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    japjot singh
    This document discusses various semiconductor characterization techniques used to determine the physical properties of semiconductor crystals. It describes structural characterization techniques like X-ray diffraction, scanning electron microscopy, and transmission electron microscopy which provide information about the crystal structure and composition. It also outlines several analytical techniques like Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy which determine the elemental composition through analysis of emitted electrons or ions. Finally, it discusses electrical characterization techniques like the Hall effect which provide information about carrier concentration and mobility in semiconductors.

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    Assignment

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    japjot singh
    9 views11 pages
    This document discusses various semiconductor characterization techniques used to determine the physical properties of semiconductor crystals. It describes structural characterization techniques like X-ray diffraction, scanning electron microscopy, and transmission electron microscopy which provide information about the crystal structure and composition. It also outlines several analytical techniques like Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy which determine the elemental composition through analysis of emitted electrons or ions. Finally, it discusses electrical characterization techniques like the Hall effect which provide information about carrier concentration and mobility in semiconductors.

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    This document discusses various semiconductor characterization techniques used to determine the physical properties of semiconductor crystals. It describes structural characterization techniques like X-ray diffraction, scanning electron microscopy, and transmission electron microscopy which provide information about the crystal structure and composition. It also outlines several analytical techniques like Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy which determine the elemental composition through analysis of emitted electrons or ions. Finally, it discusses electrical characterization techniques like the Hall effect which provide information about carrier concentration and mobility in semiconductors.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    9 views11 pages

    Assignment

    Uploaded by

    japjot singh
    This document discusses various semiconductor characterization techniques used to determine the physical properties of semiconductor crystals. It describes structural characterization techniques like X-ray diffraction, scanning electron microscopy, and transmission electron microscopy which provide information about the crystal structure and composition. It also outlines several analytical techniques like Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy which determine the elemental composition through analysis of emitted electrons or ions. Finally, it discusses electrical characterization techniques like the Hall effect which provide information about carrier concentration and mobility in semiconductors.

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    Semiconductor

    Characterization
    Techniques
    Sample Footer Text

    Introduction

    • Semiconductor characterization techniques are


    used in order to gain knowledge on the physical
    properties of a semiconductor crystal
    • The knowledge gained from the characterization
    process essential in determining whether the
    semiconductor crystal probed is suitable for a
    particular device component with certain
    functionalities
    • Semiconductors are a unique class of materials,
    distinct from conductors and insulators

    12/1/2023 2
    Sample Footer Text

    Structural
    characterization
    techniques

    • X-ray Diffraction
    • Scanning Electron Microscopy
    • Transmission Electron Microscopy
    • Auger Electron Spectroscopy
    • Secondary ion Mass Spectroscopy
    • X-ray photoelectron spectroscopy

    12/1/2023 3
    Sample Footer Text

    Principle of X-ray
    diffraction

    • X-ray diffraction involves directing X-


    rays at a semiconductor sample
    • The crystal lattice of the material
    scatters the X-rays, and the resulting
    diffraction pattern provides structural
    information

    12/1/2023 4
    Sample Footer Text

    Principle of Scanning
    Electron Microscopy
    (SEM)

    • Scanning Electron Microscopy relies


    on the interaction of electrons with the
    sample
    • A focused electron beam scans the
    surface of the semiconductor, and the
    emitted secondary electrons provide
    information about the topography and
    composition

    12/1/2023 5
    Sample Footer Text

    Principle of • Transmission Electron Microscopy utilizes a beam of


    electrons that passes through an ultra-thin specimen
    Transmission
    • Interaction with the sample generates images and
    Electron diffraction patterns
    Microscopy

    12/1/2023 6
    Sample Footer Text

    Principle of Auger
    Electron Microscopy

    • The key principle of Auger Electron


    Microscopy is that the emitted Auger
    electrons carry information about the
    elemental composition of the sample's
    surface
    • Each element has a unique set of Auger
    electron energy levels, so by measuring the
    energy spectrum of Auger electrons, the
    composition of the material can be
    determined

    12/1/2023 7
    Sample Footer Text

    Principle of Secondary
    Ion Mass
    Spectroscopy

    • The fundamental principle of SIMS is


    based on the generation and analysis
    of secondary ions that are sputtered
    from the surface of a sample when
    bombarded with a primary ion beam

    12/1/2023 8
    Sample Footer Text

    Principle of X-Ray
    electron Spectroscopy

    • In the XPS technique, low-energy x-


    rays are used as a source rather than
    electrons in the case of EDX and AES
    • Electrons are ejected when the photon
    is absorbed via the photoelectric effect

    12/1/2023 9
    Sample Footer Text

    Electrical characterization Hall Effect

    techniques

    12/1/2023 10
    Sample Footer Text

    Principle of Hall Effect

    • The Hall Effect involves the generation


    of a voltage perpendicular to both the
    current flow and the applied magnetic
    field in a semiconductor
    • This voltage is directly proportional to
    the carrier concentration and their
    mobility

    12/1/2023 11

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