Design of STT
Design of STT
Design of STT
Computing
Introduction:
In the ever-evolving landscape of modern computing, the demand for memory technologies that can cater to
the requirements of both high-performance and energy-efficient applications is paramount. Among the
various contenders, Magnetoresistive Random Access Memory (MRAM) has emerged as a promising
candidate, offering distinct advantages over traditional Dynamic Random Access Memory (DRAM) and
Static Random Access Memory (SRAM) technologies. This introduction seeks to explore the comparative
analysis of MRAM against DRAM and SRAM and delve into the utilization of 7T Non-Volatile Static
Random Access Memory (NVSRAM) based on Spin-Orbit Torque Magnetic Tunnel Junctions (STT-SOT
MTJ) for low-power applications and its non-volatile nature for in-memory computing applications.
DRAM and SRAM, though stalwarts in the memory hierarchy, grapple with inherent limitations that hinder
their adaptability to the contemporary demands of computing systems. DRAM, while providing high-density
storage, is volatile, requiring frequent refresh cycles that consume substantial power and compromise
performance. SRAM, on the other hand, boasts faster access times and lower power consumption but falls
short in terms of density due to its latch-based structure.
In contrast, MRAM leverages the unique properties of magnetic materials to store data, promising the best
of both worlds – the non-volatile characteristics of Flash memory and the speed and endurance akin to
SRAM. This inherent non-volatility allows for data retention even in the absence of power, eliminating the
need for constant refreshing and significantly reducing energy consumption.
Within the realm of non-volatile MRAM, the 7T NVSRAM configuration stands out as a noteworthy design,
leveraging the Spin-Orbit Torque effect within Magnetic Tunnel Junctions. This innovative approach not
only ensures low power consumption but also enhances the reliability and endurance of the memory cells.
The utilization of STT-SOT MTJ in 7T NVSRAM holds promise for addressing the power constraints in
battery-operated devices and finding applications in emerging paradigms such as in-memory computing.
As we embark on this exploration of MRAM and its 7T NVSRAM variant, we aim to unravel the intricacies
of their design, performance characteristics, and potential applications. The subsequent chapters of this
thesis will delve into the technological nuances, experimental findings, and implications of these memory
technologies, contributing to the evolving landscape of semiconductor memory for the next generation of
computing systems.
Literature Review:
[1] present an innovative approach in the design of Spin-Orbit Torque Non-Volatile SRAMs (SOT-
NVSRAMs) with a focus on achieving reduced area overhead. The study introduces both 9T and 7T SOT-
NVSRAM designs, showcasing improved area × energy product compared to existing alternatives. This
marks a significant advancement towards energy-efficient non-volatile memory systems.
However, the design of the 7T NVSRAM, utilizing diode-based SOT, introduces a trade-off. While reducing
the area requirement, there is a noticeable increase in restore energy consumption and a larger read voltage
headroom. Addressing this trade-off becomes a potential avenue for future research and optimization.
[2] introduce a novel approach by developing basic logic gates using CMOS Static Random Access
Memories (SRAM), aiming to enable in-memory Boolean computations. This innovative application of
SRAM technology contributes to advancing in-memory computing capabilities.
Despite its potential, traditional SRAM is volatile and requires a continuous power supply. The storage is
mostly off-chip, limiting its efficiency. The study proposes an alternative by designing logic gates with Non-
Volatile SRAM (NVSRAM), incorporating Spin-Orbit Torque (SOT) based Magnetic Tunnel Junctions
(MTJ) to enhance energy efficiency in in-memory computing.
[3] conducts a comprehensive comparative study, evaluating various performance parameters for SRAM and
STT based MRAM using the GEM 5 simulator. This study provides valuable insights into the comparative
performance of these memory technologies.
While the study contributes significantly to understanding the performance parameters of SRAM and
MRAM using STT-SOT MTJ, there is room for further exploration. Future research could delve deeper into
the intricacies of performance metrics to provide a more nuanced understanding of the strengths and
weaknesses of each technology, potentially paving the way for optimized memory architectures.
The figure 7 shows AND operation using two 7T bit cells. The RBL and BL and common to both the cell.
The output is taken from RBL. We can see Q0 = 0, Q1 = 1 and RBL = 0
Proposed design: