msp430g2231 Ep PDF
msp430g2231 Ep PDF
msp430g2231 Ep PDF
FEATURES
Low Supply-Voltage Range: 1.8 V to 3.6 V Ultra-Low Power Consumption Active Mode: 220 A at 1 MHz, 2.2 V Standby Mode: 0.5 A Off Mode (RAM Retention): 0.1 A Five Power-Saving Modes Ultra-Fast Wake-Up From Standby Mode in Less Than 1 s 16-Bit RISC Architecture, 62.5-ns Instruction Cycle Time Basic Clock Module Configurations Internal Frequencies up to 16 MHz With One Calibrated Frequency Internal Very Low Power Low-Frequency (LF) Oscillator 32-kHz Crystal (1) External Digital Clock Source 16-Bit Timer_A With Two Capture/Compare Registers Universal Serial Interface (USI) Supporting SPI and I2C (See Table 1) Brownout Detector 10-Bit 200-ksps A/D Converter With Internal Reference, Sample-and-Hold, and Autoscan (See Table 1) Serial Onboard Programming, No External Programming Voltage Needed, Programmable Code Protection by Security Fuse
Crystal oscillator cannot be operated beyond 105C
On-Chip Emulation Logic With Spy-Bi-Wire Interface For Family Members Details, See Table 1 and Available in a 14-Pin Plastic Small-Outline Thin Package (TSSOP) (PW) For Complete Module Descriptions, See the MSP430x2xx Family Users Guide (SLAU144)
(1)
(2)
DESCRIPTION
The MSP430G2231 is an ultra-low-power microcontroller consisting of several devices featuring different sets of peripherals targeted for various applications. The architecture, combined with five low-power modes, is optimized to achieve extended battery life in portable measurement applications. The device features a powerful 16-bit RISC CPU, 16-bit registers, and constant generators that contribute to maximum code efficiency. The digitally controlled oscillator (DCO) allows wake-up from low-power modes to active mode in less than 1 s. The MSP430G2231 has a 10-bit A/D converter and built-in communication capability using synchronous protocols (SPI or I2C). For configuration details, see Table 1. Typical applications include low-cost sensor systems that capture analog signals, convert them to digital values, and then process the data for display or for transmission to a host system.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
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For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI Web site at www.ti.com.
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Device Pinout
PW PACKAGE (TOP VIEW)
DVCC P1.0/TA0CLK/ACLK/A0
14
13 12
11 10
9
8
2 3
4 5
NOTE: See port schematics in Application Information for detailed I/O information.
MCLK
MAB
MDB
USI Watchdog WDT+ 15-Bit Timer0_A2 2 CC Registers Universal Serial Interface SPI, I2C
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I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
13 12 10 11 1 14 -
I/O I/O I I NA NA NA
MSP430G2x31 only TDO or TDI is selected via JTAG instruction. If XOUT/P2.7 is used as an input, excess current will flow until P2SEL.7 is cleared. This is due to the oscillator output driver connection to this pad after reset.
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Instruction Set
The instruction set consists of 51 instructions with three formats and seven address modes. Each instruction can operate on word and byte data. Table 4 shows examples of the three types of instruction formats; Table 5 shows the address modes.
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Operating Modes
The MSP430 has one active mode and five software selectable low-power modes of operation. An interrupt event can wake up the device from any of the low-power modes, service the request, and restore back to the low-power mode on return from the interrupt program. The following six operating modes can be configured by software: Active mode (AM) All clocks are active Low-power mode 0 (LPM0) CPU is disabled ACLK and SMCLK remain active, MCLK is disabled Low-power mode 1 (LPM1) CPU is disabled ACLK and SMCLK remain active, MCLK is disabled DCO's dc generator is disabled if DCO not used in active mode Low-power mode 2 (LPM2) CPU is disabled MCLK and SMCLK are disabled DCO's dc generator remains enabled ACLK remains active Low-power mode 3 (LPM3) CPU is disabled MCLK and SMCLK are disabled DCO's dc generator is disabled ACLK remains active Low-power mode 4 (LPM4) CPU is disabled ACLK is disabled MCLK and SMCLK are disabled DCO's dc generator is disabled Crystal oscillator is stopped
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Reset
0FFFEh
31, highest
30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 to 0, lowest
ADC10 USI I/O Port P2 (two flags) I/O Port P1 (eight flags)
ADC10IFG
(4)
USIIFG, USISTTIFG (2) (4) P2IFG.6 to P2IFG.7 (2) (4) P1IFG.0 to P1IFG.7
(2) (4)
(5)
0FFDEh to 0FFC0h
A reset is generated if the CPU tries to fetch instructions from within the module register memory address range (0h to 01FFh) or from within unused address ranges. Multiple source flags (non)-maskable: the individual interrupt-enable bit can disable an interrupt event, but the general interrupt enable cannot. Interrupt flags are located in the module. The interrupt vectors at addresses 0FFDEh to 0FFC0h are not used in this device and can be used for regular program code if necessary.
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Watchdog Timer interrupt enable. Inactive if watchdog mode is selected. Active if Watchdog Timer is configured in interval timer mode. Oscillator fault interrupt enable (Non)maskable interrupt enable Flash access violation interrupt enable 7 6 5 4 3 2 1 0
Set on watchdog timer overflow (in watchdog mode) or security key violation. Reset on VCC power-on or a reset condition at the RST/NMI pin in reset mode. Flag set on oscillator fault. Power-On Reset interrupt flag. Set on VCC power-up. External reset interrupt flag. Set on a reset condition at RST/NMI pin in reset mode. Reset on VCC power-up. Set via RST/NMI pin 7 6 5 4 3 2 1 0
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Memory Organization
Table 9. Memory Organization
MSP430G2231 Memory Main: interrupt vector Main: code memory Information memory RAM Peripherals Size Flash Flash Size Flash Size 16-bit 8-bit 8-bit SFR 2kB 0xFFFF to 0xFFC0 0xFFFF to 0xF800 256 Byte 010FFh to 01000h 128B 027Fh to 0200h 01FFh to 0100h 0FFh to 010h 0Fh to 00h
Flash Memory
The flash memory can be programmed via the Spy-Bi-Wire/JTAG port or in-system by the CPU. The CPU can perform single-byte and single-word writes to the flash memory. Features of the flash memory include: Flash memory has n segments of main memory and four segments of information memory (A to D) of 64 bytes each. Each segment in main memory is 512 bytes in size. Segments 0 to n may be erased in one step, or each segment may be individually erased. Segments A to D can be erased individually or as a group with segments 0 to n. Segments A to D are also called information memory. Segment A contains calibration data. After reset segment A is protected against programming and erasing. It can be unlocked but care should be taken not to erase this segment if the device-specific calibration data is required.
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Peripherals
Peripherals are connected to the CPU through data, address, and control buses and can be handled using all instructions. For complete module descriptions, see the MSP430x2xx Family User's Guide (SLAU144). Oscillator and System Clock The clock system is supported by the basic clock module that includes support for a 32768-Hz watch crystal oscillator, an internal very-low-power low-frequency oscillator and an internal digitally controlled oscillator (DCO). The basic clock module is designed to meet the requirements of both low system cost and low power consumption. The internal DCO provides a fast turn-on clock source and stabilizes in less than 1s. The basic clock module provides the following clock signals: Auxiliary clock (ACLK), sourced either from a 32768-Hz watch crystal or the internal LF oscillator. Main clock (MCLK), the system clock used by the CPU. Sub-Main clock (SMCLK), the sub-system clock used by the peripheral modules. Table 10. DCO Calibration Data (Provided From Factory In Flash Information Memory Segment A)
DCO FREQUENCY 1 MHz CALIBRATION REGISTER CALBC1_1MHZ CALDCO_1MHZ SIZE byte byte ADDRESS 010FFh 010FEh
Brownout The brownout circuit is implemented to provide the proper internal reset signal to the device during power on and power off. Digital I/O There is one 8-bit I/O port implementedport P1and two bits of I/O port P2: All individual I/O bits are independently programmable. Any combination of input, output, and interrupt condition is possible. Edge-selectable interrupt input capability for all the eight bits of port P1 and the two bits of port P2. Read/write access to port-control registers is supported by all instructions. Each I/O has an individually programmable pull-up/pull-down resistor. WDT+ Watchdog Timer The primary function of the watchdog timer (WDT+) module is to perform a controlled system restart after a software problem occurs. If the selected time interval expires, a system reset is generated. If the watchdog function is not needed in an application, the module can be disabled or configured as an interval timer and can generate interrupts at selected time intervals.
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Timer_A2 Timer_A2 is a 16-bit timer/counter with two capture/compare registers. Timer_A2 can support multiple capture/compares, PWM outputs, and interval timing. Timer_A2 also has extensive interrupt capabilities. Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare registers. Table 11. Timer_A2 Signal Connections Device With ADC10
INPUT PIN NUMBER 2 - P1.0 DEVICE INPUT SIGNAL TACLK ACLK SMCLK 2 - P1.0 3 - P1.1 TACLK TA0 ACLK (internal) VSS VCC 4 - P1.2 8 - P1.6 TA1 TA1 VSS VCC MODULE INPUT NAME TACLK ACLK SMCLK INCLK CCI0A CCI0B GND VCC CCI1A CCI1B GND VCC CCR1 TA1 4 - P1.2 8 - P1.6 13 - P2.6 CCR0 TA0 3 - P1.1 7 - P1.5 Timer NA MODULE BLOCK MODULE OUTPUT SIGNAL OUTPUT PIN NUMBER
USI The universal serial interface (USI) module is used for serial data communication and provides the basic hardware for synchronous communication protocols like SPI and I2C. ADC10 (MSP430G2x31 only) The ADC10 module supports fast, 10-bit analog-to-digital conversions. The module implements a 10-bit SAR core, sample select control, reference generator and data transfer controller, or DTC, for automatic conversion result handling, allowing ADC samples to be converted and stored without any CPU intervention.
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0.3 V to 4.1 V 0.3 V to VCC + 0.3 V 2 mA Unprogrammed device Programmed device 55C to 150C 55C to 150C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages referenced to VSS. The JTAG fuse-blow voltage, VFB, is allowed to exceed the absolute maximum rating. The voltage is applied to the TEST pin when blowing the JTAG fuse. Higher temperature may be applied during board soldering according to the current JEDEC J-STD-020 specification with peak reflow temperatures not higher than classified on the device label on the shipping boxes or reels.
The MSP430 CPU is clocked directly with MCLK. Both the high and low phase of MCLK must not exceed the pulse width of the specified maximum frequency. Modules might have a different maximum input clock specification. See the specification of the respective module in this data sheet.
Legend : 16 MHz
Supply voltage range , during flash memory programming 12 MHz Supply voltage range , during program execution 6 MHz
1.8 V
3.3 V 3.6 V
Note:
Minimum processor frequency is defined by system clock. Flash program or erase operations require a minimum VCC of 2.2 V.
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A. B. C.
See data sheet for absolute maximum and minimum recommended operating conditions. Silicon operating life design goal is 10 years at 110C junction temperature (does not include package interconnect life). The predicted operating lifetime vs. junction temperature is based on reliability modeling using electromigration as the dominant failure mechanism affecting device wearout for the specific device process and design characteristics.
THERMAL INFORMATION
MSP430G2231 THERMAL METRIC (1) JA JCtop JB JT JB JCbot (1) (2) (3) (4) (5) (6) (7) Junction-to-ambient thermal resistance (2) Junction-to-case (top) thermal resistance (3) Junction-to-board thermal resistance
(4)
UNITS
Junction-to-top characterization parameter (5) Junction-to-board characterization parameter (6) Junction-to-case (bottom) thermal resistance
(7)
C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a. The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8. The junction-to-top characterization parameter, JT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-board characterization parameter, JB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA , using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
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Electrical Characteristics Active Mode Supply Current Into VCC Excluding External Current
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (1)
PARAMETER TEST CONDITIONS fDCO = fMCLK = fSMCLK = 1 MHz, fACLK = 32768 Hz, Program executes in flash, BCSCTL1 = CALBC1_1MHZ, DCOCTL = CALDCO_1MHZ, CPUOFF = 0, SCG0 = 0, SCG1 = 0, OSCOFF = 0 VCC 2.2 V MIN TYP 220 A MAX UNIT
IAM,1MHz
3V
300
390
(1)
All inputs are tied to 0 V or to VCC. Outputs do not source or sink any current.
TA = 85 C TA = 25 C
2.0
VCC = 3 V TA = 85 C TA = 25 C
1.0
0.0 1.5
2.0
2.5
3.0
3.5
4.0
4.0
8.0
12.0
16.0
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ILPM0,1MHz
25C
2.2 V
65
25C 2.2 V
22 A
ILPM2
125C
46
25C 125C 25C 125C 25C 85C 125C 2.2 V 2.2 V 2.2 V
ILPM3,LFXT1
ILPM3,VLO
ILPM4
All inputs are tied to 0 V or to VCC. Outputs do not source or sink any current. Current for brownout and WDT clocked by SMCLK included. Current for brownout and WDT clocked by ACLK included. Current for brownout included.
2.50 2.25 2.00 1.75 1.50 1.25 Vcc = 3 V 1.00 0.75 0.50 0.25 0.00 -40 -20 0 20 40 Vcc = 1.8 V Vcc = 2.2 V Vcc = 3.6 V
2.25 2.00 1.75 1.50 1.25 1.00 0.75 0.50 0.25 0.00 -40 Vcc = 1.8 V -20 0 20 40 60 80 Vcc = 3.6 V Vcc = 3 V Vcc = 2.2 V
60
80
TA Temperature C
TA Temperature C
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The leakage current is measured with VSS or VCC applied to the corresponding pin(s), unless otherwise noted. The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is disabled.
Outputs Ports Px
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER VOH VOL (1) High-level output voltage Low-level output voltage TEST CONDITIONS I(OHmax) = 6 mA (1) I(OLmax) = 6 mA
(1)
VCC 3V 3V
MIN
MAX
UNIT V V
The maximum total current, I(OHmax) and I(OLmax), for all outputs combined should not exceed 48 mA to hold the maximum voltage drop specified.
VCC 3V 3V
MIN
TYP 12 16
MAX
A resistive divider with 2 0.5 k between VCC and VSS is used as load. The output is connected to the center tap of the divider. The output voltage reaches at least 10% and 90% VCC at the specified toggle frequency.
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20
15
20
10
10
10
20
15 TA = 85C 20
25 0
Figure 9.
Figure 10.
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The current consumption of the brownout module is already included in the ICC current consumption data. The voltage level V(B_IT) + Vhys(B_IT)is 1.8 V.
0 t d(BOR)
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1 t pw Pulse Width s
Figure 12. VCC(drop) Level With a Square Voltage Drop to Generate a POR/Brownout Signal
VCC 2 VCC = 3 V VCC(drop) V 1.5 1 VCC(drop) 0.5 0 0.001 t f = tr 1 t pw Pulse Width s 1000 tf tr Typical Conditions 3V t pw
t pw Pulse Width s
Figure 13. VCC(drop) Level With a Triangle Voltage Drop to Generate a POR/Brownout Signal
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DCO Frequency
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER RSELx < 14 VCC fDCO(0,0) fDCO(0,3) fDCO(1,3) fDCO(2,3) fDCO(3,3) fDCO(4,3) fDCO(5,3) fDCO(6,3) fDCO(7,3) fDCO(8,3) fDCO(9,3) fDCO(10,3) fDCO(11,3) fDCO(12,3) fDCO(13,3) fDCO(14,3) fDCO(15,3) fDCO(15,7) SRSEL SDCO Duty cycle Supply voltage DCO frequency (0, 0) DCO frequency (0, 3) DCO frequency (1, 3) DCO frequency (2, 3) DCO frequency (3, 3) DCO frequency (4, 3) DCO frequency (5, 3) DCO frequency (6, 3) DCO frequency (7, 3) DCO frequency (8, 3) DCO frequency (9, 3) DCO frequency (10, 3) DCO frequency (11, 3) DCO frequency (12, 3) DCO frequency (13, 3) DCO frequency (14, 3) DCO frequency (15, 3) DCO frequency (15, 7) Frequency step between range RSEL and RSEL+1 Frequency step between tap DCO and DCO+1 RSELx = 14 RSELx = 15 RSELx = 0, DCOx = 0, MODx = 0 RSELx = 0, DCOx = 3, MODx = 0 RSELx = 1, DCOx = 3, MODx = 0 RSELx = 2, DCOx = 3, MODx = 0 RSELx = 3, DCOx = 3, MODx = 0 RSELx = 4, DCOx = 3, MODx = 0 RSELx = 5, DCOx = 3, MODx = 0 RSELx = 6, DCOx = 3, MODx = 0 RSELx = 7, DCOx = 3, MODx = 0 RSELx = 8, DCOx = 3, MODx = 0 RSELx = 9, DCOx = 3, MODx = 0 RSELx = 10, DCOx = 3, MODx = 0 RSELx = 11, DCOx = 3, MODx = 0 RSELx = 12, DCOx = 3, MODx = 0 RSELx = 13, DCOx = 3, MODx = 0 RSELx = 14, DCOx = 3, MODx = 0 RSELx = 15, DCOx = 3, MODx = 0 RSELx = 15, DCOx = 7, MODx = 0 SRSEL = fDCO(RSEL+1,DCO)/fDCO(RSEL,DCO) SDCO = fDCO(RSEL,DCO+1)/fDCO(RSEL,DCO) Measured at SMCLK output 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 3V 8.6 15.25 21 1.35 1.08 50 4.3 7.8 13.9 0.8 1.6 2.3 3.4 4.25 7.3 TEST CONDITIONS VCC MIN 1.8 2.2 3 0.096 0.12 0.15 0.21 0.30 0.41 0.58 0.80 1.5 TYP MAX 3.6 3.6 3.6 UNIT V V V MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz ratio ratio %
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30C
1.8 V to 3.6 V
-3
+3
-40C to 105C
1.8 V to 3.6 V
-6
+6
This is the frequency change from the measured frequency at 30C over temperature.
The DCO clock wake-up time is measured from the edge of an external wake-up signal (for example, port interrupt) to the first clock edge observable externally on a clock pin (MCLK or SMCLK). Parameter applicable only if DCOCLK is used for MCLK.
0.10 0.10
10.00
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LFXT1 oscillator logic level square wave input frequency, XTS = 0, XCAPx = 0, LFXT1Sx = 3 LF mode LFXT1 oscillator logic level XTS = 0, XCAPx = 0, LFXT1Sx = 3, square wave input frequency, TA = -40C to 125C LF mode Oscillation allowance for LF crystals XTS = 0, LFXT1Sx = 0, fLFXT1,LF = 32768 Hz, CL,eff = 6 pF XTS = 0, LFXT1Sx = 0, fLFXT1,LF = 32768 Hz, CL,eff = 12 pF XTS = 0, XCAPx = 0 XTS = 0, XCAPx = 1 XTS = 0, XCAPx = 2 XTS = 0, XCAPx = 3 Duty cycle, LF mode XTS = 0, Measured at P2.0/ACLK, fLFXT1,LF = 32768 Hz XTS = 0, XCAPx = 0, LFXT1Sx = 3 (4)
fLFXT1,LF,logic
1.8 V to 3.6 V
32768 500
Hz
OALF
CL,eff
fFault,LF (1)
(2)
(3) (4)
To improve EMI on the XT1 oscillator, the following guidelines should be observed. (a) Keep the trace between the device and the crystal as short as possible. (b) Design a good ground plane around the oscillator pins. (c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT. (d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins. (e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins. (f) If conformal coating is used, ensure that it does not induce capacitive/resistive leakage between the oscillator pins. (g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This signal is no longer required for the serial programming adapter. Includes parasitic bond and package capacitance (approximately 2 pF per pin). Since the PCB adds additional capacitance, it is recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should always match the specification of the used crystal. Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag. Frequencies in between might set the flag. Measured with logic-level input frequency but also applies to operation with crystals.
Timer_A
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER fTA tTA,cap Timer_A input clock frequency Timer_A capture timing TEST CONDITIONS Internal: SMCLK, ACLK External: TACLK, INCLK Duty cycle = 50% 10% TA0, TA1 3V 20 VCC MIN TYP fSYSTEM MAX UNIT MHz ns
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3.0
TA = 85C
2.0
1.0
1.0
0.0 0.0
0.2
0.4
0.6
0.8
1.0
0.0 0.0
0.2
0.4
0.6
0.8
1.0
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TEST CONDITIONS VSS = 0 V All Ax terminals, Analog inputs selected in ADC10AE register fADC10CLK = 5.0 MHz, ADC10ON = 1, REFON = 0, ADC10SHT0 = 1, ADC10SHT1 = 0, ADC10DIV = 0 fADC10CLK = 5.0 MHz, ADC10ON = 0, REF2_5V = 0, REFON = 1, REFOUT = 0 fADC10CLK = 5.0 MHz, ADC10ON = 0, REF2_5V = 1, REFON = 1, REFOUT = 0 fADC10CLK = 5.0 MHz, ADC10ON = 0, REFON = 1, REF2_5V = 0, REFOUT = 1, ADC10SR = 0 fADC10CLK = 5.0 MHz, ADC10ON = 0, REFON = 1, REF2_5V = 0, REFOUT = 1, ADC10SR = 1 Only one terminal Ax can be selected at one time 0 V VAx VCC
TA
VCC
MIN 2.2
TYP
UNIT V V
3V -40C to 125C
IADC10
(3)
3V
0.6
1.64
mA
0.25 -40C to 125C 3V 0.25 -40C to 85C -40C to 125C -40C to 85C -40C to 125C -40C to 125C -40C to 125C 1.1 3V
IREF+
IREFB,0
IREFB,1
0.5 3V
0.7 mA 0.9
3V 3V 1000
27 2000
pF
The leakage current is defined in the leakage current table with Px.y/Ax parameter. The analog input voltage range must be within the selected reference voltage range VR+ to VR for valid conversion results. The internal reference supply current is not included in current consumption parameter IADC10. The internal reference current is supplied via terminal VCC. Consumption is independent of the ADC10ON control bit, unless a conversion is active. The REFON bit enables the built-in reference to settle before starting an A/D conversion.
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V mA
2 3V 2 LSB
(1)
VREF+ load regulation response time (1) (2) Maximum capacitance at pin VREF+ (1) (2) Temperature coefficient Settling time of internal reference voltage to 99.9% VREF (1) (2) Settling time of reference buffer to 99.9% VREF (1) (2)
3V
400
ns
3V 3V
100 190
pF ppm/ C s
3.6 V
30
tREFBURST
3V
(1) (2)
Minimum and maximum parameters are characterized up to TA = 105C, unless otherwise noted. Characterized at TA = -40C to 105C only.
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VCC
TYP
MAX VCC
UNIT
VEREF+
V 3 1.2 VCC 1 A 3V 3V 0 1 A V V
VEREF VEREF
IVEREF+
0 V VEREF+ VCC, SREF1 = 1, SREF0 = 0 0 V VEREF+ VCC 0.15 V 3 V, SREF1 = 1, SREF0 = 1 (3) 0 V VEREF VCC
3V
The external reference is used during conversion to charge and discharge the capacitance array. The input capacitance, CI, is also the dynamic load for an external reference during conversion. The dynamic impedance of the reference supply should follow the recommendations on analog-source impedance to allow the charge to settle for 10-bit accuracy. The accuracy limits the minimum positive external reference voltage. Lower reference voltage levels may be applied with reduced accuracy requirements. Under this condition the external reference is internally buffered. The reference buffer is active and requires the reference buffer supply current IREFB. The current consumption can be limited to the sample and conversion period with REBURST = 1. The accuracy limits the maximum negative external reference voltage. Higher reference voltage levels may be applied with reduced accuracy requirements. The accuracy limits the minimum external differential reference voltage. Lower differential reference voltage levels may be applied with reduced accuracy requirements.
ADC10DIVx = 0, ADC10SSELx = 0, fADC10CLK = fADC10OSC ADC10 built-in oscillator, ADC10SSELx = 0, fADC10CLK = fADC10OSC
tCONVERT
Conversion time
tADC10ON (1)
ns
The condition is that the error in a conversion started after tADC10ON is less than 0.5 LSB. The reference and input signal are already settled.
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MSP430G2231-EP
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VCC 3V 3V 3V 3V 3V 3V
MIN
TYP 60 3.55
MAX
UNIT A mV/C s
ADC10ON = 1, INCHx = 0Ah, Error of conversion result 1 LSB ADC10ON = 1, INCHx = 0Bh ADC10ON = 1, INCHx = 0Bh, VMID 0.5 VCC ADC10ON = 1, INCHx = 0Bh, Error of conversion result 1 LSB
30
(4)
A V ns
1.5 1220
The sensor current ISENSOR is consumed if (ADC10ON = 1 and REFON = 1) or (ADC10ON = 1 and INCH = 0Ah and sample signal is high). When REFON = 1, ISENSOR is included in IREF+. When REFON = 0, ISENSOR applies during conversion of the temperature sensor input (INCH = 0Ah). The following formula can be used to calculate the temperature sensor output voltage: VSensor,typ = TCSensor (273 + T [C] ) + VOffset,sensor [mV] or VSensor,typ = TCSensor T [C] + VSensor(TA = 0C) [mV] The typical equivalent impedance of the sensor is 51 k. The sample time required includes the sensor-on time tSENSOR(on). No additional current is needed. The VMID is used during sampling. The on-time tVMID(on) is included in the sampling time tVMID(sample); no additional on time is needed.
Flash Memory
over recommended ranges of supply voltage and up to operating free-air temperature, TA = 105C (unless otherwise noted)
PARAMETER VCC(PGM/ERASE) fFTG IPGM IERASE tCPT tCMErase Program and erase supply voltage Flash timing generator frequency Supply current from VCC during program Supply current from VCC during erase Cumulative program time
(1)
TEST CONDITIONS
VCC
TYP
UNIT V kHz mA mA ms ms
5 7 10
Data retention duration Word or byte program time Block program time for first byte or word Block program time for each additional byte or word Block program end-sequence wait time Mass erase time Segment erase time
The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming methods: individual word/byte write and block write modes. These values are hardwired into the Flash Controller's state machine (tFTG = 1/fFTG).
29
MSP430G2231-EP
SLAS862 JUNE 2012 www.ti.com
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER V(RAMh) (1) RAM retention supply voltage
(1)
MIN 1.6
MAX
UNIT V
This parameter defines the minimum supply voltage VCC when the data in RAM remains unchanged. No program execution should happen during this supply voltage condition.
Tools accessing the Spy-Bi-Wire interface need to wait for the maximum tSBW,En time after pulling the TEST/SBWCLK pin high before applying the first SBWCLK clock edge. fTCK may be restricted to meet the timing requirements of the module selected.
Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to bypass mode.
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APPLICATION INFORMATION Port P1 Pin Schematic: P1.0 to P1.2, Input/Output With Schmitt Trigger
To ADC10 INCHx
ADC10AE0.y
PxSEL.y PxDIR.y 1 0
PxREN.y
PxSEL.y
DVSS DVCC
0 1 1
PxOUT.y ACLK
PxIN.y
To Module
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MSP430G2231-EP
SLAS862 JUNE 2012 www.ti.com
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MSP430G2231-EP
www.ti.com SLAS862 JUNE 2012
To ADC10 INCHx = y
ADC10AE0.y
PxSEL.y
PxDIR.y
1 0
PxREN.y
PxSEL.y
DVSS DVCC
0 1 1
PxOUT.y ADC10CLK
0 1 Bus Keeper EN
P1.3/ADC10CLK/A3/VREF-/VEREF-
PxIN.y EN To Module D PxIE.y PxIRQ.y Q Set PxIFG.y PxSEL.y PxIES.y Interrupt Edge Select EN
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MSP430G2231-EP
SLAS862 JUNE 2012 www.ti.com
ADC10AE0.y PxSEL.y
PxDIR.y
1 0
PxREN.y
PxSEL.y
DVSS DV CC
0 1 1
PxOUT.y SMCLK
0 1 Bus Keeper EN
P1.4/SMCLK/A4/VREF+/VEREF+/TCK
PxIN.y
To Module PxIE.y PxIRQ.y EN Q Set PxIFG.y PxSEL.y PxIES.y Interrupt Edge Select
From JTAG
To JTAG
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MSP430G2231-EP
www.ti.com SLAS862 JUNE 2012
PxDIR.y
1 0
PxREN.y
PxSEL.y
DVSS DVCC
0 1 1
PxIN.y
To Module PxIE.y PxIRQ.y Q Set PxIFG.y PxSEL.y PxIES.y Interrupt Edge Select EN
From JTAG
To JTAG
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MSP430G2231-EP
SLAS862 JUNE 2012 www.ti.com
1 0
PxREN.y
PxSEL.y or USIP E6
DVSS DV CC
0 1 1
PxIN.y
To Module
From JTAG
To JTAG
USI in I2C mode: Output driver drives low level only. Driver is disabled in JTAG mode.
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MSP430G2231-EP
www.ti.com SLAS862 JUNE 2012
1 0
PxSEL.y PxREN.y
PxSEL.y or USIPE7
DVSS DVCC
0 1 1
PxIN.y
To Module
From JTAG
To JTAG
USI in I2C mode: Output driver drives low level only. Driver is disabled in JTAG mode.
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MSP430G2231-EP
SLAS862 JUNE 2012 www.ti.com
BCSCTL3.LFXT1Sx = 11 LFXT1CLK 0
PxSEL.6
PxDIR.y
1 0
PxREN.y
PxSEL.6
DV SS DV CC
0 1 1
0 1 Bus Keeper EN
XIN/P2.6/TA0.1
PxIN.y
To Module
BCSCTL3.LFXT1Sx = 11 is required.
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MSP430G2231-EP
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BCSCTL3.LFXT1Sx = 11 LFXT1CLK 0
PxSEL.7
from P2.6/XIN
PxDIR.y
1 0
PxREN.y
PxSEL.7
DVSS DV CC
0 1 1
0 1 Bus Keeper EN
XOUT/P2.7
PxIN.y
To Module
39
www.ti.com
27-Feb-2013
PACKAGING INFORMATION
Orderable Device MSP430G2231QPW1EP MSP430G2231QPW1REP V62/12621-01XE-T
(1)
Status
(1)
Package Type Package Pins Package Qty Drawing TSSOP TSSOP TSSOP PW PW PW 14 14 14 90 2000 90
Eco Plan
(2)
Top-Side Markings
(4)
Samples
The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Only one of markings shown within the brackets will appear on the physical device.
(4)
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. OTHER QUALIFIED VERSIONS OF MSP430G2231-EP :
Catalog: MSP430G2231
Addendum-Page 1
www.ti.com
27-Feb-2013
Automotive: MSP430G2231-Q1
NOTE: Qualified Version Definitions:
Catalog - TI's standard catalog product Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
Addendum-Page 2
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