Lecture27 Part 4 Thin Film Interference

Today’s agenda: Thin Film Interference.
Phase Change Due to Reflection.

You must be able to determine whether or not a phase change occurs when a wave is
reflected.
Phase Change Due to Path Length Difference.

You must be able to calculate the phase difference between waves reflecting of the “front”
and “back” surfaces of a thin film.
Thin Film Interference.

You must be able to calculate thin film thicknesses for constructive or destructive
interference.
Examples.
You must be able to solve problems similar to these examples.
Thin Film Interference
Thin film
interference is
caused by…
…phase difference
of reflected waves
due to path length
differences…
http://www.photographyblog.com/gallery/showphoto.php?photo=5545
…and phase difference of reflected waves due to reflection off

a higher-n material.
Thin Film Interference, Including Reflection
180° phase change
 
Ray  undergoes a
phase change on No phase change
reflection. Air
Film
doesanot
Ray  has phase t nAir < nFilm
undergodue
change a phase
to the
change
path on
difference.
reflection.. Air
Do the reflected rays  and  interfere destructively or

constructively?
Caution! The wavelength in the film is different than in air.

Dark lines in drawings are there to help you see the boundaries, and are not a separate medium.
Assume the incident light is nearly perpendicular to the film
surface.
180°
180°phase
phasechange
change
The path length
difference is
 No phase change
approximately 2t.
Air
There is a 180
Film
phase difference (½  t
 film = nAir < nFilm
of a wavelength) due nfilm
to the first reflection.
Air
We will get destructive interference when the path

difference is an integral number of wavelengths:

2t = m film = m  2nfilm t = m,m = 0,1, 2...
nfilm
Assume the incident light is nearly perpendicular to the film
surface.
180° phase change
 No phase change
We get constructive
Air
interference when
the path difference Film
is film/2, 3film/2,  t nAir < nFilm
 film =
5film/2, etc. nfilm
Air
We will get constructive interference when the path

difference is a half-integral number of wavelengths:
 1  1   1
2t =  m+   film =  m+   2nfilm t =  m+  ,m = 0,1, 2...
 2  2  nfilm  2
The equations below are not on your starting equation sheet.
180° phase change
You need to apply

 No phase change
the reasoning used
Air
here in deriving
them to each of your Film
thin film interference  t nAir < nFilm
 film =
problems. nfilm
Air
2nfilm t = m,m = 0,1, 2...

 1
2nfilm t =  m+  ,m = 0,1, 2...
 2
These are only true when the film is surrounded by a medium with lower
index of refraction than the film!
Caution!
180° phase change
These are valid when
the light is incident
almost perpendicular to  No phase change
the film: Air
Film
2nfilm t = m  t nAir < nFilm
 film =
1 nfilm

2nfilm t =  m+  
 2 Air
The incident ray in the diagram clearly does not qualify visually
as “almost perpendicular.” That’s because the angle relative to
the normal is exaggerated for viewing convenience.
Caution!
180° phase change
 No phase change
Air
Film
 t nAir < nFilm
 film =
nfilm
Air
For truly non-perpendicular incidence, you have to take into

account the extra path length of the ray reflected at the air-film
interface, as well as the extra path length inside the film
because the path is not perpendicular to the surfaces.
Let’s look at a couple of applets.
Thin film interference.
Antireflective coatings.
Thin Film Interference Problem Solving Tips
 Identify the thin film causing the interference.
 Phase differences have two causes: (1) path differences and

(2) phase changes upon reflection (low to high, change is ).
 Determine the phase difference due to reflection between the

portion of the wave reflected at the upper surface and the
portion reflected at the lower surface.
 Determine the phase difference due to the path length

difference (in the thin film).
 When the total phase difference is an integer multiple of the

wavelength (, 2, 3, etc.) the interference is constructive,
and when it is a half-integer multiple of the wavelength (/2,
3/2, 5/2, etc.) it is destructive.

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Today’s agenda: Thin Film Interference.

Phase Change Due to Reflection.

Phase Change Due to Path Length Difference.

Thin Film Interference.

…and phase difference of reflected waves due to reflection off

Do the reflected rays  and  interfere destructively or

Caution! The wavelength in the film is different than in air.

We will get destructive interference when the path

We will get constructive interference when the path

180° phase change

You need to apply

2nfilm t = m,m = 0,1, 2...

For truly non-perpendicular incidence, you have to take into

Thin film interference.

 Identify the thin film causing the interference.

 Phase differences have two causes: (1) path differences and

 Determine the phase difference due to reflection between the

 Determine the phase difference due to the path length

 When the total phase difference is an integer multiple of the

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