Statistical Process Control
Statistical Process Control
Statistical Process Control
By :
Mahender Kumar
1
Basic Introduction
Statistical Process Control (SPC)
• SPC is a statistical technique which compares current process output
against a historical template.
• The objective
j is to keepp the current p
process stable,, within these ± 3
control limits and to limit variation within them.
• Industry
Industry-standard
standard rules are adopted: If data from the current process
approaches these control limits or forms non-random patterns within
the limits, then appropriate action to control the process is taken.
3
Variation: The Heart of SPC
5
FFEXERCISE
EXERCISE
IMAGINE FOR ONE BRIEF MOMENT THAT EACH OF THE ONE HUNDRED
AND FORTY-ONE
O O WORDS
O S OF
O THIS S PARAGRAPH
G IS
S A SEPARATE
S
COMPONENT FORM A FIRST SHIFT RUN OF FOURTEEN-INCH
FLYWHEELS. YOU ARE ONE OF FIVE INSPECTORS PERFORMING THE
FINAL INSPECTION OF THSES FINSISHED COMPONENTS WHICH WERE
PRODUCED ON FOUR FAIRLY SMALL DIAL INDEX MACHINES THAT ARE
NOT BEING CONTROLLED BY THE USE OF STATISTICAL TECHNIQUES.
AS CAN BE EXPECTED FROM AN OPERATION OF THIS NATURE, THERE
ARE A NUMBER OF DEFECTIVES COMPONENTS BEING MADE. EACH
WORD THAT CONTAINS AN F REPRESENTS A DEFECTIVE COMPONENT.
HOW MANY OF THE DEFECTIVES ARE YOU ABLE TO FIND? CHECK AGAIN
AND INSPECT FOR THE PRESENTS OF F'S
F'S. WRITE YOUR FINAL COUNT
IN THE BOTTOM LEFT HAND CORNER OF THIS PAGE. THIS EXAMPLE
SHOULD GIVE YOU A FAIR IDEA OF HOW RELIABLE 100% INSPECTION
CAN BE
BE.
6
INSPECTION
D
Draw sample
l
YE N
Meets spec. ?
S O
ACCEPT REJECT
zSame
S as before?
b f ? zSame
S as before?
b f ?
7
INSPECTION
Lower Spec.
A
B
SPECIFICATION
9
Hey!!!!!
But I'm in spec.
p
SPECIFICATION
10
TARGET
Every specification has a TARGET
TARGET.
The upper and lower specification
is meant to serve as a
guide line. What you
really want is the stuff
that hits the TARGET.
11
LEANRING 1
Meeting
g specification
p
is not enough
we need a way to
communicate more.
What
a ???
12
Average
Income
Country X Country Y
10,000
0,000 Rs/Month
s/ o t 11000
000 Rs/Month
s/ o t
13
Country X Country Y
8000 46000
12000 3000
10000 1000
9000 3000
11000 2000
Avg.
g 10000 11000
Std dev. 1414 17516
14
LEANRING 2
Meeting specification is not enough
we need a way to communicate
15
Wh t is
What i SPC?
16
WHY SPC?
IInspection
ti does
d nott assure quality
lit
inspection is too late, its after the fact
enough
g
17
SPC how
SPC, h does
d it work
k
18
DISCUSSION ON VARIABILITY
First order
lower Upper
spec.
size spec.
19
Second order
lower Upper
spec.
size spec.
20
After 6 orders
lower Upper
spec.
size spec.
21
After 12 orders
lower Upper
spec.
size spec.
22
lower Upper
spec.
size spec.
Distribution of averages
Control limits
Specification limits
Distribution of individuals
Process limits
26
LEANRING 3
CHARACTERISTICS OF A
NORMAL DISTRIBUTION
LOCATION
SPREAD:
The dispersion it is
usually expressed as
LOCATION:
SIGMA
The central tendency
it is usually
expressed as the
AVERAGE
27
SPREAD
Distribution Patterns
28
Average different
p
Spread same
29
A B
Average same
p
Spread different
A 30
B
Average different
Spread
p different
31
A B
LEANRING 4
SIGMA -measure
measure of spread
gma
sig
32
+/-3 sigma
+/- 2 sigma
+/- 1 sigma
2% 2% 33
14% 32% 32% 14%
+/-3 sigma
99.73%
+/-2 sigma
96.45%
+/-1 sigma
64.25%
2% 2% 34
14% 32% 32% 14%
LEANRING 5
99.73%
+/-3 sigma
95.45%
+/- 2 sigma
68.26%
+/- 1 sigma
g
S i l Cause
Special C
37
Causes of Variability
• Common Causes:
– Random variation (usual)
– No pattern
– Inherent in process
– adjustingg thee process
adjus p ocess increases
c eases itss variation
va a o
• Special Causes
– Non-random variation (unusual)
– M exhibit
May hibi a pattern
– Assignable, explainable, controllable
– adjusting
j g the process
p decreases its variation
PREDICTION
39
SO WHAT?
Once we know
O k the
h sigma
i off a process then;
h
Process has not changed if it is inside +/- 3
sigma.
i
If outside +/- 3 sigma, process has changed
40
LEANRING 8
CENTER = AVERAGE
SPREAD = RANGE
= (MAXIMUM - MINIMUM)
x-bar Chart
x x
x xx
x xxx xxx
x xxx xxx x
x xxx xxx
x xx
x xx
xx
x xx
44
We can calculate the sigma of all the points in the
control charts and draw lines at +/- 3 sigma. Since
99.7% of the vaules are suppose to fit in the line
we can say that a process has changed if it one of
the points are outside the +/- 3 sigma lines. We
will call the +/-3
/ 3 sigma lines the CONTROL
CO O LIMIT
xx
xxx
xxxxxxxx
xxxxxxx
xxxxxxx +/- 3 sigma
xxx
xxx
xx
xxx 45
HOW DO YOU CALCULATE CONTROL LIMITS?
IIn the
th pastt it was important
i t t for
f operators
t andd auditors
dit
to be able to calculate the control limit. Today, in most
manufacturing g plants
p the computer
p calculates the
control limits and people interpret them.
46
LEANRING 10
Control Limits for
Average and Range Chart
X+X+X+…X R+R+R+ R
R+R+R+…R
1 2 3 n 1 2 3 n
X = R =
n n
47
Setting up control charts:
Calculating the limits
1. Sample n items (often 4 or 5)
2
2. Find the mean of the sample (x (x-bar)
bar) x
3. Find the range of the sample R
4. Plot x on the x chart
5. Plot the R on an R chart
6. Repeat steps 1-5 thirty times
7
7. Average the x ’ss to create x(x-bar-bar)
(x bar bar)
8. Average the R’s to create (R-bar) R
48
Setting up control charts:
Calculating the limits
9. Find A2 on table (A2 times R estimates 3σ)
10 Use formula to find limits for x-bar
10. x bar chart:
X ± A2 R
11. Use formulas to find limits for R chart:
LCL = D3 R UCL = D4 R
49
WE USE STATISTICS EVERYDAY
51
LEANRING 11
_ _ 2 _
σ √
2 2
( 1 ) + (x-x
(x-x ( 2) + … (x-x
( )
= n
(n-1)
(n - 1)
σ (R bar) =
R
d2
52
Process capability
Good quality: defects are rare (Cpk>1)
Poor quality: defects are common (Cpk<1)
=
USL – x
= 24 – 20 =.667
3σ 3(2)
Cpk = min
=
x - LSL
= 20 – 15 =.833
3
3σ 3(2)
14 20 26
15 24
= =
3σ = (USL – x, or x – LSL) 53
The control limits can be drawn around both the
average (x-bar) and the Range chart. Therefore,
you can detect several different types of change.
X-bar chart
xx
xxx
xxxxxxx
xxxxxxxx
xxxxxxx
xxx +/- 3 sigma
xxx
xx
xxx
Range chart
xxx
xx
xxx
xxx
xxxxxxxx
xxxxxxx +/- 3 sigma
xxxxxxx
xx
xxx
54
LOCATION SHIFTS
Process spread
remains same
let's see what
while center
that looks like
increases
in a control chart
55
Spread remains same
Center shifts up
X-bar chart
+/- 3 sigma
Range chart
+/- 3 sigma
56
SPREAD CHANGE
Process spread
increase while
center remain
same let's see what
that looks like
in a control chart
57
Spread increased
Center remain same
X-bar chart
+/- 3 sigma ?
Range chart
+/- 3 sigma
58
Spread increased
Center remain same
X b chart
X-bar h t
+/- 3 sigma
Range chart
+/- 3 sigma
59
LEANRING 12
Note that when the process variation increased
the Range chart points shifted to a higher le level.
el
However, the process center (X-bar) seems to
swing wildly going out of both Upper and Lower
control limit while the average is still the same.
60
TREND
target
+/- 3 ssigma
Rule of thumb
thumb, if there are 7 points in a row all higher or lower
than the preceeding point. In this case from the start of the
trend to the time a point went outside the control limit there were
12 samples.
l An
A experinced
i d operator/auditor
t / dit would ld b
begin
i llooking
ki
for assignable cause much sooner. 61
SHIFT
target
+/- 3 ssigma
Spread
p increase while Center same
Center
C t shift
hift up or down
d att the
th same time
ti the
th spreadd
increase 63
PROCESS CAPABILITY
If we controll the
h process the h process will
ill produce
d
parts with variation as the equipment is CAPABLE
off producing.
d i W
We callll thi
this PROCESS CAPABILITY
CAPABILITY.
64
C C
Cp Cpk.....
k S
Say what?
h t?
C k
Cpk Cp
Lower Upper
pp
spec. spec.
65
Cpk = Target - lower spec or Upper spec - Target
3 sigma 3 sigma
C k
Cpk C k
Cpk
Lower Upper
pp
spec. spec.
66
LEANRING
IT IS IMPORTANT TO KNOW
WHAT YOUR MACHINE IS
CAPABLE OF PRODUCING.
OTHERWISE YOU MAY BE
CHASING YOUR TAIL
TRYING TO GET THE
MACHINE TO DO WHAT IT IS
NOT CAPABLE OF DOING.
67
Each red x represents five individual
reading (blue x) that are spread out
more than the average (red x)
x Upper Sample
p
x U spec
xx
x
xxxxx x
xx x
x xxx
xxxxxxx
x x x
x x x xx xxxxxxx x
x
x x x xx xxxxxxxxx x
x x
x xxx xxx xxxxxxx
xxxxxxx xx = x
x x xxxx x
x xxx
xx xxx
x xxxxxxx x x
x
xx x
xxx x
xx
x Lower spec
x
x
70
LEANRING
After the
Aft th distribution
di t ib ti shifted
hift d up, there
th is
i now a
much greater chance of getting a value outside
upper specification.
ifi ti So
S the
th machine
hi iis adjusted
dj t d
down, slightly more than it was adjusted up.
Chance off outt off
Ch
spec was = 10%
x
x Chance of out of
xxx
x spec is now = 40%
xx xx x
x Upper spec xx x xxx
xxxxxxx
x x x x x
x x x xx xxxxxxx
x
xx x x x xx xxxxxxxxx
x x x x
xx xx x
x x xxx xxx xxxxxxx
xxxxxxx
xxx x xxx
xxxxxxxx x x x xxx x xxxxxx
x x x xx xxxxxxx x x x
xxxxx x
xxx xx
x
x
x x x xx xxxxxxxx x x x
x
x xxxx x xxx
xxx xxxxxxx
xxxxxxx xx
x x xxx x x
x xxx
xx xxx x
x xxxx
xxxxx x x x
x x
x xxx x
xx L
Lower spec
x
x 71
x
LEANRING 13
The adjustments continues until, the actual products
produced varies much more than the capability of the
machine
machine.
x
x x
x x
xxx x
x x xx x
xx x x xx x xx xxx
x x xx x
xx Upper spec x x x
x
x
x xx xxx x x xx x x xx x xx
x
xx x x x xx
x xxxxxxxx xx x xx xxx x x
x xx x
xx x x xx x xx x x x xx xxxxxxx
x
xxxxxxxx x x xx
x
x xx xxxxxxxx
x x
x x x xx xxxxxxx x x xxx x xxxxxxxx
xx x xx xxx x x x x xxxx xxxxxx xx x x x xxx xxxxxxx
x xxxxxxx
xx xx xxxxxxx x
x xx xxxxxxxx x x xxx x xx xx
x x x xxx x xxx
xx x x xx xxxxxxx x x xxx x xx
x x x x xxxxx xxx xxxx
x x x xx xxxxxxx x xxx xx xx xxxx x xx x xxx xx
x x xxx x xxxxxx xx x x xx xxx x x x xxx
x x xxxxxxxxx x x xx x x xx xxxxxxx x
x xxx x
x x xxx x x
x xxx x xx xxxxxxxxx xx
xx Lower x x xxx x
x xxxxxxx
x xxxxxxx x
x L spec x x
x xxxx xxxxxx x
x x xx
x
xxx xx x
xxx
x xx
x x xxx
xx
x
x
x 72
LEANRING 14
If you are controlling your process using SPC Method,
even if your process is not capable, no adjustment
would take place
place. Therefore
Therefore, the product you produced
is what the machine is capable of and not more.
x x
x
x
xx Upper spec UpperControl Limit
x
xx xx x x
x xx
xxx x xxx
xxxxxxx
x x
x xxx
x x x xx xxxxxxx = x xxxxxxx
x x x xx xxxxxxxxx xxxxxxxx
x x x
x xxx
x xxxxxxx
xxx xxxxxxx
xxxxxxx xxx
xxx
x x xxxx x
x xxx
xx xxx xx
x xxxxxxx x x x
xxx
x
xx x
xxx
xx Lower spec LowerControl Limit
x
x
x
73
74
ATTRIBUTE CONTROL CHARTS
Defectives Defects
Variable
V i bl
Sample
pp-Chart
Chart c - Chart
Fixed
Sample np-Chart
np Chart u - Chart
75
CONTROL CHART
76
THANKS
77