MI 3394 - CE Multitester XA ANG Ver 3.10.22 20752432

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CE MultiTesterXA

MI 3394
Instruction manual
Ver. 3.10.22, Code no.20 752 432
Distributor:

Manufacturer:

Metrel d.d.
Ljubljanska cesta 77
SI-1354 Horjul
Slovenia
https://www.metrel.si
info@metrel.si

DATA BACKUP AND LOSS:

It is the user’s responsibility to ensure the integrity and security of the data carrier and to
regularly backup and validate the integrity of backups of the data. METREL HAS NO
OBLIGATION OR LIABILITY FOR ANY LOSS, ALTERATION, DESTRUCTION, DAMAGE,
CORRUPTION OR RECOVERY OF USER DATA, REGARDLESS OF WHERE THE DATA IS
STORED.

Mark on your equipment certifies that it meets requirements of all subjected EU


regulations.

Hereby, Metrel d.d. declares that the MI 3394 is in compliance with Directive
2014/53/EU (RED) and all other subjected EU directive. The full text of the EU
declaration of conformity is available at the following internet address
https://www.metrel.si/DoC.

© 2022 METREL

The trade names Metrel®, Smartec®, Eurotest®, Auto Sequence® are trademarks registered in Europe and other
countries.

No part of this publication may be reproduced or utilized in any form or by any means without
permission in writing from METREL.

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i. About the Instruction manual
 Version note: Ver. 3.1.6 relates to HW 3 version.
 This Instruction manual contains detailed information on the CE MultiTesterXA, its key
features, functionalities and use.
 It is intended for technically qualified personnel responsible for the product and its use.
 Please note that LCD screenshots in this document may differ from the actual instrument
screens in details due to firmware variations and modifications.
 Version note: Ver. 3.3.12 has added reference to EN 61180 standard.
 Version note: Ver. 3.6.15 and higher relates to HW 5 version.
 We reserve the right to make technical modifications without notice as part of the further
development of the product.

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MI 3394 CE MultiTesterXA Table of contents

TABLE OF CONTENTS
1 General description....................................................................................................... 7
1.1 Warnings and notes .................................................................................................... 7
1.1.1 Safety warnings ....................................................................................................... 7
1.1.2 Warnings related to safety of measurement functions ............................................. 7
1.1.2.1 HV AC, HV DC, HV AC programmable, HV DC programmable ....................... 8
1.1.2.2 Diff. Leakage, Ipe Leakage, Touch Leakage, Power, Leak’s & Power ............. 8
1.1.2.3 Insulation resistance........................................................................................ 8
1.1.3 Markings on the instrument ..................................................................................... 8
1.2 Standards applied ....................................................................................................... 9
2 Instrument set and accessories ................................................................................. 10
2.1 Standard set of the instrument .................................................................................. 10
2.2 Optional accessories ................................................................................................. 10
3 Instrument description................................................................................................ 11
3.1 Front panel ................................................................................................................ 11
4 Instrument operation .................................................................................................. 13
4.1 General meaning of keys .......................................................................................... 13
4.2 General meaning of touch gestures:.......................................................................... 13
4.3 Safety checks ............................................................................................................ 14
4.4 Symbols and messages ............................................................................................ 14
4.5 Instrument main menu............................................................................................... 18
4.6 General settings ........................................................................................................ 19
4.6.1 Language .............................................................................................................. 20
4.6.2 Date and time ........................................................................................................ 20
4.6.3 Profiles .................................................................................................................. 20
4.6.4 Workspace Manager ............................................................................................. 20
4.6.5 Auto Sequence® groups ........................................................................................ 21
4.6.6 User accounts ....................................................................................................... 21
4.6.6.1 Signing in ...................................................................................................... 21
4.6.6.2 Changing user password, signing out ............................................................ 22
4.6.6.3 Managing accounts ....................................................................................... 23
4.6.6.4 Edit user accounts ......................................................................................... 25
4.6.6.5 Setting Blackbox password ........................................................................... 27
4.6.7 Change password for HV functions ....................................................................... 27
4.6.8 Settings ................................................................................................................. 28
4.6.9 Devices ................................................................................................................. 30
4.6.10 Initial Settings ........................................................................................................ 31
4.6.11 About..................................................................................................................... 31
4.7 Instrument profiles ..................................................................................................... 32
4.8 Workspace Manager ................................................................................................. 32
4.8.1 Workspaces and Exports....................................................................................... 32
4.8.2 Workspace Manager main menu ........................................................................... 33
4.8.2.1 Operations with Workspaces ......................................................................... 34
4.8.2.2 Operations with Exports ................................................................................ 34
4.8.2.3 Adding a new Workspace .............................................................................. 35
4.8.2.4 Opening a Workspace ................................................................................... 36
4.8.2.5 Deleting a Workspace / Export ...................................................................... 36
4.8.2.6 Importing a Workspace.................................................................................. 37
4.8.2.7 Exporting a Workspace ................................................................................. 38

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MI 3394 CE MultiTesterXA Table of contents

4.9 Auto Sequence® groups ............................................................................................ 39


4.9.1 Auto Sequence® groups menu ............................................................................... 39
4.9.1.1 Operations in Auto Sequence® groups menu ................................................. 39
4.9.1.2 Selecting a group of Auto Sequences® .......................................................... 40
4.9.1.3 Deleting a group of Auto Sequences® ........................................................... 40
5 Memory Organizer ....................................................................................................... 42
5.1 Memory Organizer menu ........................................................................................... 42
5.1.1 Measurement statuses .......................................................................................... 43
5.1.2 Structure Objects................................................................................................... 44
5.1.2.1 Measurement status indication under the Structure object ............................ 44
5.1.3 Selecting an active Workspace in Memory Organizer ............................................ 45
5.1.4 Adding Nodes in Memory Organizer ...................................................................... 46
5.1.5 Operations in Tree menu ....................................................................................... 47
5.1.5.1 Operations on measurements (finished or empty measurements) ................. 47
5.1.5.2 Operations on Structure objects .................................................................... 48
5.1.5.3 View / Edit parameters and attachments of a Structure object ....................... 50
5.1.5.4 Add a new Structure Object ........................................................................... 51
5.1.5.5 Add a new measurement............................................................................... 52
5.1.5.6 Clone a Structure object ................................................................................ 53
5.1.5.7 Clone a measurement ................................................................................... 54
5.1.5.8 Copy & Paste a Structure object .................................................................... 54
5.1.5.9 Cloning and Pasting sub-elements of selected structure object ..................... 56
5.1.5.10 Copy & Paste a measurement ....................................................................... 56
5.1.5.11 Cut & Paste a Structure object with sub-items ............................................... 57
5.1.5.12 Delete a Structure object ............................................................................... 58
5.1.5.13 Delete a measurement .................................................................................. 58
5.1.5.14 Rename a Structure object ............................................................................ 60
5.1.5.15 Recall and Retest selected measurement ..................................................... 60
5.1.6 Searching in Memory Organizer ............................................................................ 62
6 Single tests .................................................................................................................. 65
6.1 Selection of single tests............................................................................................. 65
6.1.1 Single test screens ................................................................................................ 67
6.1.1.1 Single test start screen .................................................................................. 67
6.1.1.2 Setting parameters and limits of single tests .................................................. 68
6.1.1.3 Single test screen during test ........................................................................ 69
6.1.1.4 Single test result screen ................................................................................ 70
6.1.1.5 Single test memory screen ............................................................................ 71
6.1.2 Single test (inspection) screens ............................................................................. 72
6.1.2.1 Single test (inspection) start screen ............................................................... 72
6.1.2.2 Single test (Inspection) screen during test ..................................................... 73
6.1.2.3 Single test (Inspection) result screen ............................................................. 74
6.1.2.4 Single test (inspection) memory screen ......................................................... 75
6.1.3 Help screens ......................................................................................................... 76
6.2 Single test measurements ......................................................................................... 77
6.2.1 Visual inspections.................................................................................................. 77
6.2.2 Continuity .............................................................................................................. 78
6.2.2.1 Compensation of test leads resistance .......................................................... 80
6.2.2.2 Limit Calculator ............................................................................................. 81
6.2.3 HV AC ................................................................................................................... 83
6.2.4 HV DC ................................................................................................................... 84
6.2.5 HV AC programmable ........................................................................................... 86
6.2.6 HV DC programmable ........................................................................................... 89
6.2.7 Insulation resistance (Riso, Riso-S) ....................................................................... 91

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MI 3394 CE MultiTesterXA Table of contents

6.2.8 Sub-leakage (Isub, Isub-S) .................................................................................... 93


6.2.9 Differential Leakage .............................................................................................. 95
6.2.10 Ipe Leakage .......................................................................................................... 97
6.2.11 Touch Leakage...................................................................................................... 99
6.2.12 Power .................................................................................................................. 100
6.2.13 Leak's & Power ................................................................................................... 103
6.2.14 Discharging Time ................................................................................................ 105
6.2.15 Functional inspections ......................................................................................... 108
7 Auto Sequences® ...................................................................................................... 110
7.1 Selection of Auto Sequences® ................................................................................. 110
7.1.1 Selecting an active Auto Sequence® group in Auto Sequences® menu ............... 110
7.1.2 Searching in Auto Sequences® menu .................................................................. 111
7.1.3 Structure organization of Auto Sequence® group ................................................. 113
7.2 Organization of Auto Sequence® tests..................................................................... 114
7.2.1 Auto Sequence® view menu ................................................................................ 114
7.2.1.1 Auto Sequence® view menu (header is selected) ........................................ 114
7.2.1.2 Auto Sequence® view menu (measurement is selected) .............................. 115
7.2.1.3 Auto Sequence® Configurator menu ............................................................ 116
7.2.1.4 Indication of Loops ...................................................................................... 117
7.2.1.5 Managing multiple points ............................................................................. 117
7.2.2 Step by step execution of Auto Sequences® ....................................................... 117
7.2.3 Auto Sequence® result screen ............................................................................. 119
7.2.4 Auto Sequence® memory screen......................................................................... 121
8 Maintenance .............................................................................................................. 122
8.1 Periodic calibration .................................................................................................. 122
8.2 Fuses ...................................................................................................................... 122
8.3 Service .................................................................................................................... 122
8.4 Cleaning .................................................................................................................. 122
9 Communications ....................................................................................................... 123
9.1 USB and RS232 communication with PC ................................................................ 123
9.2 Bluetooth communication ........................................................................................ 123
9.3 Bluetooth communication with printers and scanners .............................................. 124
9.4 Ethernet communication .......................................................................................... 124
9.5 RS232 communication with other external devices ................................................. 124
9.6 Connections to test adapters ................................................................................... 124
9.6.1 Test connector TC1 ............................................................................................. 124
9.7 INPUTs ................................................................................................................... 125
9.8 OUTPUTs ............................................................................................................... 127
10 Technical specifications ........................................................................................... 128
10.1 HV AC, HV AC programmable ................................................................................ 128
10.2 HV DC, HV DC programmable ................................................................................ 128
10.3 Continuity ................................................................................................................ 129
10.4 Insulation Resistance, Insulation Resistance-S ....................................................... 130
10.5 Substitute Leakage Current, Substitute Leakage Current - S .................................. 130
10.6 Differential Leakage current .................................................................................... 131
10.7 PE leakage current .................................................................................................. 131
10.8 Touch leakage current............................................................................................. 131
10.9 Power ...................................................................................................................... 132
10.10 Leak’s & Power ....................................................................................................... 133
10.11 Discharging time ..................................................................................................... 135
10.12 General data ........................................................................................................... 135

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MI 3394 CE MultiTesterXA Table of contents

Appendix A - Structure objects in CE MultiTesterXA ......................................................... 137


Appendix B - Profile Notes................................................................................................... 138
Appendix C - Print labels and write / read RFID / NFC tags ............................................... 139
C.1 PAT tag format ........................................................................................................ 139
C.2 Generic tag format .................................................................................................. 139
Appendix D - Default list of Auto Sequences® .................................................................... 141
Appendix E - Programming of Auto Sequences® on Metrel ES Manager ......................... 142
E.1 Auto Sequence® Editor workspace .......................................................................... 142
E.2 Managing of Auto Sequence® groups ...................................................................... 143
E.2.1 Auto Sequence® Name, Description and Image editing ....................................... 145
E.2.2 Search within selected Auto Sequence® group .................................................... 146
E.3 Elements of an Auto Sequence® ............................................................................. 147
E.3.1 Auto Sequence® steps......................................................................................... 147
E.3.2 Single tests.......................................................................................................... 147
E.3.3 Flow commands .................................................................................................. 147
E.3.4 Number of measurement steps ........................................................................... 147
E.4 Creating / modifying an Auto Sequence® ................................................................ 148
E.5 Description of flow commands................................................................................. 149
E.6 Custom Inspections programming ........................................................................... 154
E.6.1 Creating and editing Custom Inspections ............................................................ 154
E.6.2 Applying Custom Inspections .............................................................................. 156

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MI 3394 CE MultiTesterXA General description

1 General description

1.1 Warnings and notes

Read before use

1.1.1 Safety warnings


In order to reach high level of operator safety while carrying out various measurements using
the CE MultiTesterXA instrument, as well as to keep the test equipment undamaged, it is
necessary to consider the following general warnings:

 Read this Instruction manual carefully, otherwise use of the instrument may be
dangerous for the operator, for the instrument or for the equipment under test!
 Consider warning markings on the instrument!
 If the test equipment is used in manner not specified in this Instruction manual the
protection provided by the equipment may be impaired!
 Do not use the instrument and accessories if any damage is noticed!
 Regularly check the instrument and accessories for correct functioning to avoid
hazard that could occur from misleading results.
 Consider all generally known precautions in order to avoid risk of electric shock
while dealing with hazardous voltages!
 Use only standard or optional test accessories declared for this instrument and
supplied by your distributor!
 Only test adapters provided or approved by Metrel should be connected to TC1
(test and communication) connectors.
 Use only earthed mains outlets to supply the instrument!
 In case a fuse has blown refer to chapter 8.2 Fuses in this Instruction manual to
replace it!
 Calibration, adjustment and repairing of the instrument is allowed to be carried
out only by a competent authorized person!
 Metrel is not responsible for the content of the user-programmed Auto
Sequences®!

1.1.2 Warnings related to safety of measurement functions

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MI 3394 CE MultiTesterXA General description

1.1.2.1 HV AC, HV DC, HV AC programmable, HV DC programmable

 A dangerous voltage up to 5.1 kVAC or 6 kVDC is applied to the HV instrument outputs


during the test. Therefore, special safety consideration must be taken when
performing this test!
 Only a skilled person familiar with hazardous voltages can perform this
measurement!
 DO NOT perform this test if any damage or abnormality (test leads, instrument) is
noted!
 Never touch exposed probe tip, connections equipment under test or any other
energized part during the measurements. Make sure that NOBODY can contact them
either!
 DO NOT touch any part of test probe in front of the barrier (keep your fingers behind
the finger guards on the probe) – possible danger of electric shock!
 It is a good practice to use lowest possible trip-out current.

1.1.2.2 Diff. Leakage, Ipe Leakage, Touch Leakage, Power, Leak’s & Power

 Load currents higher than 10 A can result in high temperatures of fuse holders and
On/Off switch! It is advisable not to run tested devices with load currents above 10 A
for more than 15 minutes. Recovery period for cooling is required before proceeding
with tests! Maximum intermittent duty cycle for measurements with load currents
higher than 10 A is 50 %.

1.1.2.3 Insulation resistance

 Do not touch the test object during the measurement or before it is fully discharged!
Risk of electric shock!

1.1.3 Markings on the instrument

 Read the Instruction manual with special care to safety operation«. The
symbol requires an action!

 Dangerous high voltage is present on terminals during the test. Consider all
precautions in order to avoid risk of electric shock.

 Mark on your equipment certifies that this equipment meets requirements of


all subjected EU regulations.

 This equipment shall be recycled as electronic waste.

8
MI 3394 CE MultiTesterXA General description

1.2 Standards applied


The CE MultiTesterXA instrument is manufactured and tested according to the following
regulations, listed below.

Electromagnetic compatibility (EMC)

EN 61326-1 Electrical equipment for measurement, control and laboratory use - EMC
requirements – Part 1: General requirements

Safety (LVD)

EN 61010-1 Safety requirements for electrical equipment for measurement, control, and
laboratory use – Part 1: General requirements
EN 61010-2-030 Safety requirements for electrical equipment for measurement, control and
laboratory use – Part 2-030: Particular requirements for testing and
measuring circuits
EN 61010-031 Safety requirements for electrical equipment for measurement, control and
laboratory use – Part 031: Safety requirements for hand-held probe
assemblies for electrical measurement and test
EN 61557 Electrical safety in low voltage distribution systems up to 1 000 V a.c. and 1
500 V d.c. – Equipment for testing, measuring or monitoring of protective
measures
Instrument complies with all relevant parts of EN 61557 standards.

Functionality

EN 60204-1 Safety of machinery - Electrical equipment of machines - Part 1: General


requirements
EN 60335 Household and similar electrical appliances
EN 60598 Safety of lighting equipment
EN 60950 Information technology equipment – Safety
EN 61010 Safety requirements for electrical equipment for measurement, control, and
laboratory use
EN 61180 High-voltage test techniques for low-voltage equipment - Definitions, test
and procedure requirements, test equipment
EN 61439 Low-voltage switchgear and controlgear assemblies
IEC 62368-1 Audio/video, information and communication technology equipment –
Part 1: Safety requirements
VDE 0701-702 Inspection after repair, modification of electrical appliances – Periodic
inspection on electrical appliances
General requirements for electrical safety
EN 50191 Erection and operation of electrical test equipment
EN 50699 Recurrent Test of Electrical Equipment
EN 50678 General procedure for verifying the effectiveness of the protective
measures of electrical equipment after repair

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MI 3394 CE MultiTesterXA Instrument set and accessories

2 Instrument set and accessories

2.1 Standard set of the instrument


 Instrument MI 3394 CE MultitesterXA
 Bag for accessories
 HV test probes 2 m, 2 pcs
 Continuity test lead set 2.5 m, 2 pcs
 Continuity test lead red 1.5 m / 2.5 mm2
 Test lead black 2.5 m
 Test lead red 2.5 m
 Alligator clips black 2 pcs
 Alligator clips red 3 pcs
 Mains cable (2 m, wire cross-section 3 x 1.5 mm2)
 RS232 cable
 USB cable
 Calibration Certificate
 Short form instruction manual
 CD with instruction manual (full version) and PC SW Metrel ES Manager

2.2 Optional accessories


See the attached sheet for a list of optional accessories that are available on request from your
distributor.

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MI 3394 CE MultiTesterXA Instrument description

3 Instrument description

3.1 Front panel

Figure 3.1: Front panel

1 Mains supply connector


2 F1, F2 fuses (F 5 A / 250 V)
3 F3, F4 fuses (T 16 A / 250 V)
4 On / Off switch
5 Test connections TC1 for external test adapters
6 Mains test socket
Warning!
 Line voltage is present on the test socket during the measurement.
Maximum output current is 16 A, test only devices with maximum rated
supply current no higher than 16 A!
Note
 For devices incorporating high reactive loading, e.g. motor with rated active
power >1.5 kW, it is recommended to start measurement first and to run on the
tested device later.
7 P/S (probe) connector
8 Keypad
9 HV output connectors
10 HV output warning lamp
11 Continuity connectors

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MI 3394 CE MultiTesterXA Instrument description

12 Insulation / Subleakage connectors


13 Discharging time connectors
14 Colour TFT display with touch screen
15 Control outputs
16 Control inputs
17 Multipurpose RS232-1 port
18 Multipurpose RS232-2 port
19 Ethernet connector
20 USB connector
21 MicroSD card slot

Note
 The instrument contains dedicated connectors intended to be connected only to dedicated
accessories provided or approved by Metrel.

12
MI 3394 CE MultiTesterXA Instrument operation

4 Instrument operation
The CE MultiTesterXA can be manipulated via a keypad or touch screen.

4.1 General meaning of keys

Cursor keys are used to:


- select appropriate option

Enter key is used to:


- confirm selected option
- start and stop measurements

Escape key is used to:


- return to previous menu without changes
- abort measurements
Option key is used to:
- expand column in control panel
- show detailed view of options
HV Test key is used to:
- start and stop HV tests

4.2 General meaning of touch gestures:

Tap (briefly touch surface with fingertip) is used to:


- select appropriate option
- confirm selected option
- start and stop measurements
Swipe (press, move, lift) up/ down is used to:
- scroll content in same level
- navigate between views in same level
Long press (touch surface with fingertip for at least 1 s) is used to:
- select additional keys (virtual keyboard)
long
Tap Escape icon is used to:
- return to previous menu without changes
- abort measurements

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MI 3394 CE MultiTesterXA Instrument operation

4.3 Safety checks


At start up and during operation the instrument performs various safety checks to ensure
safety and to prevent any damage. These safety pre-tests are checking for:
 Correct input mains voltage
 Presence of input PE connection,
 Any external voltage against earth on mains test socket
 Excessive leakage currents through measuring I/Os,
 Too low resistance between L and N of tested device,
 Proper operation of safety relevant internal electronic circuits

If a safety check fails, an appropriate warning message will be displayed and safety
measures will be taken. The warnings and safety measures are described in chapter 4.4
Symbols and messages.

4.4 Symbols and messages

Supply voltage warning


Possible causes:
 No earth connection.
 Instrument is connected to an IT earthing
system. Press YES to continue normally or NO
to continue in a limited mode (measurements are
disabled).
Warning:
The instrument must be earthed properly to work
safely!

Resistance L-N > 30 kΩ


In pre-test a high input resistance was measured.
Possible causes:
 Device under test is not connected or switched
on
 Input fuse of device under test is blown.
Select YES to proceed with or NO to cancel
measurement.

Resistance L-N < 10 Ω


In pre-test a very low resistance of the device under test
supply input was measured. This can result in a high
current after applying power to the device under test. If
the too high current is only of short duration (caused by
a short inrush current) the test can be performed
otherwise not.
Select YES to proceed with or NO to cancel
measurement

14
MI 3394 CE MultiTesterXA Instrument operation

Resistance L-N < 30 Ω


In pre-test a low input resistance of the device under
test was measured. This can result in a high current
after applying power to the device. If the high current is
only of short duration (caused by a short inrush current)
the test can be performed, otherwise not.
Select YES to proceed with or NO to cancel
measurement.

Warning for improper supply voltage condition. If


pressing OK instrument will continue to work in a limited
mode (measurements are disabled).

In pre-test an external voltage between C1/P1 and


C2/P2 terminals was detected. The measurement was
cancelled. Press OK to continue.

In pre-test a too high external voltage was detected


between P and PE terminals. The measurement was
cancelled. Press OK to continue.

In pre-test a too high external voltage was detected


between ISO/SUB and PE terminals. The measurement
was cancelled. Press OK to continue.

In pre-test a possible high leakage current was


detected. It is likely that a dangerous leakage current
(higher than 3.5 mA) will flow after applying power to the
device under test.
Select YES to proceed with or NO to cancel
measurement.

The measured leakage (Idiff, Ipe, Itouch) current was


higher than 20 mA. Measurement was aborted. Press
OK to continue.

15
MI 3394 CE MultiTesterXA Instrument operation

The load current exceeded the highest upper limit of 10


A for the Discharging time test. Measurement was
aborted. Press OK to continue.
The load current continuously exceeded 10 A for more
than 4 min (moving average) in Power and Leakage
tests. Measurement was stopped for safety. Press OK
to continue.

The load current exceeded the highest upper limit of 16


A for the Power and Leakage tests. Measurement was
aborted. Press OK to continue.

Warning for restart of the instrument to set new Ethernet


settings. This message appears on exit from Settings
menu after changing Ethernet settings. Press OK to
continue.

The instrument is overheated. The measurement can’t


be carried out until the icon disappears. Press OK to
continue.

The device under test should be switched on (to ensure


that the complete circuit is tested).

Test voltage in Insulation resistance measurement is too


low.

Measurement result is scaled to 110 V.

Red dot indicates phase of measurement where higher


leakage was measured. Applicable only if phase
reversal is enabled during the measurement.

Test leads resistance in Continuity P/S - PE


measurement is not compensated.

Test leads resistance in Continuity P/S - PE


measurement is compensated.

Warning!
A high voltage is / will be present on the instrument
output! (Withstanding test voltage, Insulation test
voltage, or mains voltage).

Warning!
A very high and dangerous voltage is / will be present

16
MI 3394 CE MultiTesterXA Instrument operation

on the instrument output! (Withstanding test voltage).

Test passed.

Test failed.

Conditions on the input terminals allow starting the


measurement; consider other displayed warnings and
messages.

Conditions on the input terminals do not allow starting


the measurement, consider displayed warnings and
messages.

Proceeds to next measurement step

Stop the measurement.

Expands column in control panel.

17
MI 3394 CE MultiTesterXA Instrument operation

4.5 Instrument main menu


From the instrument Main Menu different main operation menus can be selected.

Figure 4.1: Main menu


Options

Single Tests
Menu with single tests, see chapter 6 Single tests.

Auto Sequences®
Menu with customized test sequences, see chapter 7 Auto
Sequences®.

Memory Organizer
Menu for working with and documentation of test data, see chapter 5
Memory Organizer.

General Settings
Menu for setup of the instrument, see chapter 4.6 General settings.

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MI 3394 CE MultiTesterXA Instrument operation

4.6 General settings


In the General Settings menu general parameters and settings of the instrument can be viewed
or set.

Figure 4.2: Setup menu

Options in General Settings menu

Language
Instrument language selection

Date / Time
Instruments Date and time.

Workspace Manager
Manipulation with project files. Refer to chapter 4.8 Workspace Manager for
more information.

Auto Sequence® groups


Manipulation with lists of Auto Sequences®. Refer to chapter 4.9 Auto
Sequence® groups for more information.

User accounts
Users settings. Refer to chapter 4.6.6 User accounts for more information.

Profiles
Selection of available instrument profiles.

Settings
Setting of different system parameters, including Ethernet settings.

Devices
Selection of external devices. Refer to chapter 4.6.9 Devices for more
information.

19
MI 3394 CE MultiTesterXA Instrument operation

Change password
Changing password for enabling HV tests.

Initial Settings
Factory settings.

About
Instrument info.

4.6.1 Language
In this menu the language of the instrument can be set.

Figure 4.3: Select language menu

4.6.2 Date and time


In this menu date and time of the instrument can be set.

Figure 4.4: Setting data and time menu

4.6.3 Profiles
Refer to Chapter 4.7 Instrument profiles for more information.

4.6.4 Workspace Manager


Refer to Chapter 4.8 Workspace Manager for more information.

20
MI 3394 CE MultiTesterXA Instrument operation

4.6.5 Auto Sequence® groups


Refer to Chapter 4.9 Auto Sequence® groups for more information.

4.6.6 User accounts


In this menu user accounts can be managed:
 Setting if signing in to work with the instrument is required or not.
 Adding and deleting new users, setting their user names and passwords.
The demand to sign in can prevent from unauthorized persons to work with the instrument.
If a user account is set and the user is signed in, the user's name will be stored in memory for
each measurement.
The user accounts can be managed by the administrator. User account password consists of an
up to 4 digit number. Individual users can change their passwords.
The administrator password consists of an up to 15 characters. Factory set administrator
password is ADMIN.
If the password is forgotten the second administrator password can be used. This password
always unlocks the Account manager and is delivered with the instrument.

4.6.6.1 Signing in

By selecting User Accounts icon in Settings menu, Sign in menu appear on the screen. Same
screen appear when instrument is switched on, if Sign in is set to required, see Chapter 4.6.6.3
Managing accounts for details.

Figure 4.5: Sign in menu


Options

User signing in:

Last signed in user is highlighted and displayed in


the first row.

Another user can be selected from the User


accounts list.

Enters User password entry screen.

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MI 3394 CE MultiTesterXA Instrument operation

Enter the User password through the on-screen


numerical keyboard and confirm .

User profile screen is opened as presented on


Figure 4.6.

Administrator signing in:


Enters Account manager password entry screen.

Enter the Administrator password through on-


screen keyboard and confirm .
Account manager screen is opened as presented
on Figure 4.7.

4.6.6.2 Changing user password, signing out

After user completed Sign in procedure, User profile menu screen is presented. Same screen is
presented if signed in user selects User accounts from General Settings menu.

Figure 4.6: User profile menu


Options

Signed in user is displayed and highlighted on the


top of the screen.

Sign out current user.


Sign in screen appear, see Chapter 4.6.6.1 Signing
in for details.

Enters Account manager password entry screen,


see Chapter 4.6.6.1 Signing in.

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MI 3394 CE MultiTesterXA Instrument operation

Change User password.


Numerical user password entry keyboard appear on
the screen.

First step: enter current user password and confirm


entry.

Wrong entry is reported by message. Confirm


message, clear wrong password and repeat first
step.

Second step: enter new user password and confirm


entry. Password change is confirmed with
short message appearance.

4.6.6.3 Managing accounts

To access Account manager menu, Administrator should be signed in, see Chapter 4.6.6.1
Signing in for details.
Administrator can set sign in requirement, change Administrator password and edit user
accounts.
Appearance of Account manager screen depends on previous settings, see Figure 4.7 below.

Figure 4.7: Account manager menu

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MI 3394 CE MultiTesterXA Instrument operation

Options

User sign in is not required.

User sign in is required.


Presented setting requires sign in, when instrument
is switched on. Sign in could also be set to be
required on every restart of instrument.

Change Administrator password.


Alphanumerical keyboard appears on the screen.

First step: enter current Administrator password


and confirm entry.

Wrong entry is reported by message. Confirm


message, clear wrong password and repeat first
step.

Second step: enter new Administrator password


and confirm entry. Password change is
confirmed with short message appearance.
Account manager screen appear again.
Administrator can continue to manage accounts or
returns to Settings and Main menu.

Edit account icon.


Enter Edit accounts screen, presented on Figure
4.8. For details see chapter 4.6.6.4 Edit user
accounts.

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MI 3394 CE MultiTesterXA Instrument operation

4.6.6.4 Edit user accounts

Administrator can add new user and set his password, change user existing password, delete
user account and delete all user accounts.
Edit accounts screen is accessed by selecting Edit account icon from Account manager options
screen, see Chapter 4.6.6.3 Managing accounts.

Figure 4.8: Edit accounts screen – user list on the left, user selected on the right

User accounts selected:


Options

Add New user account.


Add New menu appear on the screen.

Add New selection options:


 Username opens onscreen alphanumerical
keyboard for new user name entry
 Password opens onscreen numerical keyboard
for new user password entry
 Add stores new user to User account list.
 Cancel interrupts procedure

New user account password must be entered; if


not, warning message appears on the screen.

Delete all user accounts.


Warning message appears on the screen.

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MI 3394 CE MultiTesterXA Instrument operation

Warning message selection options:


 YES: confirmation of deletion, all user accounts
will be deleted
 NO: interrupts procedure and return to Edit
accounts menu

User selected (user is highlighted ):


Options

Set password
For selected user, password is set, numerical
keyboard appears on the screen.

Enter user password and confirm entry.

Old user password is automatically overwritten


without warning or confirmation.

Delete selected user account.


Warning message appears on the screen.

Warning message selection options:


 YES: confirmation of deletion, selected user
account will be deleted
 NO: interrupts procedure and return to Edit
accounts menu

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MI 3394 CE MultiTesterXA Instrument operation

4.6.6.5 Setting Blackbox password

Blackbox password can be set by administrator from the Account manager menu. Set Blackbox
password is valid for all users. Default Blackbox password is empty (disabled).

Options

Add or edit Blackbox password. Enter to modify.

Keyboard for entering new Blackbox password is


opened. Empty string disables password.
Confirm entry.

Blackbox password is changed.

4.6.7 Change password for HV functions


In this menu the password to enable starting of HV functions can be set, changed or disabled.

Figure 4.9: Change password menu


Notes:
 Default password is 0000.
 An empty entry disables the password.
 If password is lost, entry 4648 resets password to default.

27
MI 3394 CE MultiTesterXA Instrument operation

4.6.8 Settings
In this menu different general parameters can be set.

Figure 4.10: Settings menu


Setting options:
Option Description
Touch screen ON – touch screen is active.
OFF – touch screen is deactivated.
Keys & touch sound ON – sound is active.
OFF – sound is deactivated.
Test mode Standard – Visual and Functional inspection status fields should be set
manually.
Expert – All Visual and Functional inspection status fields are filled
automatically with PASS status.
Auto Seq. flow Ends if fail – Auto Sequence will end after first fail status of
measurement / inspection is detected. Proceeding tests will be skipped.
Proceeds if fail – Auto Sequence will proceed even if fail status of
measurement / inspection is detected.
Ext. Keyboard ON – enable external BT keyboard. (See A 1578 manual for details.)
OFF – external BT keyboard is disabled.

Ethernet setting options:


Option Available selection Description
Obtain an IP [AUTOMATICALLY, When the manual mode is chosen, the user
MANUAL] must provide the correct network settings.
Otherwise the instrument is automatically
assigned an IP address from the local network
using the DHCP protocol.
IP address XXX.XXX.XXX.XXX Displays the instrument’s IP address. In
manual mode, the user should enter the
correct value.
Port number 0 – 65535 Selects the port number on which the
instrument listens for incoming connections.
The instrument communicates using UDP/IP
protocol. Max. UDP packet length is 1024
bytes.
Subnet mask XXX.XXX.XXX.XXX In manual mode, the user should enter the

28
MI 3394 CE MultiTesterXA Instrument operation

correct value.
Default gateway XXX.XXX.XXX.XXX In manual mode, depending on the network
topology, the use can enter the correct value or
leave it as it is, if not needed.
Preferred DNS XXX.XXX.XXX.XXX In manual mode, depending on the network
server topology, the use can enter the correct value or
leave it as it is, if not needed.
Alternate DNS XXX.XXX.XXX.XXX In manual mode, depending on the network
server topology, the use can enter the correct value or
leave it as it is, if not needed.
Host name MI3394_XXXXXXXX Displays the instrument’s unique name on the
local network. The host name consists of the
instrument’s name and its serial number.
MAC address XX:XX:XX:XX:XX:XX Displays the instrument’s MAC address. User
can change the address in case of another
device on the network using the same value.
Note:
 Instrument will reset to apply new Ethernet settings (if modified).

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MI 3394 CE MultiTesterXA Instrument operation

4.6.9 Devices
In this menu operation with external devices is configured.

Figure 4.11: Device settings menu

Writing devices
Type Sets appropriate writing device (Serial printer, Bluetooth printer,
RFID writer).
Port Sets/views communication port of selected writing device.
Bluetooth device Goes to menu for pairing with selected Bluetooth device.
name
Bluetooth dongle Initializes Bluetooth Dongle.
Print labels Selects label form size. See Appendix C - Print labels and write /
read RFID / NFC tags for details.
Printed date Selects date printed on label text area, Options: [Test date,
Retest date]. See Appendix C - Print labels and write / read RFID
/ NFC tags for details.
Auto save Sets simultaneous saving of finished Auto Sequence when label
is printed or RFID / NFC tag is written.
Options: [On print, On write, OFF]
See chapter 7.2.3 Auto Sequence® result screen for details.
Tag format Sets PAT tag / label format or generic tag / label format.
See Appendix C - Print labels and write / read RFID / NFC tags
for details.
Reading devices
Type Sets appropriate reading device (QR or barcode scanner, RFID
reader, android device via aMESM application).
Port Sets/views communication port of selected reading device.
Bluetooth device Goes to menu for pairing with selected Bluetooth device.
name

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MI 3394 CE MultiTesterXA Instrument operation

4.6.10 Initial Settings


In this menu internal Bluetooth module can be initialized and the instrument settings,
measurement parameters and limits can be set to initial (factory) values.

Figure 4.12: Initial settings menu

Warning!
Following customized settings will be lost when setting the instruments to initial settings:
 Measurement limits and parameters
 Global parameters and System settings in General settings menu

Note:
Following customized settings will stay:
 Profile settings
 Data in memory
 Password for HV functions

4.6.11 About
In this menu instrument data (name, serial number, version and date of calibration) can be
viewed.

Figure 4.13: Instrument info screen

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MI 3394 CE MultiTesterXA Instrument operation

4.7 Instrument profiles


In this menu the instrument profile can be selected from the available ones.

Figure 4.14: Instrument profile menu

The instrument uses different specific system and measuring settings in regard to the scope of
work or country it is used. These specific settings are stored in instrument profiles.
By default each instrument has at least one profile activated. Proper licence keys must be
obtained to add more profiles to the instruments.
If different profiles are available they can be selected in this menu.
Refer to Appendix B - Profile Notes for more information about functions specified by profiles.

Options

Loads the selected profile. The instrument will


restart automatically with new profile loaded.

Enters option for deleting a profile.

Before deleting the selected profile user is asked


for confirmation.
Loaded profiles can’t be deleted.

4.8 Workspace Manager


The Workspace Manager is intended to manage with different Workspaces and Exports stored
on the microSD card.

4.8.1 Workspaces and Exports


The works with CE MultiTesterXA MI 3394 can be organized with help of Workspaces and
Exports. Exports and Workspaces contain all relevant data (measurements, parameters, limits,
structure objects) of an individual work.

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MI 3394 CE MultiTesterXA Instrument operation

Figure 4.15: Organization of Workspaces and Exports on microSD card

Workspaces are stored on microSD card on directory WORKSPACES, while Exports are stored
on directory EXPORTS. Exports are suitable for making backups of important works or can be
used for storage of works if the removable microSD card is used as a mass storage device. To
work on the instrument an Export should be imported first from the list of Exports and converted
to a Workspace. To be stored as Export data a Workspace should be exported first from the list
of Workspaces and converted to an Export.

4.8.2 Workspace Manager main menu


In Workspace manager Workspaces and Exports are displayed in two separated lists.

Figure 4.16: Workspace manager main menu


Options

List of Workspaces.

Displays a list of Exports.

Adds a new Workspace.


Refer to chapter 4.8.2.3 Adding a new
Workspace for more information.

List of Exports.

Displays a list of Workspaces.

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MI 3394 CE MultiTesterXA Instrument operation

4.8.2.1 Operations with Workspaces

Only one Workspace can be opened in the instrument at the same time. The Workspace
selected in the Workspace Manager will be opened in the Memory Organizer.

Figure 4.17: Workspaces menu


Options

Marks the opened Workspace in Memory Organizer.


Opens the selected Workspace in Memory Organizer.
Refer to chapters 5 Memory Organizer and 4.8.2.4 Opening a Workspace for
more information.

Deletes the selected Workspace.


Refer to chapter 4.8.2.5 Deleting a Workspace / Export for more information.

Adds a new Workspace.


Refer to chapter 4.8.2.3 Adding a new Workspace for more information.

Exports a Workspace to an Export


Refer to chapter 4.8.2.7 Exporting a Workspace for more information.

4.8.2.2 Operations with Exports

Figure 4.18: Workspace manager Exports menu

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MI 3394 CE MultiTesterXA Instrument operation

Options

Deletes the selected Export.


Refer to chapter 4.8.2.5 Deleting a Workspace / Export for more information.

Imports a new Workspace from Export.


Refer to chapter 4.8.2.6 Importing a Workspace for more information.

4.8.2.3 Adding a new Workspace

 New workspaces can be added from the


Workspace manager screen.

 Enters option for adding a new Workspace.

Keypad for entering name of a new


Workspace is displayed after selecting
New.

 After confirmation a new Workspace is


added to the list of workspaces.

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MI 3394 CE MultiTesterXA Instrument operation

4.8.2.4 Opening a Workspace

 Workspace can be selected from a list in


Workspace manager screen.

 Opens a Workspace in Workspace


manager.

The opened Workspace is marked with a


blue dot. The previously opened
Workspace will close automatically.

4.8.2.5 Deleting a Workspace / Export

 Workspace / Export to be deleted should


be selected from the list of Workspaces /
Exports.

 Enters option for deleting a Workspace /


Export.

Before deleting the selected Workspace /


Export the user is asked for confirmation.

36
MI 3394 CE MultiTesterXA Instrument operation

 Workspace / Export is deleted from the


Workspace / Export list.

4.8.2.6 Importing a Workspace

 Select an Export file to be imported from


Workspace manager Export list.

 Enters option Import.

Before the import of the selected Export file


the user is asked for confirmation.

 The imported Export file is added to the list of


Workspaces.
Note:
If a Workspace with the same name already
exists the name of the imported Workspace
will be changed (name_001, name_002,
name_003, …).

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MI 3394 CE MultiTesterXA Instrument operation

4.8.2.7 Exporting a Workspace

 Select a Workspace from Workspace


manager list to be exported to an Export
file.

 Enters option for Export.

Before exporting the selected


Workspace the user is asked for
confirmation.

 Workspace is exported to Export file and


is added to the list of Exports.

Note:
If an Export file with the same name
already exists the name of the Export file
will be changed (name_001, name_002,
name_003, …).

38
MI 3394 CE MultiTesterXA Instrument operation

4.9 Auto Sequence® groups


The Auto Sequences® in CE MultiTesterXA MI 3394 are organized in Auto Sequence® groups
stored in folders on the microSD memory card. Folders are located in Root\__MOS__\AT on the
microSD card.

Figure 4.19: Organization of Auto Sequence® groups on microSD card

Each group contain similar Auto Sequences®. The Auto Sequence® groups menu is intended to
manage with different Auto Sequences®.

4.9.1 Auto Sequence® groups menu

Auto Sequence® groups menu can be accessed from General settings menu followed by
selection of Auto Sequence® groups menu.
Another option to access it is from Main Auto Sequences® menu, see chapter 7.1 Selection of
Auto Sequences®.
In this menu lists of Auto Sequence® groups are displayed. Only one group can be active in the
instrument at the same time. The group selected from the Auto Sequence® groups menu will be
opened whenever Auto Sequences® menu is selected from the instrument Main menu, see
chapter 4.5 Instrument main menu.

Figure 4.20: Auto Sequence® groups menu

4.9.1.1 Operations in Auto Sequence® groups menu

Options
Opens the selected group of Auto Sequences®. Previously selected group of Auto
Sequences® will be closed automatically.
Refer to chapter 4.9.1.2 Selecting a group of Auto Sequences® for more
information.

39
MI 3394 CE MultiTesterXA Instrument operation

Deletes the selected list of Auto Sequences®.


Refer to chapter 4.9.1.3 Deleting a group of Auto Sequences® for more
information.

4.9.1.2 Selecting a group of Auto Sequences®

 A group of Auto Sequences® should be


selected first from the list of Auto
Sequence® groups.

 Enters option for selecting a highlighted


group.

Selected group of Auto Sequences® is


marked with a blue dot.

Note:
Previously selected group is closed
automatically.

4.9.1.3 Deleting a group of Auto Sequences®

 A group of Auto Sequences® to be


deleted should be selected first from the
list of Auto Sequence® groups.

 Enters option for deleting the selected


group.

Before deleting the selected group of


Auto Sequences®, the user is asked for
confirmation.

40
MI 3394 CE MultiTesterXA Instrument operation

 A group of Auto Sequences® is deleted.


Note:
Selected Auto Sequences® group
(marked with blue dot) cannot be deleted,
warning message appear on the screen.

41
MI 3394 CE MultiTesterXA Memory Organizer

5 Memory Organizer
Memory Organizer is a tool for storing and working with test data.

5.1 Memory Organizer menu


The data is organized in a tree structure with Structure objects and Measurements. CE
MultiTesterXA has a fixed three level structure. The hierarchy of Structure objects in the tree is
shown on Figure 5.1.
0th level
1st level
2nd level
3rd level

NODE

APPLIANCE FD (full description)


measurement

APPLIANCE (short description)


measurement

PROJECT

APPLIANCE FD
measurement

APPLIANCE
measurement

LOCATION

APPLIANCE FD
measurement

APPLIANCE
measurement

Figure 5.1: Tree structure and its hierarchy

Figure 5.2: Example of a Tree menu

42
MI 3394 CE MultiTesterXA Memory Organizer

5.1.1 Measurement statuses


Each measurement has:
 a status (Pass or Fail or no status)
 a name
 results
 limits and parameters

A measurement can be a Single test or an Auto Sequence® test. Statuses of single tests:

 passed finished single test with test results

 failed finished single test with test results

 finished single test with test results and no status

 empty single test without test results

Overall statuses of Auto Sequence® tests:

at least one single test in the Auto Sequence®


 or passed and no single test failed

at least one single test in the Auto Sequence®


 or failed

at least one single test in the Auto Sequence®


 or was carried out and there were no other
passed or failed single tests.
empty Auto Sequence® with empty single
 or tests

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.2 Structure Objects


Each Structure object has:
 an icon
 a name
 parameters
Optionally they can have:
 an indication of the status of the measurements under the Structure object
 a comment or a file attached
Structure objects supported in CE MultiTesterXA are described in Appendix A - Structure
objects in CE MultiTesterXA.

Figure 5.3: Structure object in tree menu

5.1.2.1 Measurement status indication under the Structure object


Overall status of measurements under each structure element / sub-element can be seen
without spreading tree menu. This feature is useful for quick evaluation of test status and as
guidance for measurements.

Options

There are no measurement result(s)


under selected structure object.
Measurements should be made.

Figure 5.4: Example of status - No


measurement result(s)

One or more measurement result(s)


under selected structure object has
failed. Not all measurements under
selected structure object have been
made yet.

Figure 5.5: Example of status -


Measurements not completed with fail
result(s)

44
MI 3394 CE MultiTesterXA Memory Organizer

All measurements under selected


structure object are completed but one
or more measurement result(s) has
failed.

Figure 5.6: Status - Measurements


completed with fail result(s)

Note:
 There is no status indication if all measurement results under each structure element /
sub-element have passed or if there is an empty structure element / sub-element
(without measurements).

5.1.3 Selecting an active Workspace in Memory Organizer

Memory Organizer and Workspace Manager are interconnected so an active Workspace can be
selected also in the Memory Organizer menu.

Procedure

Press the active Workspace in Memory


 Organizer Menu.

 Select List of Workspaces in Control panel.

Choose desired Workspace from the list of


 Workspaces.

 Use Select button to confirm selection.

45
MI 3394 CE MultiTesterXA Memory Organizer

New Workspace is selected and displayed


 on the screen.

5.1.4 Adding Nodes in Memory Organizer

Structural Elements (Nodes) are used to ease organization of data in the Memory Organizer.
One Node is a must; others are optional and can be created or deleted freely.

Procedure

Press the active Workspace in Memory


 Organizer Menu.

Select Add New Structure Element in


 Control panel.

 Press “Create” to confirm.

New Structure Element (Node) is added.

Note:
 To change the name of a Node, see
chapter 5.1.5.14 Rename a Structure
object.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5 Operations in Tree menu


In the Memory organizer different actions can be taken with help of the control panel at the right
side of the display. Possible actions depend on the selected element in the organizer.

5.1.5.1 Operations on measurements (finished or empty measurements)


The measurement must be selected first. Operation options can be selected from the menu on
the right side of the screen. Menu options are adapted to measurement status, empty, finished,
finished and saved, as presented on Figure 5.7.

Figure 5.7: A measurement is selected in the Tree menu


Options

Views results of measurement.


The instrument goes to the measurement memory screen. Refer to chapters
6.1.1.5 Single test memory screen and 7.2.4 Auto Sequence® memory screen
for more information.

Starts a new measurement.


The instrument goes to the measurement start screen. Refer to chapters
6.1.1.1 Single test start screen and 7.2.1 Auto Sequence® view menu for more
information.

Saves a measurement.
Saving of measurement on a position after the selected (empty or finished)
measurement.

Clones the measurement.


The selected measurement can be copied as an empty measurement under
the same Structure object. Refer to chapter 5.1.5.7 Clone a measurement for
more information.

Copies & Paste a measurement.


The selected measurement can be copied and pasted as an empty
measurement to any location in structure tree. Multiple “Paste” is allowed.
Refer to chapter 5.1.5.10 Copy & Paste a measurement for more information.

Adds a new measurement.


The instrument goes to the Menu for adding measurements. Refer to chapter

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.5 Add a new measurement for more information.

Views and edit comments.


The instrument displays comment attached to the selected measurement or
opens keypad for entering a new comment.

Deletes a measurement.
Selected Measurement can be deleted. User is asked for confirmation before
the deleting. Refer to chapter 5.1.5.13 Delete a measurement for more
information.

5.1.5.2 Operations on Structure objects

The structure object must be selected first.

Figure 5.8: A structure object is selected in the tree menu


Options
Starts a new measurement.
First type of measurement (Single test or Auto Sequence®) should be selected.
After proper type is selected, the instrument goes to single test or
Auto Sequence® selection screen. Refer to chapters 6.1 Selection of single tests
and 7.1 Selection of Auto Sequences® for more information.
Saves a measurement.
Saving of measurement under the selected Structure object.

View / edit parameters and attachments.


Parameters and attachments of the Structure object can be viewed or edited.
Refer to chapter 5.1.5.3 View / Edit parameters and attachments of a Structure
object for more information.
Adds a new measurement.
The instrument goes to the Menu for adding measurement into structure. Refer
to chapter 5.1.5.5 Add a new measurement for more information.
Adds a new Structure object.
A new Structure object can be added. Refer to chapter 5.1.5.4 Add a new
Structure Object for more information.
Attachments.
Name and link of attachment is displayed.

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MI 3394 CE MultiTesterXA Memory Organizer

Clones a Structure object.


Selected Structure object can be copied to same level in structure tree (clone).
Refer to chapter 5.1.5.6 Clone a Structure object for more information.
Copies & Paste a Structure object.
Selected Structure object can be copied and pasted to any allowed location in
structure tree. Multiple “Paste” is allowed. Refer to chapter 5.1.5.8 Copy & Paste
a Structure object for more information.

Cut & Paste a Structure.


Selected Structure with child items (sub-structures and measurements) can be
moved to any allowed location in structure tree. Refer to chapter 5.1.5.11 Cut &
Paste a Structure object with sub-items for more information.

Views and edit comments.


The instrument displays comment attached to the selected Structure object or
opens keypad for entering a new comment.
Deletes a Structure object.
Selected Structure object and sub-elements can be deleted. User is asked for
confirmation before the deleting. Refer to chapter 5.1.5.12 Delete a Structure
object for more information.
Renames a Structure object.
Selected Structure object can be renamed via keypad. Refer to chapter 5.1.5.14
Rename a Structure object for more information.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.3 View / Edit parameters and attachments of a Structure object

The parameters and their content are displayed in this menu. To edit the selected parameter tap
on it or press Enter key to enter menu for editing parameters.

Parameters

Figure 5.9: Example of View / Edit parameters menu

In menu for editing parameters the parameter’s value can


be selected from a dropdown list or entered via keypad.
Refer to chapter 4 Instrument operation for more
information about keypad operation.

Attachments
The name of attachment can be seen. Operation with
attachments is not supported in the instrument.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.4 Add a new Structure Object

This menu is intended to add new structure objects in the tree menu. A new structure object can
be selected and then added in the tree menu.

Add Structure

Figure 5.10: Add a new Structure Object menu

Tap on a structure type selection window.

A list of available structure items is displayed. Select


one from a list. Arrow indicates the position where
structure item will be inserted.

Child item to the currently selected


structure item.

Structure item located in the same


level.

In menu for editing name and parameters the


parameter’s value can be selected from a dropdown
list or entered via keypad. Refer to chapter 4
Instrument operation for more information about
keypad operation.

Create new structure item.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.5 Add a new measurement

In this menu new empty measurements can be set and then added in the structure tree. The
type of measurement, measurement function and its parameters are first selected and then
added under the selected Structure object.

Add Measurement

Figure 5.11: Add a new measurement menu

Type of test can be selected from this field.


Options: (Single tests, Auto Sequences®)
Tap on field or press ENTER key to modify.

Last added single test measurement is offered by default.


To select another measurement press Enter to open menu
for selecting measurements. Refer to chapters 6.1
Selection of single tests and 7.1 Selection of Auto
Sequences® for more information

Tap on field or press ENTER key to open menu for editing


parameters of the selected measurement.
Select parameter and modify it as described earlier.
Refer to chapter 6.1.1.2 Setting parameters and limits of
single tests for more information.

Add a new empty measurement.


Adds the measurement under the selected Structure
object in the tree menu.

Returns to the structure tree menu without changes.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.6 Clone a Structure object

In this menu selected structure object can be copied (cloned) to same level in the structure tree.
Cloned structure object have same name as original.

Clone

Figure 5.12: Clone Structure Object menu

Procedure and options

 Select the structure object to be cloned.

 Select Clone option from control panel.

Clone

 The Clone Structure object menu is displayed. Sub-


elements of the selected structure object can be
marked or un-marked for cloning.
Refer to chapter 5.1.5.9 Cloning and Pasting sub-
elements of selected structure object for more
information.

 Selected structure object is copied (cloned) to same


a level in the structure tree.

 Cloning is cancelled. No changes in the Structure


b tree.

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MI 3394 CE MultiTesterXA Memory Organizer

 The new structure object is displayed.

5.1.5.7 Clone a measurement

By using this function a selected empty or finished measurement can be copied (cloned) as an
empty measurement to the same level in the structure tree.

Procedure and options

 Select the measurement to be cloned.

 Select Clone option from control panel.

Clone

 The new empty measurement is displayed.

5.1.5.8 Copy & Paste a Structure object

In this menu selected Structure object can be copied and pasted to any allowed location in the
structure tree.

Procedure and options

 Select the structure object to be copied.

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MI 3394 CE MultiTesterXA Memory Organizer

 Select Copy option from control panel.

Copy

 Select location where structure element should be


copied.

 Select Paste option from control panel.

Paste

 The Paste structure object menu is displayed.


Before copying it can be set which sub-elements of
the selected structure object will be copied too. For
more details see chapter 5.1.5.9 Cloning and
Pasting sub-elements of selected structure object.

 The selected structure object and elements are


a copied (pasted) to selected position in the tree
structure.

 Returns to the tree menu without changes.


b

 The new structure object is displayed.


Note:
The Paste command can be executed one or more
times.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.9 Cloning and Pasting sub-elements of selected structure object

When structure object is selected to be cloned, or copied & pasted, additional selection of its
sub-elements is needed. The following options are available:

Options
Parameters of selected structure object will be
copied too.

Attachments of selected structure object will be


copied too.

Structure objects in sub-levels of selected structure


object will be copied too.

Measurements in selected structure object and


sub-levels will be copied too.

5.1.5.10 Copy & Paste a measurement


In this menu selected measurement can be copied to any allowed location in the structure tree.

Procedure

 Select the structure object to be copied.

 Select Copy option from control panel.

Copy

 Select location where structure element should


be copied.

 Select Paste option from control panel.

Paste

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MI 3394 CE MultiTesterXA Memory Organizer

 The new (empty) measurement is displayed in


selected Structure object.

5.1.5.11 Cut & Paste a Structure object with sub-items

In this menu selected Structure object with sub-items (sub-structures and measurements) can
be cut and pasted (moved) to any allowed location in the structure tree.

Procedure

 Select the structure item to be moved.

 Select Cut option from Control panel.

Cut

 Select new location where structure object (with


sub-structures and measurements) should be
moved.

 Select Paste option from Control panel.

Paste

 The structure object (with sub-structures and


measurements) is moved to selected new
location and deleted from previous location in
the tree structure.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.12 Delete a Structure object

In this menu selected Structure object can be deleted.

Procedure

 Select the structure object to be deleted.

 Select Delete option from control panel.

Delete

 A confirmation window will appear.

a Selected structure object and its sub-elements


are deleted.

b Returns to the tree menu without changes.

5.1.5.13 Delete a measurement


In this menu selected measurement can be deleted.

Procedure

 Select a measurement to be deleted.

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MI 3394 CE MultiTesterXA Memory Organizer

 Select Delete option from control panel.

Delete

 A confirmation window will appear.

a Selected measurement is deleted.

b Returns to the tree menu without changes.

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MI 3394 CE MultiTesterXA Memory Organizer

5.1.5.14 Rename a Structure object

In this menu selected Structure object can be renamed.

Procedure

 Select the structure object to be renamed.

 Select Rename option from control panel.

Rename

 Virtual keypad will appear on screen. Enter new


text and confirm.

5.1.5.15 Recall and Retest selected measurement

Procedure

 Select the measurement to be recalled.

 Select Recall results in Control panel.

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MI 3394 CE MultiTesterXA Memory Organizer

 Measurement is recalled.
Parameters and limits can be viewed but
cannot be edited.

 Select Retest in Control panel.

 Measurement retest starting screen is


displayed.

a Parameters and limits can be viewed and


edited.

 Select Run in Control panel to retest the


measurement.

 Results / sub-results after re-run of


recalled measurement.

 Select Save results in Control panel.

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MI 3394 CE MultiTesterXA Memory Organizer

Retested measurement is saved under


same structure object as original one.
Refreshed memory structure with the new
performed measurement is displayed.

5.1.6 Searching in Memory Organizer

In Memory organizer it is possible to search for different structure objects and parameters.

Procedure

 Search function is available from the active


workspace directory line.

 Select Search in control panel to open Search


setup menu.

 The parameters that can be searched for are


displayed in the Search setup menu.
Note:
 Equipment ID, Test date, Retest date
refer only to the following structure
objects: Appliance, Appliance FD,
Machine and Switchgear.

a The search can be narrowed by entering a text


in the Name and Equipment ID field.

Strings can be entered using the on-screen


keyboard.

b The search can be narrowed on base of


statuses.
If searching by status, instrument will
display all structure objects that include one

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MI 3394 CE MultiTesterXA Memory Organizer

or more measurements with searched


status.

c The search can be narrowed on base of test


dates / retest dates (from / to).

Clears all filters. Sets filters to default value.


d
Clear filters

Searches through the Memory Organizer for


 objects according to the set filters.
Search The results are shown in the Search results
screen presented on Figure 5.13 and Figure
5.14.

Figure 5.13: Search results screen – Page view


Options

Next page.

Previous page.

Note:

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MI 3394 CE MultiTesterXA Memory Organizer

Search result page consist of up to 50 results.

Figure 5.14: Search results screen with structure object selected

Options

Goes to selected location in Memory Organizer.

View / edit parameters and attachments.


Parameters and attachments of the Structure object can be viewed or
edited. Refer to Chapter 5.1.5.3 View / Edit parameters and attachments of
a Structure object for more information.

Attachments.
Name and link of attachment is displayed.

Renames the selected Structure object.


Refer to Chapter 5.1.5.14 Rename a Structure object for more information.

Views comment.
The instrument displays comment attached to the selected Structure
object.

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MI 3394 CE MultiTesterXA Single tests

6 Single tests
6.1 Selection of single tests
Single tests can be selected in the Main single test menu or in Memory Organizer’s main and
submenus. In Single test main menu there are four modes for selecting single tests.

Options

All

A single test can be selected from a list of all


single tests. The single tests are always
displayed in the same (default) order.

Last used

Last 9 made different single tests are


displayed.

Groups

The single tests are divided into groups of


similar tests.

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MI 3394 CE MultiTesterXA Single tests

For the selected group a submenu with all


single tests that belongs to the selected group
is displayed.

Cross selector

This selection mode is the fastest way for


working with the keypad.
Groups of single tests are organized in a row.

For the selected group all single tests are


displayed and accessible with up/down keys.

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MI 3394 CE MultiTesterXA Single tests

6.1.1 Single test screens


In the Single test screens measuring results, sub-results, limits and parameters of the
measurement are displayed. In addition on-line statuses, warnings and other information are
displayed.
Name of function

Main result
Options
Subresult

Parameters (white) and


Statuses, info, warnings
limits (red)
Figure 6.1: Single test screen organisation

6.1.1.1 Single test start screen

Single test screen can be opened from Memory organizer or from Single test main menu.

Figure 6.2: Single test start screen

Options
Starts the measurement.

Opens help screens. Refer to chapter 6.1.3 Help


screens for more information.

Opens menu for changing parameters and limits.


Refer to chapter 6.1.1.2 Setting parameters and
limits of single tests for more information.

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MI 3394 CE MultiTesterXA Single tests

on

6.1.1.2 Setting parameters and limits of single tests

Figure 6.3: Screens in menu for setting Single test parameters and limits

Options
Selects parameter (white) or limit (red).

Selects value of parameter or limit.


In case of many (multiple pages of) parameters or
limits:
- The scroll bar on the right side of screen can be
used
- With right / left keys it can be jumped page up /
page down
Some of limits can be user defined.
Selects Custom and tap on it.

Numeric keyboard with metric prefixes will open.


Enters custom limit value and confirm entry.

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6.1.1.3 Single test screen during test

Figure 6.4: Single test screen (during measurement)

Options (during test)


Stops the single test measurement.

Proceeds to the next step of the measurement (if measurement consists of


more steps).

Aborts measurements.

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MI 3394 CE MultiTesterXA Single tests

6.1.1.4 Single test result screen

Figure 6.5: Single test result screen

Options (after measurement is finished)

Starts a new measurement.

Saves the result.


A new measurement was selected and started from a Structure object in
the structure tree:
- The measurement will be saved under the selected Structure
object.
A new measurement was started from the Single test main menu:
- Saving under the last selected Structure object will be offered by
default. The user can select another Structure object or create a

new Structure object. By pressing the key in Memory


organizer menu the measurement is saved under selected
location.
An empty measurement was selected in structure tree and started:
- The result(s) will be added to the measurement. The measurement
will change its status from ‘empty’ to ‘finished’.
An already carried out measurement was selected in structure tree,
viewed and then restarted:
- A new measurement will be saved under the selected Structure
object.

Adds comment to the measurement. The instrument opens keypad for


entering a comment.

Opens help screens. Refer to chapter 6.1.3 Help screens for more
information.

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MI 3394 CE MultiTesterXA Single tests

Opens screen for changing parameters and limits.


Refer to chapter 6.1.1.2 Setting parameters and
limits of single tests for more information.

on

6.1.1.5 Single test memory screen

Figure 6.6: Single test memory screen

Options

Retest
Enters screen with “empty” measurement.

Opens menu for viewing parameters and limits.


Refer to chapter 6.1.1.2 Setting parameters and
limits of single tests for more information.

on

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MI 3394 CE MultiTesterXA Single tests

6.1.2 Single test (inspection) screens


Visual and Functional inspections can be treated as a special class of tests. Items to be visually
or functionally checked are displayed. In addition on-line statuses and other information are
displayed.

Figure 6.7: Inspection screen organisation

6.1.2.1 Single test (inspection) start screen

Figure 6.8: Inspection start screen

Options (inspection screen was opened in Memory organizer or from Single test main menu)
Starts the inspection

Opens help screens. Refer to chapter 6.1.3 Help screens for more
information.

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6.1.2.2 Single test (Inspection) screen during test

Figure 6.9: Inspection screen (during inspection)

Options (during test)

Selects item

Applies a pass status to the selected item or group of


items.

Applies a fail status to the selected item or group of


items.

Clears status in selected item or group of items

Applies a checked status to the selected item or group


of items.

A status can be applied direct to the checkbox;


successive tap toggle between statuses.
on

Power is applied to the mains test socket to power up


the tested equipment during a functional inspection.
The instrument displays the Power measurement
screen, refer to Chapter 6.2.12 Power for details.
Stop the inspection.
Enters result screen if all items are checked.

Goes to the result screen, if inspection test running.


Goes to the previous menu, if inspection test was
stopped before.

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Rules for automatic applying of statuses:


 The parent item(s) can automatically get a status on base of statuses in child items.
- the fail status has highest priority. A fail status for any item will result in a fail status in all
parent items and an overall fail result.
- if there is no fail status in child items the parent item will get a status only if all child items
have a status.
- Pass status has priority over checked status.

 The child item(s) will automatically get a status on base of status in the parent item
- All child items will get the same status as applied to the parent item.

Note
 Inspections and even inspection items inside one inspection can have different status types.
For example some basic inspections don’t have the ‘checked’ status.

6.1.2.3 Single test (Inspection) result screen

Figure 6.10: Inspection result screen

Options (after inspection is finished)

Starts a new inspection.

Saves the result.


A new inspection was selected and started from a Structure object in
the structure tree:
- The inspection will be saved under the selected Structure object.
A new inspection was started from the Single test main menu:
- Saving under the last selected Structure object will be offered by
default. The user can select another Structure object or create a

new Structure object. By pressing the key in Memory


organizer menu the inspection is saved under selected location.
An empty inspection was selected in structure tree and started:
- The result(s) will be added to the inspection. The inspection will
change its status from ‘empty’ to ‘finished’.

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MI 3394 CE MultiTesterXA Single tests

An already carried out inspection was selected in structure tree, viewed


and then restarted:
- A new measurement will be saved under the selected Structure
object.

Opens Help screen, see chapter 6.1.3 Help screens for more
information.

6.1.2.4 Single test (inspection) memory screen

Figure 6.11: Inspection memory screen


Options

Retest
Starts inspection with cleared statuses.

Enters view mode.

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MI 3394 CE MultiTesterXA Single tests

6.1.3 Help screens

Help screens contain diagrams for proper connection of the instrument.

Figure 6.12: Examples of help screens

Options
Goes to previous / next help screen.

on

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6.2 Single test measurements


6.2.1 Visual inspections

Figure 6.13: Visual inspection menu

Test circuit

Figure 6.14: Visual inspection test circuit

Visual inspection procedure


 Select the appropriate Visual inspection.
 Start the inspection.
 Perform the visual inspection of the appliance / equipment.
 Apply appropriate ticker(s) to items of inspection.
 End inspection.
 Save results (optional).

Figure 6.15: Examples of Visual inspection results

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6.2.2 Continuity

Figure 6.16: Continuity test menu

Test results / sub-results


R............... Resistance
ΔU………..Voltage drop scaled to 10 A

Test parameters
Output connections Output [4-wire, P-PE]
Test current I out [0.2 A, 4 A, 10 A, 25 A]
Duration Duration [Off, 2 s ... 180 s]
ΔU test* Enables ΔU test [On, Off]
Wire cross-section* Wire cross-section for ΔU test [0.5 mm2… 6mm2]

Test limits
H Limit (R) H limit [Off, Custom, 0.01 Ω ... 9 Ω]
L Limit (R) L limit [Off, Custom, 0.01 Ω ... 9 Ω]
H Limit (ΔU)* H limit [1.0 V … 5.0 V ]
* Applicable only at test current 10 A.

Specific options

Calibrate - Compensation of test lead resistance.


Refer to chapter 6.2.2.1 for procedure details.

Lim. Calculator – Continuity resistance H Limit(R) calculator.


Refer to chapter 6.2.2.2 for details.

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Test circuit

Figure 6.17: Measurement of continuity 4-wire

Figure 6.18: Measurement of Continuity P/S - PE

Continuity measurement procedure


 Select the Continuity function.
 Set test parameters / limits.
 Connect test leads to C1, P1, P2 and C2 terminals on the instrument (4 wire), or connect
test lead to P/S terminal (2 wire measurement P/S – PE).
 Compensate test leads resistance (optional).
 Connect test leads to device under test.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.19: Examples of Continuity measurement results

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MI 3394 CE MultiTesterXA Single tests

6.2.2.1 Compensation of test leads resistance

This chapter describes how to compensate the test leads resistance in Continuity (Output =
P/S – PE) function. Compensation shall be carried out to eliminate the influence of test leads
resistance and the internal resistances of the instrument on the measured resistance.

Connection for compensating the resistance of test leads

Figure 6.20: Shorted test leads

Compensation of test leads resistance procedure

 Select the Continuity function. Parameter Output must be set to P/S - PE.
 Connect test leads to the instrument and short the test leads together, see Figure 6.20.
 Touch the key to compensate leads resistance.

 Symbol is displayed if the compensation was carried out successfully.

Figure 6.21: Uncompensated and compensated result

Note:
The compensation of test leads is carried out with set test current (I out).

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6.2.2.2 Limit Calculator

It is useful tool to determine continuity resistance high limit, especially when testing mains
power extension cords.

Limit calculator is included in Continuity function and can be accessed from options panel.

Limit Calculator screens are presented on Figure 6.22.

Figure 6.22: Limit Calculator screens

Three Limit rules are offered:

A: VDE / In < 16A


Continuity resistance limit is derived from table on wire length basis. Table is based on VDE
0701-0702 standard for nominal current In < 16A.

L wire length R Limit [Ω]


L <= 5 m 0.3
5 m < L <= 12.5 m 0.4
12.5 m < L <= 20 m 0.5
20 m < L <= 27.5 m 0.6
27.5 m < L <= 35 m 0.7
35 m < L <= 42.5 m 0.8
42.5 m < L <= 50 m 0.9
50 m < L <= 57.5 m 1.0

B: Calculator
Continuity resistance limit is calculated by the formula:

Where:
ρ ............... specific resistance of copper 1,68×10−8 Ωm
L ............... wire length selected from a list (1 m, 2 m, 3 m, … ,100 m) or Custom numeric entry
A ............... wire cross section selected from a list (0.50 mm2, 0.75 mm2, 1.00 mm2, 1.50 mm2,
2.5 mm2, 4.0 mm2, 10.0 mm2 ) or Custom numeric entry

C: Custom
Continuity resistance limit is directly selected from a list (Off,
0.01 Ω … 0.09 Ω, 0.1 Ω … 0.9 Ω, 1 Ω … 9 Ω) or H Limit Custom numeric entry.

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Procedure and parameter selection

 Select Limit Calculator from options panel of


Continuity test screen to open Limit Calculator
screen.

 Select Limit rule by using on-screen or keyboard


arrow keys.

Alternatively, selection is possible from the list.


By taping on the Limit rule field, list of available
Limit rules is presented. Tap on the chosen rule
field and screen returns to Limit Calculator.

 Select parameters value for chosen Limit rule by


using on-screen or keyboard arrow keys.

By tapping on parameter field, value can be


selected from presented list.
Calculator rule allow custom value Length and
Cross section entry with on-screen keyboard,
when Custom is selected from the value list.

Examples of parameter value lists:


- VDE rule Length parameter list
- Calculator rule Length parameter list
- Calculator rule Cross section parameter list.
Speed up parameters selection with:
- using scroll bar on the right side of the screen,
- keyboard right / left keys for page up / down.
Custom rule is intended for direct H Limit entry.
Select value from the list:
- by using arrow keys,
- tap on the field to open list and chose value,
- or enter value with on-screen keyboard after
Custom value is selected from the list.
Example of on-screen numeric keyboard – direct
H Limit custom value entry.

 Applies offered value from Limit Calculator that


automatically overwrite parameter H Limit(R) of
selected Continuity single test.

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6.2.3 HV AC
IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the
instrument.

Figure 6.23: HV AC test menu

Test results / sub-results


I ................ test current
U............... measured a.c. test voltage
Ir ............... resistive portion of test current
Ic .............. capacitive portion of test current

Test parameters
AC test voltage U test [100 V ... 5100 V in steps of 10 V]
Duration t end [Off, 1 s ... 120 s]

Test limits
High limit (I) H limit [Custom, 0.5 mA ... 100 mA ]
Low limit (I) L limit [Off, Custom, 0.5 mA ... 100 mA]

Test circuit

Figure 6.24: HV AC measurement

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HV AC measurement procedure
 Select the HV AC function.
 Set test parameters / limits.
 Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.
 Connect HV test leads to device under test.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.25: Examples of HV AC measurement results

Note:
 First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password
for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more
information.

6.2.4 HV DC
IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the
instrument.

Figure 6.26: HV DC test menu

Test results / sub-results


U............... measured test voltage
I ................ test current

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Test parameters
DC test voltage U test [500 V ... 6000 V in steps of 50 V]
Duration t end [Off, 1 s ... 120 s]

Test limits
High limit (I) H limit [Custom, 0.05 mA ... 10.0 mA]
Low limit (I) L limit [Off, Custom, 0.05 mA ... 10.0 mA]

Test circuit

Figure 6.27: HV DC measurement

HV DC measurement procedure
 Select the HV DC function.
 Set test parameters / limits.
 Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.
 Connect HV test leads to device under test.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

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Figure 6.28: Examples of HV DC measurement results

Note:
 First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password
for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more
information.

6.2.5 HV AC programmable
IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the
instrument.

In the HV AC programmable test the time dependency of high voltage can be set according to
diagram on Figure 6.29.

Figure 6.29: Voltage / time diagram of the HV AC programmable test

Figure 6.30: HV AC programmable test menu

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Test results / sub-results


I ................ test current
U............... measured test voltage
Ir ............... resistive portion of test current
Ic .............. capacitive portion of test current

Test parameters
Starting AC test voltage U start [100 V ... 5100 V in steps of 10 V]
AC test voltage U test [100 V ... 5100 V in steps of 10 V]
Duration of starting voltage t start [1 s ... 120 s ]
Duration of ramp t ramp [2 s ... 60 s ]
Duration of test voltage t end [Off, 1 s ... 120 s ]

Test limits
High limit (I) H limit [Custom, 0.5 mA ... 100 mA ]
Low limit (I) L limit [Off, Custom, 0.5 mA ... 100 mA]

Test circuit

Figure 6.31: HV AC programmable test

HV AC programmable test procedure


 Select the HV AC programmable function.
 Set test parameters / limits.
 Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.
 Connect HV test leads to device under test.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

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Figure 6.32: Examples of HV AC programmable test results


Note:
 First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password
for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more
information.

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6.2.6 HV DC programmable
IMPORTANT SAFETY NOTE
Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the
instrument.

In the HV DC programmable test the time dependency of high voltage can be set according to
diagram on Figure 6.29.

Figure 6.33: HV DC programmable test menu

Test results / sub-results


U............... measured test voltage
I ................ test current
Ic .............. capacitive portion of test current
Ir ............... resistive portion of test current

Test parameters
Starting DC test voltage U start [500 V ... 6000 V in steps of 50 V]
DC test voltage U test [500 V ... 6000 V in steps of 50 V]
Duration of starting voltage t start [1 s ... 120 s ]
Duration of ramp t ramp [2 s ... 60 s ]
Duration of test voltage t end [Off, 1 s ... 120 s ]

Test limits
High limit (I) H limit [Custom, 0.05 mA ... 10.0 mA ]
Low limit (I) L limit [Off, Custom, 0.05 mA ... 10.0 mA]

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Test circuit

Figure 6.34: HV DC programmable test

HV DC programmable test procedure


 Select the HV DC programmable function.
 Set test parameters / limits.
 Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.
 Connect HV test leads to device under test.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.35: Examples of HV DC programmable test results


Note:
 First HV measurement after power on the instrument (if password protection is enabled)
or first HV measurement after enabling or changing password require entering password
for enabling HV test. Refer to chapter 4.6.7 Change password for HV functions for more
information.

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6.2.7 Insulation resistance (Riso, Riso-S)

Figure 6.36: Insulation resistance test menus


Test results / sub-results
Riso .......... Insulation resistance
Riso-S ...... Insulation resistance-S
Um............ Test voltage

Test parameters
Nominal test voltage Uiso [50 V, 100 V, 250 V, 500 V, 1000 V]
Duration Duration [Off, 2 s ... 180 s]
Type of test Type [Riso, Riso-S, (Riso, Riso-S)]
Output connections (Riso) [ISO(+), ISO(-), Socket LN-PE, Socket LN-P/S]
Output connections (Riso-S) [Socket LN-P/S]

Test limits
H Limit (Riso) H limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]
L Limit (Riso) L limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]
H Limit (Riso-S) H limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]
L Limit (Riso-S) L limit [Off, Custom, 0.10 MΩ ... 10.0 MΩ ]

Test circuits

Figure 6.37: Measurement of insulation resistance (ISO(+), ISO(-))

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Figure 6.38: Measurement of insulation resistance (Socket LN - PE)

Figure 6.39: Measurement of Riso, Riso-S (socket)

RISO measurement procedure


 Select the Riso function.
 Set test parameters / limits.
 Connect test leads to ISO(+), ISO(-) terminals on the instrument, then connect test leads to
device under test, or
 Connect device to mains test socket. For Riso-S test, additionally connect test lead to P/S
terminal on instrument, and then connect test lead to device.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

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Figure 6.40: Examples of Insulation resistance measurement results


Note:
 When P/S probe is connected during the Riso measurement, then the current through it
is also considered.

6.2.8 Sub-leakage (Isub, Isub-S)

Figure 6.41: Sub Leakage test menus

Test results / sub-results


Isub .......... Sub-leakage current
Isub-S ....... Sub-leakage current-S

Test parameters
Type of test Type [Isub, Isub-S, (Isub, Isub-S)]
Duration Duration [Off, 2 s ... 180 s]
Output connections (Isub) [SUB1, SUB2, Socket LN-PE, Socket LN-P/S]
Output connections (Isub-S) [Socket LN-P/S]

Test limits
H Limit (Isub) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Isub) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]
H Limit (Isub-S) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Isub-S) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]

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Test circuits

Figure 6.42: Measurement of Sub-leakage (SUB1, SUB2)

Figure 6.43: Measurement of Sub-leakage (socket LN-PE)

Figure 6.44: Measurement of Sub-leakage, Sub-leakage-S (socket)

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Sub-leakage measurement procedure


 Select the Sub-leakage function.
 Set test parameters / limits.
 Connect test leads to SUB1,SUB2 terminals on the instrument, then connect test leads to
device under test, or
 Connect device under test to mains test socket. For Isub-S test, additionally connect test
lead to P/S terminal on the instrument, and then connect test lead to a device.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.45: Examples of Sub-leakage measurement results

Note:
 When P/S probe is connected during the Sub-leakage measurement, then the current
through it is also considered.

6.2.9 Differential Leakage

Figure 6.46: Differential Leakage test menu

Test results / sub-results


Idiff ........... Differential Leakage current
P ............... Power

Test parameters
Duration Duration [Off, 2 s ... 180 s]
Change status Change [YES, NO]
YES: The instrument measures leakage current in two sequential
steps with delay* in between. The phase voltage is firstly
applied to the right live output of the mains test socket and
secondly to the left live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
mains test socket.

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*Delay time Delay [0.2 s … 5 s]

Test limits
H Limit (Idiff) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Idiff) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]
Output connections [Socket L,N – PE,P/S ]

Test circuit

Figure 6.47: Measurement of Differential Leakage current

Differential Leakage measurement procedure


 Select the Differential Leakage function.
 Set test parameters / limits.
 Connect device under test to mains test socket and optionally to P/S terminal.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.48: Examples of Differential Leakage measurement results

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6.2.10 Ipe Leakage

Figure 6.49: Ipe Leakage test menu

Test results / sub-results


Ipe ............ PE current
P ............... Power

Test parameters
Duration Duration [Off, 2 s ... 180 s]
Change status Change [YES, NO]
YES: The instrument measures leakage current in two sequential steps
with delay* in between. The phase voltage is firstly applied to the
right live output of the mains test socket and secondly to the left
live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
mains test socket.
*Delay time Delay [0.2 s … 5 s]
Output connections [Socket L,N – PE]

Test limits
H Limit (Ipe) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Ipe) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]

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Test circuit

Figure 6.50: Measurement of Ipe Leakage current

Ipe Leakage measurement procedure


 Select the Ipe Leakage function.
 Set test parameters / limits.
 Connect device under test to mains test socket.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.51: Examples of Ipe Leakage measurement results

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6.2.11 Touch Leakage

Figure 6.52: Touch Leakage test menu

Test results / sub-results


Itou ........... Touch Leakage current
P ............... Power

Test parameters
Duration Duration [Off, 2 s ... 180 s]
Change status Change [YES, NO]
YES: The instrument measures leakage current in two sequential steps
with delay* in between. The phase voltage is firstly applied to the
right live output of the mains test socket and secondly to the left
live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
mains test socket.
*Delay time Delay [0.2 s … 5 s]
Output connections [Socket L,N – PE,P/S]

Test limits
H Limit (Itou) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Itou) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]

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Test circuit

Figure 6.53: Measurement of Touch Leakage current

Touch Leakage measurement procedure


 Select the Touch Leakage function.
 Set test parameters / limits.
 Connect device under test to mains test socket. Connect test lead to P/S terminal on the
instrument and on device under test.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.54: Examples of Touch Leakage measurement results

6.2.12 Power

Figure 6.55: Power measurement menu

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Test results / sub-results


P ............... Active power
S ............... Apparent power
Q .............. Reactive power
PF............. Power factor
THDu ........ Total harmonic distortion – voltage
THDi ......... Total harmonic distortion – current
Cos Φ ....... cosine Φ
I ................ Load current
U............... Voltage

Test parameters
Duration Duration [Off, 2 s ... 180 s]
Output connections [Socket L–N]

Test limits
H Limit (P) H limit [Off, Custom, 10 W ... 3.50 kW ]
L Limit (P) L limit [Off, Custom, 10 W ... 3.50 kW ]

Test circuit

Figure 6.56: Measurement of Power

Power measurement procedure


 Select the Power function.
 Set test parameters / limits.
 Connect device under test to mains test socket.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

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Figure 6.57: Examples of Power measurement results

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6.2.13 Leak's & Power

Figure 6.58: Leak’s & Power measurement menu

Test results / sub-results


P ............... Active power
Itou ........... Touch Leakage current
Idiff ........... Differential Leakage current
S ............... Apparent power
Q .............. Reactive power
PF............. Power factor
THDu ........ Total harmonic distortion – voltage
THDi ......... Total harmonic distortion – current
Cos Φ ....... cosine Φ
I ................ Load current
U............... Voltage

Test parameters
Duration Duration [Off, 2 s ... 180 s]
Change status Change [YES, NO]
YES: The instrument measures leakage current in two sequential
steps with delay* in between. The phase voltage is firstly
applied to the right live output of the mains test socket and
secondly to the left live output of the mains test socket.
NO: The phase voltage is applied only to the right live output of the
mains test socket.
*Delay time Delay [0.2 s … 5 s]
Output connections [Socket L–N, Socket L,N – PE,P]

Test limits
H Limit (P) H limit [Off, Custom, 10 W ... 3.50 kW ]
L Limit (P) L limit [Off, Custom, 10 W ... 3.50 kW ]
H Limit (Idiff) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Idiff) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]
H Limit (Itou) H limit [Off, Custom, 0.25 mA ... 15.0 mA ]
L Limit (Itou) L limit [Off, Custom, 0.25 mA ... 15.0 mA ]

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Test circuit

Figure 6.59: Measurement of Leak’s and Power

Leak’s & Power measurement procedure


 Select the Leak’s & Power function.
 Set test parameters / limits.
 Connect device under test to mains test socket and optionally to P/S terminal.
 Start measurement.
 Measurement can be stopped manually or by timer.
 Save results (optional).

Figure 6.60: Examples of Leak’s & Power measurement results

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6.2.14 Discharging Time

Figure 6.61: Discharging Time test menu

Test results / sub-results


t ................ Discharging time
Up............. Peak voltage of supply during the test

Test parameters
Limit voltage Limit U [34 V, 60 V, 120 V]
Output connections Output [External, Socket]
Test mode Mode [Manual, Auto]
Delay time for AUTO mode Delay [2 s ... 30 s]

Test limit
Discharging time limit Limit(t) [1 s, 5 s ]

Measuring principle (Output = External)


The measuring principle of the Discharging time function is as following:

Phase  The device under test is connected to supply voltage via an external socket. The
instrument monitors the voltage (on supply or internal connections) and internally
stores the peak voltage value.

Phase  The device under test is disconnected from the supply and the voltage at the test
terminals starts to fall. Once the r.m.s voltage falls for 10 V the instrument starts
the timer.

Phase  After the voltage drops below an internally calculated voltage value the timer is
stopped. The instrument re-calculates the measured time to a value as it would be
if the disconnection occurred at the maximum voltage value.

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(1) peak voltage (4) Ulim


(2) voltage at disconnection time (5) moment of disconnection
(3) calculated voltage value (6) discharging time
Figure 6.62: Measuring principle (external)

Test circuit (Output = External)

Figure 6.63: Discharging Time test (Output = External)

Discharging Time test procedure (Output = External)


 Select the Discharging Time function.
 Set test parameters / limits.
 Connect test leads to the DISCHARGING TIME terminals on the instrument and on the
device under test.
 Connect device under test to the mains supply and Switch it ON.
 Start measurement.
 Measurement is stopped manually by disconnecting device under test mains supply.
 Save results (optional).

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Figure 6.64: Examples of Discharging Time measurement results (Output = External)

Measuring principle (Output = Socket)


The measuring principle of the Discharging time function is as following:

Phase  The DEVICE UNDER TEST is connected to the mains test socket.The instrument
monitors the mains voltage and internally stores the peak voltage value.

Phase  The instrument disconnects the DEVICE UNDER TEST from the supply and the
voltage at the supply connections starts to fall. Disconnection moment is always at
peak voltage.

Phase  After the voltage drops below the limit value the timer is stopped.

Test circuit (Output = Socket)

Figure 6.65: Discharging Time test (Output = Socket)

Discharging Time test procedure (Output = Socket)


 Select the Discharging Time function.
 Set test parameters / limits.
 Connect the device under test to the mains test socket on the instrument.
 Start measurement.
 Measurement can be stopped manually or automatically.
 Save results (optional).

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Figure 6.66: Examples of Discharging Time measurement results (Output = Socket)

6.2.15 Functional inspections

Figure 6.67: Functional inspection start menu (left) and menu during inspection (right)

Test parameters (optional)


For the optional Power measurement test the parameters and limits are the same as set in the
Power single test, see chapter 6.2.12 Power.
Test circuit

Figure 6.68: Functional inspection

Functional inspection procedure


 Select the appropriate Functional inspection.
 Start the inspection.
 Perform the functional inspection of the appliance / equipment.
 Perform the Power measurement test through the mains test socket (optional).
 Apply appropriate ticker(s) to items of inspection.
 End the inspection.

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MI 3394 CE MultiTesterXA Single tests

 Save results (optional).

Figure 6.69: Examples of Functional Inspection results

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MI 3394 CE MultiTesterXA Auto Sequences®

7 Auto Sequences®
Pre-programmed sequences of measurements can be carried out in Auto Sequences® menu.
The sequence of measurements, their parameters and flow of the sequence can be
programmed. The results of an Auto Sequence® can be stored in the memory together with all
related information.
Auto Sequences® can be pre-programmed on PC with the Metrel ES Manager software and
uploaded to the instrument. On the instrument parameters and limits of individual single test in
the Auto Sequence® can be changed / set.

7.1 Selection of Auto Sequences®


Required Auto Sequence® group from Auto Sequence® groups menu should be selected first.
Refer to Chapter 4.9 Auto Sequence® groups for more details.
Auto Sequence® to be carried out can then be selected from the Main Auto Sequences® menu,
which can be organized in structural manner with folders and sub-folders containing Auto
Sequences®.
Searching by name or short code is also possible within the active Auto Sequence® group. Refer
to Chapter 7.1.2 Searching in Auto Sequences® menu for details.

7.1.1 Selecting an active Auto Sequence® group in Auto


Sequences® menu
Auto Sequences® and Auto Sequence® group menus are interconnected so an active Auto
Sequence® group can be also selected in the Auto Sequences® menu.

Procedure

 Select Auto Sequence® group header in Auto


Sequences® menu by taping on it.

Selects the Auto Seq. groups icon from Control


 panel. Auto Sequence® groups menu appear
on the screen.
Selects desired Auto Sequence® group from
available groups.

 Confirms a new selection.

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New Auto Sequence® group is selected and all


folders, sub-folders and Auto Sequences®
within that group are displayed on the screen.

7.1.2 Searching in Auto Sequences® menu

In Auto Sequence® menu it is possible to search for Auto Sequences® on base of their Name or
Short code.
Procedure

 Select Auto Sequence® group header in


Auto Sequences® menu by taping on it.

 Select Search from options menu to open


Search setup menu.

 The parameters that can be searched for are


displayed in the Search setup menu.

a The search can be narrowed by entering a


text in the Name and Short code fields.

Strings can be entered by using the on-


screen keyboard.

b Clears all filters. Sets filters to default value.

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MI 3394 CE MultiTesterXA Auto Sequences®

 Searches through the active Auto


Sequence® group according to the set filters.
The results are shown in the Search results
screen presented on Figure 7.1 and Figure
7.2.

Figure 7.1: Search results screen Page view

Options
Next page.

Previous page.

Note:
 Search result page consist of up to 50 results.

Figure 7.2: Search results screen with Auto Sequence® selected

Options
Goes to location in Auto Sequences® menu.

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MI 3394 CE MultiTesterXA Auto Sequences®

Goes to Auto Sequence® view menu.

Starts the selected Auto Sequence®.

7.1.3 Structure organization of Auto Sequence® group

The Auto Sequences® to be carried out can be selected from the active group in Main Auto
Sequences® menu. This menu can be organized in a structural manner with folders, sub-folders
and Auto Sequences®. Auto Sequence® in the structure can be the original Auto Sequence® or
a shortcut to the original Auto Sequence®.
Auto Sequences® marked as shortcuts and the original auto Sequences® are coupled.
Changing of parameters or limits in any of the coupled Auto Sequences® will influence on the
original Auto Sequence® and all its shortcuts.

Figure 7.3: Structure organization of Auto Sequence® group, Auto Sequence® selected

Options

The original Auto Sequence®.

A shortcut to the original Auto Sequence®.

Starts the selected Auto Sequence®.


The instrument immediately starts the Auto Sequence®.

Enters menu for more detail view of selected Auto Sequence®.


This option should also be used if the parameters / limits of the
selected Auto Sequence® have to be changed. Refer to chapter 7.2.1
Auto Sequence® view menu for more information.

Enters Auto Sequence® Configurator menu (if available).


See chapter 7.2.1.3 Auto Sequence® Configurator menu for details.

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7.2 Organization of Auto Sequence® tests


An Auto Sequence® test is divided into three phases:
 Before starting the first test the Auto Sequence® view menu is shown (unless it was
started directly from the Main Auto Sequence® menu). Parameters and limits of
individual measurements can be set in this menu.
 During the execution phase of an Auto Sequence®, pre-programmed single tests are
carried out. The sequence of single tests is controlled by pre-programmed flow
commands.
 After the test sequence is finished the Auto Sequence® result menu is shown. Details of
individual tests can be viewed and the results can be saved to Memory organizer.

7.2.1 Auto Sequence® view menu


In the Auto Sequence® view menu the header and the single tests of selected Auto Sequence®
are displayed. The header contains Name, Short code (if set) and description of the Auto
Sequence®. Before starting the Auto Sequence®, test parameters / limits of individual
measurements can be changed.

7.2.1.1 Auto Sequence® view menu (header is selected)

Figure 7.4: Auto Sequence® view menu – header selected


Options

Starts the Auto Sequence®.

Enters Auto Sequence® Configurator menu (if available).


See chapter 7.2.1.3 Auto Sequence® Configurator menu for details.

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7.2.1.2 Auto Sequence® view menu (measurement is selected)

Figure 7.5: Auto Sequence® view menu – measurement selected


Options

Selects single test.

Opens menu for changing parameters and limits of selected


measurements.
Refer to chapter 6.1.1.2 Setting parameters and limits of single
tests for more information how to change measurement
parameters and limits.
on

Starts the selected Auto Sequence®.

Opens the Help menu of selected test.

Selects Multiple points.

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MI 3394 CE MultiTesterXA Auto Sequences®

Sets operation mode for multiple points. For more information


see chapter 7.2.1.5 Managing multiple points.

on

7.2.1.3 Auto Sequence® Configurator menu

Auto Sequence® Configurator menu options are active only when single tests within selected
Auto sequence® contain configurable limits and / or parameters. They can be changed to suit
requirements of current object under test before Auto sequence® execution. Original settings
are overwritten for intended Auto sequence® execution only.
Select Configurator option from Auto sequence® Main screen or View screen to open
Configurator menu presented on Figure 7.6 below.
Available settings are organized in groups, each group starts with concerned Single test name.
Limit Calculator is referred to Continuity function. Refer to Single test description chapter for
details of parameters and limits setting / calculation.

Figure 7.6: Auto Sequence® Configurator menu – opened from Auto Sequence® Main menu on the
left, on the right opened from Auto Sequence® view menu
Options

Starts the Auto Sequence® from Configurator menu.


Option is available, if configurator was opened from Auto Sequence®
Main menu. New configuration is automatically applied to all related
single tests.

Confirms limits and parameters setting and returns to view menu.


Option is available, if configurator was opened from Auto Sequence®
view menu. Start the Auto Sequence® from view menu with confirmed
configuration.

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7.2.1.4 Indication of Loops

The attached ‘x3’ at the end of single test name indicates that a loop of single tests is
programmed. This means that the marked single test will be carried out as many times as the
number behind the ‘x’ indicates. It is possible to exit the loop before, at the end of each
individual measurement.

7.2.1.5 Managing multiple points

If the device under test has more than one test point for an individual single test and the
selected Auto Sequence® predicts only one test point (one single test) it is possible to change
the Auto Sequence® appropriately. Single tests with enabled Multiple points ticker will be
executed in a continuous loop. It is possible to exit the loop anytime at the end of each
individual measurement.
The Multiple points setting is valid only for the actual Auto Sequence®. If the user often tests
appliances with more than one test points it is recommended to program a special Auto
Sequence® with pre-programmed loops.

7.2.2 Step by step execution of Auto Sequences®

While the Auto Sequence® is running it is controlled by pre-programmed flow commands.


Examples of actions controlled by flow commands are:
- pauses during the test sequence
- monitoring of input pins
- control of lamps, test adapters and other external devices
- proceeding of test sequence in regard to measured results
- etc.
The actual list of flow commands is available on chapter E.5 Description of flow commands.

Figure 7.7: Auto Sequence® – example of a pause with message

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MI 3394 CE MultiTesterXA Auto Sequences®

Figure 7.8: Auto Sequence® – example of a finished measurement with options for
proceeding

Options (during execution of an Auto Sequence®)


Proceeds to next step in the test sequence.
Repeats the measurement if multiple points execution is selected.
Displayed result of a single test will be stored.
Repeats the measurement.
Displayed result of a single test will not be stored.

Ends the Auto test and goes to Auto test result screen. Refer to
chapter 7.2.3 Auto Sequence® result screen for more information.

Exits the loop of single tests (pre-programmed loop or multiple


points execution) and proceeds to the next step in the test
sequence.
Opens menu for viewing parameters and limits of a current
measurement.

on

Adds comment.
The instrument opens keypad for entering a comment to a current
measurement.

The offered options in the control panel depend on the selected single test, its result and the
programmed test flow.

Note:
 During Auto Sequence® the popup Warning messages (see chapter 4.4 Symbols and
messages) are displayed only before the single test inside one Auto Sequence®. This
default setting can be changed with appropriate flow command. For more information
about programming Auto Sequences® refer to chapter Appendix E - Programming of Auto
Sequences® on Metrel ES Manager.

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MI 3394 CE MultiTesterXA Auto Sequences®

7.2.3 Auto Sequence® result screen

After the Auto Sequence® is finished the Auto Sequence® result screen is displayed as
presented on Figure 7.9. At the left side of the display the single tests and their statuses are
shown. In the middle of the display the header of the Auto Sequence® is displayed and at the
top the overall Auto Sequence® status is displayed. Refer to chapter 5.1.1 Measurement
statuses for more information.

Figure 7.9: Auto Sequence® result screen


Options
Start Test
Starts a new Auto Sequence®.

View results of individual measurements.


The instrument goes to menu for viewing details of the Auto Sequence®, see
Figure 7.10.
Adds comment to the Auto Sequence®. The instrument opens keypad for entering
a comment.

Saves the Auto Sequence® results.


A new Auto Sequence® was selected and started from a Structure object in the
structure tree:
 The Auto Sequence® will be saved under the selected Structure object.
A new Auto Sequence® was started from the Auto Sequence® main menu:
 Saving under the last selected Structure object will be offered by default. The
user can select another Structure object or create a new Structure object.

By pressing in Memory organizer menu the Auto Sequence® is saved


under selected location.
An empty measurement was selected in structure tree and started:
 The result(s) will be added to the Auto Sequence®. The Auto Sequence® will

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MI 3394 CE MultiTesterXA Auto Sequences®

change its overall status from ‘empty’ to ‘finished’.


An already carried out Auto Sequence® was selected in structure tree, viewed and
then restarted:
 A new Auto Sequence® will be saved under the selected Structure object.
Print label.
See chapter 4.6.9 Devices for details how to enable and set the printer. For more
information refer to chapter Appendix C - Print labels and write / read RFID / NFC
tags.
Print and Save Auto Sequence® results simultaneously.
Option is available if Devices parameter Auto save is set to On print, se chapter
4.6.9 Devices for more information.
Write RFID/NFC tag.
Refer to Appendix C - Print labels and write / read RFID / NFC tags for supported
tag types.
Write RFID / NFC tag and Save Auto Sequence® results simultaneously. Option is
available if Devices parameter Auto save is set to On write, see chapter 4.6.9
Devices for more information.
Note:
Options menu content depends on Devices settings menu. If no writing device is set, than ‘Print
label’ and ‘Write RFID’ icons are hidden. Only one writing device can be set at the same time.

Options (menu for viewing details of Auto Sequence® results):

Details of selected single test in Auto Sequence® are displayed, see


Figure 7.10.

Adds comment to the selected single test in Auto Sequence®. The


instrument opens keypad for entering a comment.

View parameters and limits of selected single test.

Figure 7.10: Details in Auto Sequence® results menu screens

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MI 3394 CE MultiTesterXA Auto Sequences®

7.2.4 Auto Sequence® memory screen

In Auto Sequence® memory screen details of the auto test can be viewed, labels can be printed
and a new Auto Sequence® can be restarted.

Figure 7.11: Auto Sequence® memory screen


Options
Retest the Auto Sequence®.
Enters menu for a new Auto Sequence®.

Enters menu for viewing details of the Auto Sequence®. Refer to chapter 7.2.3
Auto Sequence® result screen for more information.

Print label.
See chapter 4.6.9 Devices for details how to enable and set the printer. For more
information refer to chapter Appendix C - Print labels and write / read RFID / NFC
tags.
Write RFID/NFC tag. All data including Auto Sequence® results are written to the
RFID/NFC writing device. Refer to chapter Appendix C - Print labels and write /
read RFID / NFC tags for supported tag types.

Note:
Options menu content depends on Devices settings menu. If no writing device is set, than ‘Print
label’ and ‘Write RFID’ icons are hidden. Only one writing device can be set at the same time.

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MI 3394 CE MultiTesterXA Maintenance

8 Maintenance
8.1 Periodic calibration
It is essential that all measuring instruments are regularly calibrated in order for the technical
specification listed in this manual to be guaranteed. We recommend an annual calibration.

8.2 Fuses
There are four fuses on the front panel:
F1, F2: F 5 A / 250 V / (20  5) mm / 1500 A: intended for instrument protection.
For position of fuses refer to chapter 3.1 Front panel.
F3, F4: T 16 A / 250 V / (32  6,3) mm / 1500 A: protection against over-currents
through mains test socket.
For position of fuses refer to chapter 3.1 Front panel.
Warnings!
 Switch off the instrument and disconnect all test accessories and mains cord before
replacing the fuses or opening the instrument.
 Replace blown fuses only with the same types defined in this document.

8.3 Service
For repairs under or out of warranty please contact your distributor for further information.
Unauthorized person is not allowed to open the CE MultiTesterXA instrument. There are no
user replaceable parts inside the instrument.

8.4 Cleaning
Use a soft, slightly moistened cloth with soap water or alcohol to clean the surface of CE
MultiTesterXA MI 3394 instrument. Leave the instrument to dry totally before using it.
Notes:
 Do not use liquids based on petrol or hydrocarbons!
 Do not spill cleaning liquid over the instrument!

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MI 3394 CE MultiTesterXA Communications

9 Communications
9.1 USB and RS232 communication with PC
The instrument automatically selects the communication mode according to detected interface.
USB interface has priority.

How to establish an USB or RS-232 link:

 RS-232 communication: connect a PC COM port to the instrument RS232-2 connector


using the RS232 serial communication cable;
 USB communication: connect a PC USB port to the instrument USB connector using the
USB interface cable.
 Switch on the PC and the instrument.
 Run the Metrel ES Manager software.
 Select communication port.
 The PC and the instrument will automatically recognize each other.
 The instrument is prepared to communicate with the PC.

Metrel ES Manager is a PC software running on Windows 7, Windows 8, Windows 8.1 and


Windows 10.

9.2 Bluetooth communication


The internal Bluetooth module enables easy communication via Bluetooth with PC and Android
devices.

How to configure a Bluetooth link between instrument and PC

 Switch On the instrument.


 On PC configure a Standard Serial Port to enable communication over Bluetooth link
between instrument and PC. Usually, no code for pairing the devices is needed.
 Run the Metrel ES Manager software.
 Select configured communication port.
 The PC and the instrument will automatically recognize each other.
 The instrument is prepared to communicate with the PC.

How to configure a Bluetooth link between instrument and Android device

 Switch On the instrument.


 Some Android applications automatically carry out the setup of a Bluetooth connection.
It is preferred to use this option if it exists. This option is supported by Metrel's Android
applications.
 If this option is not supported by the selected Android application, then configure a
Bluetooth link via Android device’s Bluetooth configuration tool. Usually, no code for
pairing the devices is needed.
 The instrument and Android device are ready to communicate.

Notes

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MI 3394 CE MultiTesterXA Communications

 Sometimes there will be a demand from the PC or Android device to enter the code.
Enter code ‘NNNN’ or ‘1234’ (depends of Bluetooth module type), to correctly configure
the Bluetooth link.
 The name of correctly configured Bluetooth device must consist of the instrument type
plus serial number, e.g. MI 3394-12240429I. If the Bluetooth module got another name,
the configuration must be repeated.
 In case of serious troubles with the Bluetooth communication it is possible to reinitialize
the internal Bluetooth module. The initialization is carried out during the Initial settings
procedure. In case of a successful initialization “INITIALIZING… OK!” is displayed at the
end of the procedure. See chapter 4.6.10 Initial Settings.
 Check if there are available Metrel Android applications for this instrument.

9.3 Bluetooth communication with printers and scanners


CE MultiTester XA instrument can communicate with supported Bluetooth printers and
scanners. Contact Metrel or your distributor which external devices and functionalities are
supported. See Chapter 4.6.9 Devices for details how to set the external Bluetooth devices.

9.4 Ethernet communication


The instrument is also capable of communicating through an Ethernet port. The Ethernet
communication must be fully configured in the setting menu before first use. See chapter 4.6.8
Settings for details.
Metrel ES Manager is currently not supporting Ethernet communication. Contact Metrel or your
distributor regarding options for using the Ethernet communication.

9.5 RS232 communication with other external devices


It is possible to communicate with scanners via the RS232-2 serial port and printers via the
RS232-1 serial port. Contact Metrel or your distributor which external devices and functionalities
are supported.

9.6 Connections to test adapters


9.6.1 Test connector TC1

The 8 pin test connector TC1 is intended for connection of external test adapters. TC1 consists
of Measuring signal connector and Communication signal connector.

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MI 3394 CE MultiTesterXA Communications

Figure 9.1: Test connector TC1 layout


Legend:

4 pin measuring signal connection (Safety connector)


1 In parallel to terminal N on mains test socket
2 In parallel to terminal L on mains test socket
3 In parallel to terminal PE on mains test socket
4 In parallel to terminal P/S

4 pin communication signal connection1) (USB type connector)


5 Rx, Tx, +5V, GND

Note
 1)Do not connect USB communication cable to 4 pin communication signal connector. It is
intended only for connection to test adapters.

9.7 INPUTs
The DB9 connector INPUTs is intended for connection of external control signals.

Figure 9.2: INPUT connector - pin layout

Legend:
Pin Description Type
5 EXTERNAL OK KEY Input for Remote
mode control pedal Input low: < 1 V d.c. against earth
6 IN_2 External input 2 Input high: > 4.5 V d.c. against earth
7 IN_3 External input 3 Umax: 24 V a.c, d.c against earth
8 IN_4 External input 4

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MI 3394 CE MultiTesterXA Communications

4 IN_5 External input 5


9 GND
3 Instrument reset pin
1,2 Not supported

126
MI 3394 CE MultiTesterXA Communications

9.8 OUTPUTs
Via the DB9 connector OUTPUT four control signals for external devices are provided.

Figure 9.3: OUTPUT connector - pin layout

Legend:
Pins Description Type
4,9 OUT_1 Control output 1 NO relay,
Umax: 24V, Imax:
1.5 A
Output low: open
3,8 OUT_2 Control output 2 contact
Output high: closed
contact

2,7 OUT_3 Control output 3

1,6 OUT_4 Control output 4

5 +5 V Supply for inputs

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MI 3394 CE MultiTesterXA Technical specifications

10 Technical specifications

10.1 HV AC, HV AC programmable


Voltage a.c.
Range Resolution Accuracy
U 0 V ... 1999 V 1V (3 % of reading)
2.00 kV ... 5.99 kV 10 V (3 % of reading)

Current a.c. (apparent)


Range Resolution Accuracy
I 0.0 mA ... 99.9 mA 0.1 mA (3 % of reading + 3 D)

Current a.c.(capacitive, resistive)


Range Resolution Accuracy
Ir 0.0 mA ... 99.9 mA 0.1 mA Indicative
Ic -99.9 mA ... 99.9 mA 0.1 mA Indicative

Output voltage ................................................. 100 V … 1000 V (-0/+10%),


........................................................................ 1010 V … 5100 V (-0/+7%) floating to earth
Trip out time (if apparent current exceeds high limit).......... < 30 ms
Short circuit current ………………………………………….> 200 mA
Output power………………………………………………….500 VAmax

Test terminals
Function Connections
Withstanding voltage (HVAC, HVAC-P) HV(~,+) ↔ HV(~,-)

10.2 HV DC, HV DC programmable


Voltage d.c.
Range Resolution Accuracy
U 0 V ... 1999 V 1V (3 % of reading)
2.00 kV ... 6.99 kV 10 V (3 % of reading)

Current d.c.
Range Resolution Accuracy
I 0.01 mA ... 9.99 mA 0.01 mA (5 % of reading + 3 D)

Output voltage ................................................. 500 V … 1000 V (-0/+10%),


........................................................................ 1050 V … 6000 V (-0/+7%) floating to earth
Ripple voltage .................................................. 3 %
Trip out time (if current exceeds high limit) ...... < 30 ms
Max. capacitive load ........................................ 2 µF

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MI 3394 CE MultiTesterXA Technical specifications

Test terminals
Function Connections
Withstanding voltage (HVDC, HVDC-P) HV(~,+) ↔ HV(~,-)

10.3 Continuity
Continuity
Range Resolution Accuracy
0.000  ... 1.999  0.001  (2 % of reading + 2 D)
2.00  ... 19.99  0.01   2 % of reading
R 20.0  ... 99.9  0.1   3 % of reading
100.0  ... 199.9  0.1   5 % of reading
200  ... 999  1 indicative

Voltage drop ( Iout = 10 A)


Range Resolution Accuracy
ΔU 0.00 V ... 19.99 V 0.01 V (2 % of reading + 5 D)
20.0 V ... 99.9 V 0.1 V  3 % of reading

Limit value of voltage drop versus wire cross-section:


Wire cross-section (mm2) Limit voltage drop (V)
0.5 5.0
0.75 5.0
1 3.3
1.5 2.6
2.5 1.9
4 1.4
6 1.0

Operating range (acc. to EN 61557-4) ............. 0.008 Ω ... 199.9 


Test currents ................................................... 0.2A, 4A, 10A, 25A
Current source (at nominal mains voltage, use of standard accessories)
........................................................................ 0.2 A at R < 8 Ω
........................................................................ 4 A at R < 1 Ω
........................................................................ 10 A at R < 0.5 Ω
........................................................................ 25 A at R < 0.2 Ω
Open circuit voltage ......................................... < 6 V a.c.
Max current lead resistance ............................ 40 Ω
Test lead compensation (P/S – PE) ................ up to 5 Ω
Test method: Continuity 4 wire ....................... Kelvin method, floating to earth
Test method: Continuity P/S – PE.................... 2 wire test, floating to earth

Test terminals
Function Connections
Continuity P/S – PE P/S ↔ Mains test socket (PE), TC1
Continuity 4 wire P1/C1 ↔ P2/C2

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MI 3394 CE MultiTesterXA Technical specifications

10.4 Insulation Resistance, Insulation Resistance-S


Insulation resistance (250 V, 500 V, 1000 V)
Range Resolution Accuracy
0.00 M … 19.99 M 0.01 M (3 % of reading + 2 D)
Riso
20.0 M ... 199.9 M 0.1 M  10 % of reading

Insulation resistance –S (250 V, 500 V, 1000 V)


Range Resolution Accuracy
0.00 M … 19.99 M 0.01 M (3 % of reading + 2 D)
Riso-S
20.0 M ... 199.9 M 0.1 M  20 % of reading

Insulation resistance, Insulation resistance –S (50 V, 100 V)


Range Resolution Accuracy
Riso 0.00 M ... 19.99 M 0.01 M (5 % of reading + 2 D)
Riso-S 20.0 M ... 99.9 M 0.1 M  20 % of reading

Output voltage
Range Resolution Accuracy
Um 0 V ... 1200 V 1V (3 % of reading + 2 D)

Operating range (acc. to EN 61557-2) ........ 0.08 M ... 199.9 M


Nominal voltages Un (d.c.).......................... 50 V, 100 V, 250 V, 500 V, 1000V (- 0 %, + 10 %)
Short circuit current .................................... max. 2.0 mA

Test terminals
Function Connections
Insulation Mains test socket (LN), ISO(+) ↔ Mains test socket (PE), ISO(-),
TC1
Insulation – S Mains test socket (LN), ISO(+) ↔ P/S, TC1

10.5 Substitute Leakage Current, Substitute Leakage


Current - S
Substitute leakage current, Substitute leakage current - S

Range Resolution Accuracy


Isub
0.00 mA ... 19.99 mA 10 µA (5 % of reading + 3 D)
Isub-S

Operating range (acc. to EN 61557-16) ........... 0.12 mA ... 19.99 mA


Open circuit voltage ......................................... < 50 V a.c.
Current calculated to mains supply voltage (110 V or 230 V) is displayed.

Test terminals:
Function Connections
Subleakage Mains test socket (LN), SUB1 ↔ Mains test socket (PE), SUB2,
TC1
Subleakage – S Mains test socket (LN), SUB1 ↔ P/S, TC1

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MI 3394 CE MultiTesterXA Technical specifications

10.6 Differential Leakage current

Differential leakage current


Range Resolution Accuracy
Idiff 0.00 mA ... 19.99 mA 0.01 mA (3 % of reading + 5 D)

Power (active)
Range Resolution Accuracy
0.00 W…19.99 W 0.01 W (5 % of reading + 5 D)
20.0 W…199.9 W 0.1 W  5 % of reading
P
200 W ... 1999 W 1W  5 % of reading
2.00 kW ... 3.70 kW 10 W  5 % of reading

Operating range (acc. to EN 61557-16) ........... 0.19 mA ... 19.99 mA


Frequency response of measuring circuit ........ complies with EN 61010 - Figure A1
Influence of load current .................................. < 0.02 mA/A

Test terminals:
Function Connections
Differential leakage Mains test socket (LN), TC1

10.7 PE leakage current

PE leakage current
Range Resolution Accuracy
0.010 mA ... 1.999 mA 0.001 mA (3 % of reading + 3 D)
Ipe
2.00 mA ... 19.99 mA 0.01 mA (3 % of reading)

Power (active)
Range Resolution Accuracy
0.00 W…19.99 W 0.01 W (5 % of reading + 5 D)
20.0 W…199.9 W 0.1 W  5 % of reading
P
200 W ... 1999 W 1W  5 % of reading
2.00 kW ... 3.70 kW 10 W  5 % of reading

Operating range (acc. to EN 61557-16) ........... 0.025 mA ... 19.99 mA


Frequency response of measuring circuit ........ complies with EN 61010 - Figure A1

Test terminals:
Function Connections
PE leakage Mains test socket, TC1

10.8 Touch leakage current


Touch leakage current
Range Resolution Accuracy

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MI 3394 CE MultiTesterXA Technical specifications

0.010 mA ... 1.999 mA 0.001 mA (3 % of reading + 3 D)


Itou
2.00 mA ... 19.99 mA 0.01 mA (3 % of reading)

Power (active)
Range Resolution Accuracy
0.00 W…19.99 W 0.01 W (5 % of reading + 5 D)
20.0 W…199.9 W 0.1 W  5 % of reading
P
200 W ... 1999 W 1W  5 % of reading
2.00 kW ... 3.70 kW 10 W  5 % of reading

Operating range (acc. to EN 61557-16) ........... 0.025 mA ... 19.99 mA


Frequency response of measuring circuit ........ complies with EN 61010 - Figure A1

Output:
Function Connections
Touch leakage Mains test socket ↔ P/S, TC1

10.9 Power
Power (active)
Range Resolution Accuracy
0.00 W…19.99 W 0.01 W (5 % of reading + 5 D)
20.0 W…199.9 W 0.1 W  5 % of reading
P
200 W ... 1999 W 1W  5 % of reading
2.00 kW ... 3.70 kW 10 W  5 % of reading

Power (apparent)
Range Resolution Accuracy
0.00 VA…19.99 VA 0.01 VA (5 % of reading + 10 D)
20.0 VA…199.9 VA 0.1 VA  5 % of reading
S
200 VA ... 1999 VA 1 VA  5 % of reading
2.00 kVA...3.70 kVA 10 VA  5 % of reading

Power (reactive)
Range Resolution Accuracy
0.00 var …19.99 var 0.01 var (5 % of reading + 10 D)
20.0 var …199.9 var 0.1 var  5 % of reading
Q
200 var ... 1999 var 1 var  5 % of reading
2.00 kvar...3.70 kvar 10 var  5 % of reading

Power factor
Range Resolution Accuracy
0.00i ... 1.00i
PF 0.01 (5 % of reading + 5 D)
0.00c ... 1.00c

Total Harmonic Distortion (voltage)


Range Resolution Accuracy
THDU 0.0 % ... 99.9 % 0.1 % (5 % of reading + 5 D)

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MI 3394 CE MultiTesterXA Technical specifications

Total Harmonic Distortion (current)


Range Resolution Accuracy
THDI 0 mA…999 mA 1 mA (5 % of reading + 5 D)
1.00 A ... 16.00 A 10 mA (5 % of reading)

Cosine Φ
Range Resolution Accuracy
0.00i ... 1.00i
Cos Phi 0.01 (5 % of reading + 5 D)
0.00c ... 1.00c

Voltage
Range Resolution Accuracy
0.0 V ... 199.9 V 0.1 V (3 % of reading + 10 D)
U
200 V ... 264 V 1V 3 % of reading

Current
Range Resolution Accuracy
0 mA…999 mA 1 mA (3 % of reading + 5 D)
I
1.00 A ... 16.00 A 10 mA A  3 % of reading

Accuracy is valid within 0.5c ≤ PF ≤ 0.8i

Test terminals:
Function Connections
Power Mains test socket, TC1

10.10 Leak’s & Power


Power (active)
Range Resolution Accuracy
0.00 W…19.99 W 0.01 W (5 % of reading + 5 D)
20.0 W…199.9 W 0.1 W  5 % of reading
P
200 W ... 1999 W 1W  5 % of reading
2.00 kW ... 3.70 kW 10 W  5 % of reading

Power (apparent)
Range Resolution Accuracy
0.00 VA…19.99 VA 0.01 VA (5 % of reading + 10 D)
20.0 VA…199.9 VA 0.1 VA  5 % of reading
S
200 VA ... 1999 VA 1 VA  5 % of reading
2.00 kVA...3.70 kVA 10 VA  5 % of reading

Power (reactive)
Range Resolution Accuracy
0.00 var …19.99 var 0.01 var (5 % of reading + 10 D)
20.0 var …199.9 var 0.1 var  5 % of reading
Q
200 var ... 1999 var 1 var  5 % of reading
2.00 kvar ... 3.70 kvar 10 var  5 % of reading

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MI 3394 CE MultiTesterXA Technical specifications

Power factor
Range Resolution Accuracy
0.00i ... 1.00i
PF 0.01 (5 % of reading + 5 D)
0.00c ... 1.00c

Total Harmonic Distortion (voltage)


Range Resolution Accuracy
THDU 0.0 % ... 99.9 % 0.1 % (5 % of reading + 5 D)

Total Harmonic Distortion (current)


Range Resolution Accuracy
THDI 0 mA…999 mA 1 mA (5 % of reading + 5 D)
1.00 A ... 16.00 A 10 mA (5 % of reading)

Cosine Φ
Range Resolution Accuracy
Cos Phi 0.00i ... 1.00i
0.01 (5 % of reading + 5 D)
0.00c ... 1.00c

Voltage
Range Resolution Accuracy
0.0 V ... 199.9 V 0.1 V (3 % of reading + 10 D)
U
200 V ... 264 V 1V 3 % of reading

Current
Range Resolution Accuracy
0 mA…999 mA 1 mA (3 % of reading + 5 D)
I
1.00 A ... 16.00 A 10 mA  3 % of reading

Differential leakage current


Range Resolution Accuracy
Idiff 0.00 mA ... 19.99 mA 0.01 mA (3 % of reading + 5 D)

Operating range (acc. to EN 61557-16) ........... 0.19 mA ... 19.99 mA


Frequency response of measuring circuit ........ complies with EN 61010 - Figure A1
Influence of load current .................................. < 0.02 mA/A
Accuracy is valid within 0.5c ≤ PF ≤ 0.8i

Touch leakage current


Range Resolution Accuracy
0.010 mA ... 1.999 mA 0.001 mA (3 % of reading + 3 D)
Itou
2.00 mA ... 19.99 mA 0.01 mA (5 % of reading)

Operating range (acc. to EN 61557-16) ........... 0.025 mA ... 19.99 mA


Frequency response of measuring circuit ........ complies with EN 61010 - Figure A1

Test terminals:
Function Connections
Power Mains test socket, TC1
Differential leakage Mains test socket (LN), TC1
Touch leakage Mains test socket ↔ P/S, TC1

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MI 3394 CE MultiTesterXA Technical specifications

10.11 Discharging time


Discharging time
Range Resolution Accuracy
t 0.0 s ... 9.9 s 0.1 s (5 % of reading + 2 D)

Peak voltage
Range Resolution Accuracy
Up 0 V ... 550 V 1V (5 % of reading + 3 D)

Operating range (acc. to EN 61557-14) ........... 2.0 s ... 9.9 s


High limits ........................................................ 1 s, 5 s
Threshold voltage ............................................ 34 V, 60 V, 120 V
Input resistance (Socket) ................................. 96 M
Input resistance (External) ............................... 96 M (if DUT is not earthed after disconnection)
........................................................................ 48 M (if DUT is earthed after disconnection)
Max. load current (Output = Socket). ............... 10 A
Automatic disconnection at ULNpeak if DUT (Device Under Test) is connected to mains test
socket.

Test terminals
Function Connections
Discharging time External DISCH1 ↔ DISCH2
Discharging time Socket Mains test socket (L,N), TC1

10.12 General data


Power supply
Supply voltage, frequency ............................... 110 V / 230 V AC, 50 Hz / 60 Hz
Supply voltage tolerance ................................. 10 %
Max. power consumption ................................. 600 W (without load on mains test socket)
Max. power consumption ................................. 4.5 kW (with load on mains test socket)
Mains supply overvoltage category .................. CAT II / 300V
Altitude ............................................................ ≤ 2000 m

Measuring categories
DISCH1 / DISCH2 ........................................... CAT II / 600 V
ISO(+) SUB1 / ISO(-) SUB2 ............................. CAT II / 300 V
P1, C1 / P2, C2................................................ CAT II / 300 V
P/S .................................................................. CAT II / 300 V
TC1 ................................................................. CAT II / 300 V
Mains test socket ............................................. CAT II / 300 V
Altitude ............................................................ ≤ 2000 m

Protection classifications
Power supply ................................................... Class I
HV output ........................................................ 5 kV a.c. / 6 kV d.c., double insulation

135
MI 3394 CE MultiTesterXA Technical specifications

Pollution degree............................................... 2
Degree of protection ........................................ IP 50 (closed case)
……………………………………. ...................... IP 40 (open case)
........................................................................ IP 20 (mains test socket)
Case ................................................................ Shock proof plastic / portable
INPUTs ............................................................ 24 Vmax, earthed
OUTPUTs ........................................................ 24 Vmax, earthed

Display ............................................................ Colour TFT display, 4.3 inch, 480 x 272 pixels
Touch screen ................................................... Capacitive

Communication
Memory ........................................................... depends on microSD card size
RS232 interfaces ............................................. two DB9 ports
USB 2.0 ........................................................... Standard USB Type B
Bluetooth ......................................................... Class 2
Ethernet ........................................................... Dynamic IP (DHCP)
Static IP (manual)

I/Os
Inputs .............................................................. DB9 connector (24 V max)
Outputs ............................................................ DB9 connector (NO relays, 24 V max, 1.5 A max)

Dimensions (w×h×d): ....................................... 43.5 cm × 29.2 cm × 15.5 cm


Weight ............................................................. 17 kg

EMC
Emission .......................................................... Class B (portable equipment used in controlled
EM environments: domestic, commercial, light
industry)
Immunity .......................................................... Industrial environment

Reference conditions
Reference temperature range: ......................... 15 C ... 35 C
Reference humidity range: ............................... 35 % ... 65 % RH

Operation conditions
Working temperature range: ............................ 0 C ... +40 C
Maximum relative humidity: ............................. 85 % RH (0 C ... 40 C), non-condensing
Operation......................................................... Indoor use

Storage conditions
Temperature range: ......................................... -10 C ... +60 C
Maximum relative humidity: ............................. 90 % RH (-10 C ... +40 C)
........................................................................ 80 % RH (40 C ... 60 C)

Accuracies apply for 1 year in reference conditions. Temperature coefficient outside these limits
is 0.2 % of measured value per C plus 1 digit, otherwise noted.

Fuses
2 x T 16 A / 250 V, 32 mm  6.3 mm / 1500 A (protection of mains test socket)
2 x T 5 A / 250 V, 20 mm  5 mm / 1500 A (instrument protection)

136
MI 3394 CE MultiTesterXA Appendix A

Appendix A - Structure objects in CE


MultiTesterXA
Structure elements used in Memory Organizer are instrument’s Profile dependent.

Symbol Default name Description


Node Node

Project Project

Location Location

Element Universal element

Appliance Appliance (basic description)

Appliance FD Appliance (full description)

Machine Electrical machine

Switchgear Switchgear

Level1 1st sub-level of machine / switchgear

Level 2 2nd sub-level of machine / switchgear

Level 3 3rd sub-level of machine / switchgear

137
MI 3394 CE MultiTesterXA Appendix B

Appendix B - Profile Notes


There are no specific profile notes for CE MultiTesterXA MI 3394.

138
MI 3394 CE MultiTesterXA Appendix C

Appendix C - Print labels and write / read RFID /


NFC tags
The instrument supports different printers and two tag formats (PAT and Generic); listed
parameters setting is described in chapter 4.6.9 Devices.
Tag content can be presented as text only or arranged as text area and machine-readable code
area – QR code – in addition.
The instrument supports RFID / NFC reader / writer device, tag type supported is NTAG216.
Please check with Metrel or distributor which printers and labels are supported in your
instrument.

C.1 PAT tag format


It is intended for tagging of individual appliance with Auto Sequence® test data. To start
printing, Auto Sequence® should be finished and saved or reopened from memory structure.
Label type is simple, containing text area only, available data are:
 Appliance ID
 Appliance name
 Test date
 Retest date
 Auto Sequence® test status
 User name (who currently performed test or who performed saved test, if printed from
memory)
Following table describe tag content arrangement and its data for supported form size and
chosen label type.

Label type Form size Tag content Label data


W x H (mm) arrangement
Simple 50x25,5 Text Appliance ID, appliance name, test status, test
or retest date, user name

Notes:
 Data not available will not be printed on the label.
 Test or Retest date: it is set in the General Settings => Devices => Writing devices menu.
 If Auto Sequence® was modified, its short code is marked with asterisk (*).

C.2 Generic tag format


It is intended for tagging structure objects which could be tested. In addition to test result data,
test object location within structure is marked. Label printing can be started from selected
structure object even if no Auto Sequence® is associated with it, or from finished Auto
Sequence® saved under it.

Tag data presented in text area are:


 Parent structure object ID (name) (← Object_name)
 Auto Sequence® short test code (if printing from Auto Sequence®; if printing from object
field is omitted)
 Object ID (name)
 Test date (|→ DD.MM.YYYY) or Retest date (→| DD.MM.YYYY), which one is selected in
General Settings => Devices => Writing devices menu

139
MI 3394 CE MultiTesterXA Appendix C

 Status (printing from object: overall status of all tests appended to the object or sub-
structure objects; printing from Auto Sequence®: its status)
 User name (Printing from Auto Sequence: user who performed test; printing from object:
current signed-in user)

Tag data presented in machine-readable area are:


 Parent structure object ID (name)
 Auto Sequence® short test code (if printing from Auto Sequence®; if printing from object
field is omitted)
 Object ID (name)
 Test date
 Test period (from appliance description)
 Auto Sequence® status (field is omitted, if not printing from Auto Sequence®)
 Object status (overall status of all tests appended to the object or sub-structure objects)
 User name (Printing from Auto Sequence®: user who performed test; printing from object:
currently signed-in user)

Following table describes tag content arrangement and its data for supported label form size.

Form size Tag content Data


WxH arrangement
(mm)
Text Parent object name, Test code, Object ID, test or
retest date, status, user
50 x 25.5 QR Parent object name, Test code, Object ID, test date,
test period, Auto Sequence® status, Object status,
user.

Notes:
 Data not available will not be printed on the label.
 Object without appended Auto Sequence® test has no status!
 If Auto Sequence® was modified, its short code is marked with asterisk (*).
 Object status depends on all measurements (Auto Sequences® or Single tests) appended
to the object or sub-structure objects, see chapter 5.1.2.1 Measurement status indication
under the Structure object for details.

Following table describes data content written on RFID / NFC tag.

RFID / NFC tag Data


type
NTAG216 Parent object name, Test code, Object ID, test date, test period, Auto
Sequence® status, Object status, user.

140
MI 3394 CE MultiTesterXA Appendix D

Appendix D - Default list of Auto Sequences®


Pre-programmed DEMO Auto Sequences®

No. Name Description


This Auto Sequence® is just for demonstration of manipulation of
1 DEMO_1
Auto Sequence® operation.
This Auto Sequence® is just for demonstration of manipulation of
2 DEMO_2
Auto Sequence® operation.

141
MI 3394 CE MultiTesterXA Appendix E

Appendix E - Programming of Auto Sequences®


on Metrel ES Manager
The Auto Sequence® Editor is a part of the Metrel ES Manager software. In Auto Sequence®
Editor, Auto Sequences® can be pre-programmed and organized in groups, before uploaded to
the instrument.

E.1 Auto Sequence® Editor workspace

To enter Auto Sequence® editor’s workspace, select in Home Tab of Metrel ES


Manager PC SW. Auto Sequence® editor workspace is divided in four main areas. On the left
side ,structure of selected group of Auto Sequence® is displayed. In the middle part of the
workspace , the elements of the selected Auto Sequence® are shown. On the right side, list
of available single tests and list of flow commands are shown.
Single test area contains three tabs, Measurements Inspections and Custom Inspections tab.
Custom Inspections and their tasks are programmed by user.

Figure E.1: Auto Sequence® editor workspace

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An Auto Sequence® begins with Name, Description and Image, followed by the first step
(Header), one or more measuring steps and ends with the last step (Result). By inserting
appropriate Single tests and Flow commands and setting their parameters, arbitrary
Auto Sequences® can be created.

Figure E.2: Example of an Auto Sequence®


header

Figure E.3: Example of a measurement step

Figure E.4: Example of an Auto Sequence®


result

E.2 Managing of Auto Sequence® groups


The Auto Sequences® can be divided into different user defined Auto Sequence® groups. Each
Auto Sequence® group is stored in a file. More files can be opened simultaneously in Auto
Sequence® editor.
Within Auto Sequence® Group, tree structure can be organized, with folders / subfolders
containing Auto Sequences®. The three structure of currently active Auto Sequence® Group is
displayed on the left side of the Auto Sequence® editor workspace, see Figure E.5.

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Figure E.5: Auto Sequence® Group tree organization

Operation options on Files and Auto Sequence® Group are available from menu bar at the top of
Auto Sequence® editor workspace.

File operation options:

Opens a file (Auto Sequence® Group).

Creates a new file (Auto Sequence® Group).

Saves / Saves as the opened Auto Sequence® Group to a file.

Closes the file (Auto Sequence® Group).

Group of Auto Sequences® view options:

Expand all folders / subfolders / Auto Sequences®.

Collapse all folders / subfolders / Auto Sequences®.

Search by name within Auto Sequence® group. See chapter E.2.2 Search
within selected Auto Sequence® group for details.

Auto Sequence® Group operation options (also available by right clicking on Folder or Auto
Sequence®):

Adds a new folder / subfolder to the group.

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Adds a new Auto Sequence® to the group.

Deletes:
- the selected Auto Sequence®
- the selected folder with all subfolders and Auto Sequences®

Right click on the selected Auto Sequence® or Folder opens menu with additional possibilities:
Auto Sequence®: Edit Name, Description and Image (see Figure E.6).
Folder: Edit folder name
Auto Sequence®: Copy to clipboard
Folder: Copy to clipboard including subfolders and Auto Sequences®

Auto Sequence®: Paste it to selected location


Folder: Paste it to selected location

Auto Sequence®: Create shortcut to selected Auto Sequence®

Double click on the object name allows it name edit:


Auto Sequence® name: Edit Auto Sequence® name
DOUBLE CLICK
Folder name: Edit folder name

Drag and drop of the selected Auto Sequence® or Folder / Subfolder moves it to a new location:

DRAG & DROP “Drag and drop” functionality is equivalent to “cut” and “paste” in a
single move.
move to folder
insert

E.2.1 Auto Sequence® Name, Description and Image editing

When EDIT function is selected on Auto Sequence®, menu for editing presented on Figure E.6
appear on the screen. Editing options are:
Name: Edit or change the name of Auto Sequence®.
Description: Any text for additional description of Auto Sequence® can be entered.
Image: Image presenting Auto Sequence® measuring arrangement can be entered or deleted.

Enters menu for browsing to Image location.

Deletes the Image from Auto Sequence®.

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Figure E.6: Editing the Auto Sequence® Name, Description and Image

E.2.2 Search within selected Auto Sequence® group


By entering the text into search box and click on the search icon, found results are
highlighted with yellow background and first found result (Folder or Auto Sequence®) is focused.
Click on the Search icon again focus next search result. Search functionality is
implemented in Folders, Subfolders and Auto Sequences® of selected Auto Sequence® Group.

Search text can be cleared by selecting the Clear button.

Figure E.7: Example of Search result within Auto Sequence® group

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E.3 Elements of an Auto Sequence®

E.3.1 Auto Sequence® steps

There are three kinds of Auto Sequence® steps.

Header
The Header step is empty by default.
Flow commands can be added to the Header step.

Measurement step
The Measurement step contains a Single test and the Operation after end of test flow command
by default. Other Flow commands can also be added to the Measurement step.

Result
The Result step contains the Result screen flow command by default. Other Flow commands
can also be added to the Result step.

E.3.2 Single tests


Single tests are the same as in Metrel ES Manager Measurement menu.
Limits and parameters of the measurements can be set. Results and sub-results can’t be set.

E.3.3 Flow commands


Flow commands are used to control the flow of measurements. Refer to chapter E.5
Description of flow commands for more information.

E.3.4 Number of measurement steps


Often the same measurement step has to be performed on multiple points on the device under
test. It is possible to set how many times a Measurement step will be repeated. All carried out
individual Single test results are stored in the Auto Sequence® result as if they were
programmed as independent measuring steps.

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E.4 Creating / modifying an Auto Sequence®


If creating a new Auto Sequence® from scratch, the first step (Header) and the last step (Result)
are offered by default. Measurement steps are inserted by the user.

Options:
By double clicking on a Single test a new
Adding a measurement step
measurement step will appear as the last of
measurement steps. It can also be dragged and
dropped on the appropriate position in the Auto
Sequence®.
Selected flow command can be dragged from the list
Adding flow commands
of Flow commands and dropped on the appropriate
place in any Auto Sequence® step.
Changing position of flow command By a click on an element and use of keys.
within measurement step
By a double click on the element.
Viewing / changing parameters of
flow commands or single tests.
Setting number of measurement By setting a number in the field.
step repetitions
Note:
Up to 999 step repetitions can be set.

Right click on the selected measurement step / flow command:


Copy – Paste before
A measurement step / flow command can be copied and
pasted above selected location on the same or on another
Auto Sequence®.

Copy – Paste after


A measurement step / flow command can be copied and
pasted under selected location on the same or on another
Auto Sequence®.

Delete
Deletes the selected measurement step / flow command.

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E.5 Description of flow commands


Double click on inserted Flow Command opens menu window, where text or picture can be
entered, external signalling and external commands can be activated and parameters can be
set.
Flow commands Operation after end of test and Results screen are entered by default, others
are user selectable from Flow Commands menu.

Pause
A Pause command with text message or picture can be inserted anywhere in the measuring
steps. Warning icon can be set alone or added to text message. Arbitrary text message can be
entered in prepared field Text of menu window.

Parameters:
Pause type Show text and/or warning ( check to show warning icon)
Show picture ( browse for image path)
Duration Number in seconds, infinite (no entry)

Output state
Sets outputs OUT_1, OUT_2, OUT_3, and OUT_4 on OUTPUT port.
Following settings of this command are ignored:
 OUT_1 and OUT_2 while Lamps HV mode is enabled.
 OUT_3 and OUT_4 while Lamps Pass / Fail mode is enabled.
All outputs are single normally opened relay contacts if not checked in Menu Output pins
window.
Parameters:

OUT_1 Set closed relay contact between OUTPUT pins 4 and 9

OUT_2 Set closed relay contact between OUTPUT pins 3 and 8

OUT_3 Set closed relay contact between OUTPUT pins 2 and 7

OUT_4 Set closed relay contact between OUTPUT pins 1 and 6

OUT_5

OUT_6
Applicable only when using CE Adapter A 1460
OUT_7

OUT_8

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Wait input mode


Reads input condition on pins IN_2, IN_3, IN_4 and IN_5 on INPUT port. Input must be high to
proceed with the Auto Sequence®.

Parameters

State On – enables Wait input mode; set active INPUT from Input pins menu
Off – disables Wait input mode

IN_2 IN_2 reading condition on INPUT pin 6 is active

IN_3 IN_3 reading condition on INPUT pin 7 is active

IN_4 IN_4 reading condition on INPUT pin 8 is active

IN_5 IN_5 reading condition on INPUT pin 4 is active

Lamps HV mode
Drives external lamps through OUT_1 and OUT_2 outputs. Works only in HV & HV
programmable functions.
 Red lamp (OUT_1) ON means that the instrument is ready for HV test. Red lamp turns
on before first flow command in step that contains HV test. Red lamp turns off after end
of the HV test.
 Green lamp (OUT_2) blinking means that high voltage will be applied to
WITHSTANDING (HV(~+) and HV(~-)) test terminals as soon as all input conditions will
be fulfilled.
 Green lamp (OUT_2) ON means that dangerous voltage is present at WITHSTANDING
(HV(~+) and HV(~-)) test terminals. Green lamp turns on before the measurement and
turns off after the measurement.
While Lamps HV mode command is enabled the settings of Drive output command for OUT_1
and OUT_2 is ignored.

Parameters
State On – enables Lamps HV mode
Off – disables Lamps HV mode

Lamps Pass / Fail mode


Drives external lamps through OUT_3 and OUT_4 outputs.
During measurement the lights reflect status icon in single test.
After measurement
 Blue lamp (OUT_3) lights ON when test has passed. Lamp is lit until next step is started.
 Yellow lamp (OUT_4) lights ON when test has failed. Lamp is lit until next step is started.
 Lights turn off at the beginning of next step.
While Lamps Pass / Fail mode command is enabled the settings of Drive output command for
OUT_3 and OUT_4 is ignored.

Parameters
State On – enables Lamps Pass / Fail mode
Off – disables Lamps Pass / Fail mode

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Buzzer mode
Passed or failed measurement is indicated with beeps.
 Pass – double beep after the test
 Fail – long beep after the test
Beep happens right after single test measurement.

Parameters
State On – enables Buzzer mode
Off – disables Buzzer mode

External TEST / OK key mode


Instrument enables external TEST / OK key (OK / ENTER / TEST / HV TEST) by activating
INPUT pin 5 reading condition. Functionality of the EXTERNAL OK KEY mode is the same as of
the OK / ENTER / TEST / HV TEST key.

Parameters
State On – enables External TEST / OK key mode (INPUT pin 5 is active)
Off – disables External TEST / OK key mode

No notifications mode
Instrument skips pre-test warnings (see CE MultiTesterXA User Manual, chapter 4.4 Symbols
and messages for more information).

Parameters
State On – enables No notifications mode
Off – disables No notifications mode

Appliance info
Instrument enables to automatically add the appliance name to the Auto Sequence®.

Parameters
Repeat Setting Repeat: The same Appliance ID will be offered each time if the
same Auto Sequence® is carried out successively in a
loop.
Increment: A four digit number will be added to the Appliance ID and
incremented each time if the same Auto Sequence® is
carried out successively in a loop.
Appliance type Selects the type of the appliance (Appliance, Appliance_FD)
Default Appliance ID Enter default Appliance ID
Appliance name Enter Appliance name.
Options:
Editable – allows Appliance name to be modified while running Auto
Sequence®. Menu with a list of Appliance names and possibility to
enter custom Appliance name is offered within the test.
Not editable – Default Appliance name is used. Appliance name
cannot be modified while running Auto Sequence®.

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Retest period Retest period in months.


Options:
Editable – allows Retest period to be modified while running Auto
Sequence®. Numeric keypad for entering custom Retest period is
offered within the test.
Not editable – Default Retest period is used. Retest period cannot be
modified while running Auto Sequence®.

Note
 This flow command is active only if Auto Sequence® is started from the Auto Sequences®
Main menu.

Inspection Expert mode


If Inspection Expert mode flow command is set, the Visual inspection screen and Functional
inspection screen within Auto Sequence® are displayed for 1 second and an overall PASS is
automatically applied at the end of test. In between, the automatic procedure can be stopped
and statuses can be applied manually.
Inspection Expert mode is disabled by default.
Parameters
State On – enables automatic settings of tickers in Visual and Functional tests.
Off – disables automatic settings of tickers in Visual and Functional tests.

Flow Protocol

This flow command controls commands for communication with external device for the control
of the flow of Auto Sequence®.

Parameters
Communication Selects the port for communication with the external device.
settings - RS232(PC)
- USB
Flow settings Commands for communication with external device
(industrial PC for example)
Proceed Send string: Proceed

Description: If Proceed Flow setting is enabled,


implementation of Auto Sequence® on instrument can be
automatically controlled by external device by using
Proceed string command. Command works in parallel
with OK / ENTER / TEST / HV TEST keys and the
EXTERNAL TEST / OK key mode. Proceed Flow setting is
disabled by default.

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End + Status Received strings: End - pass


End - fail
End - none
End - empty
Description: Instrument sends string to external device at
the end of each Measurement step. End + Status Flow
setting is disabled by default.

Alarm Received string: Alarm

Description: Instrument sends “Alarm” string to external


device if “empty” status is detected and if both conditions -
“Fail” status at the end of measurement step and flow
command OPERATION AFTER END OF TEST – fail is
set to “manual”. Alarm Flow setting is disabled by default.

Operation after end of test


This flow command controls the proceeding of the Auto Sequence® in regard to the
measurement results.

Parameters
Operation after end of test The operation can be individually set for the case the
– pass measurement passed, failed or ended without a status.
– fail Manual: The test sequence stops and waits for
– no status appropriate command (TEST key, external
command...) to proceed.
Auto: The test sequence automatically proceeds.

Result screen
This flow command controls the proceeding after the Auto Sequence® has ended.

Parameters
Auto Save Auto Sequence® results are stored in the momentary
workspace.
A new Node with the month and year will be created. Under
the Node Auto Sequence® results or (if Appliance info flow
command is set) a new appliance and Auto Sequence®
results will be stored.
Up to 100 Auto Sequence® results or appliances can be
automatically stored under the same node. If more results /
appliances are available, they are split to multiple nodes.
Local Save Flow setting is disabled by default.
Auto Print Auto Sequence® results are automatically printed.

Notes
 This flow command is active only if Auto Sequence® is started from the Auto Sequences®
Main menu (not from Memory organizer).

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E.6 Custom Inspections programming


Arbitrary set of tasks dedicated to specific user defined Inspections can be programmed with
application of Custom Inspection Editor Tool, accessible from Auto Sequence® Editor
workspace. Custom Inspections are stored in dedicated file *.indf with user defined name. For
application of Custom Inspections as a single test within Auto Sequence® group, appropriate
file containing specific Custom Inspection should be opened first.

E.6.1 Creating and editing Custom Inspections

Custom Inspection Editor workspace is entered by selecting icon from Auto


Sequences® main menu. It is divided in two main areas, as presented on Figure E.8: Custom
Inspection Editor workspace.
Custom Inspection Name and Scope of inspection (Visual or Functional)
Name of Custom Inspection Item tasks and Type of Item Pass / Fail checkbox marking

Figure E.8: Custom Inspection Editor workspace

Custom Inspection Editor Main menu options:


Opens existing Custom Inspection Data file.
By selecting, menu for browsing to location of *.indf file containing one or more
Custom Inspections data appear on the screen. Selected file is opened in
dedicated tab marked with file name.
Creates a new Custom Inspection Data file.
New tab with empty workspace is opened. Default name of the new tab is
Inspection Data File; it could be renamed during Save procedure.

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Saves / Saves as Custom Inspection Data file opened on active tab.


Menu for browsing to the folder location and editing of file name is opened.
Browse to the location, confirm overwriting, if file already exists or edit file name to
save it as a new Custom Inspection Data file.
Add New Custom Inspection.
New inspection with default name Custom Inspection and default scope Visual
appear on the editor workspace. It contains one Item task with default name
Custom Inspection and default Type Pass_Fail_Checked_Empty. Default Name
and Type can be edited – changed.
Remove selected custom inspection.
To select inspection, click to the inspection Name field. To remove it, select icon
from editor main menu. Before removal, user is asked to confirm deletion.

Edit Name and Scope of Inspection


Inspection Name edit:
Click to the Inspection Name field to start editing it.
Drag cursor, with left mouse button pressed, to select letters and words.
Position cursor and double-click to select word of the name. Actions
could be performed with keyboard also.
Press right mouse button to activate Edit menu and select appropriate
action as presented on the left figure. Menu is case sensitive; options
currently not available are greyed out.
Inspection Scope edit:
Click to Inspection Scope field to open selection menu presented on left
figure. Options:
Visual is intended for observation of test object
Functional allows functional test of observed object

Edit Item task structure of Inspection

Item tasks of the selected Inspection are listed in Name column on


the right side of Editor workspace.
Each Item task can have Child Item tasks, Child Item can have its
own Child Item tasks and so on.
Arbitrary tree structure of Item tasks and subtasks can be built as
presented on left figure.
ADD New Item task procedure:
Position cursor above Item task Name and apply right mouse click
to select Item task and open menu with options:
Add New: new Item task is added on the top tree level
Add New Child: new child Item task is added under selected Item
Remove selected: delete selected Item task with all subtasks
Default Name of New Item task is Custom Inspection, default Type
Pass_Fail_Checked_Empty and both can be edited – changed.

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Item tasks containing Child Item tasks are marked with triangle in
front of their Name.
Click on triangle mark:
collapse Item task tree structure
expands Item task tree structure

Edit Name and Type of Item task

Edit Name of Item task:


Click to the Item task Name field to start editing it.
Drag cursor, with left mouse button pressed, to select letters and
words. Position cursor and double-click to select word of the name.
Actions could be performed with keyboard also.
Press right mouse button to activate Edit menu and select
appropriate action as presented on the left figure. Menu is case
sensitive; options currently not available are greyed out.

Edit Type of Item task:


Click to Item Type field to open selection menu presented on left
figure. Selectable checkbox status assignment options are:
Pass_Fail_Checked_Empty: Pass, Fail, Checked, Empty (default)
Pass_Fail_Empty: Pass, Fail selection, Empty (default) value

E.6.2 Applying Custom Inspections

Custom inspections can be applied in Auto Sequences®. Direct assignment of Custom


inspection to the Metrel ES manager structure objects is not possible.
After custom created Inspection Data file is opened, available inspections are listed in Custom
Inspections tab of Single test area of Auto Sequence® Editor, see chapter E.1 Auto Sequence®
Editor workspace for details.
Custom Inspection is added to Auto sequence as a Single test, see chapter E.4 Creating /
modifying an Auto Sequence® for details.

Opening / changing Inspection Data File


Position cursor within Custom inspections List area and
apply mouse right click to open Option menu:
Refresh: Refresh content of already opened Inspection
Data file.
Browse for custom Inspection file:
Menu for browsing to folder location of new Inspection
Data file is opened.

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After confirmation of selection, new Inspection Data file is


opened and list of available Custom Inspections is
changed.
Note:
 If Metrel ES Manager Work scope is changed,
opened Inspection Data file remains active and
available Custom Inspections remains the same.

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