Tuckerman 2016 Supercond. Sci. Technol. 29 084007
Tuckerman 2016 Supercond. Sci. Technol. 29 084007
Tuckerman 2016 Supercond. Sci. Technol. 29 084007
E-mail: v-datuck@microsoft.com
Abstract
We describe progress and initial results achieved towards the goal of developing integrated
multi-conductor arrays of shielded controlled-impedance flexible superconducting transmission
lines with ultra-miniature cross sections and wide bandwidths (dc to >10 GHz) over meter-scale
lengths. Intended primarily for use in future scaled-up quantum computing systems, such flexible
thin-film niobium/polyimide ribbon cables could provide a physically compact and ultra-low
thermal conductance alternative to the rapidly increasing number of discrete coaxial cables that
are currently used by quantum computing experimentalists to transmit signals between the
several low-temperature stages (from ∼4 K down to ∼20 mK) of a dilution refrigerator. We have
concluded that these structures are technically feasible to fabricate, and so far they have
exhibited acceptable thermo-mechanical reliability. S-parameter results are presented for
individual 2-metal layer Nb microstrip structures having 50 Ω characteristic impedance; lengths
ranging from 50 to 550 mm were successfully fabricated. Solderable pads at the end terminations
allowed testing using conventional rf connectors. Weakly coupled open-circuit microstrip
resonators provided a sensitive measure of the overall transmission line loss as a function of
frequency, temperature, and power. Two common microelectronic-grade polyimide dielectrics,
one conventional and the other photo-definable (PI-2611 and HD-4100, respectively) were
compared. Our most striking result, not previously reported to our knowledge, was that the
dielectric loss tangents of both polyimides, over frequencies from 1 to 20 GHz, are remarkably
low at deep cryogenic temperatures, typically 100× smaller than corresponding room
temperature values. This enables fairly long-distance (meter-scale) transmission of microwave
signals without excessive attenuation, and also permits usefully high rf power levels to be
transmitted without creating excessive dielectric heating. We observed loss tangents as low as
2.2×10−5 at 20 mK, although losses increased somewhat at very low rf power levels, similar to
the well-known behavior of amorphous inorganic dielectrics such as SiO2. Our fabrication
techniques could be extended to more complex structures such as multiconductor cables,
Original content from this work may be used under the terms
of the Creative Commons Attribution 3.0 licence. Any
further distribution of this work must maintain attribution to the author(s) and
the title of the work, journal citation and DOI.
embedded microstrip, 3-metal layer stripline or rectangular coax, and integrated attenuators and
thermalization structures.
Keywords: polyimide, superconducting, resonator, dielectric loss, flexible, transmission lines,
quantum computing
2
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
Figure 1. Conceptual cross-sectional diagram of a future ‘rectangular coax’ ribbon cable that could be used to communicate between different
temperature stages of a dilution refrigerator. The structures reported in this paper are much simpler, but the experimental results provide
confidence that much more complex cables, such as illustrated here, could be fabricated and be usable in quantum computing experiments.
leakage, and cost. Various multiplexing schemes are being fabricated. Owing to its small cross sectional area, the axial
pursued [21, 22], which could reduce the number of required heat leakage along such a ribbon cable would be orders of
lines by ∼10×, but the numbers would still be daunting. magnitude less than for an equivalent number of discrete
The 4 K temperature stage that exists in the upper portion commercially available coaxial cables. The cable terminations
of typical dilution refrigerators provides a particularly could be bonded to a chip using a solder (Pb or In), either in a
attractive location for a layer of control electronics (including closely spaced linear array for contact near the edge of a chip,
basic quantum error correction functions) [23, 24]. Heat dis- or in a less densely spaced two-dimensional array, which
sipation capabilities of multiple Watts are currently available would mate to the face of a chip or to a connector.
from pulse-tube systems, and it is easy to imagine how the In this work we have fabricated and characterized
cooling capacity could be further increased using an exter- somewhat simpler structures than proposed in figure 1, spe-
nally supplied flow cryostat. Large numbers of ultralow- cifically individual microstrip transmission lines, as a step-
power superconducting electronics can coexist with moderate ping stone towards our ultimate goal. Figure 2(a) is a
quantities of semiconductor circuits at 4 K. One can imagine photograph of one such assembled flexible cable, which is a
that sufficient electronics could exist at the 4 K stage so that functional superconducting Nb microwave transmission line
the bandwidth needed to connect to the room-temperature built on a thin-film polyimide dielectric. The performance of
environment is greatly reduced. In this case, the main inter- these cables, as described herein, gives us confidence that
connection problem becomes the links from 4 K down more sophisticated highly parallel cables are indeed feasible.
to 20 mK. This paper is organized as follows. In section 2 we
We believe that thin-film flexible superconducting describe prior work and estimate thermal performance of the
transmission lines, fabricated by adapting techniques from the superconducting thin-film cables. Section 3 presents concepts
microelectronics industry, can help address this interconnec- and details for the design of the microstrip test structures. In
tion challenge. Owing to their very low rf surface impedance, section 4, we describe relevant fabrication and measurement
superconducting conductors can be scaled to quite small details. Section 5 covers results for transmission lines, reso-
dimensions. Excellent microwave signal propagation can be nators, non-idealities and dielectric loss. Finally, conclusions
achieved with conductor cross sections that are orders of and closing comments are presented in section 6.
magnitude smaller than commercially available coaxial
cables. In principle, as illustrated in figure 1, one could
construct many parallel thin-film transmission lines within a 2. Relationship to prior work and thermal projections
single ribbon cable, with superconducting shield walls (or at
least multiple closely spaced vias between upper and lower A number of researchers have reported making low-frequency
ground planes) surrounding each signal conductor to form (dc to low MHz) superconducting thin film flexible cables
‘rectangular coax’ cables having negligible crosstalk (an [25–30], but none have presented microwave (GHz range)
important consideration in many qubit experiments). Typical performance data. Manufacturer’s data sheets for thin-film
dimensions of the conductors can be 20 μm wide and polyimides generally only provide low-frequency (kHz or
∼250 nm thick on a pitch as fine as 50 μm, which would yield MHz) room-temperature loss tangent (tanδ) data, which is not
a very high interconnect density (up to 200 signals in a 10 mm useful for our purposes. Some cryogenic loss measurements
wide cable), excellent mechanical flexibility, and very low have been reported for polyimide, but again only at very low
axial heat leakage when in the superconducting state. Total frequencies [31–33]. Ponchak and Downey [34] have mea-
dielectric (e.g., polyimide) thickness could be 50 μm or less. sured room-temperature microwave properties of thin-film
Nb (Tc ∼ 9.2 K) would be an acceptable superconductor for copper/polyimide microstrip lines on silicon substrates over
many applications, although alternative materials could be the 1–110 GHz frequency range and reported an average tanδ
used if needed for high-magnetic field environments. Either of 0.006 for PI-2611. Harris et al [35] measured copper
conventional single-ended or differential pairs could be microstrip lines on free-standing Kapton polyimide and
3
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
Figure 2. (a) Assembled thin film PI-2611 (meandered) microstrip transmission line with edge launch SMA connectors and support substrate,
(b) Released thin film resonator with signal trace, prior to deposition of ground metallization and (c) Cross sectional structure of the
simplified structures tested in this work, which were individual superconducting microstrip transmission lines and resonators fabricated on
20 μm thick polyimide, with lengths ranging from 50 to 550 mm. Based on the measured relative dielectric constant of the polyimide at low
temperature (er ) of 3.2, we chose a line width of 47.4 μm to yield a 50 Ω characteristic impedance. Our early test structures were straight
50 mm long lines, and we have since successfully tested serpentine transmission lines and resonators having total lengths of up to 550 mm.
reported a room-temperature tanδ of 0.013 at 13 GHz, which conductive, e.g. only 0.6 nW of heat leakage from 800 mK to
fell to 0.007 when cooled to 77 K. We will demonstrate in this lower temperatures.
work that, remarkably, polyimide microwave dielectric losses In contrast to the flex cables in [29], where the thermal
are reduced by roughly two orders of magnitude when cooled conductivity of their Nb traces were deemed negligible based
to deep cryogenic temperatures (4 K and below). on a 2000:1 polyimide/Nb area ratio, we use ground planes in
Using thin-film geometries similar to those in our work, our devices, for shielding and precise impedance control at
van Weers et al [29] have measured the axial thermal con- microwave frequencies. Our polyimide/Nb ratio for micro-
ductivity of a released layer of thin-film PI-2611 to be strip is in the range between 40:1 and 80:1 depending on the
1.6 ´ 10-3T1.17 W m−1 K−1 over the temperature range signal density, and so we cannot neglect the Nb; in fact it may
150 mK to 10 K. In the absence of convective or radiative be the dominant contributor to axial heat leakage. The
heat transfer, it can be shown by integrating the one-dimen- reported thermal conductivity of Nb with an RRR of 40 from
sional Fourier law that whenever a cable’s axial thermal T=4 K down to T=1.5 K ranged from 9 to 3 W m−1 K−1,
conductivity has that type of power-law dependence on respectively [36]. Lower-temperature measurements of bulk
absolute temperature, i.e., of the form k = aT n , then the Nb with RRR=26 have shown that the thermal conductivity
steady-state heat Q̇ conducting along a cable of uniform drops monotonically starting from ∼2 W m−1 K−1 at 0.7 K,
cross-sectional area A and length L having a ‘hot’ end at and diminishing to ∼0.002 W m−1 K−1 at 40 mK, following
temperature Thot and a ‘cold’ end at Tcold will be fairly close to the theoretical T 3 dependence (a T 2.4 depend-
Q˙ = (khot Thot - k cold Tcold ) A [(n + 1) L ], where khot and kcold ence looks like a best fit) [37]; kNb∼0.028 W m−1 K−1 at
are the thermal conductivities at the hot and cold ends. When 120 mK using this fit. In contrast to these bulk samples, our
Thot Tcold 1, as is the case in our contemplated applications, Nb thin films have an RRR of ∼3, so we might expect both
this simplifies to Q˙ = khot Thot A [(n + 1) L ]. We can thus electronic and phononic contributions to thermal conductivity
predict that the heat conduction of a 10 mm wide, 20 μm to be reduced by an order of magnitude, but to be very
thick polyimide ribbon spanning a 150 mm distance from the conservative we will assume the bulk values here. The heat
4 K stage of a dilution refrigerator to the next lower stage leaks of greatest concern in a dilution refrigerator are nor-
would be only 20 nW, which is insignificant. Cables with a mally those loading the lowest temperature stage (mixing
‘hot’ end at a lower temperature stage would be even less chamber), where one wants to maintain T∼20 mK. The next
4
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
5
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
resistance and superconducting critical transition temperature sections are corrected for system attenuation/amplification,
(Tc) of the deposited Nb. Typical sheet resistances of our unless otherwise indicated.
250 nm thick Nb films ranged from 1 Ω/square to 2.1 Ω/ In all our measurement set-ups, no intentional magnetic
square at room temperature. Typical Tc values for the Nb shielding was used, so it is quite possible that flux vortices
layers used in this work ranged from 8.7 to 9.1 K, with an threading the Nb thin films reduced our resonator Q values
RRR (R280 K R10 K ) between 2.5 and 3.5. below what would be observed in an ideal field-free
After the Nb deposition, a lift-off process was performed environment [43].
to complete the definition of the signal traces. The samples
were then patterned for solder contact pad areas (i.e., under
bump metallization, UBM). We used electron beam physical
5. Results and discussion
vapor deposition to deposit Ti (50 nm), then Cu (500 nm),
onto the samples. The samples were then protected with
In this section, we describe and discuss results for super-
photoresist and released in a NaCl solution by anodic dis-
conducting microstrip transmission lines and resonators fab-
solution [42]. A released and cleaned structure is shown in
ricated on thin-film polyimide. These structures are all free-
figure 2(b). After removing the protective photoresist, we
standing films, supported only at the ends by the edge-launch
mounted the free-standing film onto another Si support wafer connectors. We also discuss non-ideal low power and high
with the non-metallized back side of the film exposed. The power effects, as well as extraction of upper bounds on tanδ
sample was then loaded into the deposition system for back- for the polyimide at various temperatures.
side Nb metallization, with the same thickness as the signal
layer. A schematic cross-section of the transmission line
structure is shown in figure 2(c). 5.1. Performance of superconducting thin-film polyimide
In order to facilitate suitable microwave connections to transmission lines
the flexible transmission lines and resonators, we used edge
launch SMA connectors. Due to the small dimensions of the S-parameters were measured for superconducting Nb trans-
mission lines at frequencies up to approximately 14 GHz and
signal solder pad, we used Southwest Microwave connectors
at an incident microwave power of −20 dbm, while immersed
with the smallest available pin size (0.005″, i.e. 127 μm). In
in LHe (4.2 K). SOLR calibration was used, requiring several
order to achieve reliable connections for use at cryogenic
immersion cycles [44]. Representative S21 results for a 50 mm
temperatures, we soldered the signal pin from the SMA
long line are shown in figure 4(a). The observed oscillations
connector to the solder pad on the flex using high purity In
are due to alternating constructive and destructive interference
solder. Additionally, we prevented the hefty SMA connectors
from impedance discontinuities at the two ends of the near-
from straining and damaging the thin flexible structures by
lossless transmission line. Specifically, the connector pin
mounting the connectors and the sample onto a support board,
attachment points required a wide soldering pad (see figure 3)
as shown in figure 2(a).
and additional solder, resulting in parasitic capacitance to
Measurements above ∼1 K were carried out in either a
ground. To confirm this explanation, Keysight ADS was used
LHe dewar (4.2 K), or a Cryo Industries of America pulse- to simulate the response of the transmission lines. We used
tube based cryostat with stainless steel cryogenic rf coaxial dielectric loss tangent values derived from measurements of
cables. The pulse-tube cryostat with the rf cables stabilizes at superconducting resonators (described below) fabricated on
approximately 3 K, and can temporarily cool to ∼1 K by the same substrate as the transmission lines. Excellent
pumping on the sample space that has been back-filled with matching of simulation to measurement was obtained and is
He. Thermometry was performed at the sample holder near shown as simulation results ‘with pads’. The variables in
the top of the sample. The sample was primarily thermalized these simulations were the kinetic inductance of the super-
through the He exchange gas. A performance network ana- conductor and the two values of the extra capacitance (one at
lyzer (Keysight N5227A PNA) was used for measurement of each end of the line, and not necessarily symmetric due to
the scattering parameters. variability in solder quantity). These capacitive pads and
The milliKelvin measurements were performed in a 3He/ accompanying extra solder, which result from the current
4He dilution refrigerator (Leiden Cryogenics CF450) with method of making contact to the structure, are expected to be
base temperature of 20 mK. High frequency coax lines were eliminated with a more refined connection method, such as
attenuated at each temperature stage to reduce noise and to flip-chip attachment. Therefore, we also performed simula-
thermalize the inner conductors. The Southwest Microwave tions without these capacitive instances and show these
SMA connectors at each end of the flex cable were therma- results as simulation ‘without pads’ in figure 4(a); these
lized to the mixing chamber via SMA feedthroughs (for the simulation results closely coincide with the constructively
grounds) and cryogenic attenuators (for the center con- interfering peaks (top envelope) of the S21 response, as
ductors). Transmission measurements were performed using a expected. These results demonstrate that, with ideal signal
vector network analyzer (Keysight N5245A), with room launchers, insertion losses less than approximately 0.1 dB up
temperature amplification (Low Noise Factory LNF- to at least 14 GHz can be achieved for a 50 mm long super-
LNR1_15A) and cryogenic amplification on some samples conducting microstrip transmission line constructed from Nb
(Caltech CITLF). Measurement results in the following on flexible polyimide substrates.
6
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
Figure 4. Measurement and simulation data of: (a) S21 for a 50 mm long flexible superconducting microstrip transmission line (Ti/Nb on PI-
2611). Simulation results are shown both with and without the terminal solder pads, to demonstrate the effects of those parasitic capacitive
structures. (b) S21 for a 5× longer (i.e., 250 mm), otherwise nominally identical microstrip line. These samples were immersed in liquid He
(T=4.2 K) and tested using −20 dBm incident power; results at higher powers were identical up to 0 dBm, beyond which 3rd-order
nonlinearities started to become discernible in the power spectrum.
7
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
8
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
Figure 7. (a) 1/Q (loaded) for multiple harmonics of a Nb/HD-4100 microstrip resonator at different temperatures. Dashed lines are linear
fits. (b) 1/Q (loaded) as a function of temperature for the fundamental (∼2 GHz) resonance of several PI-2611 and HD-4100 resonators.
9
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
Figure 9. (a) Loaded Q versus incident power at the sample for the first four harmonics (2–8 GHz) of a Ti/Nb on PI-2611 resonator at 20 mK,
(b) fundamental resonance showing high power effects of high Q-factor and resonance peak clipping, and (c) fundamental frequency
resonances showing Duffing-type nonlinearity due to high power effects.
still partially in the low-power regime, which artificially From Qd, we can determine tanδ from:
depresses those Q values.
1 ⎛ 1 - q⎞
Qd = ⎜1 + ⎟, (3 )
5.4. Dielectric loss tangent extraction tand ⎝ qer ⎠
To allow more precise modeling and performance predictions where q is the dielectric filling factor, which is not unity since
for the flexible superconducting transmission lines, knowl- this is a non-embedded microstrip structure. From ADS
edge of the dielectric tanδ for the various polyimide materials simulation results, with er =3.2 and for the case of the
is needed. As shown previously, we extracted Q-factors at microstrip transmission line stack-up used in this work, we
multiple resonant frequencies and multiple temperatures. The find q=0.703. Based on 3, we determine the tanδ of these
extracted Q is the loaded quality factor (Ql) and can be two types of polyimide films at various frequencies and
described by: temperatures. The loaded Q-factor and corresponding tanδ
(corrected for coupling loss) at ∼1.2 K (for both types of
1
=
1
+
1
+
1
+
1
(1 ) polyimide) and 20 mK (for HD-4100), are shown in table 1.
Ql Qc Qd Qr Qcoup We emphasize again that the existence of other parasitic
losses (i.e., not associated with the polyimide dielectric)
where Qc, Qd, Qr and Qcoup are the Q-factors associated with cannot be ruled out, and so these calculated loss tangents
conductor loss, dielectric loss, radiation loss and coupling should be viewed as worst-case upper bounds for the actual
loss, respectively [52]. Radiation losses are assumed to be dielectric loss tangent.
negligible for these resonators. Given the previously
presented 1/Q results (see figure 7), we assume that the
conductor (BCS-related) losses are negligible at temperatures 6. Conclusion and future work
below ∼1.2 K. Furthermore, ADS simulation results for
resonators with no conductor loss and tanδ=0 provide Flexible superconducting transmission line cables, with small
values for the coupling loss at each resonant frequency. These physical and thermal cross sections, can be an enabling
values are provided in table 1. With this in mind, we technology for future computing technologies, such as
mathematically correct for the coupling loss to get Qd quantum computing. Our results so far give us confidence that
according to: more sophisticated structures can be built. Future work is
1 1 1 planned to characterize crosstalk and create embedded and
= - . (2 ) more highly shielded structures. Crosstalk between parallel
Qd Ql Qcoup
microstrip conductors follows an inverse square law and so
10
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
Figure 10. Internal Q-factors (corrected for coupling loss) versus frequency for PI-2611 and HD-4100 resonators at 20 mK measured in the
(a) low power regime and (b) moderate power regime. Results shown here are for five different samples, with the Ti/Nb on PI-2611 being
nominally identical.
Table 1. Measured loaded Q-factor and calculated dielectric loss tangent tanδ at multiple frequencies at ∼1.2 K for PI-2611, and at both 1.2 K
and 20 mK for HD-4100. The tanδ calculation corrected for the coupling Q and the non-unity dielectric filling factor of the microstrip. We
assume no other loss mechanisms at these low temperatures, and so the actual loss tangents may be smaller than shown.
Loaded Q-factor (tanδ)
∼f0 (GHz) Qcoup PI-2611 @ 1.2 K HD-4100 @ 1.2 K HD-4100 @ 20 mK
−5 −5
2 251 000 13 200 (8.21×10 ) 17 300 (6.07×10 ) 42 800 (2.19×10−5)
4 139 000 7 880 (1.35×10−4) 14 100 (7.19×10−5) 7 070(1.52×10−4)
6 106 000 10 500 (9.72×10−5) 13 400 (7.34×10−5) 23 300 (3.78×10−5)
8 88 400 9 170 (1.10×10−4) 12 000 (8.17×10−5) 15 500 (6.00×10−5)
10 77 300 9 660 (1.02×10−4) 10 400 (9.42×10−4) 10 000 (9.83×10−5)
12 75 400 8 870 (1.12×10−4) 9 710 (1.01×10−4) —
can be made arbitrarily small by spacing the conductors suf- options for wider and longer cables. In the long run, we
ficiently far apart, but stripline allows much closer spacing for suggest that these sorts of cables could be most economically
the same amount of crosstalk. Shield vias, as illustrated in fabricated using large glass panel substrates, such as are
figure 1, will reduce crosstalk even further and allow maxi- commonly used to manufacture LCD displays.
mally dense conductor spacing. The principal challenge to Connectors could be integrated or flip-chip attached to
making stripline is the degradation in the superconducting the ends of the cables. Similarly, attenuators and thermali-
properties (reduced Tc and Ic) of the Nb films caused by sub- zation structures could be incorporated in various ways, either
sequent high-temperature curing of polyimide. We have as integral thin-film patterns or as discrete chips that are flip-
recently found that reducing the polyimide curing temperature chip bonded to the cables. A large number of transmission
substantially alleviates this problem, and so are quite optimistic lines could be integrated within a single relatively narrow
about the prospects for building more highly shielded cables. ribbon, with outstanding phase matching owing to the inte-
Using a spiral pattern on 100 mm diameter wafers, we grated construction.
have built 2 mm wide cables which were fully 1 m long after In addition to our flexible cable applications, the extre-
being released. The use of 300 mm wafers would offer more mely low loss exhibited by polyimide thin films at deep
11
Supercond. Sci. Technol. 29 (2016) 084007 D B Tuckerman et al
cryogenic temperatures suggests that polyimides may also be [24] Homulle H, Visser S, Patra B, Ferrari G, Prati E,
viable dielectrics for signal distribution on rigid substrates, Sebastiano F and Charbon E 2016 A reconfigurable
e.g., for fabricating quantum integrated circuits. cryogenic platform for the classical control of scalable
quantum computers arXiv:1602.05786
[25] Yung C S and Moeckly B H 2011 IEEE Trans. Appl.
Supercond. 21 107–10
Acknowledgments [26] Cheng M Y, Park W T, Yu A, Xue R F, Tan K L, Yu D,
Lee S H, Gan C L and Je M 2013 Microsyst. Technol. 19
1111–8
We gratefully acknowledge funding and technical guidance [27] Tighe T, Akerling G and Smith A 1999 IEEE Trans. Appl.
from Microsoft Research for this work, including valuable Supercond. 9 3173–6
discussions with Burton J Smith. We thank Y Cao of [28] Chervenak J and Mateo J 2013 Flexible microstrip circuits for
AMNSTC for assistance with sample fabrication. superconducting electronics Technical Report GSC-16718-1
(Washington DC: NASA)
[29] van Weers H, Kunkel G, Lindeman M and Leeman M 2013
Cryogenics 55–56 1–4
References [30] Bruijn M P, van der Linden A J, Ridder M L and
van Weers H J 2015 J. Low Temp. Phys. 184 369–3
[31] Simon N 1994 Cryogenic properties of inorganic materials for
[1] Barends R et al 2014 Nature 508 500–3 iter magnets: a review Technical Report NISTIR 5030
[2] Reed M D, DiCarlo L, Nigg S E, Sun L, Frunzio L, (Gaithersburg, MA: NIST)
Girvin S M and Schoelkopf R J 2012 Nature 482 382–5 [32] Weedy B and Swingler S 1984 Cryogenics 24 367–70
[3] Kelly J et al 2015 Nature 519 66–9 [33] Yamaoka H, Miyata K and Yano O 1995 Cryogenics 35 787–9
[4] Corcoles A D, Magesan E, Srinivasan S J, Cross A W, [34] Ponchak G E and Downey A N 1998 IEEE Trans. Compon.
Steffen M, Gambetta J M and Chow J M 2015 Nat. Packag. Manuf. Technol. B 21 171–6
Commun. 6 6979 [35] Harris A, Sieth M, Lau J, Church S, Samoska L and Cleary K
[5] Ofek N et al 2016 arXiv:1602.04768 2012 Rev. Sci. Instrum. 83 086105
[6] Fowler A G, Mariantoni M, Martinis J M and Cleland A N [36] Koechlin F and Bonin B 1999 Supercond. Sci. Technol. 9
2012 Phys. Rev. A 86 032324 453–60
[7] Mourik V, Zuo K, Frolov S M, Plissard S R, [37] Anderson A C, Satterthwaite C B and Smith S C 1971 Phys.
Bakkers E P A M and Kouwenhoven L P 2012 Science 336 Rev. B 3 3762–4
1003–7 [38] Bai R, Hernandez G A, Cao Y, Sellers A J, Ellis C D,
[8] Albrecht S M, Higginbotham A P, Madsen M, Kuemmeth F, Tuckerman D B and Hamilton M C 2016 Cryogenic
Jespersen T S, Nygård J, Krogstrup P and Marcus C M 2016 microwave characterization of kapton polyimide using
Nature 531 206–9 superconducting resonators International Microwave Symp.
[9] Hyart T, Van Heck B, Fulga I C, Burrello M, (IMS) (San Francisco)
Akhmerov A R and Beenakker C W J 2013 Phys. Rev. B 88 [39] Meyer J U, Stieglitz T, Scholz O, Haberer W and Beutel H
1–7 2001 IEEE Trans. Adv. Packag. 24 366–74
[10] Bravyi S and Kitaev A 2004 Phys. Rev. A 71 022316 [40] HD MicroSystems 2009 PI-2600 Series-Low Stress
[11] Brecht T, Pfaff W, Wang C, Chu Y, Frunzio L, Applications product bulletin (http://www.dupont.com/
Devoret M H and Schoelkopf R J 2016 npj Quant. Inf. 2 content/dam/dupont/products-and-services/electronic-and-
16002 electrical-materials/semiconductor-fabrication-and-
[12] Hornibrook J M et al 2015 Phys. Rev. Appl. 3 024010 packaging-materials/documents/PI-2600_Process
[13] Chow J M, Gambetta J M, Cross A W, Merkel S T, Guide.pdf)
Rigetti C and Steffen M 2013 New J. Phys. 15 115012 [41] HD MicroSystems 2014 HD-4100 Series product bulletin
[14] Leek P J, Filipp S, Maurer P, Baur M, Bianchetti R, Fink J M, (http://www.hdmicrosystems.com/HDMicroSystems/en_
Göppl M, Steffen L and Wallraff A 2009 Phys. Rev. B 79 US/products/photodefineable/HD-4100_negative_
180511 solvent.html)
[15] Wallraff A, Schuster D I, Blais A, Frunzio L, Majer J, [42] Metz S, Bertsch A and Renaud P 2005 J. Microelectromech.
Devoret M H, Girvin S M and Schoelkopf R J 2005 Phys. Syst. 14 383–91
Rev. Lett. 95 1–4 [43] Song C, Heitmann T W, DeFeo M P, Yu K, McDermott R,
[16] Macklin C, O’Brien K, Hover D, Schwartz M E, Neeley M, Martinis J M and Plourde B L T 2009 Phys. Rev.
Bolkhovsky V, Zhang X, Oliver W D and Siddiqi I 2015 B 79 174512
Science 350 307–10 [44] Ferrero A and Pisani U 1992 IEEE Microw. Guid. Wave Lett. 2
[17] Córcoles A D, Chow J M, Gambetta J M, Rigetti C, Rozen J R, 505–7
Keefe G A, Beth Rothwell M, Ketchen M B and Steffen M [45] Megrant A et al 2012 Appl. Phys. Lett. 100 113510
2011 Appl. Phys. Lett. 99 181906 [46] Suh J, Weinstein A and Schwab K 2013 Appl. Phys. Lett. 103
[18] Barends R et al 2011 Appl. Phys. Lett. 99 113507 052604
[19] Wenner J et al 2013 Phys. Rev. Lett. 110 150502 [47] O’Connell A D et al 2008 Appl. Phys. Lett. 92 112903
[20] Chen Y et al 2014 Phys. Rev. Lett. 113 220502 [48] Gao J, Daal M, Martinis J M, Vayonakis A, Zmuidzinas J,
[21] Hornibrook J M, Colless J I, Mahoney A C, Croot X G, Sadoulet B, Mazin B A, Day P K and Leduc H G 2008 Appl.
Blanvillain S, Lu H, Gossard A C and Reilly D J 2014 Appl. Phys. Lett. 92 212504
Phys. Lett. 104 103108 [49] Wang H et al 2009 Appl. Phys. Lett. 95 233508
[22] Chen Y et al 2012 Appl. Phys. Lett. 101 182601 [50] Wenner J et al 2011 Appl. Phys. Lett. 99 113513
[23] Conway Lamb I D, Colless J I, Hornibrook J M, Pauka S J, [51] Neill C et al 2013 Appl. Phys. Lett. 103 072601
Waddy S J, Frechtling M K and Reilly D J 2016 Rev. Sci. [52] Belohoubek E and Denlinger E 1975 IEEE Trans. Microw.
Instrum. 87 014701 Theory Tech. 23 522–6
12