Best Practices Factory
Best Practices Factory
Best Practices Factory
Military, $89
Automotive, $52
Industrial and Medical,
Computer, $429 $113
Consumer, $123
Communications, $300
ICs: 27%
Substrates: 4%
• WEEE/ROHS directives
25
20
Pb( µg/dl)
15
10
0
1940 1945 1950 1955 1960 1965 1970 1975 1980 1985 1990 1995
Year
– Sn/Ag – Sn/Ag/Bi/X
– Sn/Cu – Sn/Sb
– Sn/Ag/Cu – Sn/Zn
– Sn/Ag/Cu/Sb – Sn/Bi
– Sn/Ag – Sn/Ag/Bi/X
– Sn/Cu – Sn/Sb
– Sn/Ag/Cu – Sn/Zn
– Sn/Ag/Cu/Sb – Sn/Bi
70%
4 5 7
6
8
10
4
Tack 2
0
0
0 Time
Slide #44 Pb-Free Workshop © Ronald C. Lasky, Timothy Jensen 2003
R&D Test #4: Solder Balling
SBI Number of solder balls
0 Did not reflow
1 > 501, with some reflow
2 401-500
3 301-400
4 201-300
5 151-200
6 101-150
7 51-100
8 21-50
9 11-20
10 0-10
1. Sn63/Pb37 7. Sn99.3/Cu0.7
2. Sn91.7/Bi4.8/Ag3.5 8. Sn96.2/Ag2.5/Cu0.8/Sb0.5
3. Sn90.5/Bi7.5/Ag2 9. Sn95/Sb5
4. Sn95.5/Ag3.8/Cu0.7 10. Sn96.5/Ag3.5
5. Sn42/Bi58 11. Sn89/Zn8/Bi3
6. Sn93.6/Ag4.7/Cu1.7
10
2 BAD
200
175
150
125 Sn-Pb-Ag
100 Eutectic
Sn-Bi-Pb
75
Peritectic
Sn-Bi-Pb Eutectic
50
Sn-3.8Ag- Sn-2Ag-2Bi Sn-2Ag-4Bi Sn-2Ag-7.5Bi Sn-10.5Bi Sn-12Bi
0.7Cu
Ref: “Lead-Free Solder Project Final Report”, NCMS Report 0401RE96 , August 1997.
• Challenges:
– higher processing temperatures
– wettability
– must wet to a variety of metallizations
6
250 C Ag3Sn
5
wt%Ag
230 C
4
220
3 C Cu6Sn5
230 C
2
Sn
Alloys in shaded 1
NIST experimental work
270 C
250 C
23 0
C showed that the composition
290
• Sn $5.06/kg
• Zn $1.06/kg
• Cu $1.94/kg
• Bi $5.63/kg
• In $250.00/kg
• Ag $180.00/kg
• Sb $1.75/kg
• Pb <$1.00/kg
1 We have a documented and functioning DFM system that includes design ground rules (DGRs). Our entire 10
organization is strongly committed to DFM. DFM is a way of life (this question counts 3 times):
2 Our DGRs are established by using designed experiments and statistical process control: 8
4 The engineer(s) responsible for stencil printing knows how to design a stencil 9
5 The engineer(s) responsible for component placement knows how to balance and optimize the placement 9
equipment. He assures that this operation is performed on all jobs:
6 The engineer in charge of the reflow process assures that the reflow profile matches the solder paste 9
specification:
7 Our process engineers have a disciplined and proven strategy to improve productivity: 9
8 Our process engineers have a disciplined and proven strategy to improve quality: 9
9 Our process equipment is "qualified" with a test and evaluation procedure that is founded on DOE principles: 3
10 There is a process engineer or team of engineers responsible for implementing new processes and technology: 9
Ratings:
World Class = > 95 Your score places you as "World Class" in DFM, Process and Equipment for
Above Average = 75 - 94 SMT assembly. Your clearly recognize the importance of these topics in your
Average = 55 - 74 assembly processes. This score still offers some opprotunity for improvement.
Below Average < 55 Look at your results on each question and develop an action plan for
improvement if appropriate.
1 We evaluate our solder pastes and/or materials with a systematic evaluation procedure, such as "The 12 Board 0
Paste Evaluator" (shown below) or DOE to assure its performance (this question counts 3 times):
2 My engineers have read and understand the solder paste and materials specs and assure they match our use 8
conditions:
3 The response to pause of my solder paste is adequate for my applications: 5
4 The cost of my solder paste and/or materials is not the main criteria for its purchase: 7
6 My materials supplier(s) understand(s) my process and business needs, we treat each other like partners: 4
7 Few, if any end of line defects can be traced to inadequacies of my solder paste and/or materials: 4
8 The type (i.e. 2, 3, 4, 5) of the solder paste we use matches the application requirement: 4
9 Our organization has a systematic method to assure that the materials/components for future jobs are being 6
prepared while current jobs are being run:
10 Our organization has a systematic method to assure that we have an uninterrupted supply of materials from our 6
vendors:
Total Score out of 120 51
Ratings:
World Class = > 95 Your score places you below average among users of SMT materials. This
Above Average = 75 - 94
position offers overwhelming opportunities for improvement. Look at your
Average = 55 - 74
results on each question and develop an action plan for improvement. Your
Below Average < 55
organization has an urgent need to recognize that evaluating your solder
pastes and materials is a most important activity.
1 We have a continuous improvement plan that is effective, uses metrics, and is recognized as valuable by the 3
entire organization (this question counts 3 times):
2 We measure our process uptime: 8
7 We have a statistical process control program and use the resulting data effectively to monitor and improve our 9
processes:
8 Our process engineers use designed experiments to optimize our processes and evaluate equipment and 9
materials:
9 Quality is everyone's job: 8
Ratings:
World Class = > 95
Above Average = 75 - 94 Your score places you as average in DOE, SPC and CIP for SMT assembly.
Average = 55 - 74 This position offers significant opportunities for improvement. Look at your
Below Average < 55 results on each question and develop an action plan for improvement. Having
an effective CIP program is vital for success.
1 Our organization has a sophisticated training program for all levels of our staff (this question counts 3 times): 9
2 Our engineers understand the difference between common cause and special cause failures and use this 8
knowledge in process troubleshooting:
3 Our engineers use sophisticated modeling tools, like StencilCoach, Reflow Coach and LineBalancer to help them 5
model processes and perform "what if" analysis:
4 Management uses costing tools like ProfitPro to perform financial "what if" analysis, before making financial 3
investments in equipment etc:
5 Our operators cannot change the process equipment's operating parameters: 8
6 Our engineers know and use analytical problem solving and brainstorming techniques to perform failure analysis: 4
7 There is a process line escalation policy that is understand by all (e.g. if the line is down and remains down this 4
information gets escalated in a documented fashion):
8 Our process engineer's yearly performance review is related to process improvement goals: 4
10 Our staff has all ot the tools necessary to perform their jobs: 6
Ratings:
World Class = > 95
Above Average = 75 - 94 Your score places you as above average in Training and Failure Analysis for
Average = 55 - 74 SMT assembly. This score still offers considerable opportunity for
Below Average < 55 improvement. Look at your results on each question and develop an action
plan for improvement, if appropriate.
40 50 60 70 80 90 100 7 6 5 4 3 2 1
Area Ratio
Aopening= πD /4
2 Circular Aperture Diameter >
D
8 particle diameters
Awall=πDt =>
t ArR=D/4t ArR = D/4t > 0.66
PW=0-2+ D = PW - ArR=D/4t
Recommendations: P/2 2 to 3 >0.66
Pitch Pad Dia Pad Dia Aperture D Stencil Area ArR
Solder
Circular Aperatures (P - mils) (PD - mils) OK? Diameter OK? Thickness Ratio OK?
Paste Type
(D-mils) (t-mils) (ArR)
40 21 TRUE 19 TRUE 5 0.95 TRUE 3
Time
Thruput Calculator
Tunnel Length cm 249 Thruput Bds/min 2.84 Obeys Lee Dwell Criteria? Yes
Belt Speed cm/min 71 Profile Time (min) 3.51
Product Length cm 20
Product Spacing cm 5
250
200
Temperature (C)
150
Lower Limit
Upper Limit
User Profile
100
50
0
0 50 100 150 200 250 300 350 400
Time (seconds)
260
255
250
Temperature (C)
245
User Profile
Hi Ramp
240 Low Ramp
Temp Max
235 Temp Min
Time Min
Time Max
230
225
220
215
0 20 40 60 80 100
Time (seconds)
220
210
200
190
Temperature (C)
180
Low Ramp
170 Hi Ramp
User Profile
160
150
140
130
120
290 295 300 305 310 315 320 325 330
Time (Seconds)
Control Process
Charts Variation
X
X
X X
X
X
X
X X
X
X
LSL USL
LSL USL
Random Variation =
Variance: Sr2
Score
Sr
Score
0
LOAD VISION PRINT SEPARATE UNLOAD Wipe
0
LOAD VISION PRINT SEP. UNLOAD Wipe
Objective:
1.8 s Load + 1.8 s Vision + Print + Separate + 1.5 s Unload + Wipe < 8sec
• Examples: 150
100
– Shorts 50
– Opens 0
Shorts Opens Missing Solder Balls
Compnent
– Missing Component
• Important, but cannot be Pareto Attribute Data
measured to improve
process performance
• Any plan should strive to
relate attribute data to
variables data and develop
a CIP around this
relationship
Opens
Shorts
= Average
LCL UCL
LSL USL
UCL
Sigma 3
Sigma 2
Sigma 1 Centerline
Sigma 1
Sigma 2
Sigma 3
LCL
LSL
1800
Mean
Mean=1750
1700
5
1600 LCL=1602
1200 1700 2200
Subgr 0 100 200
600 Normal Prob Plot
UCL=541.0
400
Range
R=255.9
200
22
0 LCL=0
Overall
Overall I I I
1650
StDev: 111.634 Specifications
Pp: 1.05 I I
1500 Ppk: 1.05 1400 2100
180 190 200
Subgroup Number
2
66 6 6 22 2 66 6 62 6 66 2222
1550 6 51 5 56 55 5222222225 6151 5 5 5622 1 6 5 2666 2 52 55 562 LCL=1602
11 111 1 111 11 111 1 1 1 11111 1 1111 1 11 1 1 1 11 11
1 11 1 11 11 1 1
1 1
1 1 1 1 1 11
1 1 1
1300 1
500 1500 2500
Subgr 0 100 200
1
Normal Prob Plot
1500 1 1
11 1
1 1 1 1 1 11 1 1
11 1 1 1
1000 1
1
1 111 11 1 1 1 1 1 11
Range
1
1 11 1 11 11 111 11 11 1
1
1 1 1 11 1 111 1 1 11 11 1 111 11
1 1 1 11 1 1 1 111 111 11 1 1 1 1
1 111 2 1 1 11 11111 121 2 111 1 11 12 1 1 11 1 21 2 2 121 1 2 2 2 11 2
2
500 22 2 2 2 22 222 2 2 2 2 2 22222 2 22 2 22 2 UCL=541.0
2 2 2 22 2 22 2
2 2 2 2 2 222
2 2 22 2 22 2 2
R=255.9
0 LCL=0
Overall
Overall I I I
1500
StDev: 273.152 Specifications
Pp: 0.43 I I
1000 Ppk: 0.43 1400 2100
180 190 200
Subgroup Number
NICKEL: 40 - 60 u” NICKEL: 20 - 80 u”
Pd / Ni STRIKE: < 5 u”
Ni STRIKE: < 5 u”
Typical wetting NiPdAu finished SOP Typical wetting NiPdAu finished SOP
components with SnPbAg solder, NiAu components with SnAgCu solder, NiAu
PWB finish. PWB finish.
Visual Appearance Results: All solder joints exhibited a heel fillet height at least one times the lead thickness and
evidence of wetting to the sides of the leads. This performance would be considered acceptable for all 3 classes of
products identified in IPC-A-610C (general electronic products, dedicated service electronic products, and high
performance electronic products.
Fine pitch
Poor Excellent Excellent Excellent Excellent
quality
Contact Not
Fair Good Good Good
Connections Recommended
Cost
1X 2X 0.3X 1X 1X
(To HASL)
Hazard to
High Moderate Low High Low
Manufacture
Component Placement
15%
Reflow
15%
3
Delta Tack Force (grams/mm2)
0
0 5 10 15 20 25 30 Brand X
-1
Good Paste
-2
-3
-4
-5
-6
Time (hrs)
Inspired by: MPM
50
45
Volume of Print (cubic mils)
40
35
30
Brand X
25
Good Paste
20
15
10
0
0 2 4 6 8 10 12 14 16 18
Print Number Inspired by: MPM
40
Acceptable
Tack (grams)
30
20
Unacceptable
10
0
0 60 120 180 240
Time (minutes)
250
PEAK
MP = ~217 C
Temperature (C)
200
150
100
Soak Zone TAL
50
0
0 1 2 3 4 5
Time (Min)
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 171 8 1 9 2 0 2122 23 24
R
S
C
A
B
C
D
E
F
C
S
R
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 171 81 9 20 21 22 23 24
400
Volume
300
200
Paste C1 Paste C2 Paste B3 Paste B1 Control Paste A1 All Pairs
Tukey- Kramer
0.05
300
Volume
200
100
Peak temp
237C P2 P5 P8
Time above
liquidus
245C P3 P6 P9
Lead-free reflow profile
Selected paste MUST perform equally well @ P1 through P9 in
air atmosphere
Tack Test
Tack Test
2.5
2.5
2
Tack (g/mm2)
2
Tack(g/mm2)
Control
Indium 51A #1
1.51.5 Indium 92J
Control #2
Indium 232-99-2
1 B1
Indium SMQ 230
1
0.5 B3
0.5 0
0 1 2 4 8
Time (Hrs)
0
0 1 2 4 8
Time (Hrs)
-3
1
2) Image components to determine
X, Y, and Theta offsets. 3.2x1.6
-1
-1
0
3) Place PCBs on XY table of Chip caps
1
3
0
Shooter & shake PCBs for 120
tantalum
1
2
1
Sec.
switch
-1
0
4) Image components to determine
X, Y, and Theta offsets caps
1
1
5) Determine delta for before & after -4 -2 0 2 4 6
109
Channel 1
Ohms
Channel 11
Channel 21
Channel 153
Visual Inspection
Printing Paste
Volumetric data NT NT NT
P1,P5,P9
Reflow
P1,P2,P3,P4,P5,
P6,P7,P8,&P9
Instron IPC650 NT NT NT NT NT NT
Tackiness
Shake Test NT NT NT NT
Solder Joint NT NT NT NT NT
Quality
ALT NT NT NT NT NT NT
J-STD B25 NT NT
SIR
Motorola NT NT NT NT NT
B3 B3
A1 A1 B3 B3B3
@ @
@ @ @ @@
P1 P5 P1
P1 P5
P5
A1 B3
B3
@ @
P9 P9
B3 B3
@ @
P1 P5
Insufficient toe
fillet
B3
Sn/Pb
@
P9 Paste A1
P1 P5
0.0023 mm 0.0025 mm
200
Temp/C
150
Ramp
100
0.7
50 deg/sec
0
0 1 2 3 4 5 6 7 8
Time/min
Peak Temp. = 235 C +/- 5C; Time Above Liquidus = 70Sec +/ 10Sec
• Drop Test
• Shear Test
• Liquid-to-Liquid Thermal Shock
• ALT for different Products
% of crack
1) Dropping products from 5 feet 20
Leaded radios
15
2) Vert. & horiz.vibration for 2 hrs 10
3) Thermal shock for 48 hrs 5
4) Repeated step 1 thru. 3 X times 0
5) Measure % joint cracks on shields
7
e2
6
4
1
5
3
ld
ld
ld
ld
ld
ld
ld
ie
ie
ie
ie
ie
ie
ie
Sh
Sh
Sh
Sh
Sh
Sh
Sh
25
20
% of crack
Pb-free radios
Drop test vehicle
Shields
15
10
5
0
4
1
7
Sh 6
3
2
5
ld
ld
ld
ld
ld
ld
ld
ie
ie
ie
ie
ie
ie
ie
Sh
Sh
Sh
Sh
Sh
Sh
Shield solder joint cracking is significantly reduced using B3
0.5mm QFP
0.5mm CSP
• 6X6 mm Package size CSP20X40 Cap.
• 0.5 mm pitch partial array
• 0.3 mm solder balls size 0.8mm
CSP
0.5mm
Conn.
BGA
0.75mm CSP
0.5 mm CSP
DIME
•7
•6
•5
•4
•3
•2
•1
•0
Output:
- Electrical test at every 75 cycles for 450 cycles
- Red dye analysis at 150, 300, and 450 cycles
75
50
Failed Joint
25
0
Failed Joint
-25
Pb-free Sn-Pb All Pairs
Tukey-Kramer
Solder 0.05 Red dye evaluation result
T5
Blind Via
0.5 mm CSP
DIME
Solder Pastes
Variables:
Paste B3 Paste #15 Paste #16
- Ramp Rate
- Solder Paste Ramp Rate (Deg./Sec.) 0.5
CSPs CSPs CSPs
Outputs:
- Number of voids 0.8 CSPs CSPs CSPs
- Void size
1.5 CSPs CSPs CSPs
30
20
15
20
10
15
5
10
PasteB3 Control(Pb)
Ref: Y. Karlya, C. Gagg, and W.J. Plumbridge, “Tin pest in lead free solders”, Soldering and Surface
Mount Technology, 13/1 [2000] 39-40
Cooling
Fan
Preheating (CVX)
Fluxer Air Knife
Inspired by Steve Breed, Speedline Chip Wave Laminar Wave
http://www.ecd.com/emfg/instruments/fluxometer/index.asp
∆T<140oC
Temperature
Board Top
Ramp Rate: 2-4oC/s
Board Bottom
183 C
Temperature
Board Top
Time
Results
Time in Wave (s) 3.86 PWB Bottom ∆T 115.00 Cool Down Rate (C/s) 2.50 PWB Bottom T at Wave 120.00 PWB Top T at Wave
Within Spec? FALSE FALSE TRUE TRUE
Courtesy: Electrovert