STGW50H65DFB2 4
STGW50H65DFB2 4
STGW50H65DFB2 4
Datasheet
Features
• Maximum junction temperature: TJ = 175 °C
• Low VCE(sat) = 1.55 V(typ.) @ IC = 50 A
• Very fast and soft recovery co-packaged diode
• Minimized tail current
4
2
3 • Tight parameter distribution
1 • Low thermal resistance
TO247-4 • Positive VCE(sat) temperature coefficient
C(1, TAB)
• Excellent switching performance thanks to the extra driving kelvin pin
Applications
G(4)
• Welding
K(3)
• Power factor correction
• UPS
E(2) • Solar inverters
NG4K3E2C1_TAB
• Chargers
Description
The newest IGBT 650 V HB2 series represents an evolution of the advanced
proprietary trench gate field-stop structure. The performance of the HB2 series is
optimized in terms of conduction, thanks to a better VCE(sat) behavior at low current
values, as well as in terms of reduced switching energy. A very fast soft recovery
diode is co-packaged in antiparallel with the IGBT. The result is a product specifically
designed to maximize efficiency for a wide range of fast applications.
STGW50H65DFB2-4
Product summary
1 Electrical ratings
ICP (1)(2)
Pulsed collector current 150
IFP(1) Pulsed forward current (tp ≤ 1 μs, TJ < 175 °C) 150
2 Electrical characteristics
Collector-emitter breakdown
V(BR)CES VGE = 0 V, IC = 1 mA 650 V
voltage
VGE = 15 V, IC = 50 A 1.55 2
VGE = 15 V, IC = 50 A,
Collector-emitter saturation 1.8
VCE(sat) TJ = 125 °C V
voltage
VGE = 15 V, IC = 50 A,
1.9
TJ = 175 °C
IF = 50 A 1.85 2.45
IF = 50 A, TJ = 175 °C 1.45
Eon (1)
Turn-on switching energy VGK = 15 V, RG(on) = 12 Ω, - 629 - μJ
RG(off) = 6.8 Ω
td(off) Turn-off delay time - 128 - ns
(see Figure 28. Test circuit for
tf Current fall time inductive load switching) - 32 - ns
Eoff (2)
Turn-off switching energy - 478 - µJ
Figure 1. Power dissipation vs case temperature Figure 2. Collector current vs case temperature
250
80
200
60
150
40
100
20
50
0 0
25 75 125 175 TC (°C) 25 75 125 175 TC (°C)
Figure 3. Output characteristics (TJ = 25 °C) Figure 4. Output characteristics (TJ = 175 °C)
IC GADG041220191035OC25 IC GADG041220191036OC175
(A) (A)
VGE = 11 V VGE = 13 V VGE = 11 V
125 125
VGE = 13 V
VGE = 15 V
100 100
VGE = 15 V VGE = 9 V
VGE = 9 V
75 75
50 50
25 25
VGE = 7 V
VGE = 7 V
0 0
0 1 2 3 4 5 VCE (V) 0 1 2 3 4 5 VCE (V)
1.1 0.8
0.8 0.4
-50 0 50 100 150 TJ (°C) 0 25 50 75 100 125 IC (A)
Figure 7. Collector current vs switching frequency Figure 8. Forward bias safe operating area
IC GADG051220191302CCS IC IGBT061220191241FSOA
(A) (A)
80
10 2
60 tp = 1 µs
TC = 100 °C
TC = 80 °C tp = 10 µs
40
10 1
tp = 100 µs
20 Single pulse, TC = 25 °C,
Rectangular current shape TJ ≤ 175 °C, VGE = 15 V tp = 1 ms
(duty cycle = 0.5, VCC = 400 V,
0 RG = 4.7 Ω, VGE = 0/15 V , Tj = 175 °C 10 0
10 0 10 1 10 2 f (kHz) 10 0 10 1 10 2 VCE (V)
IC GADG041220191038TCH VF IGBT230216EWF6GDVF
(A) (V) TJ = -40 °C
VCE = 6 V
125 2.3
100 2.0
TJ = 25 °C
75 1.7
TJ = 175 °C
50 1.4
Tj = 175 °C
25 1.1
Tj = 25 °C
0 0.8
4 6 8 10 VGE (V) 20 30 40 50 60 70 80 IF (A)
Figure 11. Normalized VGE(th) vs junction temperature Figure 12. Normalized V(BR)CES vs junction temperature
1.1 IC = 1 mA
VCE = VGE 1.08
IC = 1 mA
1.0
1.04
0.9
1.00
0.8
0.96
0.7
0.6 0.92
-50 0 50 100 150 TJ (°C) -50 0 50 100 150 TJ (°C)
Figure 13. Capacitance variations Figure 14. Gate charge vs gate-emitter voltage
Cies 15
10 3 12
10 2 6
f = 1 MHz Coes
3
Cres
10 1 0
10 -1 10 0 10 1 10 2 VCE (V) 0 40 80 120 160 Qg (nC)
Figure 15. Switching energy vs collector current Figure 16. Switching energy vs temperature
E GADG220720201127SLC E GADG220720201127SLT
(mJ) VCC = 400 V, RG(on) = 12 Ω, (mJ) VCC = 400 V, IC= 50 A, RG(on) = 12 Ω,
4.0 RG(off) = 6.8 Ω, VGK = 15 V, TJ=175 ℃ RG(off) = 6.8 Ω, VGK = 15 V
3.5 2.0
Etot
3.0 Etot
1.6
2.5
1.8 2.5
Eon
1.4 2.0
1.5
1.0
Eoff
1.0
0.6
0.5
0.2 0 10 20 30 40 RG (Ω)
150 250 350 450 VCE (V)
Figure 19. Switching times vs collector current Figure 20. Switching times vs gate resistance
t GADG220720201130STC t GADG220720201131STR
(ns) VCC = 400 V, RG(on) = 12 Ω, (ns) td(off)
RG(off) = 6.8 Ω, VGK = 15 V, TJ=175 ℃
td(off)
tf tf
10 2 10 2
tr
td(on)
tr
10 1 td(on) 10 1
45
220
40
35
200
30
25
180
20 0 500 1000 1500 2000 2500 3000 di/dt(A/µs)
0 500 1000 1500 2000 2500 3000 di/dt(A/μs)
Figure 23. Reverse recovery charge vs diode current Figure 24. Reverse recovery energy vs diode current
slope slope
4.0 1.0
3.5 0.8
3.0 0.6
2.5 0.4
2.0 0.2
0 500 1000 1500 2000 2500 3000 di/dt(A/µs) 0 500 1000 1500 2000 2500 3000 di/dt(A/µs)
0.2
0.1 0.05
-1
10
0.02
Zth=k Rthj-c
0.01 δ=tp/t
Single pulse tp
t
-2
10 -5 -4 -2 -1
tp (s)
-3
10 10 10 10 10
3 Test circuits
Figure 27. Test circuit for inductive load switching Figure 28. Gate charge test circuit
A A
C
L=100 μH
G
E B
B
3.3 1000 VCC
C μF μF
G D.U.T
RG
K E
GND1 GND2
(signal ground) (power ground) HB650_4_leads GADG030820201115SA
Figure 29. Switching waveform Figure 30. Diode reverse recovery waveform
90%
VG 10%
90%
VCE tr(Voff)
10%
tcross
10
90%
IC td(off)
10%
td(on) tf
tr(Ion)
ton toff
AM01506v1 GADG140820170937SA
4 Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
8405626_2
mm
Dim.
Min. Typ. Max.
Revision history
Contents
1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
2 Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2.1 Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5