Mhairul, Ijiev2n3p4
Mhairul, Ijiev2n3p4
Mhairul, Ijiev2n3p4
Abstract
Fabrication of titanium dioxide (TiO2) thin film on microscope glass using sol-gel method
has been studied intensively. The starting materials were titanium (IV) butoxide, ethanol, acetic
acid, triton x-100, hydrochloric acid and deionized water. The materials were mixed together to
form the sols. Then, the heat and ageing treatment was applied to form stable sols. The sols were
then spin coated on the glass substrate to form the homogenous and transparent TiO2 thin film. The
TiO2 thin film was coated at several layers using specific conditions. To evaluate the performance
of thin film, the crystallinity of the thin film was determined by using the x-ray diffractometer
(XRD). The change on the surface morphology was observed using atomic force microscope
(AFM). The electrical property of the thin film was determined by doing the current-voltage (I-V)
analysis on the thin film. It has been successfully shown that the anatase crystalline phase was
observed when the TiO2 thin film was heated at 500°C. The roughness and the crystalline phase of
TiO2 thin film changed drastically with the growth conditions. Finally, the effect of film
preparation to the film resistivity also showed a critical aspect where we should take into account
during the preparation of TiO2 thin film.
Keywords: structural properties, electrical properties, TiO2 thin film, titanium butoxide.
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International Journal of Integrated Engineering (Issue on Electrical and Electronic Engineering)
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International Journal of Integrated Engineering (Issue on Electrical and Electronic Engineering)
V A
2.3. TiO2 thin film (Ω cm)
I L
The TiO2 solution then was coated onto Where ρ is resistivity, V over I is calculated
substrate by using spin coating technique. After resistance, A is cross sectional area and L is
that, the sample was heated at 100OC. The distance between metal contacts. The thickness
process of coating and heating was repeated in of the nanostructured TiO2 thin film was
different times. The process repeated represents measured by surface profiler (Alpha Step IQ-
the number of layer of TiO2 thin film. As- KLA Tencor). Figure 1 shows the overall
prepared sample was carried to annealing experimental produce used in this research.
process at 500OC in 1 hour.
2.4. Characterization
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International Journal of Integrated Engineering (Issue on Electrical and Electronic Engineering)
better than before the annealing process. Table 1 : Resistance and resistivity of TiO2 thin
film before and after annealing process
[101]
Before anneal After anneal
Intensity (a.u)
[211] Resistance
[004] 5.00E+08 8.00E+07
[200] (Ω)
Thickness
After anneal 0.5 0.4
(μm)
Before anneal Resistivity
2.34E+04 3.20E+03
20 25 30 35 40 45 50 (Ω . cm)
2 Degree)
Table 1 shows the resistivity of TiO2 thin
Figure 2. XRD spectra of TiO2 thin film before film before and after the annealing process. It
and after annealing process. was noticed that the resistivity was decreased
after annealing process as compared with as-
prepared before annealing process. This may be
(a) due to the reason where after annealing
process, the good crystallinity and
nanostructure surface area obtained after the
annealing and it promises much surface for
electron passes through from one grain to
another grain within the TiO2 thin film.
20 25 30 35 40 45 50
2 Degree)
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International Journal of Integrated Engineering (Issue on Electrical and Electronic Engineering)
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International Journal of Integrated Engineering (Issue on Electrical and Electronic Engineering)
7. CONCLUSION
We have successfully fabricated the TiO2
thin film at various thickness and amount of
solvent along with annealing process. The
Figure 7. AFM image of (a) 20% and (b) 70% effect of the growth condition to the
amount of ethanol crystallinity, morphology and IV properties has
been studied.
Figure 6 shows the XRD analysis of TiO2 We found that the annealing process and
thin film using 20% and 70% of ethanol the number of layer influence the crytallinity
solvent. The peak of anatase TiO2 is decreased and morphology of TiO2 thin film. The
with the increasing amount of ethanol. The annealing process gives anatase phase of
XRD spectra of nanostructured TiO2 thin film nanostructured TiO2 thin film appears in XRD
with 70% amount of ethanol shows single peak spectra. The anatase peak of nanostructured
of anatase compared to nanostructured TiO2 TiO2 thin film can be identified clearer with
thin film with 20% amount of ethanol. increase number of layer.
Figure 7 shows the AFM images of thin film Roughness of TiO2 thin film is increase
prepared using 20% and 70% amount of with annealing process and number of layer but
ethanol. The roughness was 0.625 at 70% decrease with increasing amount of ethanol.
amount of ethanol. On the other hand, the The resistivity of TiO2 thin film decrease
roughness increased to 1.690 at 20% amount of with annealing process and amount of ethanol
ethanol. but increase with the number of layer deposited
Table 3 shows the electrical properties of on nanostructured TiO2 thin film.
TiO2 thin film with 20% and 70% ethanol. The Finally, we propose that the TiO2 thin film
resistivity slightly increased when the 20% of is good to growth with annealing process, 5
ethanol was used. This is clearly understood layer and 20% amount of ethanol. However,
from figure 6 where one can see a single phase further investigation on the optical properties of
structure of TiO2 thin film. The single phase this TiO2 thin film is needed.
structure enhances the electron mobility thus
improve the conductivity [10]. Therefore, the
resistivity is lower at 70% of amount ethanol. ACKNOWLEDGMENT
The authors would like to thank Universiti Tun
Hussein Onn Malaysia (UTHM) for supporting
this research under the Postgraduate Incentive
Research Grant and Ministry of Higher
Education for Fundamental Research Grant
Scheme, Phase 2/2009. We also thank Mr
Tarmizi and Mr Anuar of Faculty of
Mechanical and Manufacturing Engineering of
UTHM for XRD analysis.
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