx
BNC or Lemo 1 connector is the transmitter socket used
as both the transmitter and receiver for single element
Tx transducer/probes, or as the transmitter for twin or dual
transducer/probe operation.
CHARGE Six pin socket with a spring loaded cover used to
connect the battery charger for recharging the NiCd
battery pack. A red dot is provided on both the socket
and plug to facilitate alignment.
The red LED next to CHARGE indicates a low charge
level. Flashing is an indication that less than an hour of
charge remains on the battery. When the light stays on
permanently, there is less than 30 minutes operation
remaining on the battery charge.
Refer to Section 7 for information on power supplies
and charging of the NiCd battery.
- 26 -
5.2 Panel Calibration Memory

The panel calibration settings of the DFX-244 always remain in
memory when the instrument is turned off, even if the battery pack is
removed. That means, whatever the calibration settings are
immediately before switching the instrument off will be retained when
the instrument is again switched on.
At times, it may be desirable to start with a “fresh palette” of settings.
This is especially true when beginning a new test procedure or going
from a flaw detection test to a thickness gauging procedure.
Otherwise, it may be necessary to go through all of the menus to
reset various functions. A reset function is provided to facilitate the
returning of all panel calibration settings to the factory defaults.
To reset panel settings to factory defaults:
1. Switch the instrument off.
2. Depress the white MEM button and hold while switching the
instrument on until the reset display is seen.
3. Press the UP/RT button to reset the instrument to factory
defaults.
NOTE: Before performing this procedure, be sure to save any favorite
panel calibration settings to memory by using the procedure outlined
in Section 6.3 on page 52.
NOTE: Resetting the panel settings restores the instrument to metric
measurement mode and PAL video output mode.
Factory default values:

Zero: 0 Mode: Single A-Cal Dist1: 100mm
Range: 100 Damping: 180 A-Cal Dist2: 200mm
Delay: 0 Gates: Off Video: PAL
Velocity: 5930 m/s Meas Mode: Off Bright: 10
Freq: 5 MHZ DAC: Off Colour: 0
Detect: Full Units: mm P_OP: Off
Contour: 0 Click: On AWS - Off
PRF: 1000 Hz Alarm: Mute
Width: 100ns TCG: Off
Clearing the memory:
- 27 -
The DFX-244’s memory is comprised of all the stored A-Logs, T-Logs

and calibration setups. Erasing all of these values accidentally could
have far reaching consequences. Should the occasion arise for a
need to erase all of the memory, call the factory for instructions.
5.3 Flaw Detection

Perform the following steps to establish a basic flaw detection mode
for the DFX-244. Units shown are in inches. For metric units, select
METRIC UNITS from the UTIL menu and use the corresponding
values for the parameters.
1. Select a suitable transducer/probe, preferably a 5MHz, ½” diameter
narrowband.
2. When making a quick adjustment on a menu parameter, press the
adjacent white button until the double arrow appears next to the
parameter name. This establishes the fast scroll using the INC and
DEC buttons.
3. In the CAL menu, set the following parameters:
a) ZERO to 0.000
b) VEL can be left unchanged
c) RANGE to 5.00 or other suitable value to cover the test range of
interest.
d) DELAY to 0.000
e) GAIN to 50.0
4. In the AMP menu, set the following parameters:
a) FREQ to 5.0 MHz
b) DETECT FW
c) REJECT to 5
d) PRF MAX to 1000 Hz
5. In the GATE1 menu, set the following parameters:
a) STATE to ON +VE
b) START to 0.100
- 28 -
c) WIDTH to 2.000 or other suitable value to cover the test range of

interest.
d) LEVEL to 50.0
6. In the GATE2 menu, set the STATE to OFF
7. In the MEAS menu, set the following parameters:
a) MODE to MONITOR
8. In the Function/DAC menu, set the MODE parameter to OFF
9. In the Function/TCG menu, set the MODE parameter to OFF
You are now prepared to perform basic flaw detection. Using an
appropriate calibration block, adjust the GAIN parameter to establish
the correct sensitivity. Adjust other parameters as necessary to optimize
the calibration. For more in-depth features of the DFX-244, see Section
6.4, “Flaw Testing” on page 54.
5.4 Thickness Gauging

Perform the following steps to establish a basic thickness gauging
mode for the DFX-244. Units shown are in inches. For metric units,
select METRIC UNITS from the UTIL menu and use the
corresponding values for the parameters.
1. Select a suitable transducer/probe, preferably a 5MHz, ½” diameter
broadband.
2. Select an appropriate calibration block with at least three known
thickness sections covering the range to be inspected and made
from the same material as that of the test piece.
3. When making a quick adjustment on a menu parameter, press the
adjacent white button until the double arrow appears next to the
parameter name. This establishes the fast scroll using the INC and
DEC buttons.
4. In the CAL menu, set the following parameters:
a) ZERO can be left unchanged
b) VEL can be left unchanged
- 29 -
c) RANGE to 5.00 or other suitable value to cover the test range of

interest.
d) DELAY to 0.000
e) GAIN to 50.0
5. In the AMP menu, set the following parameters:
a) FREQ to 5.0 MHz
b) DETECT +VE HW
c) REJECT to 25 (If required for noise removal.)
d) PRF MAX to 1000 Hz
6. In the GATE1 menu, set the following parameters:
a) STATE to +VE
b) START to 0.080
c) WIDTH to 5.00 or other suitable value to cover the test range of
interest.
d) LEVEL to 25.0
7. In the MEAS menu, set the following parameters:
a) MODE to DEPTH
b) TRIGGER to FLANK
c) HUD to ON
d) T-MIN to OFF
8. Calibrate the thickness readout on the selected calibration block
using the procedure in Section 6.5.2, “A-Cal” on page 76.
You are now prepared to perform basic thickness gauging. Adjust
parameters as necessary to optimize the calibration. For more in-depth
features of the DFX-244, see Section 6.5, “Thickness Gauging” on page
72.
- 30 -
6. Detailed Operating Instructions

Before proceeding with this section, the user should be familiar with the
front panel controls described in Section 6.1 on page 33. It is also
assumed that the user has a good understanding of the theory and
practice of ultrasonic testing.
6.1 Basic Menu Functions

At power on, an information screen is displayed momentarily showing
the instrument serial number, program rendition, and software version
number while a self-test is performed. After the self-test, the Main
menu is displayed above the A-Trace display and the CAL menu is
highlighted. The CURL and CURR buttons can be used to move the
highlighted cursor through the menu selections.
To the right of the A-Trace are the four parameter boxes for the
highlighted submenu and the REF/GAIN box which always appears at
the bottom right.
6.1.1 Main Menu

The Main menu is the power on default menu and can
be reached from the Function menu and the Memory ZERO
menu by pressing the respective buttons a second 0.830
time.
VEL
CALibration Menu
0.2264
ZERO Used to calibrate the screen and
thickness readout for zero offsets that are RANGE
inherently different for each
transducer/probe. Units are microseconds 1.00
in both mm and inch modes.
DELAY
VEL Used to calibrate the screen and 2.000
thickness span readout based on the
velocity of sound in the test material. REF 37.5
Units are meters per second in mm mode
and inches per microsecond in inch GAIN 2
mode. 53. 5
- 31 -
RANGE Used to set the full screen width of the horizontal A-

Trace in mm, inches, or microseconds depending on
the Units chosen in the FN UTIL menu. The range is
5mm to 10 meters (.020”-400”).
DELAY Used to set the delay or offset of the left side of the A-
Trace for viewing of a portion of a signal. The range is
0 to 5 meters (0-200”).
AMPlifier Menu
FREQ
FREQ Used to set the center frequency band of
the amplifier to match the 5.0 MHZ
transducer/probe. Ranges are 1, 2, 5, &
DETECT
10MHz narrow bands and 1.7-14MHz
WIDE band. +VE HW
DETECT Used to set the video detection and REJECT
display mode for the desired rectification
of the signals from RF, -VE HW (negative 0
half-wave), +VE HW (positive half-wave),
and FW (full-wave). PRF MAX
REJECT Used to remove low level noise from the

500 HZ
A-Trace. Reject is suppressive and is REF
adjustable from 0 up to 50% of full screen 37.5
height. An LED warning light is activated GAIN 2
when reject is above zero.
53. 5
- 32 -
GATE1 & GATE2 Menus

STATE
STATE Set the state of the gate as follows: ON +VE
+VE: The alarm triggers when an echo in
the gate exceeds the threshold level. START
-VE: The alarm triggers when an echo in
the gate falls below the threshold level. 0.116
Usually used to monitor for loss of
backwall echo. WIDTH
EXPAND: Expands the gate width to fill 2.420
the horizontal display width. Only applies
to gate 1. LEVEL
OFF: Switches the gate off. 40.0
START Used to set the start position of the gate
relative to the initial pulse. Units are mm REF
or inches and range is from 0 to the full 37.5
time base of the horizontal display. GAIN 2
WIDTH Used to set the width of the gate. Units

53. 5
are mm or inches and range is from
0.15mm (0.001in, 0.05µsec), depending
on the range selected, to the full time
base of the horizontal display.
LEVEL Used to adjust the alarm threshold level which
corresponds to the vertical height on the A-Trace.
Adjustable in 0.5% or 2% steps from 0% to 100% full
screen height.
- 33 -
MEASurement Menu
MODE
In the measurement menu, the top selection box
shows the selected measurement mode and the DEPTH
remaining three selection boxes vary depending on
TRIGGER
the mode selected as follows:
PEAK
MONITOR In this mode, gates 1 and 2 act as two
MODE: independent monitor gates. HUD
DEPTH In this mode, gate 1 functions as a depth OFF
MODE: or thickness monitor and displays the
depth (D:) and height (H:) of the first T-MIN
signal after the start of the gate that OFF
reaches or exceeds the gate level
threshold. Values are displayed in a REF
highlighted box below the A-Trace. 37.5
TRIGGER Used to select the depth or thickness GAIN 2
measurement to the FLANK (left edge) or 53. 5
PEAK of the first echo after the start of
the gate.
HUD When switched ON, provides a large, Head-Up Display
of the depth or thickness reading at the top right of the
A-Trace. Only available in DEPTH and E-E modes. In
DEPTH mode, the amplitude is also displayed up to
100%. The INC button sequences the selection from
distance to amplitude to off.
T-MIN When switched ON, the depth or thickness reading will
freeze that last minimum or lowest value measured. To
reset, toggle the function to OFF and then ON. Only
available in the DEPTH mode.
E-E MODE: In this mode, gate 1 functions as a thickness monitor
and measures the thickness between the first signal in
the gate and the second signal in the gate that reaches
or exceeds the level threshold. A second bar is shown
representing the blanking (see BLANK).
TRIGGER Used to select the depth or thickness measurement to
the FLANK (left edge) or PEAK of the echoes.
- 34 -
HUD When switched ON, provides a large, Head-Up Display

of the depth or thickness reading at the top right of the
A-Trace. Only available in DEPTH and E-E modes. In
DEPTH mode, the amplitude (HEIGHT) is also
displayed up to 100%. The INC button sequences the
selection from distance to amplitude to off. Not
available when the DAC is on. Automatically activated
when in the SEQUENCE mode of the T-FN menu.
BLANK This function sets the blanking distance which is a blind
zone after the first echo, after which a second echo can
be measured. This helps to eliminate undesired noise
in the first echo from being measured as thickness but
will limit the minimum thickness capability if set too
large. The value displayed is non-dimensional.
TRIG The TRIGonometry mode is used with angle beam
MODE: transducer/probes for weld inspection to calculate the
three important measurements based on the echo
position: the Beam path distance (Ì:), the Surface
distance (Æ:), and the Depth distance (È:) from the
index point of the transducer/probe.
TRIGGER Used to select the depth or thickness measurement to
the FLANK (left edge) or PEAK of the echoes. In angle
beam weld testing, the PEAK is usually used because it
is thought that this represents the center of a flaw.
ANGLE Set to the known refracted angle of the
transducer/probe to calibrate the Surface and Depth
measurements.
THICK Set to the thickness of the material being tested to
account for multiple skips of the angled sound beam in
the test material.
PRINT Menu
This menu allows printing of various information to a suitable serial
printer connected to the RS232 serial port on the DFX-244. Please
note that this requires a printer with a serial port.
DISPLAY With the Print mode in Display, the screen display will
be sent to the printer when the ACPT button is pressed.
- 35 -
LIST CPY With the Print mode in List Copy, all the calibration
settings, the screen and all notes in the Edit feature will
be sent to the printer display when the ACPT button is
pressed.
A_LOG In the A-Log print mode, all of the stored A-Scans that
are valid will be printed when the ACPT button is
pressed, along with the calibration settings and notes.
This can take considerable time if all 100 A-Scans are
stored.
6.1.2 Function Menu

Press the FN button to access the Function menu. Press it again to
return to the Main menu. When moving in and out of the Function
menu, the position of the cursors in the Main menu remain in their
previous positions.
A-CAL Menu
DIST1
This menu provides automatic calibration of sound
velocity and transducer/probe zero. Gate 1 is used to 0.100
select the reference echoes. The calibration
DIST2
procedure is described fully in Section 6.5.1 on page
72. 0.400
DIST1 The actual distance to the first or thinnest ACCEPT
reference echo in the calibration block.
CAL
DIST2 The actual distance to the second or
thickest reference echo in the calibration START
block. 0.116
ACCEPT Used to record each measurement. Upon
recording DIST2, the calibration is fixed. REF
37.5
START Used to adjust the start of the gate to GAIN 2
assure that the first or thinnest echo is
measured.
53. 5
- 36 -
DAC Distance Amplitude Correction Menu

This menu is used to create DAC curves using a MODE
series of reference echoes. Once drawn, the DAC ON
curve acts as an alarm threshold level for the gate
where the level varies to match the attenuation and CURVE
field characteristics of the transducer/probe and test -6/-12
material combination. The calibration procedure is
described fully in Section 6.4.1 on page 54. TRIGGER
ON MODE: Displays the DAC curve on the screen. DAC

CURVE Used to display the DAC curve alone or MEAS
with -6/-12 dB reference curves or -6/-14
dB reference curves.
dB6
TRIGGER Used to select alarm level threshold as REF
either the DAC curve or the GATE. 37.5
GAIN 2
NOTE: While DAC is activated, the gate
may still be used. 53. 5
MEAS If depth measurement is switched on with the DAC, the

depth mode will give distance to echo peak and
amplitude in a) dB relative to the reference curve, b)
%fsh which is percent full screen height, or c) %DAC
which is percent of the reference curve. Note that the
relative dB is dependent on REF gain settings but not
the GAIN setting.
When in the GATE mode, the depth measurement can
be to FLANK or PEAK, depending on the setting in the
MEAS menu.
DRAW Used to create the DAC curve.
MODE:
CURSOR Used to move the cursor over the reference echo for
which a DAC point is being set.
POINT Display only. Shows the last point created after
pressing the ACPT button.
- 37 -
TCG Time Corrected Gain Menu

This menu is used to create TCG curves using a MODE
series of reference echoes. Once drawn, the TCG DRAW
curve acts as swept gain control on the amplifier to set
different gain levels relative to distance. The CURSOR
calibration procedure is described fully in Section 6.4.3 ADJUST
on page 59.
ON MODE: Activates the TCG curve to adjust the POINT
gain. Can be activated in RF or rectified 0
display modes.
CURVE When switched ON, the TCG curve is
displayed. 6
DRAW Used to create the TCG curve. Cannot be REF
MODE: drawn in RF display mode. 37.5
CURSOR Used to move the cursor over the GAIN 2
reference echo for which a TCG point is 53. 5
being set.
POINT Display only. Shows the last point created after
pressing the ACPT button.
AWS Menu
This menu is used when performing weld
MODE
inspection in accordance with the American
Welding Society’s Structural Welding Code, MEAS
ANSI/AWS D1.1-94. It provides a convenient IL dB
method to automatically calculate the Indication 61.4
Rating as defined in the code. The calibration
procedure is described fully in Section 6.4.5 on AF dB
page 65. 3.0
SET Used to set up the AWS measurement
AF dB
MODE: mode.
- 7.2
REF Used to set the Indication Level.
CURSOR Used to move the cursor over the REF 3 7 . 5
reference echo to set the reference level. GAIN .5
- 7.5
- 38 -
MEAS Used to make measurements in

MODE: accordance with the code.
IL dB The dB required to set the indication to the reference
level.
AF dB The attenuation factor to correct for the depth of the
indication.
IR dB The indication rating calculated in accordance with the
code. Also the difference the IL and the reference level
with correction for attenuation.
UTILities Menu
UNITS Selects INCHES, uSEC, or METRIC
UNITS
measurement units. Microseconds is a
useful mode when using Time of Flight INCHES
Diffraction techniques (TOFD).
When in uSEC mode, the Velocity feature CLICK
is fixed at 2000 m/s (5000 in/usec) and is ON
not adjustable.
ALARM
CLICK When on, a beep will sound to confirm
each button press. MUTE
ALARM When set to AUDIBLE, a buzzer will SMOOTH
sound during any gate alarm.
OFF
SMOOTH When ON, the A-scan trace is smoothed
out to produce a clearer echo envelope REF
which aids defect identification, especially 37.5
when performing weld inspections. GAIN 2
53. 5
- 39 -
VIDEO Menu COLOUR

COLOUR Selects one of eight colour schemes for 0
the display.
BRIGHT- Controls the display brightness. The level BRIGHT
NESS selected will affect the battery duration. A 20
value of 1 gives about 10 hours, whereas
a value of 20 will give about 5 hours of VIDEO
operation, assuming the battery is in good NTSC
condition and at room temperature.
VIDEO Select NTSC (USA) or PAL UK/Europe)
composite video output modes. The C
screen update rate is 50Hz in PAL and
60Hz in NTSC. NTSC mode will be REF
slightly brighter. 37.5
GAIN 2
53. 5
P_O/P Proportional Output Control Menu
Note: A right facing cursor shows the further menus
P_OP and CLOCK. Press the CURR button past the MODE
small triangle on the right until the menu is FAST
highlighted.
This menu controls the analogue and digital O/P 1
proportional outputs. Two outputs are provided, one E1-E2
for depth and one for amplitude. The outputs are
active when the associated gate is triggered. O/P 2
Switching on the outputs will reduce battery duration. LEVEL 1
Set to OFF when not being used.
TRIGGER
NORMAL Outputs updated at 50-60Hz, depending
MODE on Video mode selected.
PEAK
FAST Outputs updated at 100-120 Hz, REF
MODE depending on Video mode selected. 37.5
When selected, the signal resolution and GAIN 2
measurement accuracy are reduced. 53. 5
- 40 -
O/P 1 Select depth output for DEPTH1 (Gate1),

DEPTH2 (Gate2), or E1-E2, the distance
between the two depth measurements.
O/P 2 Select the amplitude output for LEVEL1 (Gate1),
LEVEL2 (Gate2), or L1-L2, the difference between the
two amplitudes.
TRIGGER Sets the depth output to trigger on echo PEAK or echo
FLANK, the same as for measurement readout.
CLOCK Menu
Note: A right facing cursor shows the further menus SET
P_OP and CLOCK. Press the CURR button past the TIME
small triangle on the right until the menu is highlighted.
HOURS
TIME Used to set the current time.
MODE: 20
HOURS Used to set the current hour in 24 hour MINS
format.
50
MINS Used to set the current minutes.
DATE Used to set the current date.
MODE: C
DATE Used to set the current day number. REF
MONTH Used to set the current month number. 37.5
GAIN 2
YEAR Used to set the current year.
53. 5
NOTE: Be sure to press ACPT to save the new
CLOCK settings.
6.1.3 Memory Menu

Press the MEM button to access the Memory menu. Press it again to
return to the Main menu. When moving in and out of the Memory
menu, the position of the cursors in the Main menu remain in their
previous positions.
- 41 -
PANEL Setup Menu

This menu provides storage and recall of up to 20
STORE
calibration settings. The use of this feature is
described fully in Section 6.3 on page 52. 1
STORE Used to select a storage location (1-20). MODE
RECALL Used to recall a stored calibration set to RECALL
MODE: the active memory. Press ACPT to recall.
STATE
DELETE Used to delete a VALID (used) calibration
MODE: set. Press ACPT to delete. Press ACPT VALID
again after the confirmation prompt.
EDIT
LIST Shows the notes associated with the
MODE: stored calibration set. Pressing ACPT will
NOTES
recall the calibration set at which time the
REF
Notes can be edited.
37.5
STORE Stores the current calibration settings in GAIN 2
MODE: memory to the selected Store set. Press 53. 5
ACPT to store. If the STORE was Valid,
press ACPT again after the confirmation
prompt.
STATE Display only. VALID indicates that the store location is
used. EMPTY indicates that it is not used. To change
VALID to EMPTY, use the DELETE function.
EDIT Used to create or edit the notes in the current
NOTES: calibration set in memory, not the one in the selected
Store. Press to bring up the editing boxes as follows:
Use the CURL and CURR buttons to move the cursor
horizontally along a text line. Use the UP/RT and
DN/LT buttons to highlight a character from the map.
Press ACPT to write a character to a line and press
MEM to clear all text.
NEXT LINE Press to scroll through and select a line for editing.
INSERT Inserts a blank character space before the one the
CHAR cursor is currently on.
DELETE Deletes the character under the cursor.
CHAR
- 42 -
EXIT Exits back to the PANEL or A-LOG menu. Store the

calibration set to save the notes.
---------- NOTES ----------

LABEL :¦
OPERATOR:
LOCATION:
PROBE :
NOTES :
:
:
0 1 2 3 4 5 6 7 8 9 : = . / % *
; , - + = ? A B C D E F G H I J
K L M N O P Q R S T U V W X Y Z
CURSOR EDIT
A CCE P T CLEAR ALL M E M ORY
Edit Notes Window

(Typical for the PANEL and A-LOG menu)
A-LOG Menu
This menu provides storage and recall of up to 50 STORE
A-Scans with settings. The use of this feature is 1
described fully in Section 6.4.5 on page 65.
MODE
STORE Used to select a storage location (1-50).
RECALL
RECALL Used to recall a stored A-Scan and
MODE: settings to the active memory. Press STATE
ACPT to recall. The display comes up in
FREEZE mode. Press FZ/PK to remove. VALID
DELETE Used to delete a VALID (used) A-Scan EDIT
MODE: and its settings. Press ACPT to delete.
Press ACPT again after the confirmation
NOTES
prompt.
REF
LIST Shows the notes associated with the 37.5
MODE: stored A-Scan and its settings. Pressing GAIN 2
ACPT will recall the calibration set. The 53. 5
Notes can be edited only if the present
STORE is overwritten.
- 43 -
STORE Stores the current A-Scan and its settings in memory to

MODE: the selected Store set. Press ACPT to store. Press
ACPT again after the confirmation prompt.
utilized. EMPTY indicates that it is not in use. To
change VALID to EMPTY, use the DELETE function.
EDIT: (See notes editing summary in PANEL above.)
REF Menu
STORE
This menu allows the user to select a waveform form 1
among those stored in the A-LOG menu, and to
display this on the graticule, along with the real time MODE
waveform. This feature allows the user to make RECALL
comparisons between an expected or reference signal
and the actual signal obtained from the test piece. The STATE
use of this feature is described fully in Section 6.4.7 VALID
on page 69.
STORE Used to select the A-LOG storage EDIT
location (1-50) where the reference NOTES
waveform is to be found.
REF
RECALL Used to recall the stored A-Scan to the 37.5
MODE: display. Press ACPT to recall. GAIN 2
LIST Shows the notes associated with the 53. 5
MODE: stored A-Scan. The Notes can be edited
only in the A-LOG menu.
OFF Removes the reference waveform from the display.
MODE: Press ACPT to remove.
utilized. EMPTY indicates that it is not in use.
- 44 -
T-LOG Menu
This menu provides storage and recall of up to 2,000 BLOCK
thickness readings. Numeric and Sequential modes 1
are available as selected in the T-FN menu. This
feature is described fully in Section 6.5.4 on page 78. LOC
Numeric Mode: Readings are stored under a three 9

level code, starting with BLOCK (1-14), followed by NO
LOCation (1-2000) and NO (1-2000).
15
BLOCK Used to select the block number (1-14)
for storage or viewing of a thickness THICK
reading.
0.334
LOC Used to select the location number for
storage or viewing of a thickness reading. REF
37.5
NO The individual thickness reading number
into which a thickness reading is stored. GAIN 2
Increments automatically when storing a 53. 5
reading by pressing the ACPT button.
THICK The thickness reading stored in the
BLOCK-LOC-NO. If blank, there is no
stored thickness in that particular three
level code.
- 45 -
Sequential Mode: Readings are stored by LOCation (1-2000) number

only. In this mode location and historical thickness data can be
downloaded to the DFX-244 from a computer, a fixed series of four
notes can be added to a location, and any of the 20 PANEL store
settings can be assigned to a location.
Note: The HUD is on automatically in Sequential mode.
storage or viewing of a thickness reading. LOC
THICK The thickness reading stored in the LOC. 9

If blank, there is no stored thickness in
that number. THICK
0.334
NOTES One of four notes can be selected or
blank. OBSTRC for obstruction, PITTING, NOTES
POOR S/C for poor signal or couplant,
OBSTRC
and NO BWE for no back wall echo.
AUTO SET Allows selection of the auto calibration AUTO SET
feature if the downloaded sequence ON
contains PANEL store numbers. The
DFX-244 can then be automatically REF
calibrated to one of twenty panel settings 37.5
for selected sequence numbers. GAIN 2
53. 5
- 46 -
T-FN Menu
MODE
PRINT Set the mode to PRINT to print the PRINT
MODE: selected blocks and locations to the
printer on the RS232 port. BLOCK
DELETE Set the mode to DELETE to delete the ALL
MODE: selected blocks and locations. Press
ACPT again after the confirmation LOC
prompt. ALL
BLOCK Used to select the block number for
printing or deletion. Decrement below 1 to ID MODE
select ALL blocks for printing or deletion. NUMERIC
REF
printing or deletion. Decrement below 1 to
37.5
select ALL locations for printing or
GAIN 2
deletion.
53. 5
ID MODE Used to select NUMERIC or
SEQUENTIAL modes for location
identification recording in T-LOG.
Numeric mode provides a three level code of BLOCK,
LOCation, and NO (number) for identifying locations.
Sequential mode provides LOCation only but has
additional features for downloading a preset
identification sequence from a computer along with
historic thickness readings, a choice of four notes that
can be easily added to each location, and the ability to
automatically set the instrument calibration using any of
up to 20 stored PANEL sets associated with any of the
locations.
- 47 -
6.2 Menu Tree

Menu Sub-Menu Parameters
Main Menu
CALibration ZERO VEL RANGE DELAY
AMPlifier FREQ DETECT REJECT PRF MAX
GATE1 STATE START WIDTH LEVEL
GATE2 STATE START WIDTH LEVEL
MEASurement ÈMODEÈ
MONITOR
DEPTH TRIGGER HUD T-MIN
E-E TRIGGER HUD BLANK
TRIG TRIGGER ANGLE THICK
PRINT OFF DISPLAY LIST CPY A_LOG
FN Function Menu
A-CAL DIST1 DIST2 ACCEPT START
DAC ÈMODEÈ
OFF CURVE TRIGGER
ON CURVE TRIGGER MEAS
DRAW CURSOR POINT
TCG ÈMODEÈ
OFF
ON CURVE
DRAW CURSOR POINT
1
AWS ÈMODEÈ
SET REF CURSOR
MEAS IL dB AF dB IR dB
UTILities UNITS CLICK ALARM SMOOTH
VIDEO COLOUR BRIGHT VIDEO
P_O/P MODE 0/P 1 0/P 2 TRIGGER
- 48 -
Menu Sub-Menu Parameters

CLOCK ÈMODEÈ
OFF
TIME HOURS MIN
DATE DATE MONTH YEAR
On the monochrome version, the P_O/P and CLOCK order are reversed.
MEMORY Menu
PANEL STORE ÈMODEÈ
STORE STATE EDIT*
RECALL STATE EDIT*
DELETE STATE EDIT*
LIST STATE
A-LOG STORE ÈMODEÈ
STORE STATE EDIT*
RECALL STATE EDIT*
DELETE STATE EDIT*
LIST STATE
REF STORE ÈMODEÈ
RECALL STATE
LIST STATE
OFF STATE
T-LOG BLOCK LOC NO THICK
2
T-LOG LOC THICK NOTES AUTO SET
T-FN ÈMODEÈ
PRINT BLOCK LOC ID MODE
DELETE BLOCK LOC ID MODE
*EDIT Function NEXT LINE INSERT DELETE EXIT
CHAR CHAR
1 Models sold in certain countries where the AWS methods are used such
as the United States, Canada and Mexico.
2 With ID MODE in SEQUENCE
- 49 -
6.3 Storage & Recall of Calibration Setups

After the DFX-244 has been properly calibrated for a particular testing
scheme, it is possible to store all of the panel settings for subsequent
recall when performing the same test at a later time. Although the last
panel settings are “remembered” by the DFX-244’s memory, this
feature is useful when the instrument is being used for many different
tests requiring substantially different panel calibration settings. In
addition to the panel settings, a freeform note can be stored with the
panel set that includes provision for a label, an operator name or
number, a location identifier, and a transducer/probe identifier. It is
possible to store up to twenty (20) sets of panel settings, each
assigned a set number from one to twenty. A set of panel settings can
be printed after the set is recalled to active memory by using the LIST
CPY function in the PRINT menu.
To store a panel set:
1. Press the MEM button to access the Memory menu.
2. Use the CURL and CURR buttons to highlight the PANEL menu.
3. If it is desired to store Notes with the panel settings, see the
description for entering notes below.
4. Select the STORE box and, using the UP/RT and DN/LT buttons,
select a desired STORE number from one to twenty. Note that as
the STORE number is changed, the STATE parameter indicates if
the number is used (VALID) or EMPTY.
5. Select the MODE box and using the UP/RT and DN/LT buttons,
select the STORE mode.
6. Press the green ACPT button to store the panel settings.
7. If you forgot to enter Notes, create the Notes as described below
and then re-save the panel settings starting at step 5 above.
To recall a panel set:
Follow the above procedure but set the MODE parameter to RECALL
and then press the green ACPT button.
To delete a panel set:
- 50 -
Follow the above procedure but set the MODE parameter to DELETE
and press the green ACPT button.
Adding NOTES to PANEL and A-LOG sets:
When storing panel calibration settings or waveforms, it is often useful
to add some notes to the set so it can later be identified, or to help the
user recall the correct set. This is possible in the PANEL and A-LOG
menus by using the NOTES feature.
When a panel calibration set or waveform is to be stored, first
calibrate the instrument as desired, or capture the waveform by
pressing the white FZ/PK button. Then select the EDIT NOTES box in
the menu and notice that the window shown below overlays the
display area.
The LABEL line is 8 characters long, and is used by the
WAVESTORE interface program as a file name for storing to disk.
The OPERATOR, LOCATION and PROBE lines are 25 characters
each, while the three NOTES lines allow up to 75 characters.
The green CURL and CURR buttons are used to move the cursor
from right to left along a line of text. The white button adjacent to the
NEXT LINE box is used to advance the cursor down to the next line.
When the cursor is at the bottom line, the NEXT LINE function moves
it back to the top line.
To delete a character, position the cursor over it and press the white
button adjacent to the DELETE CHAR box. To clear all of the text in
the NOTES window, press the white MEM button.
To insert a character space, position the cursor to the right of the
desired insert location and press the white button adjacent to the
INSERT CHAR box.
To select a character from the character map below the notes lines,
use the white UP/RT and DN/LT buttons to move the highlight through
the map. Then press the white ACPT button to add the character to
the NOTES line at the position of its cursor.
Once the desired notes have been added or edited, press the white
button adjacent to the EXIT box. The text is now entered but not
stored. It is now necessary to store the notes using the methods
outlined in the PANEL and A-LOG sections.
- 51 -
If a stored PANEL or A-LOG is recalled, its notes will be loaded into

the window. The notes can then be viewed and edited using the same
procedure detailed above.
---------- NOTES ----------
LABEL :¦
OPERATOR:
LOCATION:
PROBE :
NOTES :
:
:
0 1 2 3 4 5 6 7 8 9 : = . / % *
; , - + = ? A B C D E F G H I J
K L M N O P Q R S T U V W X Y Z
CURSOR EDIT
ACCEP T CLEAR ALL M E M ORY
Edit Notes Window

(Typical for the PANEL and A-LOG menu)
NOTE: When notes are displayed, the menu cursor buttons are
disabled. Exit the notes window to change to another menu.
6.4 Flaw Testing
6.4.1 Basic Flaw Testing

Reliable flaw detection requires three important considerations: a)
proper transducer/probe selection, b) an accurate reference block of
the same material as that being tested with reference holes
representing the orientation and sensitivity desired, and c) proper
calibration of the instrument. The following are the basic guidelines for
accurate flaw detection but the user is referred to Section 1.2 on
Operator Training for advice on seeking in-depth training.
Transducer/probes used for flaw detection are usually of the
narrowband variety to provide the best possible sensitivity to the
anticipated discontinuities. In some cases, broadband varieties are
chosen to optimize near or far surface resolution – the ability to
separate discontinuities from the front surface or back surface echo.
In either case, the frequency is chosen so that the wavelength in the
- 52 -
material is optimized for the orientation and size of expected

discontinuities. The single element contact transducer/probe is used
for general purpose flaw detection. The angle beam transducer/probe
is used for weld inspection which is covered in Section 4.5 on page 18
and Section 6.4.4 on page 63. Other specialty transducer/probes
including duals and surface wave can be used but these topics are
beyond the scope of the manual.
The next requirement for reliable flaw detection is a calibration or
reference block. This block should be made of the same material as
the parts to be inspected. In other words, it should have the same
sound velocity and attenuation characteristics. The calibration block
should have surfaces that mimic the parts to be inspected so that
attenuation and sensitivity characteristics are similar. Most
importantly, the calibration block should have a series of fabricated
discontinuities representing those expected to found in the test piece.
That is, the size and orientation of the fabricated discontinuities
should match the expected natural discontinuities in the test piece.
This may mean flat bottom holes perpendicular to the test surface,
side drilled holes parallel to the testing surface, or in some cases,
narrow notches representing planar surfaces parallel or perpendicular
to the testing surface. Fabricated discontinuities must also be placed
near the front and back surface of the calibration block to verify
resolution of the transducer/probe and instrument setting combination.
Finally, it is necessary to establish the proper calibration of the DFX-
244 in order to assure reliable flaw detection. The essence of this
calibration is to set the pulser, amplifier and gate parameters to
provide the necessary sensitivity and resolution. The following are the
essential steps for basic flaw detection:
1. Select the appropriate single element contact transducer/probe
and calibration block that matches the material and expected
discontinuities under test.
2. In the CAL menu, select the proper Range and Delay so that
echoes from the anticipated material depth can be viewed.
3. From the AMP menu, set the Frequency to the nominal value of
the transducer/probe and set the detection mode to RF.
4. Using the S/D button, set the Mode to Single.
- 53 -
5. Couple the transducer/probe to the calibration block and obtain

an echo from a fabricated discontinuity or the back surface and
adjust the Gain to set the peak of the echo to about 80% screen
height.
6. From the AMP menu, set the Detect parameter to FW. Set the
Reject parameter to zero or some small value up to 10 to
eliminate noise from the baseline.
NOTE: Do not set the Reject parameter so high as to
preclude the detection of small echoes from discontinuities.
7. Adjust the gain to set a reference echo from mid thickness of the
calibration block to about 80% amplitude.
8. From the GATE1 menu, set the gate to ON +VE and adjust the
Start and Width so that the gate encompasses the full testing
range of interest. Place the transducer/probe over the near and
far reference reflectors in the calibration block to verify proper
coverage. Adjust the Level parameter to 50%.
9. From the MEAS menu, set the Mode parameter to MONITOR.
For weld inspection using an angle beam transducer/probe, follow the
instructions in Section 6.4.4 “Weld Inspection Using Trigonometry
Mode” on page 63 and Section 6.4.5 “Weld Inspection Using the AWS
Menu” on page 65.
For storage and printing of A-Scans, refer to Section 6.4.5, “A-LOG, A-
Scan Storage” on page 65.
6.4.2 DAC Operation

Distance Amplitude Correction curves act as monitoring gate
triggering thresholds to compensate for attenuation and sound beam
characteristics. When properly established, the DAC curve will
provide consistent alarming from discontinuities of equal relative size
at different depths in the test piece. Functionality is provided to
automatically draw 6dB and 14dB or 6dB and 12dB reference curves
below the calibrated curve.
It should be noted that since the DAC function only provides a
dynamic alarm threshold capability, the dynamic range is limited to
the screen height. Therefore, the dB figure displayed may be limited
- 54 -
in accuracy when small signals are detected. As an alternative, the

TCG function may be more applicable. See Section 6.4.3 on page 59
for the use of the Time Corrected Gain feature.
Proper use of the DAC feature requires a reference block made from
the same material as that being examined, with flat-bottom or side-
drilled holes of the desired size placed at depths covering the range to
be inspected.
The DAC cannot be operated when either TCG or AWS is activated.
To establish a DAC curve, follow the following instructions:
1. Establish the basic calibration of the DFX-244 using the desired
transducer/probe and the proper reference block.
2. From the FN menu, select the DAC feature.
3. Select the MODE parameter by pressing the white button next to it
and use the INC button to select DRAW. The other parameters
will now be CURSOR and POINT. Note: When in the MODE
parameter, only press the DEC button to turn the DAC off. This
will erase any logged echoes.
4. The DAC system is now ready to accept reference points. Position
the transducer/probe to give a maximum echo from the first or
topmost reference hole in the reference block. Be careful to use a
consistent amount of coupling and transducer/probe pressure.
5. Use the INC and DEC buttons to position the bright cursor bar
over the echo from the reference hole.
6. Press the ACPT button to accept the point. The POINT parameter
will then increment to indicate the next point and a small dot will
appear on the display showing the peak of the point just recorded.
- 55 -
7. Repeat steps 5 and 6 for each additional reference hole in the

reference block, being careful to be consistent with the amount of
coupling and transducer/probe pressure. A maximum of ten (10)
points can be recorded for a DAC curve.
Figure 12 – Cursor Selection of Echoes for DAC
8. Press the white button adjacent to MODE and use the DEC button
to select ON mode. The DAC curve will now be displayed and the
other parameters will change to CURVE, TRIGGER and MEAS.
9. Use the CURVE parameter and the INC button to select just the
DAC reference curve, the DAC curve along with the -6dB and
-12dB curves, or the DAC curve along with the -6dB and -14dB
curves. These additional, automatically generated reference
curves provide a means for evaluating discontinuities smaller than
those in the reference block.
- 56 -
10. Use the TRIGGER parameter to establish that the alarm triggers
from the DAC curve or the GATE.
If depth measurement is switched on with the DAC feature, the depth
Figure 13 – DAC Curve and -6dB/-14dB Curves
mode display below the A-Trace will show the distance to the echo
peak and the relative amplitude in dB to the DAC reference curve or
the Gate level. Note that the relative dB display is dependent on the
REF gain setting, but not the GAIN setting.
To turn off the DAC feature, select the MODE parameter from the
DAC menu and press the DEC button until OFF is indicated.
6.4.3 TCG Operation

The Time Corrected Gain feature provides a means of creating an
attenuation curve that sets the gain in a swept manner as a function
of transit time. A properly constructed TCG curve will compensate for
- 57 -
material attenuation and sound beam characteristics so that

discontinuities of equal relative size at different depths in the test
piece will give a equal amplitude response on the display.
Proper use of the TCG feature requires a reference block made from
the same material as that being examined, with flat-bottom or side-
drilled holes of the desired size placed at depths covering the range to
be inspected.
The TCG cannot be operated when the DAC is activated.
To establish a TCG curve, follow the following instructions:
2. From the FN menu, select the TCG feature.
and use the DEC button to select DRAW. The other parameters
will now be CURSOR and POINT.
4. The TCG system is now ready to accept reference points. Position
the transducer/probe to give a maximum echo from the first or
topmost reference hole in the reference block. Be careful to use a
consistent amount of coupling and transducer/probe pressure.
5. Use the INC and DEC buttons to position the bright cursor bar
over the echo from the reference hole.
- 58 -
6. Press the ACPT button to accept the point. The POINT parameter
will then increment to indicate the next point. As each point is
entered, the gain will change to place the echo at about 80%
amplitude.
- 59 -
Figure 14 – Cursor Selection of Echoes for TCG

7. Repeat steps 5 and 6 for each additional reference hole in the

reference block, being careful to be consistent with the amount of
coupling and transducer/probe pressure. A maximum of ten (10)
points can be recorded for a TCG curve.
- 60 -
8. Press the white button adjacent to MODE and use the DEC button
to select ON mode. The TCG curve will now be displayed, the
amplifier gain will now swept, and the other parameters will
change to CURVE.
- 61 -
Figure 15 – Equalization of Echoes Using TCG

9. Use the CURVE parameter and the INC button to select ON or

OFF for the display of the TCG curve.
NOTE: A TCG curve cannot be drawn while in RF display mode
(DETECT-RF), but can be activated. Therefore, if TCG is desired in
RF display mode, draw the curve in rectified mode first and then
switch to RF. It should be noted that the range of TCG is only limited
by the dynamic range of 40dB.
6.4.4 Weld Inspection Using Trigonometry Mode

The Trigonometry Mode
provides a convenient
method for measuring the
location of discontinuities
when inspecting welds with
angle beam transducers.
Essentially, the trigonometry
mode uses the thickness
gauging features of the
DFX-244 to calculate the
surface distance and depth
to a discontinuity from the
actual beam path
measured. This is Figure 16 – Trigonometry Mode
accomplished by calibrating Measurements
the trig mode with the actual
refracted angle of the
transducer/probe being used. Additionally, the thickness of the test
piece must be established in the menu in order to calculate depth and
surface distance when using multiple skips in angle beam testing. The
measurements being calculated are depicted in Figure 16.
These measurements are displayed below the A-Trace on the DFX-
244 as follows:
Ì Beam path distance B from the central exit point on the
transducer/probe to the discontinuity, the sum of B1 and B2 in
double skip mode.
- 62 -
Æ Surface distance S from the central exit point on the

transducer/probe to a point directly above the discontinuity on
the test piece.
È Depth distance D from the surface on which the
transducer/probe rests to the discontinuity.
It is important to note that discontinuities in welds can be disjointed
and can extend over a distance. The measurements made will,
therefore, be close approximations to the discontinuity if the user
properly calibrates the DFX-244 and uses care to locate the desired
peak amplitude signal to which a measurement is made.
To calibrate and use the trigonometry mode, follow these instructions:
1. Using a suitable IIW or other calibration block, measure and
establish the central sound beam exit point and actual refracted
angle for the transducer/probe being used.
2. Establish the zero and velocity (span) for the transducer and
material under test using the A-CAL procedure described in
Section 6.5.2 on page 76. Use a suitable calibration block that has
two drilled holes representing the thin to thick range of
thicknesses expected in the test piece. In the MEAS menu
(Section 6.5.2 paragraph 4), set the TRIGGER parameter to
PEAK. As in any ultrasonic thickness measuring method, it is
important that the calibration be performed using a calibration
block of the same material as that being inspected. Alternately, if
you know the velocity of sound in the test piece, you may calibrate
using the A-CAL method on a different material and then set the
velocity parameter.
3. Set the START and WIDTH of Gate1 to encompass the desired
testing region.
4. From the Main menu, select MEAS and place the MODE to TRIG.
5. Set the TRIGGER parameter to PEAK.
6. Select the ANGLE parameter and using the INC and DEC buttons,
set the refracted angle of the transducer/probe measured in step 1
above.
- 63 -
7. Select the THICK parameter and using the INC and DEC buttons,
dial in the thickness of the test piece. You may have to readjust
this parameter if the test piece had varying thickness and you are
using a multiple skip mode of angle beam testing.
8. When measuring a discontinuity, be sure to position the
transducer/probe so as to obtain the maximum amplitude signal
before recording the readings. A typical TRIG mode display is
shown in Figure 17 below.
Figure 17 – Trigonometry Mode Measurements
- 64 -
6.4.5 Weld Inspection Using the AWS Menu

The AWS menu (available on Models sold in certain countries where
the AWS methods are used such as the United States, Canada and
Mexico) provides a means for evaluating discontinuities when
inspecting welds in accordance with the American Welding Society’s
Structural Welding Code, ANSI/AWS D1.1-94. The user is referred to
the AWS standard for full details of the method.
The AWS menu provides a convenient method of automatically
calculating the “Indication Rating” (IR) as defined by the standard.
The AWS menu can be used in conjunction with the trigonometry
mode which will simultaneously indicate beam path, surface distance
and depth distance at the bottom of the graticule. The AWS menu will
not operate with either the DAC or TCG switched on.
To set up the AWS measurements, perform the following:
1. Calibrate the DFX-244 for weld testing and set up the trigonometry
mode by following the steps in Section 6.4.4 on page 63.
2. From the FN menu, select AWS and place the MODE to SET.
3. Highlight REF on the menu and set to the desired reference level,
usually 80% of full screen height.
4. Place the probe on the test block and obtain the maximum signal
from the reference indication.
5. Place the cursor over the indication by selecting ADJUST
CURSOR and using the INC and DEC arrow keys.
6. With the signal maximized, press the ACCEPT key.
The DFX-244 is now calibrated to make Indication Rating
measurements in accordance with AWS D1.1-94. To use the AWS
mode, do the following:
1. On the AWS menu, highlight MODE and select MEAS.
2. Ensure that the gate and measurement (TRIG) function are
operative and properly adjusted.
3. When the AWS menu is selected and a signal is in the gate, the
sub-menu boxes will show the resulting AWS measurements as
follows:
- 65 -
IR = IL – RG - AF
(Indication Rating = Indication level – Reference Gain – Attenuation Factor)
Where:
IL: Indication Level is the dB setting required to bring an
indication to the reference level.
RG: Reference Gain is the dB setting of the calibrated reference
indication as a function of the reference
standard and probe being employed.
AF: Attenuation Factor is the attenuation factor required by the
AWS standard and is: Depth in inches
minus 1, divided by 2 and then rounded to
the nearest ½ dB.
IR: Indication Rating is the difference in dB between the
indication and the reference gain with
attenuation factor correction.
It is not necessary to bring the indication to the reference level to
obtain the correct measurement information as the DFX-244 adjusts
for gain offset. However, to ensure the best accuracy of calculation, it
is advised to adjust the indication to be above 40% and below 100%
of full screen height. In addition, in the AWS mode, gain offset is
shown as +/- dB from reference as opposed to absolute gain.
6.4.6 A-LOG, A-Scan Storage

The A-LOG feature provides for storage, recall and printing of
A-Scans with all of the instrument settings. Up to 100 A-Scans and
their settings can be stored. This feature is useful to record an
indication for later review or for printing a hardcopy. In addition,
recalling an A-Scan and its settings will allow for easy follow-up
inspection of the same indication on the test piece. Simply unfreeze
the display after recalling and the DFX-244 is ready to repeat the
same inspection. Be sure to use the same transducer that was used
for the original recording.
To store an A-Scan:
- 66 -
2. From the MEMORY menu, select the A-LOG feature.

3. Select the STORE parameter by pressing the white button next to
it and use the INC and DEC buttons to select a store location. The
STATE parameter shows whether the store location is VALID
(used) or EMPTY. Be careful not to store over a Valid location
unless you want to erase what is there and replace it with the
current A-Scan and settings.
and use the DEC button to select STORE.
5. Obtain a desired echo from a discontinuity or reference block.
6. Optionally press the FZ/PK button to freeze the display before
storing it. If you regularly use the FZ/PK button to freeze the
display before storing it, you can obtain the echo first (Step 5) and
then go to the A-LOG menu and select the location and function
(Steps 2-4).
7. Press the ACPT button to store the waveform and instrument
settings. At the CONFIRM prompt, press the ACPT button again
to store the A-Scan or press the INC button to continue without
storing the A-Scan.
8. After pressing the ACPT button a second time, the NOTES
window opens automatically to allow the creation of any desired
notes for the stored A-Scan and its settings. See the section
Adding NOTES to PANEL and A-LOG sets on page 53. When
finished with adding notes, press the white button next to the
STORE parameter to return to the A-LOG menu.
To recall an A-Scan:
1. From the MEMORY menu, select the A-LOG feature.
it and use the INC and DEC buttons to select the desired store
location to be recalled. The STATE parameter shows whether the
store location is VALID (used) or EMPTY.
and use the DEC button to select STORE.
- 67 -
4. Press the ACPT button to recall the waveform and instrument

settings. This may take a couple of seconds at which time the
instrument will return to the main menu and the display will be in
Freeze mode. To return to normal testing mode with the recalled
settings, press the FZ/PK button twice.
5. Alternately, you may review the notes pages stored with each
A-LOG to determine which set you want to recall. Set the MODE
to LIST and using the STORE parameter, move through each one
to view the notes page. When the desired A-LOG is found, press
the ACPT button to recall it. To remove the notes review window,
set the MODE back to STORE, RECALL or DELETE.
To delete a stored A-Scan, follow the steps above but set the MODE
parameter to DELETE and then press the ACPT button. At the
CONFIRM prompt, press the ACPT button again to delete the A-Scan
or press the INC button to continue without deleting the A-Scan.
To edit notes in an A-LOG, press the white button next to the EDIT
NOTES parameter and then follow the instructions in the section on
Adding NOTES to PANEL and A-LOG sets on page 53.
NOTE: When notes are displayed, the menu cursor buttons are
disabled. Switch off list mode to change to another menu.
6.4.7 REF, Reference Waveform Comparisons

This feature allows the user to select a waveform from one stored in
the A-LOG menu, and to display this reference waveform on the
graticule along with the real time waveform. This makes easy
comparisons possible between an expected signal response (the
reference waveform) and that obtained from the test piece.
To recall an A-Scan as a reference waveform:
1. In order for a reference waveform to be recalled, the required
trace must first be stored into an A-LOG store.
2. From the MEMORY menu, select the REF feature.
it and use the INC and DEC buttons to select a store location. The
STATE parameter shows whether the store location is VALID
(used) or EMPTY.
- 68 -

and use the DEC or INC button to select RECALL. If set to LIST,
the note associated with the reference waveform will be displayed.
5. Press the ACPT button to display the reference waveform on the
graticule. The reference waveform will be a different colour as
compared to the real time waveform, depending on which colour is
chosen.
6. To remove the reference waveform, set the MODE to OFF and
press the ACPT button.
NOTE: When the reference is recalled, no setting parameters are
changed. Therefore, if the RANGE or DELAY are subsequently
changed, the reference signal will not match the real time waveform.
This means that the RANGE and DELAY used for storing the
reference waveform in A-LOG must match that used for the
comparison of real time signals to the reference waveform.
The reference waveform cannot be displayed in video colours 0 and 1
(All white and all white).
6.4.8 Contour & Peak Echo Dynamics

During flaw testing it is sometimes difficult to determine the exact
peak of a discontinuity echo due to its geometry, coupling and surface
anomalies. The DFX-244 incorporates a unique Peak feature that,
while activated, stores all of the signal excursions on the display using
a “fill” technique.
In addition to providing an effective method of capturing peak echo
information, the Peak mode is useful for crack tip diffraction methods
in angle beam weld inspection. In the case of crack tip diffraction, the
extent of a crack type discontinuity can be inferred by the positional
excursions of the signal as it reflects from both tips of a crack. Thus,
as the transducer/probe is moved past the indication, the signals will
be “filled-in” on the display and the resultant width of the envelope or
“echo dynamic pattern” will infer the crack length.
- 69 -
To use the echo dynamic pattern feature, position the

transducer/probe just off one side of the indication. Press the FZ/PK
button twice to activate the Peak mode which is indicated by a box
displaying PEAK below the graticule. Move the transducer/probe past
the indication to fill-in the envelope pattern. In the case of angle beam
testing, it is advisable to rotate the transducer/probe slightly and move
Figure 18 – Peak Echo Dynamics
it from side to side while moving forward past the indication. This will
assure the capturing of all amplitude and distance information. An
example of peak echo mode capture is shown in Figure 18.
To return the display to normal mode, press the FZ/PK button a third
time. This will erase the envelope pattern and return the instrument to
the instantaneous mode of display. While the display is showing the
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dynamic echo pattern, it is possible to record the A-Scan as indicated

in Section 6.4.5 on page 65.
6.5 Thickness Gauging

6.5.1 Basic Thickness Gauging
Accurate and reliable thickness gauging requires three important
considerations: a) proper transducer/probe selection, b) an accurate
reference block of the same material as that being tested, and c)
proper calibration of the instrument. The following are the basic
guidelines for accurate thickness gauging but the user is referred to
Section 1.2 on Operator Training for advice on seeking in-depth
training.
There are three types of transducer/probes used in ultrasonic
thickness gauging, all employing the straight or longitudinal beam
method. The single element contact transducer/probe is used for
general purpose thickness gauging where material thickness is
generally expected to be above 2.5mm. The delay line contact
transducer/probe is used for measuring thin material down to 0.5mm
where the surfaces are clean and parallel. The dual element contact
transducer/probe is used for moderately thin materials down to about
1.0mm where the surfaces may be irregular and not necessarily
parallel. The dual transducer/probe is most commonly used for
corrosion thickness inspection where its ability to obtain echoes from
pitting is superior. Nevertheless, dual transducer/probe inspection on
corroded materials is nowhere near as accurate as single element
and delay line inspection, due to the nature of the material under test.
In addition, the dual element transducer/probe usually incorporates a
slight included angle between the transmit and receive side (V-path),
resulting in a small non-linearity of the measurements. For this
reason, dual transducer/probe thickness testing is usually calibrated
and performed over a limited thickness range.
- 71 -
Regardless of the type of transducer/probe used, it is important that it

be specifically designed for thickness gauging. This means that it
must have broadband or highly damped characteristics that provide a
sharp leading edge. Otherwise, amplitude variations of the signals
can cause half-wavelength errors due to smaller ”build-up” echoes as
shown in Figure 19 and Figure 20.
Figure 19 – Broadband Echo Figure 20 – Narrowband Echo
The next requirement for thickness gauging is a calibration or

reference block. This block should be made of the same material as
the components to be inspected. In other words, it should have the
same sound velocity and attenuation characteristics. The calibration
block should have parallel machined surfaces representing the
thickness range to be inspected. Although two thicknesses
representing the minimum and maximum values is sufficient for
calibration, it is recommended that the calibration block have four
sections covering the range anticipated. This will allow for verification
of the calibration.
It is possible to calibrate the DFX-244 using a generic test block and
only one known sample thickness of the material under inspection.
This is a less desirable method because there is no way of verifying
the calibration. With this method, the calibration would first be
performed on the generic test block which would have three to four
sections covering the expected thickness range. Essentially,
calibrating on the generic block would set the transducer/probe zero
point. Then the DFX-244 Velocity would be adjusted on the known
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sample of the test material until the thickness readout matched the
known thickness. This establishes the sound velocity for the test
material.
Finally, it is necessary to establish the proper calibration of the DFX-
244 in order to assure accurate and reliable thickness testing. The
essence of this calibration is to set the pulser and amplifier
characteristics to provide sharp leading edges on the echoes. The
following are the essential steps for basic thickness gauging:
1. Select the appropriate broadband transducer/probe and
calibration block that matches the material under test.
2. In the CAL menu, select the proper Range and Delay so that
echoes from the range of thicknesses can be viewed.
3. From the AMP menu, set the Frequency to the nominal value of
the transducer/probe and set the detection mode to RF.
4. Using the S/D button, set the Mode to Single for delay line and
single element transducer/probes and to Double for dual element
transducer/probes.
5. Couple the transducer/probe to a mid-range thickness section on
the calibration block and obtain an echo.
6. Using the RF display, verify that the probe has good broadband
echo characteristics. The echo should be narrow with a minimum
of cycles and a strong first half-cycle, either positive or negative.
Ideally, one side of the RF echo should have a first half-cycle
which is higher in amplitude than the remaining half-cycles.
7. From the AMP menu, set the Detect parameter to either -VE or
+VE, depending on which half of the RF provides the best half-
cycle as determined in step 7 above.
8. Adjust the gain to set the echo at about 80% amplitude and
increase the Reject parameter to remove any undesirable noise
from the baseline.
9. From the GATE1 menu, set the gate to ON +VE and adjust the
Start and Width so that the gate encompasses the thickness
range of interest. Place the transducer/probe between the thin and
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thick area on the calibration block to verify proper coverage.

Adjust the Level parameter to about 30% of full screen.
10. From the MEAS menu, set the Mode parameter to DEPTH and
the Trigger parameter to FLANK.
11. If desired, set the T-Min parameter to ON so that the thinnest
reading obtained will be held in the display. Reset by using the
INC or DEC buttons.
12. If desired, set the HUD parameter to ON to display the thickness
in a large window at the top right of the graticule.
13. To calibrate the DFX-244 for thickness readings, follow the steps
outlined in Section 6.5.2 below. Alternately, you can use an
iterative process from the CAL menu of setting the Zero on the
thinnest calibration block sample and the Velocity on the thickest
sample. Using this technique, you must repeat Zero to Velocity
several times until the two values are correct.
When using a delay line transducer/probe, there are two modes of
measurement: a) Interface to first return echo, and b) multiple echo
mode which usually measures from the first to the second return
echoes after the interface echo.
1. Follow steps 1-9 above.
2. From the MEAS menu, set the Mode to E-E for echo to echo
measurement. You will notice that a second gate bar appears
below Gate1 and that its start point is slightly to the right of Gate1.
This is the Blanking gate explained below.
3. For measuring from interface to first echo, position the start of
Gate1 before the interface echo. Using the Blank parameter in the
MEAS menu, position the start of the second gate just after the
interface echo but before the thinnest expected first echo.
4. For measuring multiple echoes after the interface, position the
start of Gate1 just after the interface echo. Using the Blank
parameter in the MEAS menu, position the start of the second
gate just after the first echo but before the thinnest expected
second echo.
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5. The Blank parameter determines the blanking or starting position

of the second gate relative to the starting position of Gate1. This
prevents noise and spurious echoes associated with the interface
or first echo from terminating the measurement and producing a
false reading.
For storage and printing of thickness readings, refer to Sections 6.5.4
on page 78, Section 6.5.5 on page 79 and Section 6.5.6 on page 81.
6.5.2 A-Cal
A-CAL is an automated calibration feature for thickness gauging
applications or when measuring depth to an indication in flaw testing.
In order to achieve proper calibration for measuring time-of-flight in
ultrasonic testing, two factors must be known; the velocity of sound in
the material under test, and the offset of the transducer/probe caused
by wearfaces and phase shifts.
Conventional thickness calibration techniques usually require setting
the zero (offset) and span (velocity) using an iterative technique. This
means alternately placing the transducer/probe on a thin sample to
set the zero and a thick sample to set the span. This process is
repeated several times until both readings are correct. The reason for
this is that raising the span will also raise the zero.
The A-CAL feature automates this process so that only two readings
are required, one on the thin sample and one on the thick sample.
The DFX-244 then calculates the correct offset and span factors and
sets the velocity and zero. Any time the test material is changed
(velocity) or the transducer/probe is changed (zero), this procedure
must be repeated. Using this calibration function results in faster
calibration of the instrument and more accurate measurements.
The A-CAL calibration procedure is as follows:
1. Select a test block of the same material as that being inspected,
with reference thicknesses covering the minimum to maximum
thickness expected in the test parts. The difference between the
thick sample and the thin sample should be no less than five to
one.
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2. From the Main menu, select CAL and adjust the RANGE and
DELAY so that the thin and thick reference echoes show on the
display.
3. From the Main menu, select GATE1 and place the STATE in ON
+VE. Adjust the START and WIDTH of the gate to encompass the
echoes from the thin and thick samples.
4. From the Main menu, select MEAS and place the MODE to
DEPTH.
5. From the FN menu, select the A-CAL menu.
6. Select DIST1 using the adjacent white button. Adjust the value
using the INC and DEC buttons to the known thickness of the thin
sample.
7. Place the transducer/probe on the thin reference sample and
obtain an echo. Adjust the gate start if necessary to obtain a
distance readout of the echo.
8. Press the ACPT button to log the echo.
9. Select DIST2 using the adjacent white button. Adjust the value
using the INC and DEC buttons to the known thickness of the
thick sample.
10. Place the transducer/probe on the thick reference sample and
obtain an echo. Adjust the gate width if necessary to obtain a
distance readout of the echo.
11. Press the ACPT button to log the echo.
12. Select ACCEPT CAL using the adjacent white button.
13. Press the ACPT button. The transducer/probe zero and velocity
will now be adjusted.
The DIST1 and DIST2 values can be stored when the calibration
information in PANEL and A-LOG functions are stored. This
overcomes the need to set these values and gate positions every time
a calibration is performed. Once established, all that is required is to
obtain each echo and press ACPT, and then press ACPT on
ACCEPT CAL and the instrument is calibrated.
- 76 -
If a delay transducer/probe is used, set DIST1 to 0.0 and use the

interface echo as the thin reference echo. The instrument will then set
the transducer/probe zero to compensate for the delay line.
Once calibrated, it might be desirable to record the velocity and zero
values from the CAL menu for future reference. Note that this is a
convenient method for determining the velocity of sound in an
unknown material. Once the DFX-244 is calibrated on a known
material, all that needs to be known is one fixed thickness point and
the velocity can be determined.
6.5.3 TCG for Reliable Gauging

As previously mentioned, reliable thickness gauging requires that the
shape of the echoes be consistent with sharp leading edges. When
measuring the thickness of material with higher than normal
attenuation to ultrasonic energy or a wide thickness range, it is difficult
to maintain proper characteristics of the echoes. One way to
overcome this is to use the Time Corrected Gain feature of the DFX-
244. TCG can improve the reliability of thickness gauging by
increasing the amplitude of echoes from thicker sections of the test
material so as to maintain the correct detection threshold on the
leading edge. The objective is to equalize the amplitude of echoes
over the entire thickness range to be expected.
To set up the TCG feature, refer to Section 6.4.3 on page 59.
6.5.4 T-LOG Thickness Storage (Numeric)

The T-LOG menu provides a convenient method to store thickness
readings for record keeping and analysis. The maximum number of
readings that can be stored is 2,000. When using the default Numeric
mode selected from the T-FN menu, each thickness reading is stored
under a three level code. The top level is the BLOCK number which
can be 1 to 14. This is followed by the LOCation number which can be
set between 1 and 2,000. Last is the reading number (NO) itself which
can also be between 1 and 2,000.
This hierarchy of coding for a thickness reading allows readings to be
associated with physical characteristics of the component under
inspection. Thus, it is up to the user to devise a scheme of assigning
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blocks, locations and readings to the inspection, keeping in mind the

maximum combination of 2,000.
To store readings, follow these simple steps:
1. Set up the instrument for the thickness measuring mode as
described in Section 6.5.1 on page 72.
2. From the MEMORY menu, select the T-LOG menu.
3. Use the corresponding white buttons to select BLOCK, LOC, and
NO in turn and INC or DEC the value to obtain the desire location
number for storing the thickness.
Note: If a value shows in the THICK box, then a reading has already
been stored in that location. Continuing will overwrite that value
with the new thickness reading.
4. Obtain the desired thickness reading and press the green ACPT
button to log the reading. Notice that the NO value automatically
increments to the next reading number.
5. To review a reading, select the desired BLOCK, LOC and NO to
identify the location. The value in the THICK box shows the
reading stored for that location. To print or delete readings, use
the T-FN menu.
6.5.5 T-LOG Thickness Storage (Sequential & Download)

The Sequential mode of thickness storage allows readings, locations
and notes to be transferred between a computer and the DFX-244.
Typically, the user would create a thickness location sequence on the
computer and download it to the DFX-244, which can then be used to
guide the operator when collecting thickness readings. The collected
readings could then be uploaded to the computer for further analysis
and storage, releasing the DFX-244 to collect readings from another
component. When a component is re-inspected, the historical
readings can be downloaded to the DFX-244, providing the operator
with an instant check of thickness variation while collecting new
readings. The new readings can then be downloaded back to the
computer for analysis, storage and printing.
- 78 -
To use the Sequence/Download mode, follow these steps:

1. Using suitable software or text editor, generate a location
sequence on the host computer. Each location is comprised of a
location number (1 to 2000) and a text string of 32 characters. The
text strings of 32 characters are subsequently displayed on the
DFX-244 as two lines of 16 characters each in a window at the top
left of the screen, when the DFX-244 is in the Sequence mode.
Generally, the first 16 characters are used to identify the location
so as to direct the operator to the proper point for a thickness
reading. The second 16 characters are for general use and can be
used for the historical readings or baseline readings if this is the
first inspection of the component. Character position 23 is
reserved for and identifies the PANEL store (1 to 20) to RECALL if
AUTO-SET mode is ON.
Note: The protocol for the location sequence and methods for
transferring the data to the DFX-244 are fully described in the
Communications Manual, stock number 147239.
Note: A software program (WINDFD) is available from Dakota
Ultrasonics to perform the programming of sequences and the
uploading and downloading of data to the DFX-244.
2. Turn on the Sequence mode by pressing the MEM button,
selecting the T-FN menu using the green arrow buttons, pressing
the white select button next to the ID MODE option, and using the
INC button to select the SEQUENCE mode. Once selected, the
graticule will reduce in size and a window is drawn on the top left
of the screen next to the HUD window which is automatically
switched on. The location and thickness data will be shown in the
window if any data has been downloaded to the DFX-244.
Alternately, the Sequence mode can be turned on by a command
from the host computer.
3. Set up the instrument for the thickness measuring mode as
described in Section 6.5.1 on page 72.
4. From the MEMORY menu, select the T-LOG menu.
5. If Auto Calibration is desired, press the white select button next to
the AUTO SET option, and using the INC button, select ON.
AUTO SET can only be used if the downloaded location data
- 79 -
contains a PANEL store value (A to T) at character position 23 in

the data text string, corresponding to a PANEL store location (1 to
20).
Note: If a value shows in the THICK box, then a reading has already
been stored in that location. Continuing will overwrite that value
with the new thickness reading.
6. Obtain the desired thickness reading and press the green ACPT
button to log the reading. Notice that the LOC value automatically
increments to the next reading number. Any historical reading
downloaded from the computer will show in the window on the
screen for comparison purposes.
7. To attach one of the four available notes with the reading, press
the white select button next to the NOTES option, and using the
INC or DEC buttons, select OBSTRC (obstruction), PITTING,
POOR S/C (poor signal/couplant), or NO BWE (no backwall
echo).
8. To review a reading, select the desired LOC number to identify the
location. The value in the THICK box shows the reading stored for
that location. To print or delete readings, use the T-FN menu.
9. Once all of the readings for a component have been taken, they
can be uploaded to the computer for further analysis and storage.
The location data transferred is the 32 character string associated
with the location, the thickness value, the units of measure, and
the notes. Locations with a blank note will contain the characters
“OK.”
6.5.6 T-FN Thickness Log Editing and Printing

The T-FN menu provides capability for the printing and deletion of
thickness readings stored with the T-LOG feature. With the T-FN
feature, it is possible to print or delete a single Location reading, all
Locations within a Block, or all Blocks.
To print a single Location:
1. Make sure that the printer is properly connected to the serial port,
switched on and on-line.
- 80 -
2. Select the T-FN menu from the MEMORY menu.

and pressing the INC button to select PRINT mode.
4. Select the desired Block number by pressing the white button next
to the BLOCK parameter and using the INC or DEC buttons.
5. Select the desired Location number by pressing the white button
next to the LOC parameter and using the INC and DEC buttons.
6. Press the ACPT button to print the thickness reading for the
selected Location.
To print all Locations in a single Block:
and pressing the INC button to select PRINT mode.
4. Select the desired Block number by pressing the white button next
to the BLOCK parameter and using the INC or DEC buttons.
5. Set the Location number to ALL by pressing the white button next
to the LOC parameter and using the DEC button if not already
selected..
6. Press the ACPT button to print the thickness reading for the
selected Block.
To print all Blocks and all Locations:
3. Select the MODE parameter by pressing the white button adjacent
to it and pressing the INC button to select PRINT mode.
4. Set the Block number to ALL by pressing the white button
adjacent to the BLOCK parameter and using the DEC button if not
- 81 -
already selected. The Location number will be automatically set to

ALL
5. Press the ACPT button to print the thickness readings for all of the
Blocks and Locations.
To delete any or all Locations or Blocks, follow the instructions above
for printing except set the MODE function to DELETE instead of
PRINT.
- 82 -
7. Power Supply
The DFX-244 is offered with a variety of methods to power the
instrument, the most common of which is the NiCd rechargeable battery
box shown in Figure 21 below, and its corresponding charger. The
power box is attached to the rear of the DFX-244 by means of four
thumbscrews and connects to the instrument with the 9 pin D
connector.
Figure 21 – NiCd Battery Box
7.1 NiCd Battery Pack

When fully charged, the NiCd battery box should enable the unit to be
operated for 8 hours, under typical operating conditions. The NiCd
battery box can be charged while mounted to the DFX-244 through the
Lemo connector on the front panel. Alternately, the NiCd battery box
can be charged separate from the DFX-244 by using its own Lemo
connector shown in Figure 22 below, thereby allowing continual
operation of the DFX-244 through the use of multiple packs.
- 83 -
7.2 Battery Charging/Discharging

The CH5OO battery charger shown in
Figure 23 below is suitable for use with
mains supply from 85 to 26Ovolts AC. The
green LED on the charger illuminates to
indicate power on. The CH5OO "Intelligent"
charger offers three modes of battery
charging with illuminating red LED’s to
indicate the mode of charge:
1. Trickle Charge
The charger automatically
charges at a trickle charge
rate when connected to the
flaw detector. This is
indicated by the illuminated
red 'trickle' LED. The
batteries cannot be
overcharged at the trickle
charge rate and this mode is
automatically selected after
normal charging when the
batteries are fully charged.
The trickle charge current is
120ma.
2. Normal Timed Charged
Pressing the CHARGE key
initiates a timed charge at
the 14-hour charge rate,
indicated by the illuminated
red 'charging' LED. When fully
recharged, the red 'full' LED
will illuminate and the
charger reverts to the trickle
charge mode and red 'trickle'
LED illuminates. The normal
charge current is 400ma.
3. Discharge/Charge Cycle
The discharge function
prevents NiCd memory lock
caused by continuous
recharging of partially
- 84 -
Figure 22 – NiCd
Battery Connectors
charged batteries. It is recommended that this

function be used about twice per month.
Press the DISCHARGE key to initiate the discharge-
charge cycle, indicated by the illuminated red
'discharge' LED. The batteries will be discharged
and then automatically recharged at the normal 14-
hour timed charge rate. When fully recharged, the
red 'full' LED will illuminate and the charger
reverts to the trickle charge mode and red
'trickle' LED illuminates.
Figure 23 – Battery Charger
7.3 Servicing the NiCd Battery Pack

The NiCd cells are retained within the battery pack by a pre-formed
plastic cover, which is released by two star headed screws when the
box is removed from the instrument. The unit is supplied with a battery
stack of ten rechargeable NiCd cells.
- 85 -
Access to the Power Fuse is obtained by removing the battery box. The
fuse holder is mounted in the battery box end panel as shown in Figure
22 above. Replace with a 3.15A 20mm type.
NiCd cells have a useful life of several hundred charge cycles but
sometimes they will spontaneously collapse in which case the operation
time will be severely reduced in spite of performing a discharge-charge
cycle. Each cell is separately removable and is retained by electrical
spring contacts. The cells can be replaced but the following precautions
must be observed. Note that the optional fast charge pack has no user
access.
Figure 24 – NiCd Cells in the Battery Box
- 86 -
a WARNINGS a
Observe Cell Polarity When Inserting Cells.

At The End Of The Battery Life, All NiCd Cells Should Be
Replaced Simultaneously With New Cells.
Do Not Mix NiCd Cells Of Different Type Or Manufacture.
Violation Of This May Cause Irreversible Damage To The
Battery When Charged.
Do Not Short Circuit, Dismantle Or Incinerate The Cells.
Alkaline Cells Should Never Be Fitted To A Battery Pack For
NiCd Cells Because It Is Dangerous If An Attempt Is Made To
Charge Alkaline Cells.
7.4 Fast Charge Pack

A fast charge battery pack is offered as an option. This is a sealed
battery pack with no user access. The charger will automatically detect
this pack and Normal battery recharge will be performed in 2 hours. The
fast charge current is 2.0A. If the DFX-244 is switched on with the
battery charger connected, charging will take place at the 14 hour rate.
7.5 Alkaline Cells

Dakota Ultrasonics Plc. provide a battery pack for the use of Alkaline
cells.
7.6 Mains Pack

A mains pack or battery eliminator is available as an option if the DFX-
244 is to be used in continuous mains operation mode.
NOTE: If the unit is permanently used with the NiCd battery pack from
the mains in trickle mode, the batteries will loose their ability to hold a
charge. Occasional use in this way will have little effect and the
“Discharge” function can be used to restore normal battery function. If,
however, the unit is permanently powered from the mains, the mains
pack is a better choice and provides a more compact installation.
- 87 -
7.7 Optional Power Packs

Description Part No.
Battery Pack for NiCd cells W-25
Battery Pack for Alkaline cells W-23
Fast Charge Battery Pack W-24
Mains Unit to replace battery packs W-29
- 88 -
8. Interface Connections
The various interface connections are provided in a sealed
compartment under a spring loaded door on the top of the DFX-244.
The connections are shown in Figure 25 below and described on the
following pages.
Figure 25 – DFX-244 Interface Connectors
To open and close the compartment door, press firmly in the middle of
the door and release.
- 89 -
8.1 Interface Port

Pin Type Signal Pin Type Signal
1 - Digital GND 20 - Digital GND
2 I/O PA0 21 I/O PB0
10 I/P STROBE 1 29 I/P STROBE 2
11 O/P SYNC 30 O/P ACK/WR
12 O/P AL0 (Alarm 0) 31 O/P AL1 (Alarm 1)
13 I/O RELAY0 32 I/O RELAY1
14 I/O SPARE 4 33 I/O SPARE 3
15 I/O SPARE 5 34 I/O SPARE 2
16 I/O SPARE 6 35 O/P POUT2
17 O/P POUT1 36 I/O SPARE 1
18 I/O SPARE 7 37 - Analogue GND
19 - Analogue GND
In the foregoing table, the following conventions apply:
I/O is an Input/Output
I/P is an Input
O/P is an Output
POUT1 is the distance proportional output corresponding to O/P1 in
the P_OP menu. POUT2 is the amplitude proportional output
corresponding to O/P2 in the P_OP menu. The signals vary between
0-2 volts and 0-10 volts according to the potentiometer 1 and 2
position.
The SYNC TTL output occurs after each display update. It can be
used to synchronize an external device to the update rate, i.e. 50 or
60Hz in NORMAL mode and 100 or 120 Hz in FAST mode.
- 90 -
AL0 and AL1 are the TTL logic alarm outputs for gate 1 and gate 2
respectively. They are 5 volt CMOS outputs, with the high state
representing the alarm triggered and the low state representing the
alarm off. They correspond to the LED’s on the front panel and they
are switched at the update rate, i.e. 50 or 60Hz in NORMAL mode
and 100 or 120 Hz in FAST mode. If the gate STATE is in the –VE
position, the alarms trigger in a negative logic manner, i.e. a signal
falling below the gate threshold will trigger the alarm.
RELAY0 and RELAY1 correspond to the alarms for gate 1 and gate 2
respectively and they close when the alarm is triggered. If the gate
STATE is in the –VE position, the alarms trigger in a negative logic
manner, i.e. a signal falling below the gate threshold will trigger the
alarm. These lines can take up to 2 amps and 200 volts.
The digital outputs PA and PB are in hex format in the range of 0-200
where PA is the distance output and PB is the amplitude output. The
ACK/WR signal can be used to strobe the PA and PB digital outputs.
8.2 RS232
The RS232 port on the DFX-244 allows for bi-directional
communication between the instrument and a personal computer.
Various control commands are available within three general
categories; Write parameter values, Read parameter values, and
Action commands. The Write and Read parameters allow the
computer to set a parameter and to read a parameters’ current
setting. The Action commands provide special functions such as
waveform and thickness logging transfer.
The communication handshake is as follows:
Baud rate 9600
Parity None
Data Bits 8
Stop Bits 1
Handshake Hardware
The cable connections for the RS232 port are as follows:
SS230 PIN PIN PC
NC 1 1 DCD
- 91 -
RD 2 2 RD
TD 3 3 TD
NC 4 4 DTR
GND 5 5 GND
NC 6 6 DSR
NC 7 7 RTS
CTS 8 8 CTS
NC 9 9 R1
A communications cable can be ordered form Dakota Ultrasonics

under part number 152120. A separate Communications manual (part
number 147239) is available that describes all of the protocol in detail.
8.3 RF Out
The RF output is an 80 mv peak to peak signal corresponding to the
RF display. It can be used for oscilloscope viewing of the signals and
the SYNC output can be used for synchronization. The connector is a
Lemo 00.
8.4 Composite Video

The composite video output enables display of the A-Trace on a
compatible television monitor. The output is either NTSC (USA) or
PAL (UK/Europe) composite video, depending on the selection in the
Video menu under the FN menu. The screen update rate is 50Hz in
PAL and 60Hz in NTSC. The screen will be slightly brighter in the
NTSC mode.
- 92 -
9. Specifications
Test Range: 0.2in to 400in (5-10,000mm) at steel velocity. Variable in
1,2,5, sequence, or continuously in 0.05in (1mm)
increments.
Velocity: 1000m/s to 9,999m/s continuously variable.
Probe Zero: 0 to 999.9999µs, continuously variable.
Delay: Calibrated delay from 0in to 200in in 0.05in steps at steel

velocity (0-5,000mm. in 0.1mm steps).
Gain: 0 to 110dB. Adjustable in 0.5,2,6, 14 and 20dB steps.

Direct access to gain control at all times.
Test Modes: Pulse echo and transmit/receive.
Pulser: Fixed square-wave pulser of 40ns minimum to 250ns

maximum duration. 185V peak amplitude with rise/fall
times <20ns into 50 ohms.
P.R.F. Adjustable maximum of 150, 250, 500, or 1000 Hz.
Update Rate: 60Hz (NTSC Mode), 50Hz (PAL Mode)
Rectification: Full wave, positive or negative halfwave and unrectified rf.
Frequency Four (4) narrow bands centered at 1MHz, 2MHz, 5MHz,

Range: and 10MHz. Broad band at 1.7MHz to 14MHz (-6dB).
System Vertical ±1% Full Screen Height (FSH). Amplifier accuracy

Linearity: ±0.1dB. Horizontal ±0.4% Full Screen Width (FSW).
Reject: 50% suppressive reject. LED warning light when selected.
Units: Inches (in), metric (mm) or microseconds. Selected from

menu.
Display: Bright colour TFT LCD panel. A-Scan area 255 x 200
pixels. Total display area 102.7 x 77.0mm, 320 x 256
pixels. Eight (8) colour scheme options. Brightness
variable up to 300cd/m2. No parallax error. Removable
screen for easy cleaning.
- 93 -
Gate Monitor: Two fully independent gates for echo monitoring and
thickness measurement. Start and width adjustable over
full range of unit, amplitude variable from 0 to 100% FSH.
Bar presentation. Positive or negative triggering for each
gate with visual and audible alarms.
Measurement Mode 1 - Signal monitor.

Modes: Mode 2 - Depth and amplitude of first signal in gate.
Mode 3 - Echo-to-echo distance measurement.
Mode 4 - Trigonometric display of beam path, surface
distance and depth of indication.
Mode 5 - T-Min mode for holding minimum thickness
reading.
Resolution to 0.01mm (0.001in) for distance measure-
ment, or 1% FSH for amplitude measurement. Large
display of measurement at top of A-Scan display.
Measurement mode selectable between peak and flank.
All measurement functions available in unrectified rf mode.
Gate Expands range to width of Gate 1.

Expansion:
A-Scan Maximum of 50 waveforms stored with complete panel
Memory: settings. Waveforms may be recalled on display, printed or
transferred via RS232 serial interface.
Panel Twenty (20) stores for retaining calibrations.

Memories:
Thickness Storage for 2,000 thickness readings configured into
Logging: Block/Location/Number. Calibration settings stored with
each Block. Maximum number of Blocks is 14. Unlimited
Location/Number values, maximum combination of 2,000
readings. Readings may be reviewed, edited and printed
as required.
DAC: DAC curves may be entered and digitally drawn on the

display. Reference, -6dB, -12dB, -14dB curves may be
selected. Selection of DAC curve or gate for alarm outputs
and height measurement. DAC parameters stored with
Panel Memory. Curves comply with ASME and European
Standards. The gates are operational in the DAC mode.
- 94 -
TCG Time Corrected Gain curves may be entered and digitally

drawn on the display. The dynamic range of the T.C.G. is
40dB. T.C.G. parameters are stored in panel, A-Log and
memory.
AWS The AWS mode is used when inspecting welds in

accordance with the American Welding Society’s
Structural Welding Code, ANSI/AWS D1.1-94 to
automatically calculate the Indication Rating as defined by
the code.
Special Display freeze for capturing current A-Scan image. Peak

Functions: memory for echo-dynamic pattern determination in
accordance with BS3923. Help key for instant operator
guidance on using the DFX-244.
Outputs: Full bi-directional serial interface to transfer parameters,

thickness readings and waveform memories. Composite
video, full PAL or NTSC compatibility. Analogue
proportional output for connection to X-Y plotter or other
external equipment. Proportional outputs programmable to
distance or amplitude of signal. Unrectified rf. signal 80mV
peak to peak. Synchronization output for start of scan.
Gate trigger output on relay contact.
Power 10 'D' size NiCd or alkaline cells. Eight (8) hours duration
from fully charged NiCd cells. Battery duration is a function
of display brightness chosen, battery condition and
ambient temperature.
LED indication of low battery status. Recharge time is
fourteen (14) hours. A battery pack, which charges in two
(2) hours, is available as an option.
Charger: Universal mains input 85-260 volts A.C. Auto timed

charge. Two (2) hour fast charge for special battery pack.
Charger operates unit direct from AC mains.
Probe BNC or LEMO (factory option)

Sockets:
Temperature: Operating: 14 to 131°F (-10 to +55°C)
Survivable: -4 to 158°F (-20 to +70°C)
Storage: -40 to 167°F (-40 to +75°C)
- 95 -
Size: 9.3 x 5.3 x 7.9in (237 x 135 x 200mm)
Weight: 10.8 lbs (4.9 Kgs) with NiCd Cells

9.4 lbs (4.3Kgs) with Dry Cell Pack
- 96 -
10. Warranty
Warranty/Defects After Delivery: Immediately upon receipt of the
goods the buyer is required to check the goods carefully and
thoroughly. In order to benefit from the guarantee, any defect in the
product should be immediately reported in writing to Dakota Ultrasonics.
Dakota Ultrasonics will make good by repair or by the supply of a
replacement or by equivalent adjustment of the price at our sole option,
any defects which under proper use appear in the goods within the
period of twenty-four (24) calendar months after the goods have been
delivered and which arise solely from faulty design, material or
workmanship, provided that the goods are carefully packed and
promptly returned by you free to the Dakota Ultrasonics works unless
otherwise arranged. Said goods should be covered while in transit to us
and must be accompanied by a written statement detailing the precise
nature of the fault and the operating conditions under which the fault
occurred. The repaired goods will be returned by Dakota Ultrasonics
free of charge.
Dakota Ultrasonics shall not be under any liability in respect of defects

in goods delivered or for any injury damage or loss resulting from such
defects and our liability under this Clause shall be in lieu of any
warranty or condition implied by law as to the quality, fitness or
merchantability for any particular purpose of such goods.
- 97 -
11. Index
BLANK · 36, 37, 50
BLOCK · 47, 48, 49, 51, 78, 79, 82, 83
A BNC · 26, 98
Button · 7, 23, 24, 25, 26, 27, 28, 30, 33,
A-CAL · 38, 50, 64, 76, 77 36, 37, 38, 39, 40, 41, 42, 43, 44, 47,
Acoustic · 11 52, 53, 54, 56, 57, 58, 60, 61, 62, 64,
Acoustic Impedance · 11 68, 69, 70, 71, 74, 75, 77, 79, 80, 81,
Alarm Outputs · 93, 97 82, 83
Alkaline cells · 89, 90 Buyer · 99
A-LOG · ii, 45, 46, 51, 53, 54, 56, 67, 68,
69, 70, 77
American Society of Nondestructive C
Testing · 2
American Welding Society · 2, 40, 65, 97 CAL · 28, 30, 33, 38, 56, 74, 75, 77, 78
Amplifier · 9, 95 Calibration · 3, 27, 28, 29, 30, 31, 38, 39,
AMPlifier Menu · 34 40, 44, 45, 48, 49, 52, 53, 54, 55, 56,
Amplitude Response · 3, 60 57, 60, 64, 67, 69, 72, 73, 74, 75, 76, 77
Angle Beam · 18, 19 Calibration Block · 3, 29, 30, 31, 38, 55,
A-Scan · ii, 9, 25, 26, 33, 34, 35, 36, 37, 56, 64, 73, 74, 75
45, 46, 56, 60, 63, 67, 68, 69, 72, 94, CALibration Menu · 33
96, 97 Calibration Setups · ii, 52
A-Scan Storage · ii, 56, 67 Cell Polarity · 89
ASNT · 2 Cells · 87, 88, 89, 90, 97
Attenuation · 13, 39, 41, 55, 56, 60, 67, 73, Center Frequency · 34
78 Certification · 2
AWS · 2, 40, 65, 97 Charge · ii, 9, 27, 86, 87, 88, 89, 90, 98, 99
Axially · 13 Charger · 27, 85, 86, 87, 89
Clearing the memory · 28
CLICK · 41, 50
B CLOCK Menu · 43
CMOS · 93
Back Surface · 55, 56 Communication · 93
Base Material · 11 Composite Video · 42, 94
Battery · 7, 27, 42, 85, 86, 87, 89, 90, 97, Concave · 21
98 Connector · 26, 85, 94
Battery Box · 85, 87 Contact · 10
Battery Eliminator · 89 CONTOUR · 29, 30, 34, 50
Battery Pack · 27, 87, 89, 90, 97, 98 Controls · 7, 23, 33, 42
Baud Rate · 93 Convex · 21
Beam Path Distance · 37, 63 Corrosion · 16, 72
Beam Spread · 3, 15 Couplant · 4, 17, 48, 81
- 98 -
Coupling · 4, 11, 12, 20, 57, 58, 60, 61, 70 Envelope · 25, 41, 70, 71
Crack Diffraction · 10
Critical Operating Factors · i, 2
CURSOR · 39, 40, 41, 45, 50, 54, 57, 60, F
66
CURVE · 39, 40, 50, 58, 59, 62 Factory default · 28
Far Field · 13
Far Surface · 11, 55
D Fast Charge · 88, 89, 98
FLANK · 31, 36, 37, 39, 43, 75
DAC · ii, iv, 9, 28, 29, 37, 39, 50, 56, 57, Flaw Detection · i, 3, 10, 28
58, 59, 60, 61, 66, 97 Flaw Detector · 1, 2, 7, 9, 86
DAC Distance Amplitude Correction Focal Length · 20, 21
Menu · 39 Focus · 13, 16, 20
Damping · 28 Freeze · 9, 25, 69
Data Bits · 93 FREQ · 29, 30, 34, 50
dB · 24, 39, 40, 41, 50, 57, 60, 67, 97 Frequency · 2, 11, 12, 13, 14, 15, 34, 55
Delay · 25, 28, 29, 30, 33, 34, 50, 56, 70, Front Panel Controls · 23, 33
74, 77, 95 Front Surface · 3, 12, 17, 55
DELETE MODE · 44, 45, 49 Function · ii, 9, 26, 29, 33, 38, 50, 51
Density · 11 Function Menu · ii, 38, 50
Depth distance · 37, 63 Fuse · 87
Depth of Flaw · 10 FW · 29, 34, 56
DETECT · 29, 30, 34, 50 FZ/PK · 25, 45, 53, 68, 69, 71
Diffraction · 10, 41
Dimensional Measurement · 12
Directivity · 12 G
Discharge · 86
Disclaimer of Liability · i, 4 GAIN · 29, 30, 33, 34, 35, 36, 38, 39, 40,
Discontinuity · 3, 4, 11, 12, 13, 15, 19, 55, 41, 42, 43, 44, 45, 46, 47, 48, 49, 60
56, 57, 59, 60, 63, 64, 65, 68, 70 GATE1 · 29, 30, 35, 50, 56, 75, 77
Distance Echo Correction · 9 Gates · 9, 28
DRAW MODE · 39, 40, 41 Geometric Features · 15
Dual Element · 16 Grain · 13
Dual Probe · 10
Dynamic · 25, 57, 62, 70, 71, 72, 97
H
E Handshake · 93
Hardcopy · 67
Echo Dynamic · 25, 70, 71 Help · 7, 9, 26, 97
Echo Freeze · 9 HUD · 31, 36, 37, 48, 50, 75, 80
Echo to Echo · 9
EDIT NOTES · 44, 53, 69
Electromagnetic Compatibility · i, 5
English · 9
- 99 -
70, 71, 74, 75, 78, 79, 80, 81, 82, 83,
I 86, 87, 89, 92, 93, 94, 96, 97
MODE · 29, 31, 36, 37, 39, 40, 41, 42, 43,
I/O · 92 44, 45, 46, 49, 50, 51, 52, 53, 57, 58,
I/P · 92 60, 62, 64, 66, 68, 69, 70, 77, 80, 82, 83
IIW · 64 Mode Conversion · 2, 18
Immersion · i, iv, 10, 20, 21 Multiple Echo · 75
Immersion Testing · 20
Impedance · 11
Inches · 28, 30, 33, 34, 35, 67, 95
Incident Angle · 18, 19
N
Included Angle · 16, 72
Inclusions · 11 Near Field · 3, 13, 14, 20
Interface Connections · 91 NiCd · ii, iv, 9, 27, 85, 86, 87, 88, 89, 90,
97, 98
Nondestructive · 7, 12
Nondestructive Inspection · 12
L Notes · 38, 44, 45, 46, 48, 49, 52, 53, 54,
68, 69, 79, 81
Lamb Wave · 19 Notes Window · 54
Large Grain · 13 NTSC · 41, 42, 94, 95, 97
Lemo · 26, 85, 94
Lens · 20
LEVEL · 29, 31, 35, 42, 50
LIST MODE · 44, 45, 46
O
LOC · 47, 48, 49, 51, 79, 81, 82
LOCation · 48, 49, 78 O/P · 42, 43, 50, 51, 92
Longitudinal · 16, 18, 19, 72 Operator Training · i, 2, 54, 72
Longitudinal Wave · 16, 18 Orientation · 3, 54, 55
Outputs · 9, 42, 97
M
P
Mains Pack · 89
Maxima · 13 P_O/P Proportional Output Control Menu ·
MEAS · 29, 31, 39, 40, 41, 50, 56, 58, 64, 42
66, 75, 77 PAL · 28, 42, 94, 95, 97
MEASurement Menu · 36 Panel Calibration · 27, 28, 52, 53
Memory Menu · ii, 43 PANEL Setup Menu · 44
Menu Tree · ii, 50 Parameter · 24, 25, 28, 29, 30, 33, 52, 53,
Metric · 9, 28, 30, 95 56, 57, 58, 59, 60, 61, 62, 64, 68, 69,
Microseconds · 9, 41 70, 74, 75, 76, 82, 83, 93
Minima · 13 Parity · 93
Mode · 2, 18, 24, 25, 26, 28, 30, 33, 34, 36, Peak · ii, iv, 9, 25, 70, 71, 97
37, 38, 39, 40, 41, 42, 45, 48, 49, 52, Peak Echo Dynamics · ii, iv, 9, 70, 71
56, 58, 60, 62, 63, 64, 65, 66, 67, 69, Penetration · 13
Piezoelectric · 12
- 100 -
Pipe · 17 REJECT · 29, 30, 34, 50

Pitting · 16, 72 Reliability · 20, 78
Planar · 12, 55 Reset · 27, 36
POINT · 39, 40, 50, 57, 60, 61 Resolution · 13, 16, 20, 42, 55
Porosity · 11, 19 RF · iii, 9, 34, 40, 56, 62, 74, 94
POUT1 · 92 RF output · 94
Power Fuse · 87 RS232 · iii, 9, 37, 49, 93, 94, 96
Power Supply · ii, 27, 85
PRF · 28, 29, 30, 34, 50
PRINT Menu · 37 S
Printing · 37, 49, 56, 67, 76, 80, 82, 83
Probe · 3, 4, 10, 11, 12, 13, 14, 15, 16, 17, Scatter · 13
18, 19, 20, 21, 24, 25, 26, 28, 30, 33, Self Check · 9
34, 37, 38, 39, 52, 54, 55, 56, 57, 58, Sensitivity · 12, 13, 20, 29, 54, 55
60, 61, 63, 64, 66, 67, 70, 71, 72, 73, Shear · 10, 18, 19
74, 75, 76, 77, 78 Shear Wave · 10, 18, 19
Probe Calibration · 3 Single Probe · 10
Probe Pressure · 57, 58, 60, 61 Size · 98
Probe Zero · 3, 25, 38, 73, 77, 78, 95 Skips · 37, 63
Pulse · 95 Socket · 26, 27
Pulse-Echo · 10 Sound Energy · 11, 13, 16, 18, 20
Sound Field · 13
Sound Velocity · 1, 2, 10, 11, 12, 13, 14,
Q 15, 33, 64, 76, 78
Sound Wave Propagation · 1
Qualification · 2 Specifications · iii, 2, 95
Spurious Indications · 19
START · 29, 30, 35, 38, 50, 64, 77
R STATE · 29, 30, 35, 44, 45, 46, 50, 51, 52,
68, 70, 77, 93
Radially · 13 Stop Bits · 93
Radio Interference · 5 Storage · 24, 44, 45, 46, 47, 48, 56, 67, 76,
RANGE · 29, 30, 33, 34, 50, 70, 77 79, 80, 81
Recall · ii, 24, 52 Store · 24, 44, 45, 46
RECALL MODE · 44, 45, 46 STORE · 44, 45, 46, 51, 52, 68, 69
Receiver · 26 Straight Beam · 16
REF Feature · ii, 33, 34, 35, 36, 38, 39, 40, Surface · 10, 19, 37, 63
41, 42, 43, 44, 45, 46, 47, 48, 49, 50, Surface Distance · 37, 63, 66, 96
51, 60, 66, 69 Surface Wave · 10, 19, 55
REF/GAIN · 33 SYNC · 92, 94
Reference · ii, 9, 66, 67, 69, 97
Reference Block · 2, 54, 55, 57, 58, 59, 60,
61, 67, 68, 72, 73 T
Reflection · 11
Refracted Sound Beams · 19 TCG · ii, iv, 9, 28, 29, 40, 50, 57, 60, 61,
Refraction · 18, 19, 20, 21, 37, 63, 64 62, 66, 78, 97
- 101 -
TCG Time Corrected Gain Menu · 40

Temperature · 3, 98
V
Temperature Variations · 3
Test Blocks · 3 VALID · 44, 45, 46, 52, 68, 70
Testing Limitations · i, 2 VEL · 29, 30, 33, 50
T-FN Menu · 49 Velocity · 2, 10, 28, 41, 74, 75, 95
Thickness Gauge · 1, 9 Velocity Of Sound · 1, 11, 12, 13, 14, 15,
Threshold · 35, 36, 39, 57, 78, 93 33, 64, 76, 78
Time Corrected Gain · 9, 12, 40, 57, 60, VIDEO · 41, 42, 50
78, 97 Video Detection · 34
Time Of Flight · 2 VIDEO Menu · 42
Timed Charge · 86, 87, 98
Time-Of-Flight · 11, 76
T-LOG · ii, 47, 49, 51, 78, 79, 81, 82 W
T-LOG Menu · 47
T-MIN · 31, 36, 50 Warranty · iii, 99
training · 1, 2, 7, 19, 54, 72 Water Path · 21
Transmit-Receive · 10 Wave · 10
Trickle Charge · 86, 87 Wavelength · 12, 13, 55
TRIGGER · 31, 36, 37, 39, 42, 43, 50, 58, Wedge · 18
59, 64 Weight · 98
Trigonometric · 9, 96 Weld · ii, iv, 9, 19, 37, 40, 41, 55, 56, 63,
Twin · 26 65, 66, 70
TX · 2, 56, 74 Weld Inspection · 19, 37, 40, 41, 55, 56, 70
Weld Zone · 19
WIDTH · 29, 31, 35, 50, 64, 77
U
Ultrasonic Testing · 1, 2, 4, 7, 10, 11, 13, Z
19, 20, 33, 76
Unrectified · 9, 97 ZERO · 29, 30, 33, 50
UTILities Menu · 41
- 102 -

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Dakota Ultrasonics

Information in this document is subject to change without notice. No

See Disclaimers And Notices On Page 1

1.1 General Warnings ................................................................................ 1

3. Features of the DFX-244 ........................................................................... 9

3.1 Instrument Characteristics ................................................................... 9

4.1 Discontinuity Considerations.............................................................. 12

5.1 Front Panel Controls .......................................................................... 23

6.1 Basic Menu Functions........................................................................ 31

6.1.2 Function Menu ....................................................................................... 36

6.2 Menu Tree ..........................................................................................48

6.5 Thickness Gauging .............................................................................71

7. Power Supply ...........................................................................................83

7.1 NiCd Battery Pack ..............................................................................83

8.1 Interface Port ......................................................................................90

10. Warranty ............................................................................................... 97

1. Disclaimers And Notices

1.1 General Warnings

1.2 Operator Training

C. Behavior of the sound wave at the interface of

1.3 Testing Limitations

1.4 Critical Operating Factors

Users should also be aware that the sound

without noticeable wear of the front surface.

1.5 Disclaimer of Liability

Neither The Seller Not The Manufacturer Shall Be Liable

1.6 Electromagnetic Compatibility

For any questions relating to the proper use of this product,

2. How to Use this Manual

3. Features of the DFX-244

3.1 Instrument Characteristics

3.2 Functional Testing Methods

4. Fundamentals of Ultrasonic Testing

4.1 Discontinuity Considerations

4.2 Ultrasonic Transducers/Probes & Sound Fields

Figure 2 – Ultrasonic Energy Field Distribution

The near field distance is a function of the transducer/probe

Where: D = diameter of the transducer/probe element

Transducer/probes also exhibit a characteristic called beam spread.

Figure 3 – Ultrasonic Beam Spread and Half-Angle

Beam spread is an important consideration when inspecting

4.3 Straight Beam Testing

4.4 Dual Element Testing

When using dual element

Figure 6 – Couplant use on Pitted Surfaces

4.5 Angle Beam Testing

Angle beam or shear

4.6 Immersion Testing

Figure 10 – Focusing in Immersion Testing

5.1 Front Panel Controls

Figure 11 – Front Panel of the DFX-244

“Power On” push button and “Power Off” push button

ST EP Press to select the dB step value of amplifier gain as

ACCEPT This button operates in conjunction with the memory

This button operates in connection with the plain white

MEMO RY This button switches between the two main menus at

Pressing the button a third time returns the A-Trace

FN The Function button selects a menu along the top of the

5.2 Panel Calibration Memory

Factory default values: