02 Ads1288
02 Ads1288
02 Ads1288
1 Features 3 Description
• Power consumption: The ADS1288 is a 32-bit, low-power, analog-to-
– PGA operation: 5mW (typical) digital converter (ADC), with a programmable gain
– Buffer operation: 3mW (typical) amplifier (PGA) and a finite impulse response (FIR)
• Dynamic range: filter. The ADC is designed for the demanding
– PGA gain: 1, 500SPS (122dB, typical) requirements of seismology equipment requiring low
– Buffer operation: 500SPS (122dB, typical) power consumption to extend battery run time.
• THD: < –120dB (typical) The low-noise PGA extends the ADC dynamic
• CMRR: 120dB (typical) range through gains 1 to 64. The PGA allows
• Flexible digital filter: direct connection to geophones and transformer-
– Selectable sinc + FIR + IIR coupled hydrophones without the need of an external
– Linear or minimum phase amplifier. The optional unity-gain buffer reduces
– High-pass filter power consumption.
• Data rates: 125SPS to 2000SPS
• PGA gains: 1 to 64 The ADC incorporates a high-resolution, delta-sigma
• SYNC input (ΔΣ) modulator and a FIR filter with programmable
• Clock error compensation phase response. The high-pass filter removes dc
• Two-channel multiplexer and low-frequency content from the signal. Clock
• Offset and gain calibration frequency error is compensated by the sample rate
• General-purpose digital I/Os converter with up to 7ppb frequency accuracy.
• Analog supply operation: 5V, 3.3V, or ±2.5V The ADC supports 3.3V operation to minimize device
power consumption. Power consumption is 3mW
2 Applications
(typical) in buffer mode operation and 5mW (typical)
• Energy exploration in PGA mode operation.
• Passive seismic monitoring
• Earth sciences and geology The ADC is available in a compact 5mm × 5mm
• Precision instrumentation VQFN package and is fully specified over the –40°C
to +85°C ambient temperature range.
Package Information
PART NUMBER PACKAGE(1) PACKAGE SIZE(2)
ADS1288 RHB (VQFN, 32) 5mm × 5mm
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ADS1288
SBASAW0 – FEBRUARY 2024 www.ti.com
Table of Contents
1 Features............................................................................1 7.2 Functional Block Diagram......................................... 18
2 Applications..................................................................... 1 7.3 Feature Description...................................................19
3 Description.......................................................................1 7.4 Device Functional Modes..........................................32
4 Pin Configuration and Functions...................................3 7.5 Programming............................................................ 35
5 Specifications.................................................................. 5 8 Register Map.................................................................. 40
5.1 Absolute Maximum Ratings........................................ 5 8.1 Register Descriptions................................................40
5.2 ESD Ratings............................................................... 5 9 Application and Implementation.................................. 45
5.3 Recommended Operating Conditions.........................5 9.1 Application Information............................................. 45
5.4 Thermal Information....................................................6 9.2 Typical Application.................................................... 45
5.5 Electrical Characteristics.............................................7 9.3 Power Supply Recommendations.............................47
5.6 Timing Requirements: 1.65V ≤ IOVDD ≤ 1.95V 9.4 Layout....................................................................... 48
and 2.7V ≤ IOVDD ≤ 3.6V............................................. 9 10 Device and Documentation Support..........................49
5.7 Switching Characteristics: 1.65V ≤ IOVDD ≤ 10.1 Receiving Notification of Documentation Updates..49
1.95V and 2.7V ≤ IOVDD ≤ 3.6V...................................9 10.2 Support Resources................................................. 49
5.8 Timing Diagrams......................................................... 9 10.3 Trademarks............................................................. 49
5.9 Typical Characteristics.............................................. 12 10.4 Electrostatic Discharge Caution..............................49
6 Parameter Measurement Information.......................... 17 10.5 Glossary..................................................................49
6.1 Noise Performance................................................... 17 11 Revision History.......................................................... 49
7 Detailed Description......................................................17 12 Mechanical, Packaging, and Orderable
7.1 Overview................................................................... 17 Information.................................................................... 49
RESET
PWDN
DRDY
CAPR
SYNC
REFN
AVSS
REFP
32
31
30
29
28
27
26
25
AIN1P 1 24 DOUT
AIN1N 2 23 DIN
AIN2P 3 22 SCLK
AIN2N 4 21 CS
Thermal pad
CAPP 5 20 CLK
CAPN 6 19 IOVDD
CAPBP 7 18 DGND
CAPBN 8 17 CAPD
10
11
12
13
14
15
16
9
CAPC
AVSS
AVDD1
AVDD2
AGND
CAPI
GPIO0
GPIO1
Not to scale
Figure 4-1. RHB Package, 32-Pin, 5mm × 5mm VQFN (Top View)
5 Specifications
5.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
AVDD1 to AVSS –0.3 5.5
AVSS to AGND –2.8 0.3
AVDD2 to AGND –0.3 5.5
Power-supply voltages V
AVDD2 to AVSS –0.3 5.5
IOVDD to DGND –0.3 3.9
IOVDD to DGND (IOVDD connected to CAPD) –0.3 2.2
Grounds AGND to DGND – 0.3 0.3 V
Analog input voltage AIN1P, AIN1N, AIN2P, AIN2N, REFP, REFN AVSS – 0.3 AVDD1 + 0.3 V
Digital input voltage CLK, DIN, SCLK, CS, GPIO0, GPIO1, SYNC, RESET, PWDN DGND – 0.3 IOVDD + 0.3 V
Input current Continuous, any digital or analog pin (2) –10 10 mA
Junction, TJ 150
Temperature °C
Storage, Tstg –60 150
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If briefly operating outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not
sustain damage, but it may not be fully functional – this may affect device reliability, functionality, performance, and shorten the device
lifetime.
(2) Analog input pins AIN1P, AIN1N, AIN2P, AIN2N, REFP and REFN are diode-clamped to AVDD1 and AVSS. Limit the input current to
10mA in the event the analog input voltage exceeds AVDD1 + 0.3V or AVSS – 0.3V. Digital input pins are clamped to IOVDD and
DGND. Limit the input current if the digital input voltage exceeds IOVDD + 0.3V or DGND – 0.3V.
(1) JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process.
(1) Calibration range is the sum of the offset and gain error correction.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
note.
(1) Input frequencies at N × 16 kHz ± fDATA / 2 (where N = 1, 2, 3, and so on) intermodulate with the chopper clock. At these frequencies
stop band attenuation = –90dBFS (typ).
(2) Excluding current consumed by the voltage reference input or by sample rate converter operation. See voltage reference input current
and IOVDD supply current for sample rate converter operation.
5.6 Timing Requirements: 1.65V ≤ IOVDD ≤ 1.95V and 2.7V ≤ IOVDD ≤ 3.6V
over operating ambient temperature range (unless otherwise noted)
MIN NOM MAX UNIT
CLOCK
tc(CLK) CLK period 241 244.14 332 ns
tw(CLKH) Pulse duration, CLK high 110 ns
tw(CLKL) Pulse duration, CLK low 110 ns
SERIAL INTERFACE
tw(CSH) Pulse duration, CS high 20 ns
td(CSSC) Delay time, first SCLK rising edge after CS falling edge 20 ns
tc(SCLK) SCLK period 120 ns
tw(SCH) Pulse duration, SCLK high 50 ns
tw(SCL) Pulse duration, SCLK low 50 ns
tsu(DI) Setup time, DIN valid before SCLK rising edge 10 ns
th(DI) Hold time, DIN valid after SCLK rising edge 10 ns
tsu(SRC-W) Setup time, SRC[1:0] register write before DRDY falling edge 256 1 / f(CLK)
SYNC
tw(SYNL) Pulse duration, SYNC low 2 1 / f(CLK)
tw(SYNH) Pulse duration, SYNC high 2 1 / f(CLK)
tsu(SYNCLK) Setup time, SYNC high before CLK rising edge 10 ns
th(SYNCLK) Hold time, SYNC high after CLK rising edge 10 ns
RESET
tw(RSTL) Pulse duration, RESET low 2 1 / f(CLK)
tsu(RSTCLK) Setup time, RESET high before CLK rising edge 10 ns
th(RSTCLK) Hold time, RESET high after CLK rising edge 10 ns
5.7 Switching Characteristics: 1.65V ≤ IOVDD ≤ 1.95V and 2.7V ≤ IOVDD ≤ 3.6V
over operating ambient temperature range and CLOAD = 20pF (unless otherwise noted)
PARAMETER MIN TYP MAX UNIT
SERIAL INTERFACE
tw(DRH) Pulse duration, DRDY high 8 1 / f(CLK)
tp(CSDO) Propagation delay time, CS falling edge to DOUT driven valid 50 ns
tp(SCDO) Propagation delay time, SCLK falling edge to new DOUT valid 50 ns
th(SCDO) Propagation delay time, SCLK falling edge to DOUT invalid 5 ns
SYNC
tp(SYNDR) Propagation delay time, SYNC rising edge to valid data DRDY falling edge 62.98145 / fDATA + 930 / fCLK s
RESET
tp(RSTDR) Propagation delay time, RESET rising edge to DRDY falling edge 516,874 1/ fCLK
PWDN
tp(PDDR) Propagation delay time, PWDN rising edge to DRDY falling edge 62.98145 / fDATA + 946 / f(CLK) s
POWER UP
tp(SUPDR) Propagation delay time, power supply and CLK applied to first DRDY pulse 650,000 1 / fCLK
CLK
tw(CLKH)
CS
SCLK
tsu(DI) tw(SCL)
DIN
th(DI)
DRDY
CS
SCLK
tp(CSDO) th(SCDO)
tp(SCDO)
CLK
th(SYNCLK) tsu(SYNCLK)
SYNC
tw(SYNL) tw(SYNH)
CLK
th(RSTCLK) tsu(RSTCLK)
RESET
tw(RSTL) tp(RSTDR)
DRDY
PWDN
DRDY
tp(PDDR)
DRDY
tsu(SCR-W)
AVDD1 – AVSS +
1.65 V typ. –
AVDD2 – AGND +
1.65 V typ. –
CAPD – DGND +
1.35 V typ. –
CLK
DRDY
tp(SUPDR)
0 0
-20 -20
-40 -40
-60 -60
Amplitude (dB)
Amplitude (dB)
-80 -80
-100 -100
-120 -120
-140 -140
-160 -160
-180 -180
0 25 50 75 100 125 150 175 200 225 250 0 25 50 75 100 125 150 175 200 225 250
Frequency (Hz) Frequency (Hz)
-20 -20
-40 -40
-60 -60
Amplitude (dB)
Amplitude (dB)
-80 -80
-100 -100
-120 -120
-140 -140
-160 -160
-180 -180
0 25 50 75 100 125 150 175 200 225 250 0 25 50 75 100 125 150 175 200 225 250
Frequency (Hz) Frequency (Hz)
-20 -20
-40 -40
-60 -60
Amplitude (dB)
Amplitude (dB)
-80 -80
-100 -100
-120 -120
-140 -140
-160 -160
-180 -180
0 25 50 75 100 125 150 175 200 225 250 0 25 50 75 100 125 150 175 200 225 250
Frequency (Hz) Frequency (Hz)
100
PGA gain = 1
90 PGA gain = 8
80 Buffer operation
70
Population (%)
60
50
40
30
20
10
0
-100
-80
-60
-40
-20
100
0
20
40
60
80
Offset Error (V)
30 units
Figure 5-15. Dynamic Range vs PGA Gain Figure 5-16. Offset Error Distribution
100 100
PGA gain = 1 PGA gain = 1
90 90 PGA gain = 2
PGA gain = 8
Buffer operation 80 PGA gain = 4
80
70 70
Population (%)
Population (%)
60
60
50
50
40
40
30
30
20
20
10
10
0
-700
-600
-500
-400
-300
-200
-100
100
200
300
400
500
600
700
0
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
Offset Drift (V/C) Gain Error (ppm)
30 units 30 units
Figure 5-17. Offset Drift Distribution Figure 5-18. Gain Error Distribution
100 100
PGA gain = 8 PGA gain = 1
90 PGA gain = 16, 32 and 64 90 PGA gain = 2
80 Buffer operation 80 PGA gain = 4
70 70
Population (%)
Population (%)
60 60
50 50
40 40
30 30
20 20
10 10
0 0
-700
-600
-500
-400
-300
-200
-100
100
200
300
400
500
600
700
0.5
1.5
2.5
3.5
4.5
5.5
6
0
30 units 30 units
Figure 5-19. Gain Error Distribution Figure 5-20. Gain Drift Distribution
100 100
PGA gain = 8
90 PGA gain = 16, 32 and 64 90
80 Buffer operation 80
70 70
Population (%)
Population (%)
60 60
50 50
40 40
30 30
20 20
10 10
0 0
0
0.5
1.5
2.5
3.5
4.5
5.5
0.03
0.04
0.05
0.06
0.07
0.08
0.09
0.1
Gain Drift (ppm/C) Gain Match (%)
30 units 30 units
Figure 5-21. Gain Drift Distribution Figure 5-22. Gain Match Distribution
-105 -70
TA = -40C PGA gain = 1
TA = 25C PGA gain = 4
-110 TA = 85C -80 PGA gain = 16
Buffer operation
-115 -90
THD (dB)
THD (dB)
-120 -100
-125 -110
-130 -120
-135 -130
1 10 70 0 10 20 30 40 50 60 70 80 90 100
Gain (value = 1 represents buffer operation) Input Frequency (Hz)
AVDD1 = 3.3V, fIN = 31.25Hz, VIN = –0.5dBFS fIN = 31.25Hz, VIN = –0.5dBFS
Figure 5-23. THD vs PGA Gain Figure 5-24. THD vs Input Frequency
-105 33
RS = 0 30
RS = 2 x 300
-110 RS = 2 x 660 27
RS = 2 x 1000 24
-115
Population (%)
21
THD (dB)
18
-120 15
12
-125 9
6
-130 3
0
1
1.4
1.8
2.2
2.6
3.4
3.8
4.2
4.6
-135
0.5 1 10 70
Gain (0.5 value represents buffer operation) PGA Input Current Noise Density (pA/Hz)
20 800
AINP TA = -40C AINN TA = -40C AINP TA = -40C AINN TA = -40C
10 AINP TA = 25C AINN TA = 25C 600 AINP TA = 25C AINN TA = 25C
0 AINP TA = 85C AINN TA = 85C AINP TA = 85C AINN TA = 85C
400
-10
Input Current (nA)
-30 0
-40 -200
-50
-400
-60
-70 -600
-80 -800
-2.5 -2 -1.5 -1 -0.5 0 0.5 1 1.5 2 2.5 -2.5 -2 -1.5 -1 -0.5 0 0.5 1 1.5 2 2.5
Differential Input Voltage (V) Differential Input Voltage (V)
Figure 5-27. PGA Input Current vs Input Voltage Figure 5-28. Buffer Input Current vs Input Voltage
210 50
45
205 40
Reference Input Current (A)
35
200
Population (%)
30
25
195
20
190 15
10
185 5
0
170
175
180
185
190
195
200
205
210
220
230
180
-40 -20 0 20 40 60 80
Temperature (C) Reference Input Current (A)
30 units
Figure 5-29. Reference Input Current vs Temperature Figure 5-30. Reference Input Current Distribution
160 100
AVDD1 buffer operation
90 AVDD1 PGA operation
140 80 AVDD2
70
120
Population (%)
60
CMRR (dB)
50
100
40
80 30
20
60 10
PGA gain = 1
Buffer operation 0
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
40
10 100 1000 10000 100000 1000000
Common-Mode Input Frequency (Hz) AVDD1, AVDD2 Supply Current (mA)
30 units
Figure 5-31. CMRR vs Common-Mode Input Frequency Figure 5-32. Power-Supply Current Distribution
1.2 140
AVDD1 buffer operation
AVDD1 PGA operation 120
1 AVDD2
AVDD1, AVDD2 Current (mA)
100
0.8
PSRR (dB)
80
0.6
60
0.4
40
0.2 AVDD1
20 AVDD2
IOVDD
0 0
-40 -20 0 20 40 60 80 10 100 1000 10000 100000 1000000
Temperature (C) Power Supply Frequency (Hz)
Figure 5-33. Power-Supply Current vs Temperature Figure 5-34. PSRR vs Power-Supply Frequency
0.35
0.3
IOVDD Current (mA)
0.25
0.2
0.15
0.1
100 500 1000 2000
Data Rate (SPS)
1.768 V
Dynamic Range (dB) = 20×log
Gain × en (1)
where:
• en = Input-referred voltage noise (RMS)
Table 6-1 shows dynamic range and input-referred noise performance, tested with input source resistance (RS) =
0Ω. Noise data are at TA = 25°C and are representative of typical ADC performance. The data are the standard
deviation of 4096 consecutive ADC conversion results with the ADC inputs shorted, measured over the 0.413
× fDATA bandwidth. Because of the statistical nature of noise, repeated measurements can yield varying noise
performance results.
Table 6-1. Noise Performance (AVDD1 = 3.3V or 5V, RS = 0Ω)
DYNAMIC RANGE (dB) en, INPUT-REFERRED NOISE (μVRMS)
GAIN MODE fDATA (SPS) fDATA (SPS)
125 250 500 1000 2000 125 250 500 1000 2000
1 Buffer 128 125 122 119 116 0.70 0.99 1.4 2.0 2.8
1(1) PGA 128 125 122 119 116 0.70 0.99 1.4 2.0 2.8
2 PGA 127 124 121 118 115 0.39 0.56 0.79 1.1 1.6
4 PGA 126 123 120 117 114 0.23 0.32 0.45 0.63 0.89
8 PGA 123 120 117 114 111 0.16 0.22 0.31 0.44 0.62
16 PGA 118 115 112 109 106 0.14 0.20 0.28 0.39 0.55
32 PGA 112 109 106 103 100 0.14 0.20 0.28 0.39 0.55
64 PGA 106 103 100 97 94 0.14 0.20 0.28 0.39 0.55
7 Detailed Description
7.1 Overview
The ADS1288 is a high-resolution, low-power analog-to-digital converter (ADC) designed for applications
in energy exploration, geology, and seismic monitoring where low-power consumption and high resolution
are required. The output data resolution is 32 bits spanning data rates from 125SPS to 2000SPS. The
programmable gain amplifier (PGA) expands the system dynamic range with seven input ranges of ±2.5VPP
to ±0.039VPP.
As illustrated in the Functional Block Diagram, the ADC consists of the following sections: input multiplexer
(MUX), programmable gain amplifier (PGA), unity-gain buffer, delta-sigma (ΔΣ) modulator, sample rate
converter, infinite impulse response (IIR) high-pass filter (HPF), finite impulse response (FIR) low-pass filter
(LPF), and an SPI-compatible serial interface used for both device configuration and conversion data readback.
The input multiplexer selects between inputs 1 and 2, and internal options designed for self-test, including an
input-short connection to test device offset and noise performance.
The input multiplexer is followed by a low-noise PGA. The range of PGA gains is 1 to 16, with gains 32 and 64
implemented as digital gains. The PGA is chopper-stabilized to reduce 1/f noise and input offset voltage. The
PGA output connects to a buffer which drives the modulator. An external 10nF capacitor, connected to PGA
output pins CAPP and CAPN, provides an antialias filter for the input signal.
Disable the PGA to lower device power consumption by operating the ADC with the unity-gain buffer. External
47nF capacitors connected to each buffer output filter the modulator sampling pulses.
The ΔΣ modulator measures the differential input signal (VIN) at the PGA output against the differential reference
voltage (VREF = 2.5V). Modulator data are processed by the digital filter to provide the final conversion result.
The digital filter consists of a sinc filter followed by a programmable phase, FIR low-pass filter, and an IIR
high-pass filter. The high-pass filter removes dc and low-frequency components from the data.
The sample rate converter (SRC) compensates clock signal error by resampling the output data to correct the
output data rate. Write the desired compensation value to the SRC register for data rate correction with up to
7ppb accuracy.
User-programmable gain and offset calibration registers correct offset and gain errors.
The SYNC pin synchronizes the ADC. Synchronization has two modes of operation: pulse synchronization and
continuous synchronization. The RESET pin resets the ADC, including user-configuration settings. The pins are
noise-resistant, Schmitt-trigger inputs to increase reliability in high-noise environments.
The PWDN pin powers down the ADC when not in use. The software power-down mode (STANDBY) is available
through the serial interface
The 4-wire, SPI-compatible, serial interface reads conversion data and reads or writes device register data.
Two general-purpose digital I/Os are available to control external switches for diagnostic tests.
Power for the PGA and buffer is supplied by pins AVDD1 and AVSS. A charge pump voltage regulator increases
the buffer supply voltage to increase input voltage range. Power for the modulator is supplied by the AVDD2 pin.
The digital I/O voltage pin (IOVDD) powers the digital logic core through a 1.8V low-dropout regulator (LDO).
7.2 Functional Block Diagram
AVDD1 CAPC CAPBP CAPBN AVDD2 CAPD IOVDD
1.8 V LDO
Charge (digital core)
Pump
CLK
DRDY
AIN1P
CS
AIN1N Sample Serial
PGA BUF
Digital SCLK
Modulator Rate Filter Interface DOUT
AIN2P MUX
Converter DIN
AIN2N
AVSS
PWDN
GPIO Control RESET
2 x 400 SYNC
VCM
AGND AVSS CAPP CAPN CAPI REFP REFN CAPR GPIO1 GPIO0 DGND
S1
AIN1P
ESD Diodes
S2
AIN2P (+)
400 S3
AVSS
AVDD1 + AVSS To PGA
S7 To Buffer
2
AVDD1
400 S4
S5
AIN1N (-)
ESD Diodes
S6
AIN2N
AVSS
Electrostatic discharge (ESD) diodes are incorporated to protect the ADC inputs from ESD events that occur
during device manufacturing and printed circuit board (PCB) assembly process when assembled in an ESD-
controlled environment. For system-level protection, consider using external ESD protection devices to protect
the input that are exposed to ESD events.
If the inputs are driven below AVSS – 0.3V, or above AVDD1 + 0.3V, the protection diodes can conduct. If
these conditions are possible, use external clamp diodes, series resistors, or both to limit input current to the
specified maximum value. Overdriving an unused input channel can affect the conversion results of the active
input channel. Clamp the overdriven voltage with Schottky diodes to prevent channel crosstalk.
The ADC incorporates two differential input channels. The multiplexer selects between the two differential inputs
for measurement. A test mode to measure noise and offset is also provided by the multiplexer. The shorted input
test configuration is available with or without the 400Ω resistors to simulate the thermal noise generated by an
800Ω geophone. Table 7-1 summarizes the multiplexer configurations.
Table 7-1. Input Multiplexer Modes
MUX[2:0] BITS SWITCHES DESCRIPTION
000 S1, S5 Input AIN1P, AIN1N connection.
001 S2, S6 Input AIN2P, AIN2N connection.
010 S3, S4 400Ω input-short test mode for offset and noise test.
011 S1, S5,S2, S6 Cross-connection test mode. Inputs AIN1P, AIN2P and AIN2P, AIN2N are connected.
100 — Reserved
101 S3,S4,S7 0Ω input-short test mode for offset and noise test.
To test geophone THD performance, apply a test signal to the test channel through series resistors. The series
resistors are typically half the value of the geophone impedance. Select the multiplexer for the cross-connection
test mode (MUX[2:0] = 011b). In cross-connection mode, the test signal is cross-fed to the geophone input.
Geophone THD test performance can be affected by the nonlinear on-resistance of the multiplexer (RSW). Figure
7-2 shows a model of the input multiplexer resistance for the geophone THD test. Figure 7-3 shows THD
performance versus a test resistor (RLOAD) used to simulate geophone resistance. Small amplitude test signals
(such as, VIN = 0.221V), shows less THD performance degradation for geophone resistance < 500Ω.
½ RLOAD
-100
PGA gain = 1, VIN = 1.77 VRMS
PGA gain = 8, VIN = 0.221 VRMS
Test Input2
Signal ½ RLOAD
-105
RSW
THD (dB)
-115
RSW RSW
-120
RLOAD
Input1
-125
0 2000 4000 6000 8000 10000
Resistive Load ()
Figure 7-2. THD versus RLOAD Test Circuit Figure 7-3. THD Performance vs RLOAD
AGND
AVDD1 CAPP CAPN AVDD1 CAPC
Charge
Pump
MUX(+)
+ CAPBP
47 nF, C0G
AVSS
GAIN[2:0] bits
of register CONFIG1
Buffer mode
GAIN[2:0] = 111b Modulator
(address = 02h)
CAPBN
AVSS
AVSS AVSS
The device can be operated with the PGA or the unity-gain buffer. Buffer operation disables the PGA, reducing
device power consumption. Because of the limited input headroom for PGA gain = 1 when operating AVDD1 at
3.3V, the buffer must be used in this condition.
7.3.2.1 Programmable Gain Amplifier (PGA)
The PGA is a low-noise, chopper-stabilized differential amplifier that extends the ADC dynamic range
performance. The PGA provides analog gains from 1 to 16, with gains of 32 and 64 provided by digital scaling.
The PGA output signal is routed to the CAPP and CAPN pins through 270Ω resistors. Connect an external 10nF,
C0G-dielectric capacitor across these pins. An antialias filter is formed by these components to attenuate the
signal level at the modulator aliasing frequency (fMOD).
As illustrated in Figure 7-4, the buffer is used between the PGA and the modulator. Connect two 47nF, C0G-
dielectric capacitors from each buffer output to AVSS (CAPBP and CAPBN). A voltage charge pump increases
the buffer input voltage headroom. Connect an external 4.7nF capacitor between CAPC and AGND for charge
pump operation.
The PGA gain is programmed by the GAIN[2:0] bits of the CONFIG1 register. Table 7-2 shows the PGA gain
settings and buffer selection.
Table 7-2. PGA Gains
GAIN[2:0] REGISTER BITS PGA GAIN INPUT SIGNAL RANGE (VPP)
000 1 ±2.5
001 2 ±1.25
010 4 ±0.625
011 8 ±0.3125
100 16 ±0.15625
101 32 ±0.078125
110 64 ±0.0390625
111 Buffer mode, gain = 1 ±2.5
Observe the PGA input and output voltage headroom specification. Figure 7-5 shows the input and output
voltage headroom when operating with AVDD1 = 5V, an input common-mode voltage (VCM) = 2.5V, a differential
input voltage = ±2.5VPP, and at gain = 1. The absolute minimum and maximum PGA input voltages (1.25V and
3.75V) are ±1/2 of the differential signal voltage plus the common-mode voltage. The PGA provides 0.15V input
voltage margin at the negative peak and 0.4V input voltage margin at the positive peak. The PGA provides 1.1V
output voltage margin at the positive and negative peaks.
PGA Input Headroom PGA Output Headroom
AVDD1 AVDD1
AVDD1 - 0.15 V
AVDD1 - 0.85 V
VCM + 1.25 V VCM + 1.25 V
VCM = 2.5 V
AVSS + 0.15 V
AVSS AVSS
When operating with AVDD1 = 3.3V, the PGA cannot support ±2.5VPP input signals. Use the buffer for ±2.5VPP
input signals. For ±1.25VPP input signals (PGA gain = 2), the input headroom is increased by increasing the
common-mode voltage by 0.1V to AVSS + 1.75V. Figure 7-6 shows the input and output operating headroom for
AVDD1 = 3.3V, VCM = 1.75V, input signal = ±1.25VPP, and gain = 2.
PGA Input Headroom PGA Output Headroom
AVDD1 AVDD1
AVDD1 - 0.15 V
VCM + 1.25 V
AVDD1 - 0.85 V
VCM + 0.6125 V
VCM = 1.75 V
VCM - 0.6125 V
AVSS + 1.1 V
VCM - 1.25 V
AVSS + 0.15 V
AVSS AVSS
VCM = 1.65 V
Regardless of PGA or buffer operation, connect two 47nF, C0G-dielectric capacitors from each buffer output to
AVSS (CAPBP and CAPBN). The voltage charge pump increases the buffer input operating headroom. Connect
an external 4.7nF capacitor between CAPC and AGND for the charge pump operation.
7.3.3 Voltage Reference Input
The ADC requires a reference voltage for operation. The reference voltage input is differential, defined as the
voltage between the REFP and REFN pins: VREF = VREFP – VREFN. Because of the differential input, route
the VREFN trace to the voltage reference ground terminal to avoid ground noise pickup. Use a precision 2.5V
voltage reference with low noise, optimally less than 2μVRMS over the measurement bandwidth.
Figure 7-8 shows the simplified reference input circuit. Similar to the analog inputs, the reference inputs are
protected by ESD diodes. If the reference inputs are driven below AVSS – 0.3V or above AVDD1 + 0.3V, the
protection diodes can conduct. If these conditions are possible, use external clamp diodes, series resistors, or
both to limit the reference input current to the specified value.
AVDD1
CREF
REFP
REFN
AVSS
The ADC samples the reference voltage by an internal capacitor (CREF) and then discharges the capacitor at the
modulator sampling frequency (fMOD). The sampling operation results in transient current flow into the reference
inputs. The transient current is filtered by a 0.1µF ceramic capacitor placed directly at the reference pins with a
larger 10μF to 47μF capacitor at the voltage reference output. In applications where the voltage reference drives
multiple ADCs, use 0.1µF capacitors at each ADC.
The external capacitors filter the current transients, resulting in 80μA/V average reference current. With VREF =
2.5V, the reference input current is 80μA / V × 2.5V = 200μA.
7.3.4 IOVDD Power Supply
The IOVDD digital supply operates in two voltage ranges: 1.65V to 1.95V and 2.7V to 3.6V. If operating IOVDD
in the 1.65V to 1.95V range, connect IOVDD directly to the CAPD pin. Figure 7-9 shows the required connection
if IOVDD is operating in the 1.65V to 1.95V range. Otherwise, if operating IOVDD in the 2.7V to 3.6V range, do
not connect these pins together.
7.3.5 Modulator
The modulator is a multibit delta-sigma architecture featuring low power consumption with very low levels of
spurious tones in the output. The modulator shapes the quantization noise of the internal quantizer to an out-of-
band frequency range where the noise is removed by the digital filter. Noise remaining within the pass-band
region is thermal, with the characteristic of constant noise density (white noise). The total noise in the ADC
output is determined by the digital filter OSR.
7.3.5.1 Modulator Overdrive
The modulator is an inherently stable design and, therefore exhibits predictable recovery from input overdrive.
If the modulator is overdriven at the peaks of the input signal, the filter output data can clip, but not necessarily
so depending on the duration of the signal overdrive resulting from data averaging of the digital filter. If the
modulator is heavily overdriven, then the likelihood of clipped conversion data in the output increases. Be aware
the group delay of the digital filter delays the time of an input overdrive event to the output data.
7.3.6 Digital Filter
The digital filter decimates and filters the modulator data to provide high-resolution output data. By adjusting
the amount of filtering though the OSR, trade-offs can be made between output data noise and bandwidth.
Increasing the OSR reduces output data noise while decreasing the signal bandwidth.
As shown in Figure 7-10, the sample rate converter (SRC) receives data from the modulator prior to the digital
filter block. See the Sample Rate Converter section for details.
SRC
SWBypass IIR Bypass
SW
Final Output Data
The digital filter consists of three sections: a variable-decimation sinc filter; a variable-coefficient, fixed-
decimation FIR filter; and a programmable high-pass filter (IIR). The desired filter sections are selected by
the FILTER[1:0] bits of the CONFIG0 register. The sinc filter provides partially filtered data, bypassing the FIR
and HPF filters and the user calibration stage. For fully filtered data, select the FIR filter option. The IIR filter
stage removes dc and low-frequency data. The FIR and the combined FIR + IIR filter are routed to the user
calibration block and output code clipping block. See the Offset and Gain Calibration section for details of user
calibration.
7.3.6.1 Sinc Filter Section
The first section of the digital filter is a variable-decimation, fifth-order sinc filter (sinx/x). Modulator data are
passed through the sample rate converter to the sinc filter at the nominal rate of fMOD = fCLK / 4 = 1.024MHz.
The sinc filter partially filters the data for the FIR filter that produces the final frequency response. The sinc filter
output data are intended to be used with post-processing filters to shape the final frequency response.
Table 7-3 shows the decimation ratio and the resulting output data rate of the sinc filter. The sinc filter data rate is
programmed by the DR[2:0] bits of the CONFIG0 register.
Table 7-3. Sinc Filter Data Rates
DR[2:0] BITS SINC DECIMATION RATIO (N) DATA RATE (SPS)
000 256 4,000
001 128 8,000
010 64 16,000
011 32 32,000
100 16 64,000
(2)
where:
• N = Decimation ratio of Table 7-3
Equation 3 shows the frequency domain transfer function of the sinc filter.
5
pN ´ f
sin
fMOD
½H(f)½ =
p´f
N sin
fMOD
(3)
where:
• N = Decimation ratio shown in Table 7-3
• f = Input signal frequency
• fMOD = Modulator sampling frequency = fCLK / 4 (sample rate converter disabled)
The sinc filter frequency response has notches (or zeros) occurring at the output data rate and multiples thereof.
At these frequencies, the filter has zero gain. Figure 7-11 shows the wide-band frequency response of the sinc
filter and Figure 7-12 shows the –3dB response.
0 0
-20 -0.5
-40
-1.0
Gain (dB)
Gain (dB)
-60
-1.5
-80
-2.0
-100
-120 -2.5
-140 -3.0
0 1 2 3 4 5 0 0.05 0.10 0.15 0.20
Normalized Frequency (fIN/fDATA) Normalized Frequency (fIN/fDATA)
Figure 7-11. Sinc Filter Frequency Response Figure 7-12. Sinc Filter –3dB Response
Figure 7-13 shows the sinc filter frequency response at fDATA = 32kSPS. The tones at 1kHz and harmonics are
the result of dither added to the modulator input to suppress idle tones. The frequency of the dither signal is
fMOD divided by the combined decimation ratio from Table 7-4. The rise of the noise floor at 2kHz is resultant of
modulator noise shaping. For sinc filter decimation N = 32 (data rate = 32kSPS), the usable bandwidth through
the use of external post filtering is 500Hz.
0
-20
-40
-60
Amplitude (dB)
-80
-100
-120
-140
-160
-180
0 2 4 6 8 10 12 14 16
Frequency (kHz)
The sinc filter data bypasses the data scaling, clip stage, and user calibration stages, and as a result, the sinc
filter data are scaled differently compared to the FIR filter data. See the Conversion Data Format section for
details of sinc filter data scaling.
The first two FIR stages are half-band filters with decimation = 2 in each stage. The third and fourth FIR
stages determine the final frequency and phase response. Decimation is 4 and 2, in stages three and four. The
total decimation ratio of the FIR filter is 32. Different filter coefficient sets in stage 3 and 4 determine linear or
minimum phase filter response. The phase response is selected by the PHASE bit of the CONFIG0 register.
Table 7-4 lists the combined decimation ratio of the sinc and FIR filter stages and the corresponding FIR filter
data rate.
Table 7-4. FIR Filter Data Rate
DR[2:0] BITS COMBINED DECIMATION RATIO DATA RATE (SPS)
000 8192 125
001 4096 250
010 2048 500
011 1024 1000
100 512 2000
Table 7-5 lists the FIR filter coefficients and the data scaling for the linear and minimum phase coefficients.
Table 7-5. FIR Filter Coefficients
STAGE 1 STAGE 2 STAGE 3 STAGE 4
COEFFICIENT SCALE = 1/512 SCALE = 1/8388608 SCALE = 1/134217728 SCALE = 1/134217728
LINEAR PHASE LINEAR PHASE LINEAR PHASE MINIMUM PHASE LINEAR PHASE MINIMUM PHASE
b0 3 –10944 0 819 –132 11767
b1 0 0 0 8211 –432 133882
b2 –25 103807 –73 44880 –75 769961
b3 0 0 –874 174712 2481 2940447
b4 150 –507903 –4648 536821 6692 8262605
b5 256 0 –16147 1372637 7419 17902757
b6 150 2512192 –41280 3012996 –266 30428735
b7 0 4194304 –80934 5788605 –10663 40215494
b8 –25 2512192 –120064 9852286 –8280 39260213
b9 0 0 –118690 14957445 10620 23325925
b10 3 –507903 –18203 20301435 22008 –1757787
b11 0 224751 24569234 348 –21028126
b12 103807 580196 26260385 –34123 –21293602
b13 0 893263 24247577 –25549 –3886901
b14 –10944 891396 18356231 33460 14396783
b15 293598 9668991 61387 16314388
b16 –987253 327749 –7546 1518875
b17 –2635779 –7171917 –94192 –12979500
b18 –3860322 –10926627 –50629 –11506007
Figure 7-15 shows the FIR pass-band frequency response to 0.375 × fDATA with ±0.003dB pass-band ripple.
Figure 7-16 shows the pass-band, transition-band, and stop-band performance from 0Hz to fDATA. The filter is
designed for –135dB stop-band attenuation at the Nyquist frequency.
2.0 20
1.5 0
1.0 -20
Magnitude (mdB)
Magnitude (dB)
-40
0.5
-60
0
-80
-0.5
-100
-1.0
-120
-1.5 -140
-2.0 -160
0 0.05 0.10 0.15 0.20 0.25 0.30 0.35 0.40 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
Normalized Input Frequency (fIN/fDATA) Normalized Input Frequency (fIN/fDATA)
Figure 7-15. FIR Filter Pass-Band Response Figure 7-16. FIR Filter Transition Band Response
As with many sampled systems, the filter response repeats at multiples of the modulator sample rate (fMOD). The
filter response repeats at frequencies = N × fMOD ± f0, where N = 1, 2, and so on, and f0 = filter pass-band). If
present in the signal, these frequencies fold back (or alias) into the pass-band, causing errors. A low-pass input
filter at the input removes the out-of-band signal to reduce the aliasing error. For the low-frequency output signal
typical of many geophones, a single-pole filter at the PGA output is sufficient to reduce aliasing of the geophone
thermal noise.
7.3.6.3 Group Delay and Step Response
The FIR filter offers linear and minimum phase filter options. The pass-band, transition band, and stop-band
responses of the linear and minimum phase filters are the same but differ in phase and step response behavior.
7.3.6.3.1 Linear Phase Response
A linear phase filter has the unique property that the delay from input to output is constant across all input
frequencies (that is, constant group delay). The constant delay property is independent of the nature of the input
signal (impulse or swept-tone), and therefore the phase is linear across frequency, which can be important when
analyzing multitone signals. However, as shown in Figure 7-17, the group delay is longer for the linear phase
filter compared to minimum phase. For both the linear and minimum filters, fully settled data are available 62
conversions after a step input change occurs.
1.4
Minimum Phase Filter
1.2
1.0
Amplitude (dB)
0.8
0.6
0.4
0.2
Linear Phase Filter
0
-0.2
0 5 10 15 20 25 30 35 40 45 50 55 60 65
Time Index (1/fDATA)
20
15
10
Minimum Phase Filter
5
0 20 40 60 80 100 120 140 160 180 200
Frequency (Hz)
2-a 1 - z-1
H(z) =
2 1 - (1 - a)z-1 (4)
where:
2sin(&N)
a=
cos(&N) + sin(&N)
•
• ωN = π × fC / fDATA (normalized corner frequency, radians)
• fC = Corner frequency (Hz)
• fDATA = Output data rate (Hz)
Be aware the corner frequency programming is a function of fDATA. As shown by Equation 5, the value written to
the HPF1, HPF0 registers is value a, computed by Equation 4, × 216.
The HPF accumulates data to perform the high-pass function. Similar to the operation of an analog HPF after a
dc step change is applied to the input, the filter takes time to accumulate data to remove dc from the signal. The
lower the corner frequency, the longer the filter takes to settle.
To shorten the HPF settling time, the offset register is used as a seed value for the HPF accumulator. The
accumulator is loaded with the offset register each time the HPF state is changed from disabled to enabled. The
offset register can be preset with an estimated value, or a calibrated value if the dc level is known. To improve
accuracy, scale the offset value by the inverse value of GAIN[3:0] / 400000h. The normal offset operation is
disabled when the HPF is enabled.
To initialize the HPF accumulator with the OFFSET[2:0] registers:
1. Disable the HPF.
2. Write the desired value to the OFFSET[2:0] registers.
3. Enable the HPF. OFFSET[2:0] is loaded to the HPF data accumulator.
4. The HPF tracks the remaining dc value from the signal.
Subsequent writes to the OFFSET[2:0] registers are ignored. To reload the contents of the OFFSET[2:0]
registers to the HPF, disable and re-enable the HPF.
7.3.7 Clock Input
A clock signal is required for operation. The clock signal is applied to the CLK pin at 4.096MHz. As with many
precision data converters, a low-jitter clock is required to achieve data sheet performance. Avoid the use of R-C
clock oscillators. A crystal-based clock source is recommended. Avoid ringing on the clock signal by placing a
series resistor in the clock PCB trace to source-terminate. Keep the clock signal routed away from other clock
signals, input pins, and analog components.
7.3.8 GPIO
The ADC provides two general-purpose I/O (GPIO) pins that can be used as digital inputs or outputs. The GPIO
voltage levels are IOVDD and DGND. Figure 7-19 illustrates the GPIO block diagram.
The GPIOs are programmed by the GPIO register. The GPIOs are programmed as an input or output by the
GPIOx_DIR bits. The GPIO state is read or written by the GPIOx_DAT bits. When programmed as an output,
reading the GPIOx_DAT bits returns the register bit value previously written. If the GPIOs are unused, terminate
the GPIOs with pulldown resistors to prevent the pins from floating.
Write SW
GPIO0_DAT bit 3 of GPIO GPIO0
(register address = 0Bh)
0: GPIO0 data is low
1: GPIO0 data is high 100 k
Read
Write SW
DGND
Resynchronize the ADC after the sample rate converter is enabled or disabled.
Because the SRC is a digital function, operation is deterministic without error. When the target compensation
value is determined, the value can be immediately written to the ADC, or incrementally written up to the
determined value to reduce the effect of step changes in the output frequency. Because two bytes are used for
the SRC registers, use the multibyte command operation to write to the SRC registers and complete the write
operation 256 CLK cycles before the DRDY falling edge. This procedure simultaneously loads the high and low
bytes for compensation. See Figure 5-7 for details.
GAIN[23:0]
Output = (Input - OFFSET[23:0])
400000h (6)
offset bypassed in HPF mode SW
+ output data
from digital filter X
clipped to 32 bits final output
-
OFFSET[23:0] GAIN[23:0]
400000h
CS
8
SCLK
DOUT 00h
7.5 Programming
7.5.1 Serial Interface
Conversion data are read and ADC configuration is made through the SPI-compatible serial interface. The
interface consists of four signals: CS, SCLK, DIN, and DOUT. DRDY asserts low when conversion data are
ready. The serial interface is passive (peripheral mode), where the serial clock (SCLK) is an input. The ADC
operates in SPI mode 0, where CPOL = 0 and CPHA = 0. In mode 0, SCLK idles low and data are updated on
the SCLK falling edges and are read on the SCLK rising edges.
8/fCLK
DRDY
(1) Excluding the effects of reference voltage error, noise, linearity, offset, and gain errors.
(2) Because of the low values of OSR, full 32-bit resolution is not available in sinc filter mode. When the input signal is overdriven, the sinc
filter continues to output code values beyond the nominal full-scale values until clipped when the modulator saturates.
7.5.3 Commands
Table 7-11 lists the commands for the ADC. Most commands are one byte in length. However, the number
of bytes for the register read and write commands depend on the amount of register data specified in the
command.
Table 7-11. Command Descriptions
MNEMONIC TYPE DESCRIPTION BYTE 1(1) BYTE 2
WAKEUP Control Wake from standby mode or NOP 0000 000x (00h or 01h) —
STANDBY Control Enter standby (software power-down mode) 0000 001x (02h or 03h) —
SYNC Control Synchronize 0000 010x (04h or 5h) —
RESET Control Reset 0000 011x (06h or 07h) —
RDATA Data Read conversion data 0001 0010 (12h) —
RREG Register Read nnnn registers beginning at address rrrr 0010 rrrr (20h + rrrr)(2) 0000 nnnn (00h + nnnn)(3)
WREG Register Write nnnn registers beginning at address rrrr 0100 rrrr (40h + rrrr)(2) 0000 nnnn (00h + nnnn)(3)
OFSCAL Calibration Offset calibration 0110 0000 (60h) —
GANCAL Calibration Gain calibration 0110 0001 (61h) —
CS
8
SCLK
DIN Command
DRDY
CS
8 16 24 32
SCLK
DRDY
CS
8 16 24 32 40
SCLK
DOUT 00h MSB Data MSB-1 Data MSB-2 Data LSB Data
the opcode added to the register starting address, and the second byte is the number of registers to read minus
one.
• First command byte: 0010 rrrr, where rrrr is the starting register address
• Second command byte: 0000 nnnn, where nnnn is the number of registers to read minus one
Figure 7-26 shows an example of a three-register read operation starting at register address 01h. The first
register data appears on DOUT at the 16th falling edge of SCLK. The data are latched on the rising edge of
SCLK.
CS
8 16 24 32 40
SCLK
DOUT GRQ¶W FDUH GRQ¶W FDUH Reg 01h Data Reg 02h Data Reg 03h Data
8 16 24 32 40
SCLK
DIN 41h 02h Reg 01h Data Reg 02h Data Reg 03h Data
8 Register Map
Collectively, the registers contain all the information needed to configure the device (such as data rate, filter
mode, specific reference voltage, and so on). The registers are accessed by the read and write commands
(RREG and WREG). Registers can be accessed individually, or accessed in multiples given by the number of
registers specified in the command field.
Changes made to certain register bits result in a filter reset, thus requiring resynchronization of the ADC. See the
Synchronization section for details.
Table 8-1. Register Map
ADDRESS REG LINK RESET BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
00h ID/SYNC xxxx0010b REVID[3:0] DEVID[2:0] SYNC
01h CONFIG0 10010010b RESERVED DR[2:0] PHASE FILTR[1:0]
02h CONFIG1 00010000b MUX[2:0] RESERVED GAIN[2:0]
03h HPF0 00110010h HPF[7:0]
04h HPF1 00000011b HPF[15:8]
05h OFFSET0 00000000b OFFSET[7:0]
06h OFFSET1 00000000b OFFSET[15:8]
07h OFFSET2 00000000b OFFSET[23:16]
08h GAIN0 00000000b GAIN[7:0]
09h GAIN1 00000000b GAIN[15:8]
0Ah GAIN2 01000000b GAIN[23:16]
0Bh GPIO 000xx000b RESERVED GPIO1_DAT GPIO0_DAT GPIO1_DIR GPIO0_DIR RESERVED
0Ch SRC0 00000000b SRC[7:0]
0Dh SRC1 10000000b SRC[15:8]
8.1.1 ID/SYNC: Device ID, SYNC Register (Address = 00h) [Reset = xxxx0010b]
Figure 8-1. ID/SYNC Register
7 6 5 4 3 2 1 0
REVID[3:0] DEVID[2:0] SYNC
R-xxxxb R-001b R/W-0b
8.1.4 HPF0, HPF1: High-Pass Filter Registers (Address = 03h, 04h) [Reset = 32h, 03h]
Figure 8-4. HPF0 Register
7 6 5 4 3 2 1 0
HPF[7:0]
R/W-32h
8.1.8 SRC0, SRC1: Sample Rate Converter Registers (Address = 0Ch, 0Dh) [Reset = 00h, 80h]
Figure 8-13. SRC0 Register
7 6 5 4 3 2 1 0
SRC[7:0]
R/W-00h
C13 C14
1 F 0.1 F
11 12
AVDD1 AVDD2
3.3 V
ADS1288
U2 19
IOVDD
C15 C16
5V 0.1 F 1 F
1 17
AINP1 CAPD
C17
DAC SPI DAC1282 0.22 F
2
AINN1
20
D3,D4 CLK Clock Input
BAS70 14 21
CAPI CS
C12 23
0.1 µF DIN
ADC SPI
5V 24 R10
DOUT
R3 R5 22
100 100
SCLK
3 25 R11
AINP2 DRDY
R1 C1 26
20 k
C3 SYNC
100 pF C0G 1000 pF 27
Geophone RESET
C0G Control
R2 R4 C2 R6 28
20 k 100 100 PWDN
100 pF C0G 4
AINN2 15
GPIO0
16 R12
D1,D2 5 GPIO1 100 k
TVS0701 CAPP R13
C11 7 100 k
Optional ESD CAPBP
10 nF C18
Protection C0G 6
CAPN 47 nF
C0G
5V C4
C5 –
0.1 µF 31 8
CAPR CAPBN
0.1 µF C10 C19
+ 2.5 V 47 nF
0.1 µF
U1 C0G
R7
OPA391 100 k
5V 9
CAPC C20
VIN U3 30 4.7 nF
EN F REFP
SS
REF6225 S
C6 FLT
C8
R9 10 F C9
1 F 120 k THERMAL
C7 R8 60 m 0.1 F
1 F 29 PAD
REFN
10
AVSS
32
AGND DGND
13 18
21
18
15
12
9
6
3
0
1
1.4
1.8
2.2
2.6
3.4
3.8
4.2
4.6
The analysis data is over a 206Hz noise bandwidth (fDATA = 500SPS). The data shows the greatest of the total
noise increase compared to ADC noise alone is with 5000Ω geophone source resistance, PGA gain = 16, and
in = 3pA/√Hz. The 1000Ω geophone source resistance shows an insignificant noise increase under the same
condition.
9.3 Power Supply Recommendations
The ADC has four power supplies: AVDD1, AVDD2, AVSS, and IOVDD. Among the power-supply options, the
number of power supplies can be reduced to a single 3.3V supply used for AVDD1, AVDD2, and IOVDD, with
AVSS connected to ground. Be aware that 3.3V operation requires using the buffer for gain = 1.
The power supplies can be sequenced in any order. The ADC is held in reset until the power supplies have
crossed the retrospective power-on voltage thresholds and the clock signal is applied (see Figure 5-8 for details
of the voltage thresholds).
9.3.1 Analog Power Supplies
The ADC has three analog power supplies, AVDD1, AVDD2, and AVSS, all of which must be well regulated
and free from switching power-supply noise (voltage ripple < 1mV). The AVDD1 power-supply voltage is relative
to AVSS and powers the PGA and buffer. AVSS is the negative power supply. The ADC can be configured
for single-supply operation with AVDD1 = 5V or 3.3V with AVSS connected to ground. Because the minimum
voltage of AVDD1 to AGND = 2.375V, dual-supply operation is only possible when AVDD1 – AVSS = ±2.5V.
Single-power supply operation requires a level-shift voltage at the geophone input through the input termination
resistors. The level-shift voltage is typically equal to AVDD1 / 2. Bypass AVDD1 with 1μF and 0.1μF parallel
capacitors to AVSS.
The AVDD2 power-supply powers the modulator. To simplify system power management, AVDD2 can be
connected to AVDD1, regardless whether AVDD1 and AVSS are configured for single- or dual-supply operation
(AVDD2 voltage range is 2.375V to 5.25V with respect to AGND). Bypass AVDD2 with 1μF and 0.1μF parallel
capacitors to AGND.
9.3.2 Digital Power Supply
IOVDD is the digital power supply. IOVDD is the digital pin I/O voltage and also powers the digital core by a
1.8V low-dropout regulator (LDO). The LDO output is the CAPD pin and is bypassed with a 0.22µF capacitor
to DGND. Do not externally load the CAPD voltage output. Bypass the IOVDD pin with 1μF and 0.1μF parallel
capacitors to DGND.
If IOVDD is in the range of 1.65V to 1.95V, tie the IOVDD and CAPD pins together. This connection forces the
internal LDO off, thereby the IOVDD voltage now directly powers the digital core. Pay close attention to the
absolute maximum voltage rating of IOVDD driving the CAPD pin to avoid damaging the device.
9.3.3 Grounds
The ADC has two ground pins, AGND and DGND. Connect the AGND and DGND pins together at the ADC to a
single ground plane using short direct connections.
5V
DAC1282
C7 R9 U3
Test Signal REF6225
C6
5V
U1
C4
OPA391
C8 R8
D3
BAS70 R7
5V
C10 C9
C5 PWDN
RESET
D1 R11 SYNC
TVS0701 R3 - C1 R5 R10 DRDY
R1
DOUT
Signal DIN
C3 ADS1288 SCLK
Input U2 CS
CLK
C11 3.3 V
R2 R4 C2 R6
D2 IOVDD
C15 C16
TVS0701
C17
C18
D4 C14
C20 GPIO1
BAS70 C13
C12
R13
C19
GPIO0
5V R12
5V
AVDD1, AVDD2
10.5 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
11 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
DATE REVISION NOTES
February 2024 * Initial Release
www.ti.com 8-Mar-2024
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
ADS1288IRHBR ACTIVE VQFN RHB 32 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ADS Samples
1288
ADS1288IRHBT ACTIVE VQFN RHB 32 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 ADS Samples
1288
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 8-Mar-2024
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 8-Mar-2024
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 8-Mar-2024
Width (mm)
H
W
Pack Materials-Page 2
GENERIC PACKAGE VIEW
RHB 32 VQFN - 1 mm max height
5 x 5, 0.5 mm pitch PLASTIC QUAD FLATPACK - NO LEAD
Images above are just a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4224745/A
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PACKAGE OUTLINE
RHB0032E SCALE 3.000
VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
5.1 B
A
4.9
5.1 (0.1)
4.9
C
1 MAX
SEATING PLANE
0.05
0.00 0.08 C
2X 3.5
3.45 0.1 (0.2) TYP
9 16 EXPOSED
THERMAL PAD
28X 0.5
8
17 SEE SIDE WALL
DETAIL
2X SYMM
33
3.5
0.3
32X
0.2
24 0.1 C A B
1
0.05 C
32 25
PIN 1 ID SYMM
(OPTIONAL) 0.5
32X
0.3
4223442/B 08/2019
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
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EXAMPLE BOARD LAYOUT
RHB0032E VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
( 3.45)
SYMM
32 25
32X (0.6)
1 24
32X (0.25)
(1.475)
28X (0.5)
33 SYMM
(4.8)
( 0.2) TYP
VIA
8 17
(R0.05)
TYP
9 16
(1.475)
(4.8)
SOLDER MASK
METAL OPENING
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
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EXAMPLE STENCIL DESIGN
RHB0032E VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
4X ( 1.49)
(R0.05) TYP (0.845)
32 25
32X (0.6)
1 24
32X (0.25)
28X (0.5)
(0.845)
SYMM
33
(4.8)
8 17
METAL
TYP
9 16
SYMM
(4.8)
4223442/B 08/2019
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
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